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8/19/2019 BS CECC 16101-1980 (2000)
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BRITISH STANDARD BS CECC16101:1980
Specification for
Harmonized system
of quality assessment
for electronic
components —Blank detail
specification —
Electromechanical all-or-nothingrelays —
Test schedule 3
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© BSI 03-2000
ISBN 0 580 34396 0
Amendments issued since publication
Amd. No. Date Comments
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Contents
Page
National foreword ii
Foreword iiiText of CECC 16101 1
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National foreword
This British Standard has been prepared under the direction of the ElectronicComponents Standards Committee. It is identical with CENELEC ElectronicComponents Standards Committee CECC 16101 “ Blank detail specification:
Electromechanical all-or-nothing relays”.
This standard is a harmonized specification within the CECC system.
Terminology and conventions. The text of the CECC specification has beenapproved as suitable for publication, without deviation, as a British Standard.Some terminology and certain conventions are not identical with those used inBritish Standards. Attention is especially drawn to the following.
The comma has been used throughout as a decimal marker. In British Standardsit is current practice to use a full point on the baseline as the decimal marker.
Cross references. The British Standard harmonized with CECC 00100 isBS E9000 “General requirements for electronic components of assessed qualityharmonized with the CENELEC Electronic Components Committee System”Part 1 “ Basic rules”. The British Standard harmonized with CECC 00107 isBS E9000-2 “Rules of procedure”.
The following International Standards are referred to in the text and for eachthere is a corresponding British Standard; these are listed below:
IEC 255 is a multipart standard and relevant parts of it are to be published asidentical British Standards.
Scope. This standard lists the ratings, characteristics and inspectionrequirements which are to be included as the minimum mandatory requirements
in the detail specification for electromechanical all-or-nothing relays conformingto Test schedule 3. It also lists in the inspection schedule those tests which arerecommended for inclusion in the detail specification at the discretion of thespecification writer. These latter tests, if adopted, become a mandatoryrequirement for the detail specification.
The ranking of the test schedules is in accordance with 4.4 of BS CECC 16100.
Detail specification layout. In the event of conflict between the requirementsof this specification and the Provisions of BS E9000 the latter shall takeprecedence except the front page layout will be in accordance with BS 9000Circular Letter No 15 dated August 1977.
International Standard Corresponding British Standard
CECC 16000:1979 BS CECC 16000:1980 Harmonized system of qualityassessment for electronic components: Genericspecification Electromechanical all-or-nothing relays (Identical)
CECC 16100:1980 BS CECC 16100:1980 Harmonized system of qualityassessment for electronic components. Sectionalspecification: Electromechanical all-or-nothing relays
(Identical)IEC 68 BS 2011 Basic environmental testing procedures
IEC 68-1:1978 Part 1.1:1980 General (Identical)
IEC 68-2-10:1968 Part 2.1J:1977 Test J. Mould growth (Identical)
IEC 443:1974 BS 5148:1975 Method for specifying the performance ofstabilized power supply apparatus (Technicallyequivalent)
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A British Standard does not purport to include all the necessary provisions of acontract. Users of British Standards are responsible for their correct application.
Compliance with a British Standard does not of itself confer immunityfrom legal obligations.
Summary of pages
This document comprises a front cover, an inside front cover, pages i to iv,the CECC title page, pages ii to vi, pages 1 to 11 and a back cover.
This standard has been updated (see copyright date) and may have hadamendments incorporated. This will be indicated in the amendment table on theinside front cover.
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Contents
Page
Foreword iii
1 Related documents 1
2 Characteristic values 1
3 Formation of inspection lots 14 Intervals between tests 1
5 Qualification approval 1
6 Quality conformance inspection 1
7 Marking of relays and package 1
8 Appendices 1
9 Inspection requirements 2
Table 1 3
Table 2 — Qualification approval procedure requirements 9
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Foreword
The CENELEC Electronic Components Committee (CECC) is composed of thosemember countries of the European Committee for ElectrotechnicalStandardization (CENELEC) who wish to take part in a harmonized System forelectronic components of assessed quality.
The object of the System is to facilitate international trade by the harmonizationof the specifications and quality assessment procedures for electroniccomponents, and by the grant of an internationally recognized Mark, orCertificate, of Conformity. The components produced under the System arethereby accepted by all member countries without further testing.
This document has been formally approved by the CECC, and has been preparedfor those countries taking part in the System who wish to prepare and issuenational harmonized detail specifications for ELECTROMECHANICAL
ALL-OR-NOTHING RELAYS. It should be read in conjunction with documentCECC 00100: Basic Rules (1974).
At the date of printing of this document the member countries of the CECC areBelgium, Denmark, Germany, France, Ireland, Italy, the Netherlands, Norway,Sweden, Switzerland, the United Kingdom, and copies of it can be obtained from
the National Committees of the CENELEC in these countries.
Preface
This blank detail specification was prepared by CECC Working Group 16:“Relays”.
It is one of a series of blank detail specifications for electromechanicalall-or-nothing relays, all relating to the sectional specification printed asCECC 16100.
In accordance with the requirements of document CECC 00100 it is based,wherever possible, on the Recommendations of the InternationalElectrotechnical Commission.
The text of this blank detail specification was circulated to the CECC for votingin document CECC(Secretariat)645 in August 1977 and was ratified by theCECC for printing as a CECC Specification.
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Key for page v
The numbers between square brackets on page v correspond to the following indications which should be
given:Identification of the detail specification
[1] The name of the National Standards Organization under whose authority the detail specification isdrafted
[2] The CECC symbol and the number allotted to the completed detail specification by the CECC GeneralSecretariat
[3] The number and issue number of the national generic specification and/or sectional specification
[4] The national number of the detail specification, date of issue and any further information required bythe national system, together with any amendment numbers, if issued.
Identification of the relay
[5] A short description of the type of relay as required for identification
[6] Information on typical construction (where applicable)
[7] An outline drawing and/or reference to the relevant document for outlines. Alternatively, this drawingmay be given in an appendix to the detail specification
[8] Application and test schedule
[9] Reference data giving information on the most important properties of the component, whichallow comparison between the various component types intended for the same, or for similar, applications.The entry shown is an example.
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[1] page..
of...
CECC 16101-...
Issue...
[2]
ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH:
[3] [4]
DETAIL SPECIFICATION FOR: ALL-OR-NOTHING RELAYS [5]
TYPE (S) :
CONSTRUCTION :
[6]
[7] Application: [8]
(outline drawing)
Test schedule: 3 (or 3 with.. additions)
1 Coil (For example only) [9]
Coil voltage V d.c.
Number ofturns
Resistance at 20 °C 7
Test voltage kV Coil variant code
612
5451 090
3,114,7
2,5 7071
2 Contacts
TypeContinuous contact
current A Open circuit
voltage VMake/break
power WTest voltage
kVContact code
1 make2 make
1510
440 = /380 ì
1 000=/2 200 ì
2,5 1 A 2 A
3 Temperature range: 0 °C ... + 40 °C
See the relevant qualified Products list for availability of relays made to this specification.
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1 Related documents
(National Authorised Institutions will complete this section making reference to any documents or
specifications directly referred to in their national equivalent of this document.)
2 Characteristic values
(state in accordance with IEC 255-1-00)
3 Formation of inspection lots
(state as applicable)
4 Intervals between tests
(Intervals between Group C tests to be stated, and to be not less than 6 months nor more than 2 years)
5 Qualification approval(state Method 1 or 2 of CECC 00107 and, in the first case, refer to Table 2)
6 Quality conformance inspection
With the exception of Subgroup A 0, where a subgroup contains more than one test the order of tests ismandatory.
Samples subjected to destructive tests (D) shall not be released for delivery.
7 Marking of relays and package
Relays and their package supplied in accordance with this detail specification shall be marked as follows:
7.1 Relay
— trade mark or manufacturer’s name — relay type and variants code
— coded date of manufacture, to at least the nearest month
— (any further necessary marking)
7.2 Package
— detail specification reference
— trade mark or manufacturer’s name
— relay type code
— manufacturer batch identification code
— quantity
— (any further necessary marking)
8 Appendices
One or more appendices may be added, to show dimensions to be checked, sockets to be supplied with therelay, or termination variants.
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9 Inspection requirements
9.1 When assigning IL- and AQL-notations, the IL values given under the heading of each subgroup shall
be used, and the AQL values shall be within the given range.
9.2 The symbols in front of the lines of the columns for conditions of test and performance requirementsdenote, in accordance with CECC 16000 and CECC 16100:
9.3 Standard conditions for testing
Applicable to all tests unless otherwise specified Refer to 5.5 of CECC 16000 and state from 5.5.6:
NOTE 1 Conditions of tests are prescribed in detail once only; later on they are referred to as “Test No. ...”.
NOTE 2 Reference numbers of tests and performance requirements refer to CECC 16000, or to 16100 if applicable.
M mandatory test
R recommended test
ù, ú as above, but see restrictions in CECC 16000/CECC 16100
+ state if required
× state if applicable
+ (1) atmospheric conditions (IEC 68-1)
+ (2) properties of supply and connections (IEC 443)
+ (3) cleaning and/or adjustment
(4) fixing instructions
+ (5) application of these conditions
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Table 1
TEST
NO.
EXAMINATION OR
TEST
CONDITIONS OF TEST
See NOTE 2
IL AQLPERFORMANCE
REQUIREMENTSGROUP A INSPECTION
Sub-Group A0
For all tests in this subgroup General case Special case
100 % — test IL: II
AQL: 0,065 . . .0,25...0,65
1 Visual inspection,marking
M 5.6.4 (1) and (2) . . . . . . present and legible
2 Contact-circuitresistance
ù+
×
+
5.12 state from 5.12.2:(1) frequency of test voltage(2) type of measurement(3) details of dynamic test(4) energisation value(5) points of measurement(6) test current(7) open circuit voltage
. . . . . . maximum contact circuit resistance
3 D.C. coil resistance ù+×
×
5.8.1 state from 5.8.1.3:(2) reference temperature(3) temperature coefficient(4) precautions
. . . . . . resistance limit(s) of the coil(s)
4 Functional tests M+
+×
5.13 state from 5.13.3:(1) operate and release value,
preconditioning, polarity(5) test on new relays(6) magnetic orientation(7) details of monitoring
. . . . . . presence of the functions
5 Dielectric test M 5.9 state from 5.9.2:
(1) terminations
(2) voltage parameters(3) duration
. . . . . . no breakdown no flashover
+ maximum leakage current
6 Sealing ù
×
5.20.2 state from 5.20.2.2:
(1) method(3) pressurising and cleaning(4) details of Method 3
. . . . . . Method 1: no visible leakage
Methods 2 and 3: maximum leakagerace
IL: I
Sub-Group A1 For all tests in this subgroup AQL: 0,4 . . . 1,0 . . . 4
7 Internal moisture ù 5.21 state from 5.21.4:(1) energisation value(2) temperature
I . . . none, but subsequent test to beperformed as final measurement
8 Contact-circuitresistance
ù 5.12 Test No. 2 I . . . maximum contact-circuit resistance
9 D.C. coil resistance ù 5.8.1 Test No. 3 I . . . resistance limit(s) of the coil(s)10 Coil impedance ù
++
5.8.3 state from 5.8.3.3:(1) method(3) energisation value(s)(4) test voltage(5) alternative procedure
I . . . impedance or burden limits
11 Timing tests ú
+
×
×
5.14 state from 5.14.3:(1) mounting or position(2) energisation parameters(3) means for disconnection(4) supply parameters(5) contact parameters(7) further details(8) contact(s) to be checked
(10) suppression components
I . . . limits of the times to be measured+ duration of discontinuities to be
ignored
12 Mechanical tests R 5.7.1 state from 5.7.3:(1) properties to be tested, methods of
test
I . . . state required results
Notes and symbols on page 2
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Table 1
TESTNO.
EXAMINATION ORTEST
CONDITIONS OF TESTSee NOTE 2
IL AQLPERFORMANCEREQUIREMENTS
Sub-Group A2 IL: S 4For all tests in this subgroup AQL: 0,4 . . . 1,0 . . . 4
13 Check of dimensions M
+
5.6.1 state from 5.6.7:(1) dimensions(2) creepage distances and clearances
S 4 . . . tolerances
Sub-Group A3 IL: II
For all tests in this subgroup AQL: 0,4 . . . 1,0 . . . 4
14 Visual inspection,other than marking
M++
+
5.6 state from 5.6.7:(3) visual conditions(4) shaking of the relay (a)(5) correct housing (b)
other physical properties (c)
II . . . (a) no audible noise(b) condition, finish and
workmanship to be satisfactory(c) state details of results
Sub-Group A4 IL: S 4
For all tests in this subgroup AQL: 0,4 . . . 1,0 ... 4
15 Insulation resistance M
++
5.11 state from 5.11.2:(1) terminations(2) measurement voltage(3) time to reading
S 4 . . . minimum value(s) of insulationresistance
16 Dielectric test M 5.9 Test No. 5 S 4 . . . no breakdown no flashover+ maximum leakage current
GROUP B
Sub-Group B1 IL: S 3 The test of this subgroup isdestructiveFor all tests in this subgroup AQL: 0,4 . . . 1,5 . . . 6,5
17 Electrical endurance ú 5.30 state from 5.30.3, 5.30.4, 5.30.5,5.30.6 as applicable
S 3 . . .
++
++
+
For 5.30.3 (Category I, II, III) statefrom 5.30.3.2:(–) contact(s) to be tested(1) number of operations or duration(2) Method 1 or 2(4) checking intervals(6) temperature(7) energisation value(8) speed and duty factor(9) protective devices
(10) checking equipment and fuse rating(11) load(s)(12) Final measurements
Test No. 15
Test No. 2
other measurements state allconditions
Method 1: allowed number offailures, criteria of failureMethod 2: criteria of failure
Final measurements:minimum values of insulationresistancemaximum contact-circuitresistance state required results
++
+
For 5.30.4 (Category 0) state from5.30.4.2:(–) contact(s) to be tested(2) energisation value(3) speed and duty factor(4) number of operations or duration(5) contact-circuit resistance, state
from 5.12.2 (see Test No.2)(6) temperature(7) Intermediate measurements state
all conditions(8) Final measurements Test No. 15
other final measurements state allconditions
allowed number of failures,the criterion being:
maximum contact-circuitresistance
Intermediate measurements staterequired resultsFinal measurements: minimumvalues of insulation resistancestate required results
Notes and symbols on page 2
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Table 1
TESTNO.
EXAMINATION ORTEST
CONDITIONS OF TESTSee NOTE 2
IL AQLPERFORMANCEREQUIREMENTS
continued For 5.30.5 (Category 0,
miss-free) state from 5.30.5.2:(–) contact(s) to be tested(1) energisation value(2) number of operations(3) speed and duty factor(4) from 5.12.2 (Test No. 2)(5) Intermediate
measurements state allconditions
(6) Final measurementsTest No. 15other final measurementsstate all conditions
+
+
maximum contact-circuitresistance
Intermediate measurements staterequired results Finalmeasurements:minimum values of insulationresistance state required results
For 5.30.6 (Extendedassessment) state allinformation required in
IEC 255-0-20,Sub-clause 5.2.1.2
state all required results
Sub-group B2 IL: S 3
For all tests in this subgroup AQL: 0,4 . . .1,0 ... 4
This subgroup contains destructive tests as marked by (D)
18 Magnetic remanence ú
+
×
5.43 and 5.14 state from 5.43.3:(1) saturate values, duration of
application(2) contact criterion (-ia) and
from 5.14.3:(1) mounting or position(5) contact parameters(8) contact to be checked
(10) suppression components
S 3 . . . limits of remanence value+ duration of discontinuities to be
ignored
19 Heating R
×
×
++
5.18 state from 5.18.3:(1) mounting(2) energisation value, duration(3) conductor material(4) temperature(5) contact load
S 3 . . . limits of temperature rise
20 Internal moisture ù 5.21 Test No. 7 S 3 . . . none, but final measurementsapply
21 Rapid change oftemperature, Method 2
ù
+
5.19.2 state from 5.19.3:(2) temperature parameters(3) contact load
S 3 . . . none, but final measurementsapply
22 Soldering, Test 1 (D) ù
+
5.25.3 state from 5.25.4:(1) method(2) ageing procedure
S 3 . . . none, but final measurementsapply
23 Robustness of terminals
(D) for pull, bend and twist
ù 5.24 state from 5.24.3:
(1) procedure(s) and load(s)
S 3 . . . none, but final measurements
apply24 Final measurements State the appropriate conditions and performance requirements applicable to the tests above,
from the following:
— visual inspection+
×
×
5.6 state from 5.6.7:(3) visual conditions(–) properties to be checked(a) marking and identification(b) correct housing(c) corrosion(d) solder wetting
Same AQL as forthe test above
(a) present and legible(b) condition to be satisfactory(c) corrosion index(d) wetting index
— insulation resistance 5.11 Test No. 15 minimum value(s) of insulationresistance
— d.c. coil resistance 5.8.1 Test No. 3 resistance limit(s) of the coil(s)
— contact-circuit resistance 5.12 Test No. 2 maximum contact-circuitresistance
— other finalmeasurements
+ state all conditions state required results
Notes and symbols on page 2
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Table 1
TEST
NO.
EXAMINATION
OR TEST
CONDITIONS OF TEST
See NOTE 2
IL AQLPERFORMANCE
REQUIREMENTSSub-Group B3 IL: S 3
For all tests in this subgroup AQL: 0,1 . . .0,65 . . . 2,5
25 Contact sticking ú
+
×
5.42 and 5.14 state from 5.42.3:(–) upper temperature(1) upper limit of operative range and
from 5.14.3:(1) mounting or position(3) means of disconnection(5) contact parameters(8) contact(s) to be checked
(10) suppression components
S 3 . . . limits of release time+ duration of discontinuities to be
ignored
GROUP C
Sub-Group C1 IL: S 2 The test of this subgroup is destructive
For all tests in this subgroup AQL: 0,4 . . . 1,5 . . . 6,5
26 Electricalendurance
ù 5.30 Test No. 17 S 2 . . . Test No. 17
Sub-Group C2 IL: S 3
For all tests in this subgroup AQL: 0,4 . . . 1,0 . . . 4
27 Contact-circuitresistance
ù 5.12 Test No. 2 S 3 . . . maximum contact-circuitresistance
28 Coil inductance R
+
5.8.2 state from 5.8.2.3(2) measurement voltage(3) measurement frequency(4) energisation value(5) details of alternative procedure
S 3 . . . coil inductance limits,unenergised and energised state
29 Timing tests M 5.14 Test No. 11 S 3 . . . limits of times to be measured
+ duration of discontinuities to beignored
30 Dielectric test ù 5.9 Test No. 5 S 3 . . . no breakdown no flashover+ maximum leakage current
Sub-Group C3 IL: S 2
For all tests in this subgroups AQL: 0,65 . . . 1,5 . . . 6,5
31 Weighting R 5.7.2 S 2 . . . Weight and tolerances
32 Contact noise ú
+
5.39 state from 5.39.3:(1) energisation value(s)(2) shock and/or vibration parameters (see C5)(3) test circuit(4) measuring equipment
S 2 . . . limits of noise voltage
Sub-Group C4 IL: S 2 The tests of this subgroup aredestructive
For all tests in this subgroup AQL: 0,4 . . . 1,5 . . . 6,5
33 Electricalendurance
ù 5.30 Test No. 17 S 2 . . . Test No. 17
34 Mechanicalendurance
ù
×
×
5.31 state from 5.31.4, regarding Note 4 ofTable I of the Sectional Specification:(1) Method 1 or 2(2) energisation value(3) monitoring parameters(4) speed and duty factor(5) number of operations or duration(7) intermediate checks, state all details
S 2 . . . Method 1: allowed number offailuresMethod 2: state required results
Notes and symbols on page 2
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Table 1
TEST
NO.
EXAMINATION
OR TEST
CONDITIONS OF TEST
See NOTE 2
IL AQLPERFORMANCE
REQUIREMENTS35 Final measurements State the appropriate conditions and performance requirements applicable to the tests above, from
the following:
— visual inspection+
++
5.6 state from 5.6.7:(3) visual conditions(–) properties to be checked(a) marking and identification(b) correct housing(4) shaking of the relay(5) other physical properties
Same AQL asfor the testabove
(a) Present and legible(b) condition to be satisfactory(4) no audible noise(5) state details of results
— insulationresistance
5.11 Test No. 15 minimum value(s) of insulationresistance
— contact-circuitresistance
5.12 Test No. 2 maximum contact-circuit resistance
— other finalmeasurements + state all conditions state required results
Sub-Group C5 IL: S 2
For all tests in this subgroup AQL: 0,4 . . . 1,0 . . . 4
This subgroup contains destructive tests as marked by (D)
36 Thermoelectrice. m. f.
ú 5.40 state from 5.40.3:(1) method and material for soldering(2) ambient temperature
S 2 . . . limit of e. m. f.
37 Thermal endurance(D)
R
+
5.32 and 5.13 state from 5.32.3:(1) mounting(2) duration(3) ambient temperature(4) energisation value(–) contact load and, for immediate final
measurements, state from 5.13.3:(1) operate and release value(7) details of monitoring
S 2 . . . none, but final measurements apply
presence of functions
38 Damp heat, steadystate (D)
R
+
5.16 and 5.11 state from 5.16.3:(1) duration, recovery(2) voltage and, for immediate finalmeasurement, state from 5.11.2 Test No. 15
S 2 . . . none, but final measurements apply
minimum value(s) of insulationresistance
39 Climatic sequence(D)
R 5.15 and 5.11 state if 5.15.3, 5.15.5 and/or 5.15.6 are to be applied
S 2 . . .
+
For 5.15.2 (Dry heat) state from 5.15.9:(1) severity, recovery(2) energisation value, duty and
contact load(3) see also 5.13.3(1) operate and release value(7) details of monitoring
additionally, final measurementsapply
presence of functions
++
For 5.15.3 and 5.15.6 (Damp heat) statefrom 5.15.9:(1) severity, recovery and, for immediatefinal measurement after the last cycleof 5.15.6, state from 5.11.2:(1) terminals(2) measurement voltage(3) time to reading
none, but final measurements applyminimum value(s) of insulationresistance
For 5.15.4 (Cold) state from 5.15.9:(1) severity, recovery(5) method(6) operating test requirements, as follows
additionally, final measurementsapply
Notes and symbols on page 2
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Table 1
TEST
NO.
EXAMINATION
OR TEST
CONDITIONS OF TEST
See NOTE 2
IL AQLPERFORMANCE
REQUIREMENTS39 Continued
++
Category I, II and III refer to and statefrom 5.30.3.2:(–) contact(s) to be tested(7) energisation value(8) speed and duty factor(9) protective devices
(10) checking equipment(11) load
allowed number of failures, criteria offailure
+
Category 0 refer to, and statefrom 5.30.5.2:(–) contact(s) to be tested(2) energisation value(3) speed and duty factor and
from 5.12.2:(1) frequency of test voltage(3) details of dynamic test(5) points of measurement(6) test current(7) open circuit voltage
maximum contact-circuit resistance
For 5.15.5 (Low pressure) statefrom 5.15.9:(1) severity, recovery(8) test voltage duration of voltage test
additionally, final measurements apply
no breakdown, no flashover
+ Intermediate measurements: state allconditions and the part(s) of theclimatic sequence to which they apply
Intermediate measurements staterequired results
40 Salt mist (D) ú 5.22.1 state from 5.22.1.4:(1) duration(2) recovery
S 2 . . . none, but final measurements apply
41 Robustness ofterminations (D)for pull, bend andtwist
ù 5.24 Test No. 23 S 2 . . . none, but final measurements apply
42 Shock (D) R
×
×
5.26 state from 5.26.3:(1) method(2) pulse shape and acceleration(3) mounting(4) monitoring details(5) energisation value(s), Method
1-test and/or rated contact load
S 2 . . . Method 1:+ opening and closing time
both methods: final measurementsapply
43 Bump (D) R
×
×
5.27 state from 5.27.3:(1) method(2) acceleration and number(3) mounting
(4) monitoring details(5) energisation value(s),Method 1-test and/or ratedcontact load
S 2 . . . Method 1:+ opening and closing time
both methods: final measurementsapply
44 Vibration (D) R 5.28 state from 5.28.3:(1) vibration parameters(2) energisation values, test and rated(3) mounting(4) monitoring details(5) contact load
S 2 . . . + opening and closing time
additionally, final measurements apply
45 Acceleration (D) R+
×
×
5.29 state from 5.29.3:(1) method(2) acceleration duration(3) mounting(4) monitoring details(5) energisation value(s),
Method 1-test and/or rated contactload
S 2 . . . Method 1:+ opening and closing time
both methods: final measurementsapply
Notes and symbols on page 2
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Table 1
Table 2 — Qualification approval procedure requirements
TEST
NO.
EXAMINATION
OR TEST
CONDITIONS OF TEST
See NOTE 2
IL AQLPERFORMANCE
REQUIREMENTS
46 Final measurements State the appropriate conditions and performance requirements still applicable to the tests above,from the following:
— visual inspection,general +
++×
5.6 state from 5.6.7:(3) visual conditions(–) properties to be checked(a) marking and identification(b) correct housing(4) shaking of the relay(5) physical properties,surface
Same AQL as forthe test above
(a) present and legible(b) condition to be satisfactory(4) no audible noise(5) state details of results:× no mechanical deterioration× no peeling or chipping
— visual inspection,corrosion
+ state particular conditions unlessself-evident
no evidence of corrosion× which might impair operation
— d.c. coil resistance 5.8.1 Test No. 3 resistance limit(s) of the coil(s)
— insulationresistance
5.11 Test No. 15 minimum value(s) of insulationresistance
— contact-circuitresistance
5.12 Test No. 2 maximum contact-circuitresistance
— other finalmeasurements
+ state all conditions state required results
Sub-Group C6 IL: S 2
For all tests in this subgroup AQL: 1,5 ... 2.5. . . 6,5
This subgroup contains destructive tests as marked by (D)
47 Thermal resistance R
×
++
5.17 state from 5.17.3:(1) mounting(2) energisation values or operative range(3) temperature coefficient
(4) evaluation procedure(6) contact load
S 2 . . . limits of thermal resistance
48 Rapid change oftemperature (D)
R
+
5.19 state from 5.19.3:(1) method(2) temperatures, duration(3) contact load
S 2 . . . none, but final measurementsapply
49 Soldering Test 2 (D) R 5.25.3 state from 5.25.4:(1) method
S 2 . . . none, but final measurementsapply
50 Mould growth (D) R 5.23 state from 5.23.3:(1) all information required in
IEC 68-2-10 Clause 8, letters “a” to “g”
S 2 . . . state all required results
51 Final measurements Test No. 46
EXAMINATION OR TEST
CONDITIONS AND REQUIREMENTS OFTEST
SAMPLE SIZE ALLOWED DEFECTIVESDescription in
Table 1 on
QUALIFICATION APPROVAL PROCEDUREREQUIREMENTS
For symbols see 9.2
STANDARD CONDITION FOR TESTING Applicable to all teats unless otherwise specified
9.3 page 2
Notes and symbols on page 2
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BS CECC 16101:1980
10 © BSI 03-2000
Table 2 — Qualification approval procedure requirements
EXAMINATION OR TEST
CONDITIONS AND REQUIREMENTS OF TEST
See Note 2SAMPLE
SIZE ALLOWED
DEFECTIVESDescription in Table 1 under
ALL SAMPLES
Minimum sample size 24 specimens
Visual inspection, excludingdimensions
5.6 M Subgroup A 0/A 3 . . . . . .
Voltage test 5.9 M Subgroup A 0 . . . . . .
contact-circuit resistance 5.12 M Subgroup A 0 . . . . . .
D.C. coil resistance 5.8.1 M Subgroup A 0 . . . . . .
Functional test 5.13 M Subgroup A 0 . . . . . .
Sealing 5.20.2 ù Subgroup A 0 . . . . . .
SAMPLE GROUP 1
Minimum sample size 5 + 1 specimens
Internal moisture 5.21 ù Subgroup A 1 . . . . . .
Coil impedance 5.8.3 M Subgroup A 1 . . . . . .
Magnetic remanence 5.43 and 5.14 ú Subgroup B 2 . . . . . .
Contact sticking 5.42 and 5.14 ú Subgroup B 3 . . . . . .
Timing tests 5.14 M Subgroup A 1 . . . . . .
Mechanical tests 5.7.1 R Subgroup A 1 . . . . . .
Insulation resistance 5.11 M Subgroup A 4 . . . . . .
Thermal e. m. f. 5.40 R Subgroup C 5 . . . . . .
Robustness of terminations 5.24 M Subgroup C 5 . . . . . .
Shock 5.26 R Subgroup C 5 . . . . . .
Bump 5.27 R Subgroup C 5 . . . . . . Vibration 5.28 R Subgroup C 5 . . . . . .
Acceleration 5.29 R Subgroup C 5 . . . . . .
Final measurements, as applicable
— visual inspection 5.6 × Subgroup C 5 Same criteria as for the testabove
— d.c. coil resistance 5.8.1 × Subgroup C 5
— insulation resistance 5.11 × Subgroup C 5
— contact-circuit resistance 5.12 × Subgroup C 5
— other final measurements conditions as forSubgroup C 5
+ results as for Subgroup C 5
SAMPLE GROUP 2
Minimum sample size 5 + 1 specimens
Soldering, Test 1 5.25.3 and 5.25.3.1 ù Subgroup B 2 . . . . . .
Rapid change of temperature, Method 1 5.19 ù Subgroup B 2 . . . . . .
Coil inductance 5.8.2 R Subgroup C 2 . . . . . .
Thermal endurance 5.32 and 5.13 R Subgroup C 5 . . . . . .
Damp heat 5.16 and 5.11 R Subgroup C 5 . . . . . .
Climatic sequence 5.15 and 5.11 R Subgroup C 5 . . . . . .
Salt mist 5.22.1 ú Subgroup C 5 . . . . . .
Notes and symbols on page 2
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BS CECC 16101:1980
© BSI 03-2000 11
Table 2 — Qualification approval procedure requirements
EXAMINATION OR TEST
CONDITIONS AND REQUIREMENTS OF TEST
See Note 2SAMPLE
SIZE ALLOWED
DEFECTIVESDescription in Table 1 under
Final measurements, as stillapplicable
— visual inspection 5.6 × Subgroup C 5 Same criteria as for the testabove — d.c. coil resistance 5.8.1 × Subgroup C 5
— insulation resistance 5.11 × Subgroup C 5
— contact-circuit resistance 5.12 × Subgroup C 5
— other final measurements conditions as for Subgroup C 5 + results as for Subgroup C 5
SAMPLE GROUP 3
Minimum sample size 5 + 1 specimens
Check of dimensions 5.6.1 M Subgroup A 2 . . . . . .
Weighing 5.7.2 R Subgroup C 3 . . . . . .
Contact noise 5.39 ú Subgroup C 3 . . . . . .
Electrical endurance 5.30 M Subgroup C 4 . . . . . .
Mechanical endurance 5.31 M Subgroup C 4 . . . . . .
Final measurements, asapplicable
— visual inspection 5.6 × Subgroup C 4 Same criteria as for the testabove — insulation resistance 5.11 × Subgroup C 4
— contact-circuit resistance 5.12 × Subgroup C 4
— other final measurements conditions as for Subgroup C 4 + results as for Subgroup C 4
SAMPLE GROUP 4
Minimum sample size 5 + 1 specimens
thermal resistance 5.17 R Subgroup C 6 . . . . . .
plating 5.18 R Subgroup B 2 . . . . . .
rapid change of temperature,Method 2
5.19 ú Subgroup C 6 . . . . . .
soldering, Test 2 5.25.3 and 5.25.3.2 R Subgroup C 6 . . . . . . .
mould growth 5.23 R Subgroup C 6 . . . . . .
Final measurements, asapplicable
— visual inspection 5.6 × Subgroup C 6 Same criteria as for the testabove — d.c. coil resistance 5.8.1 × Subgroup C 6
— insulation resistance 5.11 × Subgroup C 6
— contact-circuit resistance 5.12 × Subgroup C 6
— other final measurements conditions as for Subgroup C 6 + results as for Subgroup C 6
Note and symbols on page 2
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BS CECC16101:1980
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