Materials and Corrosion 56, 205–212 (2005) Corrosion Books 205

CorrosionBooks

The Local Chemical Analysis of Materi-als, J. W. Martin, 215 pages, Pergamon Ma-terials Series, R. W. Cahn (ed.), Vol. 9. El-sevier Amsterdam 2003. Prize: 120 EUR.ISBN: 0-08-043936-5.Local chemical analysis down to the na-

nometer or even atomistic range is a chal-lenging issue and therefore the respectivetechniques are still under development,justifying a review of the state of the artfrom time to time. This was done here,and the systematic approach is to distin-guish the available methods according toexcitation sources i.e. X-rays, laser be-ams, ion beams or electron beams. The ul-timate technique however is to remove sin-gle atoms from a specimen and analysethem by mass spectroscopy.Therefore the book starts by describing

this technique i.e. Atom Probe Field IonMi-croscopy (AP-FIM). Nowadays it is possi-ble to perform a 3D-reconstruction of atomswithin a volume of approximately1 � 1 � 25 nm3. Typical fields of applicati-on are noon-sized precipitates, grain boun-dary segregation and multilayer thin films.Chapter 2 is dedicated to X-ray Photo-

electron Spectroscopy (XPS), also knownas Electron Spectroscopy for ChemicalAnalysis (ESCA). Since the method isvery sensitive to surface layers, contamina-tion is a crucial point, and most meaningfulresults can be obtained by creating freshfracture surfaces in the ultrahigh vacuuminside the instrument. Principles, instru-mentation, restrictions to the technique, ar-tefacts and how to get rid of them, are de-scribed comprehensively. Some examplesof application are given such as metal oxi-dation or surface layers on glass, semicon-ductors and polymers.The application of light sources for the

excitation of vibrational modes of crystalsor molecules lead to methods like IR andRaman Spectroscopy or Laser MicroprobeMass Spectroscopy (LAMMA), as des-cribed in chapter 3. A great advantage ofthese techniques is that they are not res-

tricted to vacuum environment and therefo-re a wide field of applications evolves, alldealing with issues of molecule adsorptionat surfaces. Some of the techniques alsoprovide the possibility of microanalysiswith a spatial resolution of 1 lm (RamanMicroscopy) or even 0.5 lm (LAMMA).Chapter 4 deals with the large variety of

techniques using the interaction of ionbeams with matter. The most widely usedmethod of this kind is Secondary IonMass Spectroscopy (SIMS). Its great ad-vantages are that all elements and isotopesmight be detected even at very low concen-trations (ppm) and that depth profiling witha resolution of 10 nm can be performed rea-dily. On the other hand ultrahigh vacuumand a flat surface is required and thereforethe main field of application is dopant cont-rol in the semiconductor industry. Othertechniques utilizing various ion-atom orion-electron interactions and their specialapplications are discussed as well.Finally in chapter 5 electron microscopy

and the utilization of secondary signals pro-duced by electron-material interactions aredescribed. Scanning Electron Microscopy(SEM) and Electron Probe Micro Analysis(EPMA) are very convenient for most stan-dard problems of microstructural charac-terization, but the lateral resolution of thelatter is restricted to approximately 1 lm.Better resolution of the order of 1 nm canbe achieved with the analytical Transmissi-on Electron Microscope (TEM) or Scan-ning Transmission Electron Microscope(STEM). Two impressive examples of ap-plication i.e. GP-zones in an aluminium al-loy and grain boundary segregation are pre-sented. Furthermore Auger Electron Spec-troscopy (AES), another method to studygrain boundary segregation, is described.Finally the potentials of Electron EnergyLoss Spectroscopy (EELS) and High Reso-lution EELS (HREELS) are discussed,techniques which represent options for aTEM instrument or a surface analytical de-vice, respectively.The last chapter provides useful informa-

tion related to the choice of the appropriatetechnique for the solution of problems.In conclusion, the book can indeed be re-

commended to materials scientists and en-gineers as an aid for solving numerous pro-blems for which local chemical informationor surface analysis is needed. It provides agood overview, a profound understandingof the techniques and a clear assessmentof advantages and disadvantages.– CB03404 – W. Oesterle

Reinigen und Entfetten in der Metallin-dustrie. Thomas W. Jelinek und 5 Auto-ren, 200 Seiten 67 Abbildungen und 42 Ta-bellen. 1. Auflage 1999, Eugen G. LeuzeVerlag, Bad Saulgau, 2001. 59,00 EUR.ISBN-Nr. 3-87480-155-1.Dieses Buch ist fur Praktiker der Oberfla-

chentechnik sowie fur Lehrlinge und Stu-denten geschrieben worden. Es gibt demLeser die Moglichkeit, die Grundlagen

und die technische Durchfuhrung der inder Oberflachentechnik eingesetzten Reini-gungs- und Entfettungsverfahren zu verste-hen.Es ist ein umfangreiches Werk, das so-

wohl das Reinigen mit Losungsmitteln alsauch die wassrigen Heißentfettungen be-handelt. Die Themen umfassen u.a. Metho-den zur Beurteilung des Reinheitsgradesder Oberflachen, Verfahren zum Reinigenund Entfetten, Reinigen mit Losungsmit-teln, wassrige Reinigung und Entfettung,Reinigungsanlagen und Plasmareinigung.Es werden die im Sinne einer stoffver-

lustminimierten Prozesstechnik relevantenStoffkreislaufschließungen unter Einsatzvon Regenerationsverfahren fur wassrigeEntfettungen beschrieben sowie Hinweisezur Optimierung der Spultechnik gege-ben. Die Regenerationsverfahren werdenkurz erlautert, wobei die Anlagenbeschrei-bungen zum Ubertragen in die betrieblichePraxis hilfreich sind. Die Berechnungen derSpulwasservolumenstrome fur die Spulkas-kade wird jedoch nur mit einer vereinfach-ten Formel durchgefuhrt. Fur Spuloptimie-rungen ist daher weiterfuhrende Literaturnotwendig.Besonders nutzlich fur Praktiker sowie

Anlagenlieferanten sind die zahlreichenAnwendungsbeispiele fur verschiedeneWerkstoffe, in denen die Arbeitsgange,die Art der angewendeten Reiniger, Tempe-ratur, Spultechnik, eventueller Einsatz vonRegenerationsverfahren und Einsatz vonUltraschall beschrieben sind.Nach fast jedem Kapitel ist ein Literatur-

verzeichnis angegeben, das dem Leser dieMoglichkeit fur ein vertiefendes Studiumgibt. Hilfreich ist auch das Glossar zum ra-schen Nachschlagen wichtiger Begriffe.Insgesamt eignet sich das Buch auch

heute noch sehr gut als Lehrbuch und Nach-schlagewerk zum Thema Reinigungs- undEntfettungsverfahren fur die angespro-chene Leserschaft. – CB02804 – C. Baßler

Powder Coatings – Chemistry and Tech-nology. P. Gillis de Lange. 384 Seiten, zahl-reiche Abbildungen und Tabellen, VincentzKG Hannover 2004. EUR 119. ISBN 3-87870-784-3.Das in der Reihe Coatings Compendia

erschienene Buch ist die zweite, vollstan-