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Standard Test Data Yield Analysis Tool Ertan Baykal [email protected] April 2010

Data Analysis tool by EBA

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Data Analysis tool by EBA

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Page 1: Data Analysis tool by EBA

Standard Test DataYield Analysis Tool

Ertan [email protected]

April 2010

Page 2: Data Analysis tool by EBA

04/12/20232

Contents

CONFIDENTIAL

•What is STDF•What is STDF_PRJ tool•Tool’s Main Features•Benchmark

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What is STDF

CONFIDENTIAL

The Standard Test Data Format is a comprehensive standard for the entire ATE industry, developed by Teradyne.

STDF is flexible enough to meet the needsof the different testers that generate raw test data coming from ATE.

Data analysis programs use STDF ( binary file ) to extract desired information.

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What is Standard Test Data Yield Analysis

CONFIDENTIAL

Standard Test Data Yield Analysis tool enables test and product engineers to perform fast Yield analysis and process characterization on their desktops, using standard semiconductor test data files STDF.

Tool is particularly useful for test engineers, close to ATE system. It dose not require a Data Base and DataPower to identify and report yield issues.

ATE generates STDF file, tool opens it and analyses the results, no need to wait for data to be inserted into Data Base and later appear in DataPower.

Tool was developed over a year out of office hours to enable me to do my job better and faster. Softwares used to develop it are Windows Pascal, Advance_Grid and TeeChart_Pro.

Start up Window

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Tool’s Main Features

CONFIDENTIAL

Distribution Plots:Contains main Stat Data

Box Plots: useful for process characterization & Matrix Lots Analysis

Parametric test wafer map: analyze the test gradient on wafer to investigate process or testing related problems

Pareto Fails Charts:

Color gradients on the distributionPlot corresponds to gradient On the wafer for a given parameter..

Tools can read multiple STDF files

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Tool’s Main Features cont…

CONFIDENTIAL

1 2 3 4 5 6 7

1 Contains Raw data.

2 Soft Ware Bin Fails• Stores a count of the parts associated with a particular logical bin after

testing.

3 Hard ware Bin Fails• Stores a count of the parts “physically” placed in a particular bin after

testing.

4 Test Synopsis Data : • Contains the test execution and failure counts for parametric or

functional tests.

5 Detailed Global information: tester, lot, operator etc…

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Tool’s Main Features cont…

Test summary:

Test name, limits, Fail count, Min, Max, Range, Mean, Sigma, Cpk, etc.. Copy and paste for reporting…

6

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Tool’s Main Features cont…

CONFIDENTIAL

Detailed Global information: tester, lot, operator information,Copy and paste for reporting

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Tool’s Main Features cont…

CONFIDENTIAL

Raw Data view

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Tool’s Main Features cont…

CONFIDENTIAL

Yield information : good parts, failing parts, parts retested, Copy and paste for reporting

A mouse click on YLD% or FAIL_CN cells sorts the data, useful to see main parameters causing a yield loss.

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Tool’s Main Features cont…

CONFIDENTIAL

Software Bin Fails, text or graphical format, Copy and paste for reporting

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Benchmark

CONFIDENTIAL

  STDF TOOL Data Power

Does  Data  is  avaiable  immediatley  after a Lot is  completed? Yes

  NO, Data to be inserted into DATA BASE later picked up 

by Datapower

Does it require Data Base to  access Data ? NO Yes

Pareto Fails Available after extraction Time ? Yes NO *

Yield Data Available after extraction Time ? Yes NO *

Wafer Maps Available after extraction Time ? Yes NO *

Distribution Plots Available after extraction Time ? Yes NO *

* After Data extraction It requires extra steps and time to filter data