EBB245 MATERIALS

CHARACTERIZATION

GROUP MEMBER : MOHD NAZIM BIN BIRKAMSIN (112254) MUHAMAD AIZZAT BIN MAT DZAHIR (112255) ZULFAHMI BIN ZANURI (112280) MUHAMMAD HASNOL HAZIQ BIN IMAR (112257) AHMAD FAIZUL AZRAL BIN ISMAIL (113694) MOHAMAD MURSYIK BIN ABD RAMAN (112252)

SAMPLE : ALUMINIUM FOIL

X-ray hit sample

X-ray detected by detector

compare result with standard

higher E level e fill these spaces

sample is identified

High Resolution Transmission Electron Microscopy (HRTEM)

Electron gun shoot high E e which

penetrate the sample

interaction between e and atoms core emits

wave

wave is detected and amplified by imaging

system

image produced indicates position of

atoms

the crystallinity and phase is predicted

X-ray Diffraction

(XRD).

X-ray hit sample and at certain

angles

Bragg’s Law is obeyed

Diffracted x-ray is

detected by detector

a graph, Intensity

vs. 2θ

compared with ICDD

card.

sample atom

absorbs x-ray photon

e ejected out

detector detects KE

of these ejected e

binding E is calculated using KE

value

graph Binding E vs. Counts is plotted

refer results to

XPS standard

sample is identified

Energized primary particle is bombarded on the surface of Al

foil

Particle on Al sample is sputtered

out (secondary particles)

Mass of secondary particle is measuredd

A graph of Intensity vs Mass to Charge Ratio is

plotted

The element is determined from

the graph

Sample is placed in a solution (acid).

The mist of the sample is formed. The mist is then heated by flame, only

remain the sample’s atom.

The atoms is then radiated with the light(usually UV-light).

Light of specific wavelength will be absorbed.

Absorption of the light by the atoms will be detected

The data collected then will be measured against standard curve.

Absorbance Vs. Concentration (part per million) graph is

plotted.