High Performance/Reliability Flash Solution for Embedded System and Automotive Application

Speaker : Crystal Chang Author: Alex Tseng Nov. 2013

ATP Confidential © 2013 ATP Electronics, Inc. 1

Company Profile

Product Selection by Applications

Major Concerns of Flash Product Reliability

ATP Solution of High Reliability Flash Product

Agenda

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ATPエレクトロニクスについて

Founded in Silicon Valley, USA in 1991 Offices in US, Taiwan, China, Japan,

and Europe (Netherlands, Germany) Core Competencies OEM mission critical business engagement Strengths: Long term business stability, services focusing in supply chain,

engineering, and process/quality management Global multi-party CM/EMS/3PL supply chain management Global support base for both OEM end customers and their supply chain partners

DRAM & Flash products manufacturing Taiwan SMT facilities: Kaohsiung – EVT/DVT/Burn In, Mass Production Scalable to market demands and customer requirements

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Extended & Long Term Product Longevity Long term partnership with first tier memory manufacturers Consistent DRAM and NAND Flash IC supply in varying market conditions

Controller Partnerships with SiliconMotion and LSI Long term partnership for support on flash validation and application

specific design

Micron PLP Program - Long Life Cycle Based on Micron’s Product Longevity Program, ATP

guarantees extended product life cycles of up to 10 years Longer life cycle to help reduce the frequency of re-design and

re-qualification

ATP Advantages

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100% Tested for Reliability and Consistency TDBI (Test During Burn In) & ATE (Automated Test Equipment) provide

Increased flexibility, efficiency and scalability for DRAM testing Extended and industrial temperature testing Environmental testing & application testing

Management of Total Cost of Ownership (TCO)ATP ensures the product life cycle and quality at the beginning of project to manage the TCO. Endurance and retention evaluations are initiated to provide the most

cost-effective option to customers.

Controlled Bill of Materials (BOM) Long product life cycle with buffer inventory support and advance PCN/EOL

ATP AdvantagesATP has accumulated many years of experience in the design, manufacturing, and support of two main product lines: DRAM modules & NAND flash storage products.

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Host: Integrated USB 3.0 Host is mature for UHS-I reader ; Mobile AP will support SD 3.0 in 2014

Device: UHS-I SD/microSD is ready Full HD video camera and display is popular Embedded Application of UHS-I SD/microSD

Why UHS-I SD and microSD now?

UHS-I ConventionalSD

MB/s4X71

17

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USB 3.0 Host is ready for UHS-I Card Reader Application Only USB 3.0 (5Gb/s) can fully utilize

UHS-I speed (Up to 104 MB/s) instead of USB 2.0 (480Mb/s)

Integrated USB 3.0 Host is mature for UHS-I reader

2011/Sandy BridgeUSB 3.0 Host X2

2012/Ivy BridgeIntegrated

USB 3.0 Host X2

2013/HaswellIntegrated

USB 3.0 Host X6

USB2.0 USB3.0

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Full HD Video Camera/Recording, and Playback become mainstream standard of high end Smartphone in 2013

2M pixels (Full HD) front video camera and >5-inch display (Full HD) is a good carrier to drive user to choose UHS-I

FullHD Video Camera and Display is popular

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Multi Channel Full HD Surveillance/Drive Recorder Car NAVI and RSE (Rear Seat Entertainment) Multi Channel Data Logger/Measurement Automation Control

Embedded Application of UHS-I SD/microSD

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The life of Flash Storage is limited!!! EnduranceProgram/Erase cycles of MLC is 3,000Program/Erase cycles of SLC is 30,000~60,000

Data RetentionMLC: 5/10 Years ( ≦10% of Max. P/E cycles),

1 Year ( > 10% of Max. P/E cycles)SLC: 5/10 Years ( ≦10% of Max. P/E cycles),

1 Year ( > 10% of Max. P/E cycles) Read DisturbanceContinuously Read one address without moving data is ~100K times

Major Concerns of Flash Product Reliability

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Risk of Zone 1: Endurance Risk of Zone 2: Read Disturbance Risk of Zone 3: Read Disturbance and Data Retention

Data Structure of Flash Storage Device

Zone 2 (Frequently Read)Operating System

Application Program

Zone 3 (Data Retention is Sustainable)

Map/Database

Zone 1 (Frequently Write)Multimedia/Data Log

File Allocation Table/MBR

Spare Block

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ATP Innovative Flash Solution

Conventional

ATP

Innovative

Host CPUPHYPHY Wear-

LevelingECC

SRAM

FlashInterface

NANDFlash

Flash Controller

HostCPU

PHYPHY Wear-Leveling

ECCSRAM

FlashInterface

NANDFlash

Flash Controller

EnduranceRead

Retention

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ATP Reliability Solution

Endurance Engine

Advanced Wear-leveling

Block management

ATP Total Reliability Protector

Refresh Engine

Auto ECC Check

Auto Back-Up before failure

Refresh Engine

Reliable Mode

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High Drive-Write-Per-Day Requirement OLTP/Cloud Server/Data-Log Healthcare/Surveillance Total Cost of Ownership is only ¼(5X cost/ 20X DWPD)=1/4

Application of Endurance Protector

Up to 5X cost

Up to 20X DWPD (Endurance)

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Read-Frequently Device Boot-Up/ Operating System Automation/Robot/POS Application Program/Gaming

Application of Read Protector

Others ATP Model

Before100,000

>2,000,000*

*100% Read-only

After

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Long Product life requirement Automotive IVI/NAVI system Mission-critical Environment

Application of Retention Protector

Others ATP Model

Data Retention

1~5 Yrs

>2X*

*With system support

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ATP Total Reliability Protector saves your TCO: Endurance Protector: ¼ TCO Read Protector: >2M times read (ATP) VS.100K times read Retention Protector: 2X more data retention

Conclusion

Refresh EngineReliable Mode

ATP Total Reliability Protector

Endurance Engine Advanced

Wear-levelingBlock management

Refresh EngineAuto ECC CheckAuto Back-Up

before failure

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CFast

Industrial Grade UFD

microSD

CF

mSATAeUSB

Slim SATA

SATA SSD

Horizontal SATA

Vertical SATASATA

eUSB

DRAM

Industrial Grade UFD

SD

ATP Product Summary

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TCO Evaluation Sheet can help to save total cost when you care: Performance/Form-factor Write Frequently or Read Frequently

Product Selection by Applications

10MB/s 30MB/s 100MB/s 250MB/s 500MB/s

PowerProtector Model

SDminiSD

MicroSD

UFD 2.0/eUSB/CF/DOM/CFast

SlimSATAmSATA

SATA II SSD/SATA III SSD

Form

Fac

tor S

ize

Performance

Den

sity

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