17
1 Pertemuan 5 Fabrikasi IC CMOS Matakuliah : H0362/Very Large Scale Integrated Circuits Tahun : 2005 Versi : versi/01

Pertemuan 5 Fabrikasi IC CMOS

  • Upload
    cole

  • View
    378

  • Download
    35

Embed Size (px)

DESCRIPTION

Pertemuan 5 Fabrikasi IC CMOS. Matakuliah: H0362/Very Large Scale Integrated Circuits Tahun: 2005 Versi: versi/01. Learning Outcomes. Pada Akhir pertemuan ini, diharapkan mahasiswa akan dapat menyebutkan proses fabrikasiIC CMOS. IC Fabrication. - PowerPoint PPT Presentation

Citation preview

1

Pertemuan 5 Fabrikasi IC CMOS

Matakuliah : H0362/Very Large Scale Integrated CircuitsTahun : 2005Versi : versi/01

2

Learning Outcomes

Pada Akhir pertemuan ini, diharapkan mahasiswa akan dapat menyebutkan proses fabrikasiIC CMOS.

3

IC Fabrication

Sumber: http://mems.cawru.edu/shortcourse/figure/I_2.1.gif

4

Silicon Processing

2

Silicon wafer

Sumber: http://www.amd.com

Diameter

Wafer

Die sites

5

Material Growth & Deposition

Silicon oxide

Silicon wafer

O2 flow

Silicon wafer

SiO2 layerXSi

Xox

Growth phase Final structure

Substrate

CVD oxide

SiO2 molecues

6

IC Layers

Ion implanterIon source accelerator Magnetic mass

separator

Ion beamwafer

IonSilicon wafer

Silicon nuclei

electron cloud

x0

7

Lythography

poly

substrate

poly

substrate

After oxide deposition After CMP

Glass Pattern on underside

8

Lythography

Spinning waferPhotoresist spray

Vcuum chuckResist application

Photoresist coating

Coated wafer

Wafer

Flat resistEdge bead Edge bead

Beading

9

Lythography

UV

Reticle

Resist-coatedWafer surface

Reticleshadow

Projection optics(not shown)

Exposure step

10

Lythography

Wafer

UV

Reticle

Resist

Exposure pattern

Wafer

After development and rinsing

Hardenedresist layer

11

Lythography

Hardenedresist layer

SubstrateInitial patterning of resist

Oxide layer

After etching process

Substrate

Pattern oxide layer

12

Lythography

Incoming ion beam

Substrate

Arsenic ions

Doped n-type region

Substraten+ n+

13

CMOS Process Flow

p-epitaxial layer

p+ substrate

a. Starting wafer with epitaxial layern-well

p, Na

b. Creation of n-well in p-epitaxial layer

n-wellp, Na

c. Active area definition using nitride / oxide

p, Nan-well

d. Silicon etch

Nitridep, Na

n-well

e. Field oxide growth

FOX FOX FOX FOX

p, Nan-well

f. Surface preparation

14

CMOS Process Flow

a. Gate oxide growth

p, Nan-well

b. Gate oxide growthPoly gate deposition & patterning

p, Nan-well

poly

c. pSelect mask and implant

p, Nan-well

resist

Boron implant

p+ implantd. nSelect mask and implant

p, Nan-well

resist

Arsenic implant

n+ implant

15

CMOS Process Flow

a. After anneal and CVD oxide

p, Nan-well

b. After CVD oxide active contact, W plugs

p, Nan-well

W W W W W W c. Metal 1 coating and patterning

p, Nan-well

Metal 1

Metal bonding pad

Bond

Bonding pad

Ke pin IC

Overglasswire

16

Design Rules

wp

wp

Sp-p

poly

poly

Wp = minimum width of polysilicon lineSp-p = minimum poly-topoly spacing

17

RESUME

• IC Fabrication: Flow of process.• Silicon Processing: wafer, material growth,

deposition.• Lythography: pattern, photoresist coating,

exposure steps, etching, n-type.• CMOS Process flow.• Design rules