XRD Excercises

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    X-ray diffraction exercises

    Dr. Sharon Mitchell and Prof. Javier Pérez-Ramírez

    Institute for Chemical and Bioengineering, ETH Zurich, Switzerland

    E-mail: [email protected] • http://www.perez-ramirez.ethz.ch

    Characterization of catalysts and surfaces Thermal methods

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    a)  b) 

    c)  d) 

    b

    a

    Problem 1

    Introduction to thermal analysis X-ray diffraction excercises

    Using the 2D lattice given below draw planes corresponding to a) (010) b) (200), c) (110),

    and d) (120).

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    Problem 2

    Introduction to thermal analysis X-ray diffraction excercises

    The diffraction pattern of copper metal was measured with X-ray radiation of wavelength of 

    1.315 Å. The first order Bragg diffraction peak was found at an angle 2 of 50.5°. Calculate the

    d-spacing between the diffracting planes in the copper metal.

    Bragg’s law n=2dsin  = 1.315 Å.

    2 = 50.5°

     = 25.25°

    d = /2sin 

    d = 1.54 Å

    Note: In order to calculate the d-spacing using Excel, theta must be in radians.

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    Problem 3

    Introduction to thermal analysis X-ray diffraction excercises

    n   / radians 2  /

     

    1 0.183 10.52 0.372 21.33 0.576 33.0

    4 0.813 46.65 1.139 65.2

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    Problem 4

    Introduction to thermal analysis X-ray diffraction excercises

    The quality of the experimental pattern shown below is very poor and only the strongest

    reflections are visible. Why might the signal to noise ratio be so low? If this is due to a bad data

    collection strategy, how might this be improved?

    Intensity of simulated pattern isarbitrary, scaled for ease of  visualization   cannot directlycompare intensities withexperimental pattern.

    Why is it important to obtain agood signal to noise ratio?

    What factors contribute to an

    experimental pattern?

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    Problem 4

    Introduction to thermal analysis X-ray diffraction excercises

    1) Sample. 2) Background 3) Noise

    + +

    Crystallinity/disorder

    Quantity

    Multiple phases

    Amorphous

    Particle size

    Variation of intensity

    with Bragg angle.

    Detector dependent

    e.g. Bragg-Brentano

    geometry greater

    divergence of X-ray beam

    at higher 2 .

    Incident beam

    Fluctuations in intensity of

    incident X-rays.

    Inelastic scattering /

    absorbance.

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    Problem 4

    Introduction to thermal analysis X-ray diffraction excercises

    How could we improve the data collection strategy?

    Sample preparation: Flat sample surface.

    Ensure sample fully

    illuminated by incident X-ray

    beam.

    Instrumental: Ensure incident beam monochromatic.

    Focusing of incident and diffracted beam using slits.

    Choice of wavelength.

    Higher incident beam intensity (synchrotron).

    Measurement parameters:

    Reduction of step size.

    Increased collection time.

    Mo Kα (= 0.71073 Å) and Cu Kα (= 1.54178 Å) most

    common laboratory X-ray sources. What influence does

    have on diffraction pattern?

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    Problem 4

    Introduction to thermal analysis X-ray diffraction excercises

    Mo Kα (= 0.71073 Å) and Cu Kα (= 1.54178 Å) most common laboratory X‐ray 

    sources. What influence does  have on diffraction pattern?

      Shorter  less absorption  Mo preferred  for strongly absorbing samples.

      Shorter  reflections  closer together  (Bragg  relationship).  more reflections are 

    observable for 2  

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    Problem 5

    Introduction to thermal analysis X-ray diffraction excercises

    Figure 1 shows the X-ray diffraction pattern of nanocrystalline silicon (n-Si) which exhibits

    significant line broadening with respect to that of bulk silicon (shown for comparison). Data

    was collected using Cu Kα radiation, = 1.54178 Å.

    i) Describe what factors might contribute to the line

    broadening. How could this data be used to

    estimate the size of the nano-crystallites?

    Bobs = B instr + Bsample = B instr + Bsize + Bstrain

    Binstr 

    -Dependent on experimental set up

    e.g. Monochromaticity of incident

    beam, beam divergence etc.

    -Direct relationship with θ .

    - Determined by measurement of

    suitable reference.

    Bsample = Bsize + Bstrain

    -Crystals have finite size (not infinitely periodic)

    Bsize

    Lattice imperfections (e.g. vacancies, substitutions,

    dislocations) Bstrain

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    Problem 5

    Introduction to thermal analysis X-ray diffraction excercises

    Figure 1 shows the X-ray diffraction pattern of nanocrystalline silicon (n-Si) which exhibits

    significant line broadening with respect to that of bulk silicon (shown for comparison). Data

    was collected using Cu Kα radiation, = 1.54178 Å.

    i) Describe what factors might contribute to the line

    broadening. How could this data be used to

    estimate the size of the nano-crystallites?

    Bobs = B instr + Bsample = B instr + Bsize + Bstrain

    Scherrer equation relates peak width to crystalline domain size

    Bstrain Frequently assumed to have the following dependence:

    Bstrain(2θ ) = 4 · ε0 ·tanθ 

    • Possible to gain information about sample if instrumental

    parameters are known.

    Bsize   1/cosθ 

    Bstrain   tanθ 

     

      

    cos2

     L

     K  B

     size 

    K = Scherrer constant, L = apparent ‘size’ of the crystalline domain / ÅB = Full width half maximum /°

    λ = Wavelength / Å

    ε0 =Δd/d

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    Problem 5

    Introduction to thermal analysis X-ray diffraction excercises

    Figure 1 shows the X-ray diffraction pattern of nanocrystalline silicon (n-Si) which exhibits

    significant line broadening with respect to that of bulk silicon (shown for comparison). Data

    was collected using Cu Kα radiation, = 1.54178 Å.

     

     cos

    2 L

     K  B

     size 

     

     

    cos size B

     K  L  

    Assuming K = 0.89 (i.e. for spherical crystalline domains).

    Then the size of the crystalline domains perpendicular to (331), L(331) = 1.6 Å.

    ii) For the reflection at 2 = 76.452°, the FWHM, B, is

    found to be 1.0886° after correction for instrumental

    contributions. Using the Scherrer equation estimate

    the size of the nano-crystalline domains.

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    Problem 5

    Introduction to thermal analysis X-ray diffraction excercises

    Figure 1 shows the X-ray diffraction pattern of nanocrystalline silicon (n-Si) which exhibits

    significant line broadening with respect to that of bulk silicon (shown for comparison). Data

    was collected using Cu Kα radiation, = 1.54178 Å.

    iii) Why might the size you calculated differ from the average

    particle size observed by electron microscopy?

    • Size of crystalline domain might not be clear from electron

    microscopy studies.

    • Crystalline domainsize may not behomogeneous.

    Gives average value perpendicular to reflection

    studied. May not be the same in all directions.

    • Inaccuracies based on calculation e.g. incorrect

    estimation of instrumental / strain broadening etc.

    • Crystalline domains may not be

    spherical.

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    Introduction to thermal analysis X-ray diffraction excercises

    In an effort to design catalysts for the CO2 reforming of methane, Co-Ce1−xZrxO2 catalysts with various ratiosof Ce/Zr were prepared by the co-precipitation method from the corresponding metal nitrates. Ce(NO3)3·6H2O,

    Zr(NO3)4·5H2O and Co(NO3)2·6H2O in stoichiometric ratios. The CoO content was fixed at 16 wt.%. The PXRD of 

    the materials obtained is shown in Figure A. The PXRD patterns of the 4 crystalline phases, cubic fluorite

    structure of CeO2, the cubic and tetragonal phases of ZrO2 and the catalytic phase Co3O4 identified by theauthors are shown in Figure B.

    N. Wang, W. Chu, L. Huang, T. Zhang, J. Natural Gas Chem. 19 (2010), 117.

    Co3O4

    i) Comparing the reflections in Figure B, what are the

    best reflections:

    a) to identify the presence of each phase?b) to differentiate between the tetragonal and cubic

    forms of ZrO2.

    Problem 6

    • To assign diffraction patterns of multi-phase materials

    easiest to identify the most intense reflections first.• Reflection should not overlap with that of another

    possible phase.• If a phase is present all reflections should be present, but weaker reflections

    may not be visible if signal to noise ratio is low.

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    Introduction to thermal analysis X-ray diffraction excercises

    Problem 6

    ii) Based on the information in Figure B, assign the reflections in Figure A as far as you can.

    In an effort to design catalysts for the CO2 reforming of methane, Co-Ce1−xZrxO2 catalysts with various ratiosof Ce/Zr were prepared by the co-precipitation method from the corresponding metal nitrates.

    Ce(NO3)3·6H2O, Zr(NO3)4·5H2O and Co(NO3)2·6H2O in stoichiometric ratios. The CoO content was fixed at 16

    wt.%. The PXRD of the materials obtained is shown in Figure A. The PXRD patterns of the 4 crystalline

    phases, cubic fluorite structure of CeO2, the cubic and tetragonal phases of ZrO2 and the catalytic phaseCo3O4 identified by the authors are shown in Figure B.

    Co3O4and CeO2, ZrO2

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    Introduction to thermal analysis X-ray diffraction excercises

    Problem 6

    iii) Are any reflections unaccounted for? What might be the origin of these reflections?

    Circled reflectionsunaccounted for inreported phaseassignment

    In an effort to design catalysts for the CO2 reforming of methane, Co-Ce1−xZrxO2 catalysts with variousratios of Ce/Zr were prepared by the co-precipitation method from the corresponding metal nitrates.

    Ce(NO3)3·6H2O, Zr(NO3)4·5H2O and Co(NO3)2·6H2O in stoichiometric ratios. The CoO content was fixed at 16

    wt.%. The PXRD of the materials obtained is shown in Figure A. The PXRD patterns of the 4 crystalline

    phases, cubic fluorite structure of CeO2, the cubic and tetragonal phases of ZrO2 and the catalytic phaseCo3O4 identified by the authors are shown in Figure B.

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    Introduction to thermal analysis X-ray diffraction excercises

    Problem 6

    iv) By looking at the variation in peak broadening, what can we tell about the variation in crystallinity withcomposition?

    In an effort to design catalysts for the CO2 reforming of methane, Co-Ce1−xZrxO2 catalysts with variousratios of Ce/Zr were prepared by the co-precipitation method from the corresponding metal nitrates.

    Ce(NO3)3·6H2O, Zr(NO3)4·5H2O and Co(NO3)2·6H2O in stoichiometric ratios. The CoO content was fixed at 16

    wt.%. The PXRD of the materials obtained is shown in Figure A. The PXRD patterns of the 4 crystalline

    phases, cubic fluorite structure of CeO2, the cubic and tetragonal phases of ZrO2 and the catalytic phaseCo3O4 identified by the authors are shown in Figure B.

    • Narrowest reflections observed for single phase oxides (e.g. CeO2 or

    ZrO2).• Assuming identical synthesis conditions in all cases this is unlikely

    to be due to large differences in crystal domain size as time for

    crystal growth would be equivalent Greater crystallinity.

    • At intermediate compositions (solid solutions of Co-Ce1−xZrxO2 ) thereflections are broadened.

    • Substitution of Zr into the CeO2 lattice or vice versa causes

    imperfections in the infinite lattice (due to differing size) strain

    broadening.

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    Introduction to thermal analysis X-ray diffraction excercises

    Problem 6

    v) At which composition might the catalytic Co3O4 phase have the smallest crystallite size?

    In an effort to design catalysts for the CO2 reforming of methane, Co-Ce1−xZrxO2 catalysts with variousratios of Ce/Zr were prepared by the co-precipitation method from the corresponding metal nitrates.

    Ce(NO3)3·6H2O, Zr(NO3)4·5H2O and Co(NO3)2·6H2O in stoichiometric ratios. The CoO content was fixed at 16

    wt.%. The PXRD of the materials obtained is shown in Figure A. The PXRD patterns of the 4 crystalline

    phases, cubic fluorite structure of CeO2, the cubic and tetragonal phases of ZrO2 and the catalytic phaseCo3O4 identified by the authors are shown in Figure B.

    • Content of CoO during coprecipitation is fixed at 16 wt.%.

    • Extent of incorporation into the Ce1−xZrxO2 structure dependent on

    the phase diagram and on the relative rates of precipitation of the

    crystalline components.

    • Reflections of Co3O4 phase most intense for materials with high

    ZrO2 contents. (larger) crystalline domains of Co3O4.

    • Assuming that all Co(NO3)2·6H2O is precipitated the smallest

    reflection observed for CeO2:ZrO2 = 4:1 probably smallest

    crystallite size.

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    Introduction to thermal analysis X-ray diffraction excercises

    Problem 7The (hydrothermal) reaction of MgO and Al2O3 is a green chemistry route for the preparation of hydrotalcite, alayered metal hydroxide and commonly used precursor for the preparation of Mg xAlO a well known solid base

    catalyst. The PXRD patterns compared below show the PXRD patterns of the materials obtained following

    hydrothermal reaction under three different conditions: 1) Reaction in conventional oven at 100°C, 2) reaction

    in a microwave oven at 100°

    C and 3) Reaction in a microwave oven at 180°

    C. Each reaction was undertakenfor 120 minutes with equivalent quantities of MgO, Al2O3, and H2O.

    S. Mitchell, I.R. Baxendale, W. Jones, Green Chem. 10 (2008), 629.

    • Same reflections observed in both diffraction patterns No

    variation in phase selectivity with heating method.

    • Reflections in the material obtained by conventional heating

    broader than those observed in the material prepared using

    microwave irradiation.

    • Use of microwave irradiation larger crystallite size/ higher

    crystallinity.

    Improved heating (rapid and homogeneous faster

    nucleation and growth?

    i) Comparing the PXRD pattern of the materials obtained under conditions 1 and 2, what can we say about the

    influence of the heating method (conventional or microwave oven) on the reaction?

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    Introduction to thermal analysis X-ray diffraction excercises

    Problem 7The (hydrothermal) reaction of MgO and Al2O3 is a green chemistry route for the preparation of hydrotalcite, alayered metal hydroxide and commonly used precursor for the preparation of Mg xAlO a well known solid base

    catalyst. The PXRD patterns compared below show the PXRD patterns of the materials obtained following

    hydrothermal reaction under three different conditions: 1) Reaction in conventional oven at 100°C, 2) reaction

    in a microwave oven at 100°

    C and 3) Reaction in a microwave oven at 180°

    C. Each reaction was undertakenfor 120 minutes with equivalent quantities of MgO, Al2O3, and H2O.

    ii) By comparison of the reaction under conditions 2 and 3, what can we determine about the influence of

    temperature on the materials obtained?

    • New reflections observed on increasing the temperature

    to 180°C.

    Change in phase selectivity. New phase formed at high

    temperature (e.g. thermal stability).

    • Although similar in appearance closer observation shows

    that some reflections shifted to higher diffraction angles,some to lower and some remain in the same position.

    Structural differences in materials obtained at 100 and

    180°C.

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    Introduction to thermal analysis X-ray diffraction excercises

    Problem 7iii) The layers in hydrotalcite may stack with different arrangements leading to ‘polytypes’ which may beidentified by PXRD. The positions and relative intensities of the reflections expected for the two most common

    arrangements (A and B) are summarized in the table below. Try to confirm if hydrotalcite was formed in any of

    the reactions and if so in which polytype.Polytype A Polytype B

    (hkl)   2  / °   Intensity   2  / °   Intensity

    (003)   11.6 Strong 12.1 Strong(006)   23.3 Strong 24.2 Strong

    (101)   ‐ ‐   34.2 Medium(012)   34.9 Strong   ‐ ‐(104)   ‐ ‐   37.9 Strong(015)   39.3 Medium   ‐ ‐

    (107)  ‐ ‐

      45.0 Weak(108)   46.8 Medium   ‐ ‐(1010) 53.0 Weak 54.0 Weak(110)   60.7 Medium 60.7 Medium(113)   62.1 Medium 62.2 Medium

    • Polytype A formed at 100°

    C.• At 180°C predominant phase formed is polytype B.

    • Some reflections corresponding to polytype A also

    observed.

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    Introduction to thermal analysis X-ray diffraction excercises

    Problem 7iv) This data was collected using monochromated Cu Kα radiation (λ = 1.5418 Å). Using the Bragg relationship(n λ = 2dsin ) calculate the d-spacing associated with the (003) reflection of hydrotalcite.

    • For the (003) reflection 2 = 11.6°.

    • d=n λ/2sin 

    • d=7.63 Å.

    How does this relate to the lattice parameter, c ,for this hydrotalcite?

    c = 3*d = 22.88 Å.