All Rights Reserved Copyright (c) Bee Technologies Inc. 2008

1

Device Modeling Report

Bee Technologies Inc.

COMPONENTS: MOSFET (Professional Model) PART NUMBER: 2SK4064LS MANUFACTURER: SANYO REMARK: Body Diode (Professional Model)

All Rights Reserved Copyright (c) Bee Technologies Inc. 2008

2

MOSFET MODEL

PSpice model parameter

Model description

LEVEL

L Channel Length

W Channel Width

KP Transconductance

RS Source Ohmic Resistance

RD Ohmic Drain Resistance

VTO Zero-bias Threshold Voltage

RDS Drain-Source Shunt Resistance

TOX Gate Oxide Thickness

CGSO Zero-bias Gate-Source Capacitance

CGDO Zero-bias Gate-Drain Capacitance

CBD Zero-bias Bulk-Drain Junction Capacitance

MJ Bulk Junction Grading Coefficient

PB Bulk Junction Potential

FC Bulk Junction Forward-bias Capacitance Coefficient

RG Gate Ohmic Resistance

IS Bulk Junction Saturation Current

N Bulk Junction Emission Coefficient

RB Bulk Series Resistance

PHI Surface Inversion Potential

GAMMA Body-effect Parameter

DELTA Width effect on Threshold Voltage

ETA Static Feedback on Threshold Voltage

THETA Mobility Modulation

KAPPA Saturation Field Factor

VMAX Maximum Drift Velocity of Carriers

XJ Metallurgical Junction Depth

UO Surface Mobility

All Rights Reserved Copyright (c) Bee Technologies Inc. 2008

3

Transconductance Characteristic

Circuit Simulation Result

Comparison table

Id(A) gfs (s)

Error (%) Measurement Simulation

1 3.750 3.933 4.88

2 5.300 5.473 3.26

5 8.200 8.388 2.29

10 11.250 11.465 1.91

All Rights Reserved Copyright (c) Bee Technologies Inc. 2008

4

V1

0Vdc

V2

20

0

V3

0Vdc

U12SK4064LS

V_V1

0V 2V 4V 6V 8V 10V 12V 14V

I(V3)

0A

5A

10A

15A

20A

25A

Vgs-Id Characteristic

Circuit Simulation result

Evaluation circuit

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5

Comparison Graph Circuit Simulation Result

Simulation Result

ID(A) VGS(V)

Error (%) Measurement Simulation

1 5.400 5.316 -1.556

2 5.600 5.528 -1.286

5 6.000 5.959 -0.683

10 6.525 6.462 -0.966

20 7.250 7.202 -0.662

All Rights Reserved Copyright (c) Bee Technologies Inc. 2008

6

0

V3

0Vdc

VDS

0Vdc

V1

15

U12SK4064LS

V_VDS

0V 1.0V 2.0V 2.7V

I(V3)

0A

2.0A

4.0A

6.0A

Rds(on) Characteristic

Circuit Simulation result

Evaluation circuit

Simulation Result

ID = 6A, VGS = 15V Measurement Simulation Error (%)

RDS (on) 0.450 0.450 0.067

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7

VDD

200

I1TD = 0

TF = 5nPW = 600uPER = 1000u

I1 = 0I2 = 1m

TR = 5n -

+

W1

ION = 0uAIOFF = 1mAW

I2

12

0

D2

DbreakU12SK4064LS

Time*1mA

0 10n 20n 30n 40n

V(W1:3)

0V

2V

4V

6V

8V

10V

Gate Charge Characteristic Circuit Simulation result

Evaluation circuit

Simulation Result

VDD=200V, ID=12A, VGS=10V

Measurement Simulation Error (%)

Qgs nC 14.000 14.039 0.279

Qgd nC 12.500 12.596 0.768

Qg nC 37.000 37.042 0.114

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8

Capacitance Characteristic

Simulation Result

VDS (V) Cbd (pF)

Error (%) Measurement Simulation

5 460.00 458.000 -0.43

10 321.00 326.000 1.56

20 230.00 231.000 0.43

30 191.00 188.000 -1.57

Simulation

Measurement

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9

0

VDD205Vdc

V2TD = 1u

TF = 5nPW = 10uPER = 20u

V1 = 0

TR = 5n

V2 = 20

U1TK14A55D

L2

50nH

R2

50

R1

50

L1

30nH

RL

29

Time

0.5us 1.0us 1.5us

1 V(U1:G) 2 V(U1:D)

0V

2V

4V

6V

8V

10V

12V1

0V

40V

80V

120V

160V

200V

240V2

>>

Switching Time Characteristic Circuit Simulation result

Evaluation circuit

Simulation Result

ID=6A, VDD=200V VGS=0/10V

Measurement Simulation Error(%)

td(on) ns 52.000 52.133 0.256

VGS

ID

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10

V2

30V1

0

0

V3

0Vdc

U12SK4064LS

V_V2

0V 5V 10V 15V 20V 25V 30V

I(V3)

0A

5A

10A

15A

20A

25A

30A

35A

Output Characteristic

Circuit Simulation result

Evaluation circuit

VGS=5V

6

10 8

7 55

9 55

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11

Output Characteristics Reference

All Rights Reserved Copyright (c) Bee Technologies Inc. 2008

12

VSD

0

Vsense

0Vdc

U12SK4064LS

V_VSD

0V 0.4V 0.8V 1.2V 1.6V

I(Vsense)

10mA

100mA

1.0A

10A

100A

BODY DIODE SPICE MODEL Forward Current Characteristic

Circuit Simulation Result

Evaluation Circuit

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13

Comparison Graph Circuit Simulation Result

Simulation Result

IDR(A) VSD(V)

%Error Measurement Simulation

0.01 0.555 0.553 -0.36

0.02 0.574 0.573 -0.17

0.05 0.598 0.599 0.17

0.10 0.618 0.620 0.32

0.20 0.640 0.641 0.16

0.50 0.674 0.672 -0.30

1.00 0.700 0.698 -0.29

2.00 0.730 0.732 0.27

5.00 0.800 0.797 -0.38

10.00 0.880 0.882 0.23

20.00 1.030 1.029 -0.10

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14

V1

TD = 0us

TF = 10nsPW = 32usPER = 50us

V1 = -9.45v

TR = 10ns

V2 = 10.65v

R1

50

0

U1

D2SK4064LS_P

Time

12us 16us 20us 24us 28us 32us 36us 40us 44us 48us

I(R1)

-400mA

-300mA

-200mA

-100mA

-0mA

100mA

200mA

300mA

400mA

Reverse Recovery Characteristics Circuit Simulation Result

Evaluation Circuit

Compare Measurement vs. Simulation

Measurement Simulation Error (%)

trj us 1.040 1.047 0.67

trb us 1.440 1.443 0.21

trr us 2.480 2.490 0.40

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15

Reverse Recovery Characteristic Reference

Trj= 1.04 (us) Trb= 1.44 (us) Conditions:Ifwd=lrev=0.2(A),Rl=50

Relation between trj and trb

Example

Measurement