incorporated with boron nitride nanosheets interlayer ... · Sandwich-structured P(VDF-HFP)...

Supplementary materials

Sandwich-structured P(VDF-HFP) composite film

incorporated with boron nitride nanosheets interlayerFujia Chen1, Yujiu Zhou1, Jimin Guo1, Song Sun1, Yuetao Zhao2,†, Yajie Yang1 and Jianhua Xu1,‡

1 State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China.

2 School of Electronics and Information, Jiangsu University of Science and Technology, Zhenjiang 212003, China.

* Correspondence: zhaoyuetao@yeah.net (†); jianhuaxu215@163.com (‡).Tel.: +86-28-83207027Fax: +86-28-83206123

1. FTIR The prepared experimental samples were characterized by FTIR.

Figure S1 FTIR image of several P(VDF-HFP) films

2. XRD The prepared experimental samples were characterized by XRD.

Electronic Supplementary Material (ESI) for RSC Advances.This journal is © The Royal Society of Chemistry 2019

Figure S2 XRD image of several P(VDF-HFP) films

3. Weibull distributionThe films doped with different concentrations of BNNSs were analyzed for their

breakdown characteristics by Weibull distribution. The result is shown in Figure S3.

Figure S3 Weibull distribution of BNNSs concentration test

4. P-E hysteresis loopsThe P-E hysteresis loops can be used to calculate the charge-discharge efficiency of

ferroelectric materials. P-E hysteresis loops of films were measured by using a ferroelectric tester. Several sample films were measured under 500, 1000, 1500, 2000, 2500 and 3000 kV/cm electric fields at 10 Hz, respectively. The measurement results are shown in Figure S4.

Figure S4 P-E hysteresis loops of (a) P(VDF-HFP), (b) P(VDF-HFP)/BT, (c) P(VDF-HFP)/BT@DPA, (d) HFP/BT@DPA/BNNSs, (e) PBP/BT@DPA

5. Leakage currentsAs shown in Figure S5, the leakage currents of films were measured under 200, 400,

600 and 800 kV/cm electric fields, respectively. The measure time was set as 200 ms and 20000 ms, respectively.

Figure S5 Leakage currents of several films from (a) P(VDF-HFP), (b) P(VDF-HFP)/BT, (c) P(VDF-HFP)/BT@DPA, (d) HFP/BT@DPA/BNNSs, (e)

PBP/BT@DPA