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ATE Debugging tool. 효율적 테스트 / 디버그를 위한 디자인과 테스트 업체의 연구 방안. Korea Test Conference Jin-Soo Ko (jin-soo.ko@teradyne.com) June 25, 2014. SW and debug tools magnify needle !. Market trends driving ATE SW tOOL roadmap. IG-XL : #1 in ATE Software - Why need Good SW-debug tool?. - PowerPoint PPT Presentation
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Korea Test Conference
Jin-Soo Ko
(jin-soo.ko@teradyne.com)
June 25, 2014
ATE Debugging tool
효율적 테스트 / 디버그를 위한 디자인과 테스트 업체의 연구 방안
SW AND DEBUG TOOLS MAGNIFY NEEDLE!
MARKET TRENDS DRIVING ATE SW TOOL ROADMAP
3
Test EngineerShorter Time To Market
Less Than 15 Days Si to Samples
Functional IntegrationLarge Test ListsCollaborative Development
Quality<100 DPM For Mobility Devices
Complex FlowsIncreased Device
Configuration and Repair
COT PressuresHigher Multisite, Concurrent
Test, Datalog overhead
Faster Time To Volume
>1M devices within 2 Months
IG-XL: #1 IN ATE SOFTWARE - WHY NEED GOOD SW-DEBUG TOOL?
30% faster test program development time Native MultiSite, Program Modularity, Templates, “Debug in the Zone”, Complete tool set, ESA
Optimal throughput early in the product ramp resulting in faster time to profits.
IG-XL’s Pure Parallel, Native MultiSite, Background DSP, TrueCT, Timelines
Faster time to entitled yield Scan fail capture throughput, APIs to design environments, Protocol Aware
Better quality programs that result in fewer RMAs and defect escapes
VBT, Spike-Check tool, Simulation Tools, IG-Review, IG-Diff
New users become self sufficient faster Easy to learn programming language, DUT Centric use model, Template programming
IG-XL has been ranked #1 in ATE Software for the last four years by VLSI Customer Satisfaction Research Survey
DESIGN TEST DESIGN LOOPD
esig
n
Sim
ulat
ion
On-Tester Debug/ Characterization (hours/minutes)
• Timing/Levels• Mixed Signal• Repeatability• Correlation
Pattern & Test program. Gen.
events
transactions
ATPG
STDF
“off tester” tools
“on tester” tools
Failure Analysis / Yield Enhancement
EDA-based Pattern Viewer• Simultaneous display of EDA and tester
information
• Diagnose Physical Device Faults
5
HOW ARE SCAN FAILURES RESOLVED NOW?
• Tools are not integrated
• Information is lost or delayed between Test / Design / FA
• Investigations can take weeks to complete
6
THE TESTER IS ONLY PART OF A BIGGER PROCESS
Advanced ATE SW tools for Time to Market
OPENEDA: CONNECTING ATE SW (IG-XL) TO THE ENTIRE DESIGN AND TEST ENVIRONMENT
Design and Test Development:
EDA LinksTest Program GenerationFeedback To SimulationTest-Design IntegrationYield LearningData Analysis
High Volume Manufacturing:
Test Floor ManagementFactory Data ManagementAdaptive TestPart Average TestingOperator InterfacesPeripherals and HandlersYield MonitoringOEE
8
Program Instruments with Psets (All
instruments in parallel)
Select Source Signal
Trigger measurements at precise times
Reprogram Instruments with PSets
Select different Source Signal
Trigger measurements at precise times
Automatic data move and processing
-3dB
Automatic data move and processing
…and so on…
Since the Engineer can control all the events from one pattern, we have Pattern Oriented Programming (POP)
Exact Timeline
WHAT THE TEST ENGINEER SEES…. POP
9
CONCURRENT TEST TOOL
TestsBlock A
TestsBlock BTests
Block CTestsBlock D
TestsBlock E
Initial
TestsBlock F
TestTime
Full FunctionalTest
Concurrent Test FlowSerial Test Flow
TestsBlock A
TestsBlock B
TestsBlock C
TestsBlock D
TestsBlock E
TestsBlock F
TestTime
Initial
Full FunctionalTest
Development Challenges• Common bus/pins• Shared test resources• Flow manipulation• Multi-site implementation• Adaptive test & Retest• Debug tools
10
Timeline viewer
MULTI-SHEET USE MODEL
• Separate test code & data for each sub program
• Tied together at the Job List Sheet
• IG-XL 8.10.11 completes the Multi-Sheet Model
Sub-Program B
Sub-Program A
• Enabler for independent development• Reduces time to integrate
= no more manual merging of sub programs
RF TOOLS- LTE-A TX SIGNAL DEBUG TOOL AND RESULT
IG-XL 7.30
• ESA 2.0 3GPP LTE TD-SCDMA 802.11n 4x4 MIMO VSA 10.01• 1 port vector• Power de-embedding• Signal sheet support• Smith charting
IG-XL 7.40
• ESA 2.5 3GPP LTE Update Bluetooth 3.0 VSA 11
IG-XL 8.00.01
• ESA 3.0 LTE 8.9 VSA12
IG-XL 8.10
• ESA 3.5 LTE-A (R10) 802.11ac VSA 14
IG-XL 8.20
• ESA 4.0 LTE-A (100MHz) 802.11ac (160MHz) 802.11ac (80+80) BT 4.0 (LE) VSA 16• 90% reduction in VSA
instance creation times
PROTOCOL AWARE
“Stored Response” ATE Complex Device Architecture
Tries to Test
Integrated Mobile Device
CPU
DRAMI/F
FlashI/F
JTAGI/F
USBI/F
DSPBB
Proc
Power MgmtFunctions
Audio / BBFunctions GPS
3G RF
WiFi
FM/TVWrite.jtag ( ADDR: 04h, DATA: 55h)Read.jtag (ADDR: 0Ah, DATA read_var)
Protocol Definition Editor For defining and modifying protocols
Protocol StudioFor online debug of protocol transactions
• Transaction results
• Debug displays
• Data capture setups
• Module management
• Port Properties
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