Qualification and Characterization of the FM27C256 Diodes...Mar 27, 2000 · 3 INTRODUCTION This...

Qualification andCharacterization of the

FM27C256

Product : 256K bit UV EPROM

Organization: 32k x 8Technology : CMOS

Process : TS-55

Die Size : 100 x 92 mils

Passivation: Oxy-Nitride planarization

Packages: CERDIP PDIP

Fairchild Semiconductor Salt Lake3333 West 9000 SouthWest Jordan, UT 84088-8838Fax: 1.801.562.7500

TABLE OF CONTENTS

Introduction…………………………………………………..…………3

QualificationSummary……………………………………….………………………4

Die Qualification Summary………..………………………………….6

AC/DC Characteristics…..…………………………………….………7

Datasheet Parameter Table…………………………………..8

SHMOO Plots At 85°C ….……………………………….…..9

At 25°C…………………………….………………..…10

At 0°C..…………………..…………………………... 11

At -40°C.…………………..…………………...………12

Programmability……………………………………………………….13

Erasability………………………………………………………….…..14

Electrostatic Discharge……………………………………………….15

Pin Capacitance………………………………………………..……..16

Latch-up…………………………………………………………..……17

Die Layout…..…………………………………………………..……..18

Packages & Pinouts…..………………………………………………19

Appendix I (Qual/Reliability Test Conditions) ..…………………….22

Appendix II (Compatible Programmers Guide)..…………………..23

INTRODUCTIONThis report is a summary of the qualification and characterization of theFM27C256 manufactured by Fairchild Semiconductor. The FM27C256is a high-speed 256K UV erasable and electrically reprogrammable.This part is ideal for applications where fast turnarounds,experimentation of patterns, or low power consumption are importantrequirements. The FM27C256 was using the new TS55 fabricationprocess. This process is a .6µm process that allows higher memorydensity and increased part speed. Qualification summaries andcharacterization reports are included in this report. Ten parts from LotNOIO120 were tested at –40°C, 0°C, 25°C and 85°C with acheckerboard pattern for the characterization report.

PROCESS QUALIFICATION SUMMARY

TS55 Process Qualification Results - May 13, 1998

Test Lot# / wf Samples

168hr 500hrs 1000hrs Package

HTOL N7J3654/21N7J3655/7N7J3655/4N7J3731/9

77 777777

ceramicceramicplasticplastic

HTOL N7J3655/9N7J3663/4,6N7J3693/4,8

777777

plasticplasticplastic

Test Lot#/wf Samples 168hr 500hrs 1000hrs 2000hrs Package

HTSL N7J3655/9N7J3663/4,6N7J3693/4,8

557777

HTSL N7J3654/21N7J3655/7N7J3655/4N7J3731/9

77777777

Test Lot# / wf Samples

100cyc 500cyc 1000cyc Package

TMCL N7J3654/21N7J3655/7N7J3655/4N7J3731/9

78 787878

HTOL N7J3655/9N7J3663/4,6N7J3693/4,8

777777

See Appendix I for test definitions and conditions.

QUALIFICATION RESULTS CONT.

Test Lot#/wf Samples 96hrs 168hrs 240hrs 336hrs Package

ACLV N7J3655/9N7J3663/4,6

plasticplastic

Test Lot#/wf Samples 168hrs 500hrs 1000hrs 2000hrs Package85/85 N7J3655/9

N7J3663/4,6 58 77

plastic plastic

DIE QUALIFICATION SUMMARY

FM27C256 Die Qualification Results – Mar 27, 2000

Test Lot# Samples

168hr Package

HTOL NOIO120 100 0 ceramic

Test Lot# Samples 168hr Package

HTSL NOIO120 100 0 ceramic

See Appendix I for test definitions and conditions.

AC/DC CHARACTERISTICS

The following sections are data gathered from the characterization of 10FM27C256 parts from Lot NOIO120. We programmed these parts witha checkerboard pattern using the Standard NSC Algorithm. Allcharacterization tests were executed on the Epro 142 tester. The partswere tested at four temperatures: -40°C, 0°C, 25°C, and 85°C. All datais summarized by temperature in all parts of this section.

DATA SHEET PARAMETER TABLE

FM27C256AC & DC CHARACTERIZATION DATA

System : Erpo-142 Pattern: Ckbd Sample size: 10 parts

Symbol Description Limit -40C 0C 25C 85C

VIL INPUT LOW >0.8V Mean 0.90V 0.94V 1.04V 1.04VVOLTAGE @4.5V Std Dev 0.03 0.02 0.00 0.01

VIH INPUT HIGH <2.0V Mean 1.61V 1.57V 1.45V 1.42VVOLTAGE @5.5V Std Dev 0.05 0.03 0.01 0.01

VOL OUTPUT LOW <0.4V Mean 0.13V 0.14V 0.15V0.16V

VOLTAGE @2.1Ma Std 0.00 0.01 0.00 0.01

VOH OUTPUT HIGH >3.5V Mean 4.41V 4.40V 4.42V 4.40VVOLTAGE @-2.5Ma Std 0.00 0.00 0.00 0.00

ISB2 Icc STANDBY <100uA Mean 40.8uA 40.0uA 39.7uA 34.5uACURRENT (CMOS) @5.5V Std 1.50 1.20 0.60 0.22

ISB1 Icc STANDBY <1mA Mean .40mA .39mA .35mA .34mACURRENT (TTL) @5.5V Std 0.04 0.01 0.02 0.02

ICC Icc ACTIVE <30mA Mean 10mA 9.5mA 9.4mA 9.2mACURRENT (5MHz) @5.5V Std 0.001 0.001 0.001 0.001

ILI INPUT LEAKAGE <1uA Mean 0.01uA 0.06uA 0.08uA 0.08uACURRENT @5.5V Std 0.01 0.02 0.01 0.02

ILO OUTPUT LEAKAGE <1uA Mean 0.04uA 0.03uA 0.03uA 0.02uACURRENT @5.5V Std 0.01 0.01 0.01 0.01

TACC ADDRESS <100nS Mean 50nS 52nS 54nS 60nSACCESS TIME @4.5V Std 2.30 2.23 1.2 .98

TCE CHIP ENABLE <100nS Mean 51nS 54nS 55nS61nS

ACCESS TIME @4.5V Std 1.78 1.73 2.23 1.92

Shmoo PlotsAT 85°

(VCC) 6000-......PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|......PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|....….PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|......PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP 5500-|......PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|.......PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|.......PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP 5000-|.......PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|........PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|........PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP 4500-|..........PPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|..........PPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|............PPPPPPPPPPPPPPPPPPPPPPPPPPP

|.............PPPPPPPPPPPPPPPPPPPPPPPPPP 4000-|..............PPPPPPPPPPPPPPPPPPPPPPPPP

|...............PPPPPPPPPPPPPPPPPPPPPPPP

|.................PPPPPPPPPPPPPPPPPPPPPP

|..................PPPPPPPPPPPPPPPPPPPPP

|...................PPPPPPPPPPPPPPPPPPPP 3500-|.......................................

|---------|---------|---------|---------|

40 60 80 100 120

VILA (Vcc) 6500-|PPPPPPPPPPP.........

|PPPPPPPPPPP......... |PPPPPPPPPPP......... |PPPPPPPPPPP......... |PPPPPPPPPPP.........

5000-|PPPPPPPPPPP......... |PPPPPPPPPPP.........

|PPPPPPPPPPP......... |PPPPPPPPPPP......... |PPPPPPPPPPP.........

3500-|.................... |---------|---------| 500 1000 1500

(VILA)

(Vcc) 6000-|......PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|........PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP 5000-|........PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|..........PPPPPPPPPPPPPPPPPPPPPPPPPPPPP 4500-|..........PPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|...........PPPPPPPPPPPPPPPPPPPPPPPPPPPP

|............PPPPPPPPPPPPPPPPPPPPPPPPPPP 4000-|.............PPPPPPPPPPPPPPPPPPPPPPPPPP

|.............PPPPPPPPPPPPPPPPPPPPPPPPPP

|..............PPPPPPPPPPPPPPPPPPPPPPPPP

|....................................... 3500-|.......................................

|---------|---------|---------|---------|

40 60 80 100120

VIHA (Vcc) 6500-|.........PPPPPPPPPPPPPPPP

|........PPPPPPPPPPPPPPPPP |........PPPPPPPPPPPPPPPPP |........PPPPPPPPPPPPPPPPP |.......PPPPPPPPPPPPPPPPPP

3500-|......................... |---------|---------|----- 1000 1600 2200

(VIHA)

SHMOO PLOTSAT 25°C

(VCC) 6000-....PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|....PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|....PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP 5500-|....PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|.....PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|.....PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP 5000-|.....PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|......PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP 4500-|.......PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|............PPPPPPPPPPPPPPPPPPPPPPPPPPP 4000-|.............PPPPPPPPPPPPPPPPPPPPPPPPPP

|...............PPPPPPPPPPPPPPPPPPPPPPPP

|................PPPPPPPPPPPPPPPPPPPPPPP

|................PPPPPPPPPPPPPPPPPPPPPPP 3500-|.......................................

|---------|---------|---------|---------|

40 60 80 100120

VILA (Vcc) 6500-|PPPPPPPPPPP.........

|PPPPPPPPPPP......... |PPPPPPPPPPP......... |PPPPPPPPPPP......... |PPPPPPPPPPP.........

5750-|PPPPPPPPPPP......... |PPPPPPPPPPP......... |PPPPPPPPPPP.........

|PPPPPPPPPPP......... |PPPPPPPPPPP.........

3500-|.................... |---------|---------| 500 1000 1500

(VILA)

TCE (Vcc) 6000-|....PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|.........PPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|..........PPPPPPPPPPPPPPPPPPPPPPPPPPPPP 4000-|...........PPPPPPPPPPPPPPPPPPPPPPPPPPPP

|....................................... 3500-|.......................................

|---------|---------|---------|---------|

40 60 80 100120

(TCE) NOTE: TCE 3.7V - 7.9V

VIHA (Vcc) 6500-|.........PPPPPPPPPPPPPPPP

|........PPPPPPPPPPPPPPPPP |........PPPPPPPPPPPPPPPPP |........PPPPPPPPPPPPPPPPP |.......PPPPPPPPPPPPPPPPPP

5750-|.......PPPPPPPPPPPPPPPPPP |.......PPPPPPPPPPPPPPPPPP

|......PPPPPPPPPPPPPPPPPPP |......PPPPPPPPPPPPPPPPPPP |......PPPPPPPPPPPPPPPPPPP

3500-|......................... |---------|---------|----- 1000 1600 2200

(VIHA)

SHMOO PLOTSAT 0°C

(VCC) 6000-..PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|..PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|..PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP 5500-|..PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|...PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|....PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP 5000-|....PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|..........PPPPPPPPPPPPPPPPPPPPPPPPPPPPP 4000-|...........PPPPPPPPPPPPPPPPPPPPPPPPPPPP

|.............PPPPPPPPPPPPPPPPPPPPPPPPPP

|...............PPPPPPPPPPPPPPPPPPPPPPPP 3500-|.....................................PP

|---------|---------|---------|---------|

40 60 80 100 120

VILA (Vcc) 6500-|PPPPPPPPPPPPPPP.....

|PPPPPPPPPPPP..P..... |PPPPPPPPPPPP........ |PPPPPPPPPPPP.P...... |PPPPPPPPPPPPPPP.....

5750-|PPPPPPPPPPPPPPP..... |PPPPPPPPPPPPPPP.....

|PPPPPPPPPPPPPPP..... |PPPPPPPPPPPPPP...... |PPPPPPPPPPPPPP......

3500-|PPPPPPPPPPP......... |---------|---------| 500 1000 1500

(VILA) NOTE: VILA

TCE (Vcc) 6000-|..PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|...PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP 5500-|...PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|.....PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP 5000-|......PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|........PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP 4000-|.........PPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|.............PPPPPPPPPPPPPPPPPPPPPPPPPP 3500-|.......................................

|---------|---------|---------|---------|

40 60 80 100120

(TCE) NOTE: TCE 3.7V - 7.9V

VIHA (Vcc) 6500-|..................PPPPPPP

|.................PPPPPPPP |................PPPPPPPPP |................PPPPPPPPP |...............PPPPPPPPPP

5750-|..............PPPPPPPPPPP |.............PPPPPPPPPPPP

|...........PPPPPPPPPPPPPP |..........PPPPPPPPPPPPPPP |.........PPPPPPPPPPPPPPPP

3500-|...PPPPPPPPPPPPPPPPPPPPPP |---------|---------|----- 1000 1600 2200

(VIHA) NOTE: VIHA

SHMOO PLOTSAT -40°C

(VCC) 6000-.P.PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|.PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|.PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP 5500-|.PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|...PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP 5000-|...PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|.........PPPPPPPPPPPPPPPPPPPPPPPPPPPPPP 4000-|..........PPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|..............P.PPPPPPPPPPPPPPPPPPPPPPP 3500-|.......................................

|---------|---------|---------|---------|

40 60 80 100120

VILA (Vcc) 6500-|PPPPPPPPPPPP..P.....

|PPPPPPPPP...PP...... |PPPPPPPPPPP......... |PPPPPPPPPPPPP....... |PPPPPPPPPPPPPP......

5000-|PPPPPPPPPPPPPP......

|PPPPPPPPPPPPP....... |PPPPPPPPPPPPP....... |PPPPPPPPPPPP........ |PPPPPPPPPPPP........

4250-|PPPPPPPPPPPP........ |PPPPPPPPPP.......... |PPPPPPPPP...........

|PPPPPPPPP........... |PPPPPPPPP...........

3500-|.................... |---------|---------| 500 1000 1500

(VILA)

TCE(Vcc) 6000-|.PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|.PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|..PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP 5500-|..PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|....PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP 5000-|......PPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPPP

|............PPPPPPPPPPPPPPPPPPPPPPPPPPP 3500-|.......................................

|---------|---------|---------|---------|

40 60 80 100120

VIHA (Vcc) 6500-|..........PPPPPPPPPPPPPPP

|.........PPPPPPPPPPPPPPPP |.........PPPPPPPPPPPPPPPP |.........PPPPPPPPPPPPPPPP |........PPPPPPPPPPPPPPPPP

3500-|......................... |---------|---------|----- 1000 1600 2200

(VIHA)

PROGRAMMABILITY

The programmability of the FM27C256 was measured by giving the device tenprogramming pulses with each pulse being 10us long.During programmingVpp was set to 12.75V and Vcc was set to 6.25V. The margin were measuredaftereach programming pulse to determine how high the worst case cell hadbeen programmed. The maximum value for reading margin is 8V. After the test,device margins were plotted vs. programming pulse time. Five parts from the1st lot (IOI120) were tested.

Voltage Margin ( mV) Number of 10uS Hits

1 2 3 4 5 6 7 8 9 10

Read Margin

ERASABILITY

Erasability of the FM27C256 was tested by programming a pattern into the part usingthe Data-IO Series 1000 parallel programmer and the standard Fairchild Algorithm. Theparts were then erased in a UV oven with a measured intensity of 13.17 mW/cm2. Theparts were erased and the margins of the programmed bits were measured in one minuteintervals. Both a checkerboard and all zeros pattern were tested.

The specification for the FM27C256 requires that the part receive 15W⋅ Sec/cm2 of UVenergy. Using the UV oven’s measured intensity, the parts must be fully erased in 19minutes to meet the spec. A part is fully erased when the margins voltage reaches 4Volts. It can be seen that the FM27C256 meets the specification’s requirements.

FM27C256 Lot NOIO120 Eraseability(5 Parts)

0 1 2 3 4

Number of Minutes in Erase Oven

ReadMarginsVoltage(mV)

Part #1

Part #2

Part#3

Part #4

Part #5

Average

ElectroStatic Discharge (ESD) Tests

ESD tests were performed on two Fairchild FM27C256 parts, lot NOIO120. The partswere tested on the KeyTek zapper . MIL-STD-883C, Method 3015 (vs. Vss Ground, vs.Vcc Ground, and vs. I/O Ground) was used for all ESD testing. The FM27C256 datasheetspecifies that all pins must withstand a charge of 2000 Volts. All pins were tested withvoltages from 1000 volts to 3000 volts in 500 volt increments, three times at each voltage.At each voltage the polarity was changed from positive to negative so that the totalnumber of discharges to each pin was 36. A summary of test results is shown below.

Part # Voltage Failed Test Condition Failed Pins Failure Condition1 3000 Vss Ground 0 None2 3000 Vss Ground 0 None

* The test were also performed on the three FM27C040 parts which had exactly the sameESD circuit design as the FM27C256 summary of test results is shown below.

Part # Voltage Passed Test Condition Failed Pins Failure Condition1 3000 Vss Ground 0 None2 3000 Vss Ground 0 None3 3000 Vss Ground 0 None

Note: The 1st five (5) units were tested at 500v, the 2nd five (5) units were tested at1000v and up to 3000v …Total of 30 units were tested with 0 failure.

Pin Capacitance Measurements

Pin capacitance for the FM27C256 was measured with an HP 4275A Multi-Frequency LCR meter. The pin capacitance was measured for each pin withrespect to ground. Ground and VCC pins were not measured. The datasheetspecifies that input and output pin capacitance should not exceed 12pF. Asample of five parts was used from Lot NOIO120 to gather data, and theaverage pin capacitances (pF) are plotted below.

1….VPP 7….A3 13….O2 20….CE/PGM 26….A132….A12 8….A2 15….O3 21….A10 27….A143….A7 9….A1 16….O4 22….OE4….A6 10…A0 17….O5 23….A115….A5 11…O0 18….O6 24….A96….A4 12…O1 19….O7 25….A8

#1 3 5 7 9 11

Capacitance

LATCH-UPA sample of five FM27C256 parts from lot NOIO120 were tested for latch-up at 150°C. Latch-up is caused by a paracitic bi-polar transistor withina CMOS transistor that becomes forward biased. This forms a shortcircuit from Vcc to Vss. Three test methods were used to test for latch-up.

Method 1:All outputs left floating. Vcc, OE,CE and all addresses were set to 5.5Volts except the pin to be tested. A current was forced in this pinranging from 0 to 450 mA.

Method 2:All outputs left floating. Vcc, CE, OE and all addressses were atGROUND except the pin to be tested. A current was forced in this pinranging from 0 to 450 mA.

Method 3:All outputs left floating. Vcc, CE, OE and all addressses were atGROUND except the pin to be tested. A current was forced in this pinranging from 0 to -450 mA.

There were no failures due to latch-up after these tests wereperformed.

DIE LAYOUT

PACKAGES & PINOUTS

The packages used for the FM27C256 have been extensively used forthe previous revision of this product. All packages have been previouslytested and qualified for this part. Package dimensions, specificationsand pin outs are shown on the following pages.

Appendix I

Qual/Reliability Test Conditions

The parameters for the Qualification and Reliability tests performed for the CE 60process and FM27C256 Lot NOIO120 are listed below.

TEST CONDITIONS

Hot Temperature Operating Life T= 150°C; Bias = VCC max;(HTOL) Duration = 1000 hrs.

Hot Temperature Static Life Ceramic: Unbiased bake at 250°C;(HTSL) Duration: 1000 hrs. Plastic: 150°C; Duration=1000hrs.

Temperature Cycle Air to air per MIL STD 883,(TMCL) Method 1010, Cond. 1000 cycles

Autoclave T = 121°C R.H. = 100% 14.7 psig(ACLV) Duration: 336 hrs.

Temperature Humidity Bias T = 85°C R.H.= 85% Bias = VCC

(THB or 85/85) Duration: 1000 hrs.

Appendix IICompatible Programmers Guide

On the following pages is a list of programmer manufacturers that produce deviceprogrammers for the FM27C256. They use the Fairchild Turbo programmingalgorithm, which ensures high programmability ratio and excellent data retention.Contact a specific manufacturer to find the best programmer for your application.

Advantest CorporationShinjuku-NS Bldg.,2-4-1,Nishi-Shinjuku,Shinjuku-ku, Tokyo 163-0880Phone +81-3-3342-7500ate@advantest.co.jp info@advantest.co.jp http://207.240.44.26/index-e.html

Advin Systems Inc.1050-L East Duane AvenueSunnyvale, CA 94086 USAPhone: (408) 243-7000Fax: (408) 736-2503Sales@advin.com http://www.advin.com/

American Reliance (AMREL)11801 Goldring Road Arcadia CA 91006Phone (626) 303-6688Amrel@amrel.com http://www.amrel.com

Aval DataElectronics Products DivisionSALES DEPT.FAX: +81-44-952-1331sales@avaldata.co.jp http://avaldata.com/eng/product/pkw/5100.html

AdvantechFl.7, No.98, Ming-Chuan Road,Shing-Tien City, Taipei, Taiwan, R.O.C.Telephone: 886-2-2218-4567Fax: 886-2-2218-2435Information: citron_chang@acl.advantech.com.tw Sales: citron_chang@acl.advantech.com.tw

B&C Microsystems, Inc.846 Del Rey Ave.Sunnyvale, CA 94086 USATel: (408) 730-5511Fax: (408) 730-5533info@bcmicro.com sales@bcmicro.com http://www.bcmicro.com/

BP MicrosystemsTel: (713) 688-2675 or (800) 225-2102Fax: (713) 688-0920web@bpmicro.com http://www.bpmicro.com/index.html

BYTEK Device ProgrammersSales: (800)992-9835Boca Raton (561)9943520Fax: (561)994-3615bytek@bytek.com http://www.bytek.com/

Data IOPhone: 800-332-8246Fax: 425-869-7423telsales@data-io.com http://www.data-io.com/

Dataman Programmers, Inc.215 East Michigan AvenueOrange City, FL 32763 USATel: (904) 774-7785Fax: (904) 774-7796sales@dataman.com http://www.dataman.com/

Elan Digital Systems Ltd.Elan House, Little Park Farm Road,Segensworth West, Fareham,Hampshire, PO15 5SJ. UKTel: +44 (0)1489 579 799Fax: +44 (0)1489 577 516support@elan-digital-systems.co.uk http://www.elan-digital-systems.co.uk/

GTEK, Inc.PO Box 2310 BaySt. Louis, MS 39521-2310Phone: 1-800-282-GTEK %20spot@gtek.com http://www.gtek.com/

Hi-Lo Ssystems Research Co.4F. NO. 2, SEC. 5, MING SHEN E. RD.TAIPEI, TAIWANTEL:886-2-27640215.FAX:886-2-27566403, 27601559Sales@hilosystems.com.tw http://www.hilosystems.com.tw/

ICE Technology Ltd.

Unit 4, Penistone CourtSheffield RoadPenistone, SheffieldS YORKS, S36 6HP UKTel: +44(0) 1226 767404Fax: +44(0) 1226 370434Sales@icetech.com http://www.icetech.com/

International Microsystems Inc.521 Valley WayMilpitas, CA 95035Tel: 408-942-1001Fax: 408-942-1051http://www.imtest.com/

Logical Devices1221 South ClarksonDenver Colorado 80210 USA. Tel: 303 722 6868Fax: 303 733 6868logdev@logicaldevices.com http://www.logicaldevices.com/

M2L Electronics3526 Jasmine #4Los Angeles, CA 90034Phone: (310) 837-7818 Fax/BBS: (310) 841-6050sales@m2l.com http://www.m2l.com/

Needham's Electronics

4630 Beloit Drive, Suite #20Sacramento, CA 95838Phone: (916) 924-8037Fax: (916) 924-8065http://www.needhams.com/home.htm

Systems GeneralTel:1-408-2636667Fax:1-408-2629220Sales@sg.com.tw http://www.sg.com.tw/

Xeltek3563 Ryder StreetSanta Clara, CA 95051-0707,Phone:408-5241929Fax:408-2457084info@xeltek.com http://www.xeltek.com

Qualification and Characterization of the FM27C256 Diodes...Mar 27, 2000 · 3 INTRODUCTION This...

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