Silicon on Insulator

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Silicon on Insulator. Advanced Electronic Devices Karthik Swaminathan. Reasons for SOI. Replacement for SOS Need to extend Moore’s Law Commercial Availability of SOI wafers. Advantages of SOI. Reduced Source and Drain to Substrate Capacitance. Absence of Latchup. Lower Passive current. - PowerPoint PPT Presentation

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Silicon on Insulator

Advanced Electronic Devices

Karthik Swaminathan

Reasons for SOI

• Replacement for SOS

• Need to extend Moore’s Law

• Commercial Availability of SOI wafers

Advantages of SOI

• Reduced Source and Drain to Substrate Capacitance.

• Absence of Latchup.

• Lower Passive current.

• Denser Layout Low cost.

SOI Wafer Fabrication

• Bond and Etch Back

• SIMOX (Separation by IMplantation Of oXygen)

• SIMON(Separation by IMplantation Of Nitrogen)

heat

silicon

BOX

SIMOX SIMOX

Fully Depleted (FD) SOI

• This is what you expect.

• FDSOI MOSFET• Depleted channel.

http://www.soisic.com/SOI_keys_benefits.htm

Partially Depleted (PD) SOI

• What if active Si layer is thick ?

• Body in channel floating Floating body effect.

http://www.soisic.com/SOI_keys_benefits.htm

Is SOI just in the textbooks ?

1987 IBIS’s commercial SIMOX wafers (3’’ – 6’’)

1988 HP’s 2GHz CMOS circuit

1989 TI’s commercial 64k SRAM

March 2004 Apple’s Xserve G5

End 2004 AMD 90nm processor

Novel SOI Devices

• Dual gate SOI.

• SOI Single electron transistors.

Double-Gate SOI MOSFET

• ITRS roadmap – dual gate SOI at 15nm.

• Thick gate oxide to ensure equal thickness on both sides.

IEEE Tran on Elec. Dev. 50,3,March 2003,Ultimately Thin Double-Gate SOI MOSFETsThomas Ernst et al.

Issues – Negative resist for EBL

• PMMA resist is a good positive resist for EBL.

• Do we have a good negative EBL resist high resolution.

• NO alternate techniques.

Negative Resist – SOI ?

• EBL.• Plasma oxidation.• Etching of amorphous

silicon.• BOX removal.

Negative resist – silicon ?

• EBL• Plasma oxidation• Electron cyclotron

resonance chlorine etching of silicon.

SOI SET

TEM image of trenches

AFM image of SET

Conductance Oscillations Vds = 10mV

SET by pattern dependent oxidation

Pattern dependent oxidation

Pattern dependent oxidation

• Thermal gate oxidation.

• Oxygen diffuses through the BOX and reaches the pattern edges which are oxidized.

• Stresses due to volume change prevent oxidation of the island.

Conductance Oscillations Ld=50nm Vds = 1mV

Conductance Oscillations Ld=70nm Vds = 1mV

Conductance Oscillations Ld=100nm Vds = 1mV

Gate capacitance vs Ld

Summary

• Future devices will involve SOI.

• SOI provides certain benefits over bulk CMOS for smaller gate lengths.

• SOI SETs may become a promising technology in the future.

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