复习

What did I learn in school today?

Major concept areasCrystal structure and propertiesCrystallographyReciprocal latticeX-rays, X-ray spectraX-ray absorption, X-ray fluorescenceDiffraction, Braggs' law, Ewald constructionPowder diffractometerPowder patterns

IndexingIntensities

Powder pattern applicationsQualitative analysisQuant analysisCrystallite size, microstrianResidual stressThin film epitaxy

SEMTEM, imaging and diffractionAFM

Must-know terms

Crystallographysymmetry operation - translation, rotationlattice, Bravais latticeunit cellcrystal systempoint group, space group

stereographic projectionequipointlattice plane, lattice direction

Must-know terms

X-rayscontinuous radiationcharacteristic radiationsynchrotron radiationmass attenuation coefficientabsorption edgefluorescence

Must-know terms

DiffractionBraggs' lawreciprocal latticeEwald constructionDebye rings

Must-know terms

Powder diffractometerfocusingSoller slitdivergence slitreceiving slitmonochromatordetectordeadtime

Must-know terms

Powder diffraction patternsindexingextinction ruleatomic scattering factorstructure factorintensitymultiplicityLorentz polarizationtemperature factorpeak breadth

Must-know terms

Powder diffraction proceduresdiffractometer alignmentcalibration standardsspecimen displacementpreferred orientationfront fill, back fill, side driftzero background platestep sizedwell time

Must-know terms

Powder diffraction applicationsPDFHanawalt search methodquantitative analysiscrystallite sizemicrostrainScherrer equationWilliamson-Hall methodresidual stressfour-circle diffractometerepitaxy

Must-know terms

SEMmicrostructurematrix and precipitatesbackscattered electronscomposition contrastsecondary electronstopographic contrastdepth of focusWehnelt cuptunneling and field emissioninteraction volume

Must-know terms

TEMback focal planejet thinningion millingcamera constantrelrods

Must-know terms

AFMcontact and non-contact modesconstant heightconstant forcetapping modeforce-distance plot