203098 REV. 1.1 TEST REPORT - Samtec …suddendocs.samtec.com/testreports/203098_test_report_rev1-1_qua… · of the contact systems as they progress through the applicable test sequences

Contech Research

1

MAY 27 2003

TEST REPORT #203098 REVISION 1.1

QUALIFICATION TESTING

IPD1/IPL1 SERIES CONNECTOR

PART NUMBERS

IPD1-115-X-D-XX-24 IPL1-115-01-X-D

SAMTEC, INC.

APPROVED BY: THOMAS PEEL

PRESIDENT AND DIRECTOR OF TEST PROGRAM DEVELOPMENT

CONTECH RESEARCH, INC.

TR#203098, REV.1.1 2 of 91 Contech Research

REVISION HISTORY

DATE REV. NO. DESCRIPTION ENG. 5/27/2003 5/3/2011

1.0 1.1

Initial Issue Editorial change on page 75, corrected and changed PSD 0.02 to 0.04.

TP DA


CERTIFICATION

This is to certify that the evaluation described herein was designed and executed by personnel of Contech Research, Inc. It was performed in concurrence of Samtec, Inc., of Lisle, IL who was the test sponsor. All equipment and measuring instruments used during testing were calibrated and traceable to NIST according to ISO 10012-1 and ANSI/NCSL Z540-1, as applicable. All data, raw and summarized, analysis and conclusions presented herein are the property of the test sponsor. No copy of this report, except in full, shall be forwarded to any agency, customer, etc., without the written approval of the test sponsor and Contech Research.

Thomas Peel

President and Director of Test Program Development

Contech Research, Inc.

TP:js


SCOPE To perform environmental/mechanical/electrical testing on the IPD1/IPL1 connector series as manufactured and submitted by the test sponsor Samtec, Inc. APPLICABLE DOCUMENTS 1. Unless otherwise specified, the following documents of

issue in effect at the time of testing performed form a part of this report to the extent as specified herein. The requirements of sub-tier specifications and/or standards apply only when specifically referenced in this report.

2. Product Specifications: Samtec TC038-IPX1-Qual-0103 3. Standards: EIA Publication 364 TEST SAMPLES AND PREPARATION 1. The following test samples were submitted by the test

sponsor, Samtec, Inc., for the evaluation to be performed by Contech Research, Inc.

Description Part Number

a) IPD1 Receptacle Connectors IPD1-115-X-D-XX-24 b) IPL1 Header Connectors IPL1-115-01-X-D

2. Test samples were supplied assembled and terminated to test

boards by the test sponsor for those tests requiring a mounted condition.

3. Figure #1 illustrates the test board layout used for

mounting test samples. 4. A buss wire was soldered across the conductors terminated

to the receptacle connector to create a “common buss”. 5. The test samples were ultrasonically cleaned after test

lead attachment, preparation and/or soldering using the following process:

A) Test samples were immersed into the Branson 8210 cleaner which contained Kyzen Ionex HC cleaning solution with the following conditions:

a) Temperature : 55 4C b) Frequency : 43 KHz c) Immersion Time : 3 to 5 Minutes


TEST SAMPLES AND PREPARATION - Continued

B) Test samples were slowly removed and placed into the Branson 5210 cleaner which contained DI water with the following conditions:

a) Temperature : 55 4C b) Frequency : 47 KHz c) Immersion Time : 1 to 2 Minutes

C) Test samples were removed and placed in a Fisher

Thermix agitator containing DI water warmed to 55 5C for 1 to 2 minutes. D) Upon removal, the test samples were rinsed for 1 to 2

minutes in free flowing DI water at 55 5C. E) After final rinse, test samples were dried in an air

circulating oven for 2 to 3 minutes minimum at 50 2C. F) Test samples were allowed to recover to room ambient

conditions prior to testing. 6. Unless otherwise specified in the test procedures used, no

further preparation was used. TEST SELECTION 1. See Test Plan Flow Diagram, Figure #2, for test sequences

used.

2. Test set ups and/or procedures which are standard or common are not detailed or documented herein provided they are certified as being performed in accordance with the applicable (industry or military) test methods, standards and/or drawings as specified in the detail specification.

SAMPLE CODING 1. All samples were coded. Mated test samples remained with

each other throughout the test group/sequences for which they were designated. Coding was performed in a manner which remained legible for the test duration.


SAMPLE CODING – Continued 2. The test samples were coded in the following manner:

Sequence A : Group A : L1,L2,L3,L4,L5,L6,L7,L8 Group B : F1,F2,F3,F4,F5,F6,F7,F8 Group C : S1,S2,S3,S4,S5,S6,S7,S8 Sequence B : Group A : S9,S10 Sequence C : Group A : C1,C2 Sequence D : Group A : D1,D2


FIGURE #1


FIGURE #2

TEST PLAN FLOW DIAGRAM

SAMPLE PREPARATION

LLCR VOLTAGE SOLVENT DROP RESISTANCE LLCR LLCR LLCR CURRENT CYCLE DURABILITY DURABILITY DURABILITY 10X 25X 100X MECHANICAL SHOCK VOLTAGE LLCR LLCR LLCR DROP @250 HRS 500 HRS THERMAL THERMAL THERMAL LLCR SHOCK SHOCK SHOCK LLCR LLCR LLCR RANDOM VIBRATION CYCLIC CYCLIC CYCLIC HUMIDITY HUMIDITY HUMIDITY LLCR LLCR LLCR LLCR GROUP A GROUP B GROUP C GROUP A SEQUENCE A SEQUENCE B SEQ. C SEQ.D


DATA SUMMARY TEST REQUIREMENT RESULTS SEQUENCE A GROUP A LLCR RECORD 15.2 m MAX. DURABILITY (10X) NO DAMAGE PASSED LLCR +10.0 m MAX.CHG. +1.3 m MAX.CHG. THERMAL SHOCK NO DAMAGE PASSED LLCR +10.0 m MAX.CHG. +2.4 m MAX.CHG. CYCLIC HUMIDITY NO DAMAGE PASSED LLCR +10.0 m MAX.CHG. +1.5 m MAX.CHG.

GROUP B LLCR RECORD 16.6 m MAX. DURABILITY (25X) NO DAMAGE PASSED LLCR +10.0 m MAX.CHG. +1.3 m MAX.CHG. THERMAL SHOCK NO DAMAGE PASSED LLCR +10.0 m MAX.CHG. +4.7 m MAX.CHG. CYCLIC HUMIDITY NO DAMAGE PASSED LLCR +10.0 m MAX.CHG. +5.0 m MAX.CHG. GROUP C LLCR RECORD 16.9 m MAX. DURABILITY (100X) NO DAMAGE PASSED LLCR +10.0 m MAX.CHG. +3.1 m MAX.CHG. THERMAL SHOCK NO DAMAGE PASSED LLCR +10.0 m MAX.CHG. +4.1 m MAX.CHG. CYCLIC HUMIDITY NO DAMAGE PASSED LLCR +10.0 m MAX.CHG. +2.2 m MAX.CHG.

SEQUENCE B

GROUP A LLCR RECORD 16.4 m MAX. MECHANICAL SHOCK NO DAMAGE PASSED LLCR +10.0 m MAX.CHG. +1.9 m MAX.CHG. RANDOM VIBRATION NO DAMAGE PASSED LLCR +10.0 m MAX.CHG. +2.1 m MAX.CHG.


DATA SUMMARY – Continued TEST REQUIREMENT RESULTS SEQUENCE C GROUP A VOLTAGE DROP RECORD 86.6 mV MAX. CURRENT CYCLING NO DAMAGE PASSED VOLTAGE DROP @ 250 CYCLES RECORD 85.2 mV MAX. VOLTAGE DROP @ 500 CYCLES RECORD 85.1 mV MAX. SEQUENCE D SOLVENT RESISTANCE NO DAMAGE PASSED


EQUIPMENT LIST

ID# Next Cal Last Cal Equipment Name Manufacturer Model # Serial # Accuracy Freq.Cal

27 Temp. Humid. Chamber Blue M Co. FR-256PC-1 F2-249 See Cal Cert Each Test 55 Air Fume Hood Labconco 47715 61279 N/A N/A

171 Temperature Control Dowty MDC5 1169 N/A Each Test 192 Vertical Thermal Shock Cincinnati Sub-Zero VTS-1-5-3 88-11094 See Cal Cert Each Test 295 8/16/03 8/16/02 Micro-Ohm Meter Keithley Instr. 580 480781 See Cal Cert 12 mon. 297 10/8/03 10/8/02 Micro-Ohm Meter Keithley Instr. 580 485414 See Cal Cert 12mon 323 Computer Legatech 286-12 N/A N/A N/A 418 Program Timer Dayton 2EO26 N/A N/A N/A 419 11/18/03 11/18/02 Digital Multimeter Hewlett Packard 34401A 3146A04392 See Cal Cert 12mon 476 Computer Twilight Co. 386-33 N/A N/A N/A 553 12/6/03 12/6/02 12 channel Power Unit PCB Co. 483A 1303 See Cal Cert 12mon 558 Computer ARC Elect. P111-450 274B031586 N/A N/A 620 10/16/03 10/16/02 Accelerometer PCB A353B15 34197 See Cal. Cert 12mon 673 7/3/03 7/3/02 Microohm Meter Keithley Co. 580 0681911 See Cal Cert 12 mon.

1012 3/6/04 3/6/03 DC Power Supply 30 Amps Hewlett Packard 6033A 2642A-02383 See Cal.Cert. 12 mon. 1169 Computer ARC PC133 none N/A N/A 1271 Amplifier Unholtz Dickie SA15 3483 See Manual N/A 1272 Shaker Table Unholtz Dickie S202PB 263 N/A N/A 1366 Main Frame Aiglent H.P. 8408A N/A N/A 1367 Interface Aiglent H.P. E8491A N/A N/A 1368 10/17/03 10/17/02 Sine/Rnd Control digitizer Aiglent H.P. E1432A US35470169 See Manual 12months


TEST RESULTS

SEQUENCE A

GROUP A


PROJECT NO.: 203098 SPEC: TC038-IPX1-QUAL-0103 ------------------------------------------------------------ PART NO.: IPD1-115-X-D-XX-24 PART DESCRIPTION:Header/Recept. IPL1-115-01-X-D Connector ------------------------------------------------------------ SAMPLE SIZE: 8 Samples TECHNICIAN: KMC ------------------------------------------------------------ START DATE: 3/31/03 COMPLETE DATE: 3/31/03 ------------------------------------------------------------ ROOM AMBIENT: 20C RELATIVE HUMIDITY: 40% ------------------------------------------------------------ EQUIPMENT ID#: 297, 323 ------------------------------------------------------------ LOW LEVEL CIRCUIT RESISTANCE (LLCR) PURPOSE: 1. To evaluate contact resistance characteristics of the

contact systems under conditions where applied voltages and currents do not alter the physical contact interface and will detect oxides and films which degrade electrical stability. It is also sensitive to and may detect the presence of fretting corrosion induced by mechanical or thermal environments as well as any significant loss of contact pressure.

2. This attribute was monitored after each preconditioning

and/or test exposure in order to determine said stability of the contact systems as they progress through the applicable test sequences.

3. The electrical stability of the system is determined by

comparing the initial resistance value to that observed after a given test exposure. The difference is the change in resistance occurring whose magnitude establishes the stability of the interface being evaluated.

------------------------------------------------------------ PROCEDURE: 1. The test was performed in accordance with EIA 364, Test

Procedure 23 with the following conditions: 2. Test Conditions:

a) Test Current : 10 milliamps b) Open Circuit Voltage : 20 millivolts c) No. of Positions Tested : 30 per test sample


PROCEDURE: Continued 3. The points of application are shown in Figure #3. ------------------------------------------------------------ REQUIREMENTS: Low level circuit resistance shall be measured and recorded. ------------------------------------------------------------ RESULTS: 1. The following is a summary of the data observed: LOW LEVEL CIRCUIT RESISTANCE (Milliohms)

Sample ID# Avg. Max. Min. L1 13.2 14.5 12.5 L2 13.3 15.2 12.4 L3 13.2 13.9 12.4 L4 12.9 14.0 12.1 L5 13.4 14.7 12.6 L6 13.0 14.1 12.3 L7 13.4 15.1 12.7 L8 13.5 14.7 12.8 2. See data files 20309801 through 20309808 for individual

data points.


FIGURE #3

TYPICAL LLCR TEST SET UP

+V +I

-V, -I

Mated sample

Common Buss


PROJECT NO.: 203098 SPEC: TC038-IPX1-QUAL-0103 ------------------------------------------------------------ PART NO.: IPD1-115-X-D-XX-24 PART DESCRIPTION:Header/Recept. IPL1-115-01-X-D Connector ------------------------------------------------------------ SAMPLE SIZE: 8 Samples TECHNICIAN: DAM ------------------------------------------------------------ START DATE: 4/2/03 COMPLETE DATE: 4/3/03 ------------------------------------------------------------ ROOM AMBIENT: 20C RELATIVE HUMIDITY: 40% ------------------------------------------------------------ EQUIPMENT ID#: 297, 323 ------------------------------------------------------------ DURABILITY PURPOSE: 1. This is a preconditioning sequence which is used to induce

the type of wear on the contacting surfaces which may occur under normal service conditions. The connectors are mated and unmated a predetermined number of cycles. Upon completion, the units being evaluated are exposed to the environments as specified to assess any impact on electrical stability resulting from wear or other wear dependent phenomenon.

2. This type or preconditioning sequence is also used to

mechanically stress the connector system as would normally occur in actual service. This sequence in conjunction with other tests is used to determine if a significant loss of contact pressure occurs from said stresses which in turn, may result in an unstable electrical condition to exist.


Procedure 9. 2. Test Conditions: a) No. of Cycles : 10 b) Rate : 500 per hour 3. The test samples were assembled to special holding devices

and attached to the manual cycling equipment utilizing constant speed control and counter systems.


PROCEDURE: Continued 4. The test samples were axially aligned to accomplish the

mating and unmating function allowing for self-centering movement.

5. Care was taken to prevent the mating faces of the test

samples from contacting each other. 6. All subsequent variable testing was performed in accordance

with the procedures previously indicated. ------------------------------------------------------------ REQUIREMENTS: 1. There shall be no evidence of physical damage to the test

samples so tested. 2. The change in low level circuit resistance shall not exceed

+10.0 milliohms. ------------------------------------------------------------ RESULTS: 1. There was no evidence of physical damage to the test

samples as tested. 2. The following is a summary of the data observed: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Avg. Max. Sample ID# Change Change L1 -0.1 +1.3 L2 -0.2 +0.4 L3 +0.2 +1.3 L4 -0.2 +0.3 L5 -0.2 +0.6 L6 -0.1 +0.5 L7 -0.2 +0.5 L8 +0.0 +1.0 3. See data files 20309801 through 20309808 for individual

data points.


PROJECT NO.: 203098 SPEC: TC038-IPX1-QUAL-0103 ------------------------------------------------------------ PART NO.: IPD1-115-X-D-XX-24 PART DESCRIPTION:Header/Recept. IPL1-115-01-X-D Connector ------------------------------------------------------------ SAMPLE SIZE: 8 Samples TECHNICIAN: DAM ------------------------------------------------------------ START DATE: 4/4/03 COMPLETE DATE: 4/9/03 ------------------------------------------------------------ ROOM AMBIENT: 20C RELATIVE HUMIDITY: 35% ------------------------------------------------------------ EQUIPMENT ID#: 192, 297, 323 ------------------------------------------------------------ THERMAL SHOCK PURPOSE: To determine the resistance of a given electrical connector to exposure at extremes of high and low temperatures and the shock of alternate exposures to these extremes, simulating the worst probable conditions of storage, transportation and application. ------------------------------------------------------------ PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 32 with the following conditions: 2. Test Conditions: a) Number of Cycles : 100 Cycles b) Hot Extreme : +85 +3C/-0C c) Cold Extreme : -55 +0C/-3C d) Time at Temperature : 30 Minutes e) Mating Conditions : Mated f) Transfer Time : Instantaneous 3. The total number of cycles was performed continuously. 4. All subsequent variable testing was performed in accordance

with the procedures as previously indicated. 5. Prior to performing variable measurements, the test samples

were allowed to recover to room ambient conditions.

------------------------------------------------------------ REQUIREMENTS: See next page.


REQUIREMENTS: 1. There shall be no evidence of physical damage to the test

samples as tested. 2. The change in low level circuit resistance shall not exceed


samples as tested. 2. The following is a summary of the observed data: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Avg. Max. Sample ID# Change Change L1 +0.0 +1.1 L2 +0.0 +1.1 L3 +0.4 +2.4 L4 +0.2 +1.0 L5 +0.0 +0.7 L6 +0.1 +1.4 L7 +0.2 +1.7 L8 +0.2 +1.0 3. See data files 20309801 through 20309808 for individual

data points.


PROJECT NO.: 203098 SPEC: TC038-IPX1-QUAL-0103 ------------------------------------------------------------ PART NO.: IPD1-115-X-D-XX-24 PART DESCRIPTION:Header/Recept. IPL1-115-01-X-D Connector ------------------------------------------------------------ SAMPLE SIZE: 8 Samples TECHNICIAN: SR ------------------------------------------------------------ START DATE: 4/11/03 COMPLETE DATE: 4/21/03 ------------------------------------------------------------ ROOM AMBIENT: 22C RELATIVE HUMIDITY: 34% ------------------------------------------------------------ EQUIPMENT ID#: 27, 558, 673 ------------------------------------------------------------ HUMIDITY (THERMAL CYCLE) PURPOSE: To evaluate the impact on electrical stability of the contact system when exposed to any environment which may generate thermal/moisture type failure mechanisms such as:

a) Fretting corrosion due to wear resulting from micromotion, induced by thermal cycling. Humidity accelerates the oxidation process.

b) Oxidation of wear debris or from particulates from the surrounding atmosphere which may have become entrapped between the contacting surfaces.

c) Failure mechanisms resulting from a wet oxidation process.

------------------------------------------------------------ PROCEDURE: 1. The test environment was performed in accordance with EIA

364, Test Procedure 31, Method III with the following conditions:

2. Test Conditions:

a) Preconditioning (24 hours) : 50C ± 5C b) Relative Humidity : 90% to 95% c) Temperature Conditions : 25C to 65C d) Cold Cycle : No e) Polarizing Voltage : No f) Mating Conditions : Mated g) Mounting Conditions : Mounted h) Duration : 240 hours


PROCEDURE: Continued 3. Prior to performing variable measurements, the test samples

were allowed to recover to room ambient conditions. 4. All subsequent variable testing was performed in accordance

with the procedures previously indicated. ------------------------------------------------------------ REQUIREMENTS: 1. There shall be no evidence of physical deterioration of the

test samples as tested. 2. The change in low level circuit resistance shall not exceed

+10.0 milliohms. ------------------------------------------------------------ RESULTS: 1. The test samples as tested showed no evidence of physical

deterioration. 2. The following is a summary of the data observed: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Avg. Max. Sample ID# Change Change L1 +0.1 +1.4 L2 +0.0 +1.2 L3 +0.0 +1.2 L4 +0.0 +1.3 L5 +0.0 +1.0 L6 +0.0 +1.1 L7 +0.0 +1.5 L8 +0.2 +1.0 3. See data files 20309801 through 20309808 for individual

data points.


LLCR DATA FILES

FILE NUMBERS

20309801 20309802 20309803 20309804 20309805 20309806 20309807 20309808


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. A Product: Series IPD1/IPL1 connector File #: 20309801 Description: Sample ID# L1 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 22 R.H. % 40 40 35 34 Date: 31Mar03 03Apr03 09Apr03 21Apr03 Pos. ID Initial 10X T.Shock Hum. 1 13.5 0.2 -0.5 -0.7 2 13.1 -0.3 0.1 0.2 3 13.5 -0.1 0.1 -0.4 4 13.0 0.5 -0.3 0.0 5 13.6 0.5 -0.2 -0.2 6 12.8 1.3 -0.1 -0.2 7 13.9 -0.8 -1.2 -1.1 8 13.3 -0.4 -0.5 0.0 9 13.5 0.1 -0.2 -0.1 10 13.4 0.1 -0.1 -0.3 11 13.2 -0.1 -0.1 0.3 12 12.5 0.5 0.6 0.3 13 12.6 0.2 0.4 0.4 14 13.0 -0.1 0.1 0.0 15 13.1 0.0 0.1 0.4 16 14.5 -0.4 -1.1 -1.1 17 13.6 -1.0 -0.5 -0.8 18 13.1 0.0 1.1 1.2 19 14.1 -1.0 -1.0 -0.9 20 14.3 -0.5 -0.1 -1.3 21 12.8 0.5 0.8 0.3 22 13.5 0.2 0.0 0.3 23 12.8 0.3 0.8 0.8 24 13.5 0.0 0.5 0.2 25 13.1 -0.4 -0.6 0.4 26 12.5 0.1 1.0 0.6 27 12.6 -0.1 0.6 0.3 28 12.9 -0.5 0.6 1.4 29 12.9 0.0 0.2 0.4 30 12.9 -0.4 0.2 1.2 MAX 14.5 1.3 1.1 1.4 MIN 12.5 -1.0 -1.2 -1.3 AVG 13.2 -0.1 0.0 0.1 STD 0.5 0.5 0.6 0.7 Open 0 0 0 0 Tech KMc DAM DAM S.Rath Equip ID 297 297 297 673 323 323 323 558


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. A Product: Series IPD1/IPL1 connector File #: 20309802 Description: Sample ID# L2 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 22 R.H. % 40 40 35 34 Date: 31Mar03 03Apr03 09Apr03 21Apr03 Pos. ID Initial 10X T.Shock Hum. 1 13.6 0.0 -0.3 -0.7 2 13.4 -0.4 -0.4 -0.3 3 13.4 0.4 -0.4 0.0 4 12.8 0.2 0.2 0.5 5 13.0 0.4 0.6 0.1 6 13.1 -0.5 -0.3 -0.2 7 13.1 0.1 -0.1 0.2 8 13.5 0.1 0.6 -0.2 9 13.1 0.2 0.4 0.3 10 12.7 0.2 0.1 0.6 11 13.1 0.0 0.1 0.5 12 12.4 0.1 0.4 0.5 13 12.6 0.4 0.6 0.3 14 13.1 -0.4 -0.3 -0.2 15 12.7 0.4 0.3 0.8 16 13.9 -1.3 -0.6 -1.0 17 13.2 -0.7 0.1 -0.2 18 12.9 0.2 1.1 0.1 19 13.3 -0.3 0.3 0.8 20 14.4 -0.7 -1.0 -1.2 21 13.6 -0.5 -0.1 0.1 22 13.6 0.1 0.4 0.3 23 13.1 -0.1 0.7 0.4 24 15.2 -1.8 -1.5 -2.5 25 13.4 -0.7 -0.4 0.2 26 12.9 0.1 1.0 0.0 27 13.1 -0.4 -0.1 0.9 28 13.9 -0.4 -0.6 -0.7 29 13.1 -0.3 0.3 0.1 30 13.3 -0.3 -0.3 1.2 MAX 15.2 0.4 1.1 1.2 MIN 12.4 -1.8 -1.5 -2.5 AVG 13.3 -0.2 0.0 0.0 STD 0.6 0.5 0.6 0.7 Open 0 0 0 0 Tech KMc DAM DAM S.Rath Equip ID 297 297 297 673 323 323 323 558


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. A Product: Series IPD1/IPL1 connector File #: 20309803 Description: Sample ID# L3 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 22 R.H. % 40 40 35 34 Date: 31Mar03 03Apr03 09Apr03 21Apr03 Pos. ID Initial 10X T.Shock Hum. 1 13.9 0.4 -0.1 -0.5 2 13.9 0.7 -0.6 -0.9 3 13.9 -0.4 -0.2 -1.0 4 13.2 0.5 -0.5 -0.4 5 13.8 0.3 0.4 -0.6 6 13.3 -0.6 -0.7 -0.7 7 12.9 0.3 0.6 0.3 8 13.5 -0.5 0.1 -0.7 9 13.0 0.0 0.3 0.0 10 12.8 -0.1 0.2 -0.4 11 13.0 0.1 0.5 0.1 12 13.0 -0.7 -0.4 -0.5 13 13.2 -0.5 0.4 -0.6 14 13.2 -0.9 -0.9 -0.3 15 12.6 0.2 0.6 0.2 16 13.2 -0.1 0.4 0.2 17 12.4 0.5 1.3 1.2 18 13.2 0.0 0.1 0.5 19 13.4 0.5 0.0 0.5 20 13.2 1.1 1.5 0.6 21 13.5 0.2 0.8 0.7 22 13.3 1.1 1.3 0.0 23 13.0 0.2 0.7 0.2 24 13.3 1.3 2.4 0.0 25 13.3 -0.4 1.3 0.6 26 12.9 0.3 0.6 0.4 27 13.3 0.3 0.0 0.8 28 12.8 0.6 0.2 0.2 29 13.5 0.0 0.1 0.0 30 12.9 0.4 0.5 0.2 MAX 13.9 1.3 2.4 1.2 MIN 12.4 -0.9 -0.9 -1.0 AVG 13.2 0.2 0.4 0.0 STD 0.4 0.5 0.7 0.5 Open 0 0 0 0 Tech KMc DAM DAM S.Rath Equip ID 297 297 297 673 323 323 323 558


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. A Product: Series IPD1/IPL1 connector File #: 20309804 Description: Sample ID# L4 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 22 R.H. % 40 40 35 34 Date: 31Mar03 03Apr03 09Apr03 21Apr03 Pos. ID Initial 10X T.Shock Hum. 1 13.1 0.0 -0.4 -0.6 2 12.8 -0.3 -0.2 -0.5 3 13.0 -0.1 0.1 -0.3 4 12.8 0.0 0.2 0.3 5 13.5 -0.3 0.1 -0.8 6 12.7 -0.4 0.3 -0.1 7 12.6 -0.4 -0.1 -0.3 8 12.7 -0.1 0.1 -0.4 9 12.4 0.1 0.4 0.0 10 12.5 0.2 0.0 0.1 11 12.7 -0.1 0.0 1.0 12 12.1 0.2 0.4 0.7 13 12.1 0.3 1.0 0.1 14 13.4 -0.6 -0.5 -0.9 15 12.6 -0.1 0.0 -0.1 16 14.0 -0.2 -0.2 -0.8 17 13.1 -0.5 0.0 1.3 18 13.4 -0.5 0.0 -0.4 19 13.5 -0.8 0.0 -0.5 20 13.5 -0.2 0.5 -0.3 21 12.9 -0.1 0.4 1.3 22 13.6 -0.3 0.0 0.3 23 12.9 0.1 0.4 0.0 24 13.6 0.3 0.0 -0.6 25 12.8 -0.7 0.2 0.0 26 13.2 -0.5 0.0 0.4 27 12.7 -0.4 0.5 0.5 28 12.7 0.0 0.9 0.3 29 12.6 -0.1 0.1 0.4 30 12.5 0.2 0.3 0.2 MAX 14.0 0.3 1.0 1.3 MIN 12.1 -0.8 -0.5 -0.9 AVG 12.9 -0.2 0.2 0.0 STD 0.5 0.3 0.3 0.6 Open 0 0 0 0 Tech KMc DAM DAM S.Rath Equip ID 297 297 297 673 323 323 323 558


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. A Product: Series IPD1/IPL1 connector File #: 20309805 Description: Sample ID# L5 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 22 R.H. % 40 40 35 34 Date: 31Mar03 03Apr03 09Apr03 21Apr03 Pos. ID Initial 10X T.Shock Hum. 1 13.3 -0.1 -0.5 -0.8 2 13.2 -0.2 -0.7 -0.7 3 14.7 -0.2 -1.4 -1.4 4 13.2 -0.3 -0.6 0.0 5 14.0 -0.4 -0.7 0.0 6 13.5 -0.7 -0.4 0.1 7 13.3 0.0 -0.4 0.2 8 13.8 -0.3 -0.2 -0.2 9 13.7 -0.5 -0.4 -0.2 10 13.0 0.2 0.0 0.1 11 13.1 0.4 0.4 0.4 12 12.6 -0.2 0.3 0.3 13 12.8 0.0 -0.1 0.7 14 13.5 -0.3 0.6 -0.5 15 13.4 -0.3 0.0 0.0 16 13.0 0.1 0.4 0.3 17 14.0 -0.8 -0.4 -0.1 18 13.4 -0.4 0.2 -0.1 19 13.3 -0.5 -0.3 -0.1 20 13.5 -0.3 0.6 0.0 21 13.3 -0.3 0.7 0.2 22 13.3 -0.1 0.0 -0.2 23 12.8 0.1 0.4 0.4 24 13.6 0.5 0.0 -0.2 25 13.0 -0.2 -0.2 -0.1 26 14.4 -0.3 0.4 -0.6 27 12.8 -0.1 0.6 0.2 28 12.9 0.6 0.1 0.4 29 13.2 -0.1 0.4 0.1 30 13.3 -0.5 0.5 1.0 MAX 14.7 0.6 0.7 1.0 MIN 12.6 -0.8 -1.4 -1.4 AVG 13.4 -0.2 0.0 0.0 STD 0.5 0.3 0.5 0.5 Open 0 0 0 0 Tech KMc DAM DAM S.Rath Equip ID 297 297 297 673 323 323 323 558


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. A Product: Series IPD1/IPL1 connector File #: 20309806 Description: Sample ID# L6 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 22 R.H. % 40 40 35 34 Date: 31Mar03 03Apr03 09Apr03 21Apr03 Pos. ID Initial 10X T.Shock Hum. 1 13.9 -0.7 -0.7 -0.7 2 13.5 -0.9 -0.9 -1.2 3 13.4 -0.4 -0.3 0.1 4 13.2 -0.2 0.2 -0.2 5 13.5 -0.2 -0.1 -0.3 6 12.9 0.2 0.4 0.0 7 14.1 -1.4 -1.1 -1.6 8 13.1 0.1 0.0 -0.6 9 13.0 -0.2 -0.1 -0.2 10 13.2 -0.6 -0.4 -0.4 11 12.8 0.0 0.0 -0.3 12 13.1 -0.4 -0.2 -0.4 13 13.1 0.1 0.2 -0.1 14 12.5 0.3 0.4 0.4 15 12.7 -0.2 0.1 -0.2 16 13.6 -0.1 0.2 -0.3 17 13.2 0.0 0.3 -0.1 18 13.3 0.3 0.5 0.3 19 13.0 -0.2 1.4 0.3 20 12.6 0.3 0.5 0.7 21 13.2 -0.5 0.4 0.1 22 12.9 0.1 0.5 0.0 23 12.5 0.0 0.3 0.2 24 12.8 0.3 1.1 0.7 25 12.5 0.0 0.5 0.6 26 12.6 0.4 0.5 1.0 27 12.3 0.5 0.3 0.6 28 13.5 -0.3 0.0 -0.3 29 12.8 -0.2 0.0 -0.1 30 12.3 0.4 0.3 1.1 MAX 14.1 0.5 1.4 1.1 MIN 12.3 -1.4 -1.1 -1.6 AVG 13.0 -0.1 0.1 0.0 STD 0.4 0.4 0.5 0.6 Open 0 0 0 0.0 Tech KMc DAM DAM S.Rath Equip ID 297 297 297 673 323 323 323 558


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. A Product: Series IPD1/IPL1 connector File #: 20309807 Description: Sample ID# L7 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 22 R.H. % 40 40 35 34 Date: 31Mar03 03Apr03 09Apr03 21Apr03 Pos. ID Initial 10X T.Shock Hum. 1 13.7 -0.4 0.2 0.4 2 13.0 0.0 0.7 0.1 3 13.9 -0.6 -0.7 -1.1 4 14.3 -0.4 -1.0 -1.1 5 13.2 -0.1 0.1 -0.2 6 13.6 0.0 0.2 -0.1 7 13.1 -0.2 -0.1 0.0 8 14.3 -1.1 -1.0 -1.0 9 13.4 -0.2 0.4 0.5 10 13.1 -0.1 0.1 -0.2 11 13.2 -0.2 0.1 -0.1 12 12.8 -0.2 0.1 0.0 13 12.8 0.2 0.5 0.4 14 13.6 -0.5 -0.6 -0.8 15 14.2 -1.0 -1.3 -1.1 16 15.1 -0.8 -0.4 -1.0 17 13.1 0.0 0.3 0.5 18 14.0 -0.2 0.5 -0.6 19 13.0 -0.1 0.6 0.8 20 13.7 0.5 0.7 0.6 21 13.6 -0.1 0.6 1.3 22 13.4 0.2 1.7 1.5 23 12.8 0.1 0.3 0.4 24 13.2 0.0 0.5 0.1 25 13.0 -0.1 0.6 0.1 26 14.0 -0.2 0.1 -0.3 27 13.1 -0.6 0.1 0.1 28 13.2 0.0 0.5 0.5 29 12.7 0.2 0.6 0.8 30 12.8 0.1 0.4 0.4 MAX 15.1 0.5 1.7 1.5 MIN 12.7 -1.1 -1.3 -1.1 AVG 13.4 -0.2 0.2 0.0 STD 0.6 0.4 0.6 0.7 Open 0 0 0 0 Tech KMc DAM DAM S.Rath Equip ID 297 297 297 673 323 323 323 558


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. A Product: Series IPD1/IPL1 connector File #: 20309808 Description: Sample ID# L8 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 22 R.H. % 40 40 35 34 Date: 31Mar03 03Apr03 09Apr03 21Apr03 Pos. ID Initial 10X T.Shock Hum. 1 14.1 -0.5 -0.5 -0.5 2 13.2 0.6 -0.1 0.1 3 13.5 0.0 -0.4 -0.1 4 13.4 -0.4 -0.3 0.5 5 13.6 -0.3 -0.3 -0.4 6 13.3 -0.1 -0.1 0.1 7 12.9 0.0 0.6 0.1 8 14.0 -0.5 0.1 0.0 9 13.4 1.0 0.8 0.9 10 13.1 0.0 0.4 0.5 11 13.2 0.2 0.5 0.0 12 12.8 -0.1 0.1 0.0 13 12.9 0.3 0.3 0.3 14 13.1 0.3 -0.1 0.2 15 13.7 0.4 -0.2 -0.2 16 14.4 0.0 0.0 0.0 17 14.1 -0.4 0.2 1.0 18 14.7 -0.7 -0.5 -0.6 19 13.6 -0.1 0.8 0.2 20 14.2 0.0 0.0 -0.3 21 13.7 -0.2 -0.1 0.1 22 14.0 0.6 1.0 0.2 23 13.4 -0.4 0.3 0.8 24 13.8 0.4 0.6 -0.2 25 13.3 0.3 0.6 0.5 26 13.4 0.4 1.0 0.0 27 13.6 -0.2 0.2 0.2 28 13.4 -0.2 0.4 0.2 29 13.1 -0.2 0.8 0.7 30 13.0 0.3 0.3 0.6 MAX 14.7 1.0 1.0 1.0 MIN 12.8 -0.7 -0.5 -0.6 AVG 13.5 0 0.2 0.2 STD 0.5 0.4 0.4 0.4 Open 0 0 0 0 Tech KMc DAM DAM S.Rath Equip ID 297 297 297 673 323 323 323 558


TEST RESULTS

SEQUENCE A

GROUP B













Sample ID# Avg. Max. Min. F1 13.4 14.6 12.8 F2 13.8 15.7 12.6 F3 13.8 15.0 13.1 F4 14.3 16.6 12.0 F5 13.4 14.6 12.6 F6 13.7 15.0 13.1 F7 13.4 15.4 12.3 F8 13.6 14.1 12.9 2. See data files 20309809 through 20309816 for individual

data points.







Procedure 09. 2. Test Conditions: a) No. of Cycles : 25 b) Rate : 500 cycles per hour 3. The test samples were assembled to special holding devices



PROCEDURE: Continued

4. The test samples were axially aligned to accomplish the mating and unmating function allowing for self-centering movement.






samples as tested. 2. The following is a summary of the data observed: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Avg. Max. Sample ID# Change Change F1 -0.2 +0.9 F2 -0.1 +0.7 F3 -0.2 +0.8 F4 -1.1 +1.1 F5 -0.2 +0.7 F6 -0.2 +1.3 F7 -0.1 +0.5 F8 -0.2 +0.4 3. See data files 20309809 through 20309816 for individual

data points.










samples as tested. 2. The following is a summary of the observed data: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Avg. Max. Sample ID# Change Change F1 +0.7 +2.7 F2 +0.5 +2.0 F3 +0.5 +2.5 F4 -0.3 +2.3 F5 +0.3 +1.5 F6 +0.5 +4.7 F7 +0.6 +2.2 F8 +0.1 +1.1 3. See data files 20309809 through 20309816 for individual

data points.


PROJECT NO.: 203098 SPEC: TC038-IPX1-QUAL-0103 ------------------------------------------------------------ PART NO.: IPD1-115-X-D-XX-24 PART DESCRIPTION:Header/Recept. IPL1-115-01-X-D Connector ------------------------------------------------------------ SAMPLE SIZE: 8 Samples TECHNICIAN: SR ------------------------------------------------------------ START DATE: 4/11/03 COMPLETE DATE: 4/21/03 ------------------------------------------------------------ ROOM AMBIENT: 22C RELATIVE HUMIDITY: 34% ------------------------------------------------------------ EQUIPMENT ID#: 27, 558, 673 ------------------------------------------------------------ HUMIDITY (THERMAL CYCLE) PURPOSE: To evaluate the impact on electrical stability of the contact system when exposed to any environment which may generate thermal/moisture type failure mechanisms such as:






2. Test Conditions:








deterioration. 2. The following is a summary of the data observed: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Avg. Max. Sample ID# Change Change F1 +0.4 +1.8 F2 +0.1 +1.6 F3 +0.4 +1.8 F4 -0.5 +2.7 F5 +0.5 +2.3 F6 +0.5 +5.0 F7 +0.2 +1.2 F8 +0.5 +1.1 3. See data files 20309809 through 20309816 for individual

data points.


LLCR DATA FILES

FILE NUMBERS

20309809 20309810 20309811 20309812 20309813 20309814 20309815 20309816


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. A Product: Series IPD1/IPL1 connector File #: 20309809 Description: Sample ID# F1 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 22 R.H. % 40 40 35 34 Date: 31Mar03 03Apr03 09Apr03 21Apr03 Pos. ID Initial 25X T.Shock Hum. 1 13.2 0.5 1.8 1.8 2 13.1 0.3 1.0 0.3 3 13.6 -0.4 0.2 0.2 4 13.4 0.5 0.3 0.3 5 13.5 0.1 0.1 0.3 6 13.6 -0.4 0.3 -0.3 7 13.7 -0.7 1.0 -0.2 8 13.4 -0.1 0.5 0.4 9 13.6 -0.2 0.4 0.5 10 12.9 0.4 1.4 0.3 11 13.8 -0.6 0.2 -0.4 12 12.8 0.0 0.5 0.9 13 13.0 0.1 0.7 0.4 14 13.2 -0.1 0.2 0.7 15 13.0 0.0 0.4 0.3 16 14.4 -0.6 -0.1 -0.3 17 13.7 -0.3 0.8 1.1 18 13.2 -0.5 1.1 0.5 19 12.9 0.0 2.4 0.3 20 14.6 -1.3 0.4 0.2 21 13.2 0.9 2.7 0.1 22 14.4 -0.3 0.8 -0.1 23 13.2 -0.2 1.0 0.9 24 14.4 -1.0 -0.3 -0.2 25 13.5 -0.8 0.3 0.9 26 13.0 0.2 0.5 0.8 27 12.8 -0.2 0.4 0.5 28 13.5 -0.4 0.4 0.6 29 13.0 -0.4 0.6 0.9 30 13.3 0.0 0.9 1.0 MAX 14.6 0.9 2.7 1.8 MIN 12.8 -1.3 -0.3 -0.4 AVG 13.4 -0.2 0.7 0.4 STD 0.5 0.5 0.7 0.5 Open 0 0 0 0 Tech KMc DAM DAM S.Rath Equip ID 297 297 297 673 323 323 323 558


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. A Product: Series IPD1/IPL1 connector File #: 20309810 Description: Sample ID# F2 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 22 R.H. % 40 40 35 34 Date: 31Mar03 03Apr03 09Apr03 21Apr03 Pos. ID Initial 25X T.Shock Hum. 1 13.3 -0.2 1.1 -0.2 2 13.3 -0.3 0.3 -0.2 3 13.4 0.7 0.7 0.7 4 14.0 -0.7 0.4 0.4 5 14.2 0.4 0.1 0.0 6 13.5 0.0 0.2 0.1 7 13.3 -0.2 0.6 -0.6 8 14.0 0.2 0.1 -0.2 9 13.6 -0.4 0.3 -0.4 10 13.9 -0.1 -0.1 0.0 11 14.2 -0.5 -0.8 -1.0 12 12.6 0.2 0.6 0.7 13 14.0 -0.4 -0.4 -0.3 14 13.4 0.2 0.7 1.6 15 13.2 -0.3 -0.1 -0.4 16 14.6 -0.2 2.0 1.4 17 13.3 -0.1 0.8 0.4 18 14.3 0.3 1.1 0.1 19 13.5 0.1 1.0 0.2 20 14.4 0.6 0.8 0.5 21 14.3 -1.1 -0.4 -0.9 22 15.1 -0.5 1.0 -0.5 23 14.0 -0.3 0.2 0.1 24 14.3 0.1 0.8 0.6 25 13.5 0.1 0.9 0.7 26 14.0 0.2 1.0 -0.3 27 15.7 -0.7 -0.7 -1.1 28 14.0 0.1 0.2 0.0 29 13.1 -0.1 0.7 0.2 30 13.5 0.0 0.8 0.9 MAX 15.7 0.7 2.0 1.6 MIN 12.6 -1.1 -0.8 -1.1 AVG 13.8 -0.1 0.5 0.1 STD 0.6 0.4 0.6 0.6 Open 0 0 0 0 Tech KMc DAM DAM S.Rath Equip ID 297 297 297 673 323 323 323 558


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. A Product: Series IPD1/IPL1 connector File #: 20309811 Description: Sample ID# F3 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 22 R.H. % 40 40 35 34 Date: 31Mar03 03Apr03 09Apr03 21Apr03 Pos. ID Initial 25X T.Shock Hum. 1 14.4 0.5 0.2 -0.2 2 13.1 0.2 0.5 0.4 3 13.3 0.8 0.2 0.3 4 14.0 -0.8 0.1 0.8 5 13.4 0.5 0.6 0.3 6 13.7 -0.2 -0.2 0.2 7 13.6 -0.7 -0.4 0.3 8 13.1 0.2 0.5 0.5 9 14.2 0.1 0.1 -0.3 10 14.0 -0.2 0.0 -0.9 11 13.4 0.1 0.4 0.1 12 13.8 -0.2 0.2 0.3 13 13.3 0.3 0.8 0.4 14 13.8 -0.2 0.4 0.0 15 13.6 0.4 -0.1 -0.1 16 14.1 -0.3 0.3 0.4 17 13.2 -0.4 1.4 1.1 18 14.8 -1.1 -0.3 -0.7 19 13.7 -0.7 1.4 0.7 20 14.3 -0.8 0.1 0.6 21 13.5 -0.3 1.4 0.6 22 13.7 -0.7 0.5 0.0 23 13.2 0.1 2.5 0.9 24 14.1 -0.3 0.1 1.1 25 13.4 -0.2 0.8 0.6 26 13.7 -0.4 0.7 1.7 27 13.6 0.4 1.3 1.8 28 15.0 -1.4 0.0 -0.4 29 13.6 -0.2 1.1 0.2 30 14.3 -0.8 0.3 1.4 MAX 15.0 0.8 2.5 1.8 MIN 13.1 -1.4 -0.4 -0.9 AVG 13.8 -0.2 0.5 0.4 STD 0.5 0.5 0.6 0.6 Open 0 0 0 0 Tech KMc DAM DAM S.Rath Equip ID 297 297 297 673 323 323 323 558


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. A Product: Series IPD1/IPL1 connector File #: 20309812 Description: Sample ID# F4 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 22 R.H. % 40 40 35 34 Date: 31Mar03 03Apr03 09Apr03 21Apr03 Pos. ID Initial 25X T.Shock Hum. 1 14.3 -0.8 0.2 -1.0 2 14.4 -2.2 -0.9 -1.7 3 14.1 -1.3 -0.8 -1.4 4 14.6 -1.2 -1.0 -2.0 5 15.5 -2.3 -2.3 -1.7 6 14.7 -1.4 -1.8 -1.7 7 16.6 -3.8 -2.7 -2.3 8 15.8 -2.6 -2.6 -2.7 9 15.3 -2.4 -1.4 -2.1 10 15.3 -1.7 -1.6 -2.1 11 14.7 -1.9 -1.1 -1.9 12 14.4 -1.4 -1.1 -1.7 13 15.3 -2.0 -2.0 -2.5 14 15.2 -2.2 -1.6 -1.9 15 15.4 -1.8 -2.4 -2.2 16 13.5 0.9 1.2 1.1 17 12.8 -0.1 1.2 1.1 18 13.8 -0.6 1.6 1.0 19 13.6 -0.9 1.5 1.2 20 14.6 -0.1 0.3 0.1 21 13.6 -0.4 1.3 0.7 22 15.0 -1.5 -0.6 -1.3 23 12.3 0.3 2.2 2.7 24 14.0 -0.6 0.2 0.7 25 12.0 0.8 2.3 1.6 26 13.7 -0.6 1.0 0.6 27 13.8 1.1 0.2 -0.4 28 13.7 -0.2 1.0 1.9 29 14.1 -1.4 -0.2 0.0 30 13.7 -0.7 0.1 2.1 MAX 16.6 1.1 2.3 2.7 MIN 12.0 -3.8 -2.7 -2.7 AVG 14.3 -1.1 -0.3 -0.5 STD 1.0 1.1 1.5 1.6 Open 0 0 0 0 Tech KMc DAM DAM S.Rath Equip ID 297 297 297 673 323 323 323 558


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. A Product: Series IPD1/IPL1 connector File #: 20309813 Description: Sample ID# F5 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 22 R.H. % 40 40 35 34 Date: 31Mar03 03Apr03 09Apr03 21Apr03 Pos. ID Initial 25X T.Shock Hum. 1 14.2 0.0 0.4 0.4 2 13.0 0.1 0.3 1.4 3 14.1 -0.4 -0.6 -0.4 4 12.9 -0.6 -0.3 0.3 5 13.1 0.0 0.7 0.5 6 14.1 -0.5 -0.8 -0.5 7 13.0 -0.1 0.4 0.3 8 14.6 -1.1 -0.9 -0.8 9 13.7 0.1 -0.3 -0.3 10 13.7 -0.5 0.5 0.0 11 13.1 0.3 0.6 1.4 12 13.2 -0.2 -0.3 0.2 13 12.6 0.0 0.2 0.8 14 12.7 0.2 0.4 0.5 15 12.8 0.3 0.4 0.6 16 14.0 -0.8 -0.3 -0.6 17 13.1 -0.4 0.8 0.6 18 13.1 -0.8 0.8 0.5 19 12.8 -0.3 1.4 1.0 20 13.8 -0.5 0.5 0.6 21 13.1 -0.3 1.2 0.2 22 14.1 -0.4 0.0 -0.2 23 13.3 0.0 0.5 1.0 24 14.6 -0.6 0.0 -0.7 25 13.2 -0.7 0.5 0.9 26 13.3 -0.3 0.7 1.1 27 12.7 -0.2 0.2 2.0 28 13.2 0.0 0.9 0.6 29 13.1 0.7 1.5 1.3 30 13.1 -0.5 0.7 2.3 MAX 14.6 0.7 1.5 2.3 MIN 12.6 -1.1 -0.9 -0.8 AVG 13.4 -0.2 0.3 0.5 STD 0.6 0.4 0.6 0.8 Open 0 0 0 0 Tech KMc DAM DAM S.Rath Equip ID 297 297 297 673 323 323 323 558


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. A Product: Series IPD1/IPL1 connector File #: 20309814 Description: Sample ID# F6 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 22 R.H. % 40 40 35 34 Date: 31Mar03 03Apr03 09Apr03 21Apr03 Pos. ID Initial 25X T.Shock Hum. 1 13.7 0.0 -0.9 -0.2 2 13.1 0.1 0.4 0.0 3 14.1 -0.7 -0.1 -0.7 4 13.4 -0.7 -0.6 -0.5 5 13.5 -0.3 -0.3 -0.2 6 14.0 -0.5 0.1 -0.4 7 13.4 -0.1 0.1 0.0 8 13.5 -0.5 0.2 -0.1 9 13.3 -0.3 0.7 0.4 10 13.5 -0.6 0.0 0.4 11 13.5 -0.4 0.2 0.0 12 13.3 -0.3 0.7 0.6 13 13.1 -0.5 0.8 0.1 14 15.0 0.9 1.2 -0.2 15 13.9 -0.8 -0.1 -0.4 16 13.4 -0.2 0.3 0.2 17 13.4 0.2 0.0 1.5 18 14.4 -0.6 -0.4 -0.9 19 13.1 -0.5 0.9 2.3 20 13.8 -0.4 0.2 -0.1 21 13.4 -0.4 0.7 1.1 22 14.3 -0.1 1.3 0.6 23 13.3 -0.2 1.1 1.1 24 13.6 -0.1 1.2 1.1 25 13.3 -0.3 0.5 0.8 26 14.6 0.0 0.1 0.1 27 13.5 -0.5 0.6 0.2 28 13.9 -0.4 0.9 1.4 29 15.0 1.3 4.7 5.0 30 13.5 0.1 0.8 0.9 MAX 15.0 1.3 4.7 5.0 MIN 13.1 -0.8 -0.9 -0.9 AVG 13.7 -0.2 0.5 0.5 STD 0.5 0.4 1.0 1.1 Open 0 0 0 0 Tech KMc DAM DAM S.Rath Equip ID 297 297 297 673 323 323 323 558


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. A Product: Series IPD1/IPL1 connector File #: 20309815 Description: Sample ID# F7 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 22 R.H. % 40 40 35 34 Date: 31Mar03 03Apr03 09Apr03 21Apr03 Pos. ID Initial 25X T.Shock Hum. 1 13.4 0.5 0.3 -0.1 2 13.0 -0.3 0.4 0.2 3 13.2 0.0 0.5 -0.1 4 13.6 -0.5 -0.1 -0.2 5 13.6 0.5 0.6 -0.2 6 13.1 -0.6 0.0 0.1 7 12.9 -0.3 1.2 0.2 8 13.0 -0.5 -0.1 0.3 9 13.0 -0.2 1.6 0.6 10 12.5 0.3 1.0 1.2 11 13.1 0.3 0.1 0.5 12 12.4 0.4 0.6 0.6 13 13.1 -0.2 0.0 -0.3 14 15.4 -0.5 -1.3 -0.9 15 12.3 0.0 0.7 0.4 16 14.1 -0.4 0.3 -0.3 17 13.5 -0.3 0.7 -0.3 18 13.3 0.1 1.0 0.3 19 13.4 0.1 1.3 0.2 20 13.8 -0.2 1.0 0.4 21 13.2 0.0 1.1 0.6 22 14.9 -0.4 1.6 -0.9 23 12.8 0.5 2.2 0.8 24 13.9 -0.1 0.5 0.3 25 13.6 0.1 1.1 0.9 26 13.2 0.1 0.2 0.1 27 13.7 -0.5 0.5 0.3 28 13.8 -0.3 0.6 -0.1 29 13.3 0.1 0.4 -0.3 30 13.8 0.0 0.4 0.5 MAX 15.4 0.5 2.2 1.2 MIN 12.3 -0.6 -1.3 -0.9 AVG 13.4 -0.1 0.6 0.2 STD 0.6 0.3 0.7 0.5 Open 0 0 0 0 Tech KMc DAM DAM S.Rath Equip ID 297 323 323 673 323 297 297 558


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. A Product: Series IPD1/IPL1 connector File #: 20309816 Description: Sample ID# F8 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 22 R.H. % 40 40 35 34 Date: 31Mar03 03Apr03 09Apr03 21Apr03 Pos. ID Initial 25X T.Shock Hum. 1 13.2 0.3 0.8 0.3 2 12.9 -0.1 0.3 0.4 3 13.4 -0.1 -0.3 -0.2 4 13.5 -0.3 -0.4 0.4 5 13.5 -0.2 -0.3 -0.4 6 13.3 0.0 0.1 0.4 7 14.0 -1.0 -0.8 -0.5 8 13.6 -0.1 0.0 0.5 9 13.8 0.0 0.1 0.6 10 13.4 -0.2 -0.3 1.1 11 14.0 -0.5 -0.8 -0.4 12 13.7 -0.6 -0.7 0.0 13 13.5 0.4 -0.7 -0.3 14 13.5 -0.2 0.2 -0.3 15 12.9 -0.1 0.5 0.9 16 13.3 0.3 0.7 0.1 17 13.1 0.0 0.4 0.6 18 13.5 -0.3 0.6 0.2 19 13.7 -0.3 0.7 0.3 20 13.9 -0.5 0.1 -0.4 21 14.1 -0.7 -0.1 -0.3 22 14.0 -0.7 0.0 -0.6 23 13.7 -0.6 0.1 0.4 24 13.8 0.4 0.4 0.0 25 13.3 -0.2 1.1 0.8 26 14.1 -0.5 0.0 -0.3 27 13.4 0.3 0.0 0.5 28 13.4 0.4 0.3 0.8 29 14.1 -0.8 -0.9 -0.4 30 13.3 -0.2 0.6 0.7 MAX 14.1 0.4 1.1 1.1 MIN 12.9 -1.0 -0.9 -0.6 AVG 13.6 -0.2 0.1 0.2 STD 0.3 0.4 0.5 0.5 Open 0 0 0 0 Tech KMc DAM DAM S.Rath Equip ID 297 297 297 673 323 323 323 558


TEST RESULTS

SEQUENCE A

GROUP C













Sample ID# Avg. Max. Min. S1 13.4 13.9 12.8 S2 13.6 15.9 12.9 S3 13.4 14.2 12.7 S4 13.3 13.8 12.7 S5 13.8 14.9 12.8 S6 14.0 15.5 12.8 S7 13.8 16.9 12.9 S8 13.9 15.7 13.0 2. See data files 20309817 through 20309824 for individual

data points.







Procedure 9. 2. Test Conditions: a) No. of Cycles : 100 b) Rate : 500 cycles per hour 3. The test samples were assembled to special holding devices



PROCEDURE: Continued 4. The test samples were axially aligned to accomplish the

mating and unmating function allowing for self-centering movement.






samples as tested. 2. The following is a summary of the data observed: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Avg. Max. Sample ID# Change Change S1 +0.1 +1.0 S2 +0.1 +1.0 S3 +0.1 +0.7 S4 +0.2 +1.4 S5 +0.1 +2.2 S6 +0.1 +2.3 S7 -0.2 +0.7 S8 +0.0 +3.1 3. See data files 20309817 through 20309824 for individual

data points.










samples as tested. 2. The following is a summary of the observed data: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Avg. Max. Sample ID# Change Change S1 +0.7 +2.1 S2 +0.3 +1.0 S3 +0.8 +2.2 S4 +0.4 +1.4 S5 +0.3 +1.9 S6 +0.7 +4.1 S7 +0.2 +1.9 S8 +0.4 +2.7 3. See data files 20309817 through 20309824 for individual

data points.


PROJECT NO.: 203098 SPEC: TC038-IPX1-QUAL-0103 ------------------------------------------------------------ PART NO.: IPD1-115-X-D-XX-24 PART DESCRIPTION:Header/Recept. IPL1-115-01-X-D Connector ------------------------------------------------------------ SAMPLE SIZE: 8 Samples TECHNICIAN: KMC ------------------------------------------------------------ START DATE: 4/21/03 COMPLETE DATE: 4/21/03 ------------------------------------------------------------ ROOM AMBIENT: 22C RELATIVE HUMIDITY: 34% ------------------------------------------------------------ EQUIPMENT ID#: 27, 295, 476 ------------------------------------------------------------ HUMIDITY (THERMAL CYCLE) PURPOSE: To evaluate the impact on electrical stability of the contact system when exposed to any environment which may generate thermal/moisture type failure mechanisms such as:






2. Test Conditions:








deterioration. 2. The following is a summary of the data observed: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Avg. Max. Sample ID# Change Change S1 +0.6 +1.6 S2 +0.2 +1.5 S3 +0.5 +1.8 S4 +0.8 +2.2 S5 +0.5 +2.2 S6 +0.0 +1.3 S7 +0.2 +1.7 S8 +0.4 +2.0 3. See data files 20309817 through 20309824 for individual

data points.


LLCR DATA FILES

FILE NUMBERS

20309817 20309818 20309819 20309820 20309821 20309822 20309823 20309824


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. A Product: Series IPD1/IPL1 connector File #: 20309817 Description: Sample ID# S1 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 22 R.H. % 40 40 35 34 Date: 31Mar03 03Apr03 09Apr03 21Apr03 Pos. ID Initial 100X T.Shock HUM 1 13.9 0.2 1.2 -0.3 2 13.7 -0.4 -0.3 0.1 3 13.6 -0.2 0.0 0.2 4 13.5 -0.2 0.2 0.1 5 13.4 -0.1 0.5 0.3 6 13.3 0.0 0.7 0.4 7 13.3 0.1 0.6 0.0 8 13.6 0.5 0.5 0.4 9 13.4 0.0 0.5 1.2 10 13.7 -0.2 -0.3 0.1 11 13.4 -0.2 0.0 0.5 12 13.0 0.4 0.6 0.6 13 13.6 -0.1 0.1 -0.4 14 13.7 -0.3 0.5 -0.7 15 13.5 0.2 0.0 -0.2 16 13.4 1.0 1.9 -0.3 17 13.4 -0.2 0.5 0.8 18 13.6 0.1 1.4 1.2 19 13.7 -0.6 0.9 0.7 20 13.2 1.0 2.1 1.0 21 13.7 -0.1 1.5 1.6 22 13.6 0.9 1.4 1.4 23 12.8 0.1 1.4 1.0 24 13.8 0.0 1.3 1.2 25 12.9 0.1 1.6 1.0 26 13.3 -0.3 0.6 1.4 27 13.3 0.0 0.9 0.8 28 13.1 0.0 0.5 0.5 29 13.1 0.0 0.8 0.9 30 13.1 -0.2 0.5 1.2 MAX 13.9 1.0 2.1 1.6 MIN 12.8 -0.6 -0.3 -0.7 AVG 13.4 0.1 0.7 0.6 STD 0.3 0.4 0.6 0.6 Open 0 0 0 0 Tech KMc DAM DAM KMc Equip ID 297 297 297 476 323 323 323 295


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. A Product: Series IPD1/IPL1 connector File #: 20309818 Description: Sample ID# S2 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 22 R.H. % 40 40 35 34 Date: 31Mar03 03Apr03 09Apr03 21Apr03 Pos. ID Initial 100X T.Shock HUM 1 13.6 -0.2 -0.1 0.6 2 13.1 1.0 0.9 1.5 3 12.9 0.7 0.7 1.2 4 14.0 -0.5 -0.5 0.2 5 13.7 -0.2 -0.1 0.1 6 13.8 -0.6 -0.3 -0.5 7 13.0 0.3 0.8 0.4 8 14.1 -0.1 0.3 0.3 9 13.1 0.3 0.2 0.8 10 13.0 0.2 0.4 0.8 11 13.7 -0.3 0.1 -0.2 12 13.4 0.0 0.1 0.2 13 13.3 -0.1 0.6 0.0 14 13.4 0.2 0.4 0.5 15 13.3 0.0 0.4 -0.2 16 15.9 -0.8 -0.4 -1.1 17 13.2 0.3 0.8 0.4 18 13.6 0.5 1.0 0.7 19 13.5 0.3 0.5 -0.2 20 13.9 0.8 0.9 -0.4 21 13.7 0.3 0.9 0.2 22 15.1 -0.1 -0.2 -0.5 23 13.5 -0.1 -0.3 -0.3 24 13.9 0.2 0.9 -0.1 25 13.5 0.3 0.5 0.0 26 13.7 -0.2 0.1 0.3 27 13.9 -0.4 0.3 0.1 28 13.5 0.1 0.1 0.2 29 13.2 0.3 0.2 0.5 30 14.0 -0.6 -0.1 0.1 MAX 15.9 1.0 1.0 1.5 MIN 12.9 -0.8 -0.5 -1.1 AVG 13.6 0.1 0.3 0.2 STD 0.6 0.4 0.4 0.5 Open 0 0 0 0 Tech KMc DAM DAM KMC Equip ID 297 297 297 476 323 323 323 295


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. A Product: Series IPD1/IPL1 connector File #: 20309819 Description: Sample ID# S3 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 22 R.H. % 40 40 35 34 Date: 31Mar03 03Apr03 09Apr03 21Apr03 Pos. ID Initial 100X T.Shock HUM 1 14.0 -0.2 -0.4 -0.5 2 13.5 -0.6 0.0 0.1 3 13.2 0.3 0.4 0.4 4 13.5 -0.3 0.4 -0.2 5 13.5 -0.6 -0.2 0.0 6 13.4 -0.2 0.0 0.4 7 13.6 -0.6 0.2 0.3 8 13.6 0.3 0.5 1.4 9 13.2 -0.1 0.7 0.3 10 13.9 0.2 0.3 0.3 11 13.1 0.0 0.8 0.3 12 13.1 0.3 0.7 1.8 13 13.2 0.1 0.4 0.5 14 13.2 0.2 0.9 0.6 15 13.4 0.1 0.6 0.4 16 13.8 0.2 1.4 0.0 17 13.2 0.4 1.0 1.2 18 13.2 0.7 2.0 0.6 19 13.2 -0.3 1.6 0.8 20 13.9 -0.2 1.7 -0.2 21 13.6 0.3 2.0 1.3 22 14.0 -0.1 1.4 -0.2 23 14.2 -0.5 1.2 0.4 24 13.2 0.5 2.2 0.8 25 13.2 0.1 0.9 0.5 26 13.6 -0.3 0.5 0.3 27 13.2 0.1 0.7 0.4 28 12.7 0.7 1.1 0.9 29 12.7 0.5 1.4 1.1 30 13.1 0.7 0.8 1.1 MAX 14.2 0.7 2.2 1.8 MIN 12.7 -0.6 -0.4 -0.5 AVG 13.4 0.1 0.8 0.5 STD 0.4 0.4 0.7 0.5 Open 0 0 0 0 Tech KMc DAM DAM KMc Equip ID 297 297 297 476 323 323 323 295


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. A Product: Series IPD1/IPL1 connector File #: 20309820 Description: Sample ID# S4 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 22 R.H. % 40 40 35 34 Date: 31Mar03 03Apr03 09Apr03 21Apr03 Pos. ID Initial 100X T.Shock HUM 1 13.6 0.5 -0.1 1.7 2 13.5 -0.4 -0.3 0.0 3 13.6 0.5 0.0 2.2 4 12.8 0.8 0.0 2.2 5 13.7 -0.2 0.2 1.1 6 13.2 0.1 0.1 0.4 7 13.3 0.5 0.2 1.7 8 13.5 0.1 0.4 1.0 9 13.5 0.0 0.0 1.2 10 12.8 0.3 0.9 0.6 11 13.0 1.4 1.0 0.9 12 13.4 0.2 0.3 0.5 13 13.3 0.2 0.3 0.4 14 13.3 0.4 -0.1 0.3 15 13.3 0.5 0.4 0.3 16 13.6 0.0 1.4 1.0 17 13.8 -0.2 1.3 0.9 18 13.5 0.1 0.5 0.6 19 13.5 0.3 0.5 0.4 20 13.5 -0.4 0.1 1.1 21 12.9 0.3 1.3 0.4 22 13.4 0.4 0.9 0.9 23 13.0 -0.3 0.1 -0.1 24 13.5 0.0 0.6 0.1 25 12.7 0.1 0.7 0.2 26 13.0 0.9 0.5 1.7 27 13.2 0.4 0.0 0.5 28 13.5 -0.7 -0.2 0.0 29 13.0 0.2 1.3 0.5 30 13.0 1.1 0.4 1.2 MAX 13.8 1.4 1.4 2.2 MIN 12.7 -0.7 -0.3 -0.1 AVG 13.3 0.2 0.4 0.8 STD 0.3 0.4 0.5 0.6 Open 0 0 0 0 Tech KMc DAM DAM KMc Equip ID 297 297 297 476 323 323 323 295


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. A Product: Series IPD1/IPL1 connector File #: 20309821 Description: Sample ID# S5 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 22 R.H. % 40 40 35 34 Date: 31Mar03 03Apr03 09Apr03 21Apr03 Pos. ID Initial 100X T.Shock HUM 1 14.0 0.4 1.9 1.3 2 13.4 0.3 0.2 0.3 3 13.4 0.5 1.2 2.1 4 13.7 0.2 0.1 0.3 5 13.8 -0.4 -0.3 1.4 6 13.0 0.1 0.4 0.6 7 13.2 0.6 0.6 2.2 8 13.5 0.6 0.6 1.2 9 13.5 0.1 0.4 0.7 10 13.6 0.0 -0.3 -0.2 11 13.8 -0.2 0.1 -0.1 12 13.7 0.1 -0.1 -0.2 13 13.4 0.7 0.2 0.3 14 13.6 0.1 0.5 0.0 15 13.6 -0.4 0.0 -0.3 16 14.6 -0.7 -0.6 -0.4 17 14.4 -0.3 -1.0 -0.6 18 14.2 -0.7 -0.1 0.3 19 13.9 -0.5 0.0 0.2 20 14.1 -0.4 1.0 0.3 21 14.1 -0.6 1.0 0.3 22 14.9 0.6 0.8 -0.7 23 12.8 0.4 1.1 1.7 24 14.1 -0.3 0.4 -0.2 25 14.0 0.1 0.2 0.6 26 14.2 -0.7 0.0 -0.5 27 13.7 -0.1 0.6 2.0 28 13.3 0.2 0.8 0.8 29 13.2 0.0 0.4 1.1 30 14.2 2.2 0.2 0.7 MAX 14.9 2.2 1.9 2.2 MIN 12.8 -0.7 -1.0 -0.7 AVG 13.8 0.1 0.3 0.5 STD 0.5 0.6 0.6 0.8 Open 0 0 0 0 Tech KMc DAM DAM KMc Equip ID 297 297 297 476 323 323 323 295


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. A Product: Series IPD1/IPL1 connector File #: 20309822 Description: Sample ID# S6 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 22 R.H. % 40 40 35 34 Date: 31Mar03 03Apr03 09Apr03 21Apr03 Pos. ID Initial 100X T.Shock HUM 1 13.6 0.7 0.5 1.0 2 14.0 -0.3 0.0 0.0 3 13.4 0.5 0.4 0.6 4 13.7 0.5 -0.1 0.2 5 13.9 0.7 0.0 -0.2 6 13.8 0.5 -0.1 -0.3 7 13.6 0.1 -0.1 0.2 8 14.0 0.4 0.4 0.1 9 13.7 0.4 1.2 0.8 10 13.7 0.1 0.3 -0.5 11 13.8 0.3 0.3 -0.1 12 13.4 0.0 -0.4 0.2 13 13.8 0.2 -0.6 -0.1 14 14.0 0.0 -0.6 -0.8 15 12.8 0.2 0.4 0.9 16 14.1 -0.5 1.8 0.1 17 15.0 -0.4 0.0 -0.7 18 14.4 -0.2 1.2 -0.6 19 13.5 0.1 1.0 0.1 20 14.9 -0.4 2.2 -1.0 21 14.7 -1.2 0.7 -0.8 22 14.5 0.0 1.7 -0.2 23 13.8 -0.1 0.2 1.2 24 15.5 2.0 1.6 -1.1 25 14.3 -0.2 1.3 0.3 26 13.8 2.3 4.1 1.0 27 15.5 -0.8 0.8 -0.8 28 13.9 0.1 0.1 -0.3 29 13.6 -0.6 0.7 0.3 30 13.5 0.0 1.2 1.3 MAX 15.5 2.3 4.1 1.3 MIN 12.8 -1.2 -0.6 -1.1 AVG 14.0 0.1 0.7 0.0 STD 0.6 0.7 1.0 0.7 Open 0 0 0 0 Tech KMc DAM DAM KMc Equip ID 297 297 297 476 323 323 323 295


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. A Product: Series IPD1/IPL1 connector File #: 20309823 Description: Sample ID# S7 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 22 R.H. % 40 40 35 34 Date: 31Mar03 03Apr03 09Apr03 21Apr03 Pos. ID Initial 100X T.Shock HUM 1 13.9 0.0 -0.6 0.1 2 12.9 -0.3 -0.2 0.4 3 13.3 0.0 0.3 -0.3 4 13.8 -0.1 0.1 0.0 5 14.1 -0.5 0.0 0.0 6 14.5 -1.1 -0.8 -0.4 7 13.1 0.1 0.2 0.6 8 13.6 0.5 0.3 0.7 9 13.6 -0.5 -0.1 0.3 10 13.3 0.7 0.7 0.4 11 12.9 0.0 -0.1 0.7 12 13.1 0.2 0.7 0.3 13 13.3 0.0 0.1 0.6 14 13.6 -0.1 0.3 0.3 15 14.7 -1.0 -0.9 -0.5 16 14.1 -0.1 0.6 0.5 17 13.9 -1.1 -0.1 0.1 18 13.7 -0.4 0.8 -0.5 19 16.9 -1.9 -1.4 -0.8 20 14.1 -0.1 0.4 0.0 21 13.7 -0.2 0.7 0.6 22 13.8 0.3 1.8 -0.5 23 13.9 -0.5 -0.4 -0.1 24 14.2 -0.6 1.1 0.0 25 13.9 -0.8 -0.2 0.0 26 14.1 -0.3 0.2 -0.7 27 13.0 0.6 1.9 1.7 28 13.4 0.1 0.4 0.6 29 13.3 0.1 0.7 0.4 30 13.6 0.0 0.9 0.1 MAX 16.9 0.7 1.9 1.7 MIN 12.9 -1.9 -1.4 -0.8 AVG 13.8 -0.2 0.2 0.2 STD 0.8 0.6 0.7 0.5 Open 0 0 0 0 Tech KMc DAM DAM KMC Equip ID 297 297 297 476 323 323 323 295


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. A Product: Series IPD1/IPL1 connector File #: 20309824 Description: Sample ID# S8 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 22 R.H. % 40 40 35 34 Date: 31Mar03 03Apr03 09Apr03 21Apr03 Pos. ID Initial 100X T.Shock HUM 1 13.6 -0.1 -0.1 1.7 2 13.1 0.1 0.6 0.9 3 13.4 -0.3 0.2 0.8 4 13.3 0.2 0.4 0.4 5 13.8 -0.2 0.3 0.6 6 13.3 0.5 0.2 0.4 7 14.9 -1.2 -1.2 -1.3 8 13.4 3.1 2.7 0.7 9 14.0 0.2 0.3 -0.4 10 13.0 0.5 1.4 0.8 11 13.7 0.2 -0.1 0.3 12 13.5 0.2 0.9 0.3 13 13.6 -0.2 0.3 0.0 14 13.6 0.5 0.4 2.0 15 13.7 0.7 0.5 0.7 16 15.7 -1.0 -1.3 -1.2 17 13.6 0.1 0.8 0.4 18 15.3 -0.4 0.0 -0.3 19 14.6 -0.6 -0.4 0.0 20 15.1 -0.9 1.2 -0.8 21 14.6 0.0 0.7 -0.6 22 14.3 -0.6 0.2 0.8 23 14.0 0.4 1.2 1.9 24 14.4 -0.8 -0.1 -0.3 25 13.5 0.2 1.1 1.4 26 13.8 -0.3 -0.1 0.0 27 13.5 0.4 0.4 1.5 28 14.1 -0.6 0.2 -0.6 29 14.2 -0.3 -0.3 0.4 30 13.3 0.9 0.9 1.2 MAX 15.7 3.1 2.7 2.0 MIN 13.0 -1.2 -1.3 -1.3 AVG 13.9 0.0 0.4 0.4 STD 0.7 0.8 0.8 0.9 Open 0 0 0 0 Tech KMc DAM DAM KMc Equip ID 297 297 297 476 323 323 323 295


TEST RESULTS

SEQUENCE B

GROUP A


PROJECT NO.: 203098 SPEC: TC038-IPX1-QUAL-0103 ------------------------------------------------------------ PART NO.: IPD1-115-X-D-XX-24 PART DESCRIPTION:Header/Recept. IPL1-115-01-X-D Connector ------------------------------------------------------------ SAMPLE SIZE: 2 Samples TECHNICIAN: DAM ------------------------------------------------------------ START DATE: 3/31/03 COMPLETE DATE: 3/31/03 ------------------------------------------------------------ ROOM AMBIENT: 20C RELATIVE HUMIDITY: 38% ------------------------------------------------------------ EQUIPMENT ID#: 297, 323 ------------------------------------------------------------ LOW LEVEL CIRCUIT RESISTANCE (LLCR) PURPOSE: 1. To evaluate contact resistance characteristics of the











Sample ID# Avg. Max. Min. S9 13.7 14.7 12.9 S10 13.8 16.4 12.8 2. See data files 20309833 through 20309834 for individual

data points.


PROJECT NO.: 203098 SPEC: TC038-IPX1-QUAL-0103 ------------------------------------------------------------ PART NO.: IPD1-115-X-D-XX-24 PART DESCRIPTION:Header/Recept. IPL1-115-01-X-D Connector ------------------------------------------------------------ SAMPLE SIZE: 2 Samples TECHNICIAN: DAM ------------------------------------------------------------ START DATE: 4/8/03 COMPLETE DATE: 4/8/03 ------------------------------------------------------------ ROOM AMBIENT: 20C RELATIVE HUMIDITY: 34% ------------------------------------------------------------ EQUIPMENT ID#: 297, 323, 553, 620, 1169, 1271, 1272, 1366, 1367, 1368 ------------------------------------------------------------ MECHANICAL SHOCK (SPECIFIED PULSE) PURPOSE: To determine the mechanical and electrical integrity of connectors for use with electronic equipment subjected to shocks such as those expected from handling, transportation, etc. ------------------------------------------------------------ PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 27. 2. Test Conditions: a) Peak Value : 100 G b) Duration : 6 Milliseconds c) Wave Form : Sawtooth d) Velocity : 9.7 feet Per Second e) No. of Shocks : 3 Shocks/Direction, 3 Axis (18 Total) 3. See Figure #4 for sample fixturing. 4. All subsequent variable testing was performed in accordance

with the procedures previously indicated. ------------------------------------------------------------ REQUIREMENTS: See next page.





samples as tested. 2. The following is a summary of the data observed: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Avg. Max. Sample ID# Change Change S1 +0.4 +1.6 S2 +0.2 +1.9 3. See data files 20309833 through 20309834 for individual

data points. 4. The Mechanical Shock characteristics are shown in Figures

#5 (Calibration Pulse) and #6 (Test Pulse). Each figure displays the shock pulse contained within the upper and lower limits as defined by the appropriate test specification.


FIGURE #4

TYPICAL MECHANICAL SHOCK/VIBRATION FIXTURING


FIGURE #5

0.44 0.46 0.48 0.50 0.52 0.54 0.560.57

[s]

-100

-50

0

50

100

150

[g]

Channel 1ClassicalSh k

ACCELERATION (g)

LOWER LIMIT-----

ACTUAL PULSE-----

UPPER LIMIT------

Project 203098 Samtec Cal Wave 1 04Apr03 Tech:BE

DURATION (Seconds)


FIGURE #6

0.44 0.46 0.48 0.50 0.52 0.54 0.56 0.57

[s]

-100

-50

0

50

100

150

[g]

Channel 1Classical ShockACCELERATION (g)

LOWER LIMIT-----

ACTUAL PULSE-----

UPPER LIMIT------

Project 203098 Samtec Actual Wave 04Apr03 Tech:BE

DURATION (Seconds)


PROJECT NO.: 203098 SPEC: TC038-IPX1-QUAL-0103 ------------------------------------------------------------ PART NO.: IPD1-115-X-D-XX-24 PART DESCRIPTION:Header/Recept. IPL1-115-01-X-D Connector ------------------------------------------------------------ SAMPLE SIZE: 2 Samples TECHNICIAN: DAM ------------------------------------------------------------ START DATE: 4/8/03 COMPLETE DATE: 4/9/03 ------------------------------------------------------------ ROOM AMBIENT: 20C RELATIVE HUMIDITY: 35% ------------------------------------------------------------ EQUIPMENT ID#: 297, 323, 553, 620, 1169, 1271, 1272, 1366, 1367, 1368 ------------------------------------------------------------ VIBRATION, RANDOM PURPOSE: 1. To establish the mechanical integrity of the test samples

exposed to external mechanical stresses. 2. To determine if the contact system is susceptible to

fretting corrosion. 3. To determine if the electrical stability of the system has

degraded when exposed to a vibratory environment. ------------------------------------------------------------ PROCEDURE: 1. The test was performed in accordance with EIA 364, Test

Procedure 28. 2. Test Conditions: a) Power Spectral Density : 0.04 G2/Hz b) G ’RMS’ : 7.56 c) Frequency : 50 to 2000 d) Duration : 2.0 hours per axis 3. Figure #4 illustrates the test sample fixturing utilized

during the test. 4. All subsequent variable testing was performed in accordance

with procedures previously indicated. ------------------------------------------------------------ REQUIREMENTS: See next page.





samples as tested. 2. The following is a summary of the observed data: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Avg. Max. Sample ID# Change Change S1 +0.2 +1.3 S2 +0.1 +2.1 3. See data files 20309833 through 20309834 for individual

data points.


LLCR DATA FILES

FILE NUMBERS

20309833 20309834


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. B Product: Series IPD1/IPL1 connector File #: 20309833 Description: Sample ID# S9 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 R.H. % 38 34 35 Date: 04Apr03 08Apr03 09Apr03 Pos. ID Initial M.Shock Vib 1 13.8 0.1 -0.2 2 14.6 -0.8 0.2 3 13.5 0.0 -0.1 4 13.0 0.5 0.1 5 13.2 0.6 0.4 6 12.8 0.4 1.3 7 12.9 0.3 0.4 8 13.4 0.1 0.7 9 14.3 0.1 -0.7 10 13.5 0.2 0.3 11 16.4 -1.1 -1.2 12 13.1 1.0 0.6 13 13.4 0.2 0.1 14 12.8 1.3 0.9 15 13.1 0.8 0.2 16 15.4 -0.6 -0.6 17 14.2 -0.5 0.2 18 15.2 0.0 -0.9 19 14.0 0.4 -0.1 20 14.6 0.9 0.7 21 13.4 0.5 0.5 22 14.3 1.2 1.2 23 13.7 0.2 -0.3 24 14.4 1.5 0.7 25 13.7 0.4 -0.3 26 13.9 0.6 -0.1 27 13.3 1.0 1.0 28 13.2 1.6 0.8 29 13.5 0.5 0.0 30 13.1 1.1 0.2 MAX 16.4 1.6 1.3 MIN 12.8 -1.1 -1.2 AVG 13.8 0.4 0.2 STD 0.8 0.7 0.6 Open 0 0 0 Tech DAM DAM DAM Equip ID 297 297 297 323 323 323


Low Level Contact Resistance Project :203098 Spec: EIA 364, TP 23 Customer:Samtec Subgroup: Seq. B Product: Series IPD1/IPL1 connector File #: 20309834 Description: Sample ID# S10 Open circuit voltage: 20mv Current: 10ma Delta values units: milliohms Temp ºC 20 20 20 R.H. % 38 34 35 Date: 04Apr03 08Apr03 09Apr03 Pos. ID Initial M.Shock Vib 1 13.6 0.5 1.3 2 13.3 0.0 0.2 3 13.5 -0.3 0.6 4 13.3 -0.1 0.3 5 13.6 0.1 -0.4 6 13.5 -0.4 -0.5 7 13.7 -0.4 -0.6 8 14.7 -0.5 -0.6 9 13.5 0.5 0.4 10 14.1 0.4 -0.1 11 13.5 0.4 -0.1 12 13.6 0.0 -0.2 13 13.4 -0.2 -0.6 14 13.8 0.3 -0.8 15 12.9 0.4 0.1 16 13.9 0.0 2.1 17 13.0 0.2 0.7 18 13.9 0.2 0.9 19 14.1 -0.5 0.1 20 13.8 0.8 0.8 21 13.5 0.3 0.3 22 13.9 1.9 0.7 23 13.5 -0.1 0.0 24 13.9 1.9 0.2 25 14.0 -0.3 -0.6 26 13.6 -0.3 0.0 27 13.6 -0.1 0.1 28 14.2 -0.1 -0.2 29 13.4 0.5 0.2 30 13.8 0.9 -0.1 MAX 14.7 1.9 2.1 MIN 12.9 -0.5 -0.8 AVG 13.7 0.2 0.1 STD 0.4 0.6 0.6 Open 0 0 0 Tech DAM DAM DAM Equip ID 297 297 297 323 323 323


TEST RESULTS

SEQUENCE C

GROUP A


PROJECT NO.: 203098 SPEC: TC038-IPX1-QUAL-0103 ------------------------------------------------------------ PART NO.: IPD1-115-X-D-XX-24 PART DESCRIPTION:Header/Recept. IPL1-115-01-X-D Connector ------------------------------------------------------------ SAMPLE SIZE: 2 Samples TECHNICIAN: DAM ------------------------------------------------------------ START DATE: 4/2/03 COMPLETE DATE: 4/2/03 ------------------------------------------------------------ ROOM AMBIENT: 20C RELATIVE HUMIDITY: 36% ------------------------------------------------------------ EQUIPMENT ID#: 418, 419, 1012 ------------------------------------------------------------ VOLTAGE DROP PURPOSE: To determine the electrical resistance of the contact system under conditions where the applied current levels are at the rated current of the contact. ------------------------------------------------------------ PROCEDURE: 1. The test was performed in accordance with EIA 364, Test

Procedure 6. 2. Test Conditions: a) Test Current (Amps) : 2.9 Amps b) No. of Observations : 4 per sample 3. The points of application were in accordance with Figure #7. ------------------------------------------------------------ REQUIREMENTS: When the specified rated current is applied, the voltage drop shall be measured and recorded. ------------------------------------------------------------ RESULTS: See next page.


RESULTS: 1. The following is a summary of the data observed: VOLTAGE DROP (Millivolts) Sample ID# Avg. Max. Min. C1 84.6 85.7 83.4 C2 85.2 86.6 84.4 2. See data files 20309830 and 20309831 for individual data

points.


FIGURE #7

TYPICAL VOLTAGE DROP SET UP


PROJECT NO.: 203098 SPEC: TC038-IPX1-QUAL-0103 ------------------------------------------------------------ PART NO.: IPD1-115-X-D-XX-24 PART DESCRIPTION:Header/Recept. IPL1-115-01-X-D Connector ------------------------------------------------------------ SAMPLE SIZE: 2 Samples TECHNICIAN: KMC ------------------------------------------------------------ START DATE: 4/2/03 COMPLETE DATE: 4/24/03 ------------------------------------------------------------ ROOM AMBIENT: 20C RELATIVE HUMIDITY: 42% ------------------------------------------------------------ EQUIPMENT ID#: 418, 419, 1012 ------------------------------------------------------------ CURRENT CYCLING PURPOSE: To determine the impact current cycling was on the electrical performance of the connectors. ------------------------------------------------------------ PROCEDURE: 1. The test was performed in accordance with EIA 364, Test

Procedure 55, Test Condition B, Test Method 4. 2. Test Conditions: a) Test Current : 2.9 amps b) Cycle Time : ON - 45 minutes OFF- 15 minutes c) Number of Cycles : 500 3. The test specimen was placed in a chamber or room which

prevents air currents and the like from influencing the observations.

4. All subsequent variable testing was performed in accordance



------------------------------------------------------------ REQUIREMENTS:

1. There shall be no evidence of physical damage to the test samples as tested.


REQUIREMENTS: Continued 2. The voltage drop shall be measured and recorded at 250 and

500 cycles of current cycling. ------------------------------------------------------------ RESULTS: 1. There was no evidence of physical damage to the test

samples as tested. 2. The following is a summary of the observed data: VOLTAGE DROP (Millvolts) 250 Cycles 500 Cycles

Sample ID# Avg. Max. Min. Avg. Max. Min. C1 84.4 85.2 82.9 84.2 85.1 83.0 C2 83.7 84.8 82.3 84.2 85.1 83.0 3. See data files 20309830 and 20309831 for individual data

points.


VOLTAGE DROP DATA FILES

FILE NUMBERS

20309830 20309831


Voltage Drop Project :203098 Spec: EIA 364, TP 06 Customer:Samtec Subgroup: Seq. C Product: Series IPD1/IPL1 connector File #: 20309830 Description: Sample ID# C1 Open circuit voltage: Current: 2.9 Amps Actual values units: millivolts Temp ºC 20 20 20 R.H. % 36 34 42 Date: 02Apr03 11Apr03 23Apr03 Pos. ID Initial 250 Hrs. 500 Hrs. 1-1 85.0 84.6 84.8 1-2 85.7 85.2 83.9 1-3 83.4 82.9 83.0 1-4 84.2 84.7 85.1 MAX 85.7 85.2 85.1 MIN 83.4 82.9 83.0 AVG 84.6 84.4 84.2 STD 1.0 1.0 0.9 Open 0 0 0 Tech DAM DAM DAM Equip ID 419 419 419 418 418 418 1012 1012 1012


Voltage Drop Project :203098 Spec: EIA 364, TP 06 Customer:Samtec Subgroup: Seq. C Product: Series IPD1/IPL1 connector File #: 20309831 Description: Sample ID# C2 Open circuit voltage: Current: 2.9 Amps Actual values units: millivolts Temp ºC 20 20 20 R.H. % 36 34 42 Date: 02Apr03 11Apr03 23Apr03 Pos. ID Initial 250 Hrs 500 Hrs. 2-1 85.2 84.2 84.8 2-2 84.4 83.5 83.9 2-3 84.6 82.3 83.0 2-4 86.6 84.8 85.1 MAX 86.6 84.8 85.1 MIN 84.4 82.3 83.0 AVG 85.2 83.7 84.2 STD 1.0 1.1 0.9 Open 0 0 0 Tech DAM DAM DAM Equip ID 419 419 419 418 418 418 1012 1012 1012


TEST RESULTS

SEQUENCE D

GROUP A


PROJECT NO.: 203098 SPEC: TC038-IPX1-QUAL-0103 ------------------------------------------------------------ PART NO.: IPD1-115-X-D-XX-24 PART DESCRIPTION:Header/Recept. IPL1-115-01-X-D Connector ------------------------------------------------------------ SAMPLE SIZE: 4 Samples TECHNICIAN: DAM ------------------------------------------------------------ START DATE: 4/23/03 COMPLETE DATE: 4/23/03 ------------------------------------------------------------ ROOM AMBIENT: 20C RELATIVE HUMIDITY: 42% ------------------------------------------------------------ EQUIPMENT ID#: 55, 171 ------------------------------------------------------------ SOLVENT RESISTANCE PURPOSE: To determine the ability of the plastic housing to withstand normal cleaning solvents without damage. The solvent used is considered severe. If, however, the plastic remains stable and undamaged when so exposed it is considered to be immune to all the common solutions available. ------------------------------------------------------------ PROCEDURE: 1. The test was performed in accordance with EIA 364, Test

Procedure 11A, Table 1. 2. The test samples were exposed to each of the solutions

indicated below. 3. An appropriate size beaker large enough to accept the

connectors to be tested was selected. 4. The beaker was filled to a level sufficient to cover the

samples plus 1.0” with the chemicals listed below.

Description Temperature Time (Minutes) a) Ionox FCR 65.6 C 5 b) Axarel 32 60.0 C 10 c) B10ACT EC-15 71.1 C 10

d) Synergy CCS 25.0 C 10

* 1 Sample is exposed to each chemical.


PROCEDURE: Continued 5. The solution was heated to the temperatures indicated for a

15 minute time period prior to exposing the connectors and was maintained at the level for the duration of the test.

6. The test samples were immersed in the solution and allowed

to stand for the period of time specified. 7. The test samples were allowed to cool to room temperature. 8. All test samples were visually examined under 10X

magnification after 5 minutes of drying. 9. The weight of each sample was determined prior to and

following exposure. 10. Prior to performing variable measurements, the test samples

were allowed to recover to room ambient conditions. ----------------------------------------------------------- REQUIREMENTS: 1. The marking shall be complete and legible. 2. There shall be no evidence of discoloration, degradation or physical damage to the plastic housing. ----------------------------------------------------------- RESULTS: All samples so tested met the requirements specified.

Documents

203098 REV. 1.1 TEST REPORT - Samtec …suddendocs.samtec.com/testreports/203098_test_report_rev1-1_qua… · of the contact systems as they progress through the applicable test sequences