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Nanostructured broadband antireflection coatings on AlInP fabricated by nanoimprint lithography Advisor : P. C. Yu Speaker : G. S. Hong Optoelectronics Research Centre, Tampere University of Technology, Korkeakoulunkatu 3, 33720, Tampere, P.O. Box 692, 33101 Tampere, Finland

Advisor : P. C. Yu Speaker : G. S. Hong Optoelectronics Research Centre, Tampere University of Technology, Korkeakoulunkatu 3, 33720, Tampere, P.O. Box

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Page 1: Advisor : P. C. Yu Speaker : G. S. Hong Optoelectronics Research Centre, Tampere University of Technology, Korkeakoulunkatu 3, 33720, Tampere, P.O. Box

Nanostructured broadband antireflection coatings on AlInP fabricated by nanoimprint lithography

Advisor : P. C. YuSpeaker : G. S. Hong

Optoelectronics Research Centre, Tampere University of Technology, Korkeakoulunkatu 3, 33720, Tampere, P.O. Box 692, 33101 Tampere, Finland

Page 2: Advisor : P. C. Yu Speaker : G. S. Hong Optoelectronics Research Centre, Tampere University of Technology, Korkeakoulunkatu 3, 33720, Tampere, P.O. Box

Outline

Introduction Experiment Results Conclusion

Page 3: Advisor : P. C. Yu Speaker : G. S. Hong Optoelectronics Research Centre, Tampere University of Technology, Korkeakoulunkatu 3, 33720, Tampere, P.O. Box

Moth-eye AR structures.

AlInP has a very large band gap (1.3~2.4eV) and high transparency.

This letter demonstrates moth-eye antireflection coatings fabricated by UV-nanoimprint lithography (NIL) on AlInP/GaAs structure.

Introduction

moth’s head moth-eye

Page 4: Advisor : P. C. Yu Speaker : G. S. Hong Optoelectronics Research Centre, Tampere University of Technology, Korkeakoulunkatu 3, 33720, Tampere, P.O. Box

Fabrication

The yield is approximately 95% over an 4 cm^2 consisted of 4.4x1e9 nanocones.

Arrays of metallic nanocones fabricated by UV-nanoimprint lithographyJuha M. Kontio *, Janne Simonen, Juha Tommila, Markus PessaOptoelectronics Research Centre, Tampere University of Technology, P.O. Box 692, FIN-33101, Tampere, Finland

Page 5: Advisor : P. C. Yu Speaker : G. S. Hong Optoelectronics Research Centre, Tampere University of Technology, Korkeakoulunkatu 3, 33720, Tampere, P.O. Box

Fabrication steps (1)

Laser interference lithography (LIL) UV - NIL

http://0rz.tw/mev4Chttp://0rz.tw/IAGJV

Page 6: Advisor : P. C. Yu Speaker : G. S. Hong Optoelectronics Research Centre, Tampere University of Technology, Korkeakoulunkatu 3, 33720, Tampere, P.O. Box

Fabrication steps (2)

PMMA Si

GeUV-NIL resist

Page 7: Advisor : P. C. Yu Speaker : G. S. Hong Optoelectronics Research Centre, Tampere University of Technology, Korkeakoulunkatu 3, 33720, Tampere, P.O. Box

Structure in Simulation

Page 8: Advisor : P. C. Yu Speaker : G. S. Hong Optoelectronics Research Centre, Tampere University of Technology, Korkeakoulunkatu 3, 33720, Tampere, P.O. Box

A :30/170/370 nm (top diameter/base diameter/height) B : 50/220/370 nmC : 80/300/440 nmReference : 1 um AlInP

Simulation & Measurement

Page 9: Advisor : P. C. Yu Speaker : G. S. Hong Optoelectronics Research Centre, Tampere University of Technology, Korkeakoulunkatu 3, 33720, Tampere, P.O. Box

The simulated values are lower than the measured ones partly due to :

The imperfect model of the dielectric function.

The roughness of the etched surfaces.

The silver mirror used as a reference in the measurements.

Arithmetic average reflectivities

Page 10: Advisor : P. C. Yu Speaker : G. S. Hong Optoelectronics Research Centre, Tampere University of Technology, Korkeakoulunkatu 3, 33720, Tampere, P.O. Box

Reflection of the laserGaAs’PL

Absorption of the laser and the PL in the AlInP layer

PL intensities

Page 11: Advisor : P. C. Yu Speaker : G. S. Hong Optoelectronics Research Centre, Tampere University of Technology, Korkeakoulunkatu 3, 33720, Tampere, P.O. Box

Conclusion

An average reflectivity of 2.7% was achieved for wide spectral range 450–1650 nm.

Using PL measurements, we have shown that the surface recombination and patterning induced losses are low.

Page 12: Advisor : P. C. Yu Speaker : G. S. Hong Optoelectronics Research Centre, Tampere University of Technology, Korkeakoulunkatu 3, 33720, Tampere, P.O. Box

Thanks for your attention !