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7/28/2019 Appl MOS Design
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The 2DEG is located near the MgZnO/ZnO interface in a Zn-
polar ZnO substrate (sample A) or in ZnO homoepitaxial layer
(500 nm thick) (sample B).
Optical microscope image of Hall-bar devices and
measurement configurations
Insulated gate AlGaN/GaN HFET, similar to a double-
diffused metal-oxide semiconductor (DMOS) structure.
HEMT heterostructure AlGaN/GaN has been realized
by the formation of two dimensional electron gas (2DEG)via electric polarization effects, the polarization difference
between two heterojunction materials.
Like GaN, ZnO exhibits similar effect in MgZnO/ZnO
heterostructure but with several advantages over
AlGaN/GaN, including a higher saturation velocity, a lower
lattice mismatch, and the capability for bulk growth.
With increasing MgZnO thickness, the sheet resistance
reduces rapidly and then saturates. The enhancement of
the interfacial polarization effect becomes stronger,corresponding to a larger amount of resistance reduction,
when the Mg content in the cap layer increases.
AlGaN/GaN vs. MgZnO/ZnO heterostructure
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Transport properties of MgZnO/ZnO heterostructure
v The electron density (n) dependence of electron mobility () for samples A and sample B at temperatures of
0.06 K, 2 K and 10 K, indicated by red, blue and black symbols, respectively.v Linear gate voltage dependence ofn for each sample.
v MgZnO/ZnO systems are therefore promising in high electron mobility transistor (HEMT) applications.
7/28/2019 Appl MOS Design
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Electrical properties of modulation-doped rf-sputtered polycrystalline
MgZnO/ZnO heterostructures--- H-A Chin et al. J. Phys. D: Appl. Phys. 44 (2011) 455101
qWith 2DEG introduction by the polarization effects,
modulation doping enhances the electrical
properties in MgZnO/ZnO heterostructures of high-
quality crystals.
qThe first MgzZn1-zO thin layer is the barrier
layer, allows the carriers to transfer from the
Mgx-0.025Zn1-x-0.025O:Al0.o5 modulation doping layer to
the MgzZn1-zO/ZnO interface.
qThe second MgzZn1-zO layer is the capping layer, pins
the Fermi level of the heterostructure for higher
transferring possibility.
qBilayer heterostructure composed of a thin MgzZn1-zO
capping layer deposited on top of the ZnO thin film.
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Results
When x in Mgx-0.025 Zn1-x-0.025O:Al0.025 increases, the
sheet resistance of the heterostructure decreases and
the sheet carrier density increases.
When the Mg content is raised, the band gap of MgZnO
:Al increases and the energy difference between the
donor level in the MgZnO :Al layer
Moreover, the conduction band edge of ZnO at the
MgzZn1-zO/ZnO interface becomes larger, which makes
the carriers have greater tendency to transfer from the
Mgx-0.025Zn0.975-zO:Al0.05 modulation doping layer into the
MgzZn1-zO/ZnO interface, i.e. the 2DEG region.
At a low Mg content the carrier transferring from the
modulation doping layer can significantly contribute to
the electrical conductivity and carrier concentration.
While at a high Mg content the large band gap of the
barrier layer reduces the carrier transferring probability
but the electrical properties are compensated by the
large polarization effect.
7/28/2019 Appl MOS Design
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Continue
The sheet carrier density remains nearly constant
throughout the whole temperature range, indicatingthat the carrier is 2DEG and not thermally
activated.
A slight decrease in mobility at low temperatures
indicates the dominant scattering mechanism is
roughness scattering together with minor impurity
and alloy scattering
The simulation result indicates that the carrier
distribution shift towards the modulation doping layer
slightly as the Mg content in the modulation doping
layer increases.
Therefore, the slight decrease in mobility at lowtemperatures is attributed to the impurity scattering
and alloy scattering from the modulation doping layer.
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Application
In recent TOYOTA hybridvehicles (HV) system, the
battery voltage is raised to
power source voltage 650V by a
voltage booster (DC-DC
converter) and then supplied to
the motor through the inverter.
The DC-DC converter and the
inverter control the electric
power over 10kW.
Si-IGBTs are used in these high power modules. Other power electronics modules
control the middle and low power, in which Si power MOSFETs are used as the power
devices.
Main problem of the high power modules is high electric power loss. On the other hand,
for the middle and low power modules, of which power level is lower than 5kW, required
breakdown voltage is lower than 600V.
7/28/2019 Appl MOS Design
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Fundamental Sin-wave superimposed on PWM square wave.
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Switches( S1,S2,
S3,S4) are controlled
by logic controller for
creating desired
frequency PWM wave
form.