Appl MOS Design

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    The 2DEG is located near the MgZnO/ZnO interface in a Zn-

    polar ZnO substrate (sample A) or in ZnO homoepitaxial layer

    (500 nm thick) (sample B).

    Optical microscope image of Hall-bar devices and

    measurement configurations

    Insulated gate AlGaN/GaN HFET, similar to a double-

    diffused metal-oxide semiconductor (DMOS) structure.

    HEMT heterostructure AlGaN/GaN has been realized

    by the formation of two dimensional electron gas (2DEG)via electric polarization effects, the polarization difference

    between two heterojunction materials.

    Like GaN, ZnO exhibits similar effect in MgZnO/ZnO

    heterostructure but with several advantages over

    AlGaN/GaN, including a higher saturation velocity, a lower

    lattice mismatch, and the capability for bulk growth.

    With increasing MgZnO thickness, the sheet resistance

    reduces rapidly and then saturates. The enhancement of

    the interfacial polarization effect becomes stronger,corresponding to a larger amount of resistance reduction,

    when the Mg content in the cap layer increases.

    AlGaN/GaN vs. MgZnO/ZnO heterostructure

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    Transport properties of MgZnO/ZnO heterostructure

    v The electron density (n) dependence of electron mobility () for samples A and sample B at temperatures of

    0.06 K, 2 K and 10 K, indicated by red, blue and black symbols, respectively.v Linear gate voltage dependence ofn for each sample.

    v MgZnO/ZnO systems are therefore promising in high electron mobility transistor (HEMT) applications.

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    Electrical properties of modulation-doped rf-sputtered polycrystalline

    MgZnO/ZnO heterostructures--- H-A Chin et al. J. Phys. D: Appl. Phys. 44 (2011) 455101

    qWith 2DEG introduction by the polarization effects,

    modulation doping enhances the electrical

    properties in MgZnO/ZnO heterostructures of high-

    quality crystals.

    qThe first MgzZn1-zO thin layer is the barrier

    layer, allows the carriers to transfer from the

    Mgx-0.025Zn1-x-0.025O:Al0.o5 modulation doping layer to

    the MgzZn1-zO/ZnO interface.

    qThe second MgzZn1-zO layer is the capping layer, pins

    the Fermi level of the heterostructure for higher

    transferring possibility.

    qBilayer heterostructure composed of a thin MgzZn1-zO

    capping layer deposited on top of the ZnO thin film.

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    Results

    When x in Mgx-0.025 Zn1-x-0.025O:Al0.025 increases, the

    sheet resistance of the heterostructure decreases and

    the sheet carrier density increases.

    When the Mg content is raised, the band gap of MgZnO

    :Al increases and the energy difference between the

    donor level in the MgZnO :Al layer

    Moreover, the conduction band edge of ZnO at the

    MgzZn1-zO/ZnO interface becomes larger, which makes

    the carriers have greater tendency to transfer from the

    Mgx-0.025Zn0.975-zO:Al0.05 modulation doping layer into the

    MgzZn1-zO/ZnO interface, i.e. the 2DEG region.

    At a low Mg content the carrier transferring from the

    modulation doping layer can significantly contribute to

    the electrical conductivity and carrier concentration.

    While at a high Mg content the large band gap of the

    barrier layer reduces the carrier transferring probability

    but the electrical properties are compensated by the

    large polarization effect.

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    Continue

    The sheet carrier density remains nearly constant

    throughout the whole temperature range, indicatingthat the carrier is 2DEG and not thermally

    activated.

    A slight decrease in mobility at low temperatures

    indicates the dominant scattering mechanism is

    roughness scattering together with minor impurity

    and alloy scattering

    The simulation result indicates that the carrier

    distribution shift towards the modulation doping layer

    slightly as the Mg content in the modulation doping

    layer increases.

    Therefore, the slight decrease in mobility at lowtemperatures is attributed to the impurity scattering

    and alloy scattering from the modulation doping layer.

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    Application

    In recent TOYOTA hybridvehicles (HV) system, the

    battery voltage is raised to

    power source voltage 650V by a

    voltage booster (DC-DC

    converter) and then supplied to

    the motor through the inverter.

    The DC-DC converter and the

    inverter control the electric

    power over 10kW.

    Si-IGBTs are used in these high power modules. Other power electronics modules

    control the middle and low power, in which Si power MOSFETs are used as the power

    devices.

    Main problem of the high power modules is high electric power loss. On the other hand,

    for the middle and low power modules, of which power level is lower than 5kW, required

    breakdown voltage is lower than 600V.

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    Fundamental Sin-wave superimposed on PWM square wave.

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    Switches( S1,S2,

    S3,S4) are controlled

    by logic controller for

    creating desired

    frequency PWM wave

    form.