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Note: This test report is prepared for the customer shown above and for the device described herein. It may not be duplicated or used in part without prior written consent from Bay Area Compliance Laboratories Corp. (Shenzhen). This report must not be used by the customer to claim product certification, approval, or endorsement by NVLAP*, NIST, or any agency of the Federal Government. * This report may contain data that are not covered by the NVLAP accreditation and are marked with an asterisk *(Rev.2) AS/NZS CISPR 14.1:2010 MEASUREMENT AND TEST REPORT For Tritech Technology Ltd. Unit B, 8/F, Chung Pont Commercial Building No. 300 Hennessy Road, WanChai, Hong Kong. Model: 209517 Report Type: Original Report Product Type: Moon Model (Lights Up To Illustrate Phases Of The Moon) Test Engineer: Leon Chen Report Number: RSZ10062282-9 Report Date: 2010-06-30 Reviewed By: Lisa Zhu EMC Engineer Prepared By: Bay Area Compliance Laboratories Corp. (Shenzhen) 6/F, the 3rd Phase of WanLi Industrial Building, ShiHua Road, FuTian Free Trade Zone Shenzhen, Guangdong, China Tel: +86-755-33320018 Fax: +86-755-33320008

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Page 1: AS/NZS CISPR 14.1:2010 MEASUREMENT AND TEST …resource.scholastic.com.au/resourcefiles/Toy_Safety_Report/7984292... · in part without prior written consent from Bay Area Compliance

Note: This test report is prepared for the customer shown above and for the device described herein. It may not be duplicated or used in part without prior written consent from Bay Area Compliance Laboratories Corp. (Shenzhen). This report must not be used by the customer to claim product certification, approval, or endorsement by NVLAP*, NIST, or any agency of the Federal Government. * This report may contain data that are not covered by the NVLAP accreditation and are marked with an asterisk “*” (Rev.2)

AS/NZS CISPR 14.1:2010 MEASUREMENT AND TEST REPORT

For

Tritech Technology Ltd.

Unit B, 8/F, Chung Pont Commercial Building No. 300 Hennessy Road, WanChai, Hong Kong.

Model: 209517

Report Type:

Original Report

Product Type:

Moon Model (Ligh ts Up To Il lustrate Phases Of The Moon)

Test Engineer: Leon Chen

Report Number: RSZ10062282-9

Report Date: 2010-06-30

Reviewed By: Lisa Zhu EMC Engineer

Prepared By:

Bay Area Compliance Laboratories Corp. (Shenzhen) 6/F, the 3rd Phase of WanLi Industrial Building, ShiHua Road, FuTian Free Trade Zone Shenzhen, Guangdong, China Tel: +86-755-33320018 Fax: +86-755-33320008

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Tritech Technology Ltd. Model: 209517

Report # RSZ10062282-9 Page 2 of 19 AS/NZS CISPR 14.1:2010 Report

TABLE OF CONTENTS

GENERAL INFORMATION .........................................................................................................................................3 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT).........................................................................................3 OBJECTIVE ...........................................................................................................................................................................3 RELATED SUBMITTAL(S)/GRANT(S)...................................................................................................................................3 TEST METHODOLOGY .........................................................................................................................................................3 TEST FACILITY.....................................................................................................................................................................4

SYSTEM TEST CONFIGURATION............................................................................................................................5 JUSTIFICATION .....................................................................................................................................................................5 EUT EXERCISE SOFTWARE .................................................................................................................................................5 SPECIAL ACCESSORIES ........................................................................................................................................................5 EQUIPMENT MODIFICATIONS ..............................................................................................................................................5 CONFIGURATION OF TEST SETUP........................................................................................................................................6 BLOCK DIAGRAM OF TEST SETUP ......................................................................................................................................6

SUMMARY OF TEST REPORT...................................................................................................................................7

AS/NZS CISPR 14.1 §4.1.3 - RADIATED DISTURBANCE.....................................................................................8 MEASUREMENT UNCERTAINTY ..........................................................................................................................................8 TEST SYSTEM SETUP ...........................................................................................................................................................8 EMI TEST RECEIVER SETUP ...............................................................................................................................................9 TEST EQUIPMENT LIST AND DETAILS.................................................................................................................................9 TEST PROCEDURE ................................................................................................................................................................9 CORRECTED AMPLITUDE & MARGIN CALCULATION ........................................................................................................9 TEST DATA ........................................................................................................................................................................10

EXHIBIT A - PRODUCT LABELING.......................................................................................................................11 PROPOSED LABEL FORMAT...............................................................................................................................................11 PROPOSED LABEL LOCATION ON EUT.............................................................................................................................11

EXHIBIT B – EUT PHOTOGRAPHS ........................................................................................................................12 EUT – MAIN UNIT AND REMOTE CONTROLLER TOP VIEW ............................................................................................12 EUT - MAIN UNIT AND REMOTE CONTROLLER BOTTOM VIEW .....................................................................................12 EUT – MAIN UNIT REMOVE BATTERY VIEW ..................................................................................................................13 EUT – MAIN UNIT COVER OFF VIEW ..............................................................................................................................13 EUT - MAIN BOARD OF MAIN UNIT TOP VIEW ...............................................................................................................14 EUT - MAIN BOARD OF MAIN UNIT BOTTOM VIEW .......................................................................................................14 EUT - RECEIVE BOARD OF MAIN UNIT TOP VIEW ..........................................................................................................15 EUT - RECEIVE BOARD OF MAIN UNIT BOTTOM VIEW ..................................................................................................15 EUT – REMOTE CONTROLLER TOP VIEW ........................................................................................................................16 EUT – REMOTE CONTROLLER BOTTOM VIEW ................................................................................................................16 EUT – REMOTE CONTROLLER REMOVE BATTERY VIEW................................................................................................17 EUT – REMOTE CONTROLLER COVER OFF VIEW............................................................................................................17 EUT - MAIN BOARD OF REMOTE CONTROLLER TOP VIEW ............................................................................................18 EUT - MAIN BOARD OF REMOTE CONTROLLER BOTTOM VIEW ....................................................................................18

EXHIBIT C - TEST SETUP PHOTOGRAPHS........................................................................................................19 RADIATED DISTURBANCE - FRONT VIEW.........................................................................................................................19 RADIATED DISTURBANCE - REAR VIEW ..........................................................................................................................19

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Tritech Technology Ltd. Model: 209517

Report # RSZ10062282-9 Page 3 of 19 AS/NZS CISPR 14.1:2010 Report

GENERAL INFORMATION Product Description for Equipment Under Test (EUT) The Tritech Technology Ltd.’s product, model number: 209517 or the "EUT" as referred to in this report is a Moon Model (Lights Up To Illustrate Phases Of The Moon), which measures approximately: 13.0 cm L x 13.0 cm W x 3.0 cm H for main unit, 9.5 cm L x 2.9 cm W x 1.4 cm H for remote controller, input voltage: DC 3V battery for remote controller, DC 3× 1.5AAA battery for main unit. * All measurement and test data in this report was gathered from production sample serial number: 1006010 (Assigned by BACL, Shenzhen). The EUT was received on 2010-06-22. Objective The following report is prepared on behalf of Tritech Technology Ltd. in accordance with AS/NZS CISPR 14.1:2010, Electromagnetic Compatibility – Requirements for household appliances, electric tools and similar apparatus Part 1: Emission. The objective of the manufacturer is to determine compliance with AS/NZS CISPR 14.1:2010. Related Submittal(s)/Grant(s) No related submittal(s). Test Methodology All measurements contained in this report were conducted with CISPR 16-1-1: 2007, specification for radio disturbance and immunity measuring apparatus and methods P1-1: radio disturbance and immunity measuring apparatus measuring apparatus. CISPR 16-2-3: 2006, specification for radio disturbance and immunity measuring apparatus and methods P2-3 methods of measurement of disturbances and immunity radiated disturbance measurements. All radiated and conducted emissions measurement was performed at Bay Area Compliance Laboratory, Corp. The radiated testing was performed at an antenna-to-EUT distance of 3 Meters.

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Tritech Technology Ltd. Model: 209517

Report # RSZ10062282-9 Page 4 of 19 AS/NZS CISPR 14.1:2010 Report

Test Facility The Test site used by Bay Area Compliance Laboratories Corp. (Shenzhen) to collect radiated and conducted emission measurement data is located in the 6/F, the 3rd Phase of WanLi Industrial Building, ShiHua Road, FuTian Free Trade Zone Shenzhen, GuangDong, China. Test site at Bay Area Compliance Laboratories Corp. (Shenzhen) has been fully described in reports submitted to the Federal Communication Commission (FCC). The details of these reports have been found to be in compliance with the requirements of Section 2.948 of the FCC Rules on November 21, 2007. The facility also complies with the radiated and AC line conducted test site criteria set forth in ANSI C63.4-2003. The Federal Communications Commission has the reports on file and is listed under FCC Registration No.: 382179. The test site has been approved by the FCC for public use and is listed in the FCC Public Access Link (PAL) database. Additionally, Bay Area Compliance Laboratories Corp. (Shenzhen) is a National Institute of Standards and Technology (NIST) accredited laboratory, under the National Voluntary Laboratory Accredited Program (Lab Code 200707-0). The current scope of accreditations can be found at http://ts.nist.gov/Standards/scopes/2007070.htm

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Tritech Technology Ltd. Model: 209517

Report # RSZ10062282-9 Page 5 of 19 AS/NZS CISPR 14.1:2010 Report

SYSTEM TEST CONFIGURATION Justification The system was configured for testing in a typical fashion (as normally used by a typical user). EUT Exercise Software N/A Special Accessories The special accessories were supplied by Bay Area Compliance Laboratories Corp. (Shenzhen). Equipment Modifications No modification was made to the unit tested.

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Tritech Technology Ltd. Model: 209517

Report # RSZ10062282-9 Page 6 of 19 AS/NZS CISPR 14.1:2010 Report

Configuration of Test Setup Block Diagram of Test Setup

Main Unit

1.0 Meter

1.5 Meter

Non-Conducting Table 80 cm above Ground Plane

Main Unit

Remote Controller

Remote Controller

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Tritech Technology Ltd. Model: 209517

Report # RSZ10062282-9 Page 7 of 19 AS/NZS CISPR 14.1:2010 Report

SUMMARY OF TEST REPORT AS/NZS CISPR 14.1:2010

Rule Description Results

§ 4.1.1 Terminal Voltage N/A*

§ 4.1.2 Disturbance Power N/A

§ 4.1.3 Radiated Disturbance Compliant

§ 4.2 Discontinuous Disturbance N/A

“*” note: no test for DC power supply

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Tritech Technology Ltd. Model: 209517

Report # RSZ10062282-9 Page 8 of 19 AS/NZS CISPR 14.1:2010 Report

AS/NZS CISPR 14.1 §4.1.3 - RADIATED DISTURBANCE Measurement Uncertainty All measurements involve certain levels of uncertainties, especially in field of EMC. The factors contributing to uncertainties are spectrum analyzer, cable loss, antenna factor calibration, antenna directivity, antenna factor variation with height, antenna phase center variation, antenna factor frequency interpolation, measurement distance variation, site imperfections, mismatch (average), and system repeatability. Based on NIS 81, The Treatment of Uncertainty in EMC Measurements, the best estimate of the uncertainty of a radiation emissions measurement at Bay Area Compliance Laboratories Corp. (Shenzhen) is +4.0 dB. Test System Setup The radiated emission tests were performed in the 3 meters chamber B test site, using the setup accordance with the CISPR 16-1-1:2007, CISPR 16-2-3:2006. The specification used was AS/NZS CISPR 14.1:2010 limits.

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Tritech Technology Ltd. Model: 209517

Report # RSZ10062282-9 Page 9 of 19 AS/NZS CISPR 14.1:2010 Report

EMI Test Receiver Setup The system was investigated from 30 MHz to 1000 MHz. During the radiated emission test, the EMI test receiver was set with the following configurations:

Frequency RB/W VB/W IF B/W 30 MHz-1 GHz 100 kHz 300 kHz 120 kHz

Test Equipment List and Details

Manufacturer Description Model Serial Number Calibration Date

Calibration Due Date

Rohde & Schwarz EMI Test Receiver ESCI 100035 2009-11-07 2010-11-06

HP Amplifier HP8447E 1937A01046 2009-08-02 2010-08-02

Sunol Sciences Broadband Antenna JB1 A040904-2 2010-05-05 2011-05-05

* Statement of Traceability: Bay Area Compliance Laboratories Corp. (Shenzhen) attests that all calibrations have been performed in accordance to NVLAP requirements, traceable to the NIST.

Test Procedure Maximizing procedure was performed on the highest emissions to ensure that the EUT complied with all installation combinations. All data was recorded in the Quasi-peak detection mode. Corrected Amplitude & Margin Calculation The Corrected Amplitude is calculated by adding the Antenna Loss and Cable Loss, and subtracting the Amplifier Gain from the Meter Reading. The basic equation is as follows:

Corrected Amplitude = Meter Reading + Antenna Loss + Cable Loss - Amplifier Gain The “Margin” column of the following data tables indicates the degree of compliance with the applicable limit. For example, a margin of 7dB means the emission is 7dB below the limit for Class B. The equation for margin calculation is as follows:

Margin = Limit –Corrected Amplitude.

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Tritech Technology Ltd. Model: 209517

Report # RSZ10062282-9 Page 10 of 19 AS/NZS CISPR 14.1:2010 Report

Test Data

Environmental Conditions

Temperature: 25 °C

Relative Humidity: 56 %

ATM Pressure: 100.0 kPa

The testing was performed by Leon Chen on 2010-06-25.

Test Mode: Running

Auto Test (AS/NZS CISPR 14.1:2010)

Note: The data which below the limit 20dB was not recorded.

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Tritech Technology Ltd. Model: 209517

Report # RSZ10062282-9 Page 11 of 19 AS/NZS CISPR 14.1:2010 Report

EXHIBIT A - PRODUCT LABELING Proposed Label Format

Specifications: Text is Black or white in color and is left justified. Labels are printed in indelible ink on permanent adhesive backing or silk-screened onto the EUT or shall be affixed at a conspicuous location on the EUT.

Proposed Label Location on EUT

FCC Label Location

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Tritech Technology Ltd. Model: 209517

Report # RSZ10062282-9 Page 12 of 19 AS/NZS CISPR 14.1:2010 Report

EXHIBIT B – EUT PHOTOGRAPHS

EUT – Main Unit and Remote Controller Top View

EUT - Main Unit and Remote Controller Bottom View

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Tritech Technology Ltd. Model: 209517

Report # RSZ10062282-9 Page 13 of 19 AS/NZS CISPR 14.1:2010 Report

EUT – Main Unit Remove Battery View

EUT – Main Unit Cover Off View

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Tritech Technology Ltd. Model: 209517

Report # RSZ10062282-9 Page 14 of 19 AS/NZS CISPR 14.1:2010 Report

EUT - Main Board of Main Unit Top View

EUT - Main Board of Main Unit Bottom View

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Tritech Technology Ltd. Model: 209517

Report # RSZ10062282-9 Page 15 of 19 AS/NZS CISPR 14.1:2010 Report

EUT - Receive Board of Main Unit Top View

EUT - Receive Board of Main Unit Bottom View

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Tritech Technology Ltd. Model: 209517

Report # RSZ10062282-9 Page 16 of 19 AS/NZS CISPR 14.1:2010 Report

EUT – Remote Controller Top View

EUT – Remote Controller Bottom View

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Tritech Technology Ltd. Model: 209517

Report # RSZ10062282-9 Page 17 of 19 AS/NZS CISPR 14.1:2010 Report

EUT – Remote Controller Remove Battery View

EUT – Remote Controller Cover Off View

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Report # RSZ10062282-9 Page 18 of 19 AS/NZS CISPR 14.1:2010 Report

EUT - Main Board of Remote Controller Top View

EUT - Main Board of Remote Controller Bottom View

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Tritech Technology Ltd. Model: 209517

Report # RSZ10062282-9 Page 19 of 19 AS/NZS CISPR 14.1:2010 Report

EXHIBIT C - TEST SETUP PHOTOGRAPHS

Radiated Disturbance - Front View

Radiated Disturbance - Rear View

****END OF REPORT****