76A Volume 51, Number 2, 1997

Thomas J. Vickers, Editor

Please forward book reviews to the Book Review Editor, Dr. Thom-as J. Vickers, Department of Chemistry, Florida State University,Tallahassee, Florida 32306-3006.

Modern Techniques in Raman Spectroscopy. Edited by J. J. Las-erna. Wiley, New York, 1996. Pp. 427. Price $145. ISBN0471957747.

Interest in Raman spectroscopy has increased dramatically in thelast decade, driven by major advances in instrumentation and im-portant progress in such major applications areas as process control,materials characterization, and remote analysis. The present bookattempts to survey the state of Raman technology, with mixed suc-cess. Most topics, whether specialized or generally useful, are givenapproximately equal space. Applications are secondary concerns inmost chapters. There are several serious omissions, including datareduction methods, basic resonance Raman spectroscopy, and UVRaman spectroscopy. Inevitably, some of the material has alreadybeen rendered obsolete, and the focus on technology exacerbatesthis problem.

The initial chapter by Stevenson and Vo Dinh provides the the-oretical background. The classical approach is emphasized. Reso-nance enhancement is only brie¯ y mentioned, and surface enhance-ment is treated only qualitatively. McCreery gives a scholarly andbalanced overview of the state of dispersive Raman instrumentation.Spectrograph performance is emphasized, lasers and detectors areadequately discussed, and signal-to-noise and calibration problemsare carefully considered. The relative merits of dispersive spectros-copy and FT-Raman are nicely assessed. The chapter on FT-Ramanby Hendra emphasizes the strengths and is honest about the limi-tations of the technique: long acquisition times, transition metal ion¯ uorescence, and thermal problems. The summary of applicationsprovides almost as many cautions as success stories. Turrell andDhamelincourt’s review of micro-Raman spectroscopy is a reason-able introduction to the technique. The operation of wide-® eld andconfocal microscopes is clearly explained. But the subtleties of po-larization measurements are described in disproportionately greatmathematical detail while major applications areas are too brie¯ ysummarized. The Kansas State group provides an over-long intro-duction to Hadamard transform techniques. Hadamard multiplexinghas merit, but it has found limited acceptance and does not warrantalmost three times as much space as most other topics.

Rupe rez and Laserna offer a balance between theory, practice,and applications of SERS, and they are honest about the actualstatus of SERS. Hecht and Barron describe the theory and appli-cations of Raman optical activity. The technique is powerful in prin-ciple, but the signal-to-noise problem remains formidable. The usercommunity remains small. Santos Gomez develops the theory ofcoherent Raman spectroscopy in detail. Unfortunately, the mathe-matics crowds out adequate description of experiments and appli-cations. Ondrias and co-workers discuss time-resolved resonanceRaman spectroscopy with an emphasis on the heme system. Angel,Cooney, and Skinner conclude the book with a review of ® ber opticsin NIR (dispersive) Raman spectroscopy. They provide a good de-scription of the principles and performance of ® ber-optic probes,equally applicable to any excitation wavelength, and discuss theproblems of diode lasers in detail.

Although many individual chapters are good, overall the book

disappoints. Because of the weak applications focus, the reader can-not really understand what all the excitement in the ® eld is about.Because major and specialist topics are given equal weight, theneophyte will not get a realistic view of the state of current Ramanspectroscopic practice.

MICHAEL D. MORRIS

Department of ChemistryUniversity of MichiganAnn Arbor, Michigan 48109-1055

Electron Energy-Loss Spectroscopy in the Electron Microscope, 2ndEdition. R. F. Egerton. Plenum Publishing, New York, 1996. Pp. 485.Price $110. ISBN 0-306-45223-5.

This is a major revision of the authoritative book on electron energy-loss spectroscopy (EELS) in the electron microscope, ® rst published tenyears ago. Recently, the technique has expanded greatly, with the in-strumentation becoming more sensitive and the analysis methods in-creasing in sophistication. It is therefore very timely for a new book onthe subject to appear. This second edition presents a complete up-to-date description of EELS in the electron microscope that will be indis-pensable for researchers currently working with the technique as wellas for beginners in the ® eld.

Chapter one surveys the physical principles on which EELS is basedand indicates the types of information that are available. It gives a briefhistorical development of the technique, putting it in the context of othermicroanalytical methods.

Chapter two describes the range of instrumentation that is now avail-able for performing EELS and energy-loss imaging in the conventionaland scanning transmission electron microscopes. Included are simpli® edaccounts of the electron optical design and practical considerations forspectrometer alignment. Particularly useful are diagrams and operatingprinciples of the major commercial instruments that the researcher islikely to encounter in today’s laboratory. Recent designs of energy-® ltering microscopes with in-column and post-column ® lters are de-scribed. There is a full account of parallel detectors and their perfor-mance in terms of detective quantum ef® ciency and modulation transferfunction.

Chapter three contains a detailed description of the electron scatteringtheory required for determining quantitative elemental and chemicalcompositions. This chapter begins with atomic models for inelastic scat-tering and then presents the dielectric formulation including plasmonsand single-electron excitations of valence electrons. It gives a clear ex-planation of how plural inelastic scattering affects the spectral shape inthe thicker samples that are often encountered in electron microscopy.A full description of the Bethe theory (with accompanying computerprograms as appendices) provides the basis for determining the scatter-ing cross sections used in quantitative microanalysis and also explainsthe basic core edge shapes. Effects of the solid-state and chemical bond-ing are also discussed in terms of near-edge ® ne structure (ELNES) andextended energy-loss ® ne structure (EXELFS).

Chapter four contains a variety of methods for extracting quantitativeinformation. These procedures include removal of plural scattering bydeconvolution techniques and derivation of the dielectric function byKramers± Kronig analysis (again with computer programs as appendi-ces) as well as EXELFS analysis to determine bond lengths.

The ® nal chapter has been completely rewritten since the ® rst edition.It contains a wide selection of applications that provide the reader withpractical examples of EELS analysis of metals, semiconductors, poly-

78A Volume 51, Number 2, 1997

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mers, and biological structures. Other topics include measurement ofspecimen thickness, contrast and resolution enhancement by zero-lossimaging, quantitative analysis, elemental mapping, chemical ® ngerprint-ing, and new spectrum-imaging techniques.

Overall, the book will be invaluable for scientists in many disciplineswho are interested in applying EELS for high-resolution analysis in theelectron microscope. For those already using the technique, it will bean important, concise reference text.

RICHARD D. LEAPMAN, PH.D.National Institutes of HealthBethesda, Maryland 20892

BOOK BRIEFS

Compilation of Reported 77Se NMR Chemical Shifts. Thomas M.KlapoÈ tke and Matthias Borschag. Wiley, New York, 1996. Pp. 134.Price $74.95. ISBN 047196722X.

The authors have gathered and presented a comprehensive collectionof 77Se chemical shift data. Much of the reported data have been takenfrom the authors’ own laboratories. A brief introduction to seleniumNMR is given, but the bulk of the book is devoted to the tabulatedchemical shifts of selenium bonded to various elements. All the chem-ical shift values are presented with respect to a given reference standard,(CH3)2Se.

Physico-Chemical Principles of Color Chemistry. Edited by A. T.Peters and H. S. Freeman. Blackie Academic & Professional, Glasgow,1996. Pp. 299. (No price given.) ISBN 0 7514 0210 9.

This review is divided into seven chapters by various authors. Thesefocus on the fundamental principles which in¯ uence the generation ofimportant dyes and pigments, including the formation of dye molecules,the processing of insoluble colorants to produce useful crystal forms,the application of dyes to ® bers and other media, and the environmentalchemistry of dyes. In addition, the mechanisms of diazotization, diazocoupling, dye photodegradation, dye genotoxicity, and the liquid crystalformation of anionic dyes are covered.

Computer Assisted Analytical Spectroscopy. Edited by Steven D.Brown. Wiley, New York, 1996. Pp. 259. Price $79.95. ISBN0471964336.

The chapters in this book are drawn from presentations given at theFifth Symposium on Computer-Enhanced Analytical Spectroscopy heldin 1994. A wide range of topics is covered, with computer enhancementas the common thread. Topics covered in the nine chapters are step-scanning FT-IR, automation of ion trap MS, detection of single ¯ uo-rescent molecules, factor analysis of transient Raman data, feed-forwardneural networks, parallel digital ® lters, multivariate instrument stan-dardization, extracting patterns from pyrolysis MS, and multivariateanalysis of pyrolysis MS.