CERTIFICATE - MSI Notebookfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1414x(S430)/IT... · Model Number : MS-1414, S430, S430X Company Name : ... The related certificate for

No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. TEL:+886-2-8601-3788 FAX:+886-2-8601-3789 Email:[email protected] http://www.quietek.com

CERTIFICATE

Issued Date: Sep. 29, 2006 Report No.: 068L169-IT-CE-P11V04

This is to certify that the following designated product

Product : MEGA BOOK

Trade name : MSI

Model Number : MS-1414, S430, S430X

Company Name : MICRO-STAR INT’L Co., LTD.

This product, which has been issued the test report listed as above in QuieTek

Laboratory, is based on a single evaluation of one sample and confirmed to

comply with the requirements of the following EMC standard.

EN 55022: 1998+A1: 2000+A2: 2003 EN 55024: 1998+A1: 2001+A2: 2003

EN 61000-3-2: 2000 IEC 61000-4-2 Edition 1.2: 2001-04

EN 61000-3-3: 1995 + A1: 2001 IEC 61000-4-3: 2002+A1: 2002

IEC 61000-4-4: 2004

IEC 61000-4-5 Edition 1.1: 2001-04

IEC 61000-4-6 Edition 2.1: 2004-11

IEC 61000-4-8 Edition 1.1: 2001-03

IEC 61000-4-11 Second Edition: 2004-03

TEST LABORATORY

George Chen / President

Test Report

Product Name ： MEGA BOOK

Model No. ： MS-1414, S430, S430X

Applicant ： MICRO-STAR INT’L Co., LTD.

Address ： No. 69, Li-De St., Jung-He City, Taipei Hsien,

Taiwan, R.O.C.

Date of Receipt ： 2006/08/22

Issued Date ： 2006/09/29

Report No. ： 068L169-IT-CE-P11V04

The test results relate only to the samples tested.The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein. This report must not be used to claim product endorsement by CNLA, NVLAP or any agency of the Government.The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

Declaration of Conformity

The following product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). The listed standards as below were applied: The following Equipment:

Product : MEGA BOOK Model Number : MS-1414, S430, S430X Trade Name : MSI

This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). For the evaluation regarding EMC, the following standards were applied:

RFI Emission:

EN 55022:1998+A1:2000, Class B : Product family standard

EN 61000-3-2:2000, Class D : Limits for harmonic current emission

EN 61000-3-3:1995+A1: 2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system

Immunity:

EN 55024:1998+A1:2001+A2:2003 : Product family standard

The following importer/manufacturer is responsible for this declaration:

Company Name :

Company Address :

Telephone : Facsimile :

Person is responsible for marking this declaration:

Name (Full Name) Position/ Title

Date Legal Signature

QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. Tel: 886-2-8601-3788, Fax: 886-2-8601-3789, E-mail: [email protected]

QTK No.: 068L169-IT-CE-P11V04

S ta tement o f Conformi ty

This certifies that the following designated product:

Product : MEGA BOOK Model Number : MS-1414, S430, S430X Trade Name : MSI Company Name : MICRO-STAR INT'L Co., LTD.

This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). For the evaluation regarding EMC, the following standards were applied:

RFI Emission:

EN 55022:1998+A1:2000, Class B : Product family standard

EN 61000-3-2:2000, Class D : Limits for harmonic current emission

EN 61000-3-3:1995+A1:2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system

Immunity:

EN 55024:1998+A1:2001+A2:2003 : Product family standard

TEST LABORATORY

George Chen / President The verification is based on a single evaluation of one sample of above-mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab. Logo.

0914

Report No： 068L169-IT-CE-P11V04

Page: 2 of 144

Test Report Cert i f icat ion Issued Date : 2006/09/29 Report No. : 068L169-IT-CE-P11V04

Product Name : MEGA BOOK

Applicant : MICRO-STAR INT’L Co., LTD.

Address : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C.

Manufacturer : MICRO-STAR INT’L Co., LTD.

Model No. : MS-1414, S430, S430X

Rated Voltage : AC 230 V / 50 Hz

EUT Voltage : AC 100-240V, 50/60Hz

Trade Name : MSI

Applicable Standard : EN 55022: 1998+A1: 2000+A2: 2003 Class B

EN 55024: 1998+A1: 2001+A2: 2003

EN 61000-3-2:2000EN 61000-3-3:1995+A1: 2001

AS/NZS CISPR 22: 2006

Test Result : Complied

Performed Location : Linkou EMC laboratory

No.5-22,Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kuo Shiang,

Taipei, 244 Taiwan, R.O.C.

TEL:+866-2-8601-3788 / FAX:+886-2-8601-3789

Documented By :

( Anita Chou )

Reviewed By :

( Kent Yao )

Approved By :

( George Chen )


Page: 3 of 144

Laboratory Information

We , QuieTek Corporation, are an independent EMC and safety consultancy that was established the whole facility in our laboratories. The test facility has been accredited by the following accreditation Bodies in compliance with ISO 17025, EN 45001 and Guide 25:

The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation’s Web Site : http://tw.quietek.com/modules/myalbum/ The address and introduction of QuieTek Corporation’s laboratories can be founded in our Web site : http://www.quietek.com/ If you have any comments, Please don’t hesitate to contact us. Our contact information is as below: HsinChu Testing Laboratory :

No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307, Taiwan, R.O.C. TEL:+886-3-592-8858 / FAX:+886-3-592-8859 E-Mail : [email protected]

LinKou Testing Laboratory :

No. 5-22, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C. TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789 E-Mail : [email protected]

Taiwan R.O.C. : BSMI, DGT, CNLA

Germany : TUV Rheinland

Norway : Nemko, DNV

USA : FCC, NVLAP

Japan : VCCI

0914

1313


Page: 4 of 144

TABLE OF CONTENTS Description Page 1. General Information .................................................................................................... 7 1.1. EUT Description ...................................................................................................... 7 1.2. Mode of Operation .................................................................................................. 9 1.3. Tested System Details........................................................................................... 11 1.4. Configuration of Tested System ............................................................................ 12 1.5. EUT Exercise Software ......................................................................................... 13 2. Technical Test ........................................................................................................... 14 2.1. Summary of Test Result ........................................................................................ 14 2.2. List of Test Equipment ........................................................................................... 15 2.3. Measurement Uncertainty ..................................................................................... 18 2.4. Test Environment .................................................................................................. 20 3. Conducted Emission (Main Terminals)...................................................................... 22 3.1. Test Specification .................................................................................................. 22 3.2. Test Setup ............................................................................................................. 22 3.3. Limit....................................................................................................................... 22 3.4. Test Procedure ...................................................................................................... 23 3.5. Deviation from Test Standard ................................................................................ 23 3.6. Test Result ............................................................................................................ 24 3.7. Test Photograph .................................................................................................... 42 4. Conducted Emissions (Telecommunication Ports).................................................... 45 4.1. Test Specification .................................................................................................. 45 4.2. Test Setup ............................................................................................................. 45 4.3. Limit....................................................................................................................... 45 4.4. Test Procedure ...................................................................................................... 46 4.5. Deviation from Test Standard ................................................................................ 46 4.6. Test Result ............................................................................................................ 47 4.7. Test Photograph .................................................................................................... 56 5. Radiated Emission.................................................................................................... 58 5.1. Test Specification .................................................................................................. 58 5.2. Test Setup ............................................................................................................. 58 5.3. Limit....................................................................................................................... 58 5.4. Test Procedure ...................................................................................................... 59 5.5. Deviation from Test Standard ................................................................................ 59 5.6. Test Result ............................................................................................................ 60 5.7. Test Photograph .................................................................................................... 66 6. Harmonic Current Emission ...................................................................................... 69


Page: 5 of 144

6.1. Test Specification .................................................................................................. 69 6.2. Test Setup ............................................................................................................. 69 6.3. Limit....................................................................................................................... 69 6.4. Test Procedure ...................................................................................................... 71 6.5. Deviation from Test Standard ................................................................................ 71 6.6. Test Result ............................................................................................................ 72 6.7. Test Photograph .................................................................................................... 78 7. Voltage Fluctuation and Flicker................................................................................. 80 7.1. Test Specification .................................................................................................. 80 7.2. Test Setup ............................................................................................................. 80 7.3. Limit....................................................................................................................... 80 7.4. Test Procedure ...................................................................................................... 81 7.5. Deviation from Test Standard ................................................................................ 81 7.6. Test Result ............................................................................................................ 82 7.7. Test Photograph .................................................................................................... 85 8. Electrostatic Discharge ............................................................................................. 87 8.1. Test Specification .................................................................................................. 87 8.2. Test Setup ............................................................................................................. 87 8.3. Limit....................................................................................................................... 87 8.4. Test Procedure ...................................................................................................... 88 8.5. Deviation from Test Standard ................................................................................ 88 8.6. Test Result ............................................................................................................ 89 8.7. Test Photograph .................................................................................................... 92 9. Radiated Susceptibility ............................................................................................. 94 9.1. Test Specification .................................................................................................. 94 9.2. Test Setup ............................................................................................................. 94 9.3. Limit....................................................................................................................... 94 9.4. Test Procedure ...................................................................................................... 95 9.5. Deviation from Test Standard ................................................................................ 95 9.6. Test Result ............................................................................................................ 96 9.7. Test Photograph .................................................................................................... 99 10. Electrical Fast Transient/Burst............................................................................. 101 10.1. Test Specification............................................................................................. 101 10.2. Test Setup........................................................................................................ 101 10.3. Limit ................................................................................................................. 101 10.4. Test Procedure ................................................................................................ 102 10.5. Deviation from Test Standard........................................................................... 102 10.6. Test Result ....................................................................................................... 103


Page: 6 of 144

10.7. Test Photograph .............................................................................................. 106 11. Surge................................................................................................................... 109 11.1. Test Specification............................................................................................. 109 11.2. Test Setup........................................................................................................ 109 11.3. Limit ................................................................................................................. 109 11.4. Test Procedure ................................................................................................ 110 11.5. Deviation from Test Standard........................................................................... 110 11.6. Test Result ........................................................................................................111 11.7. Test Photograph .............................................................................................. 114 12. Conducted Susceptibility ..................................................................................... 116 12.1. Test Specification............................................................................................. 116 12.2. Test Setup........................................................................................................ 116 12.3. Limit ................................................................................................................. 117 12.4. Test Procedure ................................................................................................ 117 12.5. Deviation from Test Standard........................................................................... 117 12.6. Test Result ....................................................................................................... 118 12.7. Test Photograph .............................................................................................. 121 13. Power Frequency Magnetic Field........................................................................ 124 13.1. Test Specification............................................................................................. 124 13.2. Test Setup........................................................................................................ 124 13.3. Limit ................................................................................................................. 124 13.4. Test Procedure ................................................................................................ 124 13.5. Deviation from Test Standard........................................................................... 124 13.6. Test Result ....................................................................................................... 125 13.7. Test Photograph .............................................................................................. 128 14. Voltage Dips and Interruption .............................................................................. 130 14.1. Test Specification............................................................................................. 130 14.2. Test Setup........................................................................................................ 130 14.3. Limit ................................................................................................................. 130 14.4. Test Procedure ................................................................................................ 131 14.5. Deviation from Test Standard........................................................................... 131 14.6. Test Result ....................................................................................................... 132 14.7. Test Photograph .............................................................................................. 135 15. Attachment .......................................................................................................... 137 　 EUT Photograph.................................................................................................. 137


Page: 7 of 144

1. General Information

1.1. EUT Description Product Name MEGA BOOK Trade Name MSI Model No. MS-1414, S430, S430X

Keyparts List

NO. Item Vendor Vendor P/N Discription

1 CPU AMD CPU K8,AMD/TMDTL52HAX5CT,,1.6GHz,MPGA-638pin,TURION64-31W-1600MHz(S1 SOCKET) TL52 512KBx2 L2 CACHE,RoHS COMPLIANCE

CPU K8,AMD/TMDTL56HAX5CT,,1.8GHz,MPGA-638pin,TURION64-33W-1800MHz(S1 SOCKET) TL56 512KBx2 L2 CACHE,RoHS COMPLIANCE

CPU K8,AMD/TMDTL60HAX5CT,,2.0GHz,MPGA-638pin,TURION64-35W-2000MHz(S1 SOCKET) TL60 512KBx2 L2 CACHE,RoHS COMPLIANCE

CPU K8,AMD/SMS3200HAX4CM,,1.6GHz,MPGA-638pin,512KB L2 CACHE MOBILE SEMPRON (S1 SOCKET) 25W SERIES 3200+,RoHS COMPLIANCE



2 LCD AU B141EW02 V3 14.1"glare AU B140EW01 V.1 14" WXGA Glare 1280x768

3 HDD Toshiba (ROHS)

MK1234GSX ,SYS/HDD/SATA-150/2.5 inch/120GB/5400RPM/TOSHIBA/MK1234GSX, RoHS COMPLIANCE




MK4032GSX

,SYS/HDD/SATA-150/2.5 inch/40GB/5400RPM/TOSHIBA/MK4032GSX, RoHS COMPLIANCE

HITACHI HTS541060G9SA00

,SYS/HDD/SATA-150/HITACHI/HTS541060G9SA00/2.5inch/60GB/5400RPM/ FOR MS-1034,RoHS COMPLIANCE

HTS541080G9SA00

,SYS/HDD/SATA-150/HITACHI/HTS541080G9SA00/2.5inch/80GB/5400RPM/ FOR MS-1034,RoHS COMPLIANCE

WD WD600BEAS

,SYS/HDD/SATA-150/2.5 inch /60GB/5400RPM/WESTERN DIGITAL/ WD600BEAS/FOR MS-1042,RoHS COMPLIANCE

4 ODD

GCC-4244N ,SYS/CDRW/DVDROM combo/Slim type/24X-R/24X-RW/8X-DVDROM/ 24X-CDROM/HLDS/GCC-4244N/For MS-1029,RoHS COMPLIANCE

combo/GSA-T10N

,SYS/DVDRW/SLIM TYPE/8X-DVD±R/8X-DVD+RW/6X-DVD-RW/4X-DVD±R DL/ 5X-DVD-RAM/8X-DVDROM/24X-CDR/16X-CDRW/24X-CDROM/HLDS/GSA-T10N/FOR MS-1016,RoHS COMPLIANCE

HLDS SuperMulti/GSA-T10N

,SYS/DVDRW/SLIM TYPE/8X-DVD±R/8X-DVD+RW/6X-DVD-RW/4X-DVD±R DL/ 5X-DVD-RAM/8X-DVDROM/24X-CDR/16X-CDRW/24X-CDROM/HLDS/GSA-T10N/FOR MS-1016,RoHS COMPLIANCE

SDVD8821

,SYS/DVDRW/SLIM TYPE/8X-DVD±R/8X-DVD+RW/6X-DVD-RW/4X-DVD±R DL/ 5X-DVDRAM/8X-DVDROM/24X-CDR/24X-CDRW/24X-CDROM/PHILIPS/SDVD8821/FOR MS-1016L1,RoHS COMPLIANCE

QSI SDVD8821

,SYS/DVDRW/SLIM TYPE/8X-DVD±R/8X-DVD+RW/6X-DVD-RW/4X-DVD±R DL/ 5X-DVDRAM/8X-DVDROM/24X-CDR/24X-CDRW/24X-CDROM/PHILIPS/SDVD8821/FOR MS-1016L1,RoHS COMPLIANCE

combo/SDVD8821 ,SYS/DVDRW/SLIM TYPE/8X-DVD±R/8X-DVD+RW/6X-DVD-RW/4X-DVD±R DL/


Page: 8 of 144

5X-DVDRAM/8X-DVDROM/24X-CDR/24X-CDRW/24X-CDROM/PHILIPS/SDVD8821/FOR MS-1016L1,RoHS COMPLIANCE

SCB5265

,SYS/CDRW/DVDROM combo/Slim type/ 24X-R/24X-RW/8X-DVDROM/24X-CDROM/PHILIPS/SCB5265/For MS-1022, RoHS COMPLIANCE

5 Memory TRANSCEND DDRII 533 512MB,SYS RAM MODULE,DDR2 SDRAM,266(533)MHz,512MB,SODIMM, TRANSCEND/TS64MSQ64V5J,64MX64bit/1.8V/200pin/ELPIDA CHIP/ wBGA PACKAGE,RoHS COMPLIANCE

DDRII 533 1GB,SYS RAM MODULE,DDR2 SDRAM,266(533)MHz,1GB,SODIMM, TRANSCEND/TS128MSQ64V5J,128MX64bit/1.8V/200pin/ELPIDA CHIP/wBGA PACKAGE, RoHS COMPLIANCE

DDRII 667 512MB,SYS RAM MODULE,DDR2 SDRAM,333(667)MHz,512MB,SODIMM,TRANSCEND/ TS64MSQ64V6J,64MX64bit/1.8V/ELPIDA CHIP/wBGA PACKAGE,RoHS COMPLIANCE

DDRII 667 1GB,SYS RAM MODULE,DDR2 SDRAM,333(667)MHz,1GB,SODIMM, TRANSCEND/TS128MSQ64V6J,128MX64bit/1.8V/200pin/ELPIDA CHIP/wBGA PACKAGE, RoHS COMPLIANCE

Twinmos

DDRII 533 512MB ,SYS RAM MODULE,DDR2 SDRAM,266(533)MHz,512MB,SODIMM,Twinmos/ 8D-22JJ5-HATP,64MX64bit/1.8V/Hynix CHIP,RoHS COMPLIANCE

DDRII 533 512MB,SYS RAM MODULE,DDR2 SDRAM,266(533)MHz,512MB,SODIMM, TWINMOS/8D-22JJ3MHBTP,64MX64bit/1.8V/Hynix CHIP,RoHS COMPLIANCE

DDRII 533 1GB,SYS RAM MODULE,DDR2 SDRAM,266(533)MHz,1GB,SODIMM,TWINMOS/ 8D-22KJ8MHCTP,128MX64bit/1.8V DDR2 SYNCHRONOUS DRAM WITH SPD/HYNIX CHIP, RoHS COMPLIANCE

DDRII 667 512MB,SYS RAM MODULE,DDR2 SDRAM,333(667)MHz,512MB, SODIMM,TWINMOS/8D-23JN5MHATP,64MX64bit/1.8V/HYNIX CHIP,RoHS COMPLIANCE

DDRII 667 1GB,SYS RAM MODULE,DDR2 SDRAM,333(667)MHz,1GB, SODIMM,TWINMOS/8D-23KN5MHBTP,128MX64bit/1.8V/HYNIX CHIP,RoHS COMPLIANCE

6 Inverter Sampo YIVNMS0016D11 ,SYS/MODULE/INVERTER/SAMPO/YIVNMS0016D11--/NOTEBOOK INVERTER FOR 17 TFT LCD/FOR MS-1035 AND MS-1036,RoHS COMPLIANCE

7 Battery Well Top GMS-BMS150ABA00-G,SYS/BATTERY PACK/LITHIUM-ION/Welltop/GMS-BMS150ABA00-G/SONY/ Vave=3.7V/2400mAh/3cells/11.1V/2400mAH/18650/BLACK/FOR BTY-M43, RoHS COMPLIANCE

Well Top GMS-BMS060ABA10-G,SYS/BATTERY PACK/LITHIUM-ION/Welltop/GMS-BMS060ABA10-G/S ONY/Vave=3.7V/2200mAh/6cells/11.1V/4400mAH/18650/BLACK/FOR BTY-M42,RoHS COMPLIANCE

8 AC- adapter

LI SHIN LSE0202C1990 ,SYS/POWER SUPPLY ADAPTOR/90W/90-264Vin/4.74A/19Vout/ LI SHIN/LSE0202C1990/FOR MS-1037,RoHS COMPLIANCE

LITEON PA-1900-04RM ,SYS/POWER SUPPLY ADAPTOR/90W/90-264Vin/4.74A/ 19Vout/LITEON/PA-1900-04RM/FOR MS-1058,RoHS COMPLIANCE

LI SHIN 0335A1965 ,SYS/POWER SUPPLY ADAPTOR/ 65W/90-265Vin/3.42A/ 19Vout/LI SHIN/SLS0335A19N25LF/FOR MS-1034,LEAD FREE

9 K/B Chicony MP-03086U4-3591

,SYS KEYBOARD,88KEY,CHICONY/MP-03086U4-3591,US-International, BLACK C,FOR MS-1016,RoHS COMPLIANCE

MP-03086U4-3593

,SYS KEYBOARD,88KEY,CHICONY/MP-03086U4-3593,US-International, WHITE,FOR MS-1022,RoHS COMPLIANCE

10 Touch Pad

SYNAPTICS TM61PUZ1LR327 ,SYS/MODULE/NoteBook Touchpad module/SYNAPTICS/TM61PUZ1LR327/ 51.2*37.5mm(PCB WITH MYLAR:53.7*40mm)/For MS-14141, RoHS COMPLIANCE

11 MDC Qcomm MA560-3 Plus Azalia 12 WLAN MSI MS-6877 MS-6877 10 Wireless 802.11b/g mini-Card (Ch1~11 default, RoHS Compliant) 13 Antenna SmartAnt Wireless LAN Left ANTENNA Wireless LAN Right ANTENNA HIGH-TEK Wireless LAN Left ANTENNA --- Second Source Wireless LAN Right ANTENNA --- Second Source

Note: The EUT is including three models for different marketing requirement.


Page: 9 of 144

1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as:

Pre-Test Mode MODE 1 MODE 2 MODE 3 MODE 4 MODE 5 MODE 6 MODE 7 MODE 8 MODE 9 Final Test Mode

Emission MODE 1 MODE 2 MODE 3

Immunity MODE 1 MODE 2 MODE 3

NO. Item Vendor Vendor P/N Discription 1 2 3 4 5 6 7 8 9

1 CPU AMD CPU K8,AMD/TMDTL52HAX5CT,,1.6GHz,MPGA-638pin,TURION64-31W-1600MHz(S1 SOCKET) TL52 512KBx2 L2 CACHE,RoHS COMPLIANCE V V

CPU K8,AMD/TMDTL56HAX5CT,,1.8GHz,MPGA-638pin,TURION64-33W-1800MHz(S1 SOCKET) TL56 512KBx2 L2 CACHE,RoHS COMPLIANCE V V

CPU K8,AMD/TMDTL60HAX5CT,,2.0GHz,MPGA-638pin,TURION64-35W-2000MHz(S1 SOCKET) TL60 512KBx2 L2 CACHE,RoHS COMPLIANCE V V

CPU K8,AMD/SMS3200HAX4CM,,1.6GHz,MPGA-638pin,512KB L2 CACHE MOBILE SEMPRON(S1 SOCKET) 25W SERIES 3200+,RoHS COMPLIANCE V



2 LCD AU B141EW02 V3 14.1"glare V V V V V AU B140EW01 V.1 14" WXGA Glare 1280x768 V V V V

3 HDD Toshiba (ROHS) MK1234GSX ,SYS/HDD/SATA-150/2.5 inch/120GB/5400RPM/TOSHIBA/

MK1234GSX,RoHS COMPLIANCE V

MK1032GSX ,SYS/HDD/SATA-150/2.5 inch/100GB/5400RPM/TOSHIBA/ MK1032GSX,RoHS COMPLIANCE V




HITACHI HTS541060G9SA00

,SYS/HDD/SATA-150/HITACHI/HTS541060G9SA00/2.5inch/ 60GB/5400RPM/FOR MS-1034,RoHS COMPLIANCE V V

HTS541080G9SA00

,SYS/HDD/SATA-150/HITACHI/HTS541080G9SA00/2.5inch/ 80GB/5400RPM/FOR MS-1034,RoHS COMPLIANCE V

WD WD600BEAS ,SYS/HDD/SATA-150/2.5 inch /60GB/5400RPM/WESTERN DIGITAL/ WD600BEAS/FOR MS-1042,RoHS COMPLIANCE V

4 ODD

GCC-4244N ,SYS/CDRW/DVDROM combo/Slim type/24X-R/24X-RW/ 8X-DVDROM/24X-CDROM/HLDS/GCC-4244N/For MS-1029, RoHS COMPLIANCE V V

combo/ GSA-T10N

,SYS/DVDRW/SLIM TYPE/8X-DVD±R/8X-DVD+RW/6X-DVD-RW/4X-DVD±R DL/ 5X-DVD-RAM/8X-DVDROM/24X-CDR/16X-CDRW/24X-CDROM/HLDS/GSA-T10N/FOR MS-1016,RoHS COMPLIANCE V V

HLDS SuperMulti/ GSA-T10N

,SYS/DVDRW/SLIM TYPE/8X-DVD±R/8X-DVD+RW/6X-DVD-RW/4X-DVD±R DL/ 5X-DVD-RAM/8X-DVDROM/24X-CDR/16X-CDRW/24X-CDROM/HLDS/GSA-T10N/FOR MS-1016,RoHS COMPLIANCE V

SDVD8821 ,SYS/DVDRW/SLIM V V


Page: 10 of 144

TYPE/8X-DVD±R/8X-DVD+RW/6X-DVD-RW/4X-DVD±R DL/ 5X-DVDRAM/8X-DVDROM/24X-CDR/24X-CDRW/24X-CDROM/PHILIPS/SDVD8821/FOR MS-1016L1,RoHS COMPLIANCE

QSI

SDVD8821

,SYS/DVDRW/SLIM TYPE/8X-DVD±R/8X-DVD+RW/6X-DVD-RW/4X-DVD±R DL/ 5X-DVDRAM/8X-DVDROM/24X-CDR/24X-CDRW/24X-CDROM/PHILIPS/SDVD8821/FOR MS-1016L1,RoHS COMPLIANCE V V

combo/ SDVD8821

,SYS/DVDRW/SLIM TYPE/8X-DVD±R/8X-DVD+RW/6X-DVD-RW/4X-DVD±R DL/ 5X-DVDRAM/8X-DVDROM/24X-CDR/24X-CDRW/24X-CDROM/PHILIPS/SDVD8821/FOR MS-1016L1,RoHS COMPLIANCE V

SCB5265

,SYS/CDRW/DVDROM combo/Slim type/ 24X-R/24X-RW/8X-DVDROM/24X-CDROM/PHILIPS/SCB5265/For MS-1022,RoHS COMPLIANCE V

5 Memory TRANSCEND

DDRII 533 512MB,SYS RAM MODULE,DDR2 SDRAM,266(533)MHz,512MB,SODIMM, TRANSCEND/TS64MSQ64V5J,64MX64bit/1.8V/200pin/ELPIDA CHIP/ wBGA PACKAGE,RoHS COMPLIANCE V

DDRII 533 1GB,SYS RAM MODULE,DDR2 SDRAM,266(533)MHz,1GB,SODIMM, TRANSCEND/TS128MSQ64V5J,128MX64bit/1.8V/200pin/ELPIDA CHIP/ wBGA PACKAGE,RoHS COMPLIANCE V

DDRII 667 512MB,SYS RAM MODULE,DDR2 SDRAM,333(667)MHz,512MB, SODIMM,TRANSCEND/TS64MSQ64V6J,64MX64bit/1.8V/ELPIDA CHIP/ wBGA PACKAGE,RoHS COMPLIANCE V

DDRII 667 1GB,SYS RAM MODULE,DDR2 SDRAM,333(667)MHz,1GB,SODIMM, TRANSCEND/TS128MSQ64V6J,128MX64bit/1.8V/200pin/ELPIDA CHIP/ wBGA PACKAGE,RoHS COMPLIANCE V

Twinmos DDRII 533 512MB ,SYS RAM MODULE,DDR2 SDRAM,266(533)MHz,512MB,SODIMM, Twinmos/8D-22JJ5-HATP,64MX64bit/1.8V/Hynix CHIP,RoHS COMPLIANCE V

DDRII 533 512MB,SYS RAM MODULE,DDR2 SDRAM,266(533)MHz,512MB,SODIMM, TWINMOS/8D-22JJ3MHBTP,64MX64bit/1.8V/Hynix CHIP,RoHS COMPLIANCE V

DDRII 533 1GB,SYS RAM MODULE,DDR2 SDRAM,266(533)MHz, 1GB,SODIMM,TWINMOS/8D-22KJ8MHCTP,128MX64bit/1.8V DDR2 SYNCHRONOUS DRAM WITH SPD/HYNIX CHIP,RoHS COMPLIANCE V

DDRII 667 512MB,SYS RAM MODULE,DDR2 SDRAM,333(667)MHz,512MB, SODIMM,TWINMOS/8D-23JN5MHATP,64MX64bit/1.8V/HYNIX CHIP, RoHS COMPLIANCE V

DDRII 667 1GB,SYS RAM MODULE,DDR2 SDRAM,333(667)MHz,1GB, SODIMM,TWINMOS/8D-23KN5MHBTP,128MX64bit/1.8V/HYNIX CHIP, RoHS COMPLIANCE V

6 Inverter Sampo YIVNMS0016D11

,SYS/MODULE/INVERTER/SAMPO/YIVNMS0016D11--/NOTEBOOK INVERTER FOR 17 TFT LCD/FOR MS-1035 AND MS-1036,RoHS COMPLIANCE V V V V V V V V V

7 Battery Well Top GMS-BMS150ABA00-G

,SYS/BATTERY PACK/LITHIUM-ION/Welltop/GMS-BMS150ABA00-G/SONY/ Vave=3.7V/2400mAh/3cells/11.1V/2400mAH/18650/BLACK/FOR BTY-M43, RoHS COMPLIANCE V V V V V

Well Top GMS-BMS060ABA10-G

,SYS/BATTERY PACK/LITHIUM-ION/Welltop/GMS-BMS060ABA10-G/S ONY/Vave=3.7V/2200mAh/6cells/11.1V/4400mAH/18650/BLACK/FOR BTY-M42,RoHS COMPLIANCE V V V V

8 AC- adapter LI SHIN LSE0202C

1990 ,SYS/POWER SUPPLY ADAPTOR/90W/90-264Vin/4.74A/19Vout/ LI SHIN/LSE0202C1990/FOR MS-1037,RoHS COMPLIANCE V V V

LITEON PA-1900-04RM

,SYS/POWER SUPPLY ADAPTOR/90W/90-264Vin/4.74A/ 19Vout/LITEON/PA-1900-04RM/FOR MS-1058,RoHS COMPLIANCE V V V V

LI SHIN 0335A1965 ,SYS/POWER SUPPLY ADAPTOR/ 65W/90-265Vin/3.42A/ 19Vout/LI SHIN/SLS0335A19N25LF/FOR MS-1034,LEAD FREE V V

9 K/B Chicony MP-03086U4-3591

,SYS KEYBOARD,88KEY,CHICONY/MP-03086U4-3591,US-International, BLACK C,FOR MS-1016,RoHS COMPLIANCE V V V V V V V V V

MP-03086U4-3593

,SYS KEYBOARD,88KEY,CHICONY/MP-03086U4-3593,US-International, WHITE,FOR MS-1022,RoHS COMPLIANCE V V V V V V V V V

10 Touch Pad

SYNAPTICS

TM61PUZ1LR327

,SYS/MODULE/NoteBook Touchpad module/SYNAPTICS/ TM61PUZ1LR327/51.2*37.5mm(PCB WITH MYLAR:53.7*40mm)/ For MS-14141,RoHS COMPLIANCE V V V V V V V V V

11 MDC Qcomm MA560-3 Plus Azalia V V V V V V V V V

12 WLAN MSI MS-6877 MS-6877 10 Wireless 802.11b/g mini-Card (Ch1~11 default, RoHS Compliant) V V V V V V V V V


Page: 11 of 144

1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are: Product Manufacturer Model No. Serial No. Power Cord

1 LCD Monitor CMV CT-730D FNC122F57BA1704 Non-Shielded, 1.8m

2 Walkman AIWA HS-TA164 N/A N/A

3 Microphone &

Earphone

PCHOME N/A N/A Non-Shielded, 2m

4 USB 2.0 HDD AACOM F12-UF N/A Power by PC




8 SATA HDD Onnto ST-M10 500127-E33-0007 Non-Shielded, 1.8m,

with one ferrite core bonded.

9 Exchange Network Sun Moon Star PX-4 95170087 Non-Shielded, 1.8m

10 Notebook PC DELL PPT N/A Non-Shielded, 0.8m


Page: 12 of 144

1.4. Configuration of Tested System

Connection Diagram

Signal Cable Type Signal cable Description

A D-SUB Cable Shielded, 1.8m, with two ferrite cores bonded

B Audio Cable Non-Shielded, 1.6m

C Earphone & Microphone Cable Non-Shielded, 1.8m

D USB Cable Shielded, 1.5m

E USB Cable Shielded, 1.5m

F USB Cable Shielded, 1.5m

G USB Cable Shielded, 1.5m

H SATA Cable Shielded, 1.2m

I TELECOM Cable Non-Shielded, 7m

J TELECOM Cable Non-Shielded, 7m

K LAN Cable Non-Shielded, 7m


Page: 13 of 144

1.5. EUT Exercise Software

1 Setup the EUT and simulators as shown on 1.4. 2 Turn on the power of all equipment. 3 Notebook reads data from disk. 4 Notebook sends “H” pattern to monitor. 5 Notebook sends “H” pattern to printer, the printer will print “H” pattern on paper. 6 Notebook reads and writes data into and from modem. 7 Notebook will read data from floppy disk and then writes the data into floppy disk , same operation

for hard disk. 8 Repeat the above procedure (4) to (7).


Page: 14 of 144

2. Technical Test

2.1. Summary of Test Result

No deviations from the test standards Deviations from the test standards as below description:

Emission

Performed Item Normative References Test

Performed Deviation

Conducted Emission EN 55022:1998+A1:2000+A2:2003 Class B


Yes No

Impedance Stabilization

Network

EN 55022:1998+A1:2000+A2:2003 Class B


Yes No

Radiated Emission EN 55022:1998+A1:2000+A2:2003 Class B


Yes No

Power Harmonics EN 61000-3-2:2000 Yes No

Voltage Fluctuation and

Flicker

EN 61000-3-3:1995+A1:2001 Yes No

Immunity

Performed Item Normative References Test

Performed Deviation

Electrostatic Discharge IEC 61000-4-2 Edition 1.2: 2001-04 Yes No

Radiated susceptibility IEC 61000-4-3:2002+A1:2002 Yes No

Electrical fast transient/burst IEC 61000-4-4:2004 Yes No

Surge IEC 61000-4-5 Edition 1.1: 2001-04 Yes No

Conducted susceptibility IEC 61000-4-6 Edition 2.1: 2004-11 Yes No

Power frequency magnetic

field

IEC 61000-4-8 Edition 1.1: 2001-03 Yes No

Voltage dips and interruption IEC 61000-4-11 2nd Edition: 2004-03 Yes No


Page: 15 of 144

2.2. List of Test Equipment Conducted Emission / SR1 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCS 30 836858/022 2006/02/18 LISN R&S ESH3-Z5 836679/020 2006/02/14 LISN R&S ENV4200 833209/007 2006/07/13 Pulse Limiter R&S ESH3-Z2 357.88.10.52 2006/09/04 Impedance Stabilization Network / SR1 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2070 RF-Generator N/A N/A N/A N/A

Capacitive Voltage Probe Schaffner CVP2200A 18331 2005/11/11 EMI Test Receiver R&S ESCS 30 836858/022 2006/02/18 LISN R&S ENV4200 833209/007 2006/07/13 LISN R&S ESH3-Z5 836679/020 2006/02/14 lmpedance Stabilization Network Schaffner ISN T400 19099 2006/07/15

Pulse Limiter R&S ESH3-Z2 357.88.10.52 2006/09/04

RF Current Probe FCC F-65 10KHz~1GHz 198 2005/11/11

Radiated Emission / Site3 Instrument Manufacturer Type No. Serial No Cal. Date Bilog Antenna Schaffner Chase CBL6112B 2704 2006/08/09 Broadband Horn Antenna Schwarzbeck BBHA9170 208 2006/07/25 EMI Test Receiver R&S ESI 26 838786/004 2006/06/19 EMI Test Receiver R&S ESCS 30 838251/001 2006/05/11 Horn Antenna Schwarzbeck BBHA9120D 305 2006/08/10

Pre-Amplifier MITEQ AMF-4D-180400-45-6P 925974 2006/01/03

Pre-Amplifier QTK N/A N/A 2006/01/03 Spectrum Analyzer Advantest R3162 101102468 2005/10/24 Power Harmonics / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK54148 2006/06/29

IEC1000-4-X Analyzer(Flicker) Schaffner CCN 1000-1 X7 1887 2006/06/29

Voltage Fluctuation and Flicker / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK54148 2006/06/29

IEC1000-4-X Analyzer(Flicker) Schaffner CCN 1000-1 X7 1887 2006/06/29


Page: 16 of 144

Electrostatic Discharge / SR3 Instrument Manufacturer Type No. Serial No Cal. Date ESD simulator system Schaffner NSG 438 167 2006/03/24 Horizontal Coupling Plane(HCP) QuieTek HCP AL50 N/A N/A

Vertical Coupling Plane(VCP) QuieTek VCP AL50 N/A N/A

Radiated susceptibility / CB5 Instrument Manufacturer Type No. Serial No Cal. Date

AF-BOX R&S AF-BOX ACCUST 100007 N/A

Audio Analyzer R&S UPL 16 100137 2006/03/16 Bilog Antenna Schaffner Chase CBL6112B 2450 2006/01/03 Broad-Band Antenna Schwarzbeck VULB 9166 1085 2006/08/02 CMU200 UNIV.RADIOCOMM R&S CMU200 104846 2006/03/16

Directional Coupler A&R DC 6180 22735 2006/08/03 Dual Microphone Supply B&K 5935 2426784 2006/08/04 Mouth Simulator B&K 4227 2439692 2006/08/04 Power Amplifier A&R 100W10000M7 A285000010 N/A Power Amplifier A&R 30S1G3 309453 N/A Power Meter R&S NRVD(P.M) 100219 2006/04/21 Pre-Amplifier A&R 150A220 23067 N/A Probe Microphone B&K 4182 2278070 2006/08/04

Signal Generator R&S SMY02(9K-2080) 825454/028 2005/10/03

Electrical fast transient/burst / SR2 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2050 System Mainframe N/A N/A N/A N/A

Surge / SR2 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2050 System Mainframe N/A N/A N/A N/A

Conducted susceptibility / SR6 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2070 RF-Generator N/A N/A N/A N/A

Power frequency magnetic field / SR3 Instrument Manufacturer Type No. Serial No Cal. Date Induction Coil Interface Schaffner INA 2141 6002 N/A Magnetic Loop Coil Schaffner INA 702 199749-020IN N/A Magnetic/Electric field measuring system Lackmann Phymetric MV3 N/A N/A

Triaxial ELF Magnetic Field Meter F.B.BELL 4090 9852 2006/05/30


Page: 17 of 144

Voltage dips and interruption / SR2 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2050 System Mainframe N/A N/A N/A N/A

Schaffner NSG 2050 System Mainframe Instrument Manufacturer Type No. Serial No Cal. Date Burst 4.8KV/16A Generator with CDN Schaffner PNW2225 200123-098SC 2005/12/28

Damped osc. Wave 100kHz and 1MHz Schaffner PNW2056 200124-058SC 2005/12/28

Double AC Source Variator Schaffner NSG 642A 30910014938 2005/12/28 Hybrid surge pulse 1.2/50uS Schaffner PNW 2050 20532-514LU 2006/01/03

PQT Generator Schaffner PNW2003 200138-007SC 2006/01/02 Pulse COUPLING NETWORK Schaffner CDN131 200124-007SC 2005/12/28

Schaffner NSG 2070 RF-Generator Instrument Manufacturer Type No. Serial No Cal. Date CDN Schaffner CAL U100A 20405 2006/03/27 CDN Schaffner TRA U150 20454 2006/03/27 CDN M016S Schaffner CAL U100A 20410 2006/03/27 CDN M016S Schaffner TRA U150 21167 2006/03/27 CDN T002 Schaffner CAL U100 20491 2006/03/27 CDN T002 Schaffner TRA U150 21169 2006/03/27 CDN T400 Schaffner CAL U100 17735 2006/03/27 CDN T400 Schaffner TRA U150 21166 2006/03/27 Coupling Decoupling Network Schaffner CDN M016S 20822 2006/03/27

Coupling Decoupling Network Schaffner CDN M016S 20823 2006/03/27

Coupling Decoupling Network Schaffner CDN T002 19018 2006/03/27

Coupling Decoupling Network Schaffner CDN T400 21226 2006/03/27

EM-CLAMP Schaffner KEMZ 801 21024 2006/04/21


Page: 18 of 144

2.3. Measurement Uncertainty Conducted Emission

The measurement uncertainty is evaluated as ± 2.26 dB.

Impedance Stabilization Network The measurement uncertainty is evaluated as ± 2.26 dB.

Radiated Emission The measurement uncertainty is evaluated as ± 3.19 dB.

Electrostatic Discharge As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in ESD testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant ESD standards. The immunity test signal from the ESD system meet the required specifications in IEC 61000-4-2 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%.

Radiated susceptibility As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in RS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant RS standards. The immunity test signal from the RS system meet the required specifications in IEC 61000-4-3 through the calibration for the uniform field strength and monitoring for the test level with the uncertainty evaluation report for the electrical filed strength as being 2.72 dB.

Electrical fast transient/burst As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in EFT/Burst testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant EFT/Burst standards. The immunity test signal from the EFT/Burst system meet the required specifications in IEC 61000-4-4 through the calibration report with the calibrated uncertainty for the waveform of voltage, frequency and timing as being 1.63 %, 2.8 　 10-10 and

2.76%. Surge

As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in Surge testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant Surge standards. The immunity test signal from the Surge system meet the required specifications in IEC 61000-4-5 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%.

Conducted susceptibility


Page: 19 of 144

As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in CS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant CS standards. The immunity test signal from the CS system meet the required specifications in IEC 61000-4-6 through the calibration for unmodulated signal and monitoring for the test level with the uncertainty evaluation report for the injected modulated signal level through CDN and EM Clamp/Direct Injection as being 3.72 dB and 2.78 dB.

Power frequency magnetic field As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in PFM testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant PFM standards. The immunity test signal from the PFM system meet the required specifications in IEC 61000-4-8 through the calibration report with the calibrated uncertainty for the Gauss Meter to verify the output level of magnetic field strength as being 2 %.

Voltage dips and interruption As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in DIP testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant DIP standards. The immunity test signal from the DIP system meet the required specifications in IEC 61000-4-11 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%.


Page: 20 of 144

2.4. Test Environment

Performed Item Items Required Actual

Temperature (°C) 15-35 25

Conducted Emission

Humidity (%RH) 25-75 50

Barometric pressure (mbar) 860-1060 950-1000


Impedance Stabilization Network




Radiated Emission



Temperature (°C) 15-35 24.1

Electrostatic Discharge




Radiated susceptibility




Electrical fast transient/burst




Surge Humidity (%RH) 10-75 51



Conducted susceptibility




Power frequency Humidity (%RH) 25-75 51


Page: 21 of 144

magnetic field



Voltage dips and interruption




Page: 22 of 144

3. Conducted Emission (Main Terminals)

3.1. Test Specification According to EMC Standard : EN 55022 and AS/NZS CISPR 22: 2006

3.2. Test Setup

3.3. Limit

Limits

Frequency (MHz)

QP (dBuV)

AV (dBuV)

0.15 - 0.50 66 - 56 56 – 46

0.50-5.0 56 46

5.0 - 30 60 50

Remarks: In the above table, the tighter limit applies at the band edges.


Page: 23 of 144

3.4. Test Procedure The EUT and simulators are connected to the main power through a line impedance stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.) Both sides of A.C. line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed on conducted measurement. Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using a receiver bandwidth of 9kHz.

3.5. Deviation from Test Standard No deviation.


Page: 24 of 144

3.6. Test Result Site : SR-1 Time : 2006/09/04 - 14:38

Limit : CISPR_B_00M_QP Margin : 10

EUT : MEGA BOOK Probe : LISN-020(L) - Line1

Power : AC 230V/50Hz Note : Mode 1


Page: 25 of 144

Site : SR-1 Time : 2006/09/04 - 14:40




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.193 0.202 46.120 46.322 -18.449 64.771 QUASIPEAK

2 0.326 0.214 37.130 37.344 -23.627 60.971 QUASIPEAK

3 0.584 0.217 36.800 37.017 -18.983 56.000 QUASIPEAK

4 1.689 0.262 34.790 35.052 -20.948 56.000 QUASIPEAK

5 3.959 0.352 34.070 34.422 -21.578 56.000 QUASIPEAK

6 16.818 0.924 29.460 30.384 -29.616 60.000 QUASIPEAK

Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor


Page: 26 of 144

Site : SR-1 Time : 2006/09/04 - 14:40

Limit : CISPR_B_00M_AV Margin : 0



Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.193 0.202 44.370 44.572 -10.199 54.771 AVERAGE

2 0.326 0.214 34.220 34.434 -16.537 50.971 AVERAGE

3 0.584 0.217 35.520 35.737 -10.263 46.000 AVERAGE

4 1.689 0.262 33.480 33.742 -12.258 46.000 AVERAGE

5 3.959 0.352 30.930 31.282 -14.718 46.000 AVERAGE

6 16.818 0.924 22.300 23.224 -26.776 50.000 AVERAGE



Page: 27 of 144

Site : SR-1 Time : 2006/09/04 - 14:41





Page: 28 of 144

Site : SR-1 Time : 2006/09/04 - 14:43




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.193 0.202 46.380 46.582 -18.189 64.771 QUASIPEAK

2 0.388 0.215 36.620 36.835 -22.365 59.200 QUASIPEAK

3 0.584 0.217 36.770 36.987 -19.013 56.000 QUASIPEAK

4 1.361 0.248 35.930 36.178 -19.822 56.000 QUASIPEAK

5 2.400 0.292 35.840 36.132 -19.868 56.000 QUASIPEAK

6 16.537 0.920 33.500 34.420 -25.580 60.000 QUASIPEAK



Page: 29 of 144

Site : SR-1 Time : 2006/09/04 - 14:43




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.193 0.202 44.500 44.702 -10.069 54.771 AVERAGE

2 0.388 0.215 33.420 33.635 -15.565 49.200 AVERAGE

3 0.584 0.217 35.520 35.737 -10.263 46.000 AVERAGE

4 1.361 0.248 34.600 34.848 -11.152 46.000 AVERAGE

5 2.400 0.292 33.570 33.862 -12.138 46.000 AVERAGE

6 16.537 0.920 27.900 28.820 -21.180 50.000 AVERAGE



Page: 30 of 144

Site : SR-1 Time : 2006/09/20 - 00:06


EUT : MEGA BOOK Probe : LISN-L(023) - Line1



Page: 31 of 144

Site : SR-1 Time : 2006/09/20 - 00:09




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.291 0.300 40.460 40.760 -21.211 61.971 QUASIPEAK

2 0.420 0.300 45.850 46.150 -12.136 58.286 QUASIPEAK

3 * 0.846 0.310 47.200 47.510 -8.490 56.000 QUASIPEAK

4 1.685 0.330 43.580 43.910 -12.090 56.000 QUASIPEAK

5 4.228 0.410 37.410 37.820 -18.180 56.000 QUASIPEAK

6 7.598 0.520 34.070 34.590 -25.410 60.000 QUASIPEAK



Page: 32 of 144

Site : SR-1 Time : 2006/09/20 - 00:09




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.291 0.300 21.200 21.500 -30.471 51.971 AVERAGE

2 0.420 0.300 32.350 32.650 -15.636 48.286 AVERAGE

3 * 0.846 0.310 31.210 31.520 -14.480 46.000 AVERAGE

4 1.685 0.330 27.850 28.180 -17.820 46.000 AVERAGE

5 4.228 0.410 23.000 23.410 -22.590 46.000 AVERAGE

6 7.598 0.520 21.250 21.770 -28.230 50.000 AVERAGE



Page: 33 of 144

Site : SR-1 Time : 2006/09/20 - 00:10


EUT : MEGA BOOK Probe : LISN-N(023) - Line2



Page: 34 of 144

Site : SR-1 Time : 2006/09/20 - 00:12




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.244 0.300 38.490 38.790 -24.524 63.314 QUASIPEAK

2 0.396 0.310 44.460 44.770 -14.201 58.971 QUASIPEAK

3 * 0.826 0.320 46.590 46.910 -9.090 56.000 QUASIPEAK

4 1.611 0.340 35.820 36.160 -19.840 56.000 QUASIPEAK

5 3.455 0.387 32.620 33.007 -22.993 56.000 QUASIPEAK

6 9.634 0.490 31.010 31.500 -28.500 60.000 QUASIPEAK



Page: 35 of 144

Site : SR-1 Time : 2006/09/20 - 00:12




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.244 0.300 18.940 19.240 -34.074 53.314 AVERAGE

2 0.396 0.310 28.190 28.500 -20.471 48.971 AVERAGE

3 * 0.826 0.320 30.070 30.390 -15.610 46.000 AVERAGE

4 1.611 0.340 26.200 26.540 -19.460 46.000 AVERAGE

5 3.455 0.387 24.230 24.617 -21.383 46.000 AVERAGE

6 9.634 0.490 20.530 21.020 -28.980 50.000 AVERAGE



Page: 36 of 144

Site : SR-1 Time : 2006/09/19 - 23:48





Page: 37 of 144

Site : SR-1 Time : 2006/09/19 - 23:50




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.196 0.679 46.590 47.269 -17.417 64.686 QUASIPEAK

2 0.263 0.314 40.880 41.194 -21.577 62.771 QUASIPEAK

3 0.463 0.300 40.230 40.530 -16.527 57.057 QUASIPEAK

4 * 0.724 0.310 40.230 40.540 -15.460 56.000 QUASIPEAK

5 1.587 0.330 34.080 34.410 -21.590 56.000 QUASIPEAK

6 3.705 0.390 38.300 38.690 -17.310 56.000 QUASIPEAK



Page: 38 of 144

Site : SR-1 Time : 2006/09/19 - 23:50




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.196 0.679 39.990 40.669 -14.017 54.686 AVERAGE

2 0.263 0.314 35.710 36.024 -16.747 52.771 AVERAGE

3 * 0.463 0.300 39.060 39.360 -7.697 47.057 AVERAGE

4 0.724 0.310 35.000 35.310 -10.690 46.000 AVERAGE

5 1.587 0.330 31.710 32.040 -13.960 46.000 AVERAGE

6 3.705 0.390 30.590 30.980 -15.020 46.000 AVERAGE



Page: 39 of 144

Site : SR-1 Time : 2006/09/19 - 23:51





Page: 40 of 144

Site : SR-1 Time : 2006/09/19 - 23:53




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.154 0.300 41.520 41.820 -24.066 65.886 QUASIPEAK

2 * 0.197 0.300 49.000 49.300 -15.357 64.657 QUASIPEAK

3 0.463 0.310 39.540 39.850 -17.207 57.057 QUASIPEAK

4 0.724 0.312 39.340 39.652 -16.348 56.000 QUASIPEAK

5 3.705 0.390 39.400 39.790 -16.210 56.000 QUASIPEAK

6 25.630 1.090 28.980 30.070 -29.930 60.000 QUASIPEAK



Page: 41 of 144

Site : SR-1 Time : 2006/09/19 - 23:53




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.154 0.300 15.330 15.630 -40.256 55.886 AVERAGE

2 0.197 0.300 42.310 42.610 -12.047 54.657 AVERAGE

3 * 0.463 0.310 37.790 38.100 -8.957 47.057 AVERAGE

4 0.724 0.312 33.240 33.552 -12.448 46.000 AVERAGE

5 3.705 0.390 31.790 32.180 -13.820 46.000 AVERAGE

6 25.630 1.090 22.000 23.090 -26.910 50.000 AVERAGE



Page: 42 of 144

3.7. Test Photograph Test Mode : MODE 1 Description : Front View of Conducted Test

Test Mode : MODE 1 Description : Back View of Conducted Test


Page: 43 of 144

Test Mode : MODE 2 Description : Front View of Conducted Test



Page: 44 of 144

Test Mode : MODE 3 Description : Front View of Conducted Test



Page: 45 of 144

4. Conducted Emissions (Telecommunication Ports)

4.1. Test Specification According to EMC Standard : EN 55022 and AS/NZS CISPR 22: 2006

4.2. Test Setup

4.3. Limit

Limits

Frequency (MHz)

QP (dBuV)

AV (dBuV)

0.15 - 0.50 84 – 74 74 – 64

0.50 - 30 74 64

Remarks: The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz~0.50 MHz.


Page: 46 of 144

4.4. Test Procedure Telecommunication Port:

The mains voltage shall be supplied to the EUT via the LISN when the measurement of telecommunication port is performed. The common mode disturbances at the telecommunication port shall be connected to the ISN, which is 150 ohm impedance. Both alternative cables are tested related to the LCL requested. The measurement range is from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz. The 60dB LCL ISN is used for cat. 5 cable, 50dB LCL ISN is used for cat. 3 and 80dB LCL is used for alternative one.



Page: 47 of 144

4.6. Test Result Site : SR-1 Time : 2006/09/29 - 23:12

Limit : ISN_Voltage_B_10db_00M_QP Margin : 10

EUT : MEGA BOOK Probe : ISN-T400 - Line1

Power : AC 230V/50Hz Note : isn 100M


Page: 48 of 144

Site : SR-1 Time : 2006/09/29 - 23:14




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.349 9.784 35.310 45.094 -33.220 78.314 QUASIPEAK

2 0.823 9.750 44.470 54.220 -19.780 74.000 QUASIPEAK

3 2.048 9.747 46.610 56.357 -17.643 74.000 QUASIPEAK

4 9.935 9.812 49.140 58.952 -25.048 84.000 QUASIPEAK

5 16.228 9.856 57.330 67.186 -16.814 84.000 QUASIPEAK

6 * 23.127 9.918 59.320 69.238 -14.762 84.000 QUASIPEAK



Page: 49 of 144

Site : SR-1 Time : 2006/09/29 - 23:14

Limit : ISN_Voltage_B_10db_00M_AV Margin : 0



Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.349 9.784 31.380 41.164 -27.150 68.314 AVERAGE

2 0.823 9.750 35.470 45.220 -18.780 64.000 AVERAGE

3 2.048 9.747 45.540 55.287 -8.713 64.000 AVERAGE

4 9.935 9.812 45.810 55.622 -18.378 74.000 AVERAGE

5 16.228 9.856 53.960 63.816 -10.184 74.000 AVERAGE

6 * 23.127 9.918 56.890 66.808 -7.192 74.000 AVERAGE



Page: 50 of 144

Site : SR-1 Time : 2006/09/29 - 23:16





Page: 51 of 144

Site : SR-1 Time : 2006/09/29 - 23:18




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.825 9.750 43.940 53.690 -20.310 74.000 QUASIPEAK

2 2.443 9.742 43.950 53.692 -20.308 74.000 QUASIPEAK

3 7.916 9.795 51.290 61.085 -22.915 84.000 QUASIPEAK

4 * 10.002 9.813 62.820 72.633 -11.367 84.000 QUASIPEAK

5 13.783 9.833 46.560 56.393 -27.607 84.000 QUASIPEAK

6 27.396 9.965 47.210 57.175 -26.825 84.000 QUASIPEAK



Page: 52 of 144

Site : SR-1 Time : 2006/09/29 - 23:18

Limit : ISN_Voltage_B_10db_00M_AV Margin : 0



Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.825 9.750 34.060 43.810 -20.190 64.000 AVERAGE

2 2.443 9.742 40.620 50.362 -13.638 64.000 AVERAGE

3 7.916 9.795 46.080 55.875 -18.125 74.000 AVERAGE

4 * 10.002 9.813 52.190 62.003 -11.997 74.000 AVERAGE

5 13.783 9.833 41.340 51.173 -22.827 74.000 AVERAGE

6 27.396 9.965 40.500 50.465 -23.535 74.000 AVERAGE



Page: 53 of 144

Site : SR-1 Time : 2006/09/29 - 23:27

Limit : ISN_Voltage_B_00M_QP Margin : 10


Power : AC 230V/50Hz Note : isn TEL


Page: 54 of 144

Site : SR-1 Time : 2006/09/29 - 23:30

Limit : ISN_Voltage_B_00M_QP Margin : 0



Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.162 9.802 53.920 63.722 -19.935 83.657 QUASIPEAK

2 0.193 9.798 48.550 58.348 -24.423 82.771 QUASIPEAK

3 * 2.047 9.747 49.900 59.647 -14.353 74.000 QUASIPEAK

4 3.084 9.751 39.710 49.461 -24.539 74.000 QUASIPEAK

5 4.841 9.764 34.050 43.814 -30.186 74.000 QUASIPEAK

6 21.654 9.899 41.000 50.899 -23.101 74.000 QUASIPEAK



Page: 55 of 144

Site : SR-1 Time : 2006/09/29 - 23:30

Limit : ISN_Voltage_B_00M_AV Margin : 0



Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.162 9.802 51.520 61.322 -12.335 73.657 AVERAGE

2 0.193 9.798 44.280 54.078 -18.693 72.771 AVERAGE

3 * 2.047 9.747 49.700 59.447 -4.553 64.000 AVERAGE

4 3.084 9.751 38.390 48.141 -15.859 64.000 AVERAGE

5 4.841 9.764 29.590 39.354 -24.646 64.000 AVERAGE

6 21.654 9.899 35.580 45.479 -18.521 64.000 AVERAGE



Page: 56 of 144

4.7. Test Photograph Test Mode : MODE 1 Description : Front View of ISN Test-LAN

Test Mode : MODE 1 Description : Back View of ISN Test-LAN


Page: 57 of 144

Test Mode : MODE 1 Description : Front View of ISN Test-Telecom

Test Mode : MODE 1 Description : Back View of ISN Test-Telecom


Page: 58 of 144

5. Radiated Emission

5.1. Test Specification According to EMC Standard : EN 55022 and AS/NZS CISPR 22

5.2. Test Setup

5.3. Limit

Limits Frequency

(MHz) Distance (m) dBuV/m

30 – 230 10 30

230 – 1000 10 37

Remark: 1. The tighter limit shall apply at the edge between two frequency bands. 2. Distance refers to the distance in meters between the measuring instrument antenna

and the closed point of any part of the device or system.


Page: 59 of 144

5.4. Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 10 meters. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated on radiated measurement. Radiated emissions were invested over the frequency range from 30MHz to1GHz using a receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of 10 meters.



Page: 60 of 144

5.6. Test Result Site : OATS-3 Time : 2006/08/25 - 13:45


EUT: MEGA BOOK Probe : CBL6112B-(2918) - HORIZONTAL


Frequency (MHz) Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin (dB) Limit (dBuV/m) Detector Type

1 148.460 12.801 5.230 18.031 -11.969 30.000 QUASIPEAK

2 156.960 12.362 4.670 17.032 -12.968 30.000 QUASIPEAK

3 240.000 14.124 15.180 29.304 -7.696 37.000 QUASIPEAK

4 300.000 16.708 4.150 20.857 -16.143 37.000 QUASIPEAK

5 401.800 20.518 3.860 24.378 -12.622 37.000 QUASIPEAK

6 480.120 22.175 11.000 33.175 -3.825 37.000 QUASIPEAK

7 600.030 24.440 2.130 26.570 -10.430 37.000 QUASIPEAK

8 * 800.000 26.896 7.000 33.896 -3.104 37.000 QUASIPEAK

9 835.828 27.419 3.540 30.959 -6.041 37.000 QUASIPEAK

10 975.000 28.828 1.790 30.618 -6.382 37.000 QUASIPEAK

Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor


Page: 61 of 144

Site : OATS-3 Time : 2006/08/25 - 13:47


EUT: MEGA BOOK Probe : CBL6112B-(2918) - VERTICAL


Frequency (MHz) Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin (dB) Limit (dBuV/m) Detector Type

1 69.993 7.002 15.540 22.543 -7.457 30.000 QUASIPEAK

2 120.000 13.802 9.710 23.512 -6.488 30.000 QUASIPEAK

3 * 125.000 14.027 12.870 26.897 -3.103 30.000 QUASIPEAK

4 148.900 12.773 9.400 22.172 -7.828 30.000 QUASIPEAK

5 160.000 12.301 -2.380 9.921 -20.079 30.000 QUASIPEAK

6 240.000 14.124 9.030 23.154 -13.846 37.000 QUASIPEAK

7 320.000 17.560 6.310 23.870 -13.130 37.000 QUASIPEAK

8 401.800 20.518 7.730 28.248 -8.752 37.000 QUASIPEAK

9 600.030 24.440 2.030 26.470 -10.530 37.000 QUASIPEAK

10 800.000 26.896 7.000 33.896 -3.104 37.000 QUASIPEAK

11 835.828 27.419 6.400 33.819 -3.181 37.000 QUASIPEAK



Page: 62 of 144

Site : OATS-3 Time : 2006/09/22 - 16:37


EUT : MEGA BOOK Probe : CBL6112B-(2918) - HORIZONTAL


Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 175.000 11.478 14.560 26.038 -3.962 30.000 QUASIPEAK

2 200.000 11.613 12.270 23.883 -6.117 30.000 QUASIPEAK

3 393.233 20.102 8.860 28.961 -8.039 37.000 QUASIPEAK

4 480.120 22.175 6.910 29.085 -7.915 37.000 QUASIPEAK

5 720.030 25.921 0.470 26.391 -10.609 37.000 QUASIPEAK

6 * 800.000 26.896 6.590 33.486 -3.514 37.000 QUASIPEAK

7 803.600 26.937 4.130 31.067 -5.933 37.000 QUASIPEAK



Page: 63 of 144

Site : OATS-3 Time : 2006/09/22 - 16:36


EUT : MEGA BOOK Probe : CBL6112B-(2918) - VERTICAL


Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 117.200 13.699 12.270 25.968 -4.032 30.000 QUASIPEAK

2 124.000 13.996 8.520 22.516 -7.484 30.000 QUASIPEAK

3 135.500 13.671 7.830 21.500 -8.500 30.000 QUASIPEAK

4 150.000 12.700 11.330 24.030 -5.970 30.000 QUASIPEAK

5 200.000 11.613 14.000 25.613 -4.387 30.000 QUASIPEAK

6 250.000 15.286 10.250 25.536 -11.464 37.000 QUASIPEAK

7 368.655 19.294 7.650 26.945 -10.055 37.000 QUASIPEAK

8 500.000 22.412 3.430 25.842 -11.158 37.000 QUASIPEAK

9 750.040 26.405 4.010 30.415 -6.585 37.000 QUASIPEAK

10 * 800.000 26.896 7.100 33.996 -3.004 37.000 QUASIPEAK

11 803.600 26.937 5.960 32.897 -4.103 37.000 QUASIPEAK



Page: 64 of 144

Site : OATS-3 Time : 2006/09/22 - 16:41


EUT : MEGA BOOK Probe : CBL6112B-(2918) - HORIZONTAL


Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 68.000 6.805 13.500 20.304 -9.696 30.000 QUASIPEAK

2 175.000 11.478 13.980 25.458 -4.542 30.000 QUASIPEAK

3 200.000 11.613 11.320 22.933 -7.067 30.000 QUASIPEAK

4 393.233 20.102 6.980 27.081 -9.919 37.000 QUASIPEAK

5 480.120 22.175 6.910 29.085 -7.915 37.000 QUASIPEAK

6 720.000 25.920 3.510 29.430 -7.570 37.000 QUASIPEAK

7 * 800.000 26.896 5.900 32.796 -4.204 37.000 QUASIPEAK

8 803.600 26.937 5.330 32.267 -4.733 37.000 QUASIPEAK



Page: 65 of 144

Site : OATS-3 Time : 2006/09/22 - 16:38


EUT : MEGA BOOK Probe : CBL6112B-(2918) - VERTICAL


Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 117.200 13.699 12.100 25.798 -4.202 30.000 QUASIPEAK

2 150.000 12.700 12.100 24.800 -5.200 30.000 QUASIPEAK

3 200.000 11.613 13.500 25.113 -4.887 30.000 QUASIPEAK

4 250.000 15.286 10.250 25.536 -11.464 37.000 QUASIPEAK

5 368.655 19.294 7.650 26.945 -10.055 37.000 QUASIPEAK

6 500.000 22.412 5.710 28.122 -8.878 37.000 QUASIPEAK

7 750.040 26.405 4.010 30.415 -6.585 37.000 QUASIPEAK

8 * 800.000 26.896 7.000 33.896 -3.104 37.000 QUASIPEAK

9 803.600 26.937 5.840 32.777 -4.223 37.000 QUASIPEAK



Page: 66 of 144

5.7. Test Photograph Test Mode : MODE 1 Description : Front View of Radiated Test

Test Mode : MODE 1 Description : Back View of Radiated Test


Page: 67 of 144

Test Mode : MODE 2 Description : Front View of Radiated Test



Page: 68 of 144

Test Mode : MODE 3 Description : Front View of Radiated Test



Page: 69 of 144

6. Harmonic Current Emission

6.1. Test Specification According to EMC Standard : EN 61000-3-2

6.2. Test Setup

6.3. Limit (a) Limits of Class A Harmonics Currents

Harmonics Order

n

Maximum Permissible harmonic current

A

Harmonics Order

n


A

Odd harmonics Even harmonics

3 2.30 2 1.08

5 1.14 4 0.43

7 0.77 6 0.30

9 0.40 8 ≤ n ≤ 40 0.23 * 8/n

11 0.33

13 0.21

15 ≤ n ≤ 39 0.15 * 15/n


Page: 70 of 144

(b) Limits of Class B Harmonics Currents

For Class B equipment, the harmonic of the input current shall not exceed the maximum permissible values given in table that is the limit of Class A multiplied by a factor of 1.5.

(c) Limits of Class C Harmonics Currents

Harmonics Order

n

Maximum Permissible harmonic current Expressed as a percentage of the input current at the fundamental frequency

％

2 2

3 30．λ＊

5 10

7 7

9 5

11 ≤ n ≤ 39 (odd harmonics only)

3

＊λ is the circuit power factor

(d) Limits of Class D Harmonics Currents

Harmonics Order

n

Maximum Permissible harmonic current per watt

mA/W


A

3 3.4 2.30

5 1.9 1.14

7 1.0 0.77

9 0.5 0.40

11 0.35 0.33

11 ≤ n ≤ 39 (odd harmonics only)

3.85/n See limit of Class A


Page: 71 of 144

6.4. Test Procedure

The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed.



Page: 72 of 144

6.6. Test Result Product MEGA BOOK

Test Item Power Harmonics

Test Mode MODE 1

Date of Test 2006/09/29 Test Site No.3 Shielded Room

Test Result: Pass Source qualification: Normal

Current & voltage waveforms

-3-2-10123

-300-200-1000100200300

Cur

rent

(Am

ps)

Voltage (V

olts)

Harmonics and Class D limit line European Limits

0.00000.00250.00500.00750.01000.01250.01500.01750.0200

Cur

rent

RM

S(A

mps

)

Harmonic #4 8 12 16 20 24 28 32 36 40

Test result: Pass Worst harmonic was #0 with 0.00% of the limit.


Page: 73 of 144


THC(A): 0.00 I-THD(%): 0.00 POHC(A): 0.000 POHC Limit(A): 0.000 Highest parameter values during test:

V_RMS (Volts): 229.78 Frequency(Hz): 50.00 I_Peak (Amps): 2.333 I_RMS (Amps): 0.136 I_Fund (Amps): 0.027 Crest Factor: 19.368 Power (Watts): 4.3 Power Factor: 0.154

Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.003 3 0.009 0.015 0.0 0.010 0.021 0.00 Pass 4 0.003 5 0.008 0.008 0.0 0.009 0.012 0.00 Pass 6 0.003 7 0.007 0.004 0.0 0.009 0.006 0.00 Pass 8 0.003 9 0.007 0.002 0.0 0.008 0.003 0.00 Pass 10 0.003 11 0.006 0.002 0.0 0.007 0.002 0.00 Pass 12 0.003 13 0.005 0.001 0.0 0.005 0.002 0.00 Pass 14 0.002 15 0.004 0.001 0.0 0.004 0.002 0.00 Pass 16 0.002 17 0.003 0.001 0.0 0.003 0.001 0.00 Pass 18 0.002 19 0.002 0.001 0.0 0.003 0.001 0.00 Pass 20 0.001 21 0.002 0.001 0.0 0.002 0.001 0.00 Pass 22 0.001 23 0.001 0.001 0.0 0.001 0.001 0.00 Pass 24 0.001 25 0.001 0.001 0.0 0.001 0.001 0.00 Pass 26 0.000 27 0.001 0.001 0.0 0.001 0.001 0.00 Pass 28 0.000 29 0.000 0.001 0.0 0.001 0.001 0.00 Pass 30 0.000 31 0.000 0.001 0.0 0.000 0.001 0.00 Pass 32 0.000 33 0.000 0.000 0.0 0.000 0.001 0.00 Pass 34 0.000 35 0.000 0.000 0.0 0.000 0.001 0.00 Pass 36 0.000 37 0.000 0.000 0.0 0.000 0.001 0.00 Pass 38 0.000 39 0.000 0.000 0.0 0.000 0.001 0.00 Pass 40 0.000

1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the

same window as the maximum harmonics/limit ratio.

2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power

>75W. Others the result should be pass.


Page: 74 of 144

Product MEGA BOOK


Test Mode MODE 2




-0.6-0.4-0.20.00.20.40.6

-300-200-1000100200300

Cur

rent

(Am

ps)

Voltage (V

olts)


0.000.050.100.150.200.250.300.35

Cur

rent

RM

S(A

mps

)

Harmonic #4 8 12 16 20 24 28 32 36 40



Page: 75 of 144










Page: 76 of 144

Product MEGA BOOK


Test Mode MODE 3




-6-4-20246

-300-200-1000100200300

Cur

rent

(Am

ps)

Voltage (V

olts)


0.000.050.100.150.200.250.300.35

Cur

rent

RM

S(A

mps

)

Harmonic #4 8 12 16 20 24 28 32 36 40



Page: 77 of 144










Page: 78 of 144

6.7. Test Photograph Test Mode : MODE 1 Description : Power Harmonics Test Setup

Test Mode : MODE 2 Description : Power Harmonics Test Setup


Page: 79 of 144

Test Mode : MODE 3 Description : Power Harmonics Test Setup


Page: 80 of 144

7. Voltage Fluctuation and Flicker

7.1. Test Specification According to EMC Standard : EN 61000-3-3

7.2. Test Setup

7.3. Limit The following limits apply:

－ the value of Pst shall not be greater than 1.0; － the value of Plt shall not be greater than 0.65; － the value of d(t) during a voltage change shall not exceed 3.3 ％ for more than 500

ms; － the relative steady-state voltage change, dc, shall not exceed 3.3 ％; － the maximum relative voltage change, dmax, shall not exceed;

a) 4 ％ without additional conditions; b) 6 ％ for equipment which is:

－ switched manually, or － switched automatically more frequently than twice per day, and also has either a

delayed restart (the delay being not less than a few tens of seconds), or manual restart, after a power supply interruption.

NOTE The cycling frequency will be further limited by the Pst and P1t limit. For example: a dmax of 6％producing a rectangular voltage change characteristic twice per

hour will give a P1t of about 0.65.


Page: 81 of 144

c) 7 ％ for equipment which is: － attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment

such as mixers, garden equipment such as lawn mowers, portable tools such as electric drills), or

－ switched on automatically, or is intended to be switched on manually, no more than

twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds) or manual restart, after a power supply interruption.

Pst and P1t requirements shall not be applied to voltage changes caused by manual switching.

7.4. Test Procedure

The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed.



Page: 82 of 144


Test Item Voltage Fluctuation and Flicker

Test Mode MODE 1


Test Result: Pass Status: Test Completed

Psti and limit line European Limits

0.25

0.50

0.75

1.00

Pst

14:4

4:0

2

Plt and limit line

0.10.20.30.40.50.6

Plt

14:4

4:0

2

Parameter values recorded during the test: Vrms at the end of test (Volt): 229.76 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (mS): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.160 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.070 Test limit: 0.650 Pass


Page: 83 of 144

Product MEGA BOOK


Test Mode MODE 2




0.25

0.50

0.75

1.00

Pst

23:0

2:2

7

Plt and limit line

0.10.20.30.40.50.6

Plt

23:0

2:2

7



Page: 84 of 144

Product MEGA BOOK


Test Mode MODE 3




0.25

0.50

0.75

1.00

Pst

23:2

5:3

2

Plt and limit line

0.10.20.30.40.50.6

Plt

23:2

5:3

2



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7.7. Test Photograph Test Mode : MODE 1 Description : Flicker Test Setup

Test Mode : MODE 2 Description : Flicker Test Setup


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Test Mode : MODE 3 Description : Flicker Test Setup


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8. Electrostatic Discharge

8.1. Test Specification According to Standard : IEC 61000-4-2

8.2. Test Setup

8.3. Limit

Item Environmental Phenomena

Units Test Specification Performance Criteria

Enclosure Port

Electrostatic Discharge kV(Charge Voltage) ±8 Air Discharge ±4 Contact Discharge

B


Page: 88 of 144

8.4. Test Procedure

Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT.

Indirect application of discharges to the EUT:

Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point.

8.5. Deviation from Test Standard

No deviation.


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Test Item Electrostatic Discharge

Test Mode MODE 1


Item Amount of Discharge

Voltage Required Criteria

Complied To Criteria (A,B,C)

Results

Air Discharge 10

10

+8kV

-8kV

B

B

B

B

Pass

Pass

Contact Discharge 25

25

+4kV

-4kV

B

B

B

B

Pass

Pass

Indirect Discharge

(HCP)

50

50

+4kV

-4kV

B

B

B

B

Pass

Pass

Indirect Discharge

(VCP Front)

50

50

+4kV

-4kV

B

B

B

B

Pass

Pass

Indirect Discharge

(VCP Left)

50

50

+4kV

-4kV

B

B

B

B

Pass

Pass

Indirect Discharge

(VCP Back)

50

50

+4kV

-4kV

B

B

B

B

Pass

Pass

Indirect Discharge

(VCP Right)

50

50

+4kV

-4kV

B

B

B

B

Pass

Pass

Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement

Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information

EUT stopped operation and could / could not be reset by operator at kV. No false alarms or other malfunctions were observed during or after the test.

Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points.


Page: 90 of 144

Product MEGA BOOK


Test Mode MODE 2





Results

Air Discharge 10

10

+8kV

-8kV

B

B

B

B

Pass

Pass


25

+4kV

-4kV

B

B

B

B

Pass

Pass

Indirect Discharge

(HCP)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Front)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Left)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Back)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Right)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass






Page: 91 of 144

Product MEGA BOOK


Test Mode MODE 3





Results

Air Discharge 10

10

+8kV

-8kV

B

B

B

B

Pass

Pass


25

+4kV

-4kV

B

B

B

B

Pass

Pass

Indirect Discharge

(HCP)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Front)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Left)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Back)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Right)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass






Page: 92 of 144

8.7. Test Photograph

Test Mode : MODE 1 Description : ESD Test Setup



Page: 93 of 144



Page: 94 of 144

9. Radiated Susceptibility


9.2. Test Setup

9.3. Limit


Units Test Specification

Performance Criteria

Enclosure Port

Radio-Frequency Electromagnetic Field Amplitude Modulated

MHz V/m(Un-modulated, rms)% AM (1kHz)

80-1000 3 80

A


Page: 95 of 144

9.4. Test Procedure

The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with one coincident with the calibration plane such that the distance from antenna to the EUT was 3 meters. Both horizontal and vertical polarization of the antenna and four sides of the EUT are set on measurement. In order to judge the EUT performance, a CCD camera is used to monitor EUT screen.

All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 3 V/m Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 80MHz - 1000MHz 4 Dwell Time 3 Seconds 5. Frequency step size ∆ f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s


No deviation.


Page: 96 of 144


Test Item Radiated susceptibility

Test Mode MODE 1

Date of Test 2006/08/31 Test Site Chamber5

Frequency (MHz)

Position (Angle)

Polarity (H or V)

Field Strength

(V/m)

Required Criteria


Results

80-1000 FRONT H 3 A A PASS

80-1000 FRONT V 3 A A PASS

80-1000 BACK H 3 A A PASS

80-1000 BACK V 3 A A PASS

80-1000 RIGHT H 3 A A PASS

80-1000 RIGHT V 3 A A PASS

80-1000 LEFT H 3 A A PASS

80-1000 LEFT V 3 A A PASS

80-1000 UP H 3 A A PASS

80-1000 UP V 3 A A PASS

80-1000 DOWN H 3 A A PASS

80-1000 DOWN V 3 A A PASS

Note:

The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report.


There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at V/m

at frequency MHz. No false alarms or other malfunctions were observed during or after the test.


Page: 97 of 144

Product MEGA BOOK


Test Mode MODE 2


Frequency (MHz)

Position (Angle)

Polarity (H or V)

Field Strength

(V/m)

Required Criteria


Results









80-1000 UP H 3 A A PASS

80-1000 UP V 3 A A PASS



Note:






Page: 98 of 144

Product MEGA BOOK


Test Mode MODE 3


Frequency (MHz)

Position (Angle)

Polarity (H or V)

Field Strength

(V/m)

Required Criteria


Results









80-1000 UP H 3 A A PASS

80-1000 UP V 3 A A PASS



Note:






Page: 99 of 144

9.7. Test Photograph Test Mode : MODE 1 Description : Radiated Susceptibility Test Setup

Test Mode : MODE 2 Description : Radiated Susceptibility Test Setup


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Test Mode : MODE 3 Description : Radiated Susceptibility Test Setup


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10. Electrical Fast Transient/Burst


10.2. Test Setup

10.3. Limit Item Environmental

PhenomenaUnits Test Specification Performance

Criteria I/O and communication ports Fast Transients Common Mode

kV (Peak) Tr/Th ns Rep. Frequency kHz

+0.5 5/50 5

B

Input DC Power Ports Fast Transients Common Mode


+0.5 5/50 5

B

Input AC Power Ports Fast Transients Common Mode


+1 5/50 5

B


Page: 102 of 144

10.4. Test Procedure The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on the table, and uses a 0.1m insulation between the EUT and ground reference plane. The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and projected beyond the EUT by at least 0.1m on all sides. Test on I/O and communication ports: The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1minute. Test on power supply ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT/B interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 minute. The length of the signal and power lines between the coupling device and the EUT is 0.5m.



Page: 103 of 144


Test Item Electrical fast transient/burst

Test Mode MODE 1


Inject Line

Polarity Voltage

kV

Inject Time

(Second)

Inject Method

RequiredCriteria

Complied to

Criteria Result

L+N+PE ± 1kV 60 CDN B A PASS

LAN ± 0.5 kV 90 Clamp B A PASS

Telecom ± 0.5 kV 90 Clamp B A PASS

Note:


Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information

EUT stopped operation and could / could not be reset by operator at kV of Line .

No false alarms or other malfunctions were observed during or after the test.


Page: 104 of 144

Product MEGA BOOK


Test Mode MODE 2


Inject Line

Polarity Voltage

kV

Inject Time

(Second)

Inject Method

RequiredCriteria

Complied to

Criteria Result




Note:






Page: 105 of 144

Product MEGA BOOK


Test Mode MODE 3


Inject Line

Polarity Voltage

kV

Inject Time

(Second)

Inject Method

RequiredCriteria

Complied to

Criteria Result




Note:






Page: 106 of 144

10.7. Test Photograph Test Mode : MODE 1 Description : EFT/B Test Setup

Test Mode : MODE 1 Description : EFT/B Test Setup-Clamp


Page: 107 of 144

Test Mode : MODE 2 Description : EFT/B Test Setup



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Test Mode : MODE 3 Description : EFT/B Test Setup



Page: 109 of 144

11. Surge


11.2. Test Setup

11.3. Limit Item Environmental Phenomena Units Test Specification Performance

Criteria Signal Ports and Telecommunication Ports(See 1) and 2) ) Surges Line to Ground

Tr/Th us kV

1.2/50 (8/20) ± 1 B

Input DC Power Ports Surges Line to Ground

Tr/Th us kV

1.2/50 (8/20) ± 0.5 B

AC Input and AC Output Power Ports Surges Line to Line Line to Ground

Tr/Th us kV kV

1.2/50 (8/20) ± 1 ± 2

B

Notes:

1) Applicable only to ports which according to the manufacturer’s may directly to outdoor cables.

2) Where normal functioning cannot be achieved because of the impact of the CDN on the EUT, no immunity test shall be required.


Page: 110 of 144

11.4. Test Procedure The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The length of power cord between the coupling device and the EUT shall be 2m or less. For Input and Output AC Power or DC Input and DC Output Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the Surge interference signal. The surge noise shall be applied synchronized to the voltage phase at 00, 900, 1800, 2700 and the peak value of the a.c. voltage wave. (Positive and negative) Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with interval of 1 min.


No deviation.


Page: 111 of 144


Test Item Surge

Test Mode MODE 1


Inject Line

Polarity Angle Voltage

kV

Time Interval

(Second)

Inject Method

Required Criteria

Complied to

Criteria Result

L-N ± 0 1kV 60 Direct B A PASS




L-PE ± 0 2kV 60 Direct B A PASS




N-PE ± 0 2kV 60 Direct B A PASS




Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information




Page: 112 of 144

Product MEGA BOOK

Test Item Surge

Test Mode MODE 2


Inject Line


kV

Time Interval

(Second)

Inject Method

Required Criteria

Complied to

Criteria Result

















Page: 113 of 144

Product MEGA BOOK

Test Item Surge

Test Mode MODE 3


Inject Line


kV

Time Interval

(Second)

Inject Method

Required Criteria

Complied to

Criteria Result

















Page: 114 of 144

11.7. Test Photograph Test Mode : MODE 1 Description : SURGE Test Setup

Test Mode : MODE 2 Description : SURGE Test Setup


Page: 115 of 144

Test Mode : MODE 3 Description : SURGE Test Setup


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12. Conducted Susceptibility


12.2. Test Setup CDN Test Mode

EM Clamp Test Mode


Page: 117 of 144

12.3. Limit

Item Environmental Phenomena Units Test Specification


Signal Ports and Telecommunication Ports Radio-Frequency Continuous Conducted

MHz V (rms, Un-modulated) % AM (1kHz)

0.15-80 3 80 A

Input DC Power Ports Radio-Frequency Continuous Conducted


0.15-80 3 80 A

Input AC Power Ports Radio-Frequency Continuous Conducted


0.15-80 3 80 A

12.4. Test Procedure

The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground reference plane. For Signal Ports and Telecommunication Ports The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT. For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 130dBuV(3V) Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 0.15MHz – 80MHz 4 Dwell Time 3 Seconds 5. Frequency step size ∆ f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s



Page: 118 of 144


Test Item Conducted susceptibility

Test Mode MODE 1


Frequency

Range

(MHz)

Voltage Applied dBuV(V)

Inject Method

Tested Port of

EUT

Required Criteria


Complied To

Result

0.15~80 130 (3V) CDN AC IN A A PASS

0.15~80 130 (3V) CDN LAN A A PASS

0.15~80 130 (3V) CDN Telecom A A PASS

Note:



EUT stopped operation and could / could not be reset by operator at dBuV(V) at frequency MHz.

No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test.


Page: 119 of 144

Product MEGA BOOK


Test Mode MODE 2


Frequency

Range

(MHz)


Inject Method

Tested Port of

EUT

Required Criteria


Complied To

Result


0.15~80 130 (3V) CDN LAN A A PASS


Note:






Page: 120 of 144

Product MEGA BOOK


Test Mode MODE 3


Frequency

Range

(MHz)


Inject Method

Tested Port of

EUT

Required Criteria


Complied To

Result


0.15~80 130 (3V) CDN LAN A A PASS


Note:






Page: 121 of 144

12.7. Test Photograph Test Mode : MODE 1 Description : Conducted Susceptibility Test Setup

Test Mode : MODE 1 Description : Conducted Susceptibility Test Setup-CDN


Page: 122 of 144

Test Mode : MODE 2 Description : Conducted Susceptibility Test Setup



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Test Mode : MODE 3 Description : Conducted Susceptibility Test Setup



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13. Power Frequency Magnetic Field


13.2. Test Setup

13.3. Limit Item Environmental

Phenomena Units Test Specification Performance

Criteria Enclosure Port Power-Frequency

Magnetic Field Hz A/m (r.m.s.)

50 1

A


The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured at least 1m*1m min. The test magnetic field shall be placed at central of the induction coil. The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT.

And the induction coil shall be rotated by 90° in order to expose the EUT to the test field with different orientation (X, Y, Z Orientations).



Page: 125 of 144


Test Item Power frequency magnetic field

Test Mode MODE 1


Polarization Frequency (Hz)

Magnetic Strength

(A/m)

Required Performance

Criteria


Complied To

Test Result

X Orientation 50 1 A A PASS

Y Orientation 50 1 A A PASS

Z Orientation 50 1 A A PASS





Page: 126 of 144

Product MEGA BOOK


Test Mode MODE 2



Magnetic Strength

(A/m)


Criteria


Complied To

Test Result








Page: 127 of 144

Product MEGA BOOK


Test Mode MODE 3



Magnetic Strength

(A/m)


Criteria


Complied To

Test Result








Page: 128 of 144

13.7. Test Photograph Test Mode : MODE 1 Description : Power Frequency Magnetic Field Test Setup

Test Mode : MODE 2 Description : Power Frequency Magnetic Field Test Setup


Page: 129 of 144

Test Mode : MODE 3 Description : Power Frequency Magnetic Field Test Setup


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14. Voltage Dips and Interruption


14.2. Test Setup

14.3. Limit


Units Test Specification Performance Criteria

Input AC Power Ports

% Reduction Period

30 25

C Voltage Dips

% Reduction Period

>95 0.5

B

Voltage Interruptions % Reduction Period

> 95 250

C


Page: 131 of 144


The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The power cord shall be used the shortest power cord as specified by the manufacturer. For Voltage Dips/ Interruptions test: The selection of test voltage is based on the rated power range. If the operation range is large than 20% of lower power range, both end of specified voltage shall be tested. Otherwise, the typical voltage specification is selected as test voltage. The EUT is connected to the power mains through a coupling device that directly couples to the Voltage Dips and Interruption Generator. The EUT shall be tested for 30% voltage dip of supplied voltage and duration 25 Periods, for 95% voltage dip of supplied voltage and duration 0.5 Periods with a sequence of three voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied voltage and duration 250 Periods with a sequence of three voltage interruptions with intervals of 10 seconds. Voltage phase shifting are shall occur at 00, 450, 900 ,1350 ,1800 ,2250, 2700 ,3150 of the voltage.



Page: 132 of 144


Test Item Voltage dips and interruption

Test Mode MODE 1


Voltage Dips and

Interruption Reduction(%)

Angle Test Duration (Periods)


Criteria


Complied To

Test Result

30(161V) 0 25 C A PASS 30(161V) 45 25 C A PASS 30(161V) 90 25 C A PASS 30(161V) 135 25 C A PASS 30(161V) 180 25 C A PASS 30(161V) 225 25 C A PASS 30(161V) 270 25 C A PASS 30(161V) 315 25 C A PASS >95(0V) 0 0.5 B A PASS >95(0V) 45 0.5 B A PASS >95(0V) 90 0.5 B A PASS >95(0V) 135 0.5 B A PASS >95(0V) 180 0.5 B A PASS >95(0V) 225 0.5 B A PASS >95(0V) 270 0.5 B A PASS >95(0V) 315 0.5 B A PASS >95(0V) 0 250 C A PASS >95(0V) 45 250 C A PASS >95(0V) 90 250 C A PASS >95(0V) 135 250 C A PASS >95(0V) 180 250 C A PASS >95(0V) 225 250 C A PASS >95(0V) 270 250 C A PASS >95(0V) 315 250 C A PASS


The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kV

of Line . No false alarms or other malfunctions were observed during or after the test. The acceptance

criteria were met, and the EUT passed the test.


Page: 133 of 144

Product MEGA BOOK


Test Mode MODE 2


Voltage Dips and




Criteria


Complied To

Test Result







Page: 134 of 144

Product MEGA BOOK


Test Mode MODE 3


Voltage Dips and




Criteria


Complied To

Test Result







Page: 135 of 144

14.7. Test Photograph Test Mode : MODE 1 Description : Voltage Dips Test Setup

Test Mode : MODE 2 Description : Voltage Dips Test Setup


Page: 136 of 144

Test Mode : MODE 3 Description : Voltage Dips Test Setup


Page: 137 of 144

15. Attachment EUT Photograph

(1) EUT Photo

(2) EUT Photo


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(3) EUT Photo

(4) EUT Photo


Page: 139 of 144

(5) EUT Photo

(6) EUT Photo


Page: 140 of 144

(7) EUT Photo

(8) EUT Photo


Page: 141 of 144

(9) EUT Photo

(10) EUT Photo


Page: 142 of 144

(11) EUT Photo

(12) EUT Photo


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(13) EUT Photo

(14) EUT Photo


Page: 144 of 144

(15) EUT Photo