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Challenging convention – outperforming expectations
The Analytical X-ray Company
Epsilon 3x spEctromEtErs
Ultimate light-element performance
Simple, accessible elemental analysis
Ready for any sample
Epsilon 3x spEctromEtErs
Built upon the experience and success of their predecessors, Epsilon 3X instruments are benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometers, powered by the latest advances in excitation and detection technology. Designed to be reliable and simple to operate, they have outstanding analytical performance, right across the periodic table.
Enhanced by a variety of software modules, for state-of-the-art standardless analysis, oil analysis, rapid identification fingerprinting, multi-layer analysis or regulatory compliance, Epsilon 3X spectrometers are affordable, highly flexible analytical tools suitable for a wide range of applications.
Epsilon 3X and Epsilon 3XLE versions
• High sensitivity through smart design of excitation and detection
• Market-leading light-element performance• X-ray safety assured• Full data traceability• Regulatory compliance• Unattended batch analysis• Worldwide on-line support• Highly flexible analytical tools suitable for a wide
range of applications: - Epsilon 3X – used for elemental analysis (Na - Am) in
areas from R&D through to process control - Epsilon 3XLE – used for higher sample throughput
with improved and extended light element capabilities (C – Am)
Material characterization through chemical analysis is usually part of a more complex activity undertaken by a researcher or process and quality control engineer. The simplicity with which the Epsilon 3X spectrometers can be operated, installed and maintained frees the professional to focus on other important tasks.
Measure in your own language
1. Load your sample
2. Select required method
3. Enter relevant sample information
4. Just click Measure 测量 測定 Mesurer Messung Mesure Zmierzyć Medida Измерить Médir
Epsilon 3X spectrometers can handle a large variety of sample types; including solids, pressed and loose powders, liquids and filters, weighing from a few milligrams to larger bulk samples.
Industry solutions
Epsilon 3x spEctromEtErs
Petrochemicals• Compliant with relevant ASTM, ISO and IP norms• Oil-Trace for fuel-biofuel mixtures and wear metals
analysis in lubricating oils• Certified oil and fuels standards from VHG Labs• On-line Performance Testing Program (PTP) for
immediate round robin results• Omnian standardless analysis for unknown samples
Mining & minerals• Rocks, ores and drill cores with max. sample height
of 10 cm• Minerals beneficiation• Material characterization with FingerPrinting• Can be automated for at-line process control• Omnian standardless analysis for unknown samples
Building materials• ASTM C114 and ISO 29581-2 compliant• Process and quality control of cement,
clinker and raw materials• Alternative fuels analysis (AFR)• Fusion-based reference standards (CEMOXI) • Can be automated for at-line process control
Research & education• Quantify any type of sample• Stratos multilayer analysis software• Material characterization with FingerPrinting• Ideal education tool• Omnian standardless analysis for unknown samples• Multiple user walk-up system
Metals• Stratos multi-layer analysis software• Metals sorting with FingerPrinting and PASS/FAIL reporting• Ferrous and non-ferrous analysis• Slag analysis• Omnian standardless analysis for unknown
samples
Food & cosmetics• Quantification of nutrients• Process control of food, animal feed and cosmetics• Robust and accurate quantification of milk powder• PASS/FAIL analysis of incoming goods with FingerPrinting• FDA CFR 21 Part 11 Enhanced Data Security software • Omnian standardless analysis for unknown samples
Plastics and polymers• ASTM F2617 compliant (RoHS 2)• Plastics sorting with FingerPrinting• Additive elements in polyethylene (ADPOL) certified standards• Dedicated solutions for additives and toxic elements in polymers • Heavy metal contaminants in polyethylene (TOXEL) and PVC
certified standards• Restricted toxic elements in polyethylene (RoHS) certified
standards• Omnian standardless analysis for unknown samples
Environmental• Contaminated soils analysis• EPA IO 3-3 Inorganic compounds in ambient air• Waste water analysis• Omnian standardless analysis for unknown
samples
Pharmaceuticals • USP <735> and <233> compliant• Catalyst and metals residues in API and excipients • PASS/FAIL analysis of counterfeit drugs with FingerPrinting• FDA CFR 21 Part 11 Enhanced Data Security software • Installation and operational quantification packages
(IQ and OQ) • Omnian standardless analysis for unknown samples• Multiple user walk-up system
Dedicated industry software options
Epsilon 3x spEctromEtErs
Omnian Oil-Trace
Enhanced Data Security
Stratos
FingerPrint
Advanced standardless analysis
PANalytical’s powerful Omnian software is ideal when there is no conventional calibration established for materials that require analysis. When faced with non-routine samples or materials for which there are no certified reference materials, Omnian provides excellent insight into the elemental composition.
Designed to provide fast and reliable quantification, Omnian’s advanced fundamental parameters (FP) algorithm automatically deals with the analytical challenges posed by samples of widely differing types.
FINGERPRINT
?OMNIAN
STRATOS
OIL-TRACE
Oil-Trace is an innovative package for the challenges often faced in the analysis of oils and petrochemicals. Oil-Trace offers a universal solution for a range of elements in a wide variety of fuel-biofuel mixtures to new and used lubricating oils. Analysts benefit from a simplification of application maintenance and analytical procedure, and from cost savings through the use of simple and relatively inexpensive standards.
For heavily regulated environments like the pharmaceutical industry, the installation and operation of Epsilon 3X spectrometers are strictly prescribed, and the software handling and data security comply with the requirements of the FDA CFR 21 Part 11 regulations.
The Stratos module features an algorithm which enables simultaneous determination of chemical composition and thickness of layered materials. The software provides a rapid, simple and non-destructive means of analyzing coatings, surface layers and multi-layered structures.
Accurate results are achieved by using conventional bulk standards, or reference samples whose composition and layer structure differ from those of the unknowns.
FingerPrint is a material type confirmation routine that uses a rapid statistical analysis of the spectrum for a simple Yes/No answer. Spectra used for the FingerPrint routine can also be used for conventional compositional determination and for a more complete diagnostic analysis.
Analysisstrategy
Known material type Unknown materials
Conventionalcalibration
Standardlessanalysis
DATA SECURITY
!
Increased performance by technology push
1995
High-powerWDXRF
performance
Low-powerWDXRF
performance
EDXRFperformance
Time2000 2005 2011 2014
MiniPal 2
MiniPal
MiniMate
MiniPal 4
Epsilon 3 Epsilon 3X
Epsilon 3 XL
Epsilon 3XLE
Relative performance of benchtop spectrometers over time
Well-defined fluorescent peak from 85% carbon in a polymer sample. Ultra- thin windows on both X-ray tube and detector enable carbon, nitrogen, oxygen and fluorine analysis with Epsilon 3XLE.
Combining the latest excitation and detection technology with a smart design, the analytical performance of Epsilon 3XLE moves closer to that of larger, more powerful spectrometers. Selective excitation and careful matching of the X-ray tube output to the capabilities of the detection system underlie system performance.
ExcitationA high-performance, metal-ceramic X-ray tube has been specially developed for the Epsilon 3X spectrometers at PANalytical’s tube manufacturing facility. A choice of anode materials (Rh, Ag or Mo), flexible voltage settings from 4.0 to 50 kV and a maximum current setting of 3.0 mA can be used to define optimum application-specific excitation conditions across the periodic table.
DetectionEpsilon 3X spectrometers are equipped with the latest in silicon drift detector technology. Pulse reset electronics give a linear count rate capacity to over 200,000 cps and a count rate independent resolution typically better than 135 eV for better separation of analytical lines in the spectrum.
The SDDUltra silicon drift detector fitted in Epsilon 3XLE enables ultra-light element analysis of even carbon, nitrogen and oxygen.
Advantages of XRF
XRF spectroscopy does not require sample dissolution. By avoiding the potential for inaccuracies caused by incomplete dissolution, the complete analysis offered by XRF helps to ensure the accuracy and reliability of results.
• Non-destructive• Suitable for solids, liquids and powders• Simple, fast and safe sample preparation• Accurate, highly reproducible data• No need for daily re-calibration• Wide analytical concentration range (from a few ppm
to 100%)• Very low running costs• Accurate, precise and reliable analysis
Fluorine analysis in fluorite, prepared as fused beads
Epsilon 3x spEctromEtErs
F concentration (wt%)
Co
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inte
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ty
2.0 2.4 2.8 3.2 3.6 4.0 4.4 4.8
Quick and easy sample preparation
Quality data through mature software
Powders Solids Liquids
Compared to other analytical techniques XRF requires littleor no sample preparation.
Epsilon 3X spectrometers can handle a large variety of sample types weighing from a few milligrams to larger bulk samples. Samples can be measured as:
• Solids • Slurries• Pressed powders • Granules• Loose powders • Filters• Liquids • Films and coatings• Fused beads
Larger samples
Measure unprepared samples, large or irregularly shaped objects - in complete safety - no open source high-energy X-rays
Accurate and precise data are obtained through advanced spectrum processing and state-of-the-art correction and quantification algorithms.
• Accurate intensities through unmatched spectrum deconvolution
• Automatic line-overlap and matrix corrections • Constant read-out of temperature and air pressure sensors
in software• Easy application setup and condition optimizer • Software available in many languages
Epsilon 3x spEctromEtErs
Access to expertise PANassist
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PANalytical B.V.Lelyweg 1, 7602 EA AlmeloP.O. Box 13, 7600 AA AlmeloThe NetherlandsT +31 (0) 546 534 444F +31 (0) 546 534 598 [email protected]
Regional sales officesAmericasT +1 508 647 1100 F +1 508 647 1115
Europe, Middle East, AfricaT +31 (0) 546 834 444 F +31 (0) 546 834 969
Asia PacificT +65 6741 2868 F +65 6741 2166
Global and near
With the largest service network we are able to offer the most comprehensive support package possible.
Expertise:• On-site training• XRF training courses• Performance optimization• Customizable expertise programs• Assistance with multi-laboratory standardization
PANassist provides fast, secure and reliable remote support. Wherever you are in the world, we can troubleshoot and monitor the performance of your Epsilon 3X spectrometers.
We offer:• Detailed remote diagnostics data• Real-time spectrum• Remote monitoring• Application support• History logging• Performance analysis• Remote firmware updates• Interface for a worldwide
performance monitoring system
PANalytical PANalytical is one of the world’s leading suppliers of analytical instrumentation and software for X-ray diffraction (XRD) and X-ray fluorescence spectrometry (XRF). The materials characterization equipment is used for scientific research and development, for industrial process control applications and for semiconductor metrology.
During the last decade PANalytical has added a variety of other analysis techniques to their product portfolio. Optical emission spectrometry (OBLF GmbH, Germany), pulsed fast thermal neutron activation (Sodern, France) and near-infrared (ASD Inc.) capabilities together with XRD and XRF can provide customers with tailor-made analytical solutions for the characterization of a wide range of products such as cement, metals, nanomaterials, polymers and many more.
PANalytical’s headquarters are in Almelo, the Netherlands. Fully equipped application laboratories are established in Japan, China, the USA, and the Netherlands. PANalytical’s research activities are based in Almelo (NL) and on the campus of the University of Sussex in Brighton (UK). Supply and competence centers are located on two sites in the Netherlands: Almelo (development and production of X-ray instruments) and Eindhoven (development and production of X-ray tubes) and in Boulder, USA (development and production of near-infrared instruments). A sales and service network in more than 60 countries ensures unrivalled levels of customer support. The company is certified in accordance with ISO 9001 and ISO 14001.
Visit our website at www.panalytical.com for more information about our activities.
PANalytical is part of Spectris plc, the productivity-enhancing instrumentation and controls company.
www.panalytical.com/epsilon3xspectrometers
