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DATA SHEET SURFACE CHARACTERIZATION WORKSTATION

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Page 1: DATA SHEET SURFACE CHARACTERIZATION WORKSTATION

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DATA SHEET

SURFACE CHARACTERIZATION WORKSTATION

ALTISURF®

50

Page 2: DATA SHEET SURFACE CHARACTERIZATION WORKSTATION

Data sheet ALTIMET 2/5 Latest update: 05/03/07 Ref.: DTA50

AltiSurf® 50 SURFACE STATEMENTS WORKSTATION

Altisurf® 50 TV is a portable non-contact measurement system, developed to read accurately component surfaces. It measures several profiles, which, automatically put together, allow rebuilding the morphology of the sample. Then a post-treatment software enables to apply analysis parameters such as roughness, tribology, forms and dimensions as well as topographic phenomenon.

For example, the Altisurf® 50 TV measures flatness, surface statements, step heights, outcrops... Our workstation enables accurate analysis of the relations between material micro-morphology and coating (varnish, painting...) in order to characterize adherence, ageing, porosity, mechanical strength...

The optical sensor measures the height of a single point at a given moment while the built-in sliding tables move the Altiprobe® to scan the area to be measured.

Piloting control centre The piloting control centre converts the user's command into a measure. It has an artificial intelligence thanks to the microcontrollers. That configuration allows a simultaneous use: analysing a surface with AltiMap® while measuring another sample.

The measurement module It consists in a portable module (less than 5 kg). The 3 DC motorized tables (on X, Y, Z) enable free movements of the AltiProbe® and an optimal scanning of the sample. The sensor is attached to a sliding table on the Z axis, which focuses on the sample.

The equipment is laid on the sample (i.e.: a printing cylinder). Four feet made out of elastomer and adaptable to the support keep the module in position and the control panel defines the measures to be done.

Sensors

• A high definition AltiProbe® white light sensor can be chosen among our range:

Measurement range 130 µm 400 µm 1.2 mm 3.5 mm

Page 3: DATA SHEET SURFACE CHARACTERIZATION WORKSTATION

Data sheet ALTIMET 3/5 Latest update: 05/03/07 Ref.: DTA50

The Software (compatible with Windows XP)

AltiSurf®: Piloting and data acquisition software. It is featured with a user-friendly interface for the programming of the measurement protocols, including:

• Measures with heights taken into account during a given time: measurement of a dynamic fluctuation height such as drying, hydration or absorption of a paper surface, ink…

• The metrological functions of calibration in accordance with the COFRAC standards for, among others, probes linearization and offsets positioning controls

AltiMap®: Arisen from Mountains®, AltiMap® is the industry leading topography software, offering a wide range of analysis tools in accordance with the international standards, integrated in a really user-friendly interface:

• 2D roughness analysis

• Roughness, waviness, form, step height, depth distribution and Abbott-Firestone curve, spectral analysis, distance measurement, form and Boolean removal, roughness parameters: Ra, Rt, Rp, Rv...

• 3D surface characterization and topographic analysis: shaded visualization, texture directions, isotropy/anisotropy, Fast Fourier Transform, spectral density, autocorrelation, angles and dimensions, 3D modelling, fractal studies, 3D parameters...

• Form analysis and micro-dimensions in Z

• 2D (contour) or 3D form deviations (flatness, volume, radius calculation, spheres, cylinders or polynoms which best fit the surface, cuts, surface subtraction, step heights...)

• PaperMap® is a specific software adapted to the measurement and the analysis of paper surfaces (papers, printings, plates...).

Surface statement 3D topographic analysis

2D profilometry Form analysis in Z

Page 4: DATA SHEET SURFACE CHARACTERIZATION WORKSTATION

Data sheet ALTIMET 4/5 Latest update: 05/03/07 Ref.: DTA50

TECHNICAL DATA

Dimensions

• Total height : 250 mm

• Weight : approx. 4 kg

• Width : 140 mm

• Depth : 300 mm

Sliding tables

• Technology: DC motor

• The X table is above the Y table

• For the set up to the origin, the three tables feature electronic detections at their extremities

• Transversal length: 25 mm (Y) by 25 mm (X) (usable length: 20 x 20 mm)

• Motorized column: 25 mm (Z)

• Min. pitch: X: 0.5 µm ; Y: 0,5 µm

• Max. measurement speed (X): 5000 µm / s The workstation is provided with a calibration reading and a probe-axis resolution statement; checked during the settings.

The AltiProbe® optical sensor

• Optic principle: chromatic light aberration with a halogen source or a diode

• Dynamic range: from 130 µm to 3.5 mm

• Vertical resolution: from 5 to 75 nm

• Linearity: less than +/- 0.1 %

• Max. Working speed: 1000 Hz (can be up-graded to 4000 Hz depending on the CHR)

• Light source: halogen lamp, 50 watts (intern) or LED

AltiProbe® is composed of an optical brush, an optical fibre jumper lead and an optoelectronic measurement box (CHR). The brush is totally passive as it has neither a heat source, nor any moving part. The optical fibre is the link between the optical brush and the box.

The optoelectronic box integers the light source and converts the luminous signals from the optical brush, calculates the distance thanks to an on-board DSP chip, transmits the data through a RS232 serial link and insures the display functions.

Using the long field stratigraphy optic principle, Altiprobe® is capable of measuring all kinds of surfaces or coating thicknesses.

Page 5: DATA SHEET SURFACE CHARACTERIZATION WORKSTATION

Data sheet ALTIMET 5/5 Latest update: 05/03/07 Ref.: DTA50

Altiprobe® has been created so that several optical brushes can be used. They have different resolutions, depths of field, and working distances between the brush and the object.

Operating mode

A white light spot scans (on the return stroke as well) the surface through a lens with an axial chromatic aberration (deformation).

Instead of focusing on a single point, the lens acts as a prism and separates the wave lengths which all match with a point of the measuring range. The perfect focus of a wave length (the one with the most light intensity after spatial filtering) gives the maximal peak, which, converted by a CCD spectrometer, determines the height of a point, here called M:

Sum up…

Different wave lengths match with different heights.

The wave with the best reflection shows the exact height of the M point.

S: white light

Semi-reflecting lens

Signal Surface

M point