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DB/DAQ – to implement: • …. still working on direct connection with Labview set-up • obtain list of batches from DB • get list of SSD in selected batch from DB (we had 3 cases of batchID-SSDID mismatch) • pop-up message with last SSD tested • recover possibility of saving image from dimensional test set-up Statistics 433 tests (dimensional and/or electrical) 334 geometrical – 258 electrical • almost doubled rate of geometrical tests (still margin with chuck)

DB/DAQ – to implement: …. still working on direct connection with Labview set-up obtain list of batches from DB get list of SSD in selected batch from

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Page 1: DB/DAQ – to implement: …. still working on direct connection with Labview set-up obtain list of batches from DB get list of SSD in selected batch from

DB/DAQ – to implement:• …. still working on direct connection with Labview set-up• obtain list of batches from DB• get list of SSD in selected batch from DB (we had 3 cases of batchID-SSDID mismatch)• pop-up message with last SSD tested• recover possibility of saving image from dimensional test set-up

Statistics• 433 tests (dimensional and/or electrical)• 334 geometrical – 258 electrical• almost doubled rate of geometrical tests (still margin with chuck)

Page 2: DB/DAQ – to implement: …. still working on direct connection with Labview set-up obtain list of batches from DB get list of SSD in selected batch from

Suggestions for operators:• write E/G on envelope after test• better storage (e.g. label boxes with batch ID content)• non-conformances analysis

Corner names mistake

A

BC

D

the change will be transparent to the user – you just will be prompted on corner D instead of A

Page 3: DB/DAQ – to implement: …. still working on direct connection with Labview set-up obtain list of batches from DB get list of SSD in selected batch from

List of all non-conformances up to 31/01/02SSD_ID batch operator 'date' test flag 'note'

DH00519 SWX60699Alessandro Brez 21-Oct-01 IV 3 scratch - large on bias ring - high current

DH00557 SWX60700 Gloria Spandre 29-Nov-01 IV 2 presence of particulateDH00560 SWX60700 Gloria Spandre 29-Nov-01 IV 2 presence of particulateDH00567 SWX60700

Francesco Zetti 29-Nov-01 IV 2 scratch - small on pad

DH00593 SWX60702 Nicola Omodei 30-Nov-01 IV 2 scratch - small on padDH00609 SWX60702 Luca Latronico 03-Dec-01 IV 2 scratch - barely visibleDH00627 SWX60702

Johann Cohen-Tanugi 04-Dec-01 IV 2 irregular IV curve

DH00764 SWX60733 Gloria Spandre 05-Dec-01 IV 2 irregular IV curveDH00732 SWX60709

Johann Cohen-Tanugi 06-Dec-01 dimensional 2 weird bias ring at A corner

DH00736 SWX60709Johann Cohen-Tanugi 06-Dec-01 dimensional 3 broken edge

DH00791 SWX60734 Michael Kuss 07-Dec-01 IV 2 irregular IV curveDH00798 SWX60734 Nicola Omodei 07-Dec-01 IV 2 irregular IV curveDH00810 SWX60734

Johann Cohen-Tanugi 22-Jan-02 IV 3 sparks after bad probe handling yet IV curve looks fine

DH00811 SWX60734Johann Cohen-Tanugi 22-Jan-02 IV 2

Curve is ugly but within specifications leakage current is twice the value for same batch

DH00805 SWX60734 Gloria Spandre 24-Jan-02 IV 2 presence of particulate identified as AlDH00809 SWX60734 Gloria Spandre 24-Jan-02 IV 2 scratch from bias pad to outer edgeDH00826 SWX60735 Gloria Spandre 24-Jan-02 IV 2 IV irregular high I but within specsDH00668 swx60703

Luisella Vigiani 25-Jan-02 dimensional 2 scratch little on the corner B

DH00674 swx60708Luisella Vigiani 25-Jan-02 dimensional 2 scratch little on the corner B

DH00828 SWX60735 Michael Kuss 25-Jan-02 IV 2 IV irregular breakdown below 200VDH00838 SWX60735 Nicola Omodei 25-Jan-02 IV 2 IV irregular 300nA at 200VDH00858 SWX60735 Luca Latronico 26-Jan-02 IV 2 IV curve irregularities I twice than usuallyDH00896 SWX60736 Luca Baldini 28-Jan-02 dimensional 2 ID mismatchDH00897 SWX60736 Luca Baldini 28-Jan-02 dimensional 2 ID mismatchDH00915 SWX60737 Nicola Omodei 29-Jan-02 dimensional 2 presence of particulateDH00949 SWX60742 Luca Baldini 29-Jan-02 dimensional 2 No SSDID on scratched waferDH00718 SWX60709

Johann Cohen-Tanugi 29-Jan-02 IV 2 Scratches

DH00718 SWX60709Johann Cohen-Tanugi 29-Jan-02 CV 2 Scratches

DH00977 SWX60742Johann Cohen-Tanugi 30-Jan-02 dimensional 2 no Id or very badly etched and non matching

DH00978 SWX60742Johann Cohen-Tanugi 30-Jan-02 dimensional 2 bad ID etching

DH00983 SWX60742Johann Cohen-Tanugi 30-Jan-02 dimensional 2 bad Id

DH00984 SWX60742Johann Cohen-Tanugi 30-Jan-02 dimensional 2 no Id

DH00986 SWX60742Johann Cohen-Tanugi 30-Jan-02 dimensional 2 missing ID

DH00987 SWX60742Johann Cohen-Tanugi 30-Jan-02 dimensional 2 missing Id

Page 4: DB/DAQ – to implement: …. still working on direct connection with Labview set-up obtain list of batches from DB get list of SSD in selected batch from

34 warning/failed test over407 SSD tested (dimensional/electrical or both)

dimensional: 14/308 ~ 4.5%electrical IV: 19/246 ~ 7.7%electrical CV: 1/246 ~ 0

• Should same warning be duplicated for IV and CV tests? (e.g. DH00718 marked as scratched for both tests) -> NO• clarify meaning of irregular IV • clarify meaning of broken edge

…. let’s analyze more in depth to learn how to behave

8.35% non-conformance rate -> a bit conservative?!specifically:

common questions and answers:

Page 5: DB/DAQ – to implement: …. still working on direct connection with Labview set-up obtain list of batches from DB get list of SSD in selected batch from

IV irregularities picture gallery

DH00627 DH00838

quite high (3/4 times average) leakage current

do not report

Page 6: DB/DAQ – to implement: …. still working on direct connection with Labview set-up obtain list of batches from DB get list of SSD in selected batch from

DH00791

DH00858

moderately high (2 times average) leakage current

do not report

IV irregularities picture gallery

Page 7: DB/DAQ – to implement: …. still working on direct connection with Labview set-up obtain list of batches from DB get list of SSD in selected batch from

DH00764 DH00826

Strange/unexpected shape

• redo measurement• report as warning

IV irregularities picture gallery

Page 8: DB/DAQ – to implement: …. still working on direct connection with Labview set-up obtain list of batches from DB get list of SSD in selected batch from

again a strange shape but indeed dangerous (breakdown?)

DH00828

do report a warning

IV irregularities picture gallery

nevertheless within specs, so

Page 9: DB/DAQ – to implement: …. still working on direct connection with Labview set-up obtain list of batches from DB get list of SSD in selected batch from

What’s wrong here?

DH00798

do not report

IV irregularities picture gallery

this reduces non-conformances to 30

Page 10: DB/DAQ – to implement: …. still working on direct connection with Labview set-up obtain list of batches from DB get list of SSD in selected batch from

Scratches

DH00809

• report as warning• check if current increased and is still within specs

Page 11: DB/DAQ – to implement: …. still working on direct connection with Labview set-up obtain list of batches from DB get list of SSD in selected batch from

Scratches

DH00567

scratches on pad produced during testing

should be a random and learning-phase problem

Page 12: DB/DAQ – to implement: …. still working on direct connection with Labview set-up obtain list of batches from DB get list of SSD in selected batch from

• check current• do not report if you see no effect

Scratches

DH00593

Page 13: DB/DAQ – to implement: …. still working on direct connection with Labview set-up obtain list of batches from DB get list of SSD in selected batch from

Labelled as scratches

DH00668

DH00674

learning-phase problem

• report only if bigger • I will add a ‘minor break’ warning option in the menu

Page 14: DB/DAQ – to implement: …. still working on direct connection with Labview set-up obtain list of batches from DB get list of SSD in selected batch from

DH00732

learning-phase problem

Deviations from standard pattern

‘ weird bias ring at corner A’

do not report unless very seriuos (e.g. interrupted or shortened strips - should affect current and coupling – specify)

this reduces non-conformances to 25

Page 15: DB/DAQ – to implement: …. still working on direct connection with Labview set-up obtain list of batches from DB get list of SSD in selected batch from

Problems with IDs

2 ID mismatch -> ID changed on envelope – report?

7 missing or faint scratch-ID -> • report as warning• contact HPK

Should be a problem related to this particular batch