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IJST, Transactions of Electrical Engineering, Vol. 38, No. E1, pp 1-20
Printed in The Islamic Republic of Iran, 2014 © Shiraz University
DESIGN AND IMPLEMENTATION OF PRECISE HARDWARE FOR ELECTRICAL IMPEDANCE TOMOGRAPHY (EIT)*
M. KHALIGHI1** , B. VOSOUGHI VAHDAT2, M. MORTAZAVI3 AND M. MIKAEILI4 1School of Engineering and Science, Sharif University of Technology, International Campus, I. R. of Iran
Email: [email protected] 2School of Engineering and Science, Sharif University of Technology, Tehran, I. R. of Iran
3School of Engineering, Islamic Azad University-Abhar Branch, I. R. of Iran 4Dept. of Engineering, Biomedical Engineering Group, Shahed University, Tehran, I. R. of Iran
Abstract– Electrical Impedance Tomography (EIT), is one of the safest medical imaging technologies and can be used in industrial process monitoring. In this method, image of electrical conductivity (or electrical impedance) distribution of the inner part of a conductive subject can be reconstructed. The image reconstruction process is done by injecting an accurate current into the boundary of a volume conductor (Ω), measuring voltages around the boundary (∂Ω) and transmitting them to a computer, and processing on acquired data with software (e.g. MATLAB). The image would be reconstructed from the measured peripheral data by using an iterative algorithm. A precise instrumentation (EIT hardware) plays a very important and vital role in the quality of reconstructed images. In this paper, we have proposed a practical design of a low-cost precise EIT hardware including, a high output impedance VCCS (Voltage-Controlled Current Source) with pulse generation part, precise voltage demodulator and measuring parts, a high performance multiplexer module, and a control unit. All the parts have been practically and accurately tested with successful results, and finally the proposed design was assembled on PCB. The quality of experimental results at the end of this paper, (reconstructed images by using the implemented system), confirms the accuracy of the proposed EIT hardware.
Keywords– EIT, electrical impedance tomography, EIT hardware, EIT instrumentation, EIT current source
1. INTRODUCTION
Electrical Impedance Tomography (EIT) is a relatively new imaging technique. In this method, an image
of the inner part of a conductive domain (Ω) can be made with an array of external electrodes which are
located on the boundary of domain (∂Ω). In this imaging method, the image of electrical conductivity (or
impedance) distribution of the internal part of a typical conductive subject can be reconstructed [1]. EIT
procedure includes injecting an accurate current into the boundary of domain (∂Ω) via a pair of electrodes,
measuring the boundary voltages by means of other electrodes around the boundary and transmitting them
to a computer, and at the end, processing the acquired data with software (e.g. MATLAB) to reconstruct
the image. Human body tissues contain a wide range of conductivities, and hence the potential exists to
use EIT to carry out medical imaging using the conductivity as the parameter to be mapped [2]. As a matter of fact, EIT is a challenging problem. This technique has some advantages compared to
other methods, including: simplicity of application, no hazard to the patient (such as X-ray), low cost and portable, and the high speed of data collection and image reconstruction [3]. Although EIT systems suffer
Received by the editors January 21, 2013; Accepted May 18, 2014. Corresponding author
IJST, Transac
2
from poor imof unknownquality [4]. algorithms tmost imporReconstructalgorithm [7
This padesign is illthat, some eend, final re
In general, E
EIT-sensors
iterative alg
data acquisi
The precisio
proposed EI
different pa
1- VCCS a VCC
2- Multip3- Contro4- Voltag
The co
(∂Ω) via th
types of pu
waveform.
demodulatio
the electrod
block. Cont
communica
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mage resolutn skin–electrEIT still hasto reconstrucrtant of themted image q7]. aper is focuslustrated andexperiments econstructed
EIT instrum
s and a PC.
gorithm. In o
ition part (to
on of all uni
IT system is
arts:
(Voltage-CoC (Voltage-toplexer modulol unit. ge measurem
onstant and a
he multiplexe
ulse train sim
They can be
on portion. I
des voltage, “
trol unit is ap
ating with the
rical Engineeri
tion, the tranrode impedans technical dct the image
m is hardwarquality main
sed on hardwd explained, done by usiimage of ou
Fig. 1. The ma
2. TO
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The image i
ur design, th
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nsfer impedannce on measudifficulty in ts. However, re improvem
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ain block diag
OP VIEW O
mprises digita
is finally rec
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8, Number E1
nces must sturement erroterms of devthere are so
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OF PROPOS
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er” blocks sh
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. The assemb
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ill be measurors can also hveloping hardome methodsquire a high-undary data
EIT. First ofsign will be tem and thei
mpared with
sed EIT hardw
SED DESIG
g circuits, an
from the acq
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cision). The
onstructed im
ram of the pr
udes a VCOgenerator.
ulator and a v
CCS is injec
f the current
positive pea
ginary section
oltage, mean
hould be app
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red with highhave a signifdware for das to improve-accuracy me
accuracy an
f all, the top described in
ir results wilother works.
ware design
GN
n array of ele
quired data (
es an accurat
digital part
mage quality
roposed EIT
O as a wavefo
voltmeter.
cted into the
source sect
aks and zero
ns of measur
ning demodu
plied respecti
d measurem
dware is sho
h accuracy. Tficant effect
ata acquisitioe imaging queasured datund the recon
view of our n detail as wll be presente.
ectrodes whi
voltages) by
te current sou
contains con
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hardware (F
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e boundary o
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red voltage i
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ively after m
ent parts, an
wn in Fig. 2
June 2014
The effect on image
on and the uality. The um [5, 6]. nstruction
proposed well. After ed. At the
ich acts as
y using an
urce and a
ntrol unit.
iew of the
Fig. 1) has
or, a filter,
of domain
rating two
he current
in voltage
measuring
multiplexer
nd also for
.
June 2014
Electrical Imfrequency rcurrent is topositive andVCCS usedparts. Desigprecision, wsystems in mdigital or anoutput waveideal voltagaddition, thimpedance, range of losource can a
The cu10KHz andmust be in tsatisfy the a(Voltage-Cofilters in ser
a) Wavefor
Schema(EXAR Inc
mpedance Trange and wito use a voltad negative fed in the EIT sgn of the VCwhich means most cases inalog form [eform (i.e. exge source), whe main chara
linearity in oad, and propameliorate th
urrent source d 1MHz and the range of above conditontrolled Osrial connectio
rm generatio
atic circuit o.) has been u
Design
3. VOLTA
omography th a large vaage-controlleeedback arousystems, conC in EIT systhat it must
is the sinusoi[9]. The mainxact sinusoid
wide operatioacteristics foconverting
per workinghe image quain EIT systebe able to s
more than 10tions. Figure
scillator) parton), and a VC
Fig
ion
of the wavefused in the w
n and implemen
I
Fig. 2. Ass
AGE-CONTR
(EIT) systemariation in loaed current sound a high gnsists of wavstems is espehave high ouidal waveforn features fodal waveformonal bandwidor the VCC pvoltage to c
g in a broadality to a certems must be support the 00KΩ as wee 3 shows tht, a ButterwoCC (Voltage
g. 3. Flowchar
form generatwaveform os
ntation of preci
IJST, Transacti
sembled EIT h
ROLLED C
ms require acad impedancource (VCCSain operation
veform generecially imporutput impedarm which is or a typical wm without anydth, and steapart to have
current, precd range of frtain extent [1able to delivload betwee
ell [12], therehe flowchart orth band-pae-to-Current
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tion part is sscillator part
ise hardware fo
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ccurate currece. The simpS), which canal or instrumrator and Vortant. The VCance. Generaproduced by
waveform gey jitter), a lo
ady amplitudan excellen
ision of outprequency [1011]. ver the currenen 100Ω andefore an exceof the propo
ass filter (BuConverter) p
VCCS design
shown in Figt as a VCO.
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SOURCE
ent sources tlest techniqu
an be definedmentation amltage-to-CurrCC part requally, the wavy the wavefoenerator are aw output imp
de over all thnt VCCS are put wavefor0]. The high
nt over a freqd 10KΩ [9]. ellent currentosed VCCS. utterworth lopart.
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that work ovue to obtain ad as a combmplifier [8]. rent Convert
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ver a wide a constant ination of A typical
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XR-2206 placed at
IJST, Transac
4
the output ovalue at thAD844, is a
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In ordeoutput impe250KHz, haoperational design the fcircuit of thpass filter (filter (U4 an
ctions of Electr
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Fig. 5. Bu
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Fig. 4. Voltag
pass filter
n exact wavhe next stageigned and plrange of the er frequencieown in Fig. with cutoff
a cutoff frequ
utterworth Ba
M.
ing, Volume 38
the sinusoidgeneration p
s IC, is about
ge-controlled
veform withoe (VCC), a Blaced betweedesigned EI
es, the Butter5. As it is shfrequency o
uency of 10 K
and-pass filter
Khalighi et al.
8, Number E1
dal waveformpart (measurt 14Ω).
oscillator (wa
out any jitterButterworth en the VCO IT system wrworth coeff
hown, the filtf 250 KHz aKHz that are
r which is put
l.
m and also tred output i
aveform gener
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ould be betwficients have ter consists oand also a fo connected s
between the V
to create a limpedance o
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distortion, ailter Rangingparts of curreween 10 and
been cited iof a fourth-oourth-order Bserially.
VCO and VCC
ow output imof the circui
and also to cg between 10ent source. H
d 250KHz. Inn [13]. The srder ButterwButterworth
C parts
June 2014
mpedance it without
create low 0KHz and Hence the n order to schematic
worth low-high-pass
June 2014
c) Voltage-
The enwere done configuratio VCCS VCCS VCCS VCCS
These
values suchAccording tmodified. Toperational schematic cPSPICE), acomponentsTOA1 circu
Here, if:
We can get:
The ou
7, V1 represmeasured ooptional valan oscillosc
-to-current c
nd structure oto improve
ons of a VCCS based on AS based on DS based on TS based on T
experimentsh as differentto results ofThe main se
band-widthcircuits of d
and their resus value, accouit, (2) should
:
Fig. 6. P
utput impedasents the me
output voltaglue [2]. In orcope, the inpu
Design
converter
of mentionede and modiCS:
AH (AdvanceDOA (Double
OA1 (TripleOA2 (Triple
s were done t resistance vf the primaryelected criteh, and the mdifferent VCults have beeording to thed be satisfied
IL =
Proposed struc
ance Zout of aeasured outpge of R1, whrder to measuut impedance
n and implemen
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d flowchart ify its opera
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with identicvalues, diffey practical teeria in the pminimum anCSs which
en shown in e best resultd and therefo
=
–
IL
cture of the VC
a typical currput voltage oen S is closeure the outpue of the voltm
ntation of preci
IJST, Transacti
is Voltage-toation. Sever
, [14, 15]. al Amplifier)l Amplifier fl Amplifier f
cal VCOs, drent types oests, the besprimary testsnd maximumhave been uAppendix A
t in experimeore IL is calcu
= 0 , or
.
.Vi
CC section, w
rent source cof R1, when ed. RP and Rut impedancemeter (oscillo
–∙
ise hardware fo
tions of Electric
o-Current conral essential
, [16]. form 1), [17]form 2), [9].
different VCCf OP-AMP, t structure os were basem loads thaused in prac
A. Proposed sents is showulated by (3)
R1 . R4 =
with suggested
can be calculthe switch S
R1 are connee and also loaoscope) shou
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nverter (VCCtests were
].
C structures,and also dif
of the VCC ped on the ouat each VCCctical tests astructure of
wn in Fig. 6.).
= R2 . R3
components v
lated by (4). S is opened ected at the ad voltage ofuld be consid
g, Volume 38, N
C), many expdone on f
, different cofferent rangepart was selutput impedCS can suppand simulatithe VCC par For VCCS
values
As it is showand V2 repreoutput of VCf a typical Vdered.
Number E1
5
periments four main
omponent es of load. lected and dance, the port. The ons (with rt with its based on
(1)
(2)
(3)
wn in Fig. esents the CCS with
VCCS with
(4)
IJST, Transac
6
Figure to the circuwhich the Vbe exact sinduring the tImpedance particular frin Fig. 8A. resistor, wh
Fig. 8. (A) ThVCCS, in dioutput voltagwith PSPICE
ctions of Electr
8A shows thuit of Fig. 6. VCCS can sunusoid and ttest. The ampof a current
requency is aThe best va
hich creates h
he curve reprefferent frequege of implemeE in different f
rical Engineeri
Fig. 7. A m
he results of In the curve
upport in a spthe relationshplitude of lot source depalso restrictelue for R1 to
higher output
esents the ranencies and difented VCCS ifrequencies
M.
ing, Volume 38
method for mea
f other practice, Maximumpecific frequhip of the in
oad current wends on inved by the valu
o R4 was selet impedance
nges of maximfferent values in different fre
Khalighi et al.
8, Number E1
asuring VCCS
cal tests to d
m allowable luency. The onput voltage was adjusted erse of frequue of output ected as 1KΩcompared to
mum allowableof R1 to R4 a
equencies. (C
l.
S output imped
determine theload represenoutput wavefo
of VCC paron 1mA in
uency [9]. Timpedance. Ω. This is duo others.
e load which caccording to t) Output Impe
dance [2]
e best value nts the maximform of VCCrt and load call frequenci
The maximumAs a result a
ue to the VC
can be supporthe circuit inedance of pro
for R1 to R4 mum value o
CS (load voltcurrent musties. In fact, tm allowable according to C structure w
rted by the imFig. 6. (B) O
oposed VCCS,
June 2014
according of load in age) must t be linear the output load in a the curve
with 1KΩ
mplemented pen circuit , simulated
June 2014
With twhich decrewas tested AMPs werethis part thecircuit (openof simulated d) Pulse ge
A pulstypes of syncurrent wademodulatindiagram. Thof the pulsepulse widthpulse train voltage in th
The data acvoltage acq
this resistanceases to abouwith resistor
e heated up. Te output voltn circuit voltd VCCS in P
enerator
e generationnchronous puaveform (peng the boundhe input of thes with R2. Ah can be variand also thehe demodula
Fig.
cquisition syquiring parts
Design
ce value the ut 8KΩ in 2rs less than The result oftage of the Vtage), in ope
PSPICE.
n module hasulse train wiak detectiondary voltageshe pulse gene
As shown in Fied by increae signal of Pator section.
F
10. The outpu
4
stem can lims of the EI
n and implemen
I
maximum a250KHz as sh
1KΩ (~0.5Kf the other prVCCS was merational freq
s been attachith the maximn and zeros in order to erator is connFig. 10, sectiasing C1 fromoint B may
Fig. 9. Pulse ge
ut generated pu
4. VOLTAG
mit the overaIT system. R
ntation of preci
IJST, Transacti
allowable loahown in the KΩ), howevractical test fmeasured whquency range
hed to the Vmum point o detection measure the
nected to theions A and Bm 1nF to 10be used for
eneration sche
ulses. (A) Peak
GE MEASUR
all accuracy Related to
ise hardware fo
tions of Electric
ad in frequeupper curve
ver, the wavefor the propohen there wae. Part C of F
VCCS circuiof positive peof the curr
em. Figure 9e output of thB depict the wnF. For instasampling an
ematic circuit
k detection (B)
REMENT
[18]. Errors the topology
for…
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encies less the of Fig. 8Aeform was d
osed VCCS isasn’t any loaFig. 8 shows
t design in oeaks and zerrent).The pu
9 shows the phe filter. We worthwhile uance, by regnd extracting
) Zero detectio
arise from by that is ap
g, Volume 38, N
han 100KHz. The circuitdistorted ands shown in F
ad at the outpthe output im
order to genro points of tulses were pulse generatmay shift th
usage of thisgulating R2, tg real part o
on
both current pplied for m
Number E1
7
z is 12KΩ t in Fig. 6 d the OP-Fig. 8B. In put of the mpedance
nerate two the output used for
tor circuit he position s part. The the output f the load
drive and measuring
IJST, Transac
8
(measuring addition to are connecte a) Demodu
In ordestage, the vofor measureshould be tpositive peato the 90 dknown as p[19].
As it ibuffers are entered via part of the lport D mustworks as thamplifier) athose menti[20]. To mepulse should
ctions of Electr
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Fig. 11, bohe high speeD, come fro
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R8
Fig. 11. Prop
M.
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nt, only one rror becauseis not measur
ltage
ary voltage, aples the voltain order to mtage when th
oints, the volmethod of mon. The sugg
th electrode ed CMOS-loom the pulsest be connecximum pointe the input trode voltagvalue determ
art of the loa
osed design fo
Khalighi et al.
8, Number E1
voltage can e of commonred.
at first the elage waveformmeasure the he injecting ltage of capamodulation igested meth
voltages afogic analog me generator pcted to the pt detector (tovoltages of es and the omined by R7
ad voltage th
Gain
for demodulati
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be measuredn mode effect
ectrodes voltm in specificreal portioncurrent wou
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part of the cuositive peak
o the output oAD625 (proutput voltag, R8 and R9 i
he pulse of p
n = +1
ing of electrod
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tage must bec points and pn of the loaduld be on th
mponents of tsample-and-require mul
through the s (74HC4053urrent source
detector (poof the pulse gogrammable e of the IC is optional anpoint B and
de voltages
articular elecge of electrod
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June 2014
ctrodes. In des which
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June 2014
b) Voltage
At this
value. The
measuremen
ADCs by i
conversion
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analog volt
conversion
whenever it
mentioned A
A high-spee
As it is see
used as the
For a 3
are applied
The multipl
32-electrode
pin can be u
measureme
s stage the de
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tage signal
or sampling
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changing on
5. MU
with 32 outp
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m, eight ICs o
orts of curren
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. The proposed
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IJST, Transacti
easured, hen
to the micro
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[21], the
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asurement.
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microcontro
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Fig
RS-232
tion is one o
e computer a
of the volta
smitted to
cted to the
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esign based
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llowing taskart to determid matching wed), to displayolling that asogrammer fo
ATmega128amplify the p
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Khalighi et al.
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ONTROL UN
ks: ine the state owith MATLAy the voltages a slave withor programm
is applied aport output cu
posed design o
ocols that are
ontroller, RS-
ment, the m
ter. In the
ia MAX232,
ction is done
ndard freque
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as the microurrent and al
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trode on eachransaction viumber of me
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TL voltage t
mmunication
(bps) table
for all stand
June 2014
. ls.
it. All the g effect of
mputer and
en applied
ocontroller
ocontroller
o RS-232
via 9-pin
[23], the
dard baud-
June 2014
To show th
stimulation
cross pattern
as the stimu
In the
electrodes a
applied thro
procedure w
pattern, it is
the number
pattern as th
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and decreas
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To evaluate
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ATTERNS
erent topolog
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MATLAB pa
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antom, and t
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gies can be
, opposite pa
rotocol [24]
through two
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algorithms, w
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Number E1
11
used for
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col in all
26]. The
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antom are
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IJST, Transac
12
Fig. 15. (A) reconstructedelements. (F) b) Experim
In this 4 and 14 ofthe quality Fig. 16 illusand coarse m
Fig. 16. (A) reconstructedelements. (F) c) Experim
In this cylindrical subjects in and coarse m
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Phantom withd onto eleme) Fine model r
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two pieces oode cylindricucted image onal reconstruation models.
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, four pieceshe experimenductivities hown in part
M.
ing, Volume 38
of plastic shaarse model ronto nodes
of a metalliccal phantom of the subjec
ucted images
of metallic sharse model ronto nodes
s of the metnt is conduclocating in
ts B to F of F
Khalighi et al.
8, Number E1
aft. (B) Fine meconstructed
c (Aluminumwith 30 cm cts having asof the phan
haft. (B) Fine meconstructed
tallic and placted to evalucomposite seFig. 17.
l.
model reconstronto nodes.
m) shaft have diameter. Ths much cond
ntom (shown
model reconstonto nodes.
astic shafts huate the qualetting. The f
ructed onto n(E) Fine mo
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in part A) b
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have been pulity of reconfinal reconst
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June 2014
arse model ucted onto
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June 2014
Fig. 17. (A)Coarse modreconstructed d) Experim
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The aimimages, andparameter. Ihyper-paramparameter sobtain a uscauses the iaction. As parameter vin terms of p
) Phantom witdel reconstrucd onto elemen
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model reconsucted onto n
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he phantom = 0.01, repr
g, Volume 38, N
structed onto
nodes. (E) Fi
electrode thoy using a 16-o elements, b
nstructed onto
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and resolutioed data as pcient hyper-phrough the swith differe
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Number E1
13
nodes. (C) ine model
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nning ten timthe effects o3D images oimage in par
nstructed afteframes inste
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M.
ing, Volume 38
nstructed withpresents the be
ffect of nume analyzed. Inlectrode pha
f voltage conand plastic sg. 20.A. Theage is recons(near electro
mes, which mof noise are iof the phantort F reconstrer scanning oead of one fre improved.
f one phantomfts. (B) n=1. (antom in part A
Khalighi et al.
8, Number E1
h different λ vest image in te
mber of von fact, in adj
antom is calcntains 208 vosubjects are le image in pastructed afterodes 4, 8, 9eans image rimproved inom of part Aructed after sonly one timeframe, in ima
m, by using th(C) 3D image A with n=10
l.
values (hyper-erms of precis
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9, and 10). Hreconstructio
n the mentionA, which are scanning ten e. This resultage reconstr
he average of (3D surface p
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or numberrn the numbe
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ifferent positnstructed by canning, therHowever th
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tions of a 16-using only o
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ames. (A) Phatom in part A
June 2014
6-electrode
ng in the es in each canning a
-electrode one frame effects of part E is age of ten in parts C nt number the image t, by using lity of the
antom with A with n=1.
June 2014
g) Experim
The obimage qualinear the bouthis test, thelectrodes. evaluation iwall of the phantoms, iwhereas in separated fr
Fig. 21. Recelectrodes to
The ne
reconstructeapplied as Adjacent pacentral partelectrodes, m
Fig. 22. Shomeans of var
ment 7
bjective of exity. To evaluundary, in thhree phantomThe dimensiis near the bphantoms is
in some placreconstructe
rom the boun
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ext position ed image of the stimulatattern, and its. It is sensmeasuremen
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boundary. Ass about 2~3 ces show thad images by
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located near tnstruction qua
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of the subject
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lectrodes in ttom surface ral part and nctrodes whiccts are identiance betweens by 8-electrnected to theen, the dark
of phantoms w
strated in Fiis because the reconstructe boundary aof the object
cated in centr
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the final recowould be co
near the bounch are 8, 1ical. First pon subjects to rode and 16-e boundary k parts are co
with various n
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Number E1
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16
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Fig. 23. Redifferent posreconstructio
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ast position ihantom is ves which are los, there is a dt cannot be slectrode phahe central pla
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9. VISU
been developed to be ovein clinical di
and poor spatg devices. uality of recimages prodproposed b
harian et al ifrom this pooms are madt, the size of
position of sutheir paper
M.
ing, Volume 38
e phantom. And it does note phantom. Be in the centreconstructeds the correctshows a very
ree phantoms ntral part and
he 32-electrobut it does n
heived from mber of electcreased, but subjects ha
phantom thecauses morereconstructiois important a
UAL COMPA
ped substantiercome to miagnosis [29tial resolutio
constructed iduced by usiny Bera and in [32]. In fa
oint of view tde from similf all phantomubjects in theinformation
Khalighi et al.
8, Number E1
As shown int have accep
But despite thral part of th
d image of 32t position ofy light smud
with differennear the boun
ode phantomnot show any
this experimtrodes of pha
its sensitiviave been loce distance bee current denon accuracyas well, even
ARISON ON
ally over recmake it a clin
, 30], but duon of image, t
image usingng other impNagaraju in
act in both sythose systemlar materials ms and test eir own phan
[31-32]. Th
l.
n Fig. 23, thptable accurahe bad qualithis image, as2-electrode pf the subject
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ment is, for aantom increaity to the cencated near thetween electrnsity in the cy, related ton when using
N RESOLU
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UTION
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DSP basedge is reconstr to the propmetal) as we
different in cactly plotted mage of pha
ucted image the correct ping inexact pn of the centre reconstrucear the boun
Subjects are s were identic
he correct podge, in its ce
m that worksstem sensitivf the phantomy. The reasore than the owhich result
ment and stde system.
ny challengesng [28]. EITse Ratio (SN
ot yet been ac
em will be The other EITd multi-frequtructed by us
posed systemell. comparison win the middl
antoms and t
June 2014
of the 8-position of position of ral plastic ted image
ndary, but
located in
cal in three
osition of entral part
s based on vity to the m will be on of this others (16 ts in more timulation
s (such as has been
NR) of the ccepted as
compared T systems
uency EIT sing a 16-
m. The test
with each le column their inner
June 2014
objects (in mof real phancolumn shoobjects. Thquality or re32 electrodincreased if
Fig. 24. Vis(A) reconstruusing a DSP our EIT syste
In this papedetail. Systeshown. TheSimplicity oEIT researcthe practicaoutput impewasn’t posssystem with
middle columntoms and theows three 16he third coluesolution of r
des of the imf the number
sual comparisoucted image bbased multi-f
em
er a practicaem performae novelty ofof design ma
chers for desial point of vieedance of thsible to be mh 16 electro
Design
mn of Fig. 24eir container6-electrode pumn shows treconstructe
mplemented of electrode
on on quality by using EIT frequency EIT
al low-cost pance has beenf this designade it possibigning and imew to improvhe current someasured wodes compar
n and implemen
I
4), have beenrs applied in phantoms relthe reconstrud image seenEIT system.s increases.
of final imagsystem propo
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precise design checked w
n is its precible to have amplementative the precisource, which
with oscilloscred to the o
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IJST, Transacti
n drawn withimage reconlated to diffucted imagen in Fig. 24.C. Of course,
ges made by aosed by Bera osed by Goha
ONCLUSIO
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applying threeand Nagaraju
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roportion coms it can be seystems contathree differe
d by using onand resolut
e different impu in [31]. (B) 32]. (C) recon
on was propome experimeed without aon which come hard worem such as trto more thathe reconstr
on to verify
g, Volume 38, N
mpared to dieen in Fig. 24aining salineent EIT systnly 16 electrotion of imag
plemented EIreconstructed
nstructed imag
osed and desental results hany complexould pave therk has been drying to max
an 5 MΩ suructed image
the accurac
Number E1
17
imensions 4, the first e and test tems. The odes from
ge will be
T systems. d image by ge by using
scribed in have been x circuits. e way for done from ximize the uch that it es by our cy of the
M. Khalighi et al.
IJST, Transactions of Electrical Engineering, Volume 38, Number E1 June 2014
18
implemented EIT hardware. Future research includes improvement of the current EIT hardware in terms of accuracy and precision to become appropriate for clinical applications and development of EIT application in industrial and medical fields.
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IJST, Transactions of Electrical Engineering, Volume 38, Number E1 June 2014
20
Figure A1 shows different schematic circuits of the VCCS which have been used in practical tests. As it can be
seen in Table A1, the results of several experiments are shown briefly. These tests were done on the breadboard with
different resistance values in condition of 20KHz frequency and 1mA load current. It can be concluded (from Table
A1) that the VCCS based on TOA1 (fourth row) is the best choice to have an efficient voltage-controlled current
source. It can support a load in range of 10Ω to 10KΩ linearly and also has more than 5MΩ output impedance which
calculated with (4).
Table A1. The results of VCCS primary physical tests [33]
VCCS Type
R1 (KΩ)
R2 (KΩ)
R3 (KΩ)
R4 (KΩ)
R5 (KΩ)
Allowable Load (Ω)
Measured (Ω)
PSPICE (Ω)
AH 1 2 1 1 1 10 ~ 1K 100K 420K DOA 1 1 1 1 5 10 ~ 5K 3 M 5.3M TOA1 1 1 1 1 5 10 ~ 10K >5 M 7.8M TOA1 2 2 2 2 5 10 ~ 10K 1 M 3.9M TOA1 5 5 5 5 5 10 ~ 10K 500K 1.6M TOA1 10 10 10 10 5 10 ~ 10K 500K 770K TOA1 22 22 22 22 5 10 ~ 10K 150K 340K TOA1 27 27 27 27 5 10 ~ 10K 100K 280K TOA2 1 1 1 1 5 10 ~ 10K 600K 2.5M