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IJST, Transactions of Electrical Engineering, Vol. 38, No. E1, pp 1-20 Printed in The Islamic Republic of Iran, 2014 © Shiraz University DESIGN AND IMPLEMENTATION OF PRECISE HARDWARE FOR ELECTRICAL IMPEDANCE TOMOGRAPHY (EIT) * M. KHALIGHI 1** , B. VOSOUGHI VAHDAT 2 , M. MORTAZAVI 3 AND M. MIKAEILI 4 1 School of Engineering and Science, Sharif University of Technology, International Campus, I. R. of Iran Email: [email protected] 2 School of Engineering and Science, Sharif University of Technology, Tehran, I. R. of Iran 3 School of Engineering, Islamic Azad University-Abhar Branch, I. R. of Iran 4 Dept. of Engineering, Biomedical Engineering Group, Shahed University, Tehran, I. R. of Iran Abstract– Electrical Impedance Tomography (EIT), is one of the safest medical imaging technologies and can be used in industrial process monitoring. In this method, image of electrical conductivity (or electrical impedance) distribution of the inner part of a conductive subject can be reconstructed. The image reconstruction process is done by injecting an accurate current into the boundary of a volume conductor (), measuring voltages around the boundary (∂Ω) and transmitting them to a computer, and processing on acquired data with software (e.g. MATLAB). The image would be reconstructed from the measured peripheral data by using an iterative algorithm. A precise instrumentation (EIT hardware) plays a very important and vital role in the quality of reconstructed images. In this paper, we have proposed a practical design of a low-cost precise EIT hardware including, a high output impedance VCCS (Voltage-Controlled Current Source) with pulse generation part, precise voltage demodulator and measuring parts, a high performance multiplexer module, and a control unit. All the parts have been practically and accurately tested with successful results, and finally the proposed design was assembled on PCB. The quality of experimental results at the end of this paper, (reconstructed images by using the implemented system), confirms the accuracy of the proposed EIT hardware. Keywords– EIT, electrical impedance tomography, EIT hardware, EIT instrumentation, EIT current source 1. INTRODUCTION Electrical Impedance Tomography (EIT) is a relatively new imaging technique. In this method, an image of the inner part of a conductive domain () can be made with an array of external electrodes which are located on the boundary of domain (∂Ω). In this imaging method, the image of electrical conductivity (or impedance) distribution of the internal part of a typical conductive subject can be reconstructed [1]. EIT procedure includes injecting an accurate current into the boundary of domain (∂Ω) via a pair of electrodes, measuring the boundary voltages by means of other electrodes around the boundary and transmitting them to a computer, and at the end, processing the acquired data with software (e.g. MATLAB) to reconstruct the image. Human body tissues contain a wide range of conductivities, and hence the potential exists to use EIT to carry out medical imaging using the conductivity as the parameter to be mapped [2]. As a matter of fact, EIT is a challenging problem. This technique has some advantages compared to other methods, including: simplicity of application, no hazard to the patient (such as X-ray), low cost and portable, and the high speed of data collection and image reconstruction [3]. Although EIT systems suffer Received by the editors January 21, 2013; Accepted May 18, 2014. Corresponding author

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Page 1: DESIGN AND IMPLEMENTATION OF PRECISE HARDWARE …ijste.shirazu.ac.ir/article_2095_47f0df6ce573e11ccabf073676e496fa.pdf · DESIGN AND IMPLEMENTATION OF PRECISE HARDWARE FOR ELECTRICAL

IJST, Transactions of Electrical Engineering, Vol. 38, No. E1, pp 1-20

Printed in The Islamic Republic of Iran, 2014 © Shiraz University

DESIGN AND IMPLEMENTATION OF PRECISE HARDWARE FOR ELECTRICAL IMPEDANCE TOMOGRAPHY (EIT)*

M. KHALIGHI1** , B. VOSOUGHI VAHDAT2, M. MORTAZAVI3 AND M. MIKAEILI4 1School of Engineering and Science, Sharif University of Technology, International Campus, I. R. of Iran

Email: [email protected] 2School of Engineering and Science, Sharif University of Technology, Tehran, I. R. of Iran

3School of Engineering, Islamic Azad University-Abhar Branch, I. R. of Iran 4Dept. of Engineering, Biomedical Engineering Group, Shahed University, Tehran, I. R. of Iran

Abstract– Electrical Impedance Tomography (EIT), is one of the safest medical imaging technologies and can be used in industrial process monitoring. In this method, image of electrical conductivity (or electrical impedance) distribution of the inner part of a conductive subject can be reconstructed. The image reconstruction process is done by injecting an accurate current into the boundary of a volume conductor (Ω), measuring voltages around the boundary (∂Ω) and transmitting them to a computer, and processing on acquired data with software (e.g. MATLAB). The image would be reconstructed from the measured peripheral data by using an iterative algorithm. A precise instrumentation (EIT hardware) plays a very important and vital role in the quality of reconstructed images. In this paper, we have proposed a practical design of a low-cost precise EIT hardware including, a high output impedance VCCS (Voltage-Controlled Current Source) with pulse generation part, precise voltage demodulator and measuring parts, a high performance multiplexer module, and a control unit. All the parts have been practically and accurately tested with successful results, and finally the proposed design was assembled on PCB. The quality of experimental results at the end of this paper, (reconstructed images by using the implemented system), confirms the accuracy of the proposed EIT hardware.

Keywords– EIT, electrical impedance tomography, EIT hardware, EIT instrumentation, EIT current source

1. INTRODUCTION

Electrical Impedance Tomography (EIT) is a relatively new imaging technique. In this method, an image

of the inner part of a conductive domain (Ω) can be made with an array of external electrodes which are

located on the boundary of domain (∂Ω). In this imaging method, the image of electrical conductivity (or

impedance) distribution of the internal part of a typical conductive subject can be reconstructed [1]. EIT

procedure includes injecting an accurate current into the boundary of domain (∂Ω) via a pair of electrodes,

measuring the boundary voltages by means of other electrodes around the boundary and transmitting them

to a computer, and at the end, processing the acquired data with software (e.g. MATLAB) to reconstruct

the image. Human body tissues contain a wide range of conductivities, and hence the potential exists to

use EIT to carry out medical imaging using the conductivity as the parameter to be mapped [2]. As a matter of fact, EIT is a challenging problem. This technique has some advantages compared to

other methods, including: simplicity of application, no hazard to the patient (such as X-ray), low cost and portable, and the high speed of data collection and image reconstruction [3]. Although EIT systems suffer

Received by the editors January 21, 2013; Accepted May 18, 2014. Corresponding author

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IJST, Transac

2

from poor imof unknownquality [4]. algorithms tmost imporReconstructalgorithm [7

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June 2014

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.

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June 2014

Electrical Imfrequency rcurrent is topositive andVCCS usedparts. Desigprecision, wsystems in mdigital or anoutput waveideal voltagaddition, thimpedance, range of losource can a

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more than 10tions. Figure

scillator) parton), and a VC

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g in a broadality to a certems must be support the 00KΩ as wee 3 shows tht, a ButterwoCC (Voltage

g. 3. Flowchar

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ntation of preci

IJST, Transacti

sembled EIT h

ROLLED C

ms require acad impedancource (VCCSain operation

veform generecially imporutput impedarm which is or a typical wm without anydth, and steapart to have

current, precd range of frtain extent [1able to delivload betwee

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ccurate currece. The simpS), which canal or instrumrator and Vortant. The VCance. Generaproduced by

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ass filter (BuConverter) p

VCCS design

shown in Figt as a VCO.

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SOURCE

ent sources tlest techniqu

an be definedmentation amltage-to-CurrCC part requally, the wavy the wavefoenerator are aw output imp

de over all thnt VCCS are put wavefor0]. The high

nt over a freqd 10KΩ [9]. ellent currentosed VCCS. utterworth lopart.

n

g. 4. As it cAn AD844

g, Volume 38, N

that work ovue to obtain ad as a combmplifier [8]. rent Convert

uires stabilityeform used i

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IJST, Transac

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the output ovalue at thAD844, is a

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ctions of Electr

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the sinusoidgeneration p

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C parts

June 2014

mpedance it without

create low 0KHz and Hence the n order to schematic

worth low-high-pass

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June 2014

c) Voltage-

The enwere done configuratio VCCS VCCS VCCS VCCS

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experimentsh as differentto results ofThe main se

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and their resus value, accouit, (2) should

:

Fig. 6. P

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output voltaglue [2]. In orcope, the inpu

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converter

of mentionede and modiCS:

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s were done t resistance vf the primaryelected criteh, and the mdifferent VCults have beeording to thed be satisfied

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, [14, 15]. al Amplifier)l Amplifier fl Amplifier f

cal VCOs, drent types oests, the besprimary testsnd maximumhave been uAppendix A

t in experimeore IL is calcu

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different VCCf OP-AMP, t structure os were basem loads thaused in prac

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nverter (VCCtests were

].

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= R2 . R3

components v

lated by (4). S is opened ected at the ad voltage ofuld be consid

g, Volume 38, N

C), many expdone on f

, different cofferent rangepart was selutput impedCS can suppand simulatithe VCC par For VCCS

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(4)

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IJST, Transac

6

Figure to the circuwhich the Vbe exact sinduring the tImpedance particular frin Fig. 8A. resistor, wh

Fig. 8. (A) ThVCCS, in dioutput voltagwith PSPICE

ctions of Electr

8A shows thuit of Fig. 6. VCCS can sunusoid and ttest. The ampof a current

requency is aThe best va

hich creates h

he curve reprefferent frequege of implemeE in different f

rical Engineeri

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he results of In the curve

upport in a spthe relationshplitude of lot source depalso restrictelue for R1 to

higher output

esents the ranencies and difented VCCS ifrequencies

M.

ing, Volume 38

method for mea

f other practice, Maximumpecific frequhip of the in

oad current wends on inved by the valu

o R4 was selet impedance

nges of maximfferent values in different fre

Khalighi et al.

8, Number E1

asuring VCCS

cal tests to d

m allowable luency. The onput voltage was adjusted erse of frequue of output ected as 1KΩcompared to

mum allowableof R1 to R4 a

equencies. (C

l.

S output imped

determine theload represenoutput wavefo

of VCC paron 1mA in

uency [9]. Timpedance. Ω. This is duo others.

e load which caccording to t) Output Impe

dance [2]

e best value nts the maximform of VCCrt and load call frequenci

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ue to the VC

can be supporthe circuit inedance of pro

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CS (load voltcurrent musties. In fact, tm allowable according to C structure w

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oposed VCCS,

June 2014

according of load in age) must t be linear the output load in a the curve

with 1KΩ

mplemented pen circuit , simulated

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June 2014

With twhich decrewas tested AMPs werethis part thecircuit (openof simulated d) Pulse ge

A pulstypes of syncurrent wademodulatindiagram. Thof the pulsepulse widthpulse train voltage in th

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this resistanceases to abouwith resistor

e heated up. Te output voltn circuit voltd VCCS in P

enerator

e generationnchronous puaveform (peng the boundhe input of thes with R2. Ah can be variand also thehe demodula

Fig.

cquisition syquiring parts

Design

ce value the ut 8KΩ in 2rs less than The result oftage of the Vtage), in ope

PSPICE.

n module hasulse train wiak detectiondary voltageshe pulse gene

As shown in Fied by increae signal of Pator section.

F

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4

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maximum a250KHz as sh

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Fig. 9. Pulse ge

ut generated pu

4. VOLTAG

mit the overaIT system. R

ntation of preci

IJST, Transacti

allowable loahown in the KΩ), howevractical test fmeasured whquency range

hed to the Vmum point o detection measure the

nected to theions A and Bm 1nF to 10be used for

eneration sche

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t design in oeaks and zerrent).The pu

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) Zero detectio

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han 100KHz. The circuitdistorted ands shown in F

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order to genro points of tulses were pulse generatmay shift th

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drive and measuring

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IJST, Transac

8

(measuring addition to are connecte a) Demodu

In ordestage, the vofor measureshould be tpositive peato the 90 dknown as p[19].

As it ibuffers are entered via part of the lport D mustworks as thamplifier) athose menti[20]. To mepulse should

ctions of Electr

pattern) in eavoiding meed to the cur

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er to measureoltage demoement. As antaken from tak. On the mdegree phasepulse-sample

is shown in entered to thports C and load voltaget be connectehe peak deteare the demoioned voltageeasure the imd be applied

R7 = R

rical Engineeri

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R8

Fig. 11. Prop

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nt, only one rror becauseis not measur

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ary voltage, aples the voltain order to mtage when th

oints, the volmethod of mon. The sugg

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Khalighi et al.

8, Number E1

voltage can e of commonred.

at first the elage waveformmeasure the he injecting ltage of capamodulation igested meth

voltages afogic analog me generator pcted to the pt detector (tovoltages of es and the omined by R7

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for demodulati

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mponents of tsample-and-require mul

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detector (poof the pulse gogrammable e of the IC is optional anpoint B and

de voltages

articular elecge of electrod

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high pass f3). The contre. To measuroint B of Figgenerator par

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June 2014

ctrodes. In des which

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June 2014

b) Voltage

At this

value. The

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June 2014

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IJST, Transac

12

Fig. 15. (A) reconstructedelements. (F) b) Experim

In this 4 and 14 ofthe quality Fig. 16 illusand coarse m

Fig. 16. (A) reconstructedelements. (F) c) Experim

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two pieces oode cylindricucted image onal reconstruation models.

h two pieces oents. (D) Coareconstructed

, four pieceshe experimenductivities hown in part

M.

ing, Volume 38

of plastic shaarse model ronto nodes

of a metalliccal phantom of the subjec

ucted images

of metallic sharse model ronto nodes

s of the metnt is conduclocating in

ts B to F of F

Khalighi et al.

8, Number E1

aft. (B) Fine meconstructed

c (Aluminumwith 30 cm cts having asof the phan

haft. (B) Fine meconstructed

tallic and placted to evalucomposite seFig. 17.

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model reconstronto nodes.

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model reconstonto nodes.

astic shafts huate the qualetting. The f

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nodes. (C) Coaodel reconstru

ut in the 16-nstructed imatructed imag

June 2014

arse model ucted onto

electrodes understand

B to F of ferent fine

arse model ucted onto

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June 2014

Fig. 17. (A)Coarse modreconstructed d) Experim

In the phantom. Tthorax-shapC (of Fig. 1

Fig. 18. (A) (C) Fine mod e) Experim

The aimimages, andparameter. Ihyper-paramparameter sobtain a uscauses the iaction. As parameter vin terms of p

) Phantom witdel reconstrucd onto elemen

ment 4

following, thhe goal of th

pe phantom. A8) the image

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values are shprecision and

Design

th four piecescted onto el

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hree plastic ahis test is evaAs it can be e is reconstru

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model reconstru

and metallicaluation of qseen in Fig.

ucted onto no

pe phantom wes

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and plastic shaCoarse mod

ucted onto no

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with some subj

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model reconsucted onto n

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structed onto

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electrode thoy using a 16-o elements, b

nstructed onto

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and resolutioed data as pcient hyper-phrough the swith differe

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IJST, Transac

14

Fig. 19. SomEIT system. f) Experim

In the reconstructeframe acqui16-electrode

In expecylindrical pof voltage wnoise can breconstructeframes of vand F of Figof voltage fof part C whthe averagefinal recons

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ctions of Electr

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ment 6

current exed image quired by scane phantom eaeriment 6 sophantom as which meansbe seen on ed after scanvoltages. So g. 20 are the frames. The hich is recon

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ich were reconith λ=0.01 rep

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nning an N-each frame ofme metallic shown in Figs that the imathis image

nning ten timthe effects o3D images oimage in par

nstructed afteframes inste

ges would be

cted images ofd plastic shaf image of pha

M.

ing, Volume 38

nstructed withpresents the be

ffect of nume analyzed. Inlectrode pha

f voltage conand plastic sg. 20.A. Theage is recons(near electro

mes, which mof noise are iof the phantort F reconstrer scanning oead of one fre improved.

f one phantomfts. (B) n=1. (antom in part A

Khalighi et al.

8, Number E1

h different λ vest image in te

mber of von fact, in adj

antom is calcntains 208 vosubjects are le image in pastructed afterodes 4, 8, 9eans image rimproved inom of part Aructed after sonly one timeframe, in ima

m, by using th(C) 3D image A with n=10

l.

values (hyper-erms of precis

ltage frame djacent patterculated by Noltages. located in diart B is reconr one time sc

9, and 10). Hreconstructio

n the mentionA, which are scanning ten e. This resultage reconstr

he average of (3D surface p

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or numberrn the numbe

N×(N – 3). H

ifferent positnstructed by canning, therHowever th

on is done usned image. Treconstructetimes is sm

t can be extraruction proce

f n voltage fraplot) of phant

y using the 16ty

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Hence after s

tions of a 16-using only o

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ames. (A) Phatom in part A

June 2014

6-electrode

ng in the es in each canning a

-electrode one frame effects of part E is age of ten in parts C nt number the image t, by using lity of the

antom with A with n=1.

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June 2014

g) Experim

The obimage qualinear the bouthis test, thelectrodes. evaluation iwall of the phantoms, iwhereas in separated fr

Fig. 21. Recelectrodes to

The ne

reconstructeapplied as Adjacent pacentral partelectrodes, m

Fig. 22. Shomeans of var

ment 7

bjective of exity. To evaluundary, in thhree phantomThe dimensiis near the bphantoms is

in some placreconstructe

rom the boun

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ext position ed image of the stimulatattern, and its. It is sensmeasuremen

owing qualityrious numbers

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xperiment 7 iuate the imaghe central parms are applions of phan

boundary. Ass about 2~3 ces show thad images by

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is to show thge quality, thrt and the whlied with dintoms and ins it can be scm, but in t

at the dark py 32-electrodntoms.

ects which are al image recon

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he effects of nhree positionhole phantomfferent num

nternal salineeen in Fig. 2the reconstruparts (smudge phantom a

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of the subject

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number of elns of a phantm (both centr

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the boundary ality

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lectrodes in ttom surface ral part and nctrodes whiccts are identiance betweens by 8-electrnected to theen, the dark

of phantoms w

strated in Fiis because the reconstructe boundary aof the object

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the final recowould be co

near the bounch are 8, 1ical. First pon subjects to rode and 16-e boundary k parts are co

with various n

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IJST, Transac

16

The laelectrode phthe subjectsthe subjectsshaft. But itof the 16-einstead of th

Fig. 23. Redifferent posreconstructio

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Although thresolution) extensively boundary voregular med

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ctions of Electr

ast position ihantom is ves which are los, there is a dt cannot be slectrode phahe central pla

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the result thnt pattern, whthe boundaryspecifically

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images of thrphantom (cen

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hat can be achhen the numy will be incwhen some 8-electrode poms), and it in image rof subjects i

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been developed to be ovein clinical di

and poor spatg devices. uality of recimages prodproposed b

harian et al ifrom this pooms are madt, the size of

position of sutheir paper

M.

ing, Volume 38

e phantom. And it does note phantom. Be in the centreconstructeds the correctshows a very

ree phantoms ntral part and

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heived from mber of electcreased, but subjects ha

phantom thecauses morereconstructiois important a

UAL COMPA

ped substantiercome to miagnosis [29tial resolutio

constructed iduced by usiny Bera and in [32]. In fa

oint of view tde from similf all phantomubjects in theinformation

Khalighi et al.

8, Number E1

As shown int have accep

But despite thral part of th

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with differennear the boun

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this experimtrodes of pha

its sensitiviave been loce distance bee current denon accuracyas well, even

ARISON ON

ally over recmake it a clin

, 30], but duon of image, t

image usingng other impNagaraju in

act in both sythose systemlar materials ms and test eir own phan

[31-32]. Th

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June 2014

of the 8-position of position of ral plastic ted image

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June 2014

objects (in mof real phancolumn shoobjects. Thquality or re32 electrodincreased if

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M. Khalighi et al.

IJST, Transactions of Electrical Engineering, Volume 38, Number E1 June 2014

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implemented EIT hardware. Future research includes improvement of the current EIT hardware in terms of accuracy and precision to become appropriate for clinical applications and development of EIT application in industrial and medical fields.

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M. Khalighi et al.

IJST, Transactions of Electrical Engineering, Volume 38, Number E1 June 2014

20

Figure A1 shows different schematic circuits of the VCCS which have been used in practical tests. As it can be

seen in Table A1, the results of several experiments are shown briefly. These tests were done on the breadboard with

different resistance values in condition of 20KHz frequency and 1mA load current. It can be concluded (from Table

A1) that the VCCS based on TOA1 (fourth row) is the best choice to have an efficient voltage-controlled current

source. It can support a load in range of 10Ω to 10KΩ linearly and also has more than 5MΩ output impedance which

calculated with (4).

Table A1. The results of VCCS primary physical tests [33]

VCCS Type

R1 (KΩ)

R2 (KΩ)

R3 (KΩ)

R4 (KΩ)

R5 (KΩ)

Allowable Load (Ω)

Measured (Ω)

PSPICE (Ω)

AH 1 2 1 1 1 10 ~ 1K 100K 420K DOA 1 1 1 1 5 10 ~ 5K 3 M 5.3M TOA1 1 1 1 1 5 10 ~ 10K >5 M 7.8M TOA1 2 2 2 2 5 10 ~ 10K 1 M 3.9M TOA1 5 5 5 5 5 10 ~ 10K 500K 1.6M TOA1 10 10 10 10 5 10 ~ 10K 500K 770K TOA1 22 22 22 22 5 10 ~ 10K 150K 340K TOA1 27 27 27 27 5 10 ~ 10K 100K 280K TOA2 1 1 1 1 5 10 ~ 10K 600K 2.5M