43
Meadville Confidential Serve through People……Connect through Technology Development of Low-Cost Manufacturing Methods for Volume Production of Optical Printed Circuit Boards M. Immonen (1) , J. Wu (2) , P. Chen (2) , Y.H. Luo (2) , H. He (3) , W. Huang (3) J.X. Xu (3) E. Helminen (4) , T. Rapala-Virtanen (4) (1) Meadville Aspocomp Intenational Ltd. (MAIL), Vilhonkatu 8, (02300) Salo, Finland (2) Shanghai Meadville Science and Technology (SMST), No. 185 Lian Yang Road, Songjiang (201600), Shanghai, P. R. China; (3) Shanghai Meadville Electronics Co., Ltd. (SME), No. 200 Jiangtian Rd. East, Songjiang (201600), Shanghai, P. R. China; (4) Guangzhou Meadville Electronics Co., Ltd. (GME), No. 1, Xinle Road, Science City Guangzhou, (510663) Guangdong Province, P. R. China IBM Symposium, 18-19 November 2009 T.J. Watson Research Center, Yorktown Heights, NY 10598, U.S.A

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Page 1: Development of Low-Cost Manufacturing Methods for … · Development of Low-Cost Manufacturing Methods for Volume Production of Optical Printed Circuit Boards ... •CAD/CAM OE PCB

Meadville ConfidentialServe through People……Connect through Technology

Development of Low-Cost Manufacturing

Methods for Volume Production of Optical

Printed Circuit Boards

M. Immonen(1), J. Wu(2), P. Chen(2), Y.H. Luo(2), H. He(3), W. Huang(3) J.X. Xu(3)

E. Helminen(4), T. Rapala-Virtanen(4)

(1) Meadville Aspocomp Intenational Ltd. (MAIL), Vilhonkatu 8, (02300) Salo, Finland

(2) Shanghai Meadville Science and Technology (SMST), No. 185 Lian Yang Road, Songjiang (201600),

Shanghai, P. R. China;

(3) Shanghai Meadville Electronics Co., Ltd. (SME), No. 200 Jiangtian Rd. East, Songjiang (201600),

Shanghai, P. R. China;

(4) Guangzhou Meadville Electronics Co., Ltd. (GME), No. 1, Xinle Road, Science City Guangzhou, (510663)

Guangdong Province, P. R. China

IBM Symposium, 18-19 November 2009

T.J. Watson Research Center, Yorktown Heights, NY 10598, U.S.A

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Contents

• Introduction and motivation

• Implementation

– R-stage (Research) projects & results

• Waveguide polymers

• Optical waveguides on cards and backplanes

– Single layer – multilayer builds

– Passive components, 1XN arrays

– Optical layer integration

• Optical coupling structures

– I/O-1: Device-to-waveguide

– I/O-2: Card-to-backplane

• Demonstrator for 10Gbps chip-to-chip data link

– D-stage (Development) projects & results

• Process scaling from lab to LAP

• Performance metrics and reliability

• Summary

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• Direct sales forces to serve you Better and Faster

• R&D located in Finland and China

N. America (Central)

Minneapolis, US

N. America (W)

Milpitas, US

S.E. Asia

Penang, Malaysia

S. China

Dongguan, China

Hong Kong

HK, China

N. America (S / E)

Houston, USN. America (W)

Fullerton, US

Taipei, Taoyuan &

Taichung, Taiwan

Taiwan

Europe

Wiltshire, Yorkshire & Sussex, UK

Singapore

S.E. Asia

N. China

Suzhou, China

Sales Office

R&D Center

Design Center

Training Center

S. China

Guangzhou, China

N. China

Shanghai, China

Europe

Salo, Finland

Meadville Group

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S. China

Guangzhou, China

N. China

Shanghai, China

SMST• Proto-Lab

team

• Design

qualification

• DFM

• Waveguide

characterizati

on and testing

PARTNERSVTT, Finland

• Optical

measurements

• Optical design,

simulation and

modelling

• Opto-mechanics

• OE-pkg and

assembly

Europe

Salo, Finland

R&D started 2003

Optical PCB Project & Mnf Teams – Locations

Feasibility studies, White papers,

Concept studies, Concept protos

Sample Protos, Design

Guidelines, Test engines,

Reliability tests

Univ. co-operation

HDPUG - Opto

interconnect

Low-cost Tx

modules

Materials and

manufacturing-1

O/E-PCBs for

datacom apps

WGs for

illumination

3D micro

structuring

Past projects

Proto Lab & S/V 2009

Current projects

SME• CAD/CAM

• OE-PCB mnf

• Reliability

testing

• Production

proto line

(2010)

GME• Materials

development

and testing

center

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Materials and

manufacturing-2

MAIL• R&D projects

• Customer

projects

• Design

qualification

• Process

support

Reliability

Simulation

+ Modelling

Optical

Backplane-1

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Drivers for Optical Backplanes

• The continuing growth of data rates in servers, routers and high-bandwidth

computing systems

• The trend in m-processor architectures to many-core

– Increase in chip-to-chip I/O bandwidth need at processor/memory interfaces and in

multi-processor systems

ElectricalComplex circuits, high material cost,

lower link length, signal integrity,

increasing power consumption

OpticalTerahertz bandwidth, low loss, low cross-

talk, low EMI/EMC, scalable architecture

(10, 20, 40Gb/s), low weight

• Challenges or gaps

– CPU to memory latency

– Mismatch of required and available bandwidth

– Limited speed/ physical line: 10-20 Gigabit/sec

– Complex realization of thousands high-density

lines at > 10 Gb/s

• Potentials of Optics

– Higher interconnect density

– Higher data rate per channel

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Channel Density – Optical vs. Copper

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Optical polymer waveguides (25x50 µm

channels at 100 µm pitch) for 12x 10+Gbit/s

data transmission rate.

→ 100+ Gbit/s/ millimeter Differential strip lines (80x7 µm lines at

460 µm pitch ) for 2x 10Gbit/s data

transmission rate.

→ 28.5 Gbit/s/ millimeter

(Source: IBM)

Core Pitch Density

[µm] [µm] (Gbit/s/mm)

50x50 250 40 Gbit/s/mm

50x50 100 100 Gbit/s/mm

35x35 62.5 160 Gbit/mm

1D arrays, 10 Gbit/s/ch, crosstalk <-30dB

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Applications

• Optical Backplanes

• OE-PCBs and Modules e.g daughter cards

• Optical and OE Flexes, including active signal cables

• O/E-package substrates (OE-BGA, OE-MCM)

• OE-SIPs (e.g. RF-over-fiber)

• Communication components, FTTx

• Illumination with waveguides – Touch screens and UI lightning

7

(IBM)

Panasonic

Reflex

Photonics

Intel

RPO

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Optical Electrical Backplane – Card Concept

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Backplane

Daughter cardOptical Printed

Circuit Board

(OE-PCB)

Optical (OE)

Connector

Transceiver

module (Tx/Rx)

with optical I/Os

Laser

Det.

1xN

arrayPD

1xN

array

PD

1xN

array

Laser

Det.

1xN

array

Optical waveguides

Coupling I/O

Coupling I/O

TIA

Copper layers for

power, control signals

and low speed signals

Optical channels for high speed serial

signals between cards

TIA

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Specifications – Cards and Backplane

Laser

PD

PD

1xN

array

PD

1xN

array

Laser

Det.

TIA

TIA

• Board-to-board data

link lenght: ~ 1m

• Power budget: < 13 dBm

Tx-to-WG loss: < 2 dB

Channel loss: ~0.05 dB/cm

Card-to-BP: < 2 dB

WG-to-Rx: < 3 dB

• Channel data rate: >

10 (15, 20) Gbit/s

• Number of channels:

24, 32, 48 →

Aggregate data rate

> 200 Gbit/s

• Core dimensions:

Ø < 50 µm

• Channel density:

250 µm pitch (4 ch/mm)

62.5 µm pitch (16 ch/mm)

• 2D WG arrays with

multiple optical layers

• Bi-directional data

• Passive O/E hybrid backplane

• Core & Clad height/width

control: < 5 µm

• Cost : few $/ Gbit/s per link

• Power consumption: < 12.5

mW/Gb/s for Tx-Rx pair

• Wavelength: 850 nm,

1300 nm

• Passive alignment of

parts

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Implementation

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optical receiverswaveguides

optical transmitters

Tx/Rx-to-WG couplers

• A feasibility test vehicle with different concept alternatives

• Physically separated build to allow testing

• Optical-PCB with

– Polymeric 2D channels on FR4

– Various NA, WG L/S and component designs

– Integrated out-of-plane couplers

• Optical subassemblies with

– VCSEL/PD arrays with driving ICs assembled on LTCC modules

– OE-modules with micro-optic couplings assembled on HF-substrates

→ Feasible WG materials, process and O/E-PCB design

→ Feasible coupling conceptTechnology

evaluation

Technical

specs & targets

Materials &

process development

1st phase

technology demo

2st phase

technology demo

Implemen

tation into LAP

Reliability

of O-PCBs

Waveguide arrays OE-BGA packages

Technology Evaluation Platform – DEMO I

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Fabricated Polymer Waveguides for Optical Backplanes

• Waveguide Material

– UV curable acrylic polymer

– Propagation loss @ 850nm: 0.04 dB/cm

– Temperature resistance: up to 350°C

• Waveguide Properties

– Size: 50x50 µm

– Index contrast D: 0.03, NA=0.3

• Components and Arrays

– Linears, splitters, crossings

– Arrays with fiber-pitch: 250µm

– Up to 32 channel high density arrays

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Waveguide Core Shape Control – UV Cure Kinetics

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– Kinetics of Photoinitiated Radical

Polymerization

Chain Length

Chemical structure of oligomers

Initiation efficiency

Influence of light intensity

Influence of atmospheric oxygen

– In UV curable systems Initiation rate and the cure depth is controlled by

photoinitiator

– To achieve a deep-through cure by frontal

polymerization– Use of intiator with highest initiation efficiency to

result fast photobleaching during UV exposure

Initiator-A 1-wt%, I=20mJ/cm2

Initiator-B 1-wt %, I=20mJ/cm2

w=50µm w=75µm

w=75µmw=50µm

Consentration

of Initiator-A

Absorption Spectrum of Photoinitiator-A

(% in acetonitrile)

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0,00

0,05

0,10

0,15

0,20

0,25

0,30

1 2 3 4 5 6 7 8 9 10 11 12

Tran

smis

sio

n L

oss

at

84

0 n

m [

dB

/cm

]

Channel number

Characterization – Channel Propagation Loss

• Experimental results

– Propagation loss for commercial acrylate

and epoxy waveguide polymers

– Losses independant of channel width

(25, 50 and 70 µm)

– Losses increased significantly in 1,3 µm

and 1,55 µm (2nd and 3rd ) telecom

windows

– Highly sensitive to process defects &

sidewall roughness

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Acrylate waveguides

Epoxy waveguides

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Channel Loss of Waveguides (L=79.5cm)

• Acrylate-based waveguide

material

• Waveguide loop

– Total lenght L=79.5cm

– 6x180° turns and 2x90° S-turn

– 6x over crossings

– Minimum bending radius

Rmin= 14.5 mm

• Loss at 840 nm

– Insertion loss 11.5 – 13.5 dB

– Waveguide transmission loss

~0.08 - 0.1 dB/cm

Light in

Out R=14.5 mm

R=14.5 mm

Loop layout

Eye diagram at

10Gbit/s at 850nm

Insertion loss (IL) set-up

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Side Wall Roughness vs. Channel Loss

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λ= 850 nm, Core 100µmx100µm, ncore=1,56, nclad=1,49 (NA=0.46)

Source: It-Infomation Technology 45 (2003), 79-86

Core ”Micro” roughness : < 5 nmCladding ”Macro” roughness (L=240 µm)

Core ”Macro” roughness (L=300 µm)

Ra < 25 nm

Ra < 30 nm

LSCM, Solarius LT 8010, step 50 nm

White light interferometer (Wyko NT 2000)

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Indirect coupling

with micro-optics

SMT packaged OEs

90-deg beam turn

Loosest tolerance

Complex I/O

”Chip-like approach”

Low loss m-optics and beam turn

No comm.OE- pkgs

Indirect coupling

without micro-optics

Flip chip OEs

90-deg beam turn

Simple I/O

FC OEs available

High accuracy critic.

Low loss beam turn

Direct coupling

OE-chip in cavity or plugg-in rod

No beam turn

Simple I/O

Low loss I/O

WG end face critic.

1st Level Coupling – Concepts & Analysis

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Waveguides

FR-4

250 mm w=50 mm w=75 mm

Optical Interconnect Demonstrator II: Board-embedded 4-ch waveguides, SMT mounted 10Gbps

OE-Modules, Micro-lens/micromirror I/O, Discrete micro-optics.

Vcc and control

signals for receiver

Transmitter (4x10 Gb/s,

BGA mounted)

Differential

data outputs

(connectors)

Optical build-up with 4x

8.3 cm waveguide array

Vcc and control signals for transmitter

Differential

data inputs

(connectors)

Receiver (4x10 Gb/s,

BGA mounted)

Passive alignment

structuresWaveguide

arrayLens

arrayMicro-

mirror

Optical 4x10 Gb/s Chip-to-Chip Data Link – DEMO II

Optics on Future Printed Circuit Board in

High Speed Data Transmission Applications

(OHIDA)

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Characterization of O-PCBs

• Path Losses and Optical Alignment Tolerances, using

– Precision translation stages for fibre-to-waveguide coupling

– Fibre-coupled (850 nm) light source;

match fiber NA and core diameter with waveguides

– Power meter coupled to step-index fibre;

fibre NA and core diameter a bit larger than of waveguide

• Data transmission: Eye Patterns and Bit-Error-Rate;

using PRBS data generator (and high-speed optical Tx & Rx)

Light

source Mover

X

Y

Z

Mover

X

YZ

Optical power

meter

Computer

Sample

(wg on PCB)Fiber Fiber

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On-Card Link Tests – Eye Diagrams at 10 Gb/s

Sender test Full linkOptical waveguideElectrical test lineL=8.2cm, FR4

Reference signal

4Gbit/s

10Gbit/s

Tx-MMF Tx-MMF-Rx

10Gbit/s 5Gbit/s

10Gbit/s

10Gbit/s

10Gbit/s

Optical data transmission on FR4Electrical

transmission on FR4

MMF-WG-MMF

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21

Two Separate Microlens Arrays – BGA Alignment

Tolerance

-24

-22

-20

-18

-16

-140 -100 -60 -20 20 60 100 140

Transversal misalignment [µm]

Loss [dB

]

Perpendicular to wg

Parallel to wg

-30

-27

-24

-21

-18

-15

-140 -100 -60 -20 20 60 100 140

Transversal misalignment [µm]

Lo

ss [d

B]

Perpendicular to wg

Parallel to wg

Loss increases only <1 dB,

when module-to-board

distance increased to 1 mm

(i.e. good collimation

between microlenses)

Waveguide width 75 μm Waveguide width 50 μm

PWB

Vacuum gripper

Tx module

8 cm long waveguides

Receiving fiber

(200µm)

Fiber couplerX

Y

Z

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Link Loss Analysis

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Coupling...1 – Integrated 45° µ-Mirrors

Optical coupling from/to waveguides

• Integrated 45° beam couplers for VCSEL-

WG interface

• Short optical path for direct coupling

without micro-optics with flip chip VCSELs

• Angle accuracy 45° ±0.5°

• Surface roughness: Ra < 30 nm

• Coupling loss

• 1.6 dB (TIR, measured)

• < 0.5 dB (HR coat, simulated)

• Fiber-fiber test with MMFin Ø 50µm for 50

µm WG, lower loss expected by SMFy = 0,7835x + 6,4912

y = 0,8466x + 6,6129

y = 0,8378x + 6,8539

2,00

4,00

6,00

8,00

10,00

12,00

14,00

16,00

0 2 4 6 8 10 12

Waveguide lenght [cm]

Inse

rtio

n L

oss

[dB

]

Channel # 7 Channel # 8 Channel # 9

Linear (Ch. # 7) Linear (Ch. # 8) Linear (Ch. # 9)

VCSEL Optical waveguideMirror

PD or edge

connector

Optical card or backplane

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Coupling...2 – Curved µ-Mirrors

In OutMMF, 50mm

=850 nm

cladding

guide cores

glass

substrate

Optical coupling from/to waveguides

• Integrated parabolic/circular shaped

micro mirrors for beam down-turns

• Multiple optical functions: 90° turn,

focus/collimation (in/out)

• Low tolerance for geometric

inaccuracies

• Surface roughness: Ra < 25 nm

• Coupling loss

• 0.33 dB (TIR [1])

[1] ETRI 2004

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Volume Scale O/E-PCB Manufacturing

• Fabrication of low-loss waveguides

– Channel length Ltyp 15-75 cm – defects vs. loss vs. yield

– Loss spec. < 0.1 (0.05) dB/cm with curves and crossings

– Roughness < 50 nm in sidewalls

– Thermal stability: Pressing conditions & Lead-free compliance

– Chemical stability: Alkaline and acid solutions, contamination,

absorption, moisture,..

– High sensitivity to process errors

• I/O end face and beam turns < 1-3 dB per I/O

• Large board size

– Deposition and patterning with high uniformity & accuracy

– Bending of PCB – stress-induced errors to RI & loss

– Adhesion strength

– Material cost in development

Targets

• Volume manufacturing of small size OE-PCBs and optical backplanes

• Panel size up to 500 x 600mm

Challenges

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Waveguides & I/O’s: Features and Specifications

Unit or criteria Target Spec.

Straights [dB/cm] 0.05

Curves [dB] per 180° bend, R=20mm 0.1

Rmin [mm] for 0.5 dB per 180°bend, Flex-WGs

<2.5

Crossings [dB] 0.02

Splitter [dB] per 50-50 split 0.1

Dispersion [Gb/s] Open eye ≥10 (> 1m)

Coupler (1st), chip-to-WG [dB] per turn (out-of-plane) < 1

Coupler (2nd), WG-to-conn [dB] per interface < 2

Substrate Rigid, flex

Channel length [m] OE-PCBs, O-flex, BPs 0.1- 1

Core dimensions [µm] Multimode, 35-70

Density [ch/mm] (pitch, L/S) 16 (62.5, 35/27.5)

Layer count Optical layers 2-4

Numbers at λ = 850nm

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Commercial Optical Waveguide Polymers

Table 1.B.1. Commercial polymers. Photoimageable liquid/ dry films OWG/WR materials for

multimode WGs on PCBs. Excluding non-photoimageable (e.g. RIE), moldable or ink-jet materials

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Type Loss [channel]RI

(Nco) RI (Ncl)D

(%) NA L/F APPL Remarks840 1300 1550 % SM/MM

NA 0,04 NA NA 1,586 1,543 2,7 0,37 FILM MMLaminatable dry film. Rigid and flexible waveguides

Siloxane 0,08 0,24 0,50 1,510 1,490 1,3 0,24 LIQ SM,MM For data + telecom applications

Acrylate 0,04 NA NA 1,550 1,520 1,9 0,30 LIQ SM,MM Many ref.users.

Siloxane 0,05 0,20 0,60 1,555 1,534 1,4 0,25 LIQ SM,MMMany ref.users. Data + telecom, micro-lenses

Acrylate 0,08 0,35 1,60 1,510 1,490 1,3 0,24 FILM SM,MM Technology lisencing required

Epoxy 0,10 NA NA 1,587 1,572 0,9 0,22 LIQ SM,MMMedium loss, low-cost, many univ. ref.users

BCB 0,80 0,80 1,50 1,550 1,500 3,2 0,39 LIQ SMHigh loss, high cure T. Many univ. ref.users

Siloxane - - - - - - - LIQ SM,MM Very low stress material. PNB 0,03 - - 1,54 1,50 2,6 - LIQ MM Low loss, high-Tg.

Epoxy 0,10 - - - - - - FILM MMAvailable 2010-2011. Feasible for flexes and rigids.

Polysilane - - - - - - - LIQ MM R&D productEpoxy 0,10 - - - - - - FILM MM Laminatable dry film, medium loss. Polyimide (-F)

0,18 - - - - - - FILM MM R&D product

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Optical Evaluation Card Designs

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50 µm

Lower

cladding

(clad-1)

Core

Top

cladding

(clad-2)

50 µm

50 µm100-250 µm 25-70 µm

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Base Materials for Opto-Electronic PCBs

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Tg vs. Td

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Base Materials for Opto-Electronic PCBs

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Dk vs. Df

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Optical PCB (2+W), Optical Buildup, Side-to-Side O-VIAs

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OWG

L1

L2

• 2+W

• Rigid OE-CB, FR4

• Thickness 0.95 mm

• Optical layer thickness: 275 µm

• Polymer waveguides

• NA=0.18, α ~ 0.1 dB/cm at 850 nm

• Integrated 45-deg beam couplers

• Optical vias from side-to-side

• Channel width/pitch: 100µm/1mm

• Large core and loose pitch for fast

characterization e.g. in reliability tests

45°

Gold

mirror

WG core

Beam pathOptical via

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32

Optical PCB (2+W+2), High Density Multichannel Array

in Optical Inner Layer

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WG

L1

L2

L5

L4

250µm

50µm

• 2+W+2

• Rigid OE-CB, FR4

• Thickness 2.0mm

• Optical layer thickness: 115 µm

• Channel width: 25-70µm

• Standard fiber pitch: 250 µm

• High density pitch: 100 µm

• Polymer waveguides

• NA=0.18, α ~ 0.1 dB/cm at 850nm

• Integrated 45-deg beam couplers

• Aggregate bandwidth: 125 Gbit/mm

(12.5 Gb/s source)

100µm

70µm

100µm

50µm

100µm

25µm

12 channels (12.5 Gb/s/ch) > 150 Gb/s

1.2cm

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33

Optical PCB (2+W), High Density Small Feature WGs

in Optical Buildup

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WG

L1

L2

100µm

50µm

100µm

25µm

100µm

12µm

L/S 50/50

L/S 25/75

L/S 12/88

• 2+W

• Rigid OE-CB, FR4

• Thickness 0.4 mm

• Optical layer thickness: 125 µm

• Channel width: 6, 12, 25, 50 µm

• High density pitch: 100 µm

• Polymer waveguides

• NA=0.18, α ~ 0.1 dB/cm at 850 nm

• Aggregate bandwidth: 125 Gbit/mm

(12.5 Gb/s source)

L/S 12/88 µm, 25/75, 50/50 µm

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34

2nd Level Coupling – Concepts & Analysis

34

90°-in-optics

Connector at card edge

90-deg beam turn inside conn.

With or without micro-optics

WGs on cards

WG end face critical

Near commercial connectors

Butt coupling

Connector at card edge

Direct coupling, no beam turn

No waveguides on cards

Potentially low loss

Manufacturing tolerances criticals

WG end face critical

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35

”EcoSystem” for Optical Board-Level Communication

Board-level

waveguide technology

Devices + Pkgs with

E/O/E conv. and

optical I/Os

Optical coupling techn. –

1st & 2nd level

Computer/ system

architectures

Simulation and design tools

Techn. standards

Mass-production and asse. techniques and tools

Supply chain,

mulitiple sources

TECHNOLOGY INFRASTRUCTURE

Commercial viability

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Summary

• High channel density over copper is one of the key drivers for

embedded optical waveguides on PCBs

• Manufacturing of waveguides, out-of-plane couplers and optical vias

on PCBs on panel scale boards challenging, yet possible

• Coupling and alignment accuracies are the most challenging parts in

realization of full optical card-backplane data link

• Reliability of materials and waveguides proven, – need for system-

level tests and specified performance targets – Telcordia, IPC, LF

• To meet cost target for opto

– Volume scale high yield manufacturing of optical PCBs and backplanes

– Applications and first-entry products

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37

Serve through People……Connect through Technology

Meadville value preposition / Business strategy

Continual Investment

in Technology

Increased Capacity

for High-End

and Complex PCBs

Capitalising on High

Margin, Strong Growth

Products

Early Involvement in

Product Development

Strategic Partnership with

Key Accounts

Your truly One Stop

Solution Partner!

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Serve through People……Connect through Technology

Thank

You!

Meadville Group

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39

39

Additional Data: Optical Design and Modelling

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40

OPTICAL DESIGN

WITH ALIGNMENT TOLERANCE ANALYSIS

Optimization of design for assembly

• Based on non-sequential ray tracing (using ASAP software)

– 3-D optomechanical system model

– Multimode VCSEL beam (measured profile)

– Ray-trace propagation through waveguide

1) Sensitivity analysis => Most critical tolerances are found

2) Monte Carlo analysis => Statistical information about performance (≈yield)

– Input parameters: fabrication & assembly tolerances

– All variables are simulated simultaneously

– Large number of randomly chosen perturbed systems

Example:

Fiber coupling

Example: Optical interconnect on circuit board

Measured VCSEL

beam

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41

Tolerance value (maximum misalignment) Tolerance

parameter Lens arrays VCSEL & PD Tx & Rx modules Mirrors

Shift x, y, z ± 10 / 15 µm ± 5 / 8 µm ± 20 / 60 µm ± 10 µm

Tilt x & y ± 0.1° / 2° ± 1° ± 1° ± 0.5°

Tilt z ± 0° ± 0° ± 1° ± 0.5°

Coupling loss [dB]

Num

ber

of

M.C

. syste

ms

Distributions of Monte Carlo systems with

altenative tolerance parameter sets

Example: OPTICAL DESIGN

WITH ALIGNMENT TOLERANCE ANALYSIS

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42

SIMULATION OF MICROLENS SCHEME

Model of full optical channel

Optimization by sensitivity analysis

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43

TOLERANCE ANALYSIS OF MICROLENS SCHEME

Distribution of 1000 Monte Carlo systems

Tolerance value (maximum misalignment)

Tolerance

parameter

VCSEL &

detector

Individual

lenses

Stacked lens

pairs

Transmitter &

receiver modules

Mirrors Receiver

module

Shift x,y ± 5 µm ± 10 µm ± 5 & 10 µm ± 15 µm ± 10 µm ± 15 µm

Shift z ± 5 µm ± 10 µm ± 10 µm ± 15 µm ± 10 µm ± 15 µm

Tilt x,y ± 1° ± 0.1° ± 0.5° ± 1° ± 0.5° ± 1°

Tilt z - - ± 1° ± 1° ± 0.5° ± 1°

0 2 4 6 8 10 12 140

20

40

60

80

100

Coupling loss [dB]

Pe

rce

nta

ge

of M

C s

yste

ms [%

]5-um lens-pair accuracy10-um lens-pair accuracy