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Electron Beam Analysis (EPMA, SEM-EDS)
Warren Straszheim, PhDEPMA, Ames Lab, 227 Wilhelm
SEM-EDS, MARL, 23 Town [email protected] 515-294-8187
With acknowledgements to John Donovan of the University of Oregon
Instrumental Techniques
• Excite
• measure characteristic response
• quantify by comparison to standards
Bulk or microanalysis
• Can excitation be focused?
• Can detector be focused?
Electron beam microanalysis
Excitation: focused electron beam
Sample interactions
secondary electrons
backscattered electrons
auger electrons
cathodoluminescence
absorbed current
X-rays
•Precise x-ray intensities
•High spectral resolution
•Sub-micron spatial resolution
•Matrix/standard independent
•Accurate quantitative chemistry
Electron-Sample Interactions
• characteristic emissions
• Be and heavier elements
• background (bremsstrahlung)
X-rays
Origin of X-ray Lines for K and L Transitions
X-ray Lines - K, L, MKa X-ray is produced due to removal of K shell electron, with L shell electron taking its place. Kb occurs in the case where K shell electron is replaced by electron from the M shell.
La X-ray is produced due to removal of L shell electron, replaced by M shell electron.
Ma X-ray is produced due to removal of M shell electron, replaced by N shell electron.
Differences between SEM and EPMA
Many shared components
Resulting from intent - imaging vs. analysis
Stability (higher for EPMA)
Current capability (higher for EPMA)
Spatial resolution (higher for SEM) via smaller spot and limited aberration correction
attached analyzer (EDS vs. WDS)
EDS vs. WDS
• technology – solid state crystal vs. wavelength spectrometer
• Resolution~126 eV vs 20eV
• P/B ratio
• Detection limit
• count rate limitations 500 kcps in total vs. 70 kcps/element
• parallel vs. serial operation
Spectral Resolution
WDS provides roughly an order of magnitude higher spectral resolution (sharper peaks) compared with EDS. Plotted here are resolutions of the 3 commonly used crystals, with the x-axis being the characteristic energy of detectable elements.
Note that for elements that are detectable by two spectrometers (e.g., Y La by TAP and PET, V Ka by PET and LIF), one of the two crystals will have superior resolution (but lower count rate).
Reed, 1995, Fig 13.11, in Williams, Goldstein and Newbury (Fiori volume)
Spectrometer Efficiency
The intensity of a WDS spectrometer is a function of the solid angle subtended by the crystal, reflection efficiency, and detector efficiency.
Reed (right) compared empirically the efficiency of various crystals vs EDS. However, the curves represent generation efficiency (recall overvoltage) and detection efficiency.
Reed, 1996, Fig 4.19, p. 63Reed suggests that the WDS spectrometer has ~10% the collection efficiency relative to the EDS detector.
How to explain the curvature of each crystal’s intensity function? At high Z, the overvoltage is presumably minimized (assuming Reed is using 15 or 20 keV). Low Z equates larger wavelength, and thus higher sinq, and thus the crystal is further away from the sample, with a smaller solid angle.
Effect of voltage
• Excitation volume goes as V1.7
• Available X-ray lines
• Calculations for Si
25kV 5um
15kV 2.5um
10kV 1.3um
5kV 0.4um
20kV
8kV
Typical steel spectrum, 15 kV
Lines available at low kV
Note overlap of V, Cr, Mn, and Fe. Also, O has its line at 0.53 keV.
Effect of current
spatial resolution reduced with high currents
greater sensitivity with high currents
• detectability
• precision/repeatability
Overlap considerations
• Smaller issue for WDS – effects background choices
• Deconvolution option for EDS if statistics permit
• Statistics become problematic if trace element on major element background
EDS Overlap: S, Mo, Hg
HgS std Line Type Wt% Wt% Sigma Atomic %
S K series 13.38 0.14 49.15
Hg M series 86.62 0.14 50.85
Total 100.00 100.00
Stoichiometry is on-the-mark - in this case.
WDS “overlap”: HgS, PbS, Mo
Note that signal drops to background in between most peaks. Mo tail interferes with S.
Rare earths by EDS and WDS
Pr peak fits between Ce La and Lb peaks.
Er
DyTb
EDS Atomic fractionCompound Fe Y Ce Pr Nd Gd Tb Dy Ho Er Lu
D5 Y2Fe17 88.49 11.51
B4 Ce2Fe17 89.05 10.95
B5 Pr2Fe17 88.39 11.61
C1 Nd2Fe17 88.81 11.19
C2 Gd2Fe17 90.12 9.88
C5 Tb2Fe17 86.21 13.79
D1 Dy2Fe17 88.43 11.57
D2 Ho2Fe17 87.59 12.41
D3 Er2Fe17 84.69 15.31
E2 Lu2Fe17 89.77 10.23
2/19 = 10.53%
Suitable samples
• solid/rigid
• stable under beam
• conductive (while under beam)
• nonconductive samples can be coated with C or metal (e.g., Au, Pt, Ir)(coating obscures features and elements but only a little)
Samples include
• Metals
• Geologic samples
• Ceramics
• Polymers
• Experimental materials
Quantitative Considerations
• Homogeneous (within excitation volume)
• Thick (enclosing interaction volume);therefore, problems with layered samples
• Known geometry (preferably “flat” compared to excitation volume; thus, polished); therefore problems with rough samples
• Be smart with construction (e.g., glass vs. Si)
• Standards collected each time vs.Standardless and normalization
Matrix effectsZ-A-F or Phi-Rho-Z corrections accounting for penetration depth, absorption, secondary fluorescence
Accuracy depends on well known curvature.
Alternatively, need standard in region for better results.
Range of Quantitation
100% down to 0.05% (500 ppm) EDS, 0.001% (10s of ppm) WDS
Limited by statistics, differentiation from background
More counts help!
Mapping and Line-scans
Point analysis are most sensitive to concentration differences (30s/point)
Line scans are next (500 ms/pixel)
Mapping is least sensitive (12 ms/pixel)
Graphics convey much information quickly(i.e., a picture is worth a thousand words)
Digital image showing regions of analysis and line-scan
Mg portion of overlapped peak
Ge portion of overlapped peak
Line-scan using typical windowsGe-Mg overlap causes problems
Line-scan using deconvolutionGe contribution is stripped from Mg profile
Regular mapping with overlaps
Mapping using deconvolution
EDS-WDS comparison
Characteristic EDS WDS
Geometric collection efficiency
(solid angle)<3% <0.2%
Spectral resolution (FWHM) <130 eV 2-10 eV
Instantaneous X-ray detection entire spectrum (0.2 keV thru E0) single wavelength (a few eV)
Maximum count rate100s of thousands cps
over entire spectrum
tens of thousands cps
(single wavelength)
Artifacts sum peaks, Si escape peaks, Si fluor. peakhigher order peaks,
Ar escape peaks
Low-Z limit = Be With thin window detector With synthetic "crystals"
Detection Limits 0.05 wt% (500 ppm) 0.001 wt% (10 ppm)
Bottom Line
Cheaper, quicker but some elements are too close
to resolve,
e.g., S-Ka, Mo-La, Pb-Ma
Slower, more expensive, but with better
resolution and higher peak/bkgd ratios
giving lower detection limits
“Harper’s Index” of EPMA1 nA of beam electrons = 10-9 coulomb/sec
1 electron’s charge = 1.6x 10-19 coulomb
ergo, 1 nA = 1010 electrons/sec
Probability that an electron will cause an ionization: 1 in 1000 to 1 in 10,000
ergo, 1 nA of electrons in one second will yield 106 ionizations/sec
Probability that ionization will yield characteristic X-ray (not Auger electron):
1 in 10 to 4 in 10.
ergo, our 1 nA of electrons in 1 second will yield 105 x-rays.
Probability of detection: for EDS, solid angle < 0.03 (1 in 30). WDS, <0.001
ergo 3000 x-rays/sec detected by EDS, and 100 by WDS. These are for pure
elements. For EDS, 10 wt% = 300 X-rays; 1 wt% = 30 x-rays; 0.1 wt % = 3 x-ray/sec.
ergo, counting statistics are very important, and we need to get as high count rates
as possible within good operating practices.From Lehigh Microscopy Summer School
Raw data needs correctionThis plot of Fe Ka X-
ray intensity data
demonstrates why we
must correct for matrix
effects. Here 3 Fe alloys
show distinct variations.
Consider the 3 alloys at
40% Fe. X-ray intensity
of the Fe-Ni alloy is
~5% higher than for the
Fe-Mn, and the Fe-Cr is
~5% lower than the Fe-
Mn. Thus, we cannot
use the raw X-ray
intensity to determine
the compositions of the
Fe-Ni and Fe-Cr alloys.
(Note the hyperbolic functionality of the upper and lower curves)
n l s m j number of
electrons
Sub shell X-ray
notation1 0 ½ 0 ½ 2 1s K
2 0 ½ 0 ½ 2 2s LI
2 1 LII
2 1 ½ -1, 0, 1 ½
½
½
6 2p LIII
3 0 ½ 0 ½ 2 3s MI
3 1 MII
3 1 ½ -1, 0, 1 ½
½
½
6 3p
MIII
3 2 MIV
3 2 ½ -2, -1, 0,
1, 2 ½
½
½
½
½
10 3d
MV
n = principal quantum number and indicates the electron shell or orbit (n=1=K, n=2=L, n=3=M, n=4=N) of the
Bohr model. Number of electrons per shell = 2n2
l = orbital quantum number of each shell, or orbital angular momentum, values from 0 to n –1
Electrons have spin denoted by the letter s, angular momentum axis spin, restricted to +/- ½ due to magnetic
coupling between spin and orbital angular momentum, the total angular momentum is described by j = l + s
In a magnetic field the angular momentum takes on specific directions denoted by the quantum number m <= ABS(j)
or m = -l… -2, -1, 0, 1, 2 … +l
Rules for Allowable Combinations of Quantum Numbers:
The three quantum numbers (n, l, and m) that describe an orbital must be integers.
"n" cannot be zero. "n" = 1, 2, 3, 4...
"l" can be any integer between zero and (n-1), e.g. If n = 4, l can be 0, 1, 2, or 3.
"m" can be any integer between -l and +l. e.g. If l = 2, m can be -2, -1, 0, 1, or 2.
"s" is arbitrarily assigned as +1/2 or –1/2, but for any one subshell (n, l, m combination), there can only
be one of each. (1 photon = 1 unit of angular momentum and must be conserved, that is no ½ units,
hence “forbidden transitions)
No two electrons in an atom can have
the same exact set of quantum
numbers and therefore the same
energy. (Of course if they did, we
couldn’t observably differentiate them
but that’s how the model works.)
One slide Schrödinger Model of the Atom