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Some Application of Instrumentation Engg. / Automotive
Sensors
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1 of or S7 ECE 2013
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Some Application of Instrumentation Engg. /Aviation
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Some Application of Instrumentation Engg. /Atomic Energy
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Some Application of Instrumentation Engg. /Medical Imaging
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Some Application of Instrumentation Engg. /Furnace
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Some Application of Instrumentation Engg. /Chemical Plant
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Some Application of Instrumentation Engg. /Robotics
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References1. Measurement Systems:
Ernest Doeblin & Dhanesh N Manik
2. Electronic Instrumentation:
H S Kalsi
3. Modern Electronic Instrumentation and Measurement
techniques:
Albert D Helfrick & William D Cooper
4. Measurement & Instrumentation Principles:
Alan S Morris
5. Transducers & Instrumentation:
D.V. S Murthy
ELECTRONIC INSTRUMENTATIONEC 010 704 (Syllabus) 3hours
lectureand 1hour tutorialper week
Introductory Slides for Electronic Instrumentation (EC 010 Page
8 of or S7 ECE 2013
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References6. Electronic Instrumentation and Measurements
David A Bell
7. Instrumentation-Devices and Systems:
C S Rangan, SG R arma & V S V Mani,
8. Electronic Measurements and Instrumentation:
R K Rajput,
9. Measurements and Instrumentation:
U A Bakshi, A V Bakshi,
10. A Course in Electrical and Electronic Measurements and
Instrumentation:
A K Sawhney,
ELECTRONIC INSTRUMENTATIONEC 010 704 (Syllabus) 3hours
lectureand 1hour tutorialper week
Introductory Slides for Electronic Instrumentation (EC 010 Page
9 of or S7 ECE 2013
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References11. A Course in Electrical and Electronic Measurements
and Instrumentation:
J B Gupta,
ELECTRONIC INSTRUMENTATIONEC 010 704 (Syllabus) 3hours
lectureand 1hour tutorialper week
Introductory Slides for Electronic Instrumentation (EC 010 Page
10 of or S7 ECE 2013
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Engg.,
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Module 1(12 hrs)
Introduction to Electronic Instrumentation
ELECTRONIC INSTRUMENTATIONEC 010 704 (Syllabus) 3hours
lectureand 1hour tutorialper week
Introductory Slides for Electronic Instrumentation (EC 010 Page
11 of or S7 ECE 2013
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Engg.,
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Module 2(12 hrs)Transducers
ELECTRONIC INSTRUMENTATIONEC 010 704 (Syllabus) 3hours
lectureand 1hour tutorialper week
Introductory Slides for Electronic Instrumentation (EC 010 Page
12 of or S7 ECE 2013
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Engg.,
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Module 3(12 hrs)Intermediate elements
ELECTRONIC INSTRUMENTATIONEC 010 704 (Syllabus) 3hours
lectureand 1hour tutorialper week
y f ( g f
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Engg.,
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Module 4(12 hrs)End devices
ELECTRONIC INSTRUMENTATIONEC 010 704 (Syllabus) 3hours
lectureand 1hour tutorialper week
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Engg.,
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Module 5(12 hrs)
Basic measurements
ELECTRONIC INSTRUMENTATIONEC 010 704 (Syllabus) 3hours
lectureand 1hour tutorialper week
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Module 1(12 hrs)
Introduction to Electronic Instrumentation
ELECTRONIC INSTRUMENTATIONEC 010 704 (Syllabus) 3hours
lectureand 1hour tutorialper week
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
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Introduction to Measurement and InstrumentationoMeasurement
o
o result of
o quantitative comparison betw
opredetermined standard o unknown magnitude
oprocedure apparatus
ofor comparison
o must be provable
o
o calibration
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Measurandophysical quantity
o characteristic condition
o object of
o
measurement instrumentation -systemo
o"measurand"
omeasurement variable"
o"instrumentation variable"
o"process variable"
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Engg.,
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Measurement Process
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Engg.,
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Measurand
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Basic Requirements for Getting MeaningfulResult of
Measurement
standard for compariso
o must be accurately defined and
o commonly acceptable.
standard
o same character as the measurandand
o usually, but not defined by
o recognized agency
o e.g., Bureau of Indian Standards (BIS) or
o the International Organisation of Standards (ISO)
3. The apparatusused and methodadopted
o forthe comparisonpurposes
o must beprovable.
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Engg.,
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Instrumentation
o tech
o instrument
o measure control
o
phy chepropo materials
o
o"instrumentation".
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Engg.,
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Process Instrumentation
o instrument used
omeasurement and controlof
oindustrial manufacturing,
o
conversionortreatment process,othe term
o"process instrumentation
o
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Engg.,
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Control System
o measuring
ocontrolling instrument
o
omeasurprovide
oimpulses
oremote automa tion
o
ocontrol system
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Engg.,
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Modes of Measurement
oPrimary
o
Secondary .oTertiary .
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Engg.,
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Primary Measurement
o
ocomparing directlywith
orefstandard
oNo conversion measurand
o
terms of lengthoE.g.:
o time ounting
o strokes of clock
o determining length
o
with ruler
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
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Secondary Measurement
oIndirect
o 'one translation
o
osecondary measurements
E.g. :
oPressure
o
manometers.oTemperature
o mercury thermometers
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
T i M
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Tertiary MeasurementoIndirect
o'two conversions
otertiary
o
o temperature
o thermocouple
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
G li d M t S t d
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Generalised Measurement System andits Functional Elements
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
P i i l t
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Primary sensing element
o sensitive
omeasured variable
oSensethe
ocondition,
ostateor
ovalueofthe
oprocess variableby
o
extractingasmall part of energyofrom the measurand,and
oproducesan output
owhich reflects this
ocondition,state or value of the
omeasurand.
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
V i bl i f t d l t
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Variable conversion of transducer element
oConvertssignalfrom
o
onephysicalform anotherowithout changing
oinformation content signal
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Manipulation element
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Manipulation element
oOperate onsignal
o
according to math ruleowithout changing physical nature
o variable
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Data transmission element
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Data transmission element
oTransmit signal
o
one location anotherowithout changing
oinformation contents
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Data presentation element
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Data presentation element
oProvide indication
o
output from omanipulation elements
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Data presentation element
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Data presentation element
oProvide indication
o
output from omanipulation elements
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
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Static Characteristics
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oAccuracy
odegree of exactness measur
ocompared to expected) value
oResolution
osmallest change measur variable
oto which instrument respondoPrecision
omeasur consistency
osuccessive reading not differ
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Static Characteristics
Class Slides for Electronic Instrumentation (EC 010 704) Page 27
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oError
odeviation of true value
ofrom desired value
oSensitivity
oratio change in output
oto change input
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Error in Measurement
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nXnYe
o Measur introduce error
o expressed
o absol perc error
o Absolute error
o
o expected value
o measured value
o
o % error 100
n
Y
nX
nY
nX
n
Y
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Error in Measurement
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n
nn
X
XX
1
oRelative accuracy
o% Accuracy a
o
Precision P
o
o value nthmeasur
o average measure
100A
nX
nX
n
nn
Y
XYA
1
error%-100%
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Error in Measurement
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o
Rel accuracy
o% Accuracy a
oPrecision P
o
o val nth
measur
o average set of measur
100A
nX
n
nn
X
XX 1
nX
n
nn
Y
XYA
1
error%-100%
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Example 1 1
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Example 1.1
expected voltage 80V
measurement 79V
Calculate,
absolute error
% error relative accuracy
% accuracy
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Solution (Example 1.1)
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( p )
o Given expected value 80Vo measurement value 79V
Absolute error e = 80V 79V = 1V
% error 1.25%
Relative accuracy, 0.9875
% accuracy a 0.9875 x 100%=98.75%
nXnY
10080
7980
100
nY
nXnY
n
nn
Y
XY
A
1
%100A
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Example 1.2
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Example 1.2o
o precision of 6th measur
o Solution
o average measur value
o
o 6threading Precision
No Xn
1 98
2 101
3 102
4 97
5 101
6 100
7 103
8 98
9 106
10 99
5.10010
1005
10
99....10198
nX
99505100
501
5100
51001001 .
.
.
.
.
n
nn
X
XX 1
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Significant Figures
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g f go Significant figure
o actual information reg o mag prec
o More significant figure
o greater precision
Example 1.3
Findprecision X1X2
===>> 2 s.f
===>> 3 s.f5.98
98
101
2
1
X
X
Xn
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Solution (Example 1 3)
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Solution (Example 1.3)
===>> 2 s.f
===>> 3 s.f
Precision
5.98
98
101
2
1
X
X
Xn
1X 97.0101
10198
1
975.0
101
1015.981
2X Precision = ===>more precise
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Significant Figures (cont)
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g g ( )
o Rules for significant figures
All non-zero sig
Zeros bet two non-zero sig
Leading zeros not sig
Trailing zeros sig
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Significant Figures (cont)
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g g ( )Example
o 1 20 300 1,2,3 sig
o 123.45 5 sig
o 1001 4 sig
o
100.02 5 sig
o 0.00001 5 sig
o 1.100 2 sig
o 0.00100 3 sig
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Types of Static Error
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Types of Static Error
1) Grosshuman
2) Systematic
3) Random
Gross Error
o human mistakes reading instruments
o cannot eliminate can minimize
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Types of Static Error (Cont)
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Systematic Error
shortcomingsof instrument
defective worn parts
3 types
Instrumental
Environmental
Observational
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Types of Static Error (Cont)
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Instrumental error
o
o mechanical structure
o bearing friction irregular spring tensionstretching of
spring
o avoided by
select suitable instrument
particular appli
correction factor
calibrate instrument
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Types of Static Error (Cont)
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yp ( )
Environmental erroro external condition
o inclsurrounding area condition
osuch as temperature, humidity,
obarometer pressure
o toavoid error
air conditioner
sealing component instrument
magnetic shields
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Engg.,
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Types of Static Error (Cont)
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Random error
o unknown causes
oall systematic error accounted
o accumulation of small effect
oa high degree of accuracy
o avoided by
o increasing number of reading
ostatistical means
obest approximation of true value
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Dynamic CharacteristicsClass Slides for Electronic
Instrumentation (EC 010 704) Page 44 of or S7 ECE 2013
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o
Instr rarely respond instantaneously
o changesin measured variables
o
omass,
o thermal capacitance,
ofluid capacitance
oelectrical capacitance
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Dynamic CharacteristicsClass Slides for Electronic
Instrumentation (EC 010 704) Page 45 of or S7 ECE 2013
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o most common variations
o
oStep change
oLinear change
oSinusoidal change
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Dynamic CharacteristicsClass Slides for Electronic
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oStep change
oprimary element subj
o inst finitechange
o measured variable
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Engg.,
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oLinear change
oprimary element follow
o measured variable
ochang linearly time
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Engg.,
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Dynamic CharacteristicsClass Slides for Electronic
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o dynamic characteristics of instrument
oSpeed of response
o rapidity
o instrument respond
o changes in measured quantity
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
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oDynamic error
o diff betw
otrue measured value
o no static error
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
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o Lag
odelay response
o instrument to
ochanges in measured variable
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Engg.,
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o
Fidelity
o degree to which instr
o indicates change in
o measured variable
owithout dynamic error
o (faithful reproduction).
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Limiting Error
f i
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o accuracy of instr
o guaranteedwithin certain percentage of
o full scale reading
o manuf specify instr
o accurate at 2 %
o with full scale deflection
o reading less than full scale
o limiting error increases
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Limiting Error (Cont)
Example 1 6
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Example 1.6
o 600 V voltmeter accuracy 2% full scale
o Calc limiting error when instru
oused to measur 250V
o mag of limiting error
o 0.02 x 600 = 12V
o limiting error for 250V
o (12/250) x 100 = 4.8%
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Limiting Error (Cont)
Class Slides for Electronic Instrumentation (EC 010 704) Page 55
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o
o limiting error voltmeter at 70V 2.143%
o
limiting error ammeter 80mA 2.813%.
o Determine limiting error of the power
o limiting error for the power
o 2.143% + 2.813%
o = 4.956%
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
StandardClass Slides for Electronic Instrumentation (EC 010 704)
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o standard
oknown accurate measure
o
o used to determine
o values other physical quantities
o comparison method
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
StandardClass Slides for Electronic Instrumentation (EC 010 704)
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o
All standardspreserved
oBureau International des Poids et Mesures
o(BIPM)
o International Bureau of Weight and Measures
o
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Standard
o
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o
Four categories of standard
o InternationalStandard
o PrimaryStandard
oSecondaryStandard
oWorkingStandard
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
o International Std
International Standard
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o International Std
oDefi nternational Agreement
o
Rep
oclosest possible accuracy attainable
ocurrent sciencetechnology.
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
o Primary Std
Primary Standard
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o Primary Std
o Maintained National Std Lab
o
o Function
o calibration and verification
osecondary std
o
Each lab own secondary std
o periodically checkedcertified
o National Std LabGathered aison, C.S. (Asst. Prof. in mal
Jyothi College of Engg.,
o Secondary Std
Secondary Standard
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o Secondary Std
o basic refstd used by
omeasurement calibration lab
o in industries
o maintained by
oparticular industry
o .
o Each industry
o own secondary standard
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
o
Working Standard
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o
Working Std
o
ocheck calibrate lab instrument
oaccuracy performance.
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Calibration
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oproc
o
det correct values
o measurand
o comparison
ostandardones
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
o
Calibration
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o
std device ocomparison made
ostandardinstrument
o
instrument is unknown
o to be calibrated
otest instrument
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
o two methodologies
Calibration
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g
o obtaining comparison betw
o
test instrument standardinstrument
oDirect comparisons
o
Indirectcomparisons
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Calibration Curve
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o calibration curve
o
oyields informationpertaining to
o readingsseveral input values
oselected withinfull-scale value
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Calibration Curve
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o Its represented as,
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Calibration Curve
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
o generator applies
Direct Comparison
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o known input the meterunder test
o ratioof
o meter indicat
o knowngenerator values
ogives meter's error
o meter test instrument
o
ogenerator standard instrument
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Direct Comparison
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Direct ComparisonoWith of direct comparison
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ogenerator also can be calibrated
o
othe meter standard instrument
o the generator
o test instrument
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Direct Comparison
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Indirect Comparison
o
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compared with oresponsestandard instrument
osame type
o
oif test inst meter
ostandard is also meter
oif test inst generator
ostandard also generator
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Indirect Comparison
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Units (Fundamental & Supplementary)o i
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ounits
oindependently chosen
onot dependent other units
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
od i d f
Units(Derived)
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oderivedfrom
ofundamental supplementary units.
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Engg.,
Units (Derived)Class Slides for Electronic Instrumentation (EC
010 704) Page 77 of or S7 ECE 2013
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Engg.,
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SI PrefixesClass Slides for Electronic Instrumentation (EC 010
704) Page 80 of or S7 ECE 2013
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Engg.,
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Instrument Application Guide
o
Selection care use instrument
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Selection, care use instrumento Before using
othoroughly familiarize
o its operation
o** read the manual carefully
o Select instrumentprovide
odegree of accuracy required
o(accuracy + resolution + cost)
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Instrument Application Guideo Selection, care use instrument
B f i
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o Before using
o doinspection for
o physical problem
o Before connecting
o
to circuitomake sure function switch
o range selector switch
o set-up
oproper function range
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Engg.,
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Transducers
o
Transducer
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Transducer o transforms energy
ofrom one form another
o
o
omechanical force into
o electrical signal
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Electrical Transducers
o to measure non-electrical quantities
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o detector used
o converts
ophysical to displacement
o displacement actuates
o electric transducer
oacting as secondarytransducer
o output
oelectricalin nature
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Advantages of Electrical Transducers
o Electricalamplification attenuation
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o
o mass-inertia effects minimised
o effects of friction minimised
o Controlled with small power level
o output
o used transmittedprocessed
o Miniaturization easily.
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Transducer (General Structure)
o transducer two parts:
o Sensing or Detector Element
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o Sensingor Detector Element
o responds to
o change in physical phenomenon &
o Transduction Element
o transforms outputofsensing elemento to electrical output
o acts as asecondary transducer
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Transducer (Classification)
o
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basis of transductionform used
ii. asprimary andsecondary transducers,
iii. aspassiveand active transducers,
iv. as analogueand digitaltransducers, and
v. as transducersand inversetransducers
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Engg.,
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Classification asPrimary and Secondary Transducers
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Engg.,
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Classification asPassive and Active Transducers
o Passive Transducers
o derivepowerfor transduction from
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o auxiliary power source
o "externally powered transducers".
o Active transducers
o do not require auxiliary power source produce output
o self generating type
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Classification asAnalogue and Digital Transducers
o Analogue Transducers.
t i t i t
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o convert input into
o
analogueoutput
o continuousfunction of time
o Digital Transducers.
o convert input into
o electrical output
o form ofpulses
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Engg.,
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Transducer (Classification)
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Transducer (Classification)
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Engg.,
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Transducer (Classification)
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Transducer (Classification)
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Basic Requirements of a Transducer
Ruggedness
oAbility withstand overloads
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y
osafety stops overload protection
Linearity
oAbility reproduceinput-output chara
o
symmetricallylinearlyOverall linearity is the main factor
considered.
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Basic Requirements of a Transducer
Repeatability:
oAbility reproduce outputsignal
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y p p g
o whensame measurand applied
orepeatedlysame environmental conditions
Convenient instrumentation:
o
highanalogue outputsignalo highsignal to noise ratio
Digital output preferred in many cases.
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Basic Requirements of a Transducer
High stability and reliability:
oMin error measurement
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ounaffected temperature, vibration
o environmental variations
Good Dynamic response:
o
Outputfaithful inputo taken asfunction of time
The effect is analysed as the frequency response.
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Basic Requirements of a Transducer
Excellent Mechanical Characteristics:
o affectperformance
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ostatic quasi-static dynamic states
major effects
Mechanical hysteresis-
o
imperfect response osensing elements
oIntegrated over dimensions
ostrained transducer
Effect depends on the raw material used, ageing, etc.
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Basic Requirements of a Transducer
Viscous flow or creep
o due to viscous flow material
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oofsensing element
oMagnitudeincreases
oincreasing loadtemperature
Materials low melting point larger creep values
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Basic Requirements of a Transducer
Elastic after effect
o continued deformation
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oload applied kept constant
decreases with time
oLike creep similar relaxation towards
o
originalpositionowhen load removed.
Virtually no residual deformation is observed.
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Basic Requirements of a Transducer
Built-in integrated device
o noise,
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oasymmetry
oother defects minimized
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Engg.,
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Basic Requirements of a Transducer
Repeatability:
oAbility reproduce outputsignal
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o whensame measurand applied
orepeatedlysame environmental conditions
Convenient instrumentation:
o highanalogue outputsignal
o highsignal to noise ratio
Digital output preferred in many cases.
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Basic Requirements of a Transducer
High stability and reliability:
oMin error measurement
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ounaffected temperature, vibration
o environmental variations
Good Dynamic response:
oOutputfaithful input
o taken asfunction of time
The effect is analysed as the frequency response.
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
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Basic Requirements of a Transducer
Viscous flow or creep
o due to viscous flow material
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oofsensing element
oMagnitudeincreases
oincreasing loadtemperature
Materials low melting point larger creep values
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Basic Requirements of a Transducer
Elastic after effect
o continued deformation
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oload applied kept constant
decreases with time
oLike creep similar relaxation towards
o originalposition
owhen load removed.
Virtually no residual deformation is observed.
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
-
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Resistive Transducers
oResistance metal conductor
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Potentiometric Transducers
o POT
o resistiveelement with
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oslidingcontact
osliding contact wiper
o motion of sliding contact
oranslatory rotational
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Helipots
o combinationof
oi.e., translationalas well as rotational.
oTheirresistive element form of
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f f
ohelix
o helipots.
o helical elements
omulti-turm
o can be used for
o translationalor rotarymotion
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Linear POT
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Rotational POT
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Helical POT
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Diagrammatic Representations of POTs
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Diagrammatic Representations of POTs
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Construction of POTs
o resistive body
o wire wound
o thin platinum nickel alloy
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o thin platinum nickelalloy
o wound insulatedformer
o elements also made
ocermet
o mouldedcarbon
ocarbon film
othin metal
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
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Analysis on Working of POTs
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Capacitive Transducers
o
ProximityTransducers.oDisplacement Transducer.
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oDisplacementTransducer.
oNon-loading,oNon-contact, and
oNon-invasive
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Capacitive Transducers
o
o parallel plate capacitor
d
AC r
0
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dowhere,
o0= absolute permittivity offree space
or= dielectric constant of the mediumbetween the plates
(relative permittivity)
oA = areaof theplates
od= distanceof separation between theplates
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Properties of Some Dielectric Materials
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Capacitive Thickness Transducer
oplates arranged
osheet
o passed betweenplates
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o
without touching them
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Capacitive Thickness Transducer
oCapacitance of theSystem:
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owhere:
oatotal separation betweenplates
otthicknessofthesheet
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Capacitive Thickness Transducero increasein
o thickness sheettocausesanincreaseof
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othe capacitancebyC, and hence
oSolvingfor C/C0
owhere:
oN=Sensitivity Factor
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Capacitive Displacement Transducer
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Capacitive Displacement Transducer
oIf air gap decreased x
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oIf air gap decreasedx,
othe capacitanceincreases byC
owhere,
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Capacitive Displacement Transducer(Using Movable Dielectric
Core)
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Capacitive Proximity Transducer
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Capacitive Proximity Transducer
oThe OutputSignal,
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where:
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Capacitive Strain Transducer
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Capacitive Strain Transducer
Class Slides for Electronic Instrumentation (EC 010 704) Page 60
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where:
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Variable Area Capacitive Transducer
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
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Variable Area Capacitive Transducer
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where:
When the teethalignment changes &
oeffective contactlength becomes l
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Variable Area Capacitive Transducer
oFractional Changein Capacitance,
C
otoChange in length l
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where:
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Capacitive Pressure Transducer
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Capacitive Pressure Transducer
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Capacitive Microphone
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Capacitive Level Transducer
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Capacitive Level Transducer
oCapacitance
odue to two columns
oliquidandvapour
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Capacitive Moisture Transducer
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Capacitive Hygrometer
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Peizo-Electric Transducers
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Peizo-Electric Transducersosymmetrical crystalline materials
o Quartz Rochelle salt Barium titanate
oproduceemf
owhen placedunder stress
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o peizo electric transducers
o a crystal placed between solid base
oforce-summing member
oconversely varying potential
o proper axis of crystal
o
changedimensionsoof crystal
odeforming it
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Peizo-Electric Transducers
o twomain groups piezoelectric crystals
oNatural crystals
o(quartz and tourmaline).
o
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o
Synthetic crystalso(Rochelle salt, lithium sulphate,
odipotassium tartrate etc).
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Desirable Propertiesof Piezoelectric Materials
Stability.
High output.
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Insensitivity to temperature and humidity.
The ability to be formed into most desirable shape
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Natural vs.SyntheticPiezoelectric Materials
Advantages
Natural crystals :
(i) Higher mechanical and thermal stability.
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(ii) Ability to withstand higher stresses.
(iii) Low leakage.
(iv) Good frequency response.
Synthetic materials
ohave a higher voltage sensitivity.
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Working Principleof Piezoelectric Materials
oThe magnitudeandpolarityof
othe induced charge onthe crystalsurfaceis
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oproportional to
othe magnitudeand direction of
othe appliedforce.
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Working Principleof Piezoelectric Materials
oThe chargeatthe electrode
ogives rise to voltage (E),given by,
,
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o
Where;
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Advantages &Disadvantagesof Piezoelectric Transducers
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Proximity Sensors
oproximity sensor consists of
oan element that changeseither itsstate
oor an analogue signal
owhenit is closeto an object.
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o(often not actually touching)
oMagnetic,
o capacitance
oinductance
oeddy current o
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
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Eddy Current Proximity Sensor
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Eddy Current Proximity Sensor
o coilsupplied with a c
o alternating magnetic field produced
oIf metal inclose proximity
oto magnetic field
oeddy currents induced in it
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o eddy currents producea magnetic field
o distorts the magnetic responsible for their production
o
impedance of the coil changes andsoothe amplitude of the
alternating current.
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Advantages ofEddy Current Proximity Sensor
Small in size.
Relatively inexpensive.
Hi h fl ibilit
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High flexibility.
High sensitivity to small displacements.
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Capacitance Proximity Sensor
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Capacitance Proximity Sensor
o consists of simple plate
o
owith object(earthed)
o as other plate
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o as other plate
oAs object approaches sensor
oseparation betw plate
o and object changes
o significant
oas object close tosensor.
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
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Hall Voltage
o currentin N-typespecimen
o carried by electrons
o electrons, as result Hall effect,
oaccumulate side 1
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oaccumulateside 1
o gets negatively charged
orelative toside 2
oConsequently potential difference develops
obetween 12
ocalled 'Hall voltage' (V H).
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Hall Voltage
oHall voltage in an N-typesemiconductor
o ispositive surface 2
o
o P type
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o P-type
o
opositivesurface 1
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Hall Voltage
o magnitude Hall voltage (VH)
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oWhere;
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Uses of Hall Effect Hall effect may be used for:
1. Determining
o N-type or P-type
2. Determining carrier concentration
3. Calculating mobility
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3. Calculating mobility
o (having measured the conductivity).
4. Magnetic field meter.oThe Hall voltage V Hforagiven
current
oisproportional to B.
o V H
omeasuresthe magnetic field B.
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Uses of Hall Effect
Hall effect multiplier.
oThe instrument gives an outputproportional to
otheproduct of two signals
o
ifcurrent Iis madeproportional to one input and
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f p p poif Bisproportional to second input
o Hall voltage V Hisproportional to
otheproduct of the two inputs
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Hall EffectDisplacement Transducer
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Hall EffectDisplacement Transducer
o measure linear displ or
o locatestructural element
oin cases where it is possible to
ochange the magnetic field strength
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g g f g
oby variation inthegeometry of
oa magnetic structure.
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Hall EffectDisplacement TransduceroThe Hall effect element
located in gap
oadjto permanent magnet
ofield strength in gap
odue to permanent member
o changed by changing
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o changed by changing
oposition of ferromagnetic plate
oThe voltage output Hall effect element
opropto field strength
oingap function of the position displacement
oofferromagnetic plate
owith respect to structure.
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Hall Effect Fluid Level Transducer
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Hall Effect Fluid Level Transducer
o magnet attached to float
oas level changes
o float distance
ofrom Hall sensor changes
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f g
o result Hall voltage output
o a measure of
o distance of float from
osensor hence level
oof the fuel in tank
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Hall Effect
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
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Hall Voltage
oCurrentin N-typespecimen
o carried by electrons
o electrons, as result Hall effect,
oaccumulateside 1
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o gets negatively charged
orelative toside 2
oConsequently potential difference develops
obetween 12
ocalled 'Hall voltage' (V H).
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Hall Voltage
oHall voltage in an N-typesemiconductor
o ispositive surface 2
oOn the other hand,
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,
o P-type
o
o
positivesurface 1
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
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Uses of Hall Effect Hall effect may be used for:
1. Determining
o N-type or P-type
2. Determining carrier concentration
3. Calculating mobility
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o (having measured the conductivity).
4. Magnetic field meter.oThe Hall voltage V Hforagiven
current
oisproportional to B.
o V H
omeasuresthe magnetic field B.
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Uses of Hall Effect
Hall effect multiplier.
oThe instrument gives an outputproportional to
otheproduct of two signals
o ifcurrent Iis madeproportional to one input and
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oif Bisproportional to second input
o Hall voltage V Hisproportional to
otheproduct of the two inputs
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Hall EffectDisplacement Transducer
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Hall EffectDisplacement Transducer
o measure linear displ or
o locatestructural element
oin cases where it is possible to
ochange the magnetic field strength
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o by variation inthegeometry of
oa magnetic structure.
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Hall EffectDisplacement Transducer
oThe Hall effect element located in gap
oadjto permanent magnet
ofield strength in gap
odue to permanent member
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o changed by changing
oposition of ferromagnetic plate
oThe voltage output Hall effect element
opropto field strength
oingap function of the position displacement
oofferromagnetic plate
owith respect to structure.
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Hall Effect Fluid Level Transducer
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Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
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Variable Inductance Transducers
o
ochange magnetic characteristic
o
of electrical circuitoin response to measure
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oinresponse to measure
o
odisplacement,
ovelocity,
oacceleration
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Types of Variable Inductance Transducers
1. Self-generating type.
o voltageisgeneratedbecause of
o the relative motionbetween
o a conductorand a magnetic field.
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o classified as follows:
Electro-magnetic
Electro-dynamictype.
Eddy current
Gathered aison, C.S. (Asst. Prof. in mal Jyothi College of
Engg.,
Passive type
o motionof an object resultsin
ochanges in the inductanceof the coils
oof the transducer.
classified
Types of Variable Inductance Transducers
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