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© 2013 Agilent Technologies EW Testing: Capture, Measurement, and Emulation Presented by: Walt Schulte, Agilent Technologies

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© 2013 Agilent Technologies

EW Testing: Capture, Measurement, and Emulation

Presented by: Walt Schulte, Agilent Technologies

© 2013 Agilent Technologies 2

© 2013 Agilent Technologies

Problem

• Jamming is a response to an identified radar signal

• Jamming techniques take time to work

• You must therefore capture and analyze an entire jamming event

© 2013 Agilent Technologies

Measurement Challenges: Dynamic PRI

1. 2.

• Signal Source: PRI increasing from 50 us to 100 us in 100 pulses

• Signal Analyzer: RBW < .3 x min PRF

Single sweep, delta marker:

PRF = 12.750 kHz Single sweep, delta marker:

PRF = 17 kHz

© 2013 Agilent Technologies 4

© 2013 Agilent Technologies

Measurement Challenges: Dynamic PRI

• Limited analysis time

• Scalar only: no doppler/phase

• Painful automation

© 2013 Agilent Technologies 5

© 2013 Agilent Technologies

Measurement Challenges: Dynamic Doppler

• Sweep times too slow relative to rate of doppler change

• Display shows a swept spectrum over entire sweep time

© 2013 Agilent Technologies

• Capture the Event

• Measure the Event

Solution

PXA

89600

VSA

© 2013 Agilent Technologies 7

© 2013 Agilent Technologies

Solution: Test Setup

DUT

(Jammer)

Agilent X-Series

Analyzer

LAN

Computer

w/Agilent 89600

VSA

• Digitize

• Record

• Analyze

Caution: Max. input

power +30 dBm (1 Watt)

© 2013 Agilent Technologies 8

© 2013 Agilent Technologies

Alternative Setup

DUT

(Jammer)

Agilent X-Series

Analyzer running

VSA internally

• Digitize

• Record

•Analyze

Caution: Max. input

power +30 dBm (1 Watt)

© 2013 Agilent Technologies 9

© 2013 Agilent Technologies

Agenda

Transmitter Test

• Capture

• Measurement

Receiver Test

• Emulation

© 2013 Agilent Technologies 10

© 2013 Agilent Technologies

Capture: Span/Record Length

1

10

100

1000

1 10 100 1000

Cap

ture

Len

gth

(sec)

Measurement Span (MHz)

PXA Capture Length vs. Span

Spanxfs 28.1

© 2013 Agilent Technologies 11

© 2013 Agilent Technologies

Capture: Span

rtBW /35.

devchirpBW -or-

1.

2. xBWfs 5

3. 28.1/sfspan

.35/30ns ~ 12 MHz

5 x 12 MHz = 60 MHz

60 MHz/1.28 = 46 MHz

46 MHz ~ 50 MHz

© 2013 Agilent Technologies

• Multiple options available

• Most flexible is “IF Mag”

• Use negative trigger delay

Capture: Triggering on the First Pulse

89600 VSA

© 2013 Agilent Technologies 13

© 2013 Agilent Technologies

Capture: Recording the Signal

© 2013 Agilent Technologies 14

© 2013 Agilent Technologies

Capture: Recording Length

© 2013 Agilent Technologies 15

© 2013 Agilent Technologies

Capture: Recording the Signal

Record

89600 VSA

© 2013 Agilent Technologies 16

© 2013 Agilent Technologies

Agenda

Transmitter Test

• Capture

• Measurement

Receiver Test

• Emulation

© 2013 Agilent Technologies 17

© 2013 Agilent Technologies

Measurement: J/S, PRI

© 2013 Agilent Technologies 18

© 2013 Agilent Technologies

Velocity Technique Measurement

Po

we

r

Dopp

© 2013 Agilent Technologies 19

© 2013 Agilent Technologies

Measurement: Frequency Resolution

© 2013 Agilent Technologies

Signal Processing So Far…

• Gated FFT

• Sample period of

15.625 ns

• Correspondingly, a 64

MSa/s sample rate

• We get much better

frequency resolution

through zero padding

5 us gate time. N = 5 us / 15.625 ns/Sa ~ 300 samples

300 samples padded out to 406,601 FFT points

© 2013 Agilent Technologies 21

© 2013 Agilent Technologies

Frequency Resolution

N

ff s 64 MHz / 409,601 ~ 150 Hz

© 2013 Agilent Technologies 22

© 2013 Agilent Technologies

Measurement: Gated Spectrum

GHzft cN 10,1

kHzft cN 822.4,

© 2013 Agilent Technologies 23

© 2013 Agilent Technologies

Using the VSA to Process Doppler

0 5 10 15 20 25 30 35 40-1000

0

1000

2000

3000

4000

5000

6000

Dop

ple

r (H

z)

Pulse Number

Carrier Frequency: 10 GHz

© 2013 Agilent Technologies 24

© 2013 Agilent Technologies

More Helpful Measurements: OBW

5 us PW, gated FFT of 900 MHz chirp

© 2013 Agilent Technologies 25

© 2013 Agilent Technologies

More Helpful Measurements: Band Power

Band Power Marker: Based on the OBW, how much jamming power is in-band?

© 2013 Agilent Technologies 26

© 2013 Agilent Technologies

More Helpful Measurements: Spectrogram

© 2013 Agilent Technologies 27

© 2013 Agilent Technologies

More Helpful Measurements: Spectrogram

© 2013 Agilent Technologies 28

© 2013 Agilent Technologies

More Helpful Measurements: Spectrogram

© 2013 Agilent Technologies 29

© 2013 Agilent Technologies

Deep-Memory Record / Playback

Record and Playback 100% of Long Duration RF Signals (No Gaps)

minutes days hours

+ High Fidelity Signal

Acquisition and Generation

Continuous Capture and Playback

Modern Equipment

S i g n a l R e c o r d e r s E x t e n d T i m e

© 2013 Agilent Technologies

Turning Data into Information

30

Record 100% of Signal Content (minutes, hours, days)

Identify Signals of Potential Interest

Replay “Interesting”

Portions

Analyze/ Demod

RF Environment

Take Appropriate Action

Raw Data

Info

“Stare” at spectrum for extended periods of time

Operate on very large data sets

Recreate with high signal fidelity

Leverage investment in existing signal analysis tools using open-format data files

X-Series + IQC

89601B

CPG + VSG

Spectro-X

© 2013 Agilent Technologies 31

© 2013 Agilent Technologies

Agenda

Transmitter Test

• Capture

• Measurement

Receiver Test

• Emulation

© 2013 Agilent Technologies

W H Y S I M U L AT E R A D A R F O R E W T E S T ?

EW Test Challenges • You need some way of determining whether the

jammer will respond to emitters known to be in a

particular theater

• Captured enemy radars are relatively rare

• Test ranges exist, but it’s expensive to fly and difficult

to schedule

• Flight testing occurs much later in the design process

Page 32

Simulation Benefits • Cost effective

• Sufficient realism

• Time-efficient

• Test much earlier in the process

© 2013 Agilent Technologies

What Radar Parameters Should Be

Simulated?

• Antenna Properties

• Pulse Parameters

• Pulse Repetition Interval

• Power Levels

© 2013 Agilent Technologies

•Bore-Sight – Maximum gain of the

antennas main lobe or beam pointing at the

target.

•Bearing Angle - The bearing angle of the

target can be determined by moving the

antenna beam to the maximum return.

•Beam width – ½ Power points in the main

lobe measured in angular width AZ/EL

degrees.

•Side Lobe Level - the level of energy on

the side lobes relative to the main lobe or

beam

•Back Lobe – the energy emitting in the

opposite direction of the main beam.

A N T E N N A P AT T E R N P R O P E R T I E S A N D D E F I N I T I O N S

Page 34

© 2013 Agilent Technologies

E X A M P L E 1 – C I R C U L A R A N T E N N A S C A N

(Elevation)

Degrees

Reciever

Vertical

Location

Receiver

Horizontal Location

(Azimuth) - Degrees

Circular ScanY

°

+90°

+180°

+270°

Scan Rate RPM

Page 35

© 2013 Agilent Technologies

E X A M P L E 2 – C O N I C A L A N T E N N A S C A N Feed horn nutating in a small circular orbit

Page 36

© 2013 Agilent Technologies

E X A M P L E 3 – B I D I R E C T I O N A L R A S T E R A N T E N N A S C A N

Page 37

© 2013 Agilent Technologies

Amplitude seen by the jammer due to scan

38

N7620B Signal Studio for pulse building

© 2013 Agilent Technologies

Pulse Repetition Interval

Choice of PRI • Crucial for range or doppler

measurement

• Helps reduce

mainlobe/sidelobe clutter

• Helps eliminate ground moving

targets

• Reduces range/doppler

ambiguities, blind zones and

blind speeds

• Aids in power management

• Helps reduce POI

• Mode switching

EW systems use radar PRI for identification

© 2013 Agilent Technologies

PRI Switching

B A

C t

A B

rf

1

PW

Range

C

uR

© 2013 Agilent Technologies

Pulse Parameters

• Pulse width: affects average power for a given peak power, affects time-bandwidth product and range resolution

• Rise Time/Fall Time: affected by analog BW of the radar

• Modulation-on-pulse: chosen for range resolution desired

• Jitter: may be intentional to eliminate blind speeds or clutter, may be due to thermal fluctuations or system impairments from power supplies

© 2013 Agilent Technologies

Scenario Name

Source Parameters

Pulse Envelope properties – tr, tf, PW

Pulse Width Patterns

PRI Patterns

Modulation on Pulse Properties – Chirp, Barker, FSK, etc

Antenna Scanning Type

Antenna Radiation Type

Antenna Beam Width – AZ, El

Antenna Null Depth

Receiver Location

S C E N A R I O D ATA B A S E – I M P O R T I N G & E X P O R T I N G

Page 42

Intelligence

Database Spreadsheet Simulation at RF (emulation)

© 2013 Agilent Technologies

Agilent N7620B Signal Studio

For Pulse Building Software

43

I Q

Features

• flexible GUI

• Complex pulse/PRI patterns/antenna scans

• wideband modulation on pulse

• corrected test signals

• .csv importing

• COM API

© 2013 Agilent Technologies 44

© 2013 Agilent Technologies

Summary

Transmitter Test

• Capture

• Measurement

Receiver Test

• Emulation

© 2013 Agilent Technologies 45

© 2013 Agilent Technologies

Summary

• More information can be found on our website:

www.agilent.com/find/pxa PXA Signal Analyzer

www.agilent.com/find/psg PSG Signal Generator

www.agilent.com/find/vsa 89600 VSA Software

www.agilent.com/find/n7620b Signal Studio for Pulse Building

www.agilent.com/find/n6171b MATLAB

www.agilent.com/find/xcom X-com systems

• The application note entitled “Making Wideband Measurements” (5990-

9108EN) is found here:

http://cp.literature.agilent.com/litweb/pdf/5990-9108EN.pdf

• VSA trial licenses available!

http://www.home.agilent.com/agilent/download.jspx?cc=US&lc=eng&nid=-

33713.958604&pageMode=DL