• HOLOGRAPHY

• 3D IMAGING

• PHASE SENSITIVITY

• PHASE RETRIEVAL,

• OPTICAL TOMOGRAPHY

9-11 OCTOBER 2017

SCIENCE CENTER

DELFT, THE NETHERLANDS

FACE2PHASE REPORT

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Contents Summary ................................................................................................... 3

Sponsors & Partners .................................................................................. 4

Program Schedule ...................................................................................... 5

Invited Speakers ........................................................................................ 8

Contributing Speakers ............................................................................. 14

FOCUS Leadership Workshop .................................................................. 16

Social Event.............................................................................................. 17

Poster Presentation ................................................................................. 18

Finances ................................................................................................... 21

List of All Attendees ................................................................................. 22

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Summary

The Face2Phase conference presents research that make use of phase information, namely

Holography, Tomography, Phase Retrieval and their applications. Its goal is to let students

who are studying in this research topic gain more ideas about the cutting-edge technology

and get some insights about the application in industry. The conference also provides the

interaction between researchers working in these fields, in particular, interaction between

young and more experienced researchers. The conference received great success, with 9 invited talks, 24 contributing talks, and 17 poster contributions.

Apart from the already mentioned Holography Exhibition, a student event on Monday is organized by the SPIE Student Chapter of Delft University of Technology and sponsored by SPIE. The topic of Face2Phase is arguably the most important property of any optical field, namely its phase. With information about the phase of an optical field one can see in three dimensions, i.e. one can see that objects are situated behind each other. Attendees can even look around corners, as is convincingly demonstrated by the impressive holograms in the Holography Exhibition held in the same building as the conference. The importance of lensless imaging and computational optics are rapidly growing as soft x-rays, for which high quality components do not exist, are increasingly used in applications, e.g. in lithography for ICs. During the conference the SPIE FOCUS logo is always presented in the front of the venue, hence SPIE received great acknowledgement from the audiences.

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Sponsors & Partners

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Program Schedule Monday 9 October 2017 09:00 - 09:30 Registration & Coffee 09:30 - 09:35 Welcome speech by Dr. Bart Verbeek Chairman of PhotonicsNL, Main sponsor of the conference. 09:35 - 10:50 Session 1: Holography I 1. Marriage between holography and statistical optics for unconventional imaging: coherence

holography and holographic correloscopy (invited), Mitsuo Takeda, Untsunomiya University,

Japan

2. Quantitative phase and attenuation imaging using optical coherence computed tomography,

Jelle van der Horst, Delft University of Technology, The Netherlands

3. Nanoscale lensless stereo imaging using dual coherent soft X-ray beams, Joana Duarte, CEA-

Saclay, France

10:50 - 11:10 Break 11:10 - 12:45 Session 2: Phase retrieval and computational imaging I 1. X-Ray ptychography (invited), Andreas Menzel, Paul Scherrer Institure, Switzerland

2. Sampled optical fields for sensing and imaging G. Vdovin, Delft University of Technology, The

Netherlands

3. Interference-probe ptychography for visible light applications, Dirk Boonzajer Flaes, Vrije

Universiteit Amsterdam, The Netherlands

4. The optimal sampling point distribution for aberrated wavefunctions, Bernhard J. Hoenders,

University of Groningen, The Netherlands

12:45 -14:00 Lunch Break 14:00 - 15:35 Session 3: Adaptive optics and wavefront sensing 1. Adaptive optics from microscopy to nanoscopy (invited), Martin J. Booth, University of

Oxford, UK

2. Model based sensorless adaptive optics in confocal microscopy with reflective pinholes, Paolo Pozzi, Delft University of Technology, The Netherlands

3. Pupil plane wavefront sensor technologies at Leiden Observatory, Maaike van Kooten, Leiden

Observatory, The Netherlands

4. Shack-Hartmann wavefront sensor based phase microscopy, Hai Gong, Delft University of

Technology, The Netherlands

15:35 -15:55 Break 15:55 - 17:10 Session 4: Quantum effects in phase measurement and tomography 1. Quantum-enhanced phase measurement in interferometric metrology (invited), Bahaa Saleh,

University of Central Florida, USA

2. Optical communication using singular pptical beams, Larry X.-C. Yuan, Shenzhen University,

China

3. Beyond structural OCT imaging, Johannes de Boer, Vrije Universiteit Amsterdam, The

Netherlands

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17:10 - 18:30 Visit holography exhibition & drinks 17.10 - 18:30 SPIE FOCUS open to all attendees 1. To patent or not to patent? How patents can motivate new ideas, Adonis Reyes Reyes, TMC,

The Netherlands

2. System design in industrial innovation, Hans d’Achard, TMC-physics, The Netherlands

18:30 - 20:30 SPIE FOCUS Social Dinner (for students only) Tuesday 10 October 2017 09:00 - 10:35 Session 5: Phase retrieval and computation imaging ii 1. Ptychography: accurate, self-calibrating phase imaging (invited), John Rodenburg, University

of Sheffield, UK

2. Local smoothing edge preserving filters, Firas Sawaf, Delft University of Technology, The

Netherlands

3. Impact of design-parameters on the optical performance of a high-power adaptive mirror,

Wouter Koek, TNO, The Netherlands

4. Simultaneous compressive imaging with phase aberrations, Esteban Vera, Pontificia

Universidad Catolica de Valparaiso, Chile

10:35 - 10:55 Break 10:55- 12:30 Session 6: Diffraction imaging 1. Volumetric imaging using Fourier ptychography (invited) Roarke Horstmeyer, Humboldt

University of Berlin, Germany

2. A model-independent noise-robust extension of ptychography, Sander Konijnberg, Delft

University of Technology, The Netherlands

3. Compact lens-free phase microscope, Manon Rostykus, EPFL, Switzerland

4. Image reconstruction of interferometrically sheared diffraction patterns, Anne de Beurs, Vrije

Universiteit Amsterdam/ARCNL, The Netherlands

12:30 - 13:45 Lunch Break 13:45 - 14:20 Session 7: Holography II 1. Holographic microscopy and tomography for biomedical applications (invited), Malgorzata

Kujawinska, Warsaw University of Technology, Poland

2. Nanoscale single view 3D imaging based on hybrid phase retrieval and in-line holography

imaging Maria Kholodtsova, CEA Saclay, France

3. Depth resolved digital holography with sub-millimeter axial resolution, Joseph van Rooij, Delft

University of Technology, The Netherlands

4. Focal-plane holographic wavefront sensing for astronomical applications, Michael Wilby,

Leiden Observatory, The Netherlands

15:20 - 15:40 Break

16:10 - 17:00 SPIE FOCUS Poster Session including drinks

17.00 - 19:00 Free Time

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19:00 - 21:30 Conference Dinner

Wednesday 11 October 2017

09:00 - 10:35 Session 8: Holography III

1. Exploiting the whole information content of the light field: limitations and approaches (invited),

Wolfgang Osten, University Stuttgart, Germany

2. A novel technique for phase imaging of ex-vivo retina, Dino Carpentras, EPFL, Switzerland

3. Coherent imaging using the mutual intensity function, Claas Falldorf, Bremer Institut für

angewandte Strahltechnik, Germany

4. Starlight phase manipulation for direct exoplanet imaging, Christoph Keller, Leiden

Observatory, The Netherlands

10:35 - 10:55 Break

10:55 - 12:10 Session 9: Novel phase manipulation of optical beams

1. Light in complex systems (invited), Allard Mosk, Utrecht University, The Netherlands

2. Polarimetric and interferometric measurement of orbital angular momentum imparted by single

plasmon nano-antennas, Ruslan Röhrich, AMOLF, The Netherlands

3. Deep optics - optical intelligence goes artificial,Manuel Decker, Carl Zeiss AG, Germany

12:10 - 13:10 Closing & Lunch

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Invited Speakers 5. Prof. Mitsuo Takeda, Untsunomiya University, Japan

The first invited talk is given by Prof. Mitsuo Takeda. The title of the talk is ‘Marriage between holography and statistical optics for unconventional imaging: coherence holography and holographic correloscopy’. Traditionally, holography and statistical optics have been regarded as mutually separated fields of optics. He talks about introducing some of their recent efforts to bridge the gap between the two fields, which resulted in unconventional imaging techniques called coherence holography and holographic correloscopy.

6. Dr. Andreas Menzel, Paul Scherrer Institure, Switzerland

The second invited talk is from Dr. Andreas Menze. He talks about their recent development in X-Ray ptychography.

The unavailability of highly resolving, efficient, and aberration-free X-ray optics gave rise to the development of “lens-less” microscopy techniques applicable to X-ray imaging. Among a variety of coherent diffractive imaging (CDI) techniques, which offer high resolution at high dose efficiency, ptychography has been found particularly robust and reliable and has been made available at numerous user facilities worldwide.

Invented in the 1960s in the context of electron microscopy, ptychography comprises sampling and analyzing the object’s spatial spectrogram by windowed (or “short-space”) Fourier transforms. An analytic solution to the inversion problem exists in the form of the so-called Wigner distribution deconvolution. However, this particular approach is subject to experimentally rather forbidding sampling requirements. More relevant in praxis are therefore iterative reconstruction techniques that allow for significantly sparser sampling and allow for simultaneous reconstruction of both object and illumination, i.e., the Fourier transform’s window function. Recent algorithmic developments can further yield three-dimensional information from essentially two-dimensional measurements or allow for deviations from “ideal” measurements conditions.

Instrumentation, reconstruction techniques, and applications will be discussed, in particular regarding opportunities at upcoming sources which, compared to today’s sources, will increase the usable flux by orders of magnitude.

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7. Prof. Martin J. Booth, University of Oxford, UK

Prof. Martin J. Booth gives us an overall introduction to Adaptive optics in nanometer scale.

Adaptive optics (AO) has been introduced into microscopes to overcome the problems caused by specimen-induced wavefront aberrations. This is particularly important when focusing deep into tissue where the cumulative effect of focusing through the refractive index structure of the specimen causes significant wavefront distortion. These AO systems employ a dynamic element, such as a deformable mirror or spatial light modulator, to correct aberrations, restoring image quality. Adaptive optics has been demonstrated in a range of microscope modalities including conventional widefield microscopes as well as laser scanning systems with various applications in biomedical imaging and other areas. Adaptive microscopy has most recently been developed for super-resolution microscopes – or nanoscopes – which enable resolutions smaller than the diffraction limit of light. He reports on a range of recent advances in this field.

8. Prof. Bahaa Saleh, University of Central Florida, USA

Prof. Bahaa Saleh gives us a talk on how to measure the phase information using Quantum-enhanced technology.

A principal question in optical interferometry, which is an established tool in metrology, is the precision of phase measurement. The accuracy of phase estimation is limited by shot noise, which is particularly manifest when weak light sources are used. Light probes in nonclassical states, for which the photon number statistics are sub-Poisson, or the photons

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are in an entangled quantum state, have been shown to surpass the Heisenberg limit of precision. However, this super-sensitivity is often accompanied by enhanced vulnerability to noise and decoherence within the system itself. As an example, in two-photon interferometry, the slightest amount of decoherence can cause total loss of phase sensitivity at certain values of the interferometer phase difference. This talk begins with a tutorial overview of quantum-enhanced interferometric phase measurement techniques and their limitations. He then introduces the notion of ancilla-aided interferometry – the use of a probe with an ancillary degree of freedom, such as polarization. He shows that when the ancilla and the normal interferometer path degrees of freedom are entangled, and with appropriate measurements at the output end of the interferometer, the quantum super-sensitivity that has been diminished by decoherence, can be restored.

9. Prof. John Rodenburg

Prof. John Rodenburg of University of Sheffield, UK is one of the pioneers in the field of X-ray imaging. His introductory talk is about the accurate, self-calibrating phase imaging.

Once seen as an obscure solution of the diffraction plane phase problem, ptychography has evolved with extraordinary speed over the last ten years. It should be seen as a very general computational imaging technique that relies on encoding optics (whether via a diffraction pattern or an image), translational diversity and a decoding algorithm. The range of optical set-ups that can exploit these concepts is large. Because the information diversity can be vast, the method can self-calibrate, removing a wide class of experimental errors including those of the encoding optics themselves, errors in the translation vectors, errors in the detector and its position, and partial coherence in the illuminating beam. Its first major application area was in X-ray imaging, but it is now making in-roads into visible and EUV light imaging and electron imaging.

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10. Dr. Roarke Horstmeyer, Humboldt University of Berlin, Germany

Dr. Roarke Horstmeyer presents a method to boost the resolving power of current

microscopes to one gigapixel using a technique termed Fourier ptychography. No moving

parts or precision controls are needed for this resolution enhancement. The only required

hardware is a standard digital microscope and an array of illumination LEDs, while an

optimization algorithm does the rest of the work. This talk also describes an extension of

Fourier ptychography that can create 3D volumetric images of thick specimens, and discuss

the various challenges associated with imaging highly scattering samples.

11. Malgorzata Kujawinska, Warsaw University of Technology, Poland

Prof. Malgorzata Kujawinska gives us a talk about recent development on Holographic

microscopy and tomography in the field of biomedical applications

Label-free quantitative phase imaging techniques are becoming increasingly important and

popular in biological and medical applications. It is due to their capability of measurement

and monitoring of cells with absolute biophysical parameters like optical path length delay,

volume, refractive index or dry mass without affecting normal cell functions or disturbing

proliferation. Digital holographic microscopy (DHM) is currently the most adapted and

precise measurement method when applied to semitransparent and purely phase biological

samples such as living cells and microorganisms. It is also the best method to provide input

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data for accurate optical diffraction tomographic (ODT) reconstruction of 3D refractive index

distribution.

In the talk, at first, the state-of the-art in the field of digital holography and 3D phase imaging

techniques is presented. Next the recent advances in tomographic measurement, numerical

approaches, algorithms and architectures of holographic data capture will be discussed.

Special attention is given to novel schemes of modulation of an object illumination beam,

numerical focusing, aberration compensation and holographic data manipulation for both full

and limited projection angle tomography. New measurement scenarios and algorithms for

limited angle tomographic reconstruction based on generalized total variation iterative

constraint strategy and extension of depth-of-field will be introduced. Some interesting

examples of DHM and ODT implementation in biomedical investigations will be presented.

Finally, the challenges connected with the necessity to improve spatial resolution of DHM and ODT and to develop holographic systems for digital pathology is discussed.

12. Wolfgang Osten, University Stuttgart, Germany

Prof. Wolfgang Osten gives us the talk about Exploiting the whole information content of the light field: limitations and approaches.

In the context of measurement technology, optical methods have a number of unique features.

To them belong in particular the non-contact and high-speed interaction with the object

under test, the largely free scalability of the dimension of the probing tool, the high resolution

of the data, the diversity of information channels in the light field, and the flexible adaptability

of the comparative standard. On the other hand, the user is also confronted with a bunch of

challenges. Here one should mention especially the indirect nature of the measurement. This

fact is the origin of a number of serious consequences which make it often difficult for the

practitioner to decide for optical metrology. However, the numerous information channels

recommend optical principles for the solution of various inspection and measurement

problems. A broad variety of techniques is sensitive for the measurement of a particular

quantity such as the intensity, the frequency, the phase, the angular spectrum, the

polarization state, the angular momentum, the degree of coherence and the time of flight. By

applying these methods, a wide spectra of spatial, spectral and temporal modalities can be

evaluated. To them belong dimensional, structural, geometrical, colorimetrical, chemical, and

mechanical properties of the object under test. More modern principles such as hyper-

spectral technologies are designed to measure various modalities with one system. Known

under the name of multimodal measurement techniques, these systems are capable of

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elegantly solving complex medical, structural-mechanical or biological problems. However,

the high information density in optical signals is often not only an advantage but a challenge

with respect to the correct interpretation of the measured data. This talk starts with a brief

summary of the advantages and disadvantages of optical metrology. Afterwards he discuss

the various information channels and present examples for their exploitation. Special attention is directed to the correct interpretation of the data.

13. Allard Mosk, Utrecht University, The Netherlands

Prof. Allard Mosk’s talk is about light in scattering medium. Random scattering of light, which

causes the opaqueness of paper, paint and biological tissue is an obstacle to imaging and

focusing of light. At the same time scattering is a phenomenon of basic physical interest as it

allows the study of fascinating interference effects such as open transport channels, which

enable lossless transport of waves through strongly scattering materials. The transmission of

these open channels remains high even for a thick sample, while their statistical occurrence

offers a new way to measure the scattering strength of a material. Individual open channels

can be elucidated by repeated phase conjugation, and this opens them up to detailed

spectroscopy measurements, allowing space-time mapping of these remarkable transmission

properties in three-dimensional optical systems.

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Contributing Speakers We have in total 24 contributing talks from all over the world, including our chapter member Hai Gong. Below are summary of part of the interesting talks.

Hai Gong, Delft University of Technology, The Netherlands. Shack-Hartmann wavefront sensor based phase microscopy.

He is currently a PhD student of DCSC in Delft with the research background of optical sensing.

In the talk he talks about measuring the quantitative phase by a Shack-Hartmann wavefront

sensor. And when the spatial coherence condition is satisfied that the numerical aperture of

the illumination should be smaller than the numerical aperture of the imaging lens.

The phase or optical path difference of the microscopic sample provides plentiful information

about the sample, such as creating good image contrast in the transparent and translucent

cases and characterizing the profile of the surface in reflective cases. Comparing with the

holographic or interferometric methods, the SH technique needs no delicate reference beam in the setup, which simplifies the system.

Larry X.-C. Yuan, Shenzhen University, China. Optical communication using singular optical

beams

Prof. Larry X.-C. Yuan currently works at Shenzhen University. He has a very strong research

background in vectorial beam shaping and optical communication. In his talk he introduces the research carrying on in his research team.

Singular Optical beams such as orbital angular momentum (OAM) beam and cylindrical vector

beam (CVB) have shown advantages in increasing the data transmission rate in both free-

space optical and fiber optical communication systems. Here, we will review several singular

beams based optical communication techniques developed by our research group. I. Massive

individual OAM channels multiplexing enabled by a Dammann optical vortex grating with sub-

Pbit/s data rate. II. CVB multiplexing communication in few mode fiber. III. Integrated OAM

(de)multiplexer with high efficiency and broad bandwidth. The singular beams based optical

communication techniques have the potential for the next generation high performance

computing applications.

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Esteban Vera, Pontificia Universidad Catolica de Valparaiso, Chile. Simultaneous compressive imaging with phase aberrations

Dr. Esteban Vera is an associate professor from Pontificia Universidad Catolica de Valparaiso.

He gives an interesting talk on compress imaging technique. They present a new approach for

snapshot compressive imaging by engineering a point spread function using optical

aberrations. Compressive imaging simulation and experimental results at 16x compression,

using both natively sparse and natural scenes, demonstrate the enhanced ability of aberrated

imaging systems to compress images.

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FOCUS Leadership Workshop We are honored to have two experts from TMC to give all student an in-depth discussion on

the non-academic topics. Besides the main organizer SPIE Delft Student Chapter, this

workshop is also co-organized by EPS Youngmind Delft Section.

Senior System

Architect, TMC-physics

HANS D’ACHARD

SYSTEM DESIGN IN INDUSTRIAL

INNOVATION. Without proper insight in market mechanisms, the marketplace can be

experienced as chaotic and hostile. Competition is intense and

increasing in speed. New technologies are appearing on every field. For

many companies the struggle is how to navigate, how to keep up with

the speed of innovation, how to stay agile and effective. Is there order

in this chaos?

Focus in this talk is on the role of the designer-engineer in the practice

of research and development of advanced complex systems in an

industrial environment. Where do innovation ideas come from and how

to be stubborn and listen at the same time.

TO PATENT OR NOT TO PATENT?

HOW PATENTS CAN MOTIVATE

NEW IDEAS.

Invention Disclosure

Coordinator -- IMEC, Physics R & D Engineer –

TMC

ADONIS REYES REYES

A true leader knows that information is essential to take the best

decisions. But sometimes the right information is difficult to find or

even to read. In this talk I will talk about the importance of keeping an

open and inquisitive mind. I will illustrate it with my own experience

moving from being an experimental Physicist to work as Patent analyst.

I will share how Patents can be used to keep track of the newest

scientific and technological developments and at the same time

motivate the creativity. I will close by explaining how to identify the

relevant information in a Patent in a fast and efficient way.

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Social Event The social event is organized right after the workshop. All students are invited to enjoy

our light diner with all kind of drinks.

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Poster Presentation We have in total 17 poster contributions, including SPIE student member Priya Dwivedi,

Anna Ezerskaia, Antoine Grégoire, Wojciech Krauze, Piotr Stępień. The event is branded

under the name of SPIE FOCUS, all conference participants attend the event. During the

one hour poster session, the student can has the opportunity to present their work and

receive feedbacks from top expects of the field. The poster session is evaluated by a

panel of judges and one Best Poster Prize is given.

Finally the Best Poster Prize goes to Wojciech Krauze, with his poster title Extended

depth-of-field optical diffraction tomography: algorithms and system.

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List of Posters

#1 Distortion free reconstruction in digital holographic microscopy

Mostafa Agour, BIAS-Bremen Institute for Applied Beam Technology, Germany

#2 Compensation of aberrations in digital in-line holography by resorting to wavefront

sensor measurements

Joana Duarte, CEA-Saclay, France

#3 Lateral position corrections in Ptychography using the gradient of intensity patterns

Priya Dwivedi, Delft University of Technology, The Netherlands

#4 Improved sensitivity of infrared spectroscopic method for depth resolved profiling of

stratum corneum

Anna Ezerskaia, Delft University of Technology, The Netherlands

#5 Engineering of optical focal lines with diffractive vector holograms

Pavel Gotovski, Industrial laboratory for photonic technologies, Center for Physical Sciences

and Technology, Lithuania

#6 Design of optical knives and shovels based on geometrical phase elements

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Pavel Gotovski, Industrial laboratory for photonic technologies, Center for Physical Sciences

and Technology, Lithuania

#7 Digital holographic microscopy (DHM) characterization to study the spatiotemporal

variations of neuronal morphology

Antoine Grégoire, Université Laval, Canada

#8 Progressive on-the-fly Fourier ptychography reconstruction

Patrick Horain, IMT / Telecom SudParis, France

#9 Fast computer generated hologram calculation with a mini look-up table

Shuming Jiao, Shenzhen University, China

#10 Extended depth-of-field optical diffraction tomography: algorithms and system

Wojciech Krauze, Institute of Micromechanics and Photonics, Warsaw University of

Technology, Poland

#11 Phase Imaging in STEM using Integrated Differential Phase Contrast (iDPC)

Ivan Lazic, Thermo Fisher Scientific, The Netherlands

#12 The Real-Time Phase Retrieval System Using a White-Light Source

Chunli Meng, School of Optical-Electrical Computer Engineering, University of Shanghai

for Science and Technology, China

#13 Experimental investigation of phase retrieval method using white-lightsource

Chunki Meng, University of Shanghai for Science and Technology, China

#14 Spatial coherence measurement and partially coherent diffractive imaging

Yifeng Shao, Delft University of Technology, The Netherlands

#15 Investigations of skin tissue with digital holographic microscopy

Piotr Stępień, Warsaw University of Technology, Poland

#16 Non-standard phase manipulation with a liquid lens

Matthias Strauch, Delft University of Technology, The Netherlands

#17 Coherent speckle removal in imaging

Abhilash Thendiyammal, Utrecht University, The Netherlands

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Finances We received FOCUS grant from SPIE in total 3680.19 EUR. Most of the budget is used for

supporting the student to travel and attending the conference.

1. SPIE FOCUS Conference Grant

As SPIE student member, they have the conference registration fee(50 EUR) waivered.

Moreover, also receive finance support for accommodation up to 150 EUR. The registration fee and the accommodation support arerefunded onsite.

2. SPIE FOCUS Travel Grant

We provide limited space for travel grant, which cover maximum 200 EUR. To apply

this grant, applicants need to send the application letter to us, including motivation

letter, CV and one reference letter.

We have offered 9 Conference Grant and 4 Travel Grant. In the end 7 Conference Grant

and 4 Travel Grant were offered. The other two members could not attend due to visa

issues.

content amount total

Received € 3,680.19

gift to speakers 1 € 67.97

Conference Grant 7 € 1,400.00

Travel Grant 4 € 800.00

Best Poster Prize 2 € 250.00

Social Event Dinner 1 € 700.00

Drinks of Poster Session 1 € 250.00

BALANCE

€ 212.22

The remaining 212.22 EUR will be utilized for supporting chapter members to attend conference in the future.

Below is the list of grant winners

Mr./Ms. First name Last nameCountry Affliation Conference GrantTravel Grant

Ms. Mengqi Du NetherlandsARCNL Yes no

Mr. Xiaomeng Liu NetherlandsARCNL Yes no

Mr. Dong Cheon Kim Germany Holoeye Photonics AG Yes Yes

Mr. Piotr Stepien Poland Warsaw University of Technology Yes Yes

Mr. Wojciech Krauze Poland Warsaw University of Technology Yes Yes

Mr. Maximilian Hoffmann Germany University Hospital Charité , Berlin Yes no

Mr. Antoine Grégoire Canada Université Laval Yes Yes

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List of All Attendees First name Last name Country Affiliation

Yasmin Abou Laban Germany Zeiss

Antoine Grégoire Canada Université Laval

Sabad-E- Gul Netherlands TUDelft

Bernhard J. Hoenders Netherlands Univerisity of Groningen

Joseph Kabogoza Netherlands TUDelft

Wojciech Krauze Poland Warsaw University of Technology

Xiaomeng Liu Netherlands ARCNL

Nandita Mariam Mukasa Netherlands TUDelft

Peiwen Meng Netherlands TU Delft

Allard Mosk Netherlands Utrecht University

Sean O'Gorman` Netherlands TUDelft

Jannik Trapp Germany Zeiss

Aurèle Adam Netherlands TUDelft

Tibor Agocs Netherlands NOVA

Paolo Ansuinelli Netherlands TU Delft

Alessandro Antoncecchi Netherlands ARCNL

Stefan Bäumer Netherlands TNO - Optics department

Nandini Bhattacharya Netherlands TU Delft - Faculty TNW - ImPhys - Optics

Martin Booth United Kingdom Department of Engineering Science, University of Oxford

Po-Ju Chen Netherlands TU Delft

Po-Sheng Chiu Netherlands TU Delft

Wim Coene Netherlands ASML Research

Mengqi Du Netherlands ARCNL

Priya Dwivedi Netherlands TU Delft

Hai Gong Netherlands TU Delft

Maximilian Hoffmann Germany University Hospital Charité , Berlin

Roarke Horstmeyer Germany Bioimaging and Neurophotonics Laboratory, Humboldt University of Berlin

Zhe Hou Netherlands TU Delft

Matthijs Jansen Netherlands ARCNL

Jeroen Kalkman Netherlands Delft University of Technology

Christoph Keller Netherlands Leiden Observatory

Dong Cheon Kim Germany Holoeye Photonics AG

Dmytro Kolenov Netherlands TU Delft

Sander Konijnenberg Netherlands TU Delft

Malgorzata Kujawinska Poland Institute of Micromechanics and Photonics, Warsaw University of Technology

Ad Maas Netherlands SPECTRAL

Andreas Menzel Switzerland Paul Scherrer Institut

Wolfgang Osten Germany Institut für Technische Optik, Universität Stuttgart

Silvania Pereira Netherlands TU Delft - Facultu TNW - ImPhys - Optics

Paolo Pozzi Netherlands Delft University of Technology

Vitaliy Prosyentsov Netherlands ASML

Janneke Ravensbergen Netherlands ASML

John Rodenburg United Kingdom Department of Electronic and Electrical Engineering, University of Sheffield

Bahaa Saleh United States of America CREOL, The College of Optics and Photonics

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Gregory Samelsohn Israel SCE

Piotr Stepien Poland Warsaw University of Technology

Mitsuo Takeda Japan Center for Optical Research & Education (CORE) Utsunomiya University

Ying Tang Netherlands TU Delft

Abhilash Thendiyammal Netherlands Utrecht University

Paul Urbach Netherlands TU Delft - Faculty TNW - ImPhys - Optics

Yvonne Van Aalst Netherlands TU Delft - Faculty TNW - ImPhys - Optics

Maaike van Kooten Netherlands Leiden Observatory

Esteban Vera Chile Pontificia Universidad Catolica de Valparaiso

Xukang Wei Netherlands TU Delft

Stefan Witte Netherlands ARCNL

Zheng Xi Netherlands TU Delft

Thim Zuidwijk Netherlands TUDelft / Optics Research Group

Tope Agbana Netherlands TU Delft

Andrei Anisimov Netherlands TU Delft

Ralf Bergmann Germany BIAS

Martin Berndsen Netherlands mindef

Chris Christie Netherlands TU Delft

Boudewijn Docter Netherlands effectphotonics

Omar El Gawhary Netherlands TU Delft

Erik Ham Netherlands TNO

Roel Hendriks Netherlands TU Delft

Bernd Kleemann Germany Zeiss

Marc Korevaar Netherlands kipp & zonen

Hans Kuiper Netherlands TU Delft

Nitish Kumar Netherlands ASML

Sven Pekelder Netherlands sttls

Rob Remis Netherlands TU Delft

Sarathi Roy Netherlands ASML

Lohle Steven Netherlands TU Delft

Jelle van der Horst Netherlands TU Delft

Diederik Van Lierop Netherlands innoluce

Jan Van Moorsel Netherlands mikrocentrum

Gerard Van Veen Netherlands FEI

Gleb Vdovin Netherlands TU Delft

Willem Vos Netherlands TU Twente

Jeroen Wehmeijer Netherlands lambertinstruments