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Facility for spectral irradiance and radiance responsivity calibrations using uniform sources Steven W. Brown, George P. Eppeldauer, and Keith R. Lykke Detectors have historically been calibrated for spectral power responsivity at the National Institute of Standards and Technology by using a lamp–monochromator system to tune the wavelength of the excitation source. Silicon detectors can be calibrated in the visible spectral region with combined standard uncertain- ties at the 0.1% level. However, uncertainties increase dramatically when measuring an instrument’s spectral irradiance or radiance responsivity. We describe what we believe to be a new laser-based facility for spectral irradiance and radiance responsivity calibrations using uniform sources (SIRCUS) that was de- veloped to calibrate instruments directly in irradiance or radiance mode with uncertainties approaching or exceeding those available for spectral power responsivity calibrations. In SIRCUS, the emission from high-power, tunable lasers is introduced into an integrating sphere using optical fibers, producing uniform, quasi-Lambertian, high-radiant-flux sources. Reference standard irradiance detectors, calibrated directly against national primary standards for spectral power responsivity and aperture area measurement, are used to determine the irradiance at a reference plane. Knowing the measurement geometry, the source radiance can be readily determined as well. The radiometric properties of the SIRCUS source coupled with state-of-the-art transfer standard radiometers whose responsivities are directly traceable to primary na- tional radiometric scales result in typical combined standard uncertainties in irradiance and radiance responsivity calibrations of less than 0.1%. The details of the facility and its effect on primary national radiometric scales are discussed. OCIS codes: 120.0120, 120.5630, 120.3930. 1. Introduction Detectors are calibrated for spectral power respon- sivity over the spectral range from 350 to 1000 nm at the National Institute of Standards and Technol- ogy (NIST) on the spectral comparator facility 1 (SCF) by using a lamp–monochromator system to tune the wavelength of the excitation source and silicon work- ing standard detectors with responsivities directly traceable to the NIST high-accuracy cryogenic radi- ometer (HACR), the primary U.S. national radiomet- ric standard for optical power measurement. 2,3 Silicon detectors can be calibrated for optical power responsivity in the visible spectral region on the SCF with combined expanded uncertainties k 2 at the 0.2% level. However, quantities of interest are often the amount of light falling on a surface (irradiance) or the amount of light emitted from a source (radiance). In many cases, spectral information is required as well. Consequently, the calibration of filter-based ir- radiance and radiance meters is frequently needed. Because of the low flux in the lamp–monochromator system, instruments cannot be directly calibrated for irradiance or radiance responsivity on the SCF, and more complicated approaches must be taken that often increase the expanded uncertainty k 2 in the mea- surements to the 0.5% level or greater. 4 In addition, the low flux associated with lamp–monochromator excitation sources 1 W limits the effective dy- namic range of the system. The out-of-band response of filter radiometers can be measured only to ap- proximately 0.001% of the peak response while a dynamic range greater than 10 6 can be required for high-accuracy applications. In more advanced ap- plications, spatially nonuniform (e.g., infrared or ultraviolet) irradiance meters cannot be calibrated accurately by using the traditional power measure- ment mode on the SCF and detector-array-based imaging systems require tests in uniform, mono- chromatic fields. With the development of tunable dye lasers in 1970, 5,6 high-power, monochromatic, tunable sources became available for scientific use. Replacing the lamp–monochromator source with a tunable laser The authors are with the National Institute of Standards and Technology, Gaithersburg, Maryland 20899. S. Brown’s e-mail ad- dress is [email protected]. Received 14 February 2006; accepted 27 April 2006; posted 7 July 2006 (Doc. ID 68064). 8218 APPLIED OPTICS Vol. 45, No. 32 10 November 2006

Facility for spectral irradiance and radiance responsivity calibrations using uniform sources

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  • Facility for spectral irradiance and radiance responsivitycalibrations using uniform sources

    Steven W. Brown, George P. Eppeldauer, and Keith R. Lykke

    Detectors have historically been calibrated for spectral power responsivity at the National Institute ofStandards and Technology by using a lampmonochromator system to tune the wavelength of the excitationsource. Silicon detectors can be calibrated in the visible spectral region with combined standard uncertain-ties at the 0.1% level. However, uncertainties increase dramatically when measuring an instrumentsspectral irradiance or radiance responsivity. We describe what we believe to be a new laser-based facility forspectral irradiance and radiance responsivity calibrations using uniform sources (SIRCUS) that was de-veloped to calibrate instruments directly in irradiance or radiance mode with uncertainties approaching orexceeding those available for spectral power responsivity calibrations. In SIRCUS, the emission fromhigh-power, tunable lasers is introduced into an integrating sphere using optical fibers, producing uniform,quasi-Lambertian, high-radiant-flux sources. Reference standard irradiance detectors, calibrated directlyagainst national primary standards for spectral power responsivity and aperture area measurement, areused to determine the irradiance at a reference plane. Knowing the measurement geometry, the sourceradiance can be readily determined as well. The radiometric properties of the SIRCUS source coupled withstate-of-the-art transfer standard radiometers whose responsivities are directly traceable to primary na-tional radiometric scales result in typical combined standard uncertainties in irradiance and radianceresponsivity calibrations of less than 0.1%. The details of the facility and its effect on primary nationalradiometric scales are discussed.

    OCIS codes: 120.0120, 120.5630, 120.3930.

    1. Introduction

    Detectors are calibrated for spectral power respon-sivity over the spectral range from 350 to 1000 nmat the National Institute of Standards and Technol-ogy (NIST) on the spectral comparator facility1 (SCF)by using a lampmonochromator system to tune thewavelength of the excitation source and silicon work-ing standard detectors with responsivities directlytraceable to the NIST high-accuracy cryogenic radi-ometer (HACR), the primary U.S. national radiomet-ric standard for optical power measurement.2,3Silicon detectors can be calibrated for optical powerresponsivity in the visible spectral region on the SCFwith combined expanded uncertainties k 2 at the0.2% level. However, quantities of interest are oftenthe amount of light falling on a surface (irradiance) orthe amount of light emitted from a source (radiance).In many cases, spectral information is required as

    well. Consequently, the calibration of filter-based ir-radiance and radiance meters is frequently needed.

    Because of the low flux in the lampmonochromatorsystem, instruments cannot be directly calibrated forirradiance or radiance responsivity on the SCF, andmore complicated approaches must be taken that oftenincrease the expanded uncertainty k 2 in the mea-surements to the 0.5% level or greater.4 In addition,the low flux associated with lampmonochromatorexcitation sources 1 W limits the effective dy-namic range of the system. The out-of-band responseof filter radiometers can be measured only to ap-proximately 0.001% of the peak response while adynamic range greater than 106 can be required forhigh-accuracy applications. In more advanced ap-plications, spatially nonuniform (e.g., infrared orultraviolet) irradiance meters cannot be calibratedaccurately by using the traditional power measure-ment mode on the SCF and detector-array-basedimaging systems require tests in uniform, mono-chromatic fields.

    With the development of tunable dye lasers in1970,5,6 high-power, monochromatic, tunable sourcesbecame available for scientific use. Replacing thelampmonochromator source with a tunable laser

    The authors are with the National Institute of Standards andTechnology, Gaithersburg, Maryland 20899. S. Browns e-mail ad-dress is [email protected].

    Received 14 February 2006; accepted 27 April 2006; posted 7July 2006 (Doc. ID 68064).

    8218 APPLIED OPTICS Vol. 45, No. 32 10 November 2006

  • source has a number of advantages for radiometricapplications, in particular the high-power, very nar-row spectral bandwidth, and the extremely low wave-length uncertainty of the laser-based source. Schaeferand Eckerle7 developed the first laser-based radiomet-ric facility at NIST in 1984. In 1986, independentirradiance scales maintained by NIST based on black-body or synchrotron radiation were compared withscales established on the laser calibration facilitybased on silicon photodiode physics traceable to cryo-genic radiometry.8 In 1990, absolute spectral radio-metric measurements of the melting and freezingpoints of a gold blackbody were made at NIST usingthe laser-based facility.9 The radiometric temperaturewas in agreement with the gold-point value estab-lished in the International Temperature Scale of 1990(ITS-90). In the same time frame, a laser-based radio-metric calibration facility was established at theNational Physical Laboratory (NPL) in the UnitedKingdom, and the radiometric freezing and meltingtemperatures of gold, silver, and aluminum blackbod-ies were determined with a radiometric uncertainty of0.04%.10 The results were compared with thermody-namic temperatures established by using constant-volume gas thermometry. Subsequently, severalprimary national radiometric standards laboratorieshave developed or are developing laser-based cali-bration facilities, including the NPL in the UK,11the Helsinki University of Technology (HUT) inFinland,12 and the Physikalisch-Technische Bunde-sanstalt (PTB) in Germany,13 as well as at NIST. Inthis work, a new laser-based facility developed atNIST for spectral irradiance and radiance responsiv-ity calibrations using uniform sources (SIRCUS) isdescribed.

    This facility expands on previous work through theintegration of cw, continuously tunable lasers thatcover wide ranges of the spectrum as well as with thedevelopment of high-performance transfer standarddetectors. The expanded continuous spectral cover-age has been made possible by recent and continuedadvances in laser technology. By exploiting thedevelopments in laser and detector technologies inSIRCUS and calibrating filter radiometers that areused in radiance temperature (pyrometers) and pho-tometry (photometers), the uncertainty of the twoSysteme Internationale (SI) units maintained by theNIST Optical Technology Division, the kelvin and thecandela, can be reduced.

    In Section 2 we describe the principal componentsof the facility and give a representative uncertaintybudget for an instrument calibration. In Section 3 wecompare the SCF with SIRCUS. In Section 4 we dis-cuss the effect on NIST scales and facilities. In Sec-tion 5, we give examples of calibrations that illustratethe flexibility of the new facility.

    2. Description of Spectral Irradiance and RadianceResponsivity Calibrations Using Uniform Sources

    In the SIRCUS facility, emission from high-power,tunable lasers is introduced into an integrating sphereproducing uniform, quasi-Lambertian, highly radiant

    flux sources. Reference standard irradiance detectors,calibrated directly against national primary standardsfor spectral power responsivity, are used to determinethe irradiance at a reference plane. Knowing themeasurement geometry, the source radiance can bereadily determined as well. Instruments are cali-brated directly in irradiance or radiance mode withuncertainties approaching or exceeding those avail-able for spectral power responsivity calibrations.

    There are three components to the SIRCUS facility:an ultraviolet, visible, and near-infrared (UVVisNIR) SIRCUS; an infrared (IR) SIRCUS; and a high-accuracy electrical substitution cryogenic radiometersystem called the primary optical watt radiometer(POWR).14 POWR is a primary standard facility for themeasurement of optical power. The UVVisNIR fa-cility currently operates over the spectral region from210 to 960 nm; extensions to the short-wave IR, out to2.5 m, are planned. The IR SIRCUS facility has aspectral coverage from 700 to 5.3 m using tunableoptical parametric oscillator (OPO) systems and cov-erage to 11 m using discrete laser sources. Lasersfrom both SIRCUS facilities can be introduced intothe POWR radiometer for detector responsivity mea-surements. Typically, reference instruments used onSIRCUS are calibrated against POWR. Occasionally,a second, working-standard absolute cryogenicradiometer (ACR) is used.15 This system is smallerand easier to operate than POWR. It is located on aportable table and can be readily moved between fa-cilities. Intercomparisons using transfer standard de-tectors establish the equivalence between the twocryogenic radiometers.

    The spectral coverage available with the tunablelasers ultimately defines the spectral range of theSIRCUS facility while the quality of the referencestandard detectors and their radiometric uncertain-ties ultimately determine the uncertainty achievableon SIRCUS. In this work we focus on the UVVisNIR facility and limit the discussion to the spectralrange from 210 to 960 nm where silicon referencedetectors are available. A general description of theSIRCUS facility is given in Subsection 2.A. Sourcesand reference detectors are discussed in Subsections2.B and 2.C. Subsection 2.D outlines the calibrationmethod. The uncertainties achievable for radianceand irradiance responsivity calibrations are dis-cussed in Subsection 2.E.

    It should be noted that our identification of com-mercial equipment is for information purposes only.It does not imply recommendation or endorsement bythe National Institute of Standards and Technology,nor does it imply that the equipment identified isnecessarily the best available for the purpose.

    A. Setup

    The SIRCUS facility is shown schematically in Fig. 1.The output of a high-power, tunable laser is firstdirected through an intensity stabilizer that controlsthe relative optical power in the beam to within 0.1%of the set point. A portion of the laser beam is sentinto a traveling Michelson interferometer that mea-

    10 November 2006 Vol. 45, No. 32 APPLIED OPTICS 8219

  • sures the wavelength of the radiation to within0.001 nm. A beam splitter sends another portion ofthe laser beam into a FabryPerot interferometer tomeasure the bandwidth and mode stability of thelaser. The laser radiation is typically introduced intoan integrating sphere, often using an optical fiber.Different size spheres are used depending on the ap-plication. Occasionally, a collimator coupled to thesphere is used as a calibration source. Speckle in theimage from the source, originating from interferencedue to the coherent nature of the laser radiation, iseffectively removed either by rastering the beam in-side the sphere with a galvanometer-driven mirror9or by placing a short length of optical fiber in anultrasonic bath.11,16 Note that the speckle is stillpresent but is altered on a much shorter time con-stant than the observing radiometers, effectively av-eraging out the distribution. A monitor photodiode islocated on the sphere to correct for any radiant fluxchanges in the sphere output between measurementswith the reference instrument and the device undertest. The sources and detectors are located insidea light-tight box (1.4 m wide, 1.2 m tall, 3.2 m long)that has been covered on the inside with Ultrapol, amaterial with excellent light-absorbing properties:The measured reflectance is of the order of 0.1%0.3% from 300 nm to 2.5 m. Two baffles are typi-cally installed between the source and the detectorsto minimize the effects of stray radiation on the mea-surement.

    The calibrations are performed by direct substitu-tion against primary standard reference irradiancemeters (see Subsection 2.C). For both irradiance andradiance responsivity calibrations, the distance be-tween the source aperture and the defining apertureon the reference standard detector is required. Anelectronic ruler with a resolution of 5 m measuresthe distance between the source and the detectors.

    B. Sources

    In this subsection we go into detail on the laser sys-tems as well as the different calibration sources,

    namely, the integrating spheres and collimators usedon SIRCUS.

    1. LasersA number of different lasers are used to cover thespectral range from about 210 to 960 nm (see Fig. 2).Continuous tunability is provided by dye lasersand Ti:sapphire lasers that are pumped by eitheran argon-ion laser (25 W, all lines visible; 7 W, alllines UV) or a frequency-doubled Nd:vanadate laser10 W, 532 nm. A number of discrete wavelengthsare provided by the pump lasers themselves.

    Dye laser use has declined in recent years because ofthe development of the solid-state Ti:sapphire laser,but the dye laser is still the easiest method for produc-ing high-power, tunable, cw light in the visible.17,18Dye lasers at SIRCUS cover the spectral region from415 to 700 nm; the dyes used include Stilbene 3415475 nm, Coumarin 480 470520 nm, Couma-rin 521 505565 nm,19 Rhodamine 6G R6G; 550620 nm, and DCM 610700 nm. A separate laser isused for each dye so that the full tuning range can berapidly covered, and no dye change or optical recon-figuration is required. The longer-wavelength dye la-sers, with DCM and R6G dyes, are ring lasers. Theyare located on a table separate from the other threedye lasers and are pumped by the 532 nm outputfrom a frequency-doubled Nd:vanadate laser. TheCoumarin 521, Coumarin 480, and Stilbene 3 lasersare pumped with the output of an argon-ion laser.Separate optical fibers, located on each laser table,couple the radiation from the lasers into the integrat-ing spheres.

    Ti:sapphire lasers cover the spectral range from 680to 1050 nm.20 A frequency doubling of Ti:sapphirelasers enables us to tune from 350 to 500 nm. Twodifferent types of frequency doubling are available:The first approach uses an external power buildupcavity that requires a frequency-stabilized, single-mode pump laser.21 The second is a home-builtintracavity-doubled Ti:sapphire laser that requiresno frequency stabilization. This system uses a simple

    Fig. 2. (Color online) Lasers, output power, and spectral coverageof UVVisIR SIRCUS.

    Fig. 1. (Color online) Schematic diagram of the SIRCUS facility.

    8220 APPLIED OPTICS Vol. 45, No. 32 10 November 2006

  • z-cavity Ti:sapphire laser. When doubling is required,the output coupler is removed and two mirrors areused in its place: a fold mirror (with a 5 cm focallength) and a flat mirror. The doubling crystal, typi-cally lithium barium oxide (LBO), is located near thefocus of the curved mirror.22 One of the attractivefeatures of the intracavity-doubling design is that thesystem lases without the doubling crystal in placeensuring the proper cavity alignment prior to instal-lation of the doubling crystal. It is also less sensitiveto acoustic noise and small frequency fluctuations inthe laser than the external-cavity system.

    Over 300 mW of optical power is available fromthe dye lasers and the Ti:sapphire laser (with opticalpowers of 1 W or greater over much of the spectralrange). The power available from the cw, frequency-doubled radiation is typically in the range from 100 to200 mW. A variety of standing-wave and ring lasersare currently used on SIRCUS. With the exception ofthe external buildup cavity approach to frequency-doubled light, simple, inexpensive standing-wave dyelasers and Ti:sapphire lasers equipped with an intra-cavity, uncoated etalon to ensure narrowband opera-tion are sufficient for all foreseeable radiometricapplications.

    Quasi-cw, mode-locked laser systems have beenshown in the past to be equivalent to cw systems forradiometric calibrations of silicon radiometers, withno additional uncertainties in the calibration arisingfrom the quasi-cw nature of the radiation.23,24 A com-mercial mode-locked system was recently installed inthe facility. The system includes an OPO system forgeneration of visible and infrared light, and a fre-quency doubler, tripler, and quadrupler system forgeneration of visible and UV radiation. These nonlin-ear optical systems take advantage of the pulsed na-ture of the radiation: It is significantly easier togenerate sum and difference frequency radiation us-ing a mode-locked laser rather than a true cw laserbecause of the high peak power of the mode-lockedsource. This system generates almost continuouslytunable radiation from 210 to 3 m. One useful fea-ture of the quasi-cw system is that the bandwidth ofthe radiation is considerably broader than radiationfrom the cw systems. This may help to alleviate themeasurement problems associated with interferencefringes (discussed in Section 6).

    Computer-controlled actuators rotate the angle ofthe birefringent tuner in the dye and Ti:sapphirelasers. The minimum step size is determined by thefree spectral range of the etalon in the lasers. For a1 mm thick etalon, the thickness of the etalons usedon SIRCUS, the minimum wavelength step using thebirefringent tuner is 0.16 nm at 600 nm. For finerspectral resolution, the etalon angle is changed aswell. Controlling both the birefringent tuner and theetalon angle, wavelength steps of 0.01 nm or less canbe readily achieved.

    2. Integrating SpheresDifferent integrating spheres are used, depending onthe radiometric calibration. Small-diameter integrat-

    ing sphereswith diameters ranging from 2.54 to5.08 cmequipped with precision apertures with di-ameters ranging from 3 to 8 mm are typically used forirradiance responsivity calibrations. Note that theareas of the exit apertures are normally measured atthe NIST facility for aperture area measurement.25Larger-diameter spheres30 cm in diameterwith5 to 10 cm diameter exit ports are used for radiancemeasurements. The spheres are made of a sinteredpolytetrafluoroethylene-based (PTFE-based) coatingthat has high diffuse reflectance from approximately250 nm to 2.5 m.26 Typical irradiance levels at 1 musing a 2.54 cm diameter integrating sphere with a5 mm diameter aperture range from approximate-ly 1 to 10 Wcm2. Radiance levels between 1 and5 mWcm2sr are standard for a 30 cm diametersphere with a 7.5 cm diameter output port. A monitordetector is mounted on the sphere wall to monitorand correct for fluctuations in the source radiant fluxduring a calibration. The irradiance is uniform towithin 0.1% over several centimeters at a 1 m sepa-ration from the integrating sphere. Similarly, the ra-diance from the integrating sphere is uniform towithin 0.1% over the central 90% of the exit aperture.

    3. Collimator SourcesIn earlier work at the NPL, collimated sources madefrom spheres with lenses were used in the calibrationof a number of filter radiometers and transmission oflenses.11 In SIRCUS, off-axis parabolic mirrors areused to prepare the quasi-collimated source. Mirrorshave the advantage over lenses of achromaticity fromthe UV to the IR. In addition to the collimators inSIRCUS, both on- and off-axis collimator sourceshave been developed in collaboration with NASA27and the U.S. Geological Survey28 (USGS) for thecharacterization and calibration of large-aperture-area telescopes. Nonuniformities of 1% or less areachieved over a 5 cm diameter area with an irradi-ance up to 2 orders of magnitude greater than withthe integrating sphere alone.

    C. Detectors

    The uncertainty in the spectral irradiance responsivityof reference standard detectors is the largest compo-nent in the SIRCUS calibration uncertainty budget.Ultimately, the quality and characteristics of the ref-erence standard detectors determine the uncertaintyachievable on SIRCUS. Silicon tunnel-trap detectors,configured to operate in both radiant power and irra-diance measurement modes, are the highest-level ref-erence standards used in the SIRCUS facility. Theycover the spectral range from 300 to 960 nm. Reflec-tance traps with specially designed Si detectors thatare stable under UV exposure are used for calibra-tions in the 210 to 350 nm spectral region.

    1. Reference Standard Silicon Tunnel-Trap DetectorTrap detectors consist of multiple silicon photodiodesoriented such that the incident radiation reflectedfrom one detector impinges on a second detector.29Hamamatsu model S1337 (Ref. 30) photodiodes are

    10 November 2006 Vol. 45, No. 32 APPLIED OPTICS 8221

  • typically used in trap detectors to utilize the physicalmodel of internal quantum efficiency (IQE) for spec-tral responsivity extrapolation and interpolation.3 TheIQE is the ratio of the number of collected electrons tothe number of photons absorbed by the detector afterthe front surface reflection loss; the S1337 photodiodesare chosen because of their extremely high IQE (closeto 1). A detectors external quantum efficiency (EQE) isequal to the IQE times the term 1 reflectance. Intrap detectors, the reflection loss is minimized by hav-ing incident reflected radiation impinge on the nextphotodiode in succession, leading to the absorption ofalmost all the incident radiation. Measuring the sumof the photocurrents from the photodiodes that makeup the trap detector, the EQE can be very close tounity. This type of detector is frequently called aquantum-flat detector.

    The schematic of the transmission tunnel-trapdetectors used on SIRCUS, with the input apertureincluded, is shown in Fig. 3.31 By choosing differentsize photodiodes, the aperture area and the field ofview (FOV) could be maximized. Two 10 mm 10 mm and four 18 mm 18 mm silicon photodiodes,equivalent to the Hamamatsu S1337 model photo-diodes, were packaged in a triangular-shaped,light-trapping arrangement. The photodiodes wereselected for large and equal shunt resistance, animportant consideration for the signal current-to-voltage conversion.31 The beam propagates in thetunnel-trap detector from the first photodiode (be-hind the aperture) to the last (sixth) photodiode. Pho-todiodes 3 and 6 are not shown for better illustration.The small amount of radiation that exits the back ofthe trap detector can be utilized for alignment or canbe measured for detector transmittance measure-ments in spectral responsivity determination. A con-ical light trap attached to the trap detector outputabsorbs the transmitted radiation and minimizes theeffect of ambient stray light for low-level optical ra-diation measurements. The photodiodes in the trapdetectors are not temperature controlled. The trapdetectors have been characterized for both electri-

    cal and optical performance. In Subsection 2.D, thetrap detectors response linearity, spatial uniformity,and angular responsivity are discussed along withthe spectral power responsivity calibration against ahigh-accuracy cryogenic radiometer.

    2. Monitor DetectorsSilicon detectors mounted on the integrating spheresources monitor the source radiance and correct forany small changes that occur during a calibrationcaused by fluctuations in the laser power input intothe integrating spheres. To avoid interference fringesin the monitor signal (caused by residual coherence inthe output radiation of a sphere source), the windowof the silicon monitor detector is removed, or a dif-fuser is placed between the silicon detector and theintegrating sphere. Both the reference standard trapdetectors and the monitor detectors operate in dcmeasurement mode.32

    D. Method of Calibration

    A calibration relates the measured quantity from aradiometer, usually current or voltage, to the radio-metric quantity being measured, e.g., radiance orirradiance, through the instruments responsivity. De-termination of an instruments responsivity and anevaluation of the associated uncertainties are requiredin a calibration. The substitution method is used forcalibrations in SIRCUS. NIST reference standard ir-radiance meters determine the irradiance at a refer-ence plane. From the irradiance at the reference plane,which is usually the plane of the detector aperture, theradiance of a source can be determined by knowing thedistance between the detector and source apertures, aswell as the area of the source aperture. The instrumentbeing calibrated, or device under test (DUT), is thenplaced in front of the source and its signal is recorded.The laser is blocked and the dark signal is recordedprior to each measurement. The responsivity (at theexcitation wavelength) is the instruments net outputsignal (with the dark signal subtracted from the lightsignal) divided by the radiometric quantity to be mea-sured.

    The characterization of an instrument and an un-derstanding and evaluation of all meaningful sourcesof uncertainty are crucial for a proper calibration. Acalibration without an associated uncertainty table isof limited use. The evaluation and expression of un-certainty is generally difficult and time consuming; itis not unusual to have incomplete or inaccurate in-formation in an uncertainty table. Determining howbest to express a particular uncertainty componentcan be confusing. There are a variety of useful refer-ences that provide definitions and recommendationsfor describing and establishing the uncertainties en-countered when calibrating a radiometer.33

    A measurement equation is a mathematical ex-pression describing the relationship between themeasured source-related radiometric quantity andthe instrument responsivity. The simplified mea-surement equation for an irradiance responsivitycalibration is

    Fig. 3. Beam propagation through the six-element transmissiontunnel-trap detector. Detectors 3 and 6 have been removed fromthe diagram.

    8222 APPLIED OPTICS Vol. 45, No. 32 10 November 2006

  • RDUTiDUTitrap

    RtrapiDUTitrap

    strap A, (1)

    where RDUT is the irradiance responsivity of the de-vice under test, Rtrap is the irradiance responsivity ofthe trap, strap is the power spectral responsivity of thetrap, A is the area of the aperture on the trap, and iis the photocurrent. The photocurrent is converted tovoltage in a transimpedence amplifier and then mea-sured with a multimeter.

    Equation (1) assumes that the reference planes ofthe DUT and trap are in the same plane, i.e., that thedefining apertures are located the same distancefrom the point source. In many cases, they are locatedin different planes. In Subsection 2.D.4, it is shownthat, for the aperture sizes and operating distancesused on SIRCUS, the sources can be treated as pointsources. For a point-source geometry,

    IE1d12E2d22, (2)

    where I is the radiant intensity of the source; E1 isthe irradiance at reference plane 1, located a distanced1 from the source; and E2 is the irradiance at refer-ence plane 2, located a distance d2 from the source. Inmany cases, the reference plane of the DUT is notknown and must be determined radiometrically.

    There are two types of uncertainty components, des-ignated Type A and Type B. Type A uncertaintiesare evaluated using statistical methods, and Type Buncertainties are evaluated using models or other ex-ternal information. The term standard uncertaintyrefers to an estimated standard deviation. Assumingeach uncertainty component is independent from theothers (the components are uncorrelated), the com-bined standard uncertainty is the root sum square ofthe individual uncertainty components. Often, the dif-ferent variables are not completely independent fromone another, and correlations between these variablesneed to be taken into account.34,35

    The expanded uncertainty is the product of the com-bined standard uncertainty and a coverage factor k,where the value of k is chosen based on the desiredlevel of confidence. Typically the expanded uncertaintyis reported with k 2, corresponding to a confidencelevel of 95%. A confidence level of 95% means thatthere is a 1 in 20 chance that a measurement will falloutside the interval. A coverage factor k 3 corre-sponds to a confidence level of 99%, meaning there isa 1% chance that a measurement will fall outside thestated interval. In reporting the uncertainty for ameasurement, the components of standard uncer-tainty are listed and their designation stated (A or B).The uncertainty table should also identify and dis-tinguish random components from systematic com-ponents that are common to all wavelengths. Thisinformation is important when combining the spec-tral measurements, for example in measuring theband-integrated response of filtered detectors.

    The dominant uncertainties of the spectral irradi-ance responsivity scale originate from systematic er-rors in the absolute scale transfer from the cryogenicradiometer. Temperature variations within the facil-

    ity, while small, may also contribute to the overalluncertainty in certain spectral regions. The radiomet-ric stability of the source (and monitor detector) andthe irradiance uniformity at a reference plane contrib-ute to the overall uncertainty in the measurement.Additional uncertainties from the radiometric charac-teristics of the DUT need to be quantified to establishthe uncertainty in the calibration (and subsequentmeasurements of a source). Typically, the instrumentsresponse linearity, temperature dependence, polar-ization dependence, and out-of-FOV blocking aremeasured. The current-to-voltage converter and themultimeter used to measure the signal need to be char-acterized and their contribution to the overall uncer-tainty established. Finally, both short-term stability(repeatability) and long-term stability (to monitordegradation in time) should be considered.

    In the following subsections, we discuss the uncer-tainty components in a typical irradiance responsiv-ity calibration. The components are combined into anuncertainty budget in Table 1. These are representa-tive numbers only. The uncertainty in an irradianceresponsivity calibration may differ slightly, depend-ing on the details of the calibration and the DUT.

    1. Detector-Based Spectral Irradiance ResponsivityScaleThe reference standard tunnel-trap detectors hold thespectral irradiance responsivity scale on SIRCUS. Asno light is reflected back from the trap detector to theaperture, the aperture area and the trap detector spec-tral radiant power responsivity can be determined sep-

    Table 1. SIRCUS Uncertainty for an Irradiance Responsivity Calibration

    Uncertainty Component

    Relative StandardUncertainty

    [%]

    Type A Type B

    Reference detector responsivityRadiant power responsivity

    (400 to 920 nm)0.025

    Aperture area 0.004Response uniformity 0.005Cosine dependence 0.01Polarization 0.00Linearity 0.00Temperature 0.003

    Source characteristicsRadiant flux 0.005Wavelength (0.01 nm) 0.005Irradiance uniformity 0.005

    Determination of thereference plane

    0.01

    IV Gain 0.01Voltmeter reading 0.005Irradiance 0.032Transfer to device under test

    (estimated)0.030

    Combined standarduncertainty (k 1) (%)

    0.044

    10 November 2006 Vol. 45, No. 32 APPLIED OPTICS 8223

  • arately. The spectral irradiance responsivity of thetrap detector is calculated as the product of the aper-ture area and the spectral radiant power responsivityof the trap detector. The spectral radiant power re-sponsivity of the tunnel trap was measured by directsubstitution against the working standard ACR (Sec-tion 2). The spectral power responsivity (in AW) isproportional to the EQE and the wavelength. The pro-portionality factor is ehc, where e is the elementaryelectron charge, c is the speed of light in vacuum, andh is the Planck constant. The measured EQE of one ofthe working standard trap detectors (T-01) versus thewavelength (82 laser wavelengths) is shown in Fig. 4.The EQE is equal to 0.996 to within 0.1% between 600and 920 nm. The relative combined standard uncer-tainties in the detector responsivity are 0.05% be-tween 400 and 960 nm and 0.1% between 350 and400 nm. A fit to the data points, illustrated in Fig. 4,shows that the reproducibility error of the responsiv-ity determinations is very small, especially between500 and 900 nm. That is, the uncertainty in the fit tothe EQE is smaller than the uncertainty determina-tion at each wavelength. Additionally, there are cor-relations among these absolute points.35 Neitherhave been considered or included in the uncertaintybudget listed in Table 1.

    The trap detector was then equipped with a preci-sion circular aperture whose area was measured on aninterferometrically controlled xy translation stagewith a video microscope by using edge detection.25 Therelative standard uncertainty of the area determina-tion for the 5 mm diameter aperture of the trap detec-tor was 0.004%.25

    The spectral radiant power responsivity of thereference standard trap detectors was measured inunderfilled (total beam power measurement) mode. Inthe irradiance mode, the incident flux overfills the ap-erture. The radiant flux falls on different regions of thetrap detector for the two measurement modes. While

    typically small for silicon trap detectors, the spatialnonuniformity in responsivity of the trap detector canproduce the ultimate limiting uncertainty componentfor the reference irradiance responsivity scale whenthe primary standard, in our case the ACR, measuresradiant power. Dust is the primary cause of nonuni-formity in the responsivity because the reference trapdetectors are nonwindowed devices. To propagate thelow uncertainties in power responsivity to irradianceresponsivity, the detectors spatial response unifor-mity, as well as the area of the defining aperture, mustbe measured. The response of a reference trap detectorwas recently found to be uniform to within 0.01% overthe entire area of the entrance window (with theaperture removed).

    When measuring a point source, the expected re-sponsivity in irradiance mode is a cosine depen-dence on the angle of rotation of the detector fromthe plane normal to the incident flux. Deviationsfrom the expected response can give rise to errorswhen measuring extended sources. Figure 5 showsthe normalized angular responsivity of the tunnel-trap detector when it is equipped with a circularaperture of 5 mm in diameter. The responsivity de-viation from the cosine function is less than 0.02%within a 6 FOV. For an 8 FOV, the deviation isapproximately 0.05%. This feature makes it possibleto use these trap detectors as transfer standards formonochromator-based facilities where the beam con-vergence angle is smaller than the unvignetted FOVof the tunnel-trap detector.

    2. Radiometric Characteristics of the Trap DetectorThe radiation from an integrating sphere is typicallyunpolarized.36 If polarized light is required for a cal-ibration, a collimator can be used with a polarizer inthe beam.

    Linearity is easily checked by changing the laserpower with the intensity stabilizer at the input to thefiber. The ratio of the signal of the DUT or referencetrap to the monitor signal as a function of power should

    Fig. 4. Silicon tunnel-trap detector EQE versus wavelength.

    Fig. 5. Angular responsivity of the tunnel-trap detector.

    8224 APPLIED OPTICS Vol. 45, No. 32 10 November 2006

  • be a straight horizontal line. Figure 6 is a representa-tive plot of a silicon detectors response linearity overfour decades. Some silicon detectors have been mea-sured to be linear over 14 decades.37,38

    The temperature in the SIRCUS facility wasmaintained at a nominal temperature of 22 C. Typ-ical variations were of the order of 0.5 C or less,though in extreme cases, variations of the order of2 C were observed. The temperature, pressure,and humidity inside the light-tight enclosure can bemonitored and corrections can be made if necessary.The temperature coefficient of Hamamatsu S1337photodiodes (the type of silicon photodiode used in thetrap detectors) has been measured.1 It was foundthat there was negligible dependence below 950 nm0.01%K but that the dependence rose quickly to0.2%K by 1000 nm.39 A similar dependence shouldbe seen in trap detectors using these diodes.

    3. Source CharacteristicsThe radiant power and wavelength stability are twoof the primary uncertainty components. A laser in-tensity stabilizer keeps the laser power level constantto within 0.1%. The lasers used as excitation sourcesare equipped with etalons to reduce the wavelengthuncertainty from mode hopping. The wavelength un-certainty is of the order of 103 nm with a typicalbandwidth of the order of 103 nm. The wavelengthuncertainty is dominated by the dependence of theindex of refraction of air on temperature, humidity,and pressure. The wavemeter corrects for the tem-perature and pressure dependence and can be pro-grammed to correct for the humidity.

    The sequence for measurements of a DUT is to firstmeasure the trap and monitor signal, then move thestage so that the DUT versus the monitor signal ismeasured, then move back to the trap measurement.If any change is observed in the trap-to-monitor ratiogreater than 0.01%, additional measurements aremade and the data are averaged. Typically, from 9 to16 samples are averaged for each data point. Occa-

    sionally additional samples are taken, for example,when measuring the out-of-band response of a filterradiometer under test.

    The irradiance at a reference plane should be spa-tially uniform to limit the magnitude of corrections fordifferent size entrance pupils. In Fig. 7(a) we show theirradiance distribution at a reference plane approxi-mately 1 m from the exit port of a 25.4 mm integratingsphere equipped with a 5 mm diameter aperture. InFig. 7(b) we show a horizontal slice across the centerof the distribution. As shown in Fig. 7, the irradianceis uniform to within 0.1% over the central 2 cmin both the horizontal and vertical directions. Theentrance apertures of most irradiance meters cali-brated on SIRCUS have diameters significantlysmaller than 4 cm, and no correction for irradiancenonuniformity at the reference plane is applied.

    4. DistanceThe distance between the source and trap detectorapertures (reference planes) is measured optically andmechanically. For a point-source geometry, the irradi-ance should follow an inverse square law, i.e., the ir-

    Fig. 6. Detector response linearity. The signal-to-monitor ratio asa function of the signal (related to incident optical power).

    Fig. 7. Irradiance uniformity at a reference plane 1 m from theirradiance source. (a) Two-dimensional map of the irradiance dis-tribution; (b) horizontal slice through the vertically centered irra-diance.

    10 November 2006 Vol. 45, No. 32 APPLIED OPTICS 8225

  • radiance should be a function of 1d2, where d is thedistance between the two reference planes. The rel-ative distance between the source and the detector ismeasured with an electronic ruler that has a quotedresolution of 5 m.40 The three-axis detector transla-tion stage is moved in the horizontal direction, andthe detector and monitor signals are acquired as afunction of relative distance. The ratio of the trapsignal to the monitor signal is then plotted as a func-tion of distance and fit with a nonlinear least-squaresalgorithm.41 Figure 8 illustrates an optical distancemeasurement, with the dots measuring trap-to-monitor ratios and the solid curve being the fit to thedata. The data were fit to the expression

    ym1m0m22, (3)

    where the radiant intensity is given by m1, the zerooffset of the fixed source is m2, and m0 is the positionof the stage measured by the electronic ruler. Theuncertainty in the fit to m2 is 28.7 m. Since we knowthe zero offset from this fit, we also know the absoluteseparation at any value of the electronic ruler with anuncertainty of 28.7 m. To validate the radiometricmeasurements, we also measured the apertureseparation by using a calibrated ruler. The two sep-arate techniques used to measure the distance be-tween the source and the detector reference planesagreed usually within 50 m. Given a 50 m uncer-tainty in the trap reference plane, the uncertainty inthe irradiance at a given reference plane for distancesof 1 m or greater is less than 0.01%.

    For radiometers with a known reference plane, weuse a micrometer to make sure that the DUTs and thereference trap aperture lie in the same plane. By usinga micrometer, the reference planes can be aligned towithin approximately 10 m. Consequently, this ap-proach significantly reduces the uncertainty in theirradiance at the DUT reference plane. If the DUTreference plane is not known, it is optically deter-mined by using Eq. (3). For a non-point-source geom-etry, the full equation including the spatial extent of

    the source and detector is required42; the uncertain-ties remain the same.

    5. Current-to-Voltage Conversion (IV Amplification)The uncertainty of the current-to-voltage (IV) con-version43 was 0.01% for gain selections between104 VA and 107 VA. At these gains, the uncertaintyof the feedback resistors in the IV converter was0.01% k 1 for the decade nominal resistance val-ues. The uncertainty increased to 0.014% at the108 VA gain where two 50 M resistors (each with0.01% resistance uncertainty) were connected seri-ally. Because the resistance uncertainty of 109 resistors is 0.5% or higher, a gain of 109 VA wasradiometrically calibrated against a gain of 108 VAby measuring the same stabilized optical power. Thegain uncertainty for this highest gain selection was0.02%. The low uncertainties in gain can be achievedonly if the dark reading is substracted from the signalplus the dark reading of the trap detector radiometer(which includes the IV converter) using a shutterpositioned upstream in the laser beam. The temper-ature coefficients of the resistances were 0.001%Cfor gain selections between 104 VA and 107 VA.The maximum temperature change in the light-tight box is 2 C. Given an equal probability distri-bution for the temperature, the uncertainty in theresistance arising from the temperature coefficient is0.001% 23 7 104%.33

    6. Transfer to Test InstrumentTo achieve the lowest possible uncertainties onSIRCUS, the instrument should be designed with thecalibration in mind. The uncertainty in the transfer toa test instrument is listed in Table 1 as 0.03%. This isfor a well-designed, well-characterized, stable radi-ometer. Nonideal instrument characteristics such asstability, temperature dependence, long-term drift,and out-of-field response, all contribute to increasedoverall uncertainty in a calibration. Interferencefringes from multiple reflections of incident radiationat optical surfaces have been observed in the calibra-tion of instruments with windows and other opticalelements if they are not wedged or antireflectioncoated. For example, the absolute spectral responsiv-ity of a pyrometer (discussed in Subsection 4.A) cal-ibrated on SIRCUS is shown in Fig. 9, in both alogarithmic [Fig. 9(a)] and a linear [Fig. 9(b)] scale.Interference fringes (the sinusoidal oscillations in theresponsivity) are emphasized in the expanded view[Fig. 9(c)]. The presence of interference fringes in-creases the difficulty in the calibration if they must bemeasured during the calibration or increases the un-certainty in the calibration.

    As an aside, we have found that interference fringesare ubiquitous, caused mainly by the window on thephotodiode or parallel-surface windows in the device,or filters.12 A complete mapping of the fringes is pos-sible on SIRCUS because of the narrow spectral band-width and wavelength stability of the lasers andbecause the laser wavelength can be tuned automati-cally. In certain calibration approachesfor example,

    Fig. 8. Radiometric determination of the distance between twoaperture planes. Dots are measured trap-to-monitor ratios; solidcurve is a fit to the data.

    8226 APPLIED OPTICS Vol. 45, No. 32 10 November 2006

  • using lampmonochromator systemsthe fringes arenot observed. Interference fringes occur when the co-herence length of the source is as long as or longer thanthe size of the interfering structure. For example, in-terference fringes will most likely be present from mul-tilayer coatings even for an incoherent source such asa lamp. If they are not observed, it is likely because thefine structure in the spectral responsivity caused byinterference fringes is being averaged over the finitesource bandwidth. However, the averaging may notbe complete, and artifacts caused by the incompletecancellation of the fringes can lead to erroneousresults. Also, errors can arise in the determinationof an instruments effective aperture area using thescanning method if fringes are present.12 In thiscase, the instrument should be calibrated directlyin the irradiance mode to obtain the lowest achiev-able uncertainties.

    7. Radiance Responsivity CalibrationsFor radiance responsivity calibrations, the uncer-tainty budget differs only slightly from the uncer-tainty budget derived for irradiance responsivitycalibrations. In a radiance responsivity calibration,the average radiance over the entire integratingsphere exit port area is measured by the referencetrap detector, while instruments being calibratedtypically image variously sized central regions ofthe exit port. Errors in calibration can occur if thesphere radiance is nonuniform, giving different av-erage radiance depending on the area of the exitport being imaged. While the spheres nonunifor-mity can be mapped and corrections applied, for thelowest uncertainty measurements, it is desirable tokeep the spheres nonuniformity as small as possi-ble. Many researchers have calculated baffle ar-rangements for spheres to improve the radianceuniformity within the exit port for different inputsource configurations. We have found empiricallythat if the input laser beam impinges on the spherewall close to the exit port, no baffles inside thesphere are needed.

    The integrating spheres used for radiance respon-sivity calibrations on SIRCUS have been designed toallow the incident laser light to hit the sphere wallnear the exit port. The spatial uniformity of one ofthe spheres, a 30 cm diameter Spectralon-coated in-tegrating sphere with a 7.5 cm diameter aperture,was mapped using a radiometer with a narrow1 FOV. Fixed at a distance of 0.5 m from thesphere, the target spot diameter of the radiometer atthe sphere exit port was approximately 12.5 mm. Theradiometer was translated in 6 mm increments andthe radiance recorded at each position. The sphereradiance was spatially uniform to within 0.1% overthe entire sphere exit port (Fig. 10). Radiance is aconserved quantity. As long as the DUT is imaging anarea within the exit port, the distance from the DUTto the sphere exit port is not critical for radianceresponsivity calibrations.

    Fig. 9. Absolute spectral irradiance responsivity of a filter radi-ometer, namely, the AP1 pyrometer, shown on (a) a logarithmicand (b) a linear scale. (c) Expanded view of the responsivity show-ing large oscillations arising from multiple reflections of the inci-dent flux between surfaces within the instrument.

    10 November 2006 Vol. 45, No. 32 APPLIED OPTICS 8227

  • E. Calibration Procedure

    Before an instrument can be calibrated, it must bealigned with respect to the integrating sphere, asmust the reference standard detector. To align thesystem, a laser is used to define an optical axis. Boththe integrating sphere and the detectors are thenaligned to the optical axis. The optical axis is typicallyset to be parallel to the direction of motion of a lineartranslation stage that moves perpendicular to thesphere exit port (the z axis defined in Fig. 11). The zaxis translation stage sits on a pair of rails and ismanually translated. A linear encoder records thestage position along the rails.

    As illustrated in Fig. 11, to define the optical axis,a laser beam is incident on a pellicle beam splitterthat is mounted on the z-axis rail system. A mirroris positioned behind the pellicle to retroreflect thelight directly back into the laser. The pellicle is in amirror mount and is adjusted to reflect light that isthen aligned to be parallel to the translation stage.This is done by first mounting an iris near thepellicle beam splitter on the translation stage and

    aligning it so that the laser light is centered on theiris aperture. Then the iris is moved by using thetranslation stage to lie some distance away fromthe pellicle. The angle of the pellicle beam splitter isadjusted so that the light reflected from it goesthrough the iris aperture. These two steps are re-peated until the beam is centered on the iris at thetwo translation stage positions. At this point, theoptical beam is parallel to the translation stage, andthe optical axis is defined.

    To align the detectors, the motorized xy translationstage is positioned such that the laser is centered oneach detector (one at a time), and the reflection from aflat reference plane on the detector is parallel with theincident beam. For each detector, a computer registersand stores the alignment position. The retroreflectedbeam (from the mirror behind the pellicle) is automat-ically aligned parallel to the rail. The sphere exit portis then centered on this beam (and the angle adjustedto coalign the reflected laser beam with the incidentbeam).

    The alignment between the detectors and the in-tegrating sphere is radiometrically validated bytranslating the detectors in the x and y directionsand recording the signals as a function of stageposition. The stage position giving the maximumsignal from each instrument is compared with thestage position derived from the optical alignmentprocedure. The two positions typically agree towithin 1 mm, well within the desired alignmentuncertainty.

    1. Calibration ProtocolThe entire data collection sequence is automated.Initially, an electronic shutter that blocks the laserradiation before it enters the optical fiber is closed,and a background signal is acquired for both thereference standard trap detector and the spheremonitor. Then the shutter opens and the signalsfrom the trap and the monitor on the sphere arerecorded. The signals are initially amplified using acurrent-to-voltage amplifier44 and then fed into adigital multimeter.45 The signal from the multim-eter is averaged for several seconds. The meanreference-to-monitor ratio and the standard devia-tion of the ratio are recorded. After this, the stagemoves to the DUT position, and the data acquisitionsequence is repeated. This gives the DUT meansignal-to-monitor ratio and the standard deviationof the ratio. The standard deviations of the ratiosare monitored; trap detector measurement stan-dard deviations larger than 0.01% are an indicationof laser power instabilities.

    Under routine calibration conditions, the intensity-stabilized laser wavelength is read by the wavemeterand transferred to the computer during each measure-ment. Along with mean ratios, the mean and standarddeviations of the wavelength are recorded. This allowsready identification of laser wavelength instabilitiesduring a scan. Occasionally, for faster data acquisition,the wavelength is recorded only at the beginning of theacquisition sequence. Following the data acquisition

    Fig. 10. Contour plot of the sphere radiance uniformity within theexit port; 0.1% steps.

    Fig. 11. Schematic of the alignment method for SIRCUS.

    8228 APPLIED OPTICS Vol. 45, No. 32 10 November 2006

  • sequence, the wavelength is changed and the sequenceis repeated.

    3. Comparison with the National Institute of Standardsand Technology LampMonochromator-BasedCalibration Facility

    The high optical power available with laser-based cal-ibration systems enables us to calibrate instrumentsdirectly for either radiance or irradiance responsivity.The low wavelength uncertainty of the laser is instru-mental in reducing the calibration uncertainty forfiltered instruments. The source radiance uniformityalso permits rapid characterization and calibration ofdigital imaging systems. Some of the advantages of thelaser-based calibration approach over a conventionallampmonochromator-based approach are illustrat-ed by the calibration of a photoelectric pyrometer(PEP), an instrument used to radiometrically deter-mine the temperature of a blackbody.46 The instru-ment is equipped with a narrow bandpass filter1 nm for spectral selectivity.

    For accurate radiance temperature determinations,the instruments spectral out-of-band responsivitymust be measured as well as its in-band responsivity.Figure 12 shows the relative spectral responsivity of

    the PEP determined on SIRCUS compared with therelative spectral responsivity determined using thelampmonochromator system in the SCF. As shown inFig. 12(a), the spectral responsivity measured with thelampmonochromator system is dominated by thespectral bandwidth of the source and deconvolution ofthe spectrum by using the source slit scatter functionis required. In contrast, the fine detail in the spectralresponsivity is easily measured on SIRCUS because ofthe monochromatic nature of the source. Note thatthere are several overlying data points at each wave-length along both the rising and falling edges, demon-strating the extreme wavelength stability of theSIRCUS facility. Because of the low flux in the lampmonochromator system, the out-of-band responsivityis limited to approximately 106 [Fig. 12(b)]. In con-trast, the out-of-band responsivity can be measuredto the 109 level in the SIRCUS facility.

    In SIRCUS, instruments are calibrated in their op-erational state: at the system level, with entrance pu-pils overfilled. This approach avoids unforeseen errorsthat can occur using other calibration approaches. Forexample, consider the measurements of the relativespectral responsivity of a single channel filter radiom-eter known as a standard lamp monitor (SLM).47 TheSLM can be operated in irradiance or radiance mode,depending on the foreoptics. The irradiance mode con-figuration has a Teflon diffuser, a window, an interfer-ence filter, and a silicon photodiode. The instrumentsrelative spectral responsivities (RSRs) are used toband integrate the response to an illumination source.The RSR of a SLM was measured on the SCF. Duringthese measurements, the flux from the monochroma-tor exit slit was imaged onto the center of the diffuser.In this case, the irradiance collector was underfilled bythe incident radiant flux. The SLM was also calibratedin irradiance mode for absolute spectral responsivityon SIRCUS. In this case, the irradiance collector wasoverfilled by the flux from the laser-illuminated inte-grating sphere. A comparison of the two results byusing peak-normalized data showed that the relativespectral responses did not agree (Fig. 13). There wasno dependence on the f# of the incoming flux. How-ever, spatial maps of the relative response at multiple

    Fig. 12. Relative spectral responsivity of the PEP measured onSIRCUS and on the SCF: (a) linear scale; (b) log scale.

    Fig. 13. Relative spectral responsivity of the SLM measured inunderfilled mode (SCF) and in overfilled mode (SIRCUS).

    10 November 2006 Vol. 45, No. 32 APPLIED OPTICS 8229

  • fixed wavelengths within the in-band region showedthat the irradiance responsivity was not spatiallyuniform (due to the diffuser), leading to the observeddifferences. These measured differences can causeerrors in the band-averaged measurements of spec-tral irradiance when the spectrum of the source beingmeasured differs from that of the calibration source.

    4. Application to Primary Radiometric Quantitiesand Units

    The NIST Optical Technology Division is responsi-ble for maintaining two fundamental SI units, theunit for temperature, the kelvin, above 1234.96 K,and the unit for luminous intensity, the candela. Inthe following subsections we describe the effect ofSIRCUS calibrations on reference standard pyrom-eters used to measure the radiance temperature ofblackbody sources and photometers used to measurethe illuminance of standard lamps. Using SIRCUS todevelop a detector-based validation of the spatial dis-tribution of the radiant flux from a standard synchro-tron source predicted by the Schwinger equation isalso discussed.

    A. Radiance Temperature

    For temperatures above the freezing temperature ofsilver, the ITS-90 (Ref. 48) is defined in terms of spec-tral radiance ratios to one of the silver-, gold-, oraluminum-freezing temperature blackbodies using thePlanck radiance law.49 In the ITS-90, the assignedtemperatures for the aluminum, silver, and gold freez-ing points result from thermometry using ratio pyrom-etry from the mean of two different and conflictingconstant-volume gas thermometry measurements atlower temperatures. There are thermodynamic tem-perature uncertainties of the freezing points of theprimary metal blackbodies that arise primarily fromthe uncertainties in the lower temperature gas ther-mometry.

    Because of the use of spectral radiance ratios, thetemperature uncertainties of ITS-90 assigned black-body, uTBB, increase as the square of the tempera-ture ratios according to

    uTBBuTFPTFP

    2 TBB2, (4)

    where TFP and uTFP are the temperature and theuncertainty of the fixed-point blackbody and TBB isthe temperature of the higher temperature black-body. The increases in the temperature uncertaintiescan be reduced by using absolute radiometry with py-rometers traceable to cryogenic radiometers, and theresulting temperature uncertainties can be smallerthan those measured using the ITS-90 techniques.10,50

    To decrease the uncertainties in the radiance tem-perature scale at NIST and, ultimately, in the ther-modynamic temperature assignment of the metalfreezing-point temperatures, a pyrometerdenotedthe Absolute Pyrometer-1 (AP1)was built to radio-metrically measure blackbody temperatures.50,51 Spec-

    tral selection is achieved by using a narrowbandinterference filter with a center wavelength at 650 nmand a bandpass of 10 nm. The filter is temperaturestabilized to near room temperature, and the hermet-ically sealed silicon photodiode has a two-stage ther-moelectric cooler for operation at 15 C. It has anoise-equivalent power (NEP) of 3 fW at an electricalbandwidth of 0.3 Hz. The radiometric characteristics,e.g., stability and linearity, for example, of the AP1have been established.51

    The AP1 was calibrated for absolute spectral ra-diance responsivity on SIRCUS. As shown in Fig. 9,it has a peak responsivity between 647 and 652 nm,a FWHM bandwidth of approximately 10 nm, andout-of-band blocking better than 107. Interferencefringes with an amplitude of 0.5% were observed inthe responsivity. The absolute spectral responsivitywas therefore measured with 0.03 nm resolution. TheAP1 subsequently measured the melt and freeze cy-cles of silver and gold fixed-point blackbodies. Thesignal from the AP1 is converted to temperature us-ing the equation:

    iu sLuLu, Td, (5)where sL is the absolute spectral responsivity ofthe AP1, u is the emissivity of the blackbody, andLu, T is the radiance of the blackbody derived fromPlancks equation.50

    The noise-equivalent temperature at the gold (andsilver) freezing temperature is 2 mK, and the noisewill not be the dominant component of the totaltemperature uncertainties. The AP1 was calibratedtwice on SIRCUS, once in 2003 and again in 2005.Using the SIRCUS 2003 calibration, the expandeduncertainty k 2 in the radiometric measurementof the gold (or silver) freezing-point blackbody wasapproximately 0.15%. The radiometric uncertaintiescan be related to the uncertainties of the temperaturedeterminations from the derivative of the Wien ap-proximation, which shows the relationship betweenthe uncertainty in radiance, L, to the uncertainty inblackbody temperature, T:

    LL

    c2

    T

    T2. (6)

    In Eq. (6), c2 is the second radiation constant, and is the wavelength. Using Eq. (6), an uncertainty of0.15% in radiance responsivity at 650 nm will lead toan uncertainty of 121 mK in the measurement of themelting and freezing temperature of the gold-pointblackbody, which is slightly larger than the ITS-90uncertainty, as shown in Table 2.52 The AP1 wasrecently recalibrated on SIRCUS by using the 2004trap-detector responsivity scale (Table 1). By usingthe new calibration, the expanded uncertainty in theradiometric measurement of the gold point is reducedto approximately 0.09%. With the reduced uncer-

    8230 APPLIED OPTICS Vol. 45, No. 32 10 November 2006

  • tainty from SIRCUS, the corresponding temperatureuncertainty derived from the uncertainty in the ra-diometric measurement of the gold-point blackbodycan be reduced to approximately 72 mK, significantlylower than the ITS-90 uncertainty.

    These results are, in effect, the first step towardimplementation of a detector-based thermodynamictemperature scale. SIRCUS can be used to calibrateoptical pyrometers directly, eliminating the depen-dence on a blackbody and the ITS-90. As discussedby Yoon et al.,50,53 moving from a source-based toa detector-based spectral irradiance (and radiance)scale can greatly reduce the radiometric uncertaintyin the measurement of higher temperature sources.

    B. Photometry

    The redefinition of the candela in 1979 coupled photo-metric and radiometric units54 and made it possible torealize and maintain photometric units by using de-tectors as well as sources. Following the redefinition,many national laboratories, including NIST, derivedand maintained the candela (and derived photometricunits) using calibrated standard detectors traceable tocryogenic radiometry rather than standard lampstraceable to primary standard blackbodies and inter-national temperature scales.55,56 Since 1992, the can-dela has been maintained at NIST by using a group ofeight standard photometers.57 The overall relative ex-panded uncertainty (k 2) for the NIST illuminanceunit realization is currently 0.39%.57

    There are several components in the uncertaintybudget related to the determination of the photometerrelative spectral responsivity using the lampmonochromator system in the SCF.1,57 The uncertain-ties in these components can be significantly reducedor eliminated by realizing the illuminance scale onSIRCUS. The spectral responsivity scale will be re-duced from a standard uncertainty of 0.11% currentlymeasured on the SCF to 0.075% because of the re-duction of transfer steps from the high-accuracycryogenic radiometer. The luminous efficiency func-tion defined by the Commission Internationale delEclairage (CIE), V, is a strong function of wave-length. The SIRCUS wavelength scale, with uncer-tainties reduced to less than 0.01 nm from the SCFswavelength uncertainty of 0.1 nm, reduces the rela-tive standard uncertainty for this component from0.04% to 0.004%. A significant set of uncertaintycomponents results from the geometry of the SCF

    output beam. The SCF uses f9 optics to focus thelight to a 1 mm spot that is used to calibrate the pho-tometers, whereas the photometers are normally usedin a far-field condition. SIRCUS can calibrate photom-eters in a geometrical configuration identical to theapplication geometry, eliminating errors caused by dif-ferent interreflection patterns inside the photometerbetween the calibration and application.

    In addition, since SIRCUS calibrates the detectorin irradiance mode instead of power mode, the uncer-tainty of the aperture size and the uncertainty due tothe nonuniform spatial response of the photometerare eliminated. Combined the uncertainty contribu-tion from these components can be reduced from0.12% (Ref. 57) to less than 0.01%. The overall rela-tive expanded uncertainty k 2 for the NIST illu-minance unit realization is expected to be reduced to0.24%, a 40% reduction from the uncertainty in thecurrent scale, when the new illuminance scale isrealized. The new illuminance scale will lead to anexpected overall relative expanded uncertainty of0.27% k 2 for the NIST candela.

    The current photometric working standard pho-tometers were not calibrated on SIRCUS becauselarge interference fringes (of the order of 10%) wereobserved in the spectral responsivity of those instru-ments. A trap-detector-based tristimulus colorimeterwas developed to realize a detector-based color scale(see Subsection 5.A.). As a first step toward the newSIRCUS-based photometric scale, the irradiance re-sponsivity of the photometric (Y) channel of the col-orimeter was determined. An aperture mounted onthe front surface of the colorimeter defines the refer-ence plane for irradiance and illuminance measure-ments. Because of the thick color filter combinations58and the removed photodiode windows, all four chan-nels of this colorimeter showed fringe-free operation onSIRCUS. Use of feedback resistors in the photocurrentmeters with 0.001%C temperature coefficient of re-sistance, 0.01% uncertainty of their decade nominalvalues, and realizing loop gains larger than 104 in dcmeasurements for all signal-gain selections, the un-certainty of the photocurrent-to-voltage conversionwas 0.01%.31

    From the SIRCUS-measured spectral irradiance re-sponsivity of the photometric channel (between 360and 950 nm), the illuminance responsivity was cal-culated.59 Thereafter standard lamps were measuredin the photometry calibration facility to compare theilluminance responsivities of the same channel deter-mined from both the existing (SCF-based) and thenew (SIRCUS-based) scales. The colorimeter wascalibrated on SIRCUS twice, with the calibrationsseparated in time by 15 months. The illuminanceresponsivity of the photometric channel from the twoSIRCUS calibrations agreed within 0.1%. The aver-age illuminance responsivity from the two SIRCUScalibrations was 4.911 nAlx, 0.35% higher than theSCF-based illuminance responsivity.

    Our investigations showed that the SCF-basedilluminance responsivity (used in the present photo-

    Table 2. Comparison of the Results of Radiometric Determinations ofthe Gold- and Silver-Point Blackbody Temperatures Using the AP1

    Pyrometer with the ITS-90 Values

    TAP1(K)

    u (TAP1)(K)

    (k 2)T90(K)

    u (T90)(K)

    (k 2)TAP1 T90

    (K)

    Au-pointblackbody

    1337.344 0.121 1337.33 0.100 0.014

    Ag-pointblackbody

    1234.956 0.106 1234.93 0.080 0.026

    10 November 2006 Vol. 45, No. 32 APPLIED OPTICS 8231

  • metric scale) is low by approximately 3% because of abeam-clipping problem caused by the small aperturesin the working standard photometers. Comparisonsof the spectral responsivity determined on SIRCUSand the SCF show spectral shifts as large as 0.5 nmand responsivity differences as large as 1%.

    C. Synchrotron Radiation

    Schwinger described the nature of radiation that isemitted from the acceleration of relativistic parti-cles.60 In a synchrotron accelerator, electrons areconfined to a circular path and continuously emitradiation tangential to their direction. Magnets areused to control the energy and direction of electronsin the synchrotron. Like blackbody radiation, syn-chrotron radiation is absolutely calculable from theknowledge of a very few parameters. Blackbody ra-diation follows from Plancks law: Knowledge of thetemperature and emittance allows for calculation ofall radiation emanating from the blackbody. Synchro-

    tron radiation is defined by the Schwinger equation:The electron beam current, magnetic field, and theorbital radius completely define the radiation field.

    The NIST Synchrotron Ultraviolet Radiation Facil-ity (SURF III) is a particularly simple synchrotronstorage ring. The electrons are confined to a circularorbit in a vacuum chamber by a dipole magnet with anextremely uniform magnetic field (104 nonunifor-mity in the magnetic field). The angular distributionand intensity of radiation is dependent on the elec-tron beam energy and the wavelength of the emittedradiation. To validate the expected spatial distribu-tion, three filter radiometers were constructed withband-center wavelengths at 254, 400, and 800 nm,respectively. A simplified schematic of the filter radi-ometers is shown in Fig. 14(a). These filter radiome-ters contain a precision aperture, a diffuser, aninterference filter, and a photodiode, and they are notpolarization sensitive. The filter radiometers werecalibrated for irradiance responsivity on SIRCUS; theabsolute spectral responsivity of the 400 nm filterradiometer is shown in Fig. 14(b). They subsequentlymeasured the angular distribution and intensity ofthe emitted radiation at a known beam current andmagnetic field at SURF III.61 The filter radiometerresults are shown in Fig. 15. By numerically integrat-ing the response of the radiometers and the calcu-lated angular distribution of the intensity of emittedradiation, the spatial distribution of the radiant fluxfrom SURF III can be calculated for different wave-lengths. The quantitative results for the three filterradiometer wavelengths are given by the solid curvesin Fig. 15. There are no adjustable parameters in thecalculations. The results at 400 nm have been mul-tiplied by a factor of 3 and the results at 800 by afactor of 15 to show all the results on the same figure.The calculated, or predicted signals as a function ofangle agree with the measurements to better than0.5%.

    5. Applications

    The unique characteristics of SIRCUS give us theversatility to address a wide range of optical metrol-ogy issues in addition to applications related to the

    Fig. 14. (a) Schematic diagram of the filter radiometers that werecalibrated for irradiance responsivity on SIRCUS and used to mea-sure the angular distribution of radiation and intensity at SURFIII. (b) Absolute spectral irradiance responsivity of the 400 nmfilter radiometer.

    Fig. 15. (Color online) Angular distribution pattern from SURFmeasured with three filter radiometers. The solid curve is thecalculated distribution pattern.

    8232 APPLIED OPTICS Vol. 45, No. 32 10 November 2006

  • measurement of fundamental sources or to the real-ization of fundamental SI units. We briefly discussother applications in the following subsections.

    A. Detector-Based Color Scale

    A tristimulus colorimeter standard was developed byusing temperature-stabilized filters in front of a silicontunnel-trap detector to realize a detector-based colorscale.58 The tristimulus colorimeter is composed of fourchannels consisting of filter combinations with the trapdetector designed to mimic the CIE color-matchingfunctions62 with small spectral mismatch. The spectralmismatch of the realized channels is characterizedby the CIE f1 values.63 The filter combinations aremounted in a temperature-controlled (heated) filterwheel that can be moved between the trap detectorand the front aperture. The aperture plane is thereference plane of the illuminance-mode photometercolorimeter, and it is in the plane of the front cover. Aprecision current-to-voltage converter is attached tothe top of the instrument. Electronic and radiometriccharacterizations, including current-to-voltage con-version uncertainty and spatial, angular, and spec-tral responsivity, have been done.

    The tristimulus colorimeter was calibrated onSIRCUS as a first step in the establishment of adetector-based color scale.64 When utilizing the uni-form irradiance at the detector reference plane fromthe small sphere source of the SIRCUS, the nonuni-formity of spatial responsivity of the filters and thedetector in the tristimulus colorimeter will not contrib-ute to measurement uncertainty. Also, interreflectionsbetween optical components will be the same for thecalibration and subsequent applications, and their con-tribution to radiometric measurement error will can-cel. The combined expanded uncertainties k 2 inthe absolute spectral irradiance responsivities of theindividual channels, neglecting correlations, are es-timated to be 0.15% or less. From the spectral irra-diance responsivity curves, the broadband calibrationfactors of the colorimeter channels can be calculated,and the tristimulus values of a test light source canbe measured. For a Planckian radiator (a light sourcewith a well-known spectral distribution), a 0.15% un-certainty in the spectral irradiance responsivity ofany one channel of a tristimulus colorimeter willresult in a chromaticity coordinate uncertainty of0.0004 for both x and y. These uncertainties corre-spond to an uncertainty of 4 K in color temperature,a factor of 2 less than the uncertainties of currentprimary color temperature lamp standards.

    B. Stray Light Characterization of Spectrographs

    Spectrographs are spectroradiometers with mul-tielement array detectors that can acquire an entirespectral image over some finite spectral region si-multaneously. Spectrographs commonly consist ofan entrance port, a dispersing element (such as agrating) to spatially resolve the spectral compo-nents of the incident radiation, and mirrors to im-age the entrance port (often a slit) onto a referenceplane where the array detector is located. Because

    of the dispersing element, the spatial image of theentrance port falls on different regions of the detec-tor array, depending on its wavelength; broadbandsources form an image across the entire array. Thespectral coverage of a spectrograph is determinedby the size of its detector array, the dispersion prop-erties of its grating, and its optical layout. Com-pared with conventional, scanned grating systems,source spectral distributions can be acquired in amatter of seconds, as opposed to minutes. The abil-ity to rapidly acquire a spectrum has led to the useof array-based systems in a variety of radiometric,photometric, and colorimetric applications whereacquisition speed is an issue, for instance, on aproduction line, or in cases where the source beingmeasured is not stable over extended periods oftime.

    The measurement uncertainties of spectrographsare often larger than conventional scanning spectrom-eters. Spectrographs are single grating instrumentsand there are intrinsic limitations in the backgroundsignal originating from radiation scattered from im-perfections in the grating and other optical elements.This unwanted background radiation, called straylight, while smallof the order of 104 or less ofthe incident spectral radiance in a single gratingspectrographcan give rise to unforeseen errors, of-ten much larger than anticipated, when the spec-tral distribution of a source being measured differssignificantly from the spectral distribution of the cal-ibration source. In comparison, a conventional scan-ning spectrometer is often constructed as a double-monochromator instrument (double grating or prismgrating) that has a stray light level lower than 106.

    In many applications, the spectral distributions ofthe test source and the calibration source differ signif-icantly. Spectrometers are typically calibrated againststandard incandescent lamps with correlated colortemperatures (CCTs) ranging from 2800 to 3100 K.Most of the emission from these sources lies in the redand NIR regions. Measurement errors, often signifi-cant, arising from stray light are inevitable wheninstruments calibrated against standard lamps sub-sequently measure light sources that have dissimilarspectral distributions, such as LEDs, displays, dis-charge lamps, and fluorescent lamps. In these situa-tions, stray light is often the dominant source ofspectrograph measurement error.

    Algorithms have been developed to correct theoutput of a spectrograph for stray light based onthe spectral imaging properties of the instrument.The tunable lasers available on SIRCUS are used tocharacterize a spectrographs response for straylight. Figure 16 is a semilogarithm plot of spectraacquired from a spectrograph with excitation wave-lengths ranging from 350 to 800 nm. Each spectrumis a single image normalized by the peak value. Thestrong central peak in each image (or spectrum) inFig. 16 corresponds to the image of the entrance slitformed on the detector array. The broad shoulder andfinite baseline are signals from radiation that is not

    10 November 2006 Vol. 45, No. 32 APPLIED OPTICS 8233

  • properly imaged onto the detector, i.e., from straylight within the spectrograph. By measuring the sys-tem response at a number of wavelengths, the evolu-tion of the image as the excitation wavelength movesacross the array can be determined. Based on thesemeasurements, a stray light correction algorithm canbe implemented that reduces the errors and associ-ated uncertainties arising from stray light an order ofmagnitude or more.47,65,66 For an accurate character-ization of spectrometers for this correction, the inputoptics must be illuminated by uniform monochro-matic radiation at many wavelengths in irradianceor radiance mode. The SIRCUS facility is effectivelyutilized to achieve the necessary measurements.

    C. Solar Irradiance

    Sun photometers are filter radiometers used to deter-mine atmospheric optical properties at different wave-lengths. Primary standard reference sun photometersare calibrated at high altitudes by using the LangleyBouguer technique. In this calibration approach, a se-ries of measurements at different solar zenith anglesare made over the course of a day, giving a range ofmeasured signals as a function of zenith angle (or airmass). The measurements are then extrapolated backto zero air mass, giving an instrument signal corre-sponding to the expected signal in the absence of anyintervening atmosphere.67 Reductions in the uncer-tainties in irradiance responsivity calibrations ofprimary standard reference Sun photometers usinglaboratory standards would allow for meaningful com-

    parisons with the results from the LangleyBouguermethod, resulting in independent values for the exoat-mospheric solar irradiance at the set of measurementwavelengths.

    Global networks of Sun photometers are used toprovide detailed mapping of atmosphere opticalproperties, for example, aerosol concentrations anddistributions. Sun photometers that are part ofthe Aerosol Robotic Network68 (AERONET) are cal-ibrated for irradiance responsivity against refer-ence primary standard Sun photometers using thecross-calibration technique at the NASA GoddardSpace Flight Center (GSFC).67 The cross-calibrationtechnique consists of near-simultaneous solar obser-vations with the uncalibrated instrument and acalibrated reference Sun photometer. Reducing the un-certainties in network instruments by using labora-tory standards would validate the uncertainties in thecalibration transfer and could improve the character-ization of the atmosphere.

    Because Sun photometers measure solar irradi-ance, their responsivity is typically low, and they aredifficult to calibrate using lampmonochromator sys-tems. To demonstrate the feasibility of calibratingSun photometers on SIRCUS, two multichannel Sunphotometers were calibrated and the results com-pared with standard cross calibrations.69 To comparethe cross-calibration results to the SIRCUS calibra-tions, the SIRCUS-derived irradiance responsivitiess() were used to predict a top-of-the-atmosphere(TOA) signal VoSIRCUS:

    VoSIRCUS sEd, (7)where s is the spectral responsivity of one of theradiometer channels and E is an exoatmosphericsolar irradiance spectrum. In this work we used theexoatmospheric solar irradiance spectrum developedby Thuillier et al.70 To perform the integration, thes and the E were interpolated to a uniformwavelength interval of 0.25 nm and integrated. The750 nm channel results agreed with the cross calibra-tion to within 0.15%, the 490 nm channel to within0.85%, and the 440 nm channel to within 5.76%.

    The dominant source of uncertainty in the SIRCUS-based predicted TOA signal was the uncertainty in thesolar irradiance spectrum. Assuming an 1.5% com-bined standard uncertainty in the absolute value andgiven a step size of 1 nm in the region of interest, wewere able to validate the cross calibration with anexpanded uncertainty k 2 of 4%. The agreementfor the 490 and 750 nm channels were within thecombined uncertainties, but the 440 nm results werenot and warrant further investigation.

    The measurements demonstrated that SIRCUS ir-radiance levels were high enough to calibrate Sunphotometers. Current uncertainties in the exoatmo-spheric solar irradiance depend on the wavelength,but in atmospheric transmittance windows in the vis-

    Fig. 16. Spectrograph images as the incident wavelength ischanged and the central image moves across the array.

    8234 APPLIED OPTICS Vol. 45, No. 32 10 November 2006

  • ible spectral region, they are estimated to be approx-imately 0.5% to 1%. Calibration of primary standardSun photometers on SIRCUS with 0.1% uncertain-ties or less would enable us to differentiate betweenexoatmospheric solar irradiance spectra and couldlead to a reduction in the uncertainties in the exoat-mospheric solar irradiance spectrum. This has impli-cations for global climate change studies because theexoatmospheric solar irradiance is one of the primaryforcing functions driving the global climate.

    Additional applications include the developmentof wavelength standard reference materials with re-duced uncertainty71 and the characterization and cal-ibration of instruments with large entrance pupils,such as telescopes and remote-sensing sensors.72

    6. Summary

    We have described a laser-based calibration facility forirradiance- and radiance-measuring instruments. Inthis facility, high-power tunable lasers were intro-duced into integrating spheres by using optical fibers,producing uniform, quasi-Lambertian, highly radiantflux sources. Reference standard irradiance detectors,calibrated directly against national primary standardsfor spectral power responsivity, were used to deter-mine the irradiance at a reference plane. Instrumentswere calibrated directly in irradiance or radiance modewith uncertainties approaching or lower than thoseavailable for spectral power responsivity calibrationsin traditional lampmonochromator facilities. Theimplications for fundamental radiometric measure-ments, including radiance temperature, photometric,and synchrotron source measurements, were de-scribed. Finally, advanced applications to realize thefirst detector-based color scale, to correct stray light inspectrographs, and to measure solar irradiance by us-ing this facility were briefly outlined.

    Work continues on reducing the uncertainties asso-ciated with measurements on SIRCUS as well as thespectral coverage and laser powers available. In Table1 we calculated the uncertainty in the irradiance re-sponsivity at a single wavelength. In practice, in de-termining the uncertainty in measuring the irradianceof a source by using a filter radiometer as an example,the responsivity was integrated over a wavelengthrange. The irradiance responsivity was determinedfor a large number of wavelengths, typically 100 ormore, over the in-band range. Calculating the band-integrated responsivity, the random components in theuncertainty budget were reduced by the square root ofthe number of measurements, and only systematiccomponents in the uncertainty budget contributed tothe uncertainty in the measurement. We have ne-glected the reduction in the uncertainty from integrat-ing the responsivity over a finite number of elements.

    The spectral coverage of the SIRCUS facility forspectral responsivity calibrations is determined bythe high-reflectance range of the coating of the inte-grating sphere sources, the wavelength coverage ofthe standard reference and monitor detectors, andthe spectral coverage of the tunable laser systems.Spectralon and similar PTFE-based coatings have

    high reflectance from 250 to 2500 nm. The spectralcoverage of the UVVisNIR SIRCUS facility hasbeen extended into the UV and the short-wave infra-red (SWIR) regions with the integration of a quasi-continuous-wave, mode-locked OPOsum-frequencysystem. This system gave us nearly continuous tun-ability from 210 to 3.0 m.

    Research is being conducted on reference detec-tors to extend the radiant power responsivity scalefrom 350 down to 200 nm and from 1 out to 2.5 mand beyond. Reference UV reflectance-type trap de-tectors using nitride-passivated UVG-100 diodes73 aswell as PIN-UV100 diodes73 have been developed toextend the wavelength coverage from 350 down to200 nm. Recently, a UV trap detector was calibratedfor radiant power responsivity over the spectralrange from 210 to 400 nm with an expanded uncer-tainty k 2 of 0.05% or less. Finally, a variety ofirradiance-measuring working standard radiometershave been developed for the NIR range, includingsingle-element Ge, InGaAs, and extended InGaAs de-tectors.74,75 With their calibration against an ACR,the low uncertainty in the SIRCUS irradiance scalewill be extended into the IR spectral range.

    The authors thank the U.S. Air Force Metrology forfunding this work under contract 98-435. They alsoacknowledge the early and continued support of JohnGrangaard, USAF (ret.) and the significant contribu-tions to the work by B. Carol Johnson, Howard Yoon,Yuqin Zong, Thomas C. Larason, C. Cameron Miller,and Ping-Shine Shaw from the NIST Optical Tech-nology Division.

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