Fatigue Life is a Statistical Quantity

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    Fatigue Life is a Statistical

    Quantity

    Introduction to the Weibull

    distribution

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    Objective

    You need a design where 90% of the springs last (at least) to 400 000 cycles.

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    First Primitive Test:

    Average Lifetime

    Design A Design B

    726000

    615000

    508000

    808000

    755000

    849000

    384000

    667000

    515000

    483000

    631000

    529000

    730000

    651000

    446000343000

    960000

    730000

    730000

    973000

    258000

    635000Average

    Design B looks better..

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    Next test, a bit more sophisticated:

    We plot fraction of springs failed vs number of cycles. We use this to get estimates

    of reliability of Design A and Design B as a function of cyles

    Example: If first failure in design A is at 200 000 cycles, reliability above 200 000

    cycles is reduced from 100% to 90%

    0

    10

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    100

    0 100000 200000 300000 400000 500000 600000 700000 800000 900000

    Survival Probability vs Cycles Design A

    Survival Probability vs Cycles Design A

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    We now fit a smooth curve (2ndorder power) to the data and to find F (400000)

    y = -7.3352E-11x2- 1.0216E-04x + 1.4026E+020

    10

    20

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    0 100000 200000 300000 400000 500000 600000 700000 800000 900000

    Chart Title

    Survival Probability vs Cycles Design A

    Survival Probability vs Cycles Design A

    Poly. (Survival Probability vs Cycles Design A)

    Y = -6.0918E-11 N2 -1.1619E-4N +144.3

    This fit predicts that

    the number of

    permissible cycles, for

    90% reliability, is

    386637, for design A.

    For 400000, our goal,

    the probability is88.07% for Design A

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    We repeat the same for Design B

    0

    10

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    0 200000 400000 600000 800000 1000000 1200000

    Survival Plot Design B

    Survival Plot Design B

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    y = -5.5949E-12x2- 1.1626E-04x + 1.2137E+02

    0

    10

    20

    30

    40

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    0 200000 400000 600000 800000 1000000 1200000

    Survival Plot Design B

    Survival Plot Design B

    Poly. (Survival Plot Design B)

    This plot predicts

    that the reliability of

    Design B at 400000

    cycles is74.866 %

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    The Weibull distribution was found by Weibull strictly by trial and error.

    He tried to model the distribution of failure strength of steels and derive

    probabilities for a high reliability (such as 99.9 %) from a limited set of testdata.

    After settled on this distribution:

    X is the variable (here the number of cycles to failure) and and are the

    Weibull parameters (is the shape parameter also known to material

    scientists as the Weibull modulus and is the scale or length parameter.

    Note that has a physical meaning. If a tensile specimen is twice as long, the

    probability for a flaw terminating its fatigue life is twice as high.

    Size matters.

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    There is nothing god given about the Weibull distribution. There are other

    reliability distributions - all invented before Weibull.

    But it does fit, experimentally, a very wide variety of phenomena.

    Weibull wrote a famous paper demonstrating it fit the size distribution of beans,

    the height distribution of the population on an island (I forgot which one) and so

    on, i.e. Biological phenomena as well as steels, with a total of 10 examples

    The paper is a classic - I will put it on the website.

    The reason is that depending on how the modulus is picked it fits both infant

    mortality and wear out phenomena.

    And fatigue failure is a kind of wear out phenomena.

    MOST IMPORTANTLY IT HAS BECOME A DE FACTO STANDARD FOR ENGINEERS.

    TO PREVAIL IN COURT, YOU BETTER SHOW YOU USED ITPROPERLY !

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    From Wiki

    The Weibull distribution is used

    In survival analysis[6]

    In reliability engineering and failure analysis

    In industrial engineering to represent manufacturing and delivery times

    In extreme value theory

    In weather forecasting (To describe wind speed distributions, as the natural distribution

    often matches the Weibull shape[7] Fitted cumulative Weibull distribution to maximum

    one-day rainfalls)

    In communications systems engineering (In radar systems to model the dispersion of

    the received signals level produced by some types of clutters. To model fading channels in

    wireless communications, as the Weibull fading model seems to exhibit good fit to

    experimental fading channel measurements)

    In General insurance to model the size of Reinsurance claims, and the cumulativedevelopment of Asbestosis losses

    In forecasting technological change (also known as the Sharif-Islam model)[citation

    needed]

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    In hydrology the Weibull

    distribution is applied to

    extreme events such as

    annual maximum one-

    day rainfalls and riverdischarges.

    In describing the size of

    particles generated by

    grinding, milling and

    crushing operations, the

    2-Parameter Weibull

    distribution is used, and

    in these applications it is

    sometimes known as the

    Rosin-Rammler

    distribution. (In this

    context it predicts fewer

    fine particles than the

    Log-normal distribution

    and it is generally most

    accurate for narrow

    particle sizedistributions).[

    Stolen From Wiki

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    Massaging the data point

    The data are plotted in increasing sequence (ranking low to high)

    The equivalent of our failure percentage becomes approximately

    This will do for most engineering problems. One can do this

    better by looking up the F distribution.

    There is a nifty website; teach yourself statistics which might

    come in handy when you are in industry

    (Modern industry runs on statistics)

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    Once you have done the ranking, it is just plotting :

    And, from the double ln plot to extract the values for K and

    So here is the plot :

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    Spring A Spring B

    beta = 4.39 2.604167

    alpha= 686938 714973

    Reliabiliy 0.911098 0.802222

    From which you get the following results:

    This does not look all that earth shattering different from our

    primitive estimate which yielded

    0.8807 0. 74866

    Which shows you that it is a good idea to make a primitive estimate

    first before setting out to do a state of the art Weibull with an F

    distribution)

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    Now, we should put confidence limits on our answer

    But as this is not a statistics course, I will leave it at this.

    But before you use a statistics package to analyze your data it is a good idea to

    make the primitive plot we started out and decide what other curves might

    reasonably be drawn to the data.

    This will give you a rough idea as to the confidence limits you can put on the

    data.

    Moving on to the three parameter Weibull Distribution

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    The three parameter Weibull distribution

    The three parameter Weibull distribution uses an additional parameter

    to shift the distribution sideways along the horizontal axis (number ofcycles to failure, time to failure .)

    Physical meaning in brittle fracture is generally density of flaws per

    unit length.

    Fiber Optics

    For example, if a Corning glass fiber has one defect per 10, and you

    test 10 specimens, each one inch long, then 9 will have high strength

    and only one low strength. The average fracture strength will be

    high.

    On the other hand, if you test 10 meter long (~ 40 inches) long

    section, the chances are that you 98% of the time will have a

    specimen with a flaw. The average fracture strength will be low.

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    Electronics:

    The classic example is the break down strength of DRAM capacitors

    (DRAM cells). The break down depends on both the intrinsic breakdown

    strength of the oxide and the defects (known as weak spots in theoxide*)

    If you have two oxides A and B, where flawless A has a break down voltage

    of 8 MV/cm and flawless B 7 MV/cm, then A is the better oxide.

    On the other hand, if A has 1 defect per 20 square m ( square micron) andB has one defect per 1 cm2 and the presence of a defect lowers the break

    down voltage by 20% AND you measure the break down strength on test

    capacitors made 10x10 micron, (because the research lab does not have

    state of the art immersion steppers), than your conclusion will be opposite !

    Cause you 10x10 test capacitors made in A will have, on average, 5defects, and therefore now return a breakdown voltage of about 6.4 MV/cm.

    Whereas the test capacitors made with the B oxide, will on average, have

    near zero defects, you will measure an average breakdown of 7 MV/cm

    THE RESEARCH LAB WILL RECOMMEND TO USE OXIDE A

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    Electronics continued:

    But the production capacitors are 0.5 x 0.5 micron.. An area 40 times

    smaller than your research lab test specimens !!!

    On average, they will not contain a defect, if made either in A or B.

    Hence the production people will report that capacitors made with the A

    oxide have a higher breakdown voltage, around 8 MV/cm and those

    with B will have a breakdown field, on average, of 7 MV/cvm

    THE PRODUCTION PEOPLE WILL RECOMMEND OXIDE A

    Conflict resolution:

    In general, you have no idea about the length scale of the defect

    population. Perhaps the difference between the research lab and the

    production line is that the production line uses Plasma Processing that

    uses higher electric fields than the research lab to etch the

    metallization. A long metal line, acting as an antenna, can partly blow

    out a gate oxide i.e. damage it, by stressing it too much.

    So, a priory it is not clear what is going on

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    Approach A for the research lab

    You plot the Weibull distribution of the breakdown voltage of your

    10x10 with a two parameter Weibull. If the distribution is curved,chances are you have a length scale parameter .

    Approach B for the research lab

    You make test capacitors of different size. From 1x1 cm down to

    2x2 which is the best your equipment can do with enoughgeometric precision to know the area within +/- 10%.

    You then investigate the dependence of the 2 parameter Weibull

    on the capacitor size.

    If it does depend, you have a length scale problem and you canextract the length scale on which the defect occurs.

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    The three parameter Weibull, accumulated failure function

    ))exp((1)(

    t

    tF

    Failure probability density function

    There are various methods of determining . The most simple one is to

    plot the data first as a two parameter Weibull (i.e ) . If that one is

    curved, then one adds/subtracts values of until the line is reasonably

    straight.

    Of course, one can also do this with linear regression. To see how,

    visit

    http://www.weibull.com/LifeDataWeb/estimation_of_the_weibull_param

    eter.htm

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    Weibull.com is a wonderfully informative website which will teach you

    everything you ever wanted to know about the Weibull distribution. Here

    is (stolen from the Website) an example on how to adjust gamma

    The curved original

    data a very familiar

    to glass fiber guys.

    And to capacitor

    testing guys mathis math.

    And to solar cell

    guys, that test

    conversion

    efficiency vs cellsize

    And so on. Math

    is math

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    As a good experimenter (good experimenters are those who a paranoid) you

    now investigate design A and B for hidden curvature.

    Is there a hidden length effect ???

    y = 0.0092x2+ 0.2435x + 13.441

    y = -0.0193x2+ 0.3536x + 13.496

    12.2

    12.4

    12.6

    12.8

    13

    13.2

    13.4

    13.6

    13.8

    14

    -4 -3 -2 -1 0 1 2

    To do so, you make a usual two

    parameter Weibull plot, but instead

    of fitting a straight line, you fit apower series.

    See left. The quadratic term gives

    you the curvature.

    The curvature is very small, and ofopposite sign for A and B. So it

    seems a wash, given the scatter of

    the data.

    And so we can conclude (without

    Doing a Sigma Analysis) that there

    is no length scale or threshold effect

    in the spring test data.

    QED