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8/13/2019 FCP16N60
1/10
2008Fairchild Semiconductor Corporation 1 www.fairchildsemi.com
FCP16N60 / FCPF16N60 Rev. B1
FCP16N60/FCP
F16N60
600V
N-ChannelM
OSFET
FCP16N60 / FCPF16N60600V N-Channel MOSFET
Features
650V @TJ= 150C
Typ. Rds(on) = 0.22
Ultra low gate charge (typ. Qg=55nC)
Low effective output capacitance (typ. Coss.eff=110pF)
100% avalanche tested
Description
SuperFETTM is, Fairchilds proprietary, new generation of high
voltage MOSFET family that is utilizing an advanced charge
balance mechanism for outstanding low on-resistance and
lower gate charge performance.
This advanced technology has been tailored to minimize
conduction loss, provide superior switching performance, and
withstand extreme dv/dt rate and higher avalanche energy.
Consequently, SuperFET is very suitable for various AC/DC
power conversion in switching mode operation for system
miniaturization and higher efficiency.
Absolute Maximum Ratings
Thermal Characteristics
TO-220FCP Series
G SDTO-220FFCPF Series
G SD
D
G
S
Symbol Parameter FCP16N60 FCPF16N60 Unit
VDSS Drain-Source Voltage 600 V
ID Drain Current - Continuous (TC= 25C)
- Continuous (TC= 100C)
16
10.1
16*
10.1*
A
A
IDM Drain Current - Pulsed (Note 1) 48 48* A
VGSS Gate-Source voltage 30 VEAS Single Pulsed Avalanche Energy (Note 2) 450 mJ
IAR Avalanche Current (Note 1) 16 A
EAR Repetitive Avalanche Energy (Note 1) 20.8 mJ
dv/dt Peak Diode Recovery dv/dt (Note 3) 4.5 V/ns
PD Power Dissipation (TC= 25C)
- Derate above 25C
167
1.33
37.9
0.3
W
W/C
TJ, TSTG Operating and Storage Temperature Range -55 to +150 C
TL Maximum Lead Temperature for Soldering Purpose,1/8 from Case for 5 Seconds
300 C
Symbol Parameter FCP16N60 FCPF16N60 Unit
RJC Thermal Resistance, Junction-to-Case 0.75 3.3 C/W
RJA Thermal Resistance, Junction-to-Ambient 62.5 62.5 C/W
*Drain current limited by maximum junction temperature
December2008
SuperFETTM
RoHS Compliant
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2 www.fairchildsemi.com
FCP16N60 / FCPF16N60 Rev. B1
FCP16N60/FCP
F16N60
600V
N-ChannelM
OSFET
Package Marking and Ordering Information
Electrical Characteristics TC= 25C unless otherwise noted
NOTES:
1. Repetitive Rating: Pulse width limited by maximum junction temperature
2. IAS= 8A, VDD= 50V, RG= 25, Starting TJ= 25C
3. ISD16A, di/dt 200A/s, VDDBVDSS, Starting TJ= 25C
4. Pulse Test: Pulse width 300s, Duty Cycle 2%
5. Essentially Independent of Operating Temperature Typical Characteristics
Device Marking Device Package Reel Size Tape Width Quantity
FCP16N60 FCP16N60 TO-220 - - 50
FCPF16N60 FCPF16N60 TO-220F - - 50
Symbol Parameter Conditions Min Typ Max Units
Off Characteristics
BVDSS Drain-Source Breakdown Voltage VGS= 0V, ID= 250A, TJ= 25C 600 -- -- V
VGS= 0V, ID= 250A, TJ= 150C -- 650 -- V
BVDSS/ TJ
Breakdown Voltage Temperature
CoefficientID= 250A, Referenced to 25C -- 0.6 -- V/C
BVDSS Drain-Source Avalanche Breakdown
Voltage
VGS= 0V, ID= 16A -- 700 -- V
IDSS Zero Gate Voltage Drain Current VDS= 600V, VGS= 0V
VDS= 480V, TC= 125C
--
--
--
--
1
10
A
A
IGSSF Gate-Body Leakage Current, Forward VGS= 30V, VDS= 0V -- -- 100 nA
IGSSR Gate-Body Leakage Current, Reverse VGS= -30V, VDS= 0V -- -- -100 nAOn Characteristi cs
VGS(th) Gate Threshold Voltage VDS= VGS, ID= 250A 3.0 -- 5.0 V
RDS(on) Static Drain-Source
On-ResistanceVGS= 10V, ID= 8A -- 0.22 0.26
gFS Forward Transconductance VDS= 40V, ID= 8A (Note 4) -- 11.5 -- S
Dynamic Characteristic s
Ciss Input Capacitance VDS= 25V, VGS= 0V,
f = 1.0MHz
-- 1730 2250 pF
Coss Output Capacitance -- 960 1150 pF
Crss Reverse Transfer Capacitance -- 85 -- pF
Coss Output Capacitance VDS= 480V, VGS= 0V, f = 1.0MHz -- 45 60 pF
Coss
eff. Effective Output Capacitance VDS
= 0V to 400V, VGS
= 0V -- 110 -- pF
Switching Characteristics
td(on) Turn-On Delay Time VDD= 300V, ID= 16A
RG= 25
(Note 4, 5)
-- 42 85 ns
tr Turn-On Rise Time -- 130 270 ns
td(off) Turn-Off Delay Time -- 165 340 ns
tf Turn-Off Fall Time -- 90 190 ns
Qg Total Gate Charge VDS= 480V, ID= 16A
VGS= 10V
(Note 4, 5)
-- 55 70 nC
Qgs Gate-Source Charge -- 10.5 13 nC
Qgd Gate-Drain Charge -- 28 -- nC
Drain-Source Diode Characteristics and Maximum Ratings
IS Maximum Continuous Drain-Source Diode Forward Current -- -- 16 A
ISM Maximum Pulsed Drain-Source Diode Forward Current -- -- 48 AVSD Drain-Source Diode Forward Voltage VGS= 0V, IS=16A -- -- 1.4 V
trr Reverse Recovery Time VGS= 0V, IS= 16A
dIF/dt =100A/s (Note 4)
-- 435 -- ns
Qrr Reverse Recovery Charge -- 7.0 -- C
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3 www.fairchildsemi.com
FCP16N60 / FCPF16N60 Rev. B1
FCP16N60/FCP
F16N60
600V
N-ChannelM
OSFET
Typical Performance Characteristics
Figu re 1. On-Region Character ist ics Figure 2. Transfer Character ist ics
Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage
Drain Current and Gate Voltage Variation vs. Source Currentand Temperatue
Figure 5. Capacitance Characteri sti cs Figure 6. Gate Charge Character istics
10-1
100
101
100
101
102
VGS
Top : 15.0 V 10.0 V
8.0 V
7.0 V
6.5 V
6.0 V
Bottom : 5.5 V
*Notes :
1. 250s Pulse Test
2. TC= 25
C
ID,DrainCurrent[A]
VDS
, Drain-Source Voltage [V]
2 4 6 8 10
100
101
102
*Note:
1. VDS
= 40V
2. 250s Pulse Test
-55oC
150oC
25oC
ID,DrainCurrent[A]
VGS
, Gate-Source Voltage [V]
0 5 10 15 20 25 30 35 40 45 500.0
0.1
0.2
0.3
0.4
0.5
0.6
VGS
= 20V
VGS
= 10V
*Note : TJ= 25oC
RDS(ON)[],
Drain-SourceOn-Resistance
ID, Drain Current [A]
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6
100
101
102
25oC150
oC
*Notes :
1. VGS
= 0V
2. 250 s Pulse Test
IDR
,ReverseDrainCurrent[A]
VSD
, Source-Drain Voltage [V]
10-1
100
101
0
1000
2000
3000
4000
5000
6000
7000C
iss= C
gs+ C
gd(C
ds= shorted)
Coss
= Cds
+ Cgd
Crss
= Cgd
*Notes :
1. VGS
= 0 V
2. f = 1 MHz
Crss
Coss
Ciss
Capacitance[pF]
VDS
, Drain-Source Voltage [V]
0 10 20 30 40 50 600
2
4
6
8
10
12
VDS
= 250V
VDS
= 100V
VDS
= 480V
*Note : ID= 16A
VGS,Gate-SourceVoltage[V]
QG, Total Gate Charge [nC]
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FCP16N60 / FCPF16N60 Rev. B1
FCP16N60/FCP
F16N60
600V
N-ChannelM
OSFET
Typical Performance Characteristics (Continued)
Figure 7. Breakdown Vol tage Variati on Figure 8. On-Resistance Var iat ionvs. Temperature vs. Temperature
Figure 9-1. Maximum Safe Operat ing Area Figure 9-2. Maximum Safe Operat ing Areafor FCP16N60 for FCPF16N60
Figure 10. Maximum Drain Current vs. Case Temperature
-100 -50 0 50 100 150 2000.8
0.9
1.0
1.1
1.2
*Notes :
1. VGS
= 0 V
2. ID= 250 A
BVDSS,(Normalized)
Drain-SourceBreakdownVoltage
TJ, Junction Temperature [
oC]
-100 -50 0 50 100 150 2000.0
0.5
1.0
1.5
2.0
2.5
3.0
*Notes :
1. VGS
= 10 V
2. ID= 8 A
RDS(ON),(Normalized)
Drain-SourceOn-Resistance
TJ, Junction Temperature [
oC]
100
101
102
103
10-2
10-1
100
101
102
10 us
Operation in This Area
is Limited by RDS(on)
DC
1 ms
100 us
*Notes :
1. TC= 25
oC
2. TJ= 150
o
C 3. Single Pulse
ID,DrainCurrent[A]
VDS
, Drain-Source Voltage [V]
100
101
102
103
10-2
10-1
100
101
102
100 ms
10 ms
10 us
Operation in This Area
is Limited by RDS(on)
DC
1 ms
100 us
*Notes :
1. TC= 25
oC
2. TJ= 150
o
C 3. Single Pulse
ID,DrainCurrent[A]
VDS
, Drain-Source Voltage [V]
25 50 75 100 125 1500
5
10
15
20
ID,DrainCurren
t[A]
TC, Case Temperature [C]
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5 www.fairchildsemi.com
FCP16N60 / FCPF16N60 Rev. B1
FCP16N60/FCP
F16N60
600V
N-ChannelM
OSFET
Figure 11-1. Transient Thermal Response Curve (FCP16N60)
Figure 11-2. Transient Thermal Response Curve (FCPF16N60)
10-5
10-4
10-3
10-2
10-1
100
101
10-2
10-1
100
*Notes :
1. ZJC
( t) = 0.75oC / W M a x .
2 . Duty Factor , D=t1/t
2
3. TJM
- TC= P
DM* Z
JC(t)
single pulse
D=0.5
0.02
0. 2
0.05
0. 1
0.01
ZJC
(t),ThermalRespons
e
t1, Square W ave Pu lse Dura t ion [ sec]
t1
PDM
t2
10 -5 10 -4 10 -3 10 -2 10 -1 10 0 10 1
10-2
10-1
100
101
*Notes :
1. ZJC
( t) = 3.3oC / W M a x .
2 . Duty Factor , D=t1/t
2
3. TJM
- TC= P
DM* Z
JC(t)
single pulse
D=0.5
0.02
0. 2
0.05
0. 1
0.01
ZJC(t),ThermalResponse
t1, Square W ave Pu lse Dura t ion [ sec]
t1
PDM
t2
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FCP16N60 / FCPF16N60 Rev. B1
FCP16N60/FCP
F16N60
600V
N-ChannelM
OSFET
Gate Charge Test Circuit & Waveform
Resistive Switching Test Circuit & Waveforms
Unclamped Inductive Switching Test Circuit & Waveforms
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7 www.fairchildsemi.com
FCP16N60 / FCPF16N60 Rev. B1
FCP16N60/FCP
F16N60
600V
N-ChannelM
OSFET
Peak Diode Recovery d v/dt Test Circuit & Waveforms
8/13/2019 FCP16N60
8/10
8 www.fairchildsemi.com
FCP16N60 / FCPF16N60 Rev. B1
FCP16N60/FCP
F16N60
600V
N-ChannelM
OSFET
Mechanical Dimensions
4.50 0.209.90 0.20
1.52 0.10
0.80 0.102.40 0.20
10.00 0.20
1.27 0.10
3.60 0.10
(8.70)
2.8
00.1
0
15.9
00.20
10
.080.3
0
18.9
5M
AX.
(1.7
0)
(3.7
0)
(3.0
0)
(1.4
6)
(1.0
0)
(45)
9.2
00.20
13.0
80.2
0
1.3
00.1
0
1.30+0.100.05
0.50+0.100.05
2.54TYP
[2.54 0.20]
2.54TYP
[2.54 0.20]
TO-220
Dimensions in Millimeters
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FCP16N60 / FCPF16N60 Rev. B1
FCP16N60/FCP
F16N60
600V
N-ChannelM
OSFET
Mechanical Dimensions (Continued)
(7.00) (0.70)
MAX1.47
(30)
#1
3.3
00.1
0
15.8
00.2
0
15.8
70.2
06.6
80.2
0
9.7
50.3
0
4.7
00.2
0
10.16 0.20
(1.00x45)
2.54 0.20
0.80 0.10
9.40 0.20
2.76 0.200.35 0.10
3.18 0.10
2.54TYP
[2.54 0.20]
2.54TYP
[2.54 0.20]
0.50+0.100.05
TO-220F
Dimensions in Millimeters
8/13/2019 FCP16N60
10/10
Rev. I37
TRADEMARKS
The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not
intended to be an exhaustive list of all such trademarks.
* EZSWITCH and FlashWriterare trademarks of System General Corporation, used under license by Fairchild Semiconductor.
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE
RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY
PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILDS WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY
THEREIN, WHICH COVERS THESE PRODUCTS.
LIFE SUPPORT POLICY
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THEEXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems which, (a) areintended for surgical implant into the body or (b) support or sustain life,and (c) whose failure to perform when properly used in accordance withinstructions for use provided in the labeling, can be reasonablyexpected to result in a significant injury of the user.
2. A critical component in any component of a life support, device, orsystem whose failure to perform can be reasonably expected to causethe failure of the life support device or system, or to affect its safety oreffectiveness.
PRODUCT STATUS DEFINITIONSDefinition of Terms
Build it NowCorePLUSCorePOWERCROSSVOLTCTLCurrent Transfer LogicEcoSPARK
EfficentMaxEZSWITCH *
Fairchild
Fairchild Semiconductor
FACT Quiet SeriesFACT
FAST
FastvCore
FlashWriter *FPSF-PFS
FRFETGlobal Power ResourceSM
Green FPSGreen FPS e-SeriesGTOIntelliMAXISOPLANARMegaBuckMICROCOUPLERMicroFETMicroPakMillerDriveMotionMaxMotion-SPMOPTOLOGIC
OPTOPLANAR
PDP SPMPower-SPMPowerTrench
PowerXS
Programmable Active DroopQFET
QSQuiet SeriesRapidConfigure
Saving our world, 1mW /W /kW at a timeSmartMaxSMART STARTSPM
STEALTHSuperFETSuperSOT-3SuperSOT-6SuperSOT-8SupreMOSSyncFET
The Power Franchise
TinyBoostTinyBuckTinyLogic
TINYOPTOTinyPowerTinyPWMTinyWireSerDes
UHC
Ultra FRFETUniFETVCXVisualMaxXS
tm
tm
tm
Datasheet Identification Product Status Definition
Advance Information Formative / In DesignDatasheet contains the design specifications for product development. Specificationsmay change in any manner without notice.
Preliminary First ProductionDatasheet contains preliminary data; supplementary data will be published at a laterdate. Fairchild Semiconductor reserves the right to make changes at any t ime withoutnotice to improve design.
No Identi fication Needed Ful l ProductionDatasheet contains final specifications. Fairchild Semiconductor reserves the right tomake changes at any time without notice to improve the design.
Obsolete Not In ProductionDatasheet contains specifications on a product that is discontinued by FairchildSemiconductor. The datasheet is for reference information only.
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Fairchild Semiconductor Corporations Anti-Counterfeiting Policy. Farichilds Anti-Counterfeiting Policy is also stated on our external website,www.fairchildsemi.com, under Sales Support.
Counterfeiting of semiconductor parts is a growing problem in the industry. All manufactures of semiconductor products are experiencing counterfeiting of theirparts. Customers who inadvertently purchase counterfeit parts experience many problems such as loss of brand reputation, substandard performance, failedapplication, and increased cost of production and manufacturing delays. Fairchild is taking strong measures to protect ourselves and our customers from theproliferation of counterfeit parts. Farichild strongly encourages customers to purchase Farichild parts either directly from Fairchild or from Authorized FairchildDistributors who are listed by country on our web page cited above. Products customers buy either from fairchild directly or from Authorized FairchildDistributors are genuine parts, have full traceability, meet Fairchilds quality standards for handing and storage and provide access to Farichilds full range ofup-to-date technical and product information. Fairchild and our Authorized Distributors will stand behind all warranties and will appropriately address andwarranty issues that may arise. Fairchild will not provide any warranty coverage or other assistance for parts bought from Unauthorized Sources. Farichild iscommitted to combat this global problem and encourage our customers to do their part in stopping this practice by buying direct or from authorized distributors.
10 www.fairchildsemi.com
FCP16N60 / FCPF16N60 Rev. B1
FCP16N60/FCPF16N60
600V
N-ChannelMOSFET