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Focused in Krakowthe Wieliczka Salt Mine and the banquet at Folwark Zalesie resort on the last day were a beautiful conclusion of the Con-gress.
Scientific Focus
The hot topics at FOM 2009 high resolu-tion microscopy, microscopy probes and high cell number analysis were repre-sented first by the invited speakers of the opening plenary lecture. First presenta-tion “Spectrally Assigned Localization Microscopy (SALM)” was given by Chris-toph Cremer from the Kirchhoff-Institute for Physics, University Heidelberg, Ger-many. To 4Pi- and STED Imaging, com-plementary SALM technology is based on labeling of point like objects – e.g. single molecules – with different spectral colors, selective registration and high precision localization monitoring by far field fluo-rescent microscopy. In the second pres-entation Konstantin Lukyanov from the Institute of Bioorganic Chemistry, Rus-sian Academy of Sciences Moscow, re-ported on promising novices of fluores-cent proteins and unexpected abilities of the well-known. Characteristics of novel far-red fluorescent proteins as well as the new feature of GFP to act as the light induced electron donors in photochemi-cal reactions were introduced. The first session was closed by the presentation of Zbigniew Darzynkiewicz from New York Medical College, Valhalla, USA. He pointed out that microscope-based Laser Scanning Cytometry (LSC) provides the means to interrogate individual cells with rates and sensitivity comparable to flow cytometry (FC), but offers a plethora of analytical capabilities that FC does not have, e.g. recording of cell position, study
of time-resolved processes, and analysis of translocation of cell signaling mole-cules.
The closing lecture dealing with inter-action of light with living cells was given by Jurek Dobrucki. His presentation con-cluded that a living cell is an assembly of scattering objects. Scattering leads to photodamage even in the vicinity of the directly illuminated cells. And this has to be seriously considered within FRAP, FLIM, and FCS imaging.
Welcome to Shanghai
The venue of the next years’ conference will be the Shanghai Everbright Conven-tion and Exhibition Center, 28-31 March, 2010. Heads of the organizing committee will be Fred Brakenhoff together with Qiushi Ren from the Shanghai Jiao Tong University. “Zai jian“ and see you next year in China.
Contact:Martin FriedrichGIT VERLAG, A Wiley [email protected]
Fred BrakenhoffJurek [email protected]
Following up on their tradition to meet in the week before Easter, the international advanced light microscopy community came together again for their annual conference on optical high resolution im-aging called “Focus on Microscopy”, 5-8 April.
This years’ conference was hosted by the Jagiellonian University of Krakow, a city wrapped in legend. For centuries it was the capital of Poland, the seat of kings, drawing great scholars and artists from the whole world. It is their talents and imagination we must thank for the city’s rich legacy of unique historical rel-ics, which reflect the most important trends in European culture. The name of Krakow is highly connected to one of Eu-ropean biggest renaissance Royal Castle at Wawel, pope Johannes Paul II (1978-2005), and Nicolaus Copernicus representing the scientific importance of the city.
Fred Brakenhoff and Jurek Dobrucki – heads of the organizing committee – welcomed 500 delegates to an extensive scientific program and diverse company demonstrations given by Leica Instru-ments – sponsor of the welcome recep-tion – and Olympus.
More than 30 companies and distribu-tors presented the recent novelties in technology development. Particularly re-markable was the increased number of laser manufactures this year. As a conse-quence the conference exhibition, the ca-tering and the poster session were ar-ranged in one place. Thus, the number of valuable contacts kept most exhibitors satisfied. As the main sponsor, Carl Zeiss MicroImaging invited the delegates to a special lecture and dinner party on the second conference day. The excursion to
Royal Castle at Wawel
The Organizing Committee FOM 2009 and 2010
E v E n t R E p o Rt
G.I.T. Imaging & Microscopy 2/2009 • 15
