28
FT-UNSHADES Microelectronic Presentation Day February, 4th, 2004 J. Tombs & M.A. Aguirre [email protected], [email protected] AICIA-GTE of The University of Sevilla (SPAIN)

FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

  • Upload
    others

  • View
    6

  • Download
    0

Embed Size (px)

Citation preview

Page 1: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

FT-UNSHADES

Microelectronic Presentation DayFebruary, 4th, 2004

J. Tombs & M.A. [email protected], [email protected]

AICIA-GTE of The University of Sevilla (SPAIN)

Page 2: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

FT-UNSHADES creditsUNiversity of Sevilla HArdware DEbuggingSystem.

Involved since 1996 in projects related to FPGA technologyWide experience in VLSI and FPGA designSoftware developers and hardware designersUNSHADES-1 and UNSHADES-2

http://www.gte.us.es/~aguirre/Web_unshades/index

Page 3: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

FT-UNSHADES. The Problem

Provide to VLSI Designers a feedback of the reliability of a module against SEUs during design phase

Provide a toolbox for deep analysis when a weak area is found.

SEU immunity tests performed in a reasonable period of time

Page 4: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

Current Approaches

HARDWARE approachesRadiation Chamber. (Expensive, Poor analysis, Chip fab is required)FPGA Prototype (till today): (Circuit overhead, SEU injection through external pins, poor analysis, many synthesis cycles and VHDL manipulation)

SOFTWARE approachesVHDL simulator (SLOW, Usually needs netlistchanges)

Page 5: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

Current approaches (I)

Run Time Test

Non Intrusive

Deep Analysis

Costs

Radiation Chamber

100%

100%

100%

100%

10% 10%

Page 6: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

Current approaches (II)

Run Time Test

Non Intrusive

Deep Analysis

Costs

FPGAEmulators

100%

40%

30%

70%

10%

Page 7: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

Current approaches (III)

Run Time Test

Non Intrusive

Deep Analysis

Costs

HDLSimulators

100%

0%

5%

90%

10%

Page 8: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

FT-UNSHADESRun Time Test

Non Intrusive

Deep Analysis

Costs

FT-UNSHADESSystem

80%

100%

100%

10%

Page 9: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

FT-UNSHADES. What’s new?

Use Xilinx FPGA technology for circuit emulationUse configuration ports with partialreadings and writings of configurationframes, speeds up SEU injectionFully automatic test, even forsubmodules

Page 10: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

FT-UNSHADES. Know how

The key of the problem is to modify a FF state during run-time (SEU) using a non intrusive method

without extra circuitry= zero overhead

UNIVERSITY of Sevilla Proprietary Patents:

•“Method for the functional test of large digital circuits using hardware emulators”. W ES-02/00571

•“Procedure for the induction of register values in an emulated circuit using integrated hardware emulation” Patent Pending P200203051

Page 11: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

FT-UNSHADES System

FT-UNSHADES Software

FT-UNSHADES Hardware

S-FPGA

C-FPGA

Sele

ctM

ap

IO L

ines

PC L

ink

RAMMemory

Laptop computer

Expansion Bus

External System

Deb

ug L

ines

Two FPGA’s•System FPGA (S-FPGA)•Control FPGA (C-FPGA)

Communication:•1.5MB/s (USB / EPP)•Multi-Board

Page 12: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

FT-UNSHADES System

FT-UNSHADES Software

FT-UNSHADES Hardware

S-FPGA

C-FPGA

Sele

ctM

ap

IO L

ines

PC L

ink

RAMMemory

Laptop computer

Expansion Bus

External System

Deb

ug L

ines

Links:•Configuration•Clock Generation•Special debug Lines•General Purpose I/O

Software:

•Board handling

•Test Definition

•Analysis

Page 13: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

FT-UNSHADES. Handling vectors

Test Bench

RTL netlist

A B(0) B(1) B(2) C D

0

0 0 0 0

0 01

1

11

1

0 0 0 0

1

1

10

1

11 1

000110

01110101

01011010

10010100

User testbed is used to create test vectors

Page 14: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

FT-UNSHADES. Handling vectors

Test vector shell

01110101

01011010

10010100

Vectors are stored in on-board memories

Page 15: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

FT-UNSHADES. System FPGA

Time Counter

Clk ControllerMem

Control

RTL netlist

RTL netlist

Cmp

01110101

01011010

10010100

Two copies of the design are instanced within a test shell

Page 16: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

FT-UNSHADES. System FPGA

RTL netlist

RTL netlist

Time Counter

Cmp

Clk ControllerMem

Control

01110101

01011010

10010100

Link

Clock ManagerMemControl

Design is frozen and SEU insertion cycle programmed

Page 17: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

FT-UNSHADES. System FPGA

RTL netlist

RTL netlist

Time Counter

Cmp

Clk ControllerMem

Control

01110101

01011010

10010100

Clock Manager

Time Counter

MemControl

Vectors are applied at system speed until SEU cycle is reached

Page 18: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

FT-UNSHADES. System FPGA

RTL netlist

RTL netlist

Time Counter

Cmp

Clk ControllerMem

Control

01110101

01011010

10010100

Link

Clock Manager

Time Counter

MemControl

Selected flip-flop has SEU inserted

Page 19: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

FT-UNSHADES. System FPGA

RTL netlist

RTL netlist

Time Counter

Cmp

Clk ControllerMem

Control

01110101

01011010

10010100

Clock Manager

Time Counter

MemControl

Design advances again at system speed

Page 20: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

FT-UNSHADES. System FPGA

RTL netlist

RTL netlist

Time Counter

Cmp

Clk ControllerMem

Control

01110101

01011010

10010100

Cmp

Link

Clock Manager

Time Counter

MemControl

If SEU produces and error output and cycle error are recorded

Page 21: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

FT-UNSHADES. Software

Software

Board Services:•Configure SFPGA•Program CLOCK rate•Handle Communications

Test Vectors Services:•Format test vectors•Transfer vectors to board

Fault testing:•Handle Time counter (WHEN)•Handle Flip-Flop Placement (WHERE)•Define Injection Strategies (HOW) Fault insertion analysis:

•Store faults•Classify faults (Damage, Latent,…)•Single Stepping Analysis

Page 22: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

FT-UNSHADES Software

C++ Based CodeConsole Mode

Wild CardsScript self-generationUser defined macro-commands

Adapted to Xilinx Design FlowFully automatic test flow

Page 23: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

Using FT-UNSHADES

1. RTL netlist of a module or circuit described in VHDL or Verilog

2. Use your Test Bench to build functional vectors file3. RUN Test vector handling services4. Synthesise netlist with the test shell using ISE5. Define fault injection strategy6. RUN FT-UNSHADES campaign and wait for your

fault dictionary

Page 24: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

Fault dictionary

Injection vector: 400.000Fault Place:/toptest/mutfaulty/registerfile/reg(5)

SEU Toggle: 1 0IO fault vector: 400.027IO mismatched: addr(3) <-Damage

This information is enough for a post campaign analysis. FT-UNSHADES can produce single

stepping analysis and provide the internal state information for a waveform viewer

Page 25: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

PCBFT-UNSHADES

Memories

FPGAs

PC LINKS

Page 26: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

Technical specifications

SFPGA: XC2V6000-FF1152 (6M gates)Maximum board clock speed 160MHzVector memory: 6 units of 2M words x 16bitsMemory clock speed: 100MHz (200Mhz units could be mounted)PC-Link: EPP 1.9 or USB 2.0

Page 27: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

Expected performance (medium)

Assume:Design speed: 50MHzMemory Speed: 100MHzLink Speed: ~1.5MB/sVectors: 2MbBytes per frame 7872/8=984

Testing time: 2M cycles / 50MHz=40msPC accessing time: 6 x 984 /1,5MHz=4ms

One fault in injected every 44ms~80.000 faults/hour

Optimistic: 25ms~144000 faults/hour

Size independant!!!

Pessimistic: 100ms~36000 faults/hour

Page 28: FT-UNSHADES - ESA Microelectronics Sectionmicroelectronics.esa.int/.../FT-UNSHADES_presentation_v2.pdf · 2004-02-05 · FT-UNSHADES Microelectronic Presentation Day February, 4th,

FT-UNSHADES. Conclusions

New design for reliability platformEasy to use. Full automatic design flow.Analysis toolboxReferences:

{aguirre,jon}@gte.esi.us.eshttp://www.gte.us.es/~aguirre/Web_unshades/index

FT-UNSHADES completion is scheduled for September 2004