GRE-65-04’s GRE-65-04’s JustificationJustification

HE YuntangHE YuntangChina Automotive Technology and Research CentreChina Automotive Technology and Research CentreUNOGUNOG ，， GenevaGeneva ， ， 3131 MarchMarch 20112011

Informal document No. GRE-65-29(65th GRE, 28-31 March 2011, agenda item 14(d))

Point 1Point 1

Three new samples (lenses or samples Three new samples (lenses or samples of material) shall be exposedof material) shall be exposed to to radiation from a source having a radiation from a source having a spectral energy distribution similar to spectral energy distribution similar to that of a black body at a temperature that of a black body at a temperature between 5,500 K and 6,000 K. between 5,500 K and 6,000 K. daylight daylight spectral energy distribution described in spectral energy distribution described in CIE Publication No. 85:1989, Table 4.CIE Publication No. 85:1989, Table 4.

SAE J2527 Figure c2Daylight filter VS. Sunlight spectral power distribution

The spectral energy The spectral energy distribution of sun distribution of sun light described in light described in CIE CIE Publication No. Publication No. 85:1989, Table 4 is 85:1989, Table 4 is much more accurate much more accurate than that than that describeddescribed with Black body with Black body temperature. temperature.

Point 1Point 1 ：： reasonreason

Point 2Point 2

Reduce radiations Reduce radiations with wave lengths with wave lengths smaller than 295 smaller than 295 nm and greater nm and greater than 2,500 nm,than 2,500 nm, and the minimum and maximum levels of the relative spectral irradiance in the UV wavelength range are given in Table 1.

Spectral passband(λ=wavelength in

nm)

Minimum

%

CIE No. 85:1989, Table 4%

Maximum

%

λ<290 0.15

290≤λ≤320 2.6 5.4 7.9

320<λ≤360 28.2 38.2 39.8

360<λ≤400 54.2 56.4 67.5

Table 1 – Relative spectral irradiance of xenon-arc lamps with daylight filters

Point-2: reasonPoint-2: reason

Threshold UV WavelengthsThreshold UV Wavelengths

Bond Threshold Wavelength

C-N 393

C-Cl 353

C-C 346

S-H 345

N-H 336

Logan

For degradation of For degradation of polymer material, polymer material, UV UV range is severer than range is severer than visible and IR range. visible and IR range.

UV table from UV table from ‘CIE ‘CIE Publication No. Publication No. 85:1989, Table 4 85:1989, Table 4

Point-3Point-3

The samples shall be exposed toThe samples shall be exposed to

an energetic illumination of 1,200 W/man energetic illumination of 1,200 W/m22

±200 W/m±200 W/m22 an light source with irradiancean light source with irradiance

of 0.68of 0.68±0.02±0.02 W/mW/m22 at 340nm, at 340nm, for a period for a period such that such that the luminous energy that they the luminous energy that they receive is equal to 4,500 MJ/mreceive is equal to 4,500 MJ/m22±200 ±200 MJ/mMJ/m22 the radiation energy that they receive the radiation energy that they receive

is equal to 2,550is equal to 2,550±75±75 kJ/mkJ/m22..

Point-3: reasonPoint-3: reason

UV is more severe than visible and IR light, UV is more severe than visible and IR light, exposure of the sample under 50 W/mexposure of the sample under 50 W/m22 of of UV or IR light for 1000 hours will have UV or IR light for 1000 hours will have totally different result.totally different result.

It will be more accurate to set the It will be more accurate to set the irradiance of the light source base on UV irradiance of the light source base on UV version instead of total version instead of total irradiance/illumination irradiance/illumination

Point-4Point-4

In order to ensure a regular In order to ensure a regular exposure,exposure,

the samples shall revolve around the samples shall revolve around the source of radiation at a speed the source of radiation at a speed between 1 and 5 r/minbetween 1 and 5 r/min the irradiance at the irradiance at any position in the area used for specimen any position in the area used for specimen exposure shall be at least 80 % of the exposure shall be at least 80 % of the maximum irradiance.maximum irradiance.

Point-4: reasonPoint-4: reason

Rotating Drum Xenon Arc Tester Cross Section

Hardware based, Hardware based, limiting the use limiting the use of test of test equipment equipment

Performance Performance based based description is description is accepted by ISO accepted by ISO 48924892

Thank you!Thank you!