IMPROVE THE IMPACT OF TESTTHROUGH SUPERIOR BUSINESS AND TECHNICAL INSIGHT

MAY 22–23, 2017 — AUSTIN CONVENTION CENTER

TEST SYSTEMS

BUSINESS AND INDUSTRY TRENDS TRACKThis year at TLF, we are highlighting a track of sessions that address test best practices and market trends that affect many companies across industries. The Business and Industry Trends sessions are recommended for attendees from industries not featured in one of the vertical tracks and for those who want to create business impact with test. Look for their abstracts with an asterisk.

AEROSPACE AND DEFENSE TRACK—MONDAY, MAY 22; BALLROOM C

*Building Internal Alignment and Consensus for Change Across Departments (Business and Industry Trends)As the number of stakeholder departments and perspectives increases (CEB study lists an average of 6.8 stakeholders), engineers need to learn best practices on how to align and build consensus internally.

Paul Wagy, Test Engineering Senior Manager, Lockheed Martin M&FC, and Chad Ruwe, Business and Technology Assessment Team, NI

*Subtle but Fatal Differences Between Service and Repair Test and Manufacturing Test (Business and Industry Trends)Understand the Service and Repair and Manufacturing business models and how test needs to operate and be optimized differently for the two scenarios.

Kevin T. Fort, Director of Avionics and Electronics, Honeywell Aerospace, and Sugato Deb, Business and Technology Assessment Team, NI

Standardizing L3 Automated Test SoftwareLearn how L3 Communication Systems-West improved its standards, processes, skills, and role definitions and received a LabVIEW Center of Excellence Award.

Azita Jamaludin, Test Supervisor, L3 Technologies

From R&D to Production: Building a Rocket for Space TourismExplore the challenges and opportunities in maintaining excellence, safety, and quality during the transition from an R&D-focused company to one that builds robust reusable rockets for space tourism.

Jason Smith, Instrumentation and Controls Engineer, Blue Origin

TRANSPORTATION TRACK—MONDAY, MAY 22; ROOM 6A

The Challenges of Sensor Fusion HIL TestADAS systems incorporate many kinds of sensors for different functionalities. The fusion of test with all the sensors combined is considered a major challenge in model-based ADAS validation. In this session, discuss different simulation solutions for each ADAS sensor (camera, radar, and ultrasonic sensor). Also explore a sensor fusion test solution that features camera and radar sensor synchronization using driving scenario simulation software based on a PXI hardware and real-time software system.

Hua Geng, Americas Branch Manager, and Zhiyuan Hua, Technical Project Manager, HiRain

V2X: Opportunities for AllThe release of the Notice of Proposed Rule Making (NPRM) that will mandate V2X functionality in all light vehicles sold in the United States has resulted in a significant uptick of activity in all areas of the V2X landscape. At this session, review the current state of the technology rollout in the United States and the challenges and opportunities it presents.

Andrew Donaldson, Program Manager of Connected Vehicles and Certification Testing, Danlaw Inc.

*The Challenges and Benefits of Investing in Team Software Proficiency (Business and Industry Trends)When determining how to invest in team training, the decision often comes down to balancing the short-term strain on bandwidth with the long-term benefit of proficiency. Learn how Valeo decided to invest heavily in software proficiency to ensure each engineer can contribute to the widest set of tasks throughout the development process. These tasks include FPGA serial commands, data acquisition, vehicle interfaces, and HIL simulations. Explore why Valeo made this decision, strategies for minimizing the short-term impact, and the long-term success the company is now enjoying.

Derek O’Dea, Measurement Equipment and Tools Development Manager, Valeo

ni.com/tlf

SEMICONDUCTOR AND CONSUMER ELECTRONICS TRACK—MONDAY, MAY 22; BALLROOM B

The Semiconductor Industry in China: Supply-Chain Developments and Implications for Multinational CompaniesThe semiconductor industry in China is rapidly transforming with significant capital investments from both government and private sources. Meanwhile, Chinese consumers and companies are becoming more important to the growth of the global semiconductor market. At this session, examine the key trends and implications for multinational companies.

E. Jan Vardaman, President and Founder, TechSearch International Inc.

Meeting the Test Challenges of the Consumer Electronics Supply Chain Through StandardizationConsumer electronics manufacturers operate in tight market windows to design, develop, and test products while device complexity increases with the incorporation of new performance standards and technology. This presents considerable challenges for test organizations. At this session, learn how engineers at Bose Corporation took on these challenges through a standardization effort to implement economic and scalable test solutions that enable a shorter time to market.

James Kostinden, Test Engineering Manager/Software Lead Engineer, Bose Corporation

*When Mega Wireless Trends Become a Reality for Test (Business and Industry Trends)Technologies like 5G mmWave and automotive radar are changing the rules of what was once a well-understood field composed of channel models, antennas, and test equipment—all of which are required to build and test the ICs that enable the wireless communication infrastructure. What are the rules when 6 GHz starts to feel like DC? At this session, discover important learnings from prototypes and early deployments of 5G and automotive wireless technologies while exploring their impact on production test requirements.

Charles Schroeder, Vice President of RF/Wireless, NI

A Business Outcome Driven Approach to Scaling Semiconductor ValidationTight time-to-market pressure in the electronics supply chain is driving many semiconductor companies to focus on automating validation test. However, focusing on test automation does not guarantee the right business outcome. Many other aspects of a validation ecosystem need to be addressed to achieve an effective operation. But what are these other aspects and where should you focus? One possible approach is to start with the question, “What is the desired business outcome and what data is needed to achieve that outcome?” In other words, start by identifying the required data to support the business outcome and work backward to architect the infrastructure you need to attain that data. This can yield dramatically better business results. At this session, explore this approach and compare it with the typical evolution of a validation environment.

Brett Mitchelson, Senior Engineering Director, Silicon Labs

WORKSHOPS—TUESDAY, MAY 23

Improving the Semiconductor Design-to-Test FlowLearn how other companies are improving the flow from chip design and verification to lab characterization and all the way to production test.

George Zafiropoulos, Vice President, Solutions Marketing, NI

Best Practices for Developing Test Software Leadership and Skills in Your Organization Test organizations face a unique set of challenges to be successful in today’s engineering world. Building a team that can meet those challenges requires more than hiring smart engineers. In this round-table working session, we will introduce a set of best practices for discussion, then provide time to share experiences and challenges in those areas with your peers. The goal of this session is that you will leave with 2 to 3 ideas that you can implement in your group.

Steve Summers, Customer Development Manager, NI

*Overcoming Depreciated Test Assets: The Battle of Zero Capital Costs (Business and Industry Trends) Examine the Test Total Cost of Ownership perspective on fully depreciated test assets and learn how to deliver a strong ROI on upgrading old assets by offsetting operational costs.

Kevin T. Fort, Director of Avionics and Electronics, Honeywell Aerospace, and Robert Lee, Business and Technology Assessment Team, NI

*Why Test Standardizations Fail and What to Do About It (Business and Industry Trends) More test standardizations fail than succeed in reaching their intended business impacts. Analyze the most common reasons and explore countermeasures and best practices at this session.

Augusto Mandelli and Earle Donaghy, Business and Technology Assessment Team, NI

SCHEDULE OF EVENTS—MONDAY, MAY 22

8:30 a.m.TLF Registration

Ballroom B

9:00 a.m.Networking Event

Ballroom C

10:30 a.m. Break

11:00 a.m.

Opening Address and Q&A Ballroom B

Alex Davern, Chief Executive Offi cer, NIKevin Ilcisin, Vice President of Product Marketing, NI

11:45 a.m.Lunch

Fogo de Chão

AEROSPACE AND DEFENSE Ballroom C

SEMICONDUCTOR AND CONSUMER ELECTRONICS

Ballroom B

TRANSPORTATIONRoom 6A

1:00 p.m.

*Building Internal Alignment and Consensus for Change Across Departments

Paul Wagy, Lockheed Martin MFC Chad Ruwe, NI

The Semiconductor Industry in China: Supply-Chain Developments and

Implications for Multinational Companies E. Jan Vardaman, TechSearch International

Industry Test Challenges Roundtable

2:00 p.m.

*Subtle but Fatal Differences Between Service and Repair Test

and Manufacturing TestKevin T. Fort, Honeywell Aerospace

Sugato Deb, NI

Meeting the Test Challenges of the Consumer Electronics Supply Chain

Through StandardizationJames Kostinden, Bose

The Challenges of Sensor Fusion HIL TestHua Geng and Zhiyuan Hua, HiRain

3:00 p.m. Break

3:30 p.m.Standardizing L3 Automated Test Software

Azita Jamaludin, L3 Technologies

* When Mega Wireless Trends Become a Reality for Test

Charles Schroeder, NI

V2X: Opportunities for AllAndrew Donaldson, Danlaw

4:30 p.m.From R&D to Production: Building a Rocket

for Space TourismJason Smith, Blue Origin

A Business Outcome Driven Approach to Scaling Semiconductor Validation

Brett Mitchelson, Silicon Labs

* The Challenges and Benefits of Investing in Team Software Proficiency

Derek O’Dea, Valeo

5:30 p.m.Happy HourCapital Grille

7:00 p.m.Dinner

Capital Grille

SCHEDULE OF EVENTS—TUESDAY, MAY 23

8:00 a.m.Morning Keynote–Testing and Deploying the Next Generation of Technology

Exhibit Hall 4

9:00 a.m. Gather near rooms 6A, 6B and 7 of the Austin Convention Center

Room 6A Room 6B Room 7

9:30 a.m.Workshop: Improving the

Semiconductor Design-to-Test FlowGeorge Zafi ropoulos, NI

Workshop: Best Practices for Developing Test Software Leadership

and Skills in Your OrganizationSteve Summers, NI

*Overcoming Depreciated Test Assets: The Battle of Zero Capital Costs

Kevin T. Fort, Honeywell AerospaceRobert Lee, NI

* Why Test Standardizations Fail and What to Do About It

Augusto Mandelli and Earle Donaghy, NI

11:45 a.m.Lunch Keynote–The Next Innovation in Engineering Software

Exhibit Hall 4

1:30 p.m. NIWeek Exhibition and Technical Sessions

*Business and Industry Trends Sessions.

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