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ORIGINAL RESEARCH
Influence of insertion of a noble gas atom on halogen bondingin H2O���XCCNgF and H3N���XCCNgF (X 5 Cl and Br; Ng 5 Ar,Kr, and Xe) complexes
Qing-Zhong Li • Wen-Ming Liu • Ran Li •
Wen-Zuo Li • Jian-Bo Cheng • Bao-An Gong
Received: 16 April 2012 / Accepted: 26 April 2012
� Springer Science+Business Media, LLC 2012
Abstract The H2O���XCCNgF and H3N���XCCNgF
(X = Cl and Br; Ng = Ar, Kr, and Xe) complexes have
been studied with quantum chemical calculations at the
MP2/aug-cc-pVTZ level. The results show that the inserted
noble gas atom has an enhancing effect on the strength of
halogen bond, and this enhancement is weakened with the
increase of noble gas atomic number. The methyl and Li
substituents in the electron donor strengthen the halogen
bond. The interaction energy increases from -3.75 kcal/mol
in H3N–BrCCF complex to -9.66 kcal/mol in H2LiN–
BrCCArF complex. These complexes have been analyzed
with atoms in molecules, natural bond orbital, molecu-
lar electrostatic potentials, and energy decomposition
calculations.
Keywords Halogen bond � Noble gas � Substitution �Electrostatic interaction � Dependence of noble gas atomic
number
Introduction
The investigation of the properties of noble gas compounds
has been the subject of many studies in recent years. Some
noble gas compounds have been synthesized and observed
experimentally. The first reported Xe derivative is Xe[PtF6]
[1]. Then other Xe-containing compounds including
HXeH, HXeCl, HXeBr, HXeI, HXeCN, HXeNC, HXeSH,
and HXeOH have been prepared [2–7]. Some Kr-contain-
ing compounds such as HKrF and HKrCl have also been
synthesized [8–11]. The first Ar-containing compound,
HArF, was first discovered and characterized in a low
temperature solid Ar matrix [12]. These noble gas insertion
compounds can be expressed with the general formula
HNgX, where Ng = Ar, Kr, Xe; and X = electronegative
atom or group. The H–Ng bond exhibits covalent bonding,
while the Ng–X bond is ionic [13]. The HNgX and other
types of noble gas compounds have also been investigated
with theoretical methods. It has been demonstrated that the
inserted noble gas atoms have a great effect on the charge
distribution in molecules. In FNgCCF (Ng = Ar and Kr),
the charge distribution indicates highly positive charges on
the noble gas atoms, highly negative charges on the halo-
gen atoms, and relatively neutral charges on the carbon
atoms [14]. The electric properties, such as dipole moment,
polarizabilities, and first hyperpolarizabilities were also
changed accordingly [15–17].
These noble gas compounds have been found to form
some hydrogen-bonded complexes such as N2���HArF [18],
CO���HArF [19], OCO���HArF [20], N2���HKrF [21], and
N2���HKrCl [22]. An unusual vibrational characteristic, a
large blue shift of the H–Ng-stretching frequency, was
observed for these complexes. They also formed dihydro-
gen-bonded complexes with metal hydrides [23–26], in
which the H–Ng stretch vibration moves to low frequency.
Electronic supplementary material The online version of thisarticle (doi:10.1007/s11224-012-0036-9) contains supplementarymaterial, which is available to authorized users.
Q.-Z. Li (&) � W.-M. Liu � R. Li � W.-Z. Li � J.-B. Cheng
The Laboratory of Theoretical and Computational Chemistry,
School of Chemistry and Chemical Engineering, Yantai
University, Yantai 264005, People’s Republic of China
e-mail: [email protected]
B.-A. Gong (&)
Yantai Nanshan University, Yantai 264005,
People’s Republic of China
e-mail: [email protected]
123
Struct Chem
DOI 10.1007/s11224-012-0036-9
The presence of noble gas atom also imposes an influence
on the strength of C–H hydrogen bond in FNgCCH
(Ng = Ar and Kr) complexes [27–29]. The hydrogen bonds
formed by FKrCCH are stronger than those formed by the
parent FCCH, which can be attributed to the increased
acidity of the C–H proton due to insertion of the Ng atom.
A halogen bond is a noncovalent interaction between a
region of positive electrostatic potential on the outer side of
the halogen X in a molecule and a negative site B, such as a
lone pair of a Lewis base or the p-electrons of an unsaturated
system [30]. In recent years, more and more attention has
been paid to halogen bonding because of its extensive
applications in molecular recognition, crystal engineering,
and biological systems [31–36]. We studied the halogen-
boned complexes of HArF and dihalogen molecules and
found that they are more stable than the corresponding
hydrogen-boned ones [37]. A large blue shift of the
H–Ar-stretching frequency was observed for both types of
complexes. However, the ability of these rare gas-inserted
molecules to form halogen bonding has not been investigated
with colloquial acceptor molecules for halogen bonding,
such as water, ammonia, alcohols, amines, and others.
In this article, we study the complexes of H2O���XCCNgF
and H3N���XCCNgF (X = Cl and Br; Ng = Ar, Kr, and Xe)
with quantum chemical calculations. The corresponding
H2O���XCCF and H3N���XCCF complexes are also studied.
The first aim is to explore the ability of C–X group in noble
gas-inserted molecule XCCNgF to form halogen bonding.
The second aim is to study the dependence of the ability on
the noble gas atomic number. Third, we compare the stability
of halogen-bonded complexes through substituting the pro-
ton in water and ammonia with a methyl group or Li atom.
The properties and nature of halogen bonds have been
understood by means of natural bond orbital (NBO), atoms in
molecules (AIM), and symmetry-adapted perturbation
theory (SAPT) methods.
Theoretical methods
All calculations were performed by means of the Gaussian
09 suite of programs [38]. We applied the most widely used
method in WFT procedures, second-order Møller-Plesset
perturbation theory (MP2) [39], which contains the essen-
tial portion of the correlation energy. This method has been
proven to be effective and accurate in determining the
equilibrium structure and interaction energy for many
halogen-bonded complexes [40–42]. All calculations were
carried out with the aug-cc-pVTZ basis set. Core electrons
were not included in the correlation treatment with MP2
calculations.
The geometries of the isolated species and halogen-
bonded complexes were optimized at the MP2/aug-cc-
pVTZ level. Then at the same level, we performed fre-
quency calculations to affirm that the obtained structures
are characterized as minima with no imaginary frequency.
The interaction energies were obtained by using the
supermolecule method as the difference between the
energy of a complex and the energy sum of the isolated
subsystems forming the complex. The basis set superpo-
sition error (BSSE) was removed by the standard coun-
terpoise correction method of Boys and Bernardi [43].
On the basis of the MP2-optimized structures, we per-
formed AIM and NBO analyses as well as molecular
electrostatic potentials (MEP) and energy decomposition
(ED) calculations. NBO analysis was carried out by means
of NBO 3.1 [44] program implemented in Gaussian 09.
AIM calculations were performed with the help of the AIM
2000 software [45]. MEP calculations were performed
using WFA Surface analysis suite [46]. ED calculations
were carried out with the SAPT method using the
SAPT2002 program [47].
Results and discussion
Energies and geometries
Figure 1 shows the optimized structures of H2O–ClCCF,
H2O–BrCCF, H3N–BrCCF, and the respective Ar-inserted
complexes. Clearly, the angle of halogen bond is close to
180� in all structures. The symmetry varies from Cs in
H2O–XCCF complex to C2,v in H2O–XCCArF (X = Cl
and br) complex, while it is kept as C3,v in H3N–BrCCF
and H3N–BrCCArF complexes. The interaction energies
corrected for BSSE in the complexes were collected in
Table 1. The interaction energy in H2O–BrCCF complex is
more negative than that in H2O–ClCCF one since the
positive electrostatic potential on the Br atom surface is
bigger. Ammonia is a stronger base than water, thus the
interaction energy in H3N–BrCCF complex becomes more
negative than that in H2O–BrCCF complex. When an Ar
atom is inserted into the C–F bond in XCCF, the interac-
tion energy becomes more negative, indicating that the
halogen bond is strengthened. This effect is like the C–H
hydrogen bond in FNgCCH (Ng = Ar and Kr) complexes
[27–29]. The increased value is related with the nature of
the halogen atom and the base. The Br halogen donor
brings out a little larger increase of the interaction energy
and the stronger base also has a similar effect but the effect
is prominent.
The strength of halogen bond is also reflected with
changes in geometries. Table 1 also presents the binding
distance and change of C–X bond length in the complexes.
One sees that the binding distance is shortened as an Ar
Struct Chem
123
atom is inserted into the C–F bond in XCCF. Its shortening
is 0.0615 A in H2O–ClCCArF complex, 0.0532 A in H2O–
BrCCArF complex, and 0.0564 A in H3N–BrCCArF
complex. Figure 2 shows the relationship of the interaction
energy and the binding distance. They display a good linear
relationship. The slope of the line is larger for the stronger
halogen bond. Upon complexation, the C–X bond is
lengthened. The Ar insertion causes a decrease of the C–X
bond elongation. Accompanied with the bond elongation, a
red shift is observed for the C–X stretch vibration. The red
shift of C–X stretch vibration is less prominent than that of
C–H bond in C2H2–HCCArF complex [48] due to the
larger atomic mass of X.
It has been demonstrated that the strength of Ng-H���pand C–H���F hydrogen bonds formed of benzene and HNgF
is weakened with the increase of Ng atomic number [49].
Thus, we replaced the Ar atom in the above complexes by a
Kr or Xe atom. The Kr and Xe complexes have a similar
structure with the Ar analog. With the increase of Ng
atomic number, the interaction energy becomes less neg-
ative and the binding distance grows up. This indicates that
the strength of halogen bond is also weakened with the
increase of Ng atomic number. This weakening is related
with the nature of halogen donor and acceptor. The bigger
weakening corresponds to the stronger base and weaker
halogen donor. For the heavier noble gas atom, the C–X
bond elongation becomes smaller. The respective bond
stretch exhibits a smaller shift as shown in Table 1.
The methyl group plays an important role in regulating
the strength of different types of interactions [50–52] and
the Li atom in the electron donor strengthens greatly the
halogen bond [53]. Thus, we substituted one H atom in
water or ammonia with a methyl group or a Li atom. The
structures of the respective complexes are shown in Fig. 3.
Fig. 1 Optimized structures of H2O–ClCCF, H2O–BrCCF, H3N–
BrCCF, and the respective Ar-inserted complexes
Table 1 Interaction energy (DE, kcal/mol) corrected for BSSE,
binding distance (R, A), change of C–X bond length (Dr, A), and shift
of C–X stretch vibration (Dv, cm-1) in the complexes
DE DDE DDE% R Dr Dv
H2O–ClCCF -1.98 – 2.9525 0.0019 -4
H2O–
ClCCArF
-2.97 -0.99 50 2.8910 0.0007 1
H2O–
ClCCKrF
-2.80 -0.82 41 2.9031 0.0008 -1
H2O–
ClCCXeF
-2.55 -0.57 29 2.9181 -0.0002 0
HMeO–
ClCCArFa-3.50 -0.71 25 2.8223 0.0013 -1
H2O–BrCCF -2.80 – 2.9201 0.0053 -6
H2O–
BrCCArF
-3.84 -1.04 37 2.8669 0.0039 0
H2O–
BrCCKrF
-3.64 -0.84 30 2.8790 0.0038 -3
H2O–
BrCCXeF
-3.36 -0.55 20 2.8937 0.0036 -3
HMeO–
BrCCArFa-4.56 -0.72 19 2.7913 0.0056 -3
H3N–BrCCF -3.75 – 2.9371 0.0115 -16
H3N–
BrCCArF
-5.25 -1.50 40 2.8807 0.0118 -13
H3N–
BrCCKrF
-4.95 -1.20 32 2.8967 0.0111 -15
H3N–
BrCCXeF
-4.57 -0.82 22 2.9167 0.0102 -14
H2MeN–
BrCCArFa-6.22 -0.97 18 2.7883 0.0164 -15
H2LiN–
BrCCArFa-9.66 -4.41 84 2.4971 0.0910 -124
a DDE is the difference of the interaction energy in the substituted
complex and that in the parent complex. DDE% is the increased
percentage of the interaction energy in the substituted complex relative
to that in the parent complex
Fig. 2 Relationship between the interaction energy and the binding
distance in the O���Cl (filled square), O���Br (filled triangle), and
N���Br (filled diamond) halogen-bonded complexes
Struct Chem
123
One can see that the C–X���O angle deviates from 180o in
HMeO–ClCCArF and HMeO–BrCCArF complexes. The
similar result is also found for the C–Br���N angle in
H2LiN–BrCCArF complex. When one H atom in water and
ammonia is replaced with a methyl group, the interaction
energy becomes more negative and the binding distance is
shorter. This shows that the halogen bond is strengthened
by the substitution. Accordingly, the C–X bond suffers a
bigger elongation, and the C–X stretch vibration shows a
larger red shift. The effect of methyl substitution is related
with the strength of halogen bond. The methyl group in the
stronger halogen bond leads to a larger enhancement. In the
methyl-substituted complexes, the positive charge on the
methyl group is increased, indicating that the methyl group
is electron-donating and thus it plays a positive contribu-
tion to the formation of halogen bond. The Li substituent
also brings out a similar effect on the strength of halogen
bond but its effect is more prominent. The interaction
energy is calculated to be -9.66 kcal/mol in H2LiN–
BrCCArF complex, which is increased by 84%. However,
the positive charge on the Li atom is decreased, and it
appears to be inconsistent with the Li electron-donating
and the enhancement of halogen bond. We found that the
Li atom is close to the Br atom in H2LiN–BrCCArF
complex; thus, we measured the distance of both atoms in
the complex. It is found that the distance is 2.6081 A,
which is much smaller than the sum of van der Waals radii
of Li and Br atoms (3.7 A). This means that the Br atom
has dual functions in formation of the complex: as the
electron donor and the acceptor, which can be understood
with the anisotropic distribution of electrostatic potentials
on the Br atomic surfaces.
NBO and AIM analyses
Natural bond order (NBO) analysis is an effective tool to
estimate the interaction between the lone pair orbitals of
O(N) and the antibonding orbital of C–X bond in the
complexes. Such orbital interaction is estimated with
perturbation energy. One can see from Table 2 that the
perturbation energy is increased in the Ng complexes and
becomes smaller for the heavier Ng atom. The methyl and
Li substitutions in the electron donor also increase the
perturbation energy. Figure 4 shows the relationship
between the interaction energy and the perturbation energy
in the complexes. A linear relation is observed for the
O���Cl complex, while a curve relation is found for the
O���Br and N���Br complexes. This indicates that the orbital
interaction is important in the formation of complexes.
The above orbital interaction leads to the changes in the
electron occupancy of C–X sigma-bonding and sigma-
antibonding orbitals. It can be seen from Table 2 that the
electron density of C–X sigma bond orbital is decreased
and that of C–X sigma-antibonding orbital is increased.
The latter suffers a bigger change than the former. Thus,
the latter is mainly responsible for the C–X bond elonga-
tion and the red shift.
The charge transfer happens between both subunits
accompanied with the orbital interactions. Although the
charge transfer is small in the formation of complexes, it
becomes larger in the Ng complexes. A good relationship is
observed for the interaction energy and charge transfer in
the O���Cl complex, while it is not found in the O���Br and
N���Br complexes. This shows that the charge transfer
interaction plays an important role in the formation of
O���Cl complex but has a small effect in the latter two
complexes.
Topological analysis of electron density is also a sen-
sitive method to estimate the strength of halogen bonding.
Table 2 presents the electron density and its Laplacian at
the O���X and N���X bond critical points in the complexes.
The electron density and its Laplacian are positive, thus the
observed BCPs are (3,-1) type for all the complexes. The
electron density and its Laplacian at the O���X and N���Xcontacts for all complexes fall in the proposed range of
Fig. 3 Optimized structures of HMeO–ClCCAeF, HMeO–BrCCArF,
H2MeN–BrCCArF, and H2LiN–BrCCArF complexes
Fig. 4 Relationship between the interaction energy and the pertur-
bation energy in the O���Cl (filled square), O���Br (filled triangle), and
N���Br (filled diamond) halogen-boned complexes
Struct Chem
123
0.002–0.04 and 0.02–0.15 a.u., respectively, for hydrogen
bonds [54]. Figures S1 and 5 show the linear relationship of
the interaction energy with the electron density and its
Laplacian, respectively. This indicates that both topologi-
cal parameters can measure the strength of halogen bonds
like that in hydrogen bonds [55].
MEP and ED analyses
Lots of studies [56, 57] showed that electrostatic interac-
tion plays a dominant role in halogen bonds, thus we cal-
culated the electrostatic potentials of the containing-X
molecules. Table 3 lists the most positive electrostatic
potentials (Vs,max) on the X atom surfaces. The Br atom has
a much larger positive electrostatic potential than Cl. The
Vs,max value is increased in the Ng complexes and becomes
smaller with the increase of Ng number. This is consistent
with the strength of halogen bond in the complexes, indi-
cating that the electrostatic interaction is of great impor-
tance in the halogen-bonded complexes.
To have a deeper insight into the nature of halogen
bonds in the complexes, we performed an ED analysis for
them. The halogen bonds were decomposed into five parts:
electrostatic energy (Eelst), exchange energy (Eexch),
induction energy (Eind), dispersion energy (Edisp), and
dEint-r(HF), which is the contributions to supermolecular
Table 2 Perturbation energy (E2, kcal/mol) due to the
LPO(N) ? r*(C–X) orbital interaction, charge transfer (CT, e), change
of charge on the methyl group or Li atom (Dq, e), differences between
NBO electron density (ED) in the complexes and the isolated halogen
donor in C–X sigma-bonding (Dr) and sigma-antibonding (Dr*)
orbitals, electron density (q, au), and its Laplacian (r2q, au) at the
intermolecular bond critical point (BCP) in the complexes
E2 CT Dq DrC–X Dr*C–X q r2q
H2O–ClCCF 1.32 0.0025 – -0.0006 0.0021 0.0091 0.0476
H2O–ClCCArF 1.67 0.0033 – -0.0008 0.0024 0.0105 0.0548
H2O–ClCCKrF 1.58 0.0031 – -0.0007 0.0022 0.0102 0.0535
H2O–ClCCXeF 1.48 0.0029 – -0.0007 0.0020 0.0099 0.0518
HMeO–ClCCArF 1.83 0.0031 0.0130 -0.0015 0.0034 0.0126 0.0646
H2O–BrCCF 3.08 0.0052 – -0.0009 0.0050 0.0121 0.0569
H2O–BrCCArF 3.50 0.0061 – -0.0011 0.0053 0.0134 0.0634
H2O–BrCCKrF 3.32 0.0057 – -0.0012 0.0050 0.0131 0.0619
H2O–BrCCXeF 3.14 0.0052 – -0.0012 0.0046 0.0127 0.0602
HMeO–BrCCArF 4.70 0.0077 0.0147 -0.0019 0.0081 0.0165 0.0751
H3N–BrCCF 5.95 0.0133 – -0.0016 0.0134 0.0158 0.0597
H3N–BrCCArF 7.39 0.0176 – -0.0020 0.0165 0.0180 0.0656
H3N–BrCCKrF 6.87 0.0159 – -0.0020 0.0151 0.0174 0.0640
H3N–BrCCXeF 6.31 0.0142 – -0.0020 0.0137 0.0166 0.0619
H2MeN–BrCCArF 8.54 0.0230 0.1033 -0.0029 0.0215 0.0224 0.0775
H2LiN–BrCCArF 38.72 0.0865 -0.0184 -0.0052 0.1087 0.0461 0.1058
Table 3 The most positive electrostatic potential (Vs,max, au) on the
halogen atom at the 0.001 electrons Bohr-3 isodensity surface at the
MP2/aug-cc-pVTZ level
Vs,max
ClCCF 0.0404
ClCCArF 0.0651
ClCCKrF 0.0585
ClCCXeF 0.0515
BrCCF 0.0515
BrCCArF 0.0756
BrCCKrF 0.0688
BrCCXeF 0.0618
Fig. 5 Relationship between the interaction energy and the Laplacian
at the intermolecular BCP in the O���Cl (filled square), O���Br (filledtriangle), and N���Br (filled diamond) halogen-bonded complexes
Struct Chem
123
Hartree–Fock energy beyond the second order of inter-
molecular operator. The Eind term also contains the
exchange-induction energy and the Edisp term also includes
the exchange-dispersion energy. The results are given in
Table 4. As expected, the Eelst, Eind, Edisp, and dEint-r(HF) terms
show an attractive contribution, while the Eexch term is a
repulsive contribution. The Ng insertion causes all terms
increase in magnitude; however, the Eelst term suffers the
largest effect from the Ng insertion. Furthermore, in all
complexes, the major attractive contribution to the total
attractive energy results from Eelst, while other attractive
contribution is small. This supports the conclusion that the
halogen bond is dominated by electrostatic interactions.
Conclusions
The influence of insertion of a noble gas atom on halogen
bonding in H2O���XCCNgF and H3N���XCCNgF (X = Cl
and Br; Ng = Ar, Kr, and Xe) complexes has been
investigated with quantum chemical calculations. The most
positive electrostatic potential on the X atomic surface is
increased because of the insertion of Ng atom into the C–F
bond. Thus, the insertion of Ng atom brings out an
enhancing effect on the strength of halogen bond. This
enhancement is decreased with the increase of Ng atomic
number. The substituents of methyl and Li in the electron
donor further strengthen the halogen bond. The ED anal-
yses show that the electrostatic interaction plays a domi-
nant role for the stability of the halogen-bonded complexes.
Acknowledgments This study was supported by the National
Natural Science Foundation of China (20973149), the Outstanding
Youth Natural Science Foundation of Shandong Province
(JQ201006), and the Program for New Century Excellent Talents in
University. It was also supported in part by the open project of State
Key Laboratory of supramolecular structure and materials (SKLS
SM201216) from Jilin University, China.
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Table 4 Energy decomposition in the complexes. All are in kcal/mol
Eelst Eexch Eind Edisp dEint-r(HF) Eint
sapt
H2O–ClCCF -2.79 3.07 -0.50 -1.61 -0.25 -2.08
H2O–ClCCArF -4.07 3.77 -0.71 -1.78 -0.36 -3.15
H2O–BrCCF -4.97 5.66 -0.99 -2.02 -0.47 -2.79
H2O–BrCCArF -6.24 6.35 -1.31 -2.18 -0.61 -3.99
H3N–BrCCF -10.51 12.72 -2.11 -3.17 -1.11 -4.18
H3N–BrCCArF -11.68 12.84 -2.45 -3.18 -1.31 -5.78
Struct Chem
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