Insulation Resistance Test - Factors Affecting Test Results

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  • 7/29/2019 Insulation Resistance Test - Factors Affecting Test Results

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    IR test set (courtesy of Megger(http://www.megger.com/) )

    Insulation Resistance Test

    From Open Electrical

    The insulation resistance (IR) test (also commonly known as a Megger) is a spot insulation test which uses an applied DC voltage (typically either

    250Vdc, 500Vdc or 1,000Vdc for low voltage equipment

  • 7/29/2019 Insulation Resistance Test - Factors Affecting Test Results

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    In the ANSI/NEC world, the standard ANSI/NETA ATS-2009 [2] provides test procedures and acceptance levels for most types of electrical equipment.

    Table 100.1 provides representative acceptance values for IR test measurements, which should be used in the absence of any other guidance (from the

    manufacturer or other standards):

    Nominal EquipmentVoltage (Vac)

    Min TestVoltage (Vdc)

    MinInsulationResistance

    (M)

    250 500 25

    600 1,000 100

    1,000 1,000 100

    2,500 1,000 500

    5,000 2,500 1,000

    8,000 2,500 2,000

    15,000 2,500 5,000

    25,000 5,000 20,000

    34,500 and above 15,000 100,000

    NFPA 70B [3] also provides some guidance on insulation resistance testing for different types of equipment.

    Factors Affecting Test Results

    There are two main factors that will affect IR test results:

    Temperature

    Electrical resistance has an inverse exponential relationship with temperature, i.e. as temperature increases, resistance will decrease and vice versa.

    Since the minimum acceptable IR test values are based on a fixed reference temperature (usually 20oC), the measured IR test values must be corrected

    to the reference temperature in order to make sense of them.

    As a rule of thumb, the resistance halves for every 10oC increase in temperature (and vice versa). So if the measured IR test value was 2M at 20oC,

    then it would be 1M at 30oC or 4M at 10

    oC.

    ANSI/NETA ATS-2009 Table 100.14 provides correction factors for IR test measurements taken at temperatures other than 20o

    C or 40o

    C, which werein turn based on the correction factors in the freely available Megger book "A stitch in time..." [4].

    Humidity

    The presence (or lack) of moisture can also affect the IR test measurements, the higher the moisture content in the air, the lower the IR test reading. If

    possible, IR tests should not be carried out in very humid atmospheres (below the dew point). While there are no standard correction factors or guidance

    for humid conditions, it is good practice to record the relative humidity of each IR test so that they can be used for baseline comparisons in future tests.

    For example, having past data on the IR test values for dry and humid days will give you a foundation for evaluating future test values.

    Related Tests

    For equipment maintenance, the Dielectric Absorption Test is normally performed in conjunction with the IR test using the same testing equipment. The

    results are either in the form of a Dielectric Absorption Ratio (DAR) or a Polarisation Index (PI). Refer to the Dielectric Absorption Test article for more

    details.

    References

    1. IEC 60364-6, "Low voltage electrical installations - Part 6: Verification", 2006

    2. ANSI/NETA ATS, "Standard for Acceptance Testing Specifications for Electrical Power Equipment and Systems", 2009

    3. NFPA 70B, "Recommended Practice for Electrical Equipment Maintenance", 2010

    4. Megger, "A stitch in time - The Complete Guide to Electrical Insulation Testing" (http://www.biddlemegger.com/biddle/Stitch-new.pdf) , a

    free book which is an excellent resource on IR testing

    Retrieved from "http://www.openelectrical.org/wiki/index.php?title=Insulation_Resistance_Test"

    Category: Electrical Testing

    This page was last modified on 27 December 2012, at 19:12.

    nsulation Resistance Test - Open Electrical http://www.openelectrical.org/wiki/index.php?title=Insulation_Resistance_Test

    of 2 29/01/2013 03:22 PM

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