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Texas Christian University Department of Engineering Ed Kolesar
Introduction toMicroeletromechanical Systems
(MEMS)
Lecture 2 Topics• Micromachining – Definitions and Terminology• Example Fabrication Process• Lithography
PhotolithographyElectron Beam LithographyOther Tools: Stereolithography, “soft” lithography
• Etching
Texas Christian University Department of Engineering Ed Kolesar
Some Definitions• MEMS: Microelectromechanical System
Note: name is not really appropriate (anymore) since the field of MEMS includes also optical, magnetic, thermal, chemical, biological systems
Other definitions: MST: Micro Systems Technology Micro Sensors and ActuatorsMicromachined Transducers
• Transducer: converts one form of energy into another.This term encompasses “sensors” and “actuators.”For practical purposes, a transducer is a conduit for information.
• What is “micromachining” ?
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Texas Christian University Department of Engineering Ed Kolesar
Micromachining• Broad term describing all precision
techniques to build small (mm to nm) structures
• Micromachining techniques were originally developed for the IC industry (1960’s on)
• Think of micromachining as the vocabulary with which we express microstructures
Texas Christian University Department of Engineering Ed Kolesar
MicromachiningDistinguish:• Bulk micromachining:
use (silicon) substrate• Surface micromachining:
use deposited thin films
Aspect ratio:Relative height / width of features. Often, high aspect ratio is desired for MEMS
Figure: G. Kovacs, 1996.
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Texas Christian University Department of Engineering Ed Kolesar
Micromachining
Three basic techniques:• Pattern Definition
(usually lithography)• Additive Processes
(deposition of material: thin film deposition, sputtering, evaporation, plating, spin-on, …)
• Subtractive Processes(removal of material: etching, …)
Texas Christian University Department of Engineering Ed Kolesar
Sample Process• Walk through a common MEMS process• Ignore fabrication details for now, instead
focus on geometric operations:Patterning Deposition (addition of material)Etching (removal of material)Isotropic (same rate in all directions)Anisotropic (preferred directions)
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Texas Christian University Department of Engineering Ed Kolesar
Sample Process
• Si wafer
• SiO2 depositionPECVD or furnace
• Photoresist spin-on
Wafer Cross Section (not to scale!)
Texas Christian University Department of Engineering Ed Kolesar
Sample Process• Expose photoresist
lithography
• Develop photoresist
• Pattern transfer photoresist → SiO2anisotropic RIE etch
• Pattern transferSiO2 → Sianisotropic RIE etch (timed)
Trenches in substrate
Light SourceLithographic
Mask
10 µm …
100 µm
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Texas Christian University Department of Engineering Ed Kolesar
Sample Process
• Remove photoresist
• Deposit SiO2PECVD (conformal - more or less)
Note: Thicker SiO2 on mesa
> 2 µm
Texas Christian University Department of Engineering Ed Kolesar
Sample Process
• Etch trench SiO2RIE anisotropic (timed)
• Etch SiRIE isotropic (timed)
Released structures
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Texas Christian University Department of Engineering Ed Kolesar
Sample Process
• Deposit insulating SiO2PECVD (conformal - more or less)
• Deposit Alsputter
Insulated mesa and trench metal
Texas Christian University Department of Engineering Ed Kolesar
SCREAM Process• Single Crystal Reactive
Etching And Metallization(developed at Cornell CNF)
• Features:1 mask, “self-aligning”High aspect-ratio SCS structures
• Applications:Electrostatic actuatorsIntegrated STM, …
SCREAM cross section
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Texas Christian University Department of Engineering Ed Kolesar
SCREAM Process
XYZ-stage for MEMS STM[Yang Xu et al. American Physical Society March Meeting, 1995]
Two-level SCREAM Actuators[K. Böhringer et al., IEEE MEMS, 1995]
Texas Christian University Department of Engineering Ed Kolesar
MEMS Overview
Micromachining: lithography, deposition, etching, …
Processes & Foundries
Devices & Structures
Methodology
History & Market
Introduction&
Background
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Texas Christian University Department of Engineering Ed Kolesar
Lithography• The basic technique used to define and transfer
patterns, in most micromachining and integrated circuit fabrication processes
• Optical lithography: light is directed through a mask to selectively expose a photosensitive organic material (photoresist)
• Patterned regions can then be manipulated (etching, deposition, etc.) or the resist can be used as a sacrificial (temporary spacer) layer.
Texas Christian University Department of Engineering Ed Kolesar
LithographyDistinguish:
Contact lithography: mask in immediate proximity ofphotoresistStepper: geometric projection, e.g. 10:1 or 5:1
Positive resist: exposed resist is removed in developerNegative resist: non-exposed resist is removed in developer
Exposed regions can be then be manipulated (with etching, deposition, etc.)
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Texas Christian University Department of Engineering Ed Kolesar
Lithography Process
Texas Christian University Department of Engineering Ed Kolesar
Problems with Lithography“Features” of (photo-)lithography:• 2-dimensional• Requires flat surfaces• Resolution limited
by wavelength of light• Projection errors
Shapes that are difficult to fabricate with lithographic techniques[Figure: G. Kovacs, 1996]
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Texas Christian University Department of Engineering Ed Kolesar
More Lithography• Electron beam lithography: scanning electron beam
for small feature sizes (smaller wavelength), Note: there are fundamental differences to optical lithography…
• X-ray and synchrotron lithographycan expose very thick layers of resist(mm and more)
Separation nozzle, Institute for Microstructure Technology Karlsruhe, Germany
Texas Christian University Department of Engineering Ed Kolesar
Stereo Lithography
• Stereolithography:build up 3D structures from CAD model layer by layer withphotocurable resin
• Resolution < 5 µm is possible
Bertsch 1998 – 2001, EPFL Switzerland http://dmtsun.epfl.ch/~abertsch/album.html
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Texas Christian University Department of Engineering Ed Kolesar
• Printing with elastomeric stampspatterning of a wide variety of materials;non-flat substrate surfaces are possible
Whitesides (Harvard) and Qin, Xia (UW)
• The key element is the elastomeric stamp or mold, usually made from polydimethylsiloxane (PDMS), having patterned relief structures on its surface.
• The stamp pattern is transferred in a printing process.
“Soft Lithography”
Texas Christian University Department of Engineering Ed Kolesar
Etching• Subtractive Process - removing materials
• Wet etching - liquid etchants:AcidsHydroxides
• Dry etching - etching gases / plasma:Physical etching (impact of atoms/ions)Reactive chemicals / ionsEnhanced by RF energy (instead of temperature)
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Texas Christian University Department of Engineering Ed Kolesar
Etchant PropertiesHow do we choose an etching method?
• Selectivity to masking layer(s) and their availability• Selectivity to metals (e.g., Al)• Etch rate• Anisotropy (crystal plane selectivity)• Surface roughness• Control of etch parameters• Safety of reactant(s) and product(s)• Cost (including disposal and fixed costs)• Capacity for etch-stops• Mode and ease of use (including throughput)• Other parameters?
Texas Christian University Department of Engineering Ed Kolesar
Wet Etching• Most micromachining is presently done with silicon,
and a large amount of that is etching with wet chemicals.
• Isotropic etchants (e.g. HNA) give rounded profiles.• Anisotropic etchants (e.g. KOH, TMAH) slow down
markedly on (111) crystal planes of silicon, yielding flat surfaces.
• Dopants such as high concentrations of boron can be used to stop the progress of etchants such as KOH.
• Electrochemical etch-stop techniques can also be used since at certain potentials, silicon forms an anodic oxide that stops etching.
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Texas Christian University Department of Engineering Ed Kolesar
Etching
Figure: G. Kovacs, 1996.
Texas Christian University Department of Engineering Ed Kolesar
Convex and Concave CornersAnisotropic Wet Etching:• Convex corners are
undercut• Concave corners stop at
[111] intersections
Figures: G. Kovacs, 1996.
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Texas Christian University Department of Engineering Ed Kolesar
Anisotropic Si Etchants• Alkali Hydroxides (KOH, NaOH, etc.): very
smooth walls, can use isopropyl alcohol to increase selectivity (111) vs. (100), attacks aluminum, oxide etches somewhat, nitride good mask.
• Ethylene Diamine Pyrochatechol (EDP): similar to KOH but much more toxic, does not attack metals (even Al in some cases) nor oxide.
• Tetramethyl Ammonium Hydroxide (TMAH):similar to EDP but safer, in some cases will not attack Al, can be masked with oxide.
• Amine Gallates: similar to EDP but somewhat safer, not commonly used.
Texas Christian University Department of Engineering Ed Kolesar
Anisotropic Etch Examples
Typical etch pit
Tuckerman and Pease (110) cooling channels
Figure: G. Kovacs, 1996.
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Texas Christian University Department of Engineering Ed Kolesar
Dopant Etch Stops• Many anisotropic etchants slow down markedly at
high boron concentrations (» 1020 cm-3).• Can diffuse or grow boron-containing epitaxial silicon.
Cantilever (Petersen, 1982) Membrane formation
Figures: G. Kovacs, 1996.
Texas Christian University Department of Engineering Ed Kolesar
Boron p++ Etch Stops
Figures: G. Kovacs, 1996.
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Texas Christian University Department of Engineering Ed Kolesar
Electrochemical Etching
Figures: G. Kovacs, 1996.
• Use standard CMOS to form isolated single-crystal islands.
• Use “open” mask to leave bare silicon regions.
• With appropriate TMAH formulation, exposed Al is not attacked.
• n-wells are biased more anodic than passivation potential and are not etched.
Texas Christian University Department of Engineering Ed Kolesar
Photon-pumped Etching• Use photogenerated
electron-hole pairs to supply holes for etching reaction.
• Holes are concentrated at high-field points (deliberately started) and can yield holes with aspect ratios > 70:1.
• (see Lebmann and Föll, 1990)
Figure: G. Kovacs, 1996.
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Texas Christian University Department of Engineering Ed Kolesar
Comparison of Si Etchants1 sublimation from solid
source2 With added Si,
polysilicic acid or pH control
3 Some formulations do not attach Al, but are not common
4 Includes cost of equipment
5 Varies with wt% TMAH, can be controlled to yield very low roughness
6 Defined as 1) allowing wafer to be immersed directly with no special measures and 2) no alkali ions
Source: G. Kovacs, 1996.