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Mark Raymond - [email protected] - 16/11/05 1 Trip-t testing rogress report modifications to test setup - hardware and software SiPM pulse height spectra linearity measurements discriminator measurements

Mark Raymond - [email protected] - 16/11/051 Trip-t testing progress report modifications to test setup - hardware and software SiPM pulse height

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Page 1: Mark Raymond - m.raymond@imperial.ac.uk - 16/11/051 Trip-t testing progress report modifications to test setup - hardware and software SiPM pulse height

Mark Raymond - [email protected] - 16/11/05 1

Trip-t testing

progress report modifications to test setup - hardware and software SiPM pulse height spectra linearity measurements discriminator measurements

Page 2: Mark Raymond - m.raymond@imperial.ac.uk - 16/11/051 Trip-t testing progress report modifications to test setup - hardware and software SiPM pulse height

Mark Raymond - [email protected] - 16/11/05 2

Test set-up

Trip-t

ProgrammableDigital PatternGenerator

~12 control linespreamp int./resetpipeline, multiplexer,programming

Qinj

ADC

Scope

LabVIEW

VMEck and trig.

level shiftdECL ->

2.5V CMOS

ADC now integrated intosystem – software writtento perform automatedlinearity measurements(using prog. attenuator)and get SiPM pulse heightspectra

prog.attenuator

Page 3: Mark Raymond - m.raymond@imperial.ac.uk - 16/11/051 Trip-t testing progress report modifications to test setup - hardware and software SiPM pulse height

Mark Raymond - [email protected] - 16/11/05 3

SiPM connection

connection method Vbias

1 M

50

thin coax

SiPMLED

trip-t

3p3

82p

short length (~15 cm) coax between SiPM and tript (at the moment)SiPM connected between core and coax sheath (core carries bias voltage)50 provides some kind of termination for the cablecharge split between two tript channels using different capacitor values to get high/low gain

would need to feed in smallcurrent here to tune Vbias for

individual SiPM’s

Page 4: Mark Raymond - m.raymond@imperial.ac.uk - 16/11/051 Trip-t testing progress report modifications to test setup - hardware and software SiPM pulse height

Mark Raymond - [email protected] - 16/11/05 4

SiPM/tript results

single p.e. spectra (200,000 events)

1500

1000

500

0

sign

al c

ount

s

10.0x103

9.59.08.5

ADC units

60x103

40

20

0

noise

counts

R1 (0509-023)39.0 V bias11/11/05

led noise only

Russian SiPM (CPTA – 600 pixels)

led pulsed (20 ns) duringpreamp integrate period(red distribution)

preamp integrate:reset ratio 350ns:50ns

get blue distribution when ledswitched off (~ 1 or 2 p.e.)

Page 5: Mark Raymond - m.raymond@imperial.ac.uk - 16/11/051 Trip-t testing progress report modifications to test setup - hardware and software SiPM pulse height

Mark Raymond - [email protected] - 16/11/05 5

SiPM/tript results – signal vs led pulse amplitude

600

500

400

300

200

100

0

coun

ts

11.0x103 10.510.09.59.08.5

ADC units

5000

4000

3000

2000

1000

0

coun

ts

11.0x103 10.510.09.59.08.5

ADC units

50004000300020001000

0

8600858085608540852085008480

expand

increasing led pulse amplitude high gainchannel

low gainchannel

limit ofhigh chan.

linear range(~ 2 pC inthis case)

led saturating?

single p.e.spectrumvisible

~ 25 pC

each distribution showsthe spectrum obtainedfor a fixed led pulseamplitude

Page 6: Mark Raymond - m.raymond@imperial.ac.uk - 16/11/051 Trip-t testing progress report modifications to test setup - hardware and software SiPM pulse height

Mark Raymond - [email protected] - 16/11/05 6

linearity studies

12.0x103

11.5

11.0

10.5

10.0

9.5

9.0

8.5

AD

C u

nits

2520151050

charge injected [pC]

~ linearrange

high gain channel

low gain channel

test charge injected viaprogrammable attenuator

different curves for differentvalues of tript discriminatorthreshold voltage Vth.

linearity not expected to bethat good for this version ofthe chip (see Fermilab tripttest docs.)

discontinuities occur wheresignal crosses Vth - could bedue to crosstalk on chip ortest board

needs further study – may need careful strategy tocalibrate out in system

~ 2 pC

discontinuities occur atdifferent points depending

on programmed disc.threshold setting

Page 7: Mark Raymond - m.raymond@imperial.ac.uk - 16/11/051 Trip-t testing progress report modifications to test setup - hardware and software SiPM pulse height

Mark Raymond - [email protected] - 16/11/05 7

discriminator timing studies – early result1

V /

div

.

5 ns / div.

charge injection edge

tript discriminator output

td

discriminators outputs constantly enabled so appear immediatelyat chip O/P when they fire

measure td (scope)for many triggersfor different signal sizes

note: td also includes fixed cable delays

Page 8: Mark Raymond - m.raymond@imperial.ac.uk - 16/11/051 Trip-t testing progress report modifications to test setup - hardware and software SiPM pulse height

Mark Raymond - [email protected] - 16/11/05 8

discriminator timing studies – early result

600

500

400

300

200

100

0

cou

nts

5045403530td [nsec.] 44

42

40

38

36

34

32

30

28

td [

nse

c]

6005004003002001000Qin [fC]

distributions show value of td (delay between charge injection edgeand disc. firing) for different values of charge, but for fixed value ofdiscriminator threshold setting

take distribution mean values andplot dependence on QinQin~100 fC

Qin~600 fC

points to note:charge injection edge also contributes here(~ 5 nsec => should deconvolve out)

actual disc. threshold value (~ 100 fC here)in our system will depend on: programmed Vth value programmed tript gain SiPM gain external gain ratio capacitors

=> many more careful and systematic measurements required here

this plot shows timewalkdependence on signal size

Page 9: Mark Raymond - m.raymond@imperial.ac.uk - 16/11/051 Trip-t testing progress report modifications to test setup - hardware and software SiPM pulse height

Mark Raymond - [email protected] - 16/11/05 9

summary

tript results with SiPM encouraging single p.e. spectra visible and charge splitting to get high/low gain channels works

linearity shows results consistent with previous chip measurements discontinuities occuring when discriminators fire need further study – try to reduce and/or understand how to manage in system

discriminator timing studies begun – more systematic study needed

our next priority investigate performance dependence on connection cable length between SiPM and tript look for degradation with cable length (noise, timing performance) – important to understand from detector design perspective (how far can front end boards be from SiPM’s) propose to try and do this with scintillator/wavelength shifting fibre -> SiPM system using cosmics and external scintillator trigger system to get reference timestamp to compare with SiPM/tript value

system currently under construction

Page 10: Mark Raymond - m.raymond@imperial.ac.uk - 16/11/051 Trip-t testing progress report modifications to test setup - hardware and software SiPM pulse height

Mark Raymond - [email protected] - 16/11/05 10

Photos

Trip-t (1st version)

charge injection splitbetween 2 adjacentchannels

2.5 V CMOScontrol lines

Page 11: Mark Raymond - m.raymond@imperial.ac.uk - 16/11/051 Trip-t testing progress report modifications to test setup - hardware and software SiPM pulse height

Mark Raymond - [email protected] - 16/11/05 11

Photos

Trip-t board

dECL -> 2.5 V CMOSlevel shift

digital pattern generatordECL outputs

ADC