65
33 rd Power Electronics Specialists Conference Matching Conducted EMI to International Standards F. S. Dos Reis, J. C. M. de Lima, V. M. F. S. Dos Reis, J. C. M. de Lima, V. M. Canalli, Canalli, J. A. Pomilio, J. Sebastián and J. Uceda J. A. Pomilio, J. Sebastián and J. Uceda

Matching Conducted EMI to International Standards

Embed Size (px)

DESCRIPTION

Matching Conducted EMI to International Standards. F. S. Dos Reis, J. C. M. de Lima, V. M. Canalli, J. A. Pomilio, J. Sebastián and J. Uceda. Table of Contents. ELECTROMAGNETIC COMPATIBILITY CONDUCTED EMI CONDUCTED EMI TEST SIMULATION FILTERING. INDUSTRIAL ENVIRONMENT. - PowerPoint PPT Presentation

Citation preview

Page 1: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Matching Conducted EMI to International Standards

Matching Conducted EMI to International Standards

F. S. Dos Reis, J. C. M. de Lima, V. M. Canalli, F. S. Dos Reis, J. C. M. de Lima, V. M. Canalli,

J. A. Pomilio, J. Sebastián and J. UcedaJ. A. Pomilio, J. Sebastián and J. Uceda

Page 2: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Table of Contents

ELECTROMAGNETIC COMPATIBILITYELECTROMAGNETIC COMPATIBILITY

CONDUCTED EMICONDUCTED EMI

CONDUCTED EMI TESTCONDUCTED EMI TEST

SIMULATIONSIMULATION

FILTERING FILTERING

Page 3: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

INDUSTRIAL INDUSTRIAL ENVIRONMENTENVIRONMENT

Page 4: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

COMMUNICATIONCOMMUNICATION ENVIRONMENTENVIRONMENT

Page 5: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

By Globalization´s By Globalization´s Highway...Highway...International Rules...International Rules...

ALCAALCA MERCOSULMERCOSUL European UnionEuropean Union

Page 6: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Consumers RequirementsConsumers Requirements No difference between domestic and No difference between domestic and commercial environment. commercial environment.

In the last years...Technologic AdvanceIn the last years...Technologic Advance

By Globalization´s By Globalization´s Highway...Highway...International Rules...International Rules...

Page 7: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

POWERLINEPOWERLINE

CAPACITORS VOLTAGECAPACITORS VOLTAGECCCC

DIODES INPUT CURRENTDIODES INPUT CURRENT

POWERLINE CURRENTPOWERLINE CURRENT

CC cccc

CC - CCCC - CC

CONVENTIONAL CONVENTIONAL INPUT RECTIFIERINPUT RECTIFIER

Page 8: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Date/Time run: 06/14/98 22:25:06

* C:\MSIM60\EXAMPLES\EXAMPLE\RETCAP.SCH

Temperature: 27.0

Date: June 14, 1998 Page 1 Time: 22:35:11

(L) C:\MSIM60\EXAMPLES\EXAMPLE\RETCAP.DAT

0s 10ms 20ms 30ms 40ms 50ms 60ms

Time

V(C1:2) -I(R2) V(D1:1,D4:2) -I(D2) I(D4)

800

400

0

-400

50 A

307 A

707 A

CAPACITIVE FILTER RECTIFIER

PURE RESISTIVE LOAD

CONVENTIONAL CONVENTIONAL INPUT RECTIFIERINPUT RECTIFIER

Page 9: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

To solve those problems it was created the PFPsTo solve those problems it was created the PFPsTo solve those problems it was created the PFPsTo solve those problems it was created the PFPs

Resistence Emulators.Resistence Emulators.

Power Factor Corrector Preregulator.Power Factor Corrector Preregulator.

Input Preregulator.Input Preregulator.

Power Factor Preregulator.Power Factor Preregulator.

Resistence Emulators.Resistence Emulators.

Power Factor Corrector Preregulator.Power Factor Corrector Preregulator.

Input Preregulator.Input Preregulator.

Power Factor Preregulator.Power Factor Preregulator.

Page 10: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Objective Main Terms and Definitions Motivation Main Regulations about EMC EMC Limits Conducted EMI Conducted EMI Assays Techniques to Reduce EMI Conclusion

INDEXINDEX

Page 11: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Means to determine, easily, the EMI levels, facing the following points:

Main Regulations; Conducted EMI; Conducted EMI Assays; EMI Minimization Techniques.

OBJECTIVESOBJECTIVES

Page 12: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

MOTIVATIONMOTIVATION

Power Quality:Power Quality:

Noise Spoils the Power Quality.Noise Spoils the Power Quality.

Page 13: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Examples of problems caused by EMI: Drill Intervening on TV; Electronic Ballast's makes the TV change the

channel. Switching Load noise in Radios.

Necessity of accordance with Regulations.

MOTIVATIONMOTIVATION

Page 14: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

TERMS AND TERMS AND DEFINITIONSDEFINITIONS

Eletromagnetic Compatibility - EMC:

• It´s the caracteristic presented by an equipment, or system, of operating, satisfactorily, in an electromagnetic environment without interfering or being interfered.

Page 15: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Electromagnetic Interference – EMIElectromagnetic Interference – EMIIt´s the spoiling on the performance of na It´s the spoiling on the performance of na

equipment or system, caused by a equipment or system, caused by a electromagnetic disturb. electromagnetic disturb.

TERMS AND TERMS AND DEFINITIONSDEFINITIONS

Page 16: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

IEC - International Electrotechnique Comission Comissão Eletrotécnica Internacional.

CISPR - International Special Committee on Radio Interference publication.

CENELEC - European committee to Electrotechinique Regulations

TERMS AND TERMS AND DEFINITIONSDEFINITIONS

Page 17: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

ELECTROMAGNETIC COMPATIBILITY

EMISSION SUSCEPTIBILITY

CONDUZIDA IRRADIATED CONDUCTED IRRADIATED

ELECTROSTATIC

HARMONICSPOWER

FLUTUATION RADIO-INTERFERENCE

Basic Categories Basic Categories for EMCfor EMC

Page 18: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

CISPR 14 Engine operating equipment´s

CISPR 16Disturbs and Immunity Methods and Measuring

Equipment´s

MAIN MAIN REGULATIONSREGULATIONS

Page 19: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Immunity Limit

Nível de compatibilidade

Immunity Edge

Independent Variable

Disturbs Level

Emission LimitEmission Edge

Immunity Edge

EMC LIMITSEMC LIMITS

Page 20: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

VDE 0871VDE 0871100

90

80

70

60

50

40

300.01 0.15 0.5 1 10 30

60

48

91

79

69.5

57.5

66

54

MHz

A and C Class

Limit Values

Class B

Limit Values

dBµV

REGULATION REGULATION LIMITSLIMITS

Page 21: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

It's the electromagnetic interference that propagates by power reliefs.

This kind of interference can be:Differential Mode (DM)Commum Mode (CM)

CONDUCTED CONDUCTED EMIEMI

Page 22: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

EquipmentEquipment

ZZ redred

FF

NN

ii CMDCMD

CONDUCTED CONDUCTED EMI IN DMEMI IN DM

Page 23: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

EquipmentEquipment

ZZ redred

FF

NN

iiCMCCMC

CONDUCTED CONDUCTED EMI IN CM?EMI IN CM?

Page 24: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Interference MeasurerEMI Receptor

10 kHz to 30 MHzAccording to VDE 0871

450 kHz a 30 MHzAccording to FCC 15

Telescopic AntennaLoop Antenna

Dipole Antenna

30 to 1000 MHz

Interferencesupply

According to VDE 0871 e FCC

10 kHz to 30 MHzAccording to VDE 0871

Not Required by VDE

Einter..

Hinter..

Pinter..

Uinter..

Iinter...

LISN

CONDUCTED CONDUCTED EMI IN DMEMI IN DM

Line Impedance Stabilization Network

Page 25: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Bigger Diameter = 2 X

E U T Antenna

Smaller Diameter = 3 X

X

Open Field Open Field OATSOATS

Page 26: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Plano de Tierra

Equipo Bajo Prueba Antena4 m

1 m

3 m10 m30 m

1 m

EMIReceptor

100 m

IRRADIATED EMI IRRADIATED EMI MEASURING MEASURING PROCEEDINGSPROCEEDINGS

Page 27: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Few able laboratories;

High cost of the assays;

Very expensive equipment;

Technique capacitation;

Regulations Interpretation;

ASSAYS ASSAYS DIFICULTIESDIFICULTIES

Page 28: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

EquipmentEquipment

Under AssayUnder Assay

FF

NN

LISN

Measuring Measuring

InstrumentInstrument

CONDUCTED EMI CONDUCTED EMI ASSAYSASSAYS

Page 29: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Condutive Surface Connected to GndCondutive Surface Connected to Gnd

Under Assay EquipmentUnder Assay Equipment

LISNLISN

EMI ReceptorEMI Receptor

80 cm80 cm8080

cmcm

4040cmcm

Available equipment´s under assay and measuring instruments

CONDUCTED EMI CONDUCTED EMI ASSAYSASSAYS

Page 30: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Condutive Surface Connected to GndCondutive Surface Connected to Gnd

Under Assay EquipmentUnder Assay Equipment

LISNLISN

EMI ReceptorEMI Receptor

80 cm80 cm8080

cmcm

4040cmcm

Frequency (MHz)Frequency (MHz)

Imp

edan

ce

Imp

edan

ce

± 20 % Maximum Tolerance± 20 % Maximum Tolerance

kHz

10

10000

5,4

50

20

80

150

300

800

7,3

21

33

43

49

ARTIFICIAL ARTIFICIAL

NETWORKNETWORKFre. Imp.

50µH

50

5

LISN LISN CHARACTERISTICSCHARACTERISTICS

CISPR 16

Page 31: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Receptor EMI

2 µF 39 k7.5 µF

5 1 k

.22 µF

Red

250 µH 50 µH E U T

E U T

F

T

N

2 µF 39 k7.5 µF

5 1 k

.22 µF250 µH 50 µH

50

COMERCIAL LISN COMERCIAL LISN

Page 32: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

VDE 0871VDE 0871

100

90

80

70

60

50

40

300.01 0.15 0.5 1 10 30

60

48

91

79

69.5

57.5

66

54

MHz

A and C Class

Limit Values

Class B

Limit Values

dBµV

Page 33: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

If we realize that the equipment If we realize that the equipment doesn’t follow the specification of doesn’t follow the specification of

a determined regulation...a determined regulation...

Page 34: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Preventives: Preventives:

Adjusted Control Methods (Tanaka, Adjusted Control Methods (Tanaka,

Wang, Albach, Lin, Willers, Simonetti)Wang, Albach, Lin, Willers, Simonetti)Adjusted Topology (DosReis) Adjusted Topology (DosReis) Adjusted Assembling Techniques Adjusted Assembling Techniques

HOW TO MINIMIZE HOW TO MINIMIZE THE EMI?THE EMI?

Page 35: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

CorrectivesCorrectives::

Applying shielding.Applying shielding.

Using Filter.Using Filter.

HOW TO MINIMIZE HOW TO MINIMIZE THE EMI?THE EMI?

Page 36: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

NETWORK FILTER NETWORK FILTER EMIEMI

Page 37: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Making Compatible Conducted Making Compatible Conducted EMI Generated for Power Factor EMI Generated for Power Factor

Preregulators with the Preregulators with the International Regulation International Regulation

Making Compatible Conducted Making Compatible Conducted EMI Generated for Power Factor EMI Generated for Power Factor

Preregulators with the Preregulators with the International Regulation International Regulation

Page 38: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Input Current.Input Current.

LISNLISN

EMI Receptor.EMI Receptor.

Input Current.Input Current.

LISNLISN

EMI Receptor.EMI Receptor.

Quantify EMIQuantify EMI

SOLUTIONS SOLUTIONS AVAILABLE AVAILABLE CURRENTLYCURRENTLY

Page 39: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Quantify EMI ( abacuses ).Quantify EMI ( abacuses ).

Minimize EMI ( FM and filter).Minimize EMI ( FM and filter).

Quantify EMI ( abacuses ).Quantify EMI ( abacuses ).

Minimize EMI ( FM and filter).Minimize EMI ( FM and filter).

Objectives Objectives

$

Page 40: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Why the Variable Why the Variable Frequency Techniques Frequency Techniques

reduce EMI?reduce EMI?

Why the Variable Why the Variable Frequency Techniques Frequency Techniques

reduce EMI?reduce EMI?

Page 41: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Given an usual Input Current Given an usual Input Current Harmonic Spectrum Harmonic Spectrum f. Constant. f. Constant.

Given an usual Input Current Given an usual Input Current Harmonic Spectrum Harmonic Spectrum f. Constant. f. Constant.

10 1000 kHz

Page 42: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

10 1000 kHz

Given an usual Input Current Given an usual Input Current Harmonic Spectrum Harmonic Spectrum f. Variable. f. Variable.

Given an usual Input Current Given an usual Input Current Harmonic Spectrum Harmonic Spectrum f. Variable. f. Variable.

Page 43: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

FM FM x x F constantF constantFM FM x x F constantF constant

dB

µV

FM

d var.

Frecuencia de operación del convertidor (MHz)

Page 44: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

I I (t)(t)

ggintint

U (t)U (t)intint

LL

RR

RR

11

22

++

--

U (t)U (t)intint

RR

RR

1D1D

2D2D

++

--

DD

U (t)U (t)CDCD

++

--

CCDD U (t)U (t)DD RR2w2w

++

--

DD

U (t)U (t)

++

--

wwCCww

RR1w1w

LISNLISN

DemodulatorDemodulator Quase-Peak MeasurerQuase-Peak Measurer

FilterFilter

MEASURING MEASURING SYSTEMSYSTEM

Page 45: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Frecuencia

10 a 150 kHz .15 a 30 MHz 30 a 1000 MHz

Ancho de Banda 200 Hz 9 kHz 120 kHzConstante de tiempo decarga.

45 ms 1 ms 1 ms

Constante de tiempo dedescarga.

500 ms 160 ms 550 ms

Constante de tiempomecánica

160 ms 160 ms 100 ms

EMI RECEPTOR EMI RECEPTOR CHARACTERISTICCHARACTERISTIC

Page 46: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

vvee

++

--

++

vvgg

CC cccc

++

--

VV

DDiigg

--

LL

1 :n1 :nTT

QQ

iidd

RRi ( t)i ( t)gg

tt

PFP WITH BUCK-PFP WITH BUCK-BOOST CONVERTERBOOST CONVERTER

Page 47: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

vvee

++

--

++

vvgg

CCcccc

LL++

--

RR

DD

iigg

--

LL

1 :n1 :nTT

QQ

CC

iidd

11

22

VV

i ( t)i ( t)gg

tt

PFP WITH ZETA PFP WITH ZETA CONVERTERCONVERTER

Page 48: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

vvee

++

--

++

--

vvgg

++

--

CCcccc VV

iigg

LL DD

iidd

RRiigg meme

dd

( t)( t)iigg ( t)( t)

tt

PFP WITH BOOST PFP WITH BOOST CONVERTERCONVERTER

Page 49: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

vvee

++

--

++

vvgg CC

LL

++

--

VV

DDiigg

--

LL

1 :n1 :nTT

QQ

CC

22

11

iidd

cccc

RRi ( t)i ( t)gg

ggi ( t)i ( t)

medmed

tt

PFP WITH SEPIC PFP WITH SEPIC CONVERTERCONVERTER

Page 50: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

dBdB

µVµV

Frecuencia de operación del convertidor (MHz)Frecuencia de operación del convertidor (MHz)Frecuencia de operación del convertidor (MHz)Frecuencia de operación del convertidor (MHz)

EMI FILTER EFFECTEMI FILTER EFFECT

Page 51: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

dBdB

µVµV

Frecuencia de operación del convertidor (MHz)Frecuencia de operación del convertidor (MHz)Frecuencia de operación del convertidor (MHz)Frecuencia de operación del convertidor (MHz)

EMI RECEPTOR’S EMI RECEPTOR’S TIPICAL TIPICAL REPRESENTATIONREPRESENTATION

Page 52: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

dBdB

µVµV

Frecuencia de operación del convertidor (MHz)Frecuencia de operación del convertidor (MHz)Frecuencia de operación del convertidor (MHz)Frecuencia de operación del convertidor (MHz)

EMI RECEPTOR’S EMI RECEPTOR’S TIPICAL TIPICAL REPRESENTATIONREPRESENTATION

Page 53: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

M = 1,23

M = 1,62

M = 2,01

M = 2,39

M = 2,78

M = 3,16

dB

µV

Frecuencia de operación del convertidor (MHz)

M’ = ____V output____ n V input

M’ = ____V output____ n V input

GENERAL ABACUSGENERAL ABACUS

Page 54: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

How to correlate the How to correlate the results of abacus with results of abacus with

a real case?a real case?

How to correlate the How to correlate the results of abacus with results of abacus with

a real case?a real case?

High Frequency

Page 55: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

U (dB/U (dB/V) = 20 log P V + U (dB/V) = 20 log P V + U (dB/V)V)

refref

nomnom

g nomg nom

refref

P VP Vnomnomg refg ref

USING GAIN USING GAIN EQUATIONS EQUATIONS

Page 56: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

M = 1,23

M = 1,62

M = 2,01

M = 2,39

M = 2,78

M = 3,16

dB

µV

Frecuencia de operación del convertidor (MHz)

U (dB/U (dB/V) = 20 log P V + U (dB/V) = 20 log P V + U (dB/V)V)

refref

nomnom

g nomg nom

refref

P VP Vnomnomg refg ref

Page 57: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Why you can use those equationsWhy you can use those equationsWhy you can use those equationsWhy you can use those equations

LISNLISN PFPPFP

P nom.

P ref

P nom.

P ref

Alta freqüência

Page 58: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

M = 1,23M = 1,23

M = 1,62M = 1,62

M = 2,01M = 2,01

M = 2,39M = 2,39

M = 2,78M = 2,78

M = 3,16M = 3,16

dBdB

µVµV

Frecuencia de operación del convertidor (MHz)Frecuencia de operación del convertidor (MHz)

FM BOOST FM BOOST

Page 59: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

PROTOTYPES PROTOTYPES

Page 60: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

Conversor Elevador em FMConversor Elevador em FMConversor Elevador em FMConversor Elevador em FM

dB

µV

Frecuencia de operación del convertidor (MHz)

Experimental Result

FM BOOST FM BOOST

Page 61: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

dB

µV

Frecuencia de operación del convertidor (MHz)

Experimental Result

FM BUCK-BOOST FM BUCK-BOOST

Page 62: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

L C

RC

f 2

1

d

Converter sideLine side

EMI FILTER DESIGN EMI FILTER DESIGN CONSIDERATIONS CONSIDERATIONS

Page 63: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

2

1

10 AAx

cf

f

21

24

1

cf

fCL

2C

LR fd

L C

RC

f 2

1

d

Converter sideLine side

FM BUCK-BOOST FM BUCK-BOOST

Page 64: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

DESIGN EXAMPLE DESIGN EXAMPLE

Page 65: Matching Conducted EMI to International Standards

33 rd Power Electronics Specialists Conference

The Experimental Results validate the method.

Small discrepancies, between the theoretical and practical values, have been observed.

The Inductors size practically doesn't change.

The Experimental Results validate the method.

Small discrepancies, between the theoretical and practical values, have been observed.

The Inductors size practically doesn't change.

CONCLUSIONCONCLUSION