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Development of High Performance Avalanche Photodiodes and Dedicated Analog Systems for HXI/SGD Detectors onboard the Astro-H mission. - PowerPoint PPT Presentation
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HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011
Development of High Performance Avalanche Photodiodes and Dedicated Analog Systems for HXI/SGD Detectors
onboard the Astro-H mission
T.Saito, M.Yoshino, H.Mizoma, T.Nakamori, J.Kataoka (Waseda U.), M.Ohno, K.Goto, Y.Hanabata, H.Takahashi, Y.Fukazawa (Hiroshima U.), M.Sasano, S.Torii,
H.Uchiyama, K.Nakazawa, K.Makishima (U.Tokyo), S.Watanabe, M.Kokubun, T.Takahashi, K. Mori (ISAS/JAXA), H.Tajima (Nagoya U.) and Astro-H HXI/SGD team
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011
Outline
2
1. Introduction2. Development of APD3. Development of analog systems
4. Summary
-CSA for Astro-H-Analog amplifier-Whole system performance
BGO
APDCSA
ADC
Analog amplifierDigital filter
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011
Astro-H Instruments
Astro-H is the 6th satellite of Japanese X-ray observatory series
HXI/SGD detectors employ BGO active shields
3
to be launched in 2014 with the H-IIA rocket wide band observation : 0.3 – 600 keV(four instruments)
we are developing readout sensor (APD) and dedicated analog system for BGO active shields.
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011
BGO Active Shield
4
BGOAPD
reduce backgrounds by anti-coincidence technique
The main detector is surrounded by BGO scintillatorsAvalanche Photodiodes (APD) readout
generating active veto signals to reject cosmic-ray particles and gamma-ray backgrounds
BGO
HXI
Main camera
depth
depth
Electric field
Gain
photon
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011 5
BGO
APDCSA
ADC
Analog amplifierDigital filter
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011
- Thermal test (silicone or epoxy resin for APD window)- Radiation tolerance test (60Co, the total dose : 10krad)- pre-FM APD acceptance test (evaluate 20 pre-FM APD)
APD for Astro-H
6
Development of pre-Flight Model (pre-FM) APD
Screening test EM shield
- Window material : silicone resin- Active area : 10 x 10 mm2
- Capacitance : ~ 400 pF (gain : 50, inc. dedicated cables)- Dark current : < 0.4 nA (gain : 50 @ - 15 deg)
Flight Model APD screening test ( ~ Apr, 2012)
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011
Elapsed time [hour]
Tem
pera
ture
[deg
]
1h dwell
1h dwell
20 deg/h
1 cycle (10h)
Thermal test
7
silicone or epoxy resin for APD window severe temperature environment just after the launch
thermal cycle test
silicone
epoxy
The number of the CycleRela
tive
light
inte
nsity
[%]
14% Down
50% Down
APD and BGO come unglued? couple each APD with BGO using a space grade silicone adhesive
We selected the silicone resin for the APD window
Comparison of pulse heights
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011
Radiation tolerance test
8
-1 -0.8
-0.6
-0.4
-0.2
0 0.2 0.4 0.6 0.8 1 次の級
05
10152025303540
The
num
ber o
f APD
Difference between Vb [V]
Difference between Vb before and after irradiation
Breakdown voltage Vb did not substantially decrease
60Co irradiation (total dose : 10 krad, ~ 1krad/year)
Although Id increase 6 times, test pulse width increase only 3 keV!
Breakdown voltage Vb decrease? Deteriorate Id and noise performance?
Total dose [krad]
Dark current[nA]
Test pulse width[keV] (FWHM)
0 0.3 10.6
10 1.9 13.2
Performance before and after irradiation
Because capacitive noise is dominant @ -15deg
Test pulse width evaluated by BGO (1x1x1 cm3) + pre-FM APD
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011
-20 -15 -10385
390
395
400
405 pre-FM1pre-FM2pre-FM3pre-FM4pre-FM5pre-FM6pre-FM7pre-FM8pre-FM9pre-FM10pre-FM11pre-FM12pre-FM13pre-FM14pre-FM15pre-FM16pre-FM17pre-FM18pre-FM19pre-FM20-20 -15 -10
0.10
0.35
0.60
0.85
1.10
-20 -15 -100.1
0.3
0.5
0.7
Different changes
pre-FM APD acceptance test
9
Establish how to screen FM APD dark current Id and operation voltage Vr at gain 50 evaluate 20 pre-FM APDs at three temperatures around – 15 degree
Temperature [deg]
Dar
k c
urre
nt I d [
nA]
Temperature [deg]
Ope
ratio
n vo
ltage
Vr (
gain
: 50
) [V]
Bad (>0.4 nA)
high Vr
We will do FM APD screening test in a similar way
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011
APD Dark current
10
Constitution of APD dark current Id
Id = Ids + M * Idb Ids : surface current Idb : bulk current
Leakage path of surface current
Bulk currentpn
π
nTemperature
Curr
ent
Id
Ids
M * Idb
source
① Ratio between Ids and Idb is possibly different② At in-orbit temperature Idb is dominant because of avalanche gain③ If APD has higher Idb, this APD show different Id changes
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011 11
BGO
APDCSA
ADC
Analog amplifierDigital filter
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011
CSA for Astro-H
12
APD capacitance including cables is ~ 400 pF. Capacitive noise is dominant @ - 15deg.
DIP type hybrid IC
CAN type hybrid ICCSA-Hybrid IC evaluation circuit
Charge sensitive amplifier (CSA) specialized for Astro-H
(FM type)
Astro-H CSA need good noise performance
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011
Performance of CSA
13
shaper
Test pulse
CSA
Detector capacitance0 ~ 1000
pF
APD + cablescapacitance
2000 eV
9.8 eV/pF
400 pF (APD + cables) testpulse width : 6 keV (FWHM, Si 60keV)
8x8x4 cm3 BGO testpulse width : 21.7 keV (FWHM)
Noise performance
Convert into active shield performance
Detector capacitance [pF]
Test
puls
e w
idth
[eV
(FW
HM
, Si 6
0keV
)]
Evaluation of CSA assuming APD capacitance ~ 400 pF
good capacitive gradient : 9.8 eV/pF
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011 14
BGO
APDCSA
ADC
Analog amplifierDigital filter
single-stage differential and integrating circuit
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011 15
Analog amplifierOptimize the best “integrating time constants”
Test
puls
e w
idth
[keV
(FW
HM
, BG
O 6
62ke
V)]
Integration time constant [us]
\ coun
t
ADC channel [ch]
Testpulse137Cs
“the expended time of output veto signal to the main detector” < 5ms
peaking time adjusted by differential filter (τ > 1.3 ms)
Without differential filter
employ integrating time constants 1.0 – 1.2 ms
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011 16
BGO
APDCSA
ADC
Digital filterAnalog amplifier
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011
0.9 1 1.1 1.2 1.319
22
25
28
1.0us
1.1us
1.2us
1.0us
1.1us
1.2us
CP4417(1us)
ORTEC570(1us)
Whole system performance
17
Performance of active shield system circuit
digital filter : Ohno, M. et al. (2011) HSTD-8
Test
puls
e w
idth
[keV
(FW
HM
, BG
O 6
62ke
V)]
Integrating time constant [us]
Filled marker using analog & digital filter
better than ready-made analog shaper (ORTEC570 & CP4417)
Ready-made shaper
using integrating time constants 1.0 – 1.2 ms
better
1.0 ms (only analog)1.1 ms (only analog)1.2 ms (only analog)1.0 ms (analog & digital)1.1 ms (analog & digital)1.2 ms (analog & digital)CP4417(1.0 ms)ORTEC570(1.0 ms)
Analog & digital filter
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011
Summary
18
APD Thermal test employ silicone resin for APD window Radiation tolerance test passed (60Co 10 krad) pre-FM APD acceptance test establish how to screen FM APD
CSA good capacitive gradient : 9.8 eV/pF 400 pF (APD + cables) testpulth width : 6 keV (FWHM, Si 60keV)
Analog amplifier employ integrating time constants 1.0 – 1.2 ms
Whole system performance achieve a good noise performance (better than ready-made analog shaper)
Future works large pulse response test (proton, Fe), end-to-end test
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011
: time constant
22222 42352 indbnoise . CMkTRIFMIq sds
Analog noise
20
total noise of analog circuit
Capacitive noiseDark current noise : surface currentdsI : bulk currentdbI
: gain of APDM : capacitance of APDinC
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011
-20 -15 -10 -5 0 5 10 15 20 251E-01
1E+00
1E+01
1E+02
pFM4
pFM16
pFM17
pFM19
pFM20
Dark current(-20 ~ +25 deg)
21
-20 -15 -10 -5 0 5 10 15 20 251E-01
1E+00
1E+01
1E+02pFM1
pFM2
pFM3
pFM4
pFM5
pFM6
pFM7
pFM8
pFM9
pFM10
pFM11
pFM12
pFM13
pFM14
pFM15
pFM16
pFM17
pFM18
pFM19
pFM20
Dar
k c
urre
nt [n
A]
Temperature [deg]
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011
CSA Performance inc. Ref.
22
shaper
Test pulse
CSA
Detector capacitance0 ~ 1000
pF
APD + cablescapacitance
2000 eV
9.8 eV/pF
400 pF (APD + cables) testpulse width : 6 keV (FWHM, Si 60keV)
8x8x4 cm3 BGO testpulse width : 21.7 keV (FWHM)
Noise performance
Convert into active shield performance
Detector capacitance [pF]
Test
puls
e w
idth
[eV
(FW
HM
, Si 6
0keV
)]
Evaluation of CSA assuming APD capacitance ~ 400 pF
- : Astro-H CSA- : Reference
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011 23
APMU analog BBM board
Analog amp. board
APMU analog BBM board
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011 24
時定数 [us] R1[kΩ] R2[kΩ] R3[kΩ] C1[pF] Gain(R2 / R1) offset[V]
1.0 5.1 10 2 100 1.96 0.9
1.1 5.6 11 2 100 1.96 0.9
1.2 5.1 10 2 120 1.96 0.9
1.32 5.6 11 2 120 1.96 0.9
1.5 5.1 10 2 150 1.96 0.9
1.6 5.6 11 2 150 1.96 0.9
1.8 5.1 10 2 180 1.96 0.9
1.98 5.6 11 2 180 1.96 0.9
R1
R2
R3
C1
VR3k.
R3offset 5
19
5V
Parameter
No using differential filter
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011
0.5 1 1.5 270
80
90
100
110
120
130
140
884,analog
typeB,analog
884, 調整ボード
typeB, 調整ボード
Integrating time constant [us]
Te
stp
uls
e w
idth
(3
×F
WH
M)[
ke
V]
25
* testpulse width (3xFWHM, BGO 662keV)
typeB
8×8×4
Without differential filter
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011
twin-T filter
26
twin-T filter for the better analog filter performance equivalent nine-stage integrating circuit
twin-T filter must use a differential filter for peaking time < 5ms
C
noise performance is shown in the next slide
C R4R3R4
5
C21
HSTD-8, Academia Sinica, Taipei Taiwan, 8th December, 2011
0.9 1 1.1 1.2 1.319
21
23
25
271.0us1.1us1.2ustwin-T filter1.0us1.1us1.2ustwin-T filterCP4417(1us)ORTEC570(1us)
Performance inc. twin-T
27
Performance of active shield system circuit
digital filter : Ohno, M. et al. HSTD-8
Test
puls
e w
idth
[keV
(FW
HM
, BG
O 6
62ke
V)]
Integrating time constant [us]
Filled marker using digital filter
better than commercial analog shaper(ORTEC570 & CP4417)
Commercial shaper
Twin-T
using integrating time constants 1.0 – 1.2 ms
better