October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 1 Quality Assurance Test Stand University of Rochester oQTC at Rochester,

October 7, 2003US Silicon Tracker group

Sergey Korjenevski University of Rochester

1

Quality Assurance Test Stand University of Rochester

o QTC at Rochester, NY • What’s new compared to KSU

Vacuum Base Chuck Positioner Extra switch to decouple guard box

o Test crosscheck• 5 Test Structures

Tested by Vienna, Karlsruhe QTC• 2 OB2 sensors

Tested by Perugia QTC

o Handling the results • Data Base

o Conclusion, plans



2

Setup is completed

Hardware is in place and operational.

Software is working as well, - test results are consistent with other testing centers (more details later).

Clean room is to be completed by 20th of October.



3

Personnel

• Regina Demina (585) 275-7357• Thomas Ferbel (585) 275-4396• Elizabeth A. Groves (585) 275-

4001• Sergey Korjenevski (585) 275-8550• David R. Martell (585) 275-5938 • Daniel Schwaab (585) 275-4394



4

List of the Equipment

• Probe Station Alessi REL-6142 8 in. guarded chuck, Semi-Auto

• Microscope Mitutoyo 2x 10x 20x, 10x• Vacuum base positioners with 4 coax probes• Needles diameter 5 m• LCR HP 4284A• V-source/Ammeter Keithley 237 and Keithley

487• Switching Matrix Agilent 34970A with two 8x4

switch 34904A• Vibration-free table Kinetics 1201• Custom made dark box



5

New Features

• Solid stable location of the

chuck positioner.

• Significant to ensure safety and

helps to minimize noise



6

New Features

• New switch is added to discharge

decoupling capacitors.

• Significant to ensure safety and helps to minimize

noise.



7

Cross Check, - Full strip tests

• Two OB2 sensors, ST, tested by Perugia– 30210420275924– 30210414739923

• 5 Test Structures, HPK – 60548-050 from Karlsruhe– 60548-051 from Karlsruhe– 60549-055 from Vienna – 60550-065 from Vienna – 60551-087 from Vienna



8

IV Test St 60548-050

0

2

4

6

8

10

12

14

16

18

0 100 200 300 400 500 600

Volt

Cu

rre

nt,

nA

URKRLS

IV Test



9

IV TestIV TestSt 60550-065

0

2

4

6

8

10

12

0 100 200 300 400 500 600

Volt

Cu

rre

nt,

nA

Rochester

Vienna



10

1/ C 2̂, ST 30210414739923

0

0.00000005

0.0000001

0.00000015

0.0000002

0.00000025

0.0000003

0.00000035

0.0000004

0.00000045

0 50 100 150 200 250 300 350 400Volt

UofR

Perugia

UofR 10-03

Vdepl=150V

CV Test



11

CV Test1/C^2 Test St 60548-050

0

0.000005

0.00001

0.000015

0.00002

0.000025

0.00003

0.000035

0.00004

0 50 100 150 200 250 300 350

URKRLS



12

Strip tests - LeakageStrip Leakage, Test St 60548-050

0

0.05

0.1

0.15

0.2

0.25

0.3

0.35

0.4

0 20 40 60 80 100 120 140Strip #

Cu

rre

nt,

nA

URKRLS



13

Strip tests - LeakageStrip Leakage, Test St 605551-087

0

0.02

0.04

0.06

0.08

0.1

0.12

0 20 40 60 80 100 120 140

Strip #

Cu

rren

t, n

A

viennaRochester



14

Rpoly, Test Structure 60548-050

1.9

1.91

1.92

1.93

1.94

1.95

1.96

0 20 40 60 80 100 120 140

UR

KRLS

Strip tests - Rpoly



15

Strip tests - RpolyRpoly, ST 30210414739923

1.16

1.18

1.2

1.22

1.24

1.26

1.28

1.3

1.32

1.34

0 100 200 300 400 500 600

Strip #

R, M

Oh

m

Perigua

UofR



16

Coupling AC, ST 30210414739923

400

420

440

460

480

500

520

540

560

580

600

0 100 200 300 400 500 600

Strip #

C, p

F UofRPerugia

Strip tests - Cac at 100Hz



17

Strip tests - Cac at 100HzCoupling AC, Test St 60548-050

93

94

95

96

97

98

99

0 20 40 60 80 100 120 140

Strip #

C, p

F KRLSUR



18

Strip tests - IdielPinhole Test, ST 30210414739923

0

1

2

3

4

5

6

7

8

9

10

0 100 200 300 400 500 600

Strip #

Cu

rre

nt,

nA

PerugiaUofR



19

Strip tests - IdielPinhole Test, ST 30210414739923

0

0.02

0.04

0.06

0.08

0.1

0.12

0.14

0.16

0.18

0.2

0 100 200 300 400 500 600

Strip #

Cu

rre

nt,

nA

Perugia

UofR



20

Data Base

• We were not able to simulate data handling with fictitious names though we believe our .xml format is correct. The problem may disappear as we proceed with real actions.

• Error: – “DB: ERROR: fatal error: 0RA-02291: integrity constraint (CMSTRKDB.REF_INPUT14)

violated – parent key not found– ORA-06512: at “CMSTRKDB.STORED_FUNCTIONS”, line 788– ORA-06512: at line 1

– …error goes on to list the text in the file. It is not just IV_TEST in particular. If this test is deleted and it goes straight to CV, the problem basically is repeated.



21

Conclusions and Plans•QTC at University of Rochester complies with CMS requirements to test Si detectors.

•Rate of the testing is estimated to be 2 OB2 sensors per day.

• Data Base remains an issue. The problem may disappear if everything is done in proper order using appropriate bar codes and all.

Documents

October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 1 Quality Assurance Test Stand University of Rochester oQTC at Rochester,