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Electronic Packaging Lab. of NTHUElectronic Packaging Lab. of NTHU國立清華大學動機系電子構裝實驗室
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Parametric Analysis of TEBGA Reliability Using a Finite-Volume-Weighted Averaging Technique
Hsien-Chie ChengComputational Solid Mechanics Laboratory
National Center for High-Performance Computing
Kuo-Ning ChiangPower Mechanical Engineering
National Tsing Hua University
Chao-Kuang ChenComputational Solid Mechanics Laboratory
National Center for High-Performance Computing
Electronic Packaging Lab. of NTHUElectronic Packaging Lab. of NTHU國立清華大學動機系電子構裝實驗室
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Outline
IntroductionModeling The Finite-Volume-Weighted Averaging TechniqueParametric Design of The TEBGA ReliabilityConclusions
Electronic Packaging Lab. of NTHUElectronic Packaging Lab. of NTHU國立清華大學動機系電子構裝實驗室
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Introduction
BGA: PBGA, CBGA, TBGA, CCGA PBGA over CBGA:
Lower cost of substrate Smaller global CTE mismatch from PCBLower profile
Conventional Over Molded PBGA Packages Experience:Excessive moisture sensitivity of substratePoor thermal performance of over molded compound
TEBGA Provides:The enhanced thermal performance over PBGARelatively cost-effective over CBGA
With Solder Joint Reliability(SJR) in Concern:Similar to PBGA, potential SJR problems still occur in TEBGA.
Electronic Packaging Lab. of NTHUElectronic Packaging Lab. of NTHU國立清華大學動機系電子構裝實驗室
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Introduction (Cont.)
Many Studies on C-up PBGA Reliability:Paydar et. al., 1994; Pan, 1994; Hong, 1997; Jung et. al,1997;Winter and Wallach, 1997; Lau and Pao, 1997, etc.
Few Investigations on C-down TEBGA: Pao et. al, 1998; Lee and Lau, 1998, etc.Most focus on the prediction of SJR.SJR is function of many parameters.Appropriate combinations of these parameters can signigicantly enhance SJR.
Two Techniques for this Purpose:Design of Optimization (DO) or Design of Experiment (Box, 1978)
Require tremendous, time-comsuming trialsParametric FEA (Yeh et. al, 1996)
More cost-effectiveReflect the effect of each parameter on the problem in concern
Electronic Packaging Lab. of NTHUElectronic Packaging Lab. of NTHU國立清華大學動機系電子構裝實驗室
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Introduction (Cont.)
Characterization of Strain/Stress Concentration Field is Critical.Fatigue life Stress/Strain InformationStress/Strain Information Mesh Desnsity
(Due to material and geometry singuarities)
Techniques:Explicit geometry representation (Fillet)
High mesh densityMaterial-nonlinear modeling
Work only for Stress Concentration ProblemAveraging Technique (Clark and Mcgregor, 1993; Akay et.al., 1997)
Considerably conservative result is obtained due to the whole domain area is averaged
Electronic Packaging Lab. of NTHUElectronic Packaging Lab. of NTHU國立清華大學動機系電子構裝實驗室
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Purposes
An Improved Averaging Technique: Finite-Volume-Weighted Averaging Technique
Instead of averaging the response within the whole domain, the structural response is averaged in a finite zoneDetermine the dimension of the finite zone using an engineering emprirical approach
Design Parametric Finite Element AnalysisDesign parameters:
Geomertry/Thickness : Die/PCB/Die Attach/Heat Spreader/BT SubstrateGeometry/Size : DieMaterial/Young’s Modulus : FR-4/BT/Die AttachMaterial/CTE : BT/FR-4
Electronic Packaging Lab. of NTHUElectronic Packaging Lab. of NTHU國立清華大學動機系電子構裝實驗室
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
PBGA and Thermal Enhanced BGAPBGA and Thermal Enhanced BGA
Heat spreader Die attachDieBT
Solder MaskSolder BallEncapsulant
Copper Ring
.
Electronic Packaging Lab. of NTHUElectronic Packaging Lab. of NTHU國立清華大學動機系電子構裝實驗室
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
256-Pin TEBGA and Modeling
Heat Spreader
PCB
Table: TEBGA Geometry Data
Table: TEBGA Material Property
Co0Co0
Electronic Packaging Lab. of NTHUElectronic Packaging Lab. of NTHU國立清華大學動機系電子構裝實驗室
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
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Electronic Packaging/CAE Labs
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Electronic Packaging/CAE Labs
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Solder Joint Material Property
Temperature-dependent (Plasticity)Time-dependent (Creep)Garfolo Hyperbolic Sine Law
RTH
BA ncp exp)(sinh
etemperatur absolute The T(J/mol/k) 8.31 : constant gas The R
(J/mol) 52961 :energy n Activatio Hstress Equivalent
3 exponent Stress nPa)0.0805(1/M B
c)147.9(1/se Arate strain creep equivalent uniaxial The
:
cp
20 oC
100 oC
0.0100.0080.0060.0040.0020.0000.0
10.0
20.0
30.0
Strain
Stre
ss (
MP
a)
Electronic Packaging Lab. of NTHUElectronic Packaging Lab. of NTHU國立清華大學動機系電子構裝實驗室
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Electronic Packaging/CAE Labs
National Tsing Hua University
Fatigue Life Prediction
An Empirical Coffin-Manson Relationship
)/1(
22
1c
f
IE
fN
0.5- : exponent ductility fatigue The c0.325 : coeffienct ductility fatigue The
loading thermal of cycle one in range strain inelastic The
failure to cycle mean The
f
IEfN
Electronic Packaging Lab. of NTHUElectronic Packaging Lab. of NTHU國立清華大學動機系電子構裝實驗室
Electronic Packaging/CAE Labs
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Electronic Packaging/CAE Labs
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Electronic Packaging/CAE Labs
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Electronic Packaging/CAE Labs
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Improved Volume-Weighted Averaging Technique
Finite-Volume-Weighted Averaging Technique
Rules to Determine the Dimension of the Finite ZoneIn an empirical engineering approximation manner:
Small enough to capture the maximal strain fieldLarge enough to obtain a converging solution as the mesh density increases
n
e
n
ee
ee
dd1 1
~
zone the in strain averaging weighted-volume The element th-e the of (area) volume The
element th-e the of strain The zone the in elements of number total The
~een
Electronic Packaging Lab. of NTHUElectronic Packaging Lab. of NTHU國立清華大學動機系電子構裝實驗室
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
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Electronic Packaging/CAE Labs
National Tsing Hua University
Determination of the Finite Zone
# of Elements within the fan shape: 18, 66, 192, 504
Four different radii are defined: 0.01, 0.02, 0.04, 0.06 mm. A net termperature swing = ; plastic behaviors considered.20 zone provide considerable agreement to the proposed criterion.
Co100
m
Fan-shape circular sector 0.12 mm
60050040030020010000.0013
0.0015
0.0017
0.0019
0.0021
0.0023
0.0025
0.0027
0.0029 radius=10 (Micro meter)
radius=20radius=40
radius=60
Mesh Density
Avera
ged E
quiva
lent P
lastic
Stra
in
A CB D
A B
C D
Electronic Packaging Lab. of NTHUElectronic Packaging Lab. of NTHU國立清華大學動機系電子構裝實驗室
Electronic Packaging/CAE Labs
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Electronic Packaging/CAE Labs
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Electronic Packaging/CAE Labs
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Electronic Packaging/CAE Labs
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Finite Element Modeling
1/2 package is modeled due to the symmmetric condition2-D plane strain finite element modelElements: 20685 Nodes: 21129The inelastic strain within the characterized finite zone will be averaged using a Volume-Weighted Technique.
Electronic Packaging Lab. of NTHUElectronic Packaging Lab. of NTHU國立清華大學動機系電子構裝實驗室
Electronic Packaging/CAE Labs
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Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Electronic Packaging/CAE Labs
National Tsing Hua University
Parametric Design of TEBGA Reliability
Design Parameters:Geomertry/Thickness : Die/PCB/Die Attach/Heat
Spreader/BTGeometry/Size : DieMaterial/Young’s Modulus : FR-4/BT/Die AttachMaterial/CTE : BT/FR-4
Thermal Cycling5 min linear temperature loading/unloading20 min low/high termperature dwell periodsTest temperature range: -40 ~ 125 Stress free temperature: 25Assume the is stablized within two cycles
IE
182 1382 1682 2882 3000
25
-40
125
CoCo
Electronic Packaging Lab. of NTHUElectronic Packaging Lab. of NTHU國立清華大學動機系電子構裝實驗室
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Geometry: Die Size
Nonlinear relationship is detected Between:Solder Joint Fatigue Life -vs.- Die Size
The maximum fatigue life appears at die size=7 mmCavity-down TEBGA / / Cavity-up PBGA
Cavity-up PBGA: The larger the die size; the shorter the fatigue life
The location experiencing with the largest CTE mismatch is right beneath the chip
Cavity-down TEBGA: A nonlinear relationship is obtained
A more complicated failure mechanism)
12.010.08.06.04.02.00.02000
2200
2400
2600
2800
3000
3200
Die Size (mm)
Num
ber o
f Cyc
les to
Fail
ure
Die Size
Electronic Packaging Lab. of NTHUElectronic Packaging Lab. of NTHU國立清華大學動機系電子構裝實驗室
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Geometry: Die Size (Cont.)
Two Major Failure Mechanisms:Global Mismatch:
CTE of PCB >> CTE of the PackageThe farther distance from the center of the package, the larger
deformation
Local Mismatch:CTE mismatch between the heat sprader and the die
5432100.0076
0.0086
0.0096
0.0106Die Size=2.Die Size=6.Die Size=10.
Ball Numbering
Max
imum
Ave
rage
Inel
astic
Stra
in
1 2 3 4
Ball Numbering
Electronic Packaging Lab. of NTHUElectronic Packaging Lab. of NTHU國立清華大學動機系電子構裝實驗室
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Geometry:Thickness
0.60.50.40.30.20.12000
2200
2400
2600
2800
3000
3200
Die Thickness (mm)
Num
ber o
f Cyc
les to
Fail
ure
1.51.31.10.90.70.52000
2200
2400
2600
2800
3000
3200
PCB Thickness (mm)N
umbe
r of C
ycle
s to
Failu
re
0.100.080.060.040.020.002000
2200
2400
2600
2800
3000
3200
Die Attach Thickness (mm)
Num
ber o
f Cyc
les to
Fail
ure
0.50.40.30.20.12000
2200
2400
2600
2800
3000
3200
Heat Spreader Thickness (mm)
Num
ber o
f Cyc
les to
Fail
ure
0.50.40.30.20.10.02000
2200
2400
2600
2800
3000
3200
BT Thickness (mm)
Num
ber o
f Cyc
les to
Fail
ure
Die Thickness PCB Thickness Die Attach Thickness
Heat Spreader Thickness BT Thickness
Electronic Packaging Lab. of NTHUElectronic Packaging Lab. of NTHU國立清華大學動機系電子構裝實驗室
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Materials: Young‘s Modulus/CTE
PCB Y’s Modulus BT Y’s Modulus Die Attach Y’s Modulus
BT CTE PCB CTE
26.024.022.020.018.016.014.02000
2200
2400
2600
2800
3000
3200
PCB Young Modulus (GPa)
Num
ber o
f Cyc
les to
Fail
ure
26.024.022.020.018.016.014.02000
2200
2400
2600
2800
3000
3200
BT Young Modulus (GPa)
Num
ber o
f Cyc
les t
o Fa
ilure
3.53.02.52.01.52000
2200
2400
2600
2800
3000
3200
Die Attach Young Modulus (GPa)
Num
ber o
f Cyc
les to
Fail
ure
2e-52e-52e-52e-51e-51e-51e-52000
2200
2400
2600
2800
3000
3200
BT CTE (ppm/Degree in Celcius)
Num
ber o
f Cyc
les to
Fail
ure
2e-52e-52e-52e-52e-51e-51e-51e-50
800
1600
2400
3200
PCB CTE (ppm/Degree in Celcius)
Num
ber o
f Cyc
les to
Fail
ure
Electronic Packaging Lab. of NTHUElectronic Packaging Lab. of NTHU國立清華大學動機系電子構裝實驗室
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ConclusionsIntroduction of a Finite-Volume-Weighted Averaging Technique:
Dimension of the zone determined using an empirical approximation mehtod.The strain/stress concentrtion responses can be characterized, and would no more be mesh-sensitive/dependent.Further experimental verification to really predict fatigue life of Solder Joints.
A parametric study of the reliability of the TEBGA assembly with respect to geometry and material parameters:
The design guideline for obtaining optimal reliability:
Educing a more accurate conclusion requires a sophisticated design optimization technique
MaterialProperty
PCB Y’sModulus
BT Y’sModulus
Die AttachY’s Modulus
BTCTE
PCBCTE
Dimension
Reliability
Electronic Packaging Lab. of NTHUElectronic Packaging Lab. of NTHU國立清華大學動機系電子構裝實驗室
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Conclusions (Cont.)
A Nonlinear Relationship Between SJR and Die Size/PCB CTE.Extensive Investigation on the Major Failure Mechanisms for the case of SJR and Die Size. A different failure mechcanism from that of C-up PBGA.Further investigation:
Effect of other failure mechanisms, such as die cracking on the package reliability.The nonlinear relationship between SJR and PCB CTE.