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J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 1
Phase I Monitoring of Nonlinear Profiles
James D. Williams
William H. Woodall
Jeffrey B. Birch
May 22, 2003
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 2
Profile MonitoringScenario
• Monitor a process or product whose quality cannot be assessed by a single quality characteristic
• Measure across some continuum (a sequence of time, space, etc.) producing a “profile”
• Various profile shapes:
• Linear Profiles: (Kang and Albin (2000), Kim, Mahmoud, and Woodall (2003), Mahmoud and Woodall (2003))
• Nonlinear Profiles: (Brill (2001))
• Very little work has been done to address monitoring nonlinear profiles (Woodall, et. al. (2003))
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 3
Profile Monitoring
Path forward
• Brill’s (2001) method
• Suggest two more methods
• Illustrate methods with nonlinear profile data
• Recommendations
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 4
Example 1: Vertical Density Profile (VDP)
Board A1 from Walker and Wright (2002, JQT)
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 5
Example 2: Dose-Response Profile of a Drug
0.0001 0.001 0.01 0.1 1 10 100Dose
Response
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 6
Phase I Analysis: Historical Data
Response Nonlinear Profile1 2 … n
2 nyyy ,22,21,2 L
Sample 1 nyyy ,12,11,1 L
M
m nmmm yyy ,2,1, LM M M M
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 7
Brief Intro to Nonlinear Regression Models
Simple Case: One Y and one X
iii xfy ε+= ),( β ni ,,1K=
),( βixfiy
ixβ
is the ith response
is an appropriate nonlinear function
is the ith regressor variable value
is the p×1 vector of parameters to estimate
iε is the ith residual error
where
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 8
Brief Intro to Nonlinear Regression Models
iβ̂ obtained iteratively for each sample
( ) ( ) iiiiVar CDDβ =′=−12 ˆˆˆˆ σ^
iD̂where is the estimated derivative matrix used in the estimation of the nonlinear regression parameters
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 9
Parameter Estimates from Historical Data
Parameter1 2 … p
pmmm
p
p
,2,1,
,22,21,2
,12,11,1
ˆˆˆ
ˆˆˆˆˆˆ
βββ
ββββββ
L
MMM
L
L1Sample
2M
m
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 10
How to Monitor Nonlinear Profiles
• Ideally, monitor each parameter independently
• Problem: parameter estimates are correlated in nonlinear regression
2T• Cannot monitor each parameter separately, so use
a multivariate control chart to monitor the parameters simultaneously
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 11
Multivariate T2 Control Chart Statistic
General form of the statistic:2T
mi ,,1K=
−
′
−= − ββSββ ˆˆˆˆ 12
iiiT
S is the covariance matrix of parameter estimates
=
∑
∑
∑
=
=
=
m
ipi
m
ii
m
ii
m
m
m
1,
12,
11,
ˆ1
ˆ1
ˆ1
ˆ
β
β
β
M
β
=
pi
i
i
i
,
2,
1,
ˆ
ˆˆ
ˆ
β
ββ
Mβ
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 12
Three Choices for S
Method 1: Sample Covariance Matrix (Brill, 2001)
′
−×
−
−= ∑
=
ββββS ˆˆˆˆ1
11
1 i
m
iim
Pros: • Easy to calculate
• Widely used and easily understood
Cons: • Greatly affected by shifts in mean vector
• Results in low power for the control chart2T
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 13
Three Choices for S
Method 2: Successive Differences (Holmes and Mergen, 1993)
Let iii ββv ˆˆ1 −= + 1,,1 −= mi K
′
′′
=
−1
2
1
mv
vv
V )1(22 −′
=m
VVSThen
Pros: • Like moving range with individual observations
• Not effected by shifts in the mean vector
• High power
Cons: • Less statistical theory developed to date
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 14
Three Choices for S
Method 3: Intra-Profile Pooling
For each of the m samples: ( ) ( ) iiiiVar CDDβ =′=−12 ˆˆˆˆ σ^
∑=
=m
iim 1
31 CSThen
Pros: • Uses information from nonlinear regression estimation
Cons: • Does not account for profile-to-profile common cause variability
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 15
Three Choices for T 2i
Three formulations of the statistic:2T
−
′
−= − ββSββ ˆˆˆˆ 1
12,1 iiiTMethod 1: Sample
Covariance Matrix
−
′
−= − ββSββ ˆˆˆˆ 1
22,2 iiiTMethod 2: Successive
Differences
−
′
−= − ββSββ ˆˆˆˆ 1
32,3 iiiTMethod 3: Intra-Profile
Pooling
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 16
Upper Control Limits
Method 1: Sample Covariance Matrix
−−
− 21,
2~
)1( 22
1pmpBeta
mmT
As discussed by Sullivan and Woodall (1996)
2/)1(,2/,1
2
1)1(
−−−−
= pmpBm
mUCL α
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 17
Upper Control Limits
Method 2: Successive Differences
−−
− 21,
2~
)1( 22
2pfpBeta
mmTApproximately
43)1(2 2
−−
=mmfwhere
For more information, see Scholz and Tosch (1994)
2/)1(,2/,1
2
2)1(
−−−−
= pfpBm
mUCL α
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 18
Upper Control Limits
Method 3: Intra-Profile Pooling
( )pmpFmmppmmT −+−
− ,~)1)(1(
)(23
We think that approximately
pmpFmmppmmUCL −−+−
−= ,,13 )1)(1(
)(α
Control limits are best approximations so far
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 19
Illustration: VDP Data
VDP of 24 Particle Boards
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 20
Nonlinear Function to Model VDP Data
Use a “bathtub” function to model each board from the VDP data
≤++−>+−
=dxcdxadxcdxa
xfi
bi
ib
ii 2
1
)()(
),(2
1β
=
dcbbaa
2
1
2
1
β
ix is the ith regressor variable valuewhere
determine the width of the “bathtub”
determine the “flatness” of the “bathtub”
is the bottom of the “bathtub” is the center of the “bathtub”
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 21
Nonlinear Function to Model VDP Data
VDP
Nonlinear fit
Board #1 from Walker and Wright (2002, JQT)
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 22
Nonlinear Function to Model VDP Data
Estimated nonlinear profile of Board #1
≤++−>+−
=313.00.46)313.0(3921313.00.46)313.0(5708
)ˆ,( 87.4
14.5
ii
iii xx
xxxf β
• Estimate profile for each board
• Calculate S1, S2, and S3.
,21T ,2
2T 23Tand• Calculate
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 23
Control Chart21T
UCL = 9.621T
Board #15
Board #18
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 24
Control Chart22T
UCL = 14.122T
Board #15 Board #18
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 25
and Control Charts22T2
1T
21T2
2T× × ×
UCL = 9.621T
UCL = 14.122T
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 26
Board 15
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 27
Board 18
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 28
Control Chart23T
According to our UCL, all of the boards are out-of-control
UCL
Board #3Board #6
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 29
Boards 3 and 6
Board 3
Board 6
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 30
Conclusions
• Method 1 (sample covariance matrix) does not take into account the sequential sampling structure of the data:
• The overall probability of detecting a shift in the mean vector will decrease (See Sullivan and Woodall, 1996)
• Should not be used
• Method 2 (successive differences) accounts for the sequential sampling scheme, and gives a more robust estimate of the covariance matrix
• In the VDP example, both Methods 1 and 2 gave same result because
• No apparent shift in the mean vector
• There were only about two outliers
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 31
Conclusions
• Method 3 (intra-profile pooling) should be used when there is no profile-to-profile common cause variability
• Comparison of the three methods:
• Method 1 assumes all variability is due to common cause
• Method 3 assumes that no variability is due to common cause
• Method 2 is somewhere in the middle
Issue: Monitoring parameters versus monitoring the fitted curves
J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 32
References
Brill, R. V. (2001). “A Case Study for Control Charting a Product Quality Measure That is a Continuous Function Over Time”. Presentation at the 45th Annual Fall Technical Conference, Toronto, Ontario.
Holmes, D. S., and Mergen, A. E. (1993). “Improving the Performance of the T 2 Control Chart”. Quality Engineering 5, pp. 619-625.
Kim, K., Mahmoud, M. A., and Woodall, W. H. (2003). “On The Monitoring of Linear Profiles”. To appear in the Journal of Quality Technology.
Mahmoud, M. A., and Woodall, W. H. (2003), “Phase I Monitoring of Linear Profiles with Calibration Applications”, Submitted to Technometrics.
Scholz, F. W., and Tosch, T. J. (1994), “Small Sample Uni- and Multivariate Control Charts for Means”. Proceedings of the American Statistical Association, Quality and Productivity Section.
Sullivan, J. H., and Woodall, W. H. (1996), “A Comparison of Multivariate Quality Control Charts for Individual Observations”. Journal of Quality Technology 28, pp. 398-408.
Walker, E., and Wright, S. P. (2002). “Comparing Curves Using Additive Models”. Journal of Quality Technology 34, pp. 118-129.
Woodall, W. H., Sptizner, D. J., Montgomery, D. C., and Gupta, S. (2003). “Using Control Charts to Monitor Process and Product Profiles”. Submitted to the Journal of Quality Technology.