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J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 1 Phase I Monitoring of Nonlinear Profiles James D. Williams William H. Woodall Jeffrey B. Birch May 22, 2003

Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

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Page 1: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 1

Phase I Monitoring of Nonlinear Profiles

James D. Williams

William H. Woodall

Jeffrey B. Birch

May 22, 2003

Page 2: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 2

Profile MonitoringScenario

• Monitor a process or product whose quality cannot be assessed by a single quality characteristic

• Measure across some continuum (a sequence of time, space, etc.) producing a “profile”

• Various profile shapes:

• Linear Profiles: (Kang and Albin (2000), Kim, Mahmoud, and Woodall (2003), Mahmoud and Woodall (2003))

• Nonlinear Profiles: (Brill (2001))

• Very little work has been done to address monitoring nonlinear profiles (Woodall, et. al. (2003))

Page 3: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 3

Profile Monitoring

Path forward

• Brill’s (2001) method

• Suggest two more methods

• Illustrate methods with nonlinear profile data

• Recommendations

Page 4: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 4

Example 1: Vertical Density Profile (VDP)

Board A1 from Walker and Wright (2002, JQT)

Page 5: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 5

Example 2: Dose-Response Profile of a Drug

0.0001 0.001 0.01 0.1 1 10 100Dose

Response

Page 6: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 6

Phase I Analysis: Historical Data

Response Nonlinear Profile1 2 … n

2 nyyy ,22,21,2 L

Sample 1 nyyy ,12,11,1 L

M

m nmmm yyy ,2,1, LM M M M

Page 7: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 7

Brief Intro to Nonlinear Regression Models

Simple Case: One Y and one X

iii xfy ε+= ),( β ni ,,1K=

),( βixfiy

ixβ

is the ith response

is an appropriate nonlinear function

is the ith regressor variable value

is the p×1 vector of parameters to estimate

iε is the ith residual error

where

Page 8: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 8

Brief Intro to Nonlinear Regression Models

iβ̂ obtained iteratively for each sample

( ) ( ) iiiiVar CDDβ =′=−12 ˆˆˆˆ σ^

iD̂where is the estimated derivative matrix used in the estimation of the nonlinear regression parameters

Page 9: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 9

Parameter Estimates from Historical Data

Parameter1 2 … p

pmmm

p

p

,2,1,

,22,21,2

,12,11,1

ˆˆˆ

ˆˆˆˆˆˆ

βββ

ββββββ

L

MMM

L

L1Sample

2M

m

Page 10: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 10

How to Monitor Nonlinear Profiles

• Ideally, monitor each parameter independently

• Problem: parameter estimates are correlated in nonlinear regression

2T• Cannot monitor each parameter separately, so use

a multivariate control chart to monitor the parameters simultaneously

Page 11: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 11

Multivariate T2 Control Chart Statistic

General form of the statistic:2T

mi ,,1K=

−= − ββSββ ˆˆˆˆ 12

iiiT

S is the covariance matrix of parameter estimates

=

=

=

=

m

ipi

m

ii

m

ii

m

m

m

1,

12,

11,

ˆ1

ˆ1

ˆ1

ˆ

β

β

β

M

β

=

pi

i

i

i

,

2,

1,

ˆ

ˆˆ

ˆ

β

ββ

Page 12: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 12

Three Choices for S

Method 1: Sample Covariance Matrix (Brill, 2001)

−×

−= ∑

=

ββββS ˆˆˆˆ1

11

1 i

m

iim

Pros: • Easy to calculate

• Widely used and easily understood

Cons: • Greatly affected by shifts in mean vector

• Results in low power for the control chart2T

Page 13: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 13

Three Choices for S

Method 2: Successive Differences (Holmes and Mergen, 1993)

Let iii ββv ˆˆ1 −= + 1,,1 −= mi K

′′

=

−1

2

1

mv

vv

V )1(22 −′

=m

VVSThen

Pros: • Like moving range with individual observations

• Not effected by shifts in the mean vector

• High power

Cons: • Less statistical theory developed to date

Page 14: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 14

Three Choices for S

Method 3: Intra-Profile Pooling

For each of the m samples: ( ) ( ) iiiiVar CDDβ =′=−12 ˆˆˆˆ σ^

∑=

=m

iim 1

31 CSThen

Pros: • Uses information from nonlinear regression estimation

Cons: • Does not account for profile-to-profile common cause variability

Page 15: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 15

Three Choices for T 2i

Three formulations of the statistic:2T

−= − ββSββ ˆˆˆˆ 1

12,1 iiiTMethod 1: Sample

Covariance Matrix

−= − ββSββ ˆˆˆˆ 1

22,2 iiiTMethod 2: Successive

Differences

−= − ββSββ ˆˆˆˆ 1

32,3 iiiTMethod 3: Intra-Profile

Pooling

Page 16: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 16

Upper Control Limits

Method 1: Sample Covariance Matrix

−−

− 21,

2~

)1( 22

1pmpBeta

mmT

As discussed by Sullivan and Woodall (1996)

2/)1(,2/,1

2

1)1(

−−−−

= pmpBm

mUCL α

Page 17: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 17

Upper Control Limits

Method 2: Successive Differences

−−

− 21,

2~

)1( 22

2pfpBeta

mmTApproximately

43)1(2 2

−−

=mmfwhere

For more information, see Scholz and Tosch (1994)

2/)1(,2/,1

2

2)1(

−−−−

= pfpBm

mUCL α

Page 18: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 18

Upper Control Limits

Method 3: Intra-Profile Pooling

( )pmpFmmppmmT −+−

− ,~)1)(1(

)(23

We think that approximately

pmpFmmppmmUCL −−+−

−= ,,13 )1)(1(

)(α

Control limits are best approximations so far

Page 19: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 19

Illustration: VDP Data

VDP of 24 Particle Boards

Page 20: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 20

Nonlinear Function to Model VDP Data

Use a “bathtub” function to model each board from the VDP data

≤++−>+−

=dxcdxadxcdxa

xfi

bi

ib

ii 2

1

)()(

),(2

=

dcbbaa

2

1

2

1

β

ix is the ith regressor variable valuewhere

determine the width of the “bathtub”

determine the “flatness” of the “bathtub”

is the bottom of the “bathtub” is the center of the “bathtub”

Page 21: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 21

Nonlinear Function to Model VDP Data

VDP

Nonlinear fit

Board #1 from Walker and Wright (2002, JQT)

Page 22: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 22

Nonlinear Function to Model VDP Data

Estimated nonlinear profile of Board #1

≤++−>+−

=313.00.46)313.0(3921313.00.46)313.0(5708

)ˆ,( 87.4

14.5

ii

iii xx

xxxf β

• Estimate profile for each board

• Calculate S1, S2, and S3.

,21T ,2

2T 23Tand• Calculate

Page 23: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 23

Control Chart21T

UCL = 9.621T

Board #15

Board #18

Page 24: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 24

Control Chart22T

UCL = 14.122T

Board #15 Board #18

Page 25: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 25

and Control Charts22T2

1T

21T2

2T× × ×

UCL = 9.621T

UCL = 14.122T

Page 26: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 26

Board 15

Page 27: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 27

Board 18

Page 28: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 28

Control Chart23T

According to our UCL, all of the boards are out-of-control

UCL

Board #3Board #6

Page 29: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 29

Boards 3 and 6

Board 3

Board 6

Page 30: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 30

Conclusions

• Method 1 (sample covariance matrix) does not take into account the sequential sampling structure of the data:

• The overall probability of detecting a shift in the mean vector will decrease (See Sullivan and Woodall, 1996)

• Should not be used

• Method 2 (successive differences) accounts for the sequential sampling scheme, and gives a more robust estimate of the covariance matrix

• In the VDP example, both Methods 1 and 2 gave same result because

• No apparent shift in the mean vector

• There were only about two outliers

Page 31: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 31

Conclusions

• Method 3 (intra-profile pooling) should be used when there is no profile-to-profile common cause variability

• Comparison of the three methods:

• Method 1 assumes all variability is due to common cause

• Method 3 assumes that no variability is due to common cause

• Method 2 is somewhere in the middle

Issue: Monitoring parameters versus monitoring the fitted curves

Page 32: Phase I Monitoring of Nonlinear Profilesresearch.ihost.com/qprc_2003/papers/Williams2003qprc.pdfJ.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research

J.D. Williams, Bill Woodall, Jeff Birch, Virginia Tech 2003 Quality & Productivity Research Conference, Yorktown Heights, NY 32

References

Brill, R. V. (2001). “A Case Study for Control Charting a Product Quality Measure That is a Continuous Function Over Time”. Presentation at the 45th Annual Fall Technical Conference, Toronto, Ontario.

Holmes, D. S., and Mergen, A. E. (1993). “Improving the Performance of the T 2 Control Chart”. Quality Engineering 5, pp. 619-625.

Kim, K., Mahmoud, M. A., and Woodall, W. H. (2003). “On The Monitoring of Linear Profiles”. To appear in the Journal of Quality Technology.

Mahmoud, M. A., and Woodall, W. H. (2003), “Phase I Monitoring of Linear Profiles with Calibration Applications”, Submitted to Technometrics.

Scholz, F. W., and Tosch, T. J. (1994), “Small Sample Uni- and Multivariate Control Charts for Means”. Proceedings of the American Statistical Association, Quality and Productivity Section.

Sullivan, J. H., and Woodall, W. H. (1996), “A Comparison of Multivariate Quality Control Charts for Individual Observations”. Journal of Quality Technology 28, pp. 398-408.

Walker, E., and Wright, S. P. (2002). “Comparing Curves Using Additive Models”. Journal of Quality Technology 34, pp. 118-129.

Woodall, W. H., Sptizner, D. J., Montgomery, D. C., and Gupta, S. (2003). “Using Control Charts to Monitor Process and Product Profiles”. Submitted to the Journal of Quality Technology.