Poster Session 1

2014 BiTS Workshop ~ March 9 – 12, 2014

Monday 3/10/14 2:30pm

If one was good, two must be better! Poster Sessions that is! We had so many qualified submissions this year, we divided them in to two Poster sessions offering a variety of relevant topics to augment what you'll learn sitting in the Podium sessions.

Poster Sessions are a great way to network through interaction with the poster presenters and other curious bystanders, multitask during a break and stretch your legs after a long session.

One Piece Stamped and Formed Probe Pin Ichiro Fujishiro—Yamaichi Electronics

Correlation and Measuring Techniques for +/-5% Impedance Tom Bresnan—R&D Altanova

Compliance Grounding -The Mechanical Importance of Grounding Shamal Mundiyath—JF Microtechnology Sdn Bhd

COPYRIGHT NOTICE The paper(s) in this publication comprise the Proceedings of the 2014 BiTS Workshop. The content reflects the opinion of the authors and their respective companies. They are reproduced here as they were presented at the 2014 BiTS Workshop. This version of the papers may differ from the version that was distributed in hardcopy & softcopy form at the 2014 BiTS Workshop. The inclusion of the papers in this publication does not constitute an endorsement by BiTS Workshop, LLC or the workshop’s sponsors.

There is NO copyright protection claimed on the presentation content by BiTS Workshop, LLC. (Occasionally a Tutorial and/or TechTalk may be copyrighted by the author). However, each presentation is the work of the authors and their respective companies: as such, it is strongly encouraged that any use reflect proper acknowledgement to the appropriate source. Any questions regarding the use of any materials presented should be directed to the author(s) or their companies.

The BiTS logo and ‘Burn-in & Test Strategies Workshop’ are trademarks of BiTS Workshop, LLC. All rights reserved.

COPYRIGHT NOTICE The paper(s) in this publication comprise the Proceedings of the 2014 BiTS Workshop. The content reflects the opinion of the authors and their respective companies. They are reproduced here as they were presented at the 2014 BiTS Workshop. This version of the papers may differ from the version that was distributed in hardcopy & softcopy form at the 2014 BiTS Workshop. The inclusion of the papers in this publication does not constitute an endorsement by BiTS Workshop, LLC or the workshop’s sponsors.

There is NO copyright protection claimed on the presentation content by BiTS Workshop, LLC. (Occasionally a Tutorial and/or TechTalk may be copyrighted by the author). However, each presentation is the work of the authors and their respective companies: as such, it is strongly encouraged that any use reflect proper acknowledgement to the appropriate source. Any questions regarding the use of any materials presented should be directed to the author(s) or their companies.

The BiTS logo and ‘Burn-in & Test Strategies Workshop’ are trademarks of BiTS Workshop, LLC. All rights reserved.

This Poster

2014 BiTS Workshop ~ March 9 - 12, 2014

Poster #11

Poster Session 1

Ichiro Fujishiro Yamaichi Electronics

One-Piece Stamped and Formed Probe Pin

Key Industry Challenges: • Pitches continue to shrink• Test temperature and device current is increasing• Cost continues to be a focus, even in demanding applications

Solution: One-Piece Stamped and Formed Probe Pin• One-piece stamped and formed pin provides high current carrying capacity• High volume stamping delivers high quality and low cost

Key Features• 0.4mm minimum pitch• Excellent electrical conductivity due to beryllium copper base material• Stable contact force and resistance throughout pin life• Excellent SI performance• Excellent travel for 0.4mm pitch solution• Compatible with current Burn In Socket Solutions

Additional Features: • Supports non-magnetic probe applications• Outstanding SI performance enables support for

SLT, Test and Validation Applications

Device Side PCB Side

【Photo】

Patent Pending

Conference Ready 1/23/2014

BiTS 2014

2014 BiTS Workshop ~ March 9 - 12, 2014

Poster #12

Poster Session 1

【Cycle Test 】Testing Condition

• Temperature: Ambient

• Contact Object: Plate with Au plating

0

100

200

300

400

500

0 20k 40k 60k 80k

Con

tact

Res

ista

nce

[mΩ

]

Cycle

100k

【Contact Force – Displacement – Resistance】

Basic Performance

0

100

200

300

400

5.005.105.205.305.405.505.600.00

0.05

0.10

0.15

0.20

Force:0.145N

Resistance:76.8mΩ

Test Length

（5.05mm）

Contact Length [mm]

Co

ntac

t Fo

rce

[N

]

Re

sist

anc

e [

mΩ

]0

100

200

300

400

5.005.105.205.305.405.505.600.00

0.05

0.10

0.15

0.20

Force:0.145N

Resistance:76.8mΩ

Test Length

（5.05mm）

Contact Length [mm]

Co

ntac

t Fo

rce

[N

]

Re

sist

anc

e [

mΩ

]

• Contact Pitch: 0.4mm minimum• Test Height: 5.05mm• Operation Stroke: 0.65mm• Contact Force: 14gf ±5gf (0.137N ± 0.0049N)• Spring Life: 80,000 times• Operation Temperature: ~ -40 to 150

Specification

BiTS 2014 One-Piece Stamped and Formed Probe Pin 2

2014 BiTS Workshop ~ March 9 - 12, 2014

Poster #13

Poster Session 1

Current Carrying Capacity Comparison

ThermocoupleType K

Spring Probe(Test length)

Jig

Jig

Ambienttemperature

DCCurrent Source

Data Logger

Measurement State Figure

ThermocoupleType K

Spring Probe(Test length)

Jig

Jig

Ambienttemperature

DCCurrent Source

Data Logger

Measurement State Figure

【Measuring Method】

- Measure the temperature at the Barrel. - Use higher temperature readings as data.

【Current condition】

- Current value : 1A, 2A, 3A

- Duty ratio : 5%, 10%, 25%, 50%, 75%, 100% （1Hz)

【 Table】

One Piece Pressed Probe Pin

Standard Four Piece Probe Pin

Product nameDuty Ratio

5 % 10 % 25 % 50 % 75 % 100 %

One Piece Pressed Probe 3.7 6.6 14.7 28.7 37.4 50.1

Standard Four Piece Probe Pin 9.5 17.5 41.0 80.5 135.2 -

<2A > Temperature Rise : [ ]

Product nameDuty Ratio

5 % 10 % 25 % 50 % 75 % 100 %

One Piece Pressed Probe 7.5 13.5 30.0 59.0 77.3 109.2

Standard Four Piece Probe Pin 21.3 37.9 89.2 - - -

<3A > Temperature Rise : [ ]

＜ 30 30-80 deg.C ≧ 80 deg.CTemperature Rise :

【Test Result】

0

50

100

150

0 % 20 % 40 % 60 % 80 % 100 %

Tem

pera

ture

Ris

e[

]

Duty Ratio

3A

2A

1A

0

50

100

150

0 % 20 % 40 % 60 % 80 % 100 %

Tem

pera

ture

Ris

e[

]

Duty Ratio

3A 2A

1A

BiTS 2014 One-Piece Stamped and Formed Probe Pin 3