Power Quality Standards: CBEMA, ITIC, SEMI F47, IEC 61000-4-11/34

Power Quality Standards: CBEMA, ITIC, SEMI F47, IEC 61000-4-11/34

Mark Stephens, PEManagerIndustrial Studies Electric Power Research Institute 942 Corridor Park Blvd Knoxville, Tennessee 37932 Phone 865.218.8022 [email protected]

2© 2009 Electric Power Research Institute, Inc. All rights reserved.

Equipment Design that is not Certified to a PQ Standard can have Components that are highly Robust and others that are Susceptible to voltage sags

0%

10%

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30%

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0 10 20 30 40 50 60

Cycles

%Vn

omin

al

PQ Events SEMI F47 AC "Ice Cube" RelayIEC Style Starter Robust PLC Flame ControllerAC Drive


Voltage Sag Standards

• The best way to Guarantee that Process Equipment is Compatible with its Electrical Environment is to Require the Equipment to Comply with Voltage Sag Standards

• OEMs have to be Forced to Incorporate Voltage Sag Tolerance intotheir Equipment

• The Push has to come from End Users• EPRI has shown that Machines can be Built to Comply with Voltage

Sag Standards, like SEMI F47, with almost no Difference in Cost • Recognized Voltage Sag Standards Discussed in Presentation

– SEMI F47-0706 (Semiconductor Equipment and Materials institute)

– IEC 61000-4-11 and 61000-4-34 (International ElectrotechnicalCommission)

– ITIC (Information Technology industry Council)


Information Technology industry Council ITIC (CBEMA) curve (1996)

• 1977 the Computer and Business Equipment Manufacturers Association’s (CBEMA) developed a standard to address energy performance profile for computer equipment

• Throughout the last thirty years the CBEMA Curve grew from a simple curve describing the performance mainframe computer equipment (PCs were not available), to a curve that was used to attempt to define everything from specification criteria for electronic equipment to the basis of power quality performance contracts between electric utilities and large industrial customers.


SEMI F47-0706 Specification for Semiconductor Processing Equipment Voltage Sag Immunity

• SEMI F47-0706 Cost $50 and can be Downloaded from www.semi.org

• EPRI along with Utilities, Semiconductor Manufacturers and Semiconductor Equipment Suppliers were all Instrumental in Developing SEMI F47 which was adopted in 1999

• SEMI F47-0706 Specification for Semiconductor Processing Equipment Voltage Sag Immunity defines the minimum voltage sag levels not to cause equipment misoperations of semiconductor equipment to voltage sags

• SEMI F47-0706 References an IEC Standard (IEC 61000-4-34) for Test Protocol Information

• SEMI F47 does not Address Product Quality or Factory Systems. For factory Related Equipment and Power Requirements, see;– SEMI F49-0200 - Guide for Semiconductor Factory Systems Voltage

Sag Immunity– SEMI F50-0200 - Guide for Electric Utility Voltage Sag Performance

for Semiconductor Factories


SEMI F47-0706 Test Levels


SEMI F47-0706 Specification for Semiconductor Processing Equipment Voltage Sag Immunity

• SEMI F47 does not Address Product Quality, the intent of the Standard is to keep the equipment Running (i.e. No Operator Interventions) when Exposed to Voltage Sags Above the Defined Curve


IEC 61000-4-34 Low Frequency PhenomenaInternational Electrotechnical Commission - IEC

• IEC 61000-4-11 is Intended to be used for Equipment LESS Then 16A• IEC 61000-4-34 is Intended to be used for Equipment GREATER Then

16A• Both Standards can be Downloaded from http://www.iec.ch/• The Intent of IEC 61000-4-11 and -34 is to Define Voltage Dip Test

Levels, not for Specific Types of Equipment, but Attempts to Define the Environment of the Equipment

• IEC 61000-4-34 applies to Equipment over 16A and IEC 61000-4-11 for Equipment Under 16A

• Table 1 Below are the Voltage Dip Test Levels from the IEC 61000-4-34 and -11 Standards


IEC 61000-4-34 Low Frequency PhenomenaClass 1

• Class 1 - This class applies to protected supplies and has compatibility levels lower than public network levels. It relates to the use of equipment very sensitive to disturbances in the power supply for instance the instrumentation of technological laboratories, some automation and protection equipment, some computers, etc.

• NOTE Class 1 environments normally contain equipment which requires protection by such apparatus as uninterruptible power supplies (UPS), filters, or surge suppressers.



• Class 2 - This class applies to points of common coupling (PCC’s for consumer systems) and points of common coupling (IPC’s) in the industrial environment in general. The compatibility levels in this class are identical to those of public networks; therefore components designed for application in public networks may be used in this class of industrial environment.



• Class 3 - This class applies only to IPC’s in industrial environments. It has higher compatibility levels than those of class 2 for some disturbance phenomena. For instance, this class should be considered when any of the following conditions are met:

• – a major part of the load is fed through converters;• – welding machines are present;• – large motors are frequently started;• – loads vary rapidly

• NOTE 1 The supply to highly disturbing loads, such as arc-furnaces and large converters which are generally supplied from a segregated bus-bar, frequently has disturbance levels in excess of class 3 (harsh environment). In such special situations, the compatibility levels should be agreed upon.

• NOTE 2 The class applicable for new plants and extensions of existing plants should relate to the type of equipment and process under consideration.


IEC 61000-4-34 Low Frequency PhenomenaClass X

• Class X – User Defined and in case of SEMI F47-0706, the test Points are Defined in the SEMI F47 Standard


Comparison of SEMI and IEC Voltage Sag Standards

• SEMI F47 standard for the semiconductor industry– Voltage sag immunity testing– Relevant for single, two and three phase manufacturing

equipment

• IEC standards 61000-4-11 (less than 16 amps) and 61000-4-34 (greater than 16 amps)– Voltage sag and short interruption testing – Relevant for single, two and three phase manufacturing

equipment

• The SEMI F47 and IEC standards appear similar but have subtle differences, especially for three-phase testing– The IEC standard allows for the use of two phase-to-phase test

vectors while the SEMI F47 adds an additional acceptable test vector


Single-Phase Sags

• If the Equipment Under Test (EUT) has a neutral conductor, then some loads may be wired with respect to neutral.

• Therefore, single-phase to neutral tests should be done to determine sensitivity/robustness of EUT to such events.

• Considerations are – Magnitude– Duration– Point-on-Wave

(0 degrees reference)

70%

70%

70%

Type “A” as shown IEC 61000-4-34, Figure 3A


Phase-to-Phase Sags

• IEC allows two types of phase-to-phase testing – Type “B”– Type “C”

• SEMI F47 allows three types of phase-to-phase testing– Type “B”– Type “C”– Type “D”

• Neither IEC 61000-4-34 or SEMI F47 calls for 3-phase symmetrical sags.

• The test methods can have implications on the test results with respect to pass/failure.


Phase-to-Phase Sags

• EPRI traditionally did Method D testing for all SEMI F47 work and System Compatibility Testing. – Needed a neutral – was

difficult to obtain at times.• Others chose Method B as an

alternative due to lack of neutral and ease of test.

• Method C is the most frequently occurring in the power system and the most realistic off all three. It does not require a neutral. (a.k.a. Type C per Bollen)


Diode Front-End ASD Response to Different Type of Voltage Sags

• Adjustable speed drives are one of the most important loads affecting overall process response to voltage dips.

• Example 5HP drive trips for Method D and E

• Did not trip for A, B and C

%Vdc Min=82%(Occurs at 50% Vdip)

Drive Loadedto 80% FLA

WG Reference Doc: CIGRE-C4.110-2006-24


Example Simulation Outputs

Simulation Output for Method B (Figure 3B in IEC 61000-4-34)

(50% one L-L voltage, 12 cycles)

Simulation Output for Method C(Figure 3C in IEC 61000-4-34)


Simulation Output for Method D (Figure 3D in IEC 61000-4-34)


0.15 0.2 0.25 0.3 0.35 0.4 0.45500

600

700

Vdc

0.15 0.2 0.25 0.3 0.35 0.4 0.45-1000

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1000

Vab

0.15 0.2 0.25 0.3 0.35 0.4 0.45-1000

0

1000

Vbc

0.15 0.2 0.25 0.3 0.35 0.4 0.45-1000

0

1000

Vca

0.15 0.2 0.25 0.3 0.35 0.4 0.45-100

0

100

time (s)

Ia

0.15 0.2 0.25 0.3 0.35 0.4 0.45600

650

700

Vdc

0.15 0.2 0.25 0.3 0.35 0.4 0.45-1000

0

1000

Vab

0.15 0.2 0.25 0.3 0.35 0.4 0.45-1000

0

1000

Vbc

0.15 0.2 0.25 0.3 0.35 0.4 0.45-1000

0

1000

Vca

0.15 0.2 0.25 0.3 0.35 0.4 0.45-100

0

100

time (s)

Ia

0.15 0.2 0.25 0.3 0.35 0.4 0.45400

600

800

Vdc

0.15 0.2 0.25 0.3 0.35 0.4 0.45-1000

0

1000

Vab

0.15 0.2 0.25 0.3 0.35 0.4 0.45-1000

0

1000

Vbc

0.15 0.2 0.25 0.3 0.35 0.4 0.45-1000

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1000

Vca

0.15 0.2 0.25 0.3 0.35 0.4 0.45-200

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200

time (s)Ia


Simulation Results - Summary

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Method B Method C Method D 80% Trip Level70% Trip Level 60% Trip Level 50% Trip Level


Testing Capabilities – Expanded due to Standards Requirements

• EPRI has now patented the the TRI-Mode voltage sag generator design. This unit can test all IEC and SEMI test vectors plus asymmetrical and symmetrical 3-phase voltage sags.

• We expect this type of test equipment to be useful in evaluating system compatibility for multiple types of test vectors.

• The EPRI PQStar testing program tests are being done as Type “C” for three-phase loads now since this is most realistic and is applicable to both SEMI F47 and IEC 61000-4-11 & 34.


NEW IEEE Standard Development – P1668

• This project will undertake the development of a standard for the response of electrical equipment to voltage sags.

• The standard will describe a level of performance to be used as a criteria for acceptance of the product. End users will be able to use the standard in their purchase specifications to ensure the required level of performance.

• The project will apply to any electrical equipment that can experience nuisance shutdowns due to reductions in supply voltage.

• Issues:– Existing Standards Advocate Different Test

Methods and in some cases conflict– Existing Standards do not require 3-Phase

Sags– Existing Standards do not provide

methodology for characterization testing.– Pass/Fail Information is all that is obtained in

existing standard

• Effort is underway to develop the standard.

http://grouper.ieee.org/groups/ias/1668/index.html


Voltage Dip Concepts for Type 1, Type 2, and Type 3

Proposed Types

Actual Dip Vectors and Types [5]

Actual RMS Plot

Approximation for Testing Purposes

Approximation RMS Plot for Testing Purposes Comment

Type 1: Single-Phase

Voltage Dip

Formerly Type D 0 2 4 6 8

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Approximation does not include phase shifting or

magnitude change of non-dipped phases.

Added phase shift may be difficult to obtain with standard transformer-switch type voltage dip

generators.

Type 2: Two-

Phase Voltage

Dip

Formerly Type C

0 2 4 6 80.4

0.5

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0.9

1

1.1

Time [Cycles]

Volta

ge [

pu]

0 2 4 6 80.4

0.5

0.6

0.7

0.8

0.9

1

1.1

Time [Cycles]

Volt

age

[pu]

Approximation matches with actual dip type

Type 3: Three-Phase

Voltage Dip

Formerly Type A

0 2 4 6 80.4

0.5

0.6

0.7

0.8

0.9

1

1.1

Time [Cycles]

Volta

ge [p

u]

0 2 4 6 80.4

0.5

0.6

0.7

0.8

0.9

1

1.1

Time [Cycles]

Vol

tage

[pu]

Approximation matches with actual dip type

Documents

Power Quality Standards: CBEMA, ITIC, SEMI F47, IEC 61000-4-11/34