Product Overview2018

[ Hyperspectral Microscopy ]

[ Nanoindenter / Tribometer ]

[ Particle Analysis ]

[ Thin Films ]

[ Measurement and Control ]

[ SEM-AFM ]

[ Scanning Probe Microscopy ]

[ 3D Profilometry ]

Foto: ??

Schaefer-Tec Group

� The Schaefer-Tec group has been exclusively representing innova-

tive and worldwide known manufacturers since 1963 in Europe.

Our strength lies in the application consulting, sale, training, service

and marketing of scientific and technical products for research and

production.

� Being more than 55 years in this business, our customers can

benefit from the rich experience and long-standing relations, guar-

anteeing a successful product implementation. Our broad product

portfolio is widely known and used by our customers in academia

and industry.

� Our employees are highly educated, trained and experienced. The

motto “close to the customer” are not only words but lived day

by day by all our staff for technical questions, qualified service and

cooperation in our customers endeavors.

� The Schaefer-Tec group has offices in Germany (established 1963),

Switzerland (1966), France (1971), Italy (2005) and Romania

(2007).

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[ Scanning Probe Microscopy ]

LHe-Free LT-SPM-System

The compact RHK PanScan Freedom UHV-STM / AFM not only astoni-shes with its outstanding performance and ease of use, but also lowers the costs of low temperature studies. High-resolution, stable measure-ments and spectroscopy are possible even in non-ideal environmental conditions.

� Closed-Cycle cooling down to < 9 K� Unlimited measurements without interruption� Low operating costs� XY drift 0.1 nm/h, Z drift 0.1 nm/day� Comprehensive STS functionality� Optional superconducting magnet

Closed-Cycle Stability, Silicon at 18K

Indium-doped Bi2Se3 at 18K (measured at AVS 2014 on the exhibition floor)

Closed Cycle Off

Closed Cycle On

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UHV SPM Systems

For high-resolution UHV Scanning Probe Microscopy we supply com-plete systems or subsystems that are based on a number of different SPM scan head designs. In addition to the “Beetle”- and “Pan”-series we also offer the cryogenic multi-probe system “Quadraprobe”.

� STM, TF-AFM, Cantilever-AFM� Ambient temperature, VT, LT� Various cryostat types for cooling� Integration with SEM� External magnetic field� Spectroscopy and various SPM operating modes

[ Scanning Probe Microscopy ]

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Flexible SPM Control Systems

The digital SPM electronics and software RHK “R9plus” is prepared to run any SPM scan head and any SPM application combining highest performance with ease of use.

� Very low noise level (8 nV / Hz )� High “Oversampling” / 100 MHz sampling rate� Fast response time for process control� Multi-Speed Data Path� Multiple internal Lock-in / PLL channels� STM, AFM (all operation modes), Kelvin Probe, NSOM, …� Extensive functions for scanning tunneling spectroscopy� Graphical Interface/user specific routines� Open architecture allows integrating external software routines

(e.g. LabVIEW, MATLAB, SciLab …)

RHK R9 with IHDLTM

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[ Scanning Probe Microscopy ]

CSI Nano-Observer Multiple-Mode AFM

The Nano-Observer system is a versatile and powerful AFM system for various operation modes and conditions. A clever combination of ana-log and digital electronics, incorporating premium components realizes lowest noise and best accuracy on a robust and flexible AFM platform.

� Advanced Electrical modes– High Definition Kelvin Force Microscopy (HD-KFM)– Scanning Microwave Impedance Microscopy (sMIM)– ResiScope™ and Soft ResiScope™

� Easy to use and intuitive AFM operation� Pre-aligning tip holders � Top-View/Side-View video microscope � Simple switching between pre-configured measurement-modes

without adding modules, connections or changing tips� MFM with magnetic field generator� Easy optical access, combination with Raman available� Measurements in special gas atmospheres, liquids and variable

temperatures

Nano-Observer; C36 molecule, 250nm

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Advanced Conductive Nano-Characterization

The patented ResiScopeTM is the most advanced module for conductive measurements that enables conductivity measurements over 10 deca-des (from 100 fA to 1 mA) within one image.

Surfaces with both, highly conductive and insulating domains can be mapped overcoming undesired side-effects like probe-induced local oxi-dation, bimetallic effects or melting of the conductive coating.It can be combined with several other dynamic modes as KFM or MFM/EFM, providing several sets of data recorded with the same tip on the same sample area.

The Soft ResiScope enables conductivity measurements even for the Intermittent Contact Mode.As a result conductivity maps on fragile and soft surfaces can be acqui-red that would never be measurable with Contact Conductive AFM techniques.

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[ Scanning Probe Microscopy ]

AFM WorkshopTM

For researchers with big ideas and small budget!Check the features and performance of the TT-2 AFM. Full hardware and software documentation is included. The instrument is offered eit-her fully assembled, or as an AFM Kit that can be assembled and tested under expert supervision in a 5-day workshop.

� Modes: Contact and dynamic mode, phase contrast, lateral force, F-Z spectroscopy

� Zoomable video microscope � Integration into your LabVIEW environment� Open for customized experiments and modifications� Suitable for educational purposes as well

AFM image: 10 × 10 μm, scratch in metal

Nanoparticles (8 nm), dynamic mode (Courtesy of Dr. Peter Eaton)

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SPM-Cantilevers and Calibration Grids

The selection of an adequate cantilever is essential for a successful AFM measurement. As contractual partner of several suppliers we offer a wide range of probes for SPM applications. We would be pleased to recommend cantilevers / tips suitable for your experiments.

� Tips for various brand AFMs� Large selection of tips with different force constants, resonance

frequencies, tip radii or aspect ratios� Cantilevers for fast scanning� Unmounted, with or without alignment structure� Pre-mounted on manufacturer-specific carriers� Coatings for many different operating modes� Materials: Silicon, Silicon-Nitride, Diamond� Single-or triple-lever, rectangular or triangle shape� Calibration structures� Standards for tip characterization

General purpose probeNSC/CSC

(silicon, uncoated)

HYDRA probe(silicon nitride)

NaDia all-diamond probe(cantilever and probe tip

are made of UNCD)

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[ Thin Films ]

Spin-Coater

Our spin coaters allow to produce, within seconds, homogeneous thin and ultrathin films down to a few nm film thickness on a choice of substrate sizes and geometries. The operation is extremely simple and optimized for the daily routine in the lab.

� Rotation speeds up to 18.000 rpm� Programmable and storable ramping function� Rotating tables with diameters up to 90 mm; special designs on

request� Active vacuum fixation of substrates

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In-Situ Film Thickness Measurement and Control

For monitoring and optimization of simple or complex coating processes we offer the precise and powerful QCM devices from Inficon. They allow the continuous measurement and control of the current layer thicknes-ses and deposition rates as well as the adjustment and data storage of all relevant process parameters.

� IQM-233 Thin-Film Co-Deposition Controller on a PCI Express Card with three sensor inputs and three outputs

� NeW: STM-2 Thin Film Rate/Thickness Monitor with internal oscillator

� SQM-160 Multi-Film Rate / Thickness Monitor for up to 6 sensors� XTC/3 Thin Film Deposition Controller for standard applications� IC-6 Controller / SQC-310 Controller for monitoring multiple

sensors / control outputs, ideal for multilayer coatings� EIES-IV Guardian™ Electron Impact Emission Spectrometer

for the operation of 2 EIES sensors� NeW: ALD sensors: operating temperatures up to 450 °C,

high temperature crystals optimized for up to 285 °C� Sensors, HV and UHV compatible vacuum feedthroughs, oscillators

and other accessories

SQC310 Deposition Controller, Quartz monitor crystals

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Ultrafast Spectroscopic ellipsometer

For quality control, in-line measurements or research: The spectroscopic ellipsometers from ULVAC provide the best solution for any application. The UNECS series consists of portable and manual as well as automated systems. The measurement is based on the ultra-fast “snapshot” tech-nique, which is far superior to conventional methods.The UNECS ellipsometers are the ideal tools for the investigation of transparent or semi-transparent layers: semiconductor films, solar films, biological films, organic LED films, functional layers in MEMS, photore-sists, polyimides, oxides, nitrides, TiO2, ITO, TFT, etc.

� Fast, precise, reliable, and easy to use� Sampling time per point is only 20 ms.� Customizable material database: unknown materials

can easily be added � Determination of the film thicknesses of up to 6 layers

in a multilayer structure� On single layers, the refractive index and extinction-coefficient

can also be measured� Extremely low maintenance costs: The halogen lamp is the only

wearing part

[ Thin Films ]

UNeCS 1500M ellipsometer

2D Map of layer thickness uniformity of SiO2

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Characterization of Transparent Structures

The DHM technique offers a unique solution to measure 3D topogra-phy and refractive indices of semi-/transparent structures on a reflective substrate. The simultaneous measurement of intensity and phase of the reflected light of two measuring lasers provides all necessary measuring parame-ters for simultaneous determination of thicknesses and refractive indices of up to three layers. The topography of structured surfaces is also pre-cisely reconstructed.

� Simultaneous acquisition of topography, thickness and refractive index of transparent structures

� Layer thickness from 10 nm to 15 µm� Complete characterization of deposited or etched structures in

multilayer systems � Non-contact method, ideal for measurement of soft or liquid media

Measurement of a step-like sample composed of differentthicknesses of SiO2 deposited on a silicon substrate

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[ 3D Profilometry ]

Stylus Profilometer

The “Alpha-Step”- and “P”-Series KLA-Tencor Profilers offer fast tac-tile measurement of step height and roughness with scan length up to 200 mm. In addition stress and bow measurements on wafers or 3D measurements can be performed. Basic systems for single measure-ments or devices with automated measuring sequences are available, optionally also with a wafer loader for fully automated measurements e.g. in semiconductor industry.

� Step height repeatability < 0.4 nm� Dynamic force control� Scan length up to 200 mm without stitching� Sample size up to 300 mm� Automated report generation

Step height measurement

Stylus tip on calibration sample

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White-Light / Phase Shift Interferometer

The high-resolution MicroXAM-800 interferometer from KLA Tencor combines all necessary hardware and software features to meet the strict requirements in research and production. It stands out from other 3D profilometers in particular due to its innovative software and an intu-itive user interface.

� Easy setup of measurement and analysis routines by means of Drag & Drop functionality

� “Smart Acquire” wizard guides the user through the measurement process

� “Fast Scan” Mode increases sample throughput� 250 µm Z-piezo for excellent height resolution in phase shift and

white light interference mode� Z-Motor with 125 mm travel range, allows vertical stitching� Various LED light sources� High resolution 1.4 MP video optic� 150 × 150 mm motorized XY sample stage

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[ 3D Profilometry ]

DHM® 3D Profiler for Real-Time Measurements

The Digital Holographic Microscope (DHM) by LyncéeTec enables sta-tic and dynamic measurements of 3D topographies without any XY- or Z-Scanning. Large area samples can be measured contactless in real-time with nanometer-resolution.MEMS up to 25 MHz can be imaged and characterized over the full field-of-view which provides significantly more information than vibrometry.

� Unrivalled acquisition speed� Real-time 3D topographies with up to 1.000 fps� No need for calibration, virtually maintenance-free� Measurements also in vacuum or in liquids� Huge range of objectives available� Resolution for static samples: 400 nm lateral, 1 nm vertical� Dynamic displacement resolution:

In-plane: 1 nm, Out-of-plane: 5 pm� MEMS excitation up to 25 MHz� Frequency response analysis (Bode, Fourier, Harmonic)

Topography measurement through vacuum window

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[ SEM / Nanoprobing ]

Nanoprobing & Nanomanipulation

The Imina miBOT™ piezo manipulators are the ideal tools for manipu-lation, positioning or probing in the µm and nm ranges.The „portable“ configuration includes the miBase platform for sam-ple sizes up to 2“, to be used in optical microscopes or in SEMs. The „compact“-version allows seamless integration even in difficult geo-metries. The „Nanoprobing“-solution offers sensitive electrical mea-surements with positioning resolution down to 1.5 nm in the vacuum chamber of a SEM.

There is a broad range of applications:� Handling of nanostructures; TEM sample preparation� Electrical 4-Point-Measurements/Characterization of thin films � Testing of fragile samples, isolation of single structures� EBIC/EBAC Failure Analysis� I/V-Measurement on a single transistor or PV-solar cells� MEMS-Characterization� Manipulation of single cells, Preparation of tissue samples� Liquid dispensing

Nanoprobing platform

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Scanning Probe Microscope for use inside a SeM

The NenoVision LiteScope™ is a Scanning Probe Microscope (SPM) developed for easy integration into an Electron Microscope. The system allows simultaneous characterization of a sample area with both SPM and SEM, using a common coordinate system. The unique CPEM-function (Correlative Probe and Electron Microscopy) enables the LiteScope™ to be a strong enhancement of your existing SEM. The System is particularly effective in situations where conventional SEM methods do not give sufficient information on the sample and the extension to quantitative 3D information is relevant. Compared to AFM alone, the combination with SEM offers precise posi-tioning of the AFM tip.

� Surface topography and roughness� Mechanical, electrical and magnetic properties� Compatible with FIB (Focused Ion Beam) � Compatible with GIS (Gas Injection System)� AFM can also be used outside the SEM

CPeM diagram

[ SEM / AFM ]

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[ REM-AFM neuer Banner ]

In-situ Indenter

The compact in-situ indenter allows for dynamic material testing during simultaneous SEM-imaging. Besides indentation, scratch, and micro compression measurements, it enables the examination of crack forma-tion, delamination processes, and many more. Each instrument is indivi-dually adapted to the setup and microscope brand to be used.

� Load forces up to 500 mN with a resolution of 10 µN� Indentation depth: 20 µm (up to 100 µm on request)� Precise positioning using closed-loop piezo actuators with

nm-resolution� Easy installation and unmounting on the SEM positioning stage� Flange and electrical vacuum feedthroughs included

[ SEM / Nano-Indenter ]

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[ CLEM ]

Correlative Light and electron Microscopy (CLeM)

Image of HeLa cellsBlack & White: SeM imageColor: Fluorescence image

Correlative light and electron microscopy combines the versatility of flu-orescence microscopy with the high spatial resolution of electron micro-scopy, linking structural and functional information. The novel Delphi microscope combines both methods in a compact desktop device and on a common hardware and software platform. The overlap of the FM and EM images is achieved with high precision and fully automatically.

� Seamless change between both methods; measurement takes place at the same position on the sample

� Extremely fast: time between loading the sample and correlative imaging < 3 min

� Easy operation thanks to intuitive software� High sample throughput� Samples up to 8 mm in diameter� Color camera to navigate on the sample

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[ Hyperspectral Microscopy ]

Correlative Light and electron Microscopy (CLeM)

Image of HeLa cellsBlack & White: SeM imageColor: Fluorescence image

Darkfield and Hyperspectral Microscopy

The patented CytoViva darkfield optics achieves signal-to-noise ratios far beyond the performance of conventional darkfield optics. This allows label-free visualization of nano-objects even in complex media such as tissues and live cells. The spectrograph collects the reflection spectra of each pixel in a hyperspectral image.

� Easy visualization of particles < 50 nm without fluorescence label� Identification and mapping of nano-objects in complex matrices� SWIR or VNIR spectral range� Reconstruction of 3D darkfield images� Simultaneous real-time imaging of fluorescent and

non-fluorescent sample structures� Characterization of upconversion nanoparticles by laser excitation� Applications: accumulation of nanoparticles in tissue and nano-

toxicity, targeted drug release and long-term studies on living cells

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DLS Nanoparticle analyzer

The Nanolab 3D particle sizer from LS-Instruments is a compact DLS system for the determination of particle sizes and their distributions in a solution. Thanks to the innovative 3D modulation technology, which uses the full suppression of multiple scattering, one can also analyze turbid and highly concentrated solutions.

� Scattering angle: 90°� Particle sizes from 0.15 nm to 5 microns (hydrodynamic radius)� Sample temperature adjustable from 4 °C to 85 °C� Only small sample volumes required 50 µ – 2 ml� Cumulant and CONTIN algorithms� Monitoring of time-dependent processes such as aggregation,

aging, etc.� ISO 22412 compliant� Suitable for nanoparticles, polymers, emulsions, peptides, proteins,

paints, cosmetics, pharmaceuticals, etc.

3D modulation technique is clearly superior to standard DLS at high concentrations

[ Particle Analysis ]

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Optical Microrheology – DWS RheoLab

The novel Rheolab III from LS-Instruments is based on the optical tech-nology named Diffusing Wave Spectroscopy (DWS). This leads to a fast and easy characterization of the deformation and flow behavior of gels, emulsions, suspensions and polymer solutions. The contact free method allows undisturbed measurements in the linear viscoelastic range and is ideal for the study of time-dependent dynamic processes.

� Transparent to opaque samples� Elasticity range is 1.0 Pa – 50 kPa in a frequency range of

0.1 Hz – 1.0 MHz� Viscosity range is 0.1 mPa∙s – 1.0 kPa∙s� Sample temperature adjustable from 4 °C to 90 °C� Intuitive measurement and analysis software� Also suitable for particle size determination� Application areas: Paints, food, cosmetics, pharmaceuticals, etc.

Different rheological behavior of viscoelastic samplesLeft: Shampoo,Right: Fully gelled samples

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[ Nanoindenter / Tribometer ]

Nano-Indentation and Mechanical Testing

The Nano-Indenter G200 is a highly accurate, flexible, and user-friendly instrument for nanoscale mechanical testing. It allows fast nano-inden-tation for properties mapping and enables measurement of deforma-tions from nm- to mm-range. Modular upgrade-options extend the capabilities to accommodate a variety of applications, like frequency-specific testing, quantitative scratch and wear testing, integrated probe-based imaging, high-temperature testing, expanded load capacity up to 10 N and customizable test protocols.

� Accurate, repeatable results compliant with ISO 14577 and ASTM 2546 standards

� Electromagnetic actuation for unparalleled dynamic force & displacement range

� Configurable for optimized routine testing or new applications � Modular options for imaging scratch, high-temperature,

and dynamic testing � Outstanding software with real-time experimental control and

easy test protocol development

Applications:Semiconductor, thin films, hard coatings, DLC films, composite materials, concrete, polymers, metals, ceramics, biomaterials

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Universal Testing Machine T150 UTM

The Universal Testing Machine T150 UTM offers researchers a superior means of nanomechanical characterization by utilizing a nanomechani-cal actuating transducer head to produce tensile force. The T150 UTM enables researchers to understand dynamic properties of compliant fibers via a large dynamic range and high resolution (five orders of mag-nitude of storage and loss modulus).

� Load cell delivers high sensitivity over large range of strain

� Flexible and upgradable for repeatable or new applications

� Software offers real-time experimental control and easy development of test protocols

Applications:� Dynamic studies of fibers and bio-

logical materials� Tensile and compression studies

of polymers� Yield of compliant fibers and bio-

logical materials

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Tribotester

DUCOM is a leading manufacturer of testers for the study of mechanical or tribological material properties in research and industry. The range of systems for material-characterization includes wear-tests using the „Pin/Ball on Disc“-method, in particular at high temperatures, under controlled humidity, or in vacuum.

� Choice of heating methods: Oven, inductive, resistive� Temperatures up to 400 / 600 / 1000 °C� Rotational speed 500 rpm or up to 2000 rpm� Load forces controllable up to 1000 N

Typical application areas are:� Test of car parts: Break shoes, gearshifts, ball bearings, and more� Tests on wear parts such as e.g. drill heads

Also available: Specific bio-tribometers as single or multiple testing stations with inde-pendent load control for tests of joint implants, dental implants, and biological liquids.

[ Nanoindenter / Tribometer ]

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Lubricant-Tester

For the screening of lubricants we offer a range of specific DUCOM testers: The Four Ball Tester with up to 3000 rpm and applicable force of 10 kN, as well as the Roller-on-Roller Tribometer, also available as Roller-on-Pin, -Ball, or -Block setup. Each element has an independent setting of rotational speed and rotational direction.

Typical applications are: � Screening of gear oils or other lubricants for high force transmission � Study of tribological interaction of steel and lubricants up to 120 °C� Investigation of fatigue behavior of materials in

ball bearings or train wheels � Test of lubricants for EP (extreme pressure),

WP (wear preventive), Friction and Fatigue� Study of wear behavior under addition of nanoparticles � Test of lubricating effect of biodegradable oils

in comparison to mineral oils� In dry operation: examination of metal forming at 700 °

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BDL 800IR-MCP LeeD optics with shutter and linear retraction

LeeD / AeS Spectrometers

The OCI INTEGRALEED series offers flexible solutions for LEED / AES sur-face analysis applications for a broad range of crystal surfaces (insula-tors, SAM structures, semiconductors, metals), as well as electron and ion guns with optional raster scan electronics. LEED/AES systems can be delivered separately or as a complete UHV spectroscopy system.

� LEED optics on CF-63, CF-100 or CF-150 mounting flanges� Single MCP, Dual MCP or Delay Line Detector LEED,

currents down to fA� AES option for LEED optics or CMA-AES spectrometer� Sample preparation- and deposition systems LEED-MBE250,

integrated MBE system IMBE300, mini-analytical system MAS120� Miniature electron gun or ion sputtering guns up to 3 kV,

on CF-16 or CF-35 flange� Digital Raster Scan Electronics for electron and ion guns

[ Structure Analysis ]

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[ Measurement and Control ]

Vacuum Measurement and Components

For the measurement of vacuum in the range of 1010 – 103 mbar, we offer a variety of gauges and measuring systems with analog and digi-tal display. In addition, we also supply vacuum components and feed-throughs as well as the reliable VACSEAL leak sealant spray.

� Low-cost analog and digital vacuum gauges and controllers� Battery operated portable vacuum gauge� Bayard-Alpert ionization gauge for UHV� Gauges: thermocouple or dual sensor design

(thin film Pirani / piezo resistive)� Reference tubes for quick and easy on-site calibration of

vacuum devices� Gas type independent absolute pressure sensors� Vacuum feedthroughs: current, voltage and thermocouple

feedthroughs for UHV, high-pressure, low or high temperature applications

� Ceramic-Metal- or Glass-Ceramic components� VACSEAL leak sealant spray for HV / UHV systems: for the usage

from LHe-temperatures up to 450 °C

HPM-2002-OBeDual-sensor vacuum gauge

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Mass Flow Measurement and Control of Gases

The inherently linear, thermal mass flow meters and controllers from Teledyne Hastings Instruments are used both in the laboratory and in industrial environments. The measurement / control of the gas mass flow rate is independent of pressure and temperature.

� Measuring ranges: selectable between 0 – 5 ml/min and 0 – 15,000 l/min, depending on the model

� NeW: 300Vue Series with color touchscreen display and IP-67 enclosure option

� High accuracy and repeatability� Fast response times: from 300 ms� Analog outputs: 0 – 5 V and 0 – 10 V or 0 – 20 mA and 4 – 20 mA� Digital interfaces: RS 232 or RS 485� Various fittings: Swagelok, VCR, VCO or flange� Single and multi-channel power supplies and display devices with

RS 232 interface and front side keyboard, master-slave function, FlowSoft software

� Calibration and repair services

[ Measurement and Control ]

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Magnetic Field Measurement

Our broad range of instruments to measure magnetic fields covers requirements from a simple handheld unit to a highly accurate research tool. Typical applications are the quality control of permanent magnets, testing the efficiency of magnetic field shielding, control of accelerator magnets, calibration of magnetic standards, and many more.

� Hall-Effect Teslameter, NMR-Teslameter, Fluxmeter� Single axis or 3-axis� Field strengths from earth magnetic field to 20 T� Resolution down to < 0.1 µT� Extremely compact probes� Probe arrays � Probes with USB-connection� Battery operated handheld units� Table-top instruments with Display and RS232/IEEE� Digital Integrator with a 250 kHz trigger rate

Digital teslameter DTM-151

3-axis magnetometer THM

Schaefer Technologie GmbH

Robert-Bosch-Straße 3163225 Langen, Germanyphone + 49 - 61 03 - 300 98 0info@schaefer-tec.com

Schaefer-Tec AG

Industrie Neuhof 93422 Kirchberg, Switzerlandphone + 41 - 34 - 423 70 70info@schaefer-tec.ch

Schaefer SEE s.r.l.

Odobesti Street 1Building C4, Office 1101800509 Galati, Romaniaphone + 40 - 33 - 640 17 18romania@schaefer-tec.com

Schaefer Techniques Sarl

1, Allée des Garays91120 Palaiseau, Francephone + 33 - 1 - 6449 6350info@schaefer-tech.com

Schaefer SEE SRL

Via Luigi Einaudi 23Area M. Tosi45100 Rovigo, Italyphone + 39 - 0425 - 46 02 18info@schaefer-tec.it

Are you looking for solutions? Do you wish to receive an offer? Please contact your nearest Schaefer office.

www.schaefer-tec.com