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Professor N Cheung, U.C. Berkeley
Lecture 19EE143 F2010
VDD
GND
Select mask(dark field & clear field)
P-well mask(dark field)
Note body contacts:• p-well to GND• n-substrate to VDD
CMOS Inverter Layout
PMOSW/L=9/2
NMOSW/L=3/2
Active(clear field)
Gate(clear field)
Contact(dark field)
Metal(clear field)
Professor N Cheung, U.C. Berkeley
Lecture 19EE143 F2010
Visualizing Layouts and Cross-Sections with SIMPLer
SIMPL is a CAD tool created by Prof. Neureuther’s group
• allows IC designers to visualize device cross-sections corresponding to a fabrication process and physical layout.
A Berkeley undergraduate student, Harlan Hile, created a mini-version of SIMPL (called SIMPLer) for EE40.
• It’s a JAVA program -> can be run on any computer, as well as on a web
server.• A 3D version SIMPL-GL can be accessed at
http://cuervo2.eecs.berkeley.edu/Volcano/simpl_gl/main.htm
Professor N Cheung, U.C. Berkeley
Lecture 19EE143 F2010
Professor N Cheung, U.C. Berkeley
Lecture 19EE143 F2010
Professor N Cheung, U.C. Berkeley
Lecture 19EE143 F2010
Professor N Cheung, U.C. Berkeley
Lecture 19EE143 F2010
Professor N Cheung, U.C. Berkeley
Lecture 19EE143 F2010
Professor N Cheung, U.C. Berkeley
Lecture 19EE143 F2010
Define active areas; etch Si trenchesFill trenches (deposit SiO2 then CMP)
Twin Well + STI CMOS Process
Form wells (implantation + thermal anneal)
Grow gate oxideDeposit poly-Si and pattern gate electrodes
Implant source/drain and body-contact regionsActivate dopants (thermal anneal)
Deposit insulating layer (SiO2); planarize (CMP)Open contact holes; deposit & pattern metal layer
Professor N Cheung, U.C. Berkeley
Lecture 19EE143 F2010
9
3D view of a CMOS inverter after contact etch.
Professor N Cheung, U.C. Berkeley
Lecture 19EE143 F2010
10
Well Engineering
P-tub
N-tub
Twin Tub
Professor N Cheung, U.C. Berkeley
Lecture 19EE143 F2010
11
Twin Well CMOS Process Flow
Professor N Cheung, U.C. Berkeley
Lecture 19EE143 F2010
12
C(x)
x
Conventional well (depth and profilecontrolled by diffusion drive-in)
Retrograde well (depth and profilecontrolled by implantation energy and dose)
Retrograde Well
- formed by high energy (>200keV) implantation
Professor N Cheung, U.C. Berkeley
Lecture 19EE143 F2010
13
1) Very low thermal budget for well formation (no need for diffusion drive-in)
2) Retrograde Well is formed AFTER field oxidation small lateral diffusion and localized high conc under FOX
Conventional vs Retrograde Well
Professor N Cheung, U.C. Berkeley
Lecture 19EE143 F2010
14
Example: Formation of Channel Stop and Retrograde Wellin a single step
Channel stopRetrograde well
Professor N Cheung, U.C. Berkeley
Lecture 19EE143 F2010
15
Multiple Implants for Well Engineering
Professor N Cheung, U.C. Berkeley
Lecture 19EE143 F2010
N Cheung EE243 Sp2010 Lec 116
Channel Engineering
ShallowOxide TrenchIsolation
Professor N Cheung, U.C. Berkeley
Lecture 19EE143 F2010
17
Generic Silicon-on-Insulator (SOI) CMOS Process Flow
Professor N Cheung, U.C. Berkeley
Lecture 19EE143 F2010
18
SOI Process Flow (continued)
Professor N Cheung, U.C. Berkeley
Lecture 19EE143 F2010
19
Smallest featureprintable bylithography
SiO2
CVD oxide CVD oxide
n+ n+ n+ n+
poly-Si gate
Thermal gate oxide
Oxide spacer
AngledImplantn+ pocket
NormalS/D implant
TiSi2
Self-Aligned Channel V-gate by Optical Lithography(SALVO) Process
* Sub-50nm channels
Professor N Cheung, U.C. Berkeley
Lecture 19EE143 F2010
20
or
SALVO Process Flow
Chang et al, IEDM 2000
See Homework Problem
Professor N Cheung, U.C. Berkeley
Lecture 19EE143 F2010
21
SUMMARY OF IC PROCESS INTEGRATION MODULE
•Self aligned techniques: channel stop, Source/Drain, LDD, SALICIDE•How to read process flow descriptions and cross-sections•Generic NMOS Process with LOCOS•Generic CMOS Process with LOCOS and single well•Modified Processes: •Shallow Trench Isolation (STI), Twin Wells, Retrograde Well, SOI CMOS