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References
Chapter 2
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3.98 W.e. Dautremont-Smith, J.e. Nabity, V. Swaminathan, M. Stavola, J. Chevallier, C. W. Tu, S.J. Pearton: Appl. Phys. Lett. 49, 1098 (1986)
3.99 J.C. Nabity, M. Stavola, J. Lopata, W.C. Dautremont-Smith, e.W. Tu, S.J. Pearton: Appl. Phys. Lett. 50, 921 (1987)
3.100 D.V. Lang, R.A. Logan, M. Jaros: Phys. Rev. B 19, 1015 (1979) 3.101 H.-J. Queisser: Proc. 17th lnt'{ Conf. Physics of Semicond., ed. by D. J. Chadi,
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Chapter 4
4.1 S.J. Pearton, J.W. Corbett, T.S. Shi: Appl. Phys. A 43, 153 (1987) 4.2 J.W. Corbett, J.L. Lindstrom, S.J. Pearton: Mat. Res. Soc. Symp. Proc. 104, 229
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N.M. Johnson, M.D. Moyer: Appl. Phys. Lett. 46, 787 (1985) 4.14 J.I. Pankove, e.W. Magee, R.O. Wance: Appl. Phys. Lett. 47,748 (1985) 4.15 A.J. Tavendale, D. Alexiev, A.A. Williams: Appl. Phys. Lett. 47, 317 (1985) 4.16 T. Zundel, E. Courcelle, A. Mesli, J.C. Muller, P. Siffert: Appl. Phys. A 40, 67
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4.17 N.M. Johnson: Appl. Phys. Lett. 47, 874 (1985) 4.18 G.G. DeLeo, W.B. Fowler: Phys. Rev. B 31, 6861 (1985)
337
4.19 J.I. Pankove, D.J. Zanzucchi, C.W. Magee, G. Lucovsky: Appl. Phys. Lett. 46, 421 (1985)
4.20 G.G. DeLeo, W.B. Fowler: In Proc. 13th In!,1 Conf. Defects in Semicond., ed. by L. C. Kimerling, J. M. Parsey, Jr. (Metalurgical Soc. AIME, Warrendale, PA 1985) Yol.l4a, p.745
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4.22 M. Stavola, S.J. Pearton, J. Lopata, W.e. Dautremont-Smith: Phys. Rev. B 37, 8313 (1988)
4.23 G.G. DeLeo, W.B. Fowler: Phys. Rev. Lett. 56, 402 (1986) 4.24 K. Bergman, Michael Stavola, S.J. Pearton, T. Hayes: Phys. Rev. B 38, 9643
(1988) 4.25 C.G. Yan de Walle, Y. Bar-Yam, S.T. Pantelides: Phys. Rev. Lett. 60, 2761
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(1986) 4.28 S.J. Pearton, A.J. Tavendale, A.A. Williams, D. Alexiev: In Semiconductor Sili
con, ed. by H.R. Huff (Electrochem. Soc., Pennington, NJ 1986) p.826 4.29 S.J. Pearton, A.J. Tavendale: Presented at Gordon Conf. on Point Defects, Line
Defects and Interfaces in Semiconductors, Plymouth, NH (July 1985) 4.30 C.T. Sah, S.C.S. Pan, C.C.H. Hsu: J. Appl. Phys. 57, 5148 (1985) 4.31 H. Reiss: J. Chern. Phys. 25, 681 (1956) 4.32 J. Wang, C.A. Kittel: Phys. Rev. B 7, 713 (1973) 4.33 Y.A. Singh, C. Weigel, J.W. Corbett, L.M. Roth: Phys. Stat. Sol. 81, 637 (1977) 4.34 H. Katayama-Yoshida, K. Shindo: J. Electron. Mater. 14a 773 (1985) 4.35 A. Mainwood, A.M. Stoneham: J. Phys. C 17, 2513 (1984) 4.36 P. Deak, L.C. Snyder, J.W. Corbett: Phys. Rev. B 37, 6887 (1988)
P. Deak, L.C. Snyder: Rad. Eff. & Defects in Solids III & I12, 77 (1989) 4.37 S.T. Pantelides: Appl. Phys. Lett. 50, 995 (1987) 4.38 G.G. DeLeo, W.B. Fowler: In Hydrogen ill Semiconductors, ed. by J.I. Pankove,
N.M. Johnson (Academic, San Diego 1991) 4.39 N.M. Johnson, C. Herring: Phys. Rev. B 38, 1581 (1988) 4.40 M. Capizzi, A. Mittiga: Appl. Phys. Lett. 50, 918 (1987) 4.41 S. Estreicher: Phys. Rev. B 36, 9122 (1987) 4.42 L.Y.C. Assali, J.R. Leite: Phys. Rev. Lett. 54, 980 (1985); also Phys. Rev. Lett.
55,403 (1986) 4.43 E.C.F. da Silva, L.Y.C. Assali, J.R. Leite, A. Dal Pino, Jr.: Phys. Rev. B 37,
3113 (1988) 4.44 M. Balkanski, R.J. Elliott, W. Nazarewicz, P. Pfeuty: In Lattice Defects in Semi
conductors, ed. by R.R. Hasigati (Univ. of Tokyo Press, Tokyo 1968) p.3 4.45 A.D. Marwick, G.S. Oehrlein, N.M. Johnson: Phys. Rev. B 36, 4539 (1987) 4.46 A.D. Marwick, G.S. Oehrlein, J.H. Barrett, N.M. Johnson: MRS Proc. 104,259
(1988) 4.47 B. Bech Nielsen, J.U. Andersen, S.J. Pearton: Phys. Rev. Lett. 60, 32) (1988) 4.48 Th. Wichert, H. Skudlick, M. Deicher, G. Grube), R. Keller, E. Recknagel, L.
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R. Keller, L. Song, M. Stutzmann: MRS Proc.l04, 265 (1988) 4.50 T. Zundel, J. Weber: Phys. Rev. B 39, 13549 (1989) 4.51 K. Muro, A.J. Sievers: Phys. Rev. Lett. 57, 897 (1986) 4.52 E.E. Haller, B. Joos, L.M. Falicov: Phys. Rev. B 24, 4729 (1980) 4.53 J.M. Kahn, R.E. Murray, Jr., E.E. Haller, L.M. Falicov: Phys. Rev. B 36, 8001
(1987)
338
4.54 A.J. Tavendale, S.J. Pearton, A.A. Williams: App!. Phys. Lett. 56, 949 (1990) 4.55 J. Zhu, N.M. Johnson, C. Herring: Phys. Rev. B 41, 12354 (1990) 4.56 R. Car, P.J. Kelly, A. Oshiyama, S.T. Pantelides: Phys. Rev. Lett. 52, 1814
(1984) 4.57 A. Amore-Bonapasta, A. Lappiccirella, N. Tomassini, M. Cappizzi: Phys. Rev. B
36, 6228 (1987) 4.58 A. Amore-Bonapasta, A. Lappiccirella, N. Tomassini, M. Cappizzi: Mat. Sci.
Forum, 38-41, 1057 (1989) 4.59 K. Bergman, M. Stavola, S.J. Pearton, J. Lopata: Phys. Rev. B 37, 2770 (1988) 4.60 K. Bergman, M. Stavola, S.J. Pearton, J. Lopata: MRS Proc. 104,291 (1988) 4.61 J. Chevallier, W.C. Dautremont-Smith, C.W. Tu, S.J. Pearton: App!. Phys. Lett.
47,108 (1985) 4.62 S.J. Pearton, W.C. Dautremont-Smith, J. Chevallier, C.W. Tu, K.D. Cummings:
J. App\. Phys. 59, 2821 (1986) 4.63 J. Chevallier, W.C .. Dautremont-Smith, S.J. Pearton, C.W. Tu, A. Jalil: Proc.3rd
Int'l Symp. Dry Etching and Plasma Deposition in Microelectronics (Cathan, France) Vide 40, 121 (1985)
4.64 Y. Chung, D.W. Langer, R. Becker, D.C. Look: IEEE. Trans. ED-32, 410 (1985) 4.65 Y. Chung, C.Y. Chen, D.W. Langer, Y.S. Park: J. Vac. Sci. Technol. BI, 799
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(1986) 4.68 J. Weber, F. Bantien, S.J. Pearton, W.C. Dautremont-Smith: In Proc. 14th Int'l
Coni. De/ects in Semicond., ed. by H.J. Von Barde1eben (Trans. Tech., Aedermannsdorf 1986) p.579
4.69 B. Pajot, R.C. Newman, R. Murray, A. Jalil, J. Chevallier, R. Azouay: Phys. Rev. B 37, 4188 (1988)
4.70 A. Jalil, J. Chevallier, J.C. Pesant, R. Mostefaoui, B. Pajot: Appl. Phys. Lett. 50, 439 (1987)
4.71 S.J. Pearton, W.C. Dautremont-Smith, J. Lopata, C.W. Tu, C.R. Abernathy: Phys. Rev. B 36, 4260 (1987)
4.72 S.J. Pearton, W.C. Dautremont-Smith, C.W. Tu, J.C. Nabity, V. Swaminathan, M. Stavola, J. Chevallier: In GaAs and Rei. Compowlds. 1986, ed. by W. T. Lindley, lost. Phys. Conf. Ser. 83,289 (Inst. Phys., Bristol, UK 1987) p.289
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4.74 N.M. Johnson, R.D. Burnham, R.A. Street, R.C. Thornton: Phys. Rev. B 33, 1102 (1986)
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4.76 J. Chevallier, B. Pajot, A. Jalil, R. Mostefaoui, R. Rahbi, M.C. Boisy: MRS Proc. 104,281 (1988)
4.77 W.C. Dautremont-Smith: MRS Proc. 104,313 (1988) 4.78 G.S. Jackson, N. Pan, M.S. Feng, G.E. Stillman, N. Holonyak, Jr., R.D. Burn
hum: App\. Phys. Lett. 51, 1629 (1987) 4.79 R. Murray, R.C. Newman, P.S. Nandhea, R.B. Beall, J.J. Harris, P.J. Wright:
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(1985) 4.84 L. Svob, Y. Marfaing: Solid St. Commun. 58, 343 (1986)
339
4.85 J. Weber, M. Singh: MRS Proc. 104,325 (1988) M. Singh, J. Weber: Appl. Phys. Lett. 54, 424 (1989)
4.86 M. Jaros, S. Brand: J. Phys. C 12,525 (l979) 4.87 R.E. McMurray, Jr., N.M. Haegel, E.E. Haller, L.M. Falicov: Solid State
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in Semicond., ICDS-15, Budapest, 1988 (Trans Tech, Aedermannsdorf 1989) pp.1 063-1 067
4.91 e.G. Crokes, D. Lancefield, K. Waterhouse, A. Adams, D. Greene, R. Glen: Electronics Lett. 15,369 (1990)
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Pankove, N.M. Johnson (Academic, New York 1990)
Chapter 5
5.1 M. Stavola, S.J. Pearton: In Hydrogen in Semiconductors, ed. by J.1. Pankove, N.M. Johnson (Academic, San Diego 1991) p.139
5.2 J. Chevallier, B. Clerjaud, B. Pajot: In Hydrogen in Semiconductors, ed. by J.I. Pankove, N.M. Johnson (Academic, San Diego 1991) p.447
5.3 G. Davies: In Defects in Electronic Materials, ed. by M. Stavola, S.J. Pearton, G. Davies (MRS, Pittsburgh 1988) p.65
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Stradling, P.C. Klipstein (Hilger, Bristol 1990) p.I05 5.8 J.1. Pankove, P.J. Zanzucchi, C.W. Magee, G. Lucovsky: Appl. Phys. Lett. 46,
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5.13 G.G. DeLeo, W.B. Fowler: J. Elect. Mater. 14a, 745 (1985) 5.14 G.G. DeLeo, W.B. Fowler, Phys. Rev. B 31, 6861 (1985) 5.15 L.Y.C. Assali, J.R. Leite: Phys. Rev. Lett. 55,980 (1985) 5.16 L.Y.e. Assali, J.R. Leite: Phys. Rev. Lett. 56, 403 (1986)
340
5.17 M. Stavola, S.J. Pearton, J. Lopata, W.C. Dautremont-Smith: Appl. Phys. Lett. 50, 1086 (1987)
5.18 M. Stutzman, C.P. Herrero: In De/ects in Electronic Materials, ed. by M. Stavola, S.J. Pearton, G. Davies (MRS, Pittsburgh, PA 1988) p.271
5.19 E.C.F. da Silva, L.V.c. Assali, J.R. Leite, A. Dal Pino Jr.: Phys. Rev. B 37, 3113 (1988)
5.20 A. Amore-Bonapasta, A. Lapiccirella, N. Tomassini, M. Capizzi: Phys. Rev. B 36,6228 (1987)
5.21 K.J. Chang, D.J. Chadi: Phys. Rev. Lett. 60, 1422 (1988) 5.22 P.J.H. Denteneer, C.S. Nichols, C.G. Van de Walle, S.T. Pantelides: In Proc. 19th
Inl'l Coni. on the Physics 0/ Semiconductors, ed. by W. Zawadzki (lnst. Phys. Polish Academy of Science, Warsow 1988) p.999
5.23 P.J.H. Denteneer, C.G. Van de Walle, Y. Bar-Yam, S.T. Pantelides: In De/ects in Semiconductors 15, ed. by G. Ferenczi (Trans Tech, Aedermannsdorf 1989)
5.24 P.J.H. Denteneer, C.G. Van de Walle, S.T. Pantelides: Phys. Rev. B 39, 10809 (1989)
5.25 C.G. Van de Walle, P.J.H. Denteneer, Y. Bar-Yam, S.T. Pantelides: In Shallow Impurities in Semiconductors 1988, ed. by B. Monemar (lOP, Bristol 1989) p.405
5.26 S.K. Estreicher, L. Throckmorton, D.S. Marynick: Phys. Rev. B 39, 13241, (1989)
5.27 M. Stutzman, C.P. Herrero: Appl. Phys. Lett. 51, 1413 (1987) 5.28 M. Stavola, S.J. Pearton, J. Lopata, W.C. Dautremont-Smith: Phys. Rev. B 37,
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(lOP, Bristol 1989) p.425 5.33 E.E. Haller: In Hydrogen in Semiconductors, ed. by J.I. Pankove, N.M. Johnson
(Academic, San Diego 1991) p.351 5.34 K. Muro, A.J. Sievers: Phys. Rev. Lett. 57, 897 (1986) 5.35 M. Stavola, K. Bergman, S.J. Pearton, J. Lopata: Phys. Rev. Lett. 61, 2786
(1988) 5.36 C.P. Herrero, M. Stutzman: Solid State Commun. 68, 1085 (1989) 5.37 M. Cardona: Phys. Stat. Sol. (b) 118,463 (1983) 5.38 G.G. DeLeo, W.B. Fowler: Bull. Am. Phys. Soc. 34, 834 (\989) 5.39 D.R. Bosomworth, W. Hayes, A.R.L. Spray, G.D. Watkins: Proc. Roy. Soc.
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ed. by W. Zawadzki (Inst. Phys., Polish Academy of Science, Warsaw 1988) p.1147
5.43 B. Pajot, A. Chari, M. Aucouturier, M. Astier, A. Chantre: Solid State Commun. 67, 855 (1988)
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In/rared and Raman Spectra 0/ Polyatomic Molecules (Van Nostrand, New York 1945) pp.215-218,266
5.48 N.M. Johnson, C. Herring, D.J. Chadi: Phys. Rev. Lett. 56, 769 (1986) 5.49 K. Bergman, M. Stavola, S.J. Pearton, J. Lopata: Phys. Rev. B 37, 2770 (1988) 5.50 K. Bergman, M. Stavola, S.J. Pearton, J. Lopata: In De/ects in Electronic Materi-
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(1990) 5.54 A. Amore-Bonapasta, A. Lapiccirella, N. Tomassini, M. Capizzi: In De/ects in
Semiconductors 15, ed. by G. Ferenczi (Trans Tech, Aedermannsdorf 1989) p.l051
5.55 P.J.H. Denteneer, e.G. Van de Walle, S.T. Pantelides: Phys. Rev. B 41, 3885 ( 1990)
5.56 S.B Zhang, D.J. Chadi: Phys. Rev. B 41, 3882 (1990) 5.57 S.J. Pearton, J.W. Corbett, T.S. Shi: Appl. Phys. A 43, 153 (1987) 5.58 S.J. Pearton, M. Stavola, J.W. Corbett: In De/ects ill Semiconductors 15, ed. by
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Chapter 6
6.1 B. Pajot: In Impurities. Defects and Diffusion in Semiconductors: Bulk and Layered Structures, ed. ·by D.F. Wolford, J. Bernhole, E.E. Haller (MRS, Pittsburgh 1990) p,465
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Chapter 7
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Chapter 8
8.1 G.D. Watkins, J.R. Troxell, A.P. Chatterjee: In Defects alld Radiation Effects ill Semiconductors 1978 ,lnst. Phys. Conf. Ser. 46, 16 (lOP, Bristol 1979)
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348
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Chapter 10
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10.56 M. Deicher, G. GrUbel, E. Recknagel, H. Skudlik, Th. Wichert: Hyperfine Int. 35,719 (1987)
10.57 D. Forkel, F. Meyer, W. Witthuhn, H. Wolf. In Proc. 7th Int'l Conf. on Hyperfine Interactions, Bangalore, India (1986)
10.58 W. Witthuhn: Hyperfine Interactions 24-26,547 (1985) 10.59 H. Wolf, S. Deubler, D. Forkel, H. FOttinger, M. Iwatschenko-Borho, F. Meyer,
M. Renn, W. Witthuhn: In Defects in Semiconductors, ed. by H.J. von Bardeleben (Trans Tech, Aedermannsdorf 1986) p.363
10.60 W. Hartree, D.R. Hartree, M.F. Manning: Phys. Rev. 60, 837 (1941) 10.61 H.L. Donley: Phys. Rev. 50, 1012 (1936) 10.62 L. Biermann, K. LUbeck: Z. Astrophys. 25, 325 (1948) 10.63 R.G. Barnes, W.V. Smith: Phys. Rev. 93, 95 (1954) 10.64 G.D Watkins, J.W. Corbett: Phys. Rev. 121, 1001 (1961)
Chapter II
11.1 S.J. Pearton, A.J. Tavendale, A.A. Williams, D. Alexiev: In Semiconductor Sili-con, ed. by H.R. Huff (Electrochem. Soc., Pennington, NJ 1986) p.826.
11.2 S.J. Pearton, J.W. Corbett, T.S. Shi: Appl. Phys. A 43, 153 (1987) 11.3 C.H. Seager, R.A. Anderson, J.K.G. Panitz: J. Mater. Res. 2, 96 (1987) 11.4 M. Grunder, H. Jacob: Appl. Phys. A 39, 3206 (1986) 11.5 A. Schnegg, M. Grunder, H. Jacob: In Semiconductor Silicon 1986, ed. by H.R.
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P.S. Ho: MRS Proc. 54, 645 (1986) 11.33 T. Zundel, J. Weber, B. Benson, P.O. Hahn, A. Schnegg, H. Prigge: App!. Phys.
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ll.41 S. Estreicher: Phys. Rev. B. 41, 9886 (1990) 11.42 W. Przyborski, J. Roed, J. Lippert, L. Sarholb-Kristensen: Rad. Eff. 1, 33
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Device Meeting Tech. Dig. 162 (1985) 11.51 A. Mogro-Campero, R.P. Love, M.F. Chang, R.F. Dyer: IEEE EDL-6, 224
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Chapter 12
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360
Subject Index
AA925,262 AB site 235 Acceptors 63 Acceptor passivation 14,63,93,103,137 Ag 32 AIGaAs 54 Apparent diffusivity 224 Ar 42 AsH3 170,31 I Atomic hydrogen 1,4, 10 Au 29,30
BC site 235 Be-H (in GaAs) 137 Be-H (in Gc) 186 Be-H (in Si) 14 Bias drift 232 BN 100 Boiling in water 5,92,282 Boltzmann-Matano 204 Bourgoin-Corbctt mcchanism 175 BP 100
Carbon 43 CdTe 28,57,96 CdI-lgTe 57 CF4 41 Chcmisorption 170 Channelling 72 Charge states 239 Chemical etching 288 Cluster calculations 154 Co 32 Compcnsation 69 CNDO 25 Cr 34 Cu 34,300 CYD 296
Deep levels 28 Defccts 41 Defcct symmetry 83 Deutcrium 6,144,147 Dcv ice applications 316
Dichroic 130 Diffusion-hydrogen 200 Diffusion path 234 DLTS 306 Donors 14 Donor passivation 83 Drift 77 Dynamic motion 103,152 OX ccnters 54
Effective diffusivity 20 I Einstein relation 203 EL252 Electron field gradient 275 Electron-hole pairs 181 Electron irradiation 175 Electron mobility 86 Electron traps 179 Embrittlement 5,319 EPR 10,258 Ex tcnded H uckcl thcory 10
Fe 29 Fcrmi level 179 Fick's laws 203 Frenkel pairs 179 FfIR 185
GaAs4 GaAs-on-Si 4,3 I3 GaP 24,97 GaSb 255 Gauss law 203 Ge 4,98 Grain boundaries 244
Halogcn lamps 288 Hartree-Fock cakulation 83 He 8 HgCdTe 4 Hole traps 179 Hydrogen - implantation 9 - incorporation 259
361
- molecules 245 - plasmas 5,6,7,262 - related defects 182, 188 - related donors 182
Implant-induced levels 182 Infrared frequencies 196 InP 99,309 InSb 255 Interstitials 10,12 Ion beam processing 312 Ion bombardment 292 Isotope shift 140
Kinetics 129
Leakage current 28 LEC 259 LIthIUm 46 Local density function theory 18 Local modes 103,110
M13E 53 Metal deposition 296 Metallic impurities 28,32 Mg 137 Microscopic characteristics 137 MINDO 17,36,157 Minority carrier - annealing 80 - lifetime 28 MNDO 50 Mo 30 MOCVD 309 Molecular dynamics calculations 242 Molecular formation 208 MOSFETs 284,308 Multiple trapping 214 Muonium 24,101,263
Na 50 Neutron - irradiation 178 - transmutation doping 182 Neutralization 77 Ni 30
038 ODENDOR 268 Oxidation 170
PAC 271 Pairing 68,69 Passi vation 28
362
Pd 30 Permeability 222 PH3 311 Phonon interactions 200 Photoluminescence 86 Pick-off reactions 77 Plasma etching 159 Platelets 241 Point defects 232 Prehydrogenation 49 Proton implantation 164,178,305 Pt 30
Quenching 45
Radiation damage 45 Raman spectroscopy 107,328 Reactive ion etching 282 Reactivation 73,85 Reorientation 121 Resonance techniques 258 Rh 32
S 36 Schottky diodes 291 Se 36 Self-interstitials 175 SF6 293 Sidebands 105 Si 1,4,28 SiGe 46 SIMS 6,68 Si02 283 Sn-H (in GaAs) 143 Solar cells 4 Solubility 245 Sputter - etching 44 - deposition 282 STM 173 Stress 121
Td site 278 Te 36 TEM 326 Thermal stability 47,73 Ti 34 Total energy calculation 19 Trigonal symmetry 120 Tunnelling motion 132, 186
Uniaxial stress 83,126 Unintentional hydrogenation
148,282