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Session 4Session 4
Atomic Mass SpectrometryAtomic Mass Spectrometry
Comparison of different Comparison of different techniques for trace analysistechniques for trace analysis
Crucial steps in atomic Crucial steps in atomic spectroscopies and -metries and spectroscopies and -metries and
other methodsother methods
Adapted from www.spectroscopynow.com (Gary Hieftje)
Solid/liquid sample Solution
Molecules in gas phase
Sample preparation
Nebulisation
Atomisation=Dissociation
Vaporisation
Desolvation
Atoms in gas phase
IonsExcited Atoms
Laser ablation etc.
Sputtering, etc.
ICP-MS and other MS methods(also: ICP-OES) AAS and AES,
X-ray methods
IonisationExcitation
M+ X-
MX(g)
M(g) + X(g)
M+
ICP-MSICP-MS Mass spectrometry method: detects ions Mass spectrometry method: detects ions
distinguished by their mass-to-charge ratio distinguished by their mass-to-charge ratio (m/z value)(m/z value)
Based on Based on ions moving under influence of ions moving under influence of electrical or magnetic fieldelectrical or magnetic field
Mass analysers generally require operation Mass analysers generally require operation under vacuum, to avoid ions colliding with under vacuum, to avoid ions colliding with other particlesother particles
Recommended series of short articles: Robert Recommended series of short articles: Robert Thomas: A beginner’s guide to ICP-MS Thomas: A beginner’s guide to ICP-MS
ICP-MS instrumentation and ICP-MS instrumentation and principleprinciple
Plasma generatesPlasma generates
positive ionspositive ions
nebuliser
Spray chamber
Detector (e.g. electron multiplier)
Sorted by Sorted by mass analyser, mass analyser, e.g. quadrupole, e.g. quadrupole, magnetic sector, magnetic sector, according to m/z ratioaccording to m/z ratio
http://www.cee.vt.edu/ewr/environmental/teach/smprimer/icpms/icpms.htm
Under vacuum
sample
Interface
55
ICP Torch
Mass Analyser:Quadrupole
Collision cellDetector(discrete dynode)
Cones and Ion Optics
ICP-MS instrumentationICP-MS instrumentation
Modern instrument with collision/reaction cell
Sampling cone
Skimmer cone
Recap: Ion formation in an Recap: Ion formation in an inductively-coupled plasmainductively-coupled plasma
Mostly, singly Mostly, singly charged positive charged positive ions are ions are generated (>90% generated (>90% efficiency)efficiency)
Interface and ion opticsInterface and ion optics
Major challenge in instrumentation: large differences in temperature and pressure. Interface Major challenge in instrumentation: large differences in temperature and pressure. Interface (consisting of two cones) allows connecting ion source to mass analyser (requires vacuum)(consisting of two cones) allows connecting ion source to mass analyser (requires vacuum)
Lens focuses ions. Necessary for getting as many ions as possible into analyser (maximising Lens focuses ions. Necessary for getting as many ions as possible into analyser (maximising signal)signal)
6000 K, ambient pressure
Room temperature,vacuum
ICP torch
Mass analysers for ICP-MSMass analysers for ICP-MS Quadrupole: High mass stability, fastQuadrupole: High mass stability, fast
Lowest cost optionLowest cost option Time-of-Flight (rare)Time-of-Flight (rare) HR (High-resolution): Uses magnetic sector mass HR (High-resolution): Uses magnetic sector mass
analyseranalyser Highest sensitivity and resolution, but slow and requires Highest sensitivity and resolution, but slow and requires
stable working environmentstable working environment ExpensiveExpensive
Multi-collector (MD): Also with magnetic sector, but with Multi-collector (MD): Also with magnetic sector, but with detector detector arrayarray Good for accurate and precise isotope Good for accurate and precise isotope ratiosratios Isotope dilution measurements – e.g. for accurate elemental Isotope dilution measurements – e.g. for accurate elemental
ratiosratios
Quadrupole mass analyserQuadrupole mass analyser Four parallel metal Four parallel metal
rods with dc and ac rods with dc and ac voltage (alternating voltage (alternating with radiofrequency)with radiofrequency)
Works as mass filter: Works as mass filter: allows passage of allows passage of particular m/z ions particular m/z ions onlyonly
Can scan over m/z Can scan over m/z range range spectrum spectrum
Atomic mass spectraAtomic mass spectra
Ray and Hieftje, J. Anal. At. Spectrom., 2001, 16, 1206-1216
http://www.wcaslab.com/tech/tbicpms.htm
Typical detection limits of ICP-MS Typical detection limits of ICP-MS instrumentinstrument
http://las.perkinelmer.co.uk/content/TechnicalInfo/TCH_ICPMSThirtyMinuteGuide.pdf
Multi-collector mass analyserMulti-collector mass analyser Magnetic sector mass analyser separates ions according to m/zMagnetic sector mass analyser separates ions according to m/z Simultaneous detection withSimultaneous detection with
array of collectors (Faraday cups) array of collectors (Faraday cups) Best for detn. of isotope ratiosBest for detn. of isotope ratios Applications in geochemistryApplications in geochemistry
and biomedical research and biomedical research
Possible factors that can affect Possible factors that can affect the performance of ICP-MSthe performance of ICP-MS
Variations in plasma ionization efficiency Variations in plasma ionization efficiency Possible clogging or corrosion of cone Possible clogging or corrosion of cone
apertures apertures Differing concentrations of other components Differing concentrations of other components
in matrix (e.g. acid, bulk elements) in in matrix (e.g. acid, bulk elements) in samples could result in samples could result in matrix suppressionmatrix suppression Ion current influenced by matrix compositionIon current influenced by matrix composition
Temperature and humidity fluctuations in the Temperature and humidity fluctuations in the laboratory environment laboratory environment
Isobaric elemental and polyatomic Isobaric elemental and polyatomic interferences: Used to be greatest limitation interferences: Used to be greatest limitation for applicability for applicability
Polyatomic interferences Polyatomic interferences in ICP-MS: Originsin ICP-MS: Origins
Spectral interference:Spectral interference:caused by presence caused by presence of species with same of species with same mass as analytemass as analyte
Often derived from Often derived from compounds with Arcompounds with Ar
Analyte Interference 39K+ 38Ar1H+
40Ca+ 40Ar+
51V+ 35Cl16O+
52Cr+ 40Ar12C+
56Fe+ 40Ar16O+
63Cu+ 23Na40Ar+
75As+ 40Ar35Cl+
80Se+ 40Ar2+
Overcoming polyatomic Overcoming polyatomic interferences:interferences:
Collision/reaction cells (CRC technology)Collision/reaction cells (CRC technology) Various modes of action:Various modes of action:
Collision-induced dissociation (less important)Collision-induced dissociation (less important) Chemical reaction (major mechanism)Chemical reaction (major mechanism) Electron transfer (major mechanism)Electron transfer (major mechanism) KED: kinetic energy discrimination (monoatomic analyte and interfering KED: kinetic energy discrimination (monoatomic analyte and interfering
molecules are retarded differently)molecules are retarded differently) Can either affect analyte or interferenceCan either affect analyte or interference Commonly used gases: He, HCommonly used gases: He, H22, ammonia , ammonia
http://breeze.thermo.com/collisioncells/(Webinar)
Requires reactive gas
Polyatomics and high-resolution ICP-Polyatomics and high-resolution ICP-MSMS
also no problem with polyatomics, as also no problem with polyatomics, as there are small, resolvable differences in there are small, resolvable differences in mass:mass:
31P
15N16O
14N16O1H
30.95 31.00Mass (u)
32S
16O16O
31.95 32.00
Stable isotopes and their usesStable isotopes and their uses
Most elements have more than one Most elements have more than one isotopeisotope
E.g. E.g. 3232S and S and 3434S, or S, or 5656Fe and Fe and 5757FeFe Can use more than one mass for one Can use more than one mass for one
element for measurements in ICP-MSelement for measurements in ICP-MS IDSM: Isotope dilution mass IDSM: Isotope dilution mass
spectrometry: Use particular isotope of spectrometry: Use particular isotope of desired analyte as internal standard in desired analyte as internal standard in ICP-MSICP-MS
Can buy enriched compounds, e.g. Can buy enriched compounds, e.g. 6767ZnO, ZnO, and use as “tracers”and use as “tracers”
Example for use of stable Example for use of stable isotopesisotopes
• Metal-binding protein with 4 Zn(II)• Are all four zinc ions exchangeable ?
• Isolated with natural abundance Zn(II):
Isotope
%
• Incubated overnight at 37°C with 40 mol equivalents of 67Zn(II) (93% isotopic purity)
• Measured isotopic ratios
0
10
20
30
40
50
60
64 66 67 68 70
67Zn: 4.1%
Total Zn and total S were determined using standard addition. For Zn quantification, the sum of the Zn isotopes 64, 66, 67, 68 and 70 was used. S was measured on the 32S isotope. Zn isotopic distribution (64, 66, 67, 68, 70) was determined. All elements and isotopes were measured in Medium Resolution (R = 4000). No internal standard has been used. No mass bias correction (using certified materials) was used for the isotopic distribution measurement.Sample preparation:Sample was diluted 1+49 with 18 MΩ water. For blank subtraction, the 10 mM NH4Acetate buffer
was diluted 1+49 with 18 MΩ water.Results for sample:
Total S 2.45 mg/L (± 0.2 %)
Total Zn 2.21 mg/L (± 0.6 %)
Ratios:Ratios:66Zn / 64Zn 0.657 ± 0.0028 (n = 7)67Zn / 64Zn 4.17 ± 0.025 (n = 7)68Zn / 64Zn 0.490 ± 0.0037 (n = 7)70Zn / 64Zn 0.01325 ± 0.00007 (n = 7)
Measurement and outputMeasurement and output(Thermofinnigan Element2)(Thermofinnigan Element2)
S: Zn ratio: 9:4 (as expected; the protein contains 9 sulfurs)
Comparison of experimental and Comparison of experimental and calculated isotopic ratioscalculated isotopic ratios
For each isotopic ratio, results agree best with the scenario for 3 For each isotopic ratio, results agree best with the scenario for 3 exchanging zinc: Clear demonstration that only 3 out of 4 Zn exchange:exchanging zinc: Clear demonstration that only 3 out of 4 Zn exchange:
The protein has one zinc that is inert towards exchangeThe protein has one zinc that is inert towards exchange
0
2
4
6
8
10
12
14
16
1 2 3 4
As measured
Calculated for 4 exchanging Zn(II)
Calculated for 3 exchanging Zn(II)
66/64 67/64 68/64 70/64
ICP-MS and hyphenationICP-MS and hyphenation
ICP-MS can be coupled with a variety of ICP-MS can be coupled with a variety of separation techniques:separation techniques:
Liquid chromatography Liquid chromatography HPLC-ICP-MS HPLC-ICP-MS Capillary electrophoresis Capillary electrophoresis CE-ICP-MS CE-ICP-MS Advantages of hyphenated techniques: Advantages of hyphenated techniques:
better control over matrixbetter control over matrix Allows separation of different components: direct Allows separation of different components: direct
access to access to speciationspeciation Laser ablation Laser ablation LA-ICP-MS LA-ICP-MS
For surface analysisFor surface analysis For materials that are difficult to digest (e.g. alloys)For materials that are difficult to digest (e.g. alloys) Is being developed in scanning fashion with Is being developed in scanning fashion with m m
spatial resolution: Imaging the metal composition of spatial resolution: Imaging the metal composition of a materiala material
Caveat: Calibration ?Caveat: Calibration ?
Laser ablationLaser ablation
Laser
To ICPCarrier gas in
monitor camera
UV light
sample
Useful for surface analysis of solid samples
The ablation processThe ablation process
Plume of molecules and ionsfrom a surface hit by a laserhttp://kottan-labs.bgsu.edu/pictures/
Comparison: AAS, ICP-OES, and ICP-Comparison: AAS, ICP-OES, and ICP-MSMS
AAS: Single element, ppm/ppb rangeAAS: Single element, ppm/ppb range Cheap, simple Cheap, simple Small dynamic rangeSmall dynamic range GFAAS about 100 times more sensitive than FAAS, GFAAS about 100 times more sensitive than FAAS,
but also more challengingbut also more challenging ICP-OES: Multi-element, ppb rangeICP-OES: Multi-element, ppb range
Limited spectral interferences, good stability, low Limited spectral interferences, good stability, low matrix effectsmatrix effects
ICP-MS: Multi-element, possible to reach ppt ICP-MS: Multi-element, possible to reach ppt (or even ppq)(or even ppq) Most complex, Most complex, most expensivemost expensive, lowest detection , lowest detection
limits, isotope analysis possiblelimits, isotope analysis possible
Comparison: Detection limits Comparison: Detection limits and working rangesand working ranges
http://pubs.acs.org/hotartcl/tcaw/99/oct/element.html
Synopsis:Synopsis:Interferences in atomic Interferences in atomic
spectroscopyspectroscopyTechnique Type of Interference
Method of Compensation
Flame AAS
IonizationChemical
Physical
Ionization buffersReleasing agent or nitrous oxide-acetylene flame Dilution, matrix matching, or method of additions
Graphite Furnace AAS
Physical and chemicalMolecular absorptionSpectral
Spectral Standard Temperature Platform Furnace (STPF), conditions, standard additionsZeeman or continuum source background correctionZeeman background correction
ICP-OES Spectral
Matrix
Background correction or the use of alternate analytical linesInternal standardization
ICP-MS Spectral
Matrix
Inter-element correction, use of alternate masses, higher resolution systems or reaction/collision cell technology Internal standardization
http://pubs.acs.org/hotartcl/tcaw/99/oct/table1.html
http://las.perkinelmer.com/content/relatedmaterials/brochures/bro_atomicspectroscopytechniqueguide.pdf
Exercise: How is this decision matrix correlated with strengths and limitations of the various techniques ?
A technique decision matrix
Other inorganic mass spectrometry Other inorganic mass spectrometry methodsmethods
Mainly for surface analysis (depth profiling, imaging) in Mainly for surface analysis (depth profiling, imaging) in different materials (e.g. conducting, semiconducting, and different materials (e.g. conducting, semiconducting, and nonconducting solid samples; technical, environmental, nonconducting solid samples; technical, environmental, biological, and geological samples) biological, and geological samples)
Spark source mass spectrometry (SSMS)Spark source mass spectrometry (SSMS) Glow discharge mass spectrometry (GDMS) Glow discharge mass spectrometry (GDMS) Laser ionization mass spectrometry (LIMS)Laser ionization mass spectrometry (LIMS) Thermal ionization mass spectrometry (TIMS)Thermal ionization mass spectrometry (TIMS) Secondary ion mass spectrometry (SIMS): most sensitive Secondary ion mass spectrometry (SIMS): most sensitive
elemental and isotopic surface analysis techniqueelemental and isotopic surface analysis technique Sputtered neutral mass spectrometry (SNMS) Sputtered neutral mass spectrometry (SNMS)
Detection limits for the direct analysis of solid samples by Detection limits for the direct analysis of solid samples by inorganic solid mass spectrometry: down to ppb levelsinorganic solid mass spectrometry: down to ppb levels
SIMS: secondary ion mass SIMS: secondary ion mass spectrometryspectrometry
Principle: bombard surface with ions, Principle: bombard surface with ions, “secondary” ions are sputtered from “secondary” ions are sputtered from surfacesurface
High sensitivity for all elementsHigh sensitivity for all elements Any type of material that can stay Any type of material that can stay
under vacuum (insulators, semiconductors, under vacuum (insulators, semiconductors, metals) metals)
Potential for high-resolution imagingPotential for high-resolution imaging(down to 40 nm)(down to 40 nm)
Very low background: high dynamic range Very low background: high dynamic range (more than 5 decades)(more than 5 decades)
Quantitative work complicated by variations Quantitative work complicated by variations in secondary ion yields in dependence on in secondary ion yields in dependence on chemical environment and the sputtering chemical environment and the sputtering conditions (ion, energy, angle)conditions (ion, energy, angle)
Rapid deterioration of bombarded surface Rapid deterioration of bombarded surface Static SIMS:Static SIMS: Molecular and elemental Molecular and elemental
characterisation of top monolayer characterisation of top monolayer
One of the most widespread surface analysis techniques for One of the most widespread surface analysis techniques for advanced material research advanced material research
• Dynamic SIMS:Dynamic SIMS: Bulk composition or depth distribution Bulk composition or depth distribution of trace of trace elements. Depth resolution ranging from one to 20-30 elements. Depth resolution ranging from one to 20-30 nm nm